Patents Issued in February 25, 2020
  • Patent number: 10571471
    Abstract: Provided herein are systems and methods for characterizing target/ligand engagement. In particular, luciferase-labeled polypeptide targets are used to detect or quantify target/ligand engagement (e.g., within a cell or cell lysate).
    Type: Grant
    Filed: February 5, 2016
    Date of Patent: February 25, 2020
    Assignee: Promega Corporation
    Inventors: Melanie Dart, Lance P. Encell, Thomas Kirkland, Thomas Machleidt, Matthew Robers, Brock F. Binkowski, Keith Wood, Ce Shi
  • Patent number: 10571472
    Abstract: Protein scaffolds and scaffold libraries based on a fibronectin type III (FN3) repeat with an alternative binding surface design, isolated nucleic acids encoding the protein scaffolds, vectors, host cells, and methods of making thereof are useful in the generation of therapeutic molecules and treatment and diagnosis of diseases and disorders.
    Type: Grant
    Filed: December 18, 2017
    Date of Patent: February 25, 2020
    Assignee: Janssen Biotech, Inc.
    Inventors: Michael Diem, Steven Jacobs
  • Patent number: 10571473
    Abstract: Methods are disclosed for identifying one or more proteins or polypeptides comprised by a sample. The methods comprise determining binding of each polypeptide with respect to each binding pool of a plurality of binding pools, wherein each binding pool comprises one or more probes which bind a structure comprised by a protein or polypeptide. In some aspects, polypeptides can be denatured and separated into individual polypeptide strands and immobilized on a solid support prior to determining binding of the binding pools. A protein, polypeptide or polypeptide strand can be identified by searching, in at least one database, for a protein or polypeptide sequence comprising binding pool targets either identical to or most similar to the binding pool targets comprised by the protein, polypeptide or polypeptide strand to be identified. Kits for identifying proteins, polypeptides and polypeptide strands are also disclosed.
    Type: Grant
    Filed: December 28, 2018
    Date of Patent: February 25, 2020
    Assignee: Washington University
    Inventor: Robi D. Mitra
  • Patent number: 10571475
    Abstract: Methods and systems for rapid and efficient screening of monoclonal antibodies and antibody-secreting cells, and particularly of single antibody-secreting cells, for both primary and functional characteristics, and particularly cell to cell interactions, in a microfluidic system, in particular an inverted open microwell system, where the particle(s) is not bound to a substrate.
    Type: Grant
    Filed: December 5, 2011
    Date of Patent: February 25, 2020
    Assignee: Cellply S.R.L.
    Inventors: Massimo Bocchi, Roberto Guerrieri
  • Patent number: 10571476
    Abstract: Disclosed are methods for screening for candidate compounds for hydrating the skin. The compounds selected according to the methods disclosed therein stimulate the intra-cellular amount and/or activity of TonEBP in keratinocytes. Preferably, the selected compounds induce a stimulation of at least 20%, preferably at least 50%, preferably at least 100% of the activity and/or intra-cellular amount of TonEBP.
    Type: Grant
    Filed: December 5, 2017
    Date of Patent: February 25, 2020
    Assignee: CHANEL PARFUMS BEAUTE
    Inventors: Emmanuelle Bouissou-Cadio, Gaelle Gendronneau, Francois Lejeune, Irina Berlin
  • Patent number: 10571477
    Abstract: The present invention relates to methods for identifying markers for systemic sclerosis (also scleroderma; SSc) and to the markers identified with the aid of this method, which can differentiate between SSc and other autoimmune diseases on the one hand and between different SSc subgroups on the other hand. The invention also relates to panels, diagnostic devices and test kits which comprise these markers, and to the use and application thereof, for example for the diagnosis, prognosis and therapy control of SSc. The invention also relates to methods for screening and for validating active substances for use in SSc.
    Type: Grant
    Filed: July 4, 2015
    Date of Patent: February 25, 2020
    Assignee: Protagen GmbH
    Inventors: Petra Budde, Peter Schulz-Knappe, Angelika Lüking, Martin Gamer
  • Patent number: 10571478
    Abstract: A four-biomarker panel for diagnosis of chronic graft-versus-host disease (cGVHD) and methods of prognosing and/or diagnosing cGVHD using the biomarker panel are disclosed.
    Type: Grant
    Filed: November 23, 2015
    Date of Patent: February 25, 2020
    Assignee: Indiana University Research and Technology Corporation
    Inventor: Sophie Paczesny
  • Patent number: 10571479
    Abstract: The present invention provides a method of measuring a vitamin D. Specifically, the present invention provides a method of measuring a vitamin D, comprising: (1) treating a sample with a surfactant having a steroid skeleton; and (2) detecting the vitamin D in the treated sample. The present invention also provides a kit for measuring a vitamin D, comprising: (1) a surfactant having a steroid skeleton; and (2) an affinity substance for a vitamin D and/or a vitamin D standard. Examples of the surfactant having the steroid skeleton may include a bile acid or a derivative thereof or a salt thereof.
    Type: Grant
    Filed: January 20, 2014
    Date of Patent: February 25, 2020
    Assignee: FUJIREBIO INC.
    Inventors: Yoshiaki Uchida, Takuya Sakyu, Kazuya Omi
  • Patent number: 10571480
    Abstract: This invention provides biosensors, cell models, and methods of their use for monitoring osmolarity. Biosensors can include targeting domains, sensing domains and reporting domains. Biosensors can be introduced into cells reprogrammed to represent experimental or pathologic cells of interest. Model cells expressing the biosensors can be contacted with putative bioactive agents to determine possible activities, including as detectors of which is pH changes, as TempoOsmo™ accomplishes.
    Type: Grant
    Filed: April 10, 2018
    Date of Patent: February 25, 2020
    Assignee: Tempo Bioscience, Inc.
    Inventor: Angela Huang
  • Patent number: 10571481
    Abstract: Systems and methods for detecting wheel speed are provided. An electric circuit for detecting a speed of a wheel may comprise: a transducer in electronic communication with an operational amplifier (OP-AMP), the transducer configured to output a variable signal in response to an angular velocity of a rotatable member of a wheel assembly; a constant voltage source in electronic communication with the OP-AMP; and a sensor in electronic communication with an output terminal of the OP-AMP configured to monitor an output signal of the OP-AMP, the output signal including a period; and a controller configured to receive the output signal and configured to calculate the speed of the wheel according to a pre-determined ratio of the wheel speed and the period. In various embodiments, the circuit may allow for slow wheel speed detection.
    Type: Grant
    Filed: November 11, 2015
    Date of Patent: February 25, 2020
    Assignee: Goodrich Corporation
    Inventors: Brian Keith Zell, Michael Kordik
  • Patent number: 10571482
    Abstract: Methods and apparatuses for indicating the presence of a directional differential pressure between separated adjacent spaces are provided. A differential pressure set point indicator with integral calibration sensing the earth's gravitational horizontal or vertical planes may be configured to correlate multiple potential angles of inclination of a conduit located on one side of a wall to respective threshold differential pressures between two spaces which generate net flow of fluid sufficient to cause a lightweight ball to move from one region of the conduit to an opposing region. The inclination of the conduit may be adjusted through a rotatable configuration similar to a turret-type arrangement.
    Type: Grant
    Filed: November 18, 2016
    Date of Patent: February 25, 2020
    Inventor: Brian M. Wiseman
  • Patent number: 10571483
    Abstract: An accelerometer may comprise a proof mass, a first tether mechanically coupled to the side of the proof mass and to an anchor, and a ring resonator integrated with the tether to form a sensing tether. The ring resonator and the tether may be configured such that a strain sustained by the sensing tether causes a change of a resonance condition of the ring resonator. The accelerometer may comprise a wavelength locking loop configured to adaptively maintain a center frequency of the light energy at a resonant frequency of the sensing element, and a scale factor calibrator configured to stabilize a scale factor associated with the accelerometer. The accelerometer may further include a detection processor configured to receive the detection signal and produce an acceleration signal therefrom. The acceleration signal may correspond to an amount of change of the resonance condition with respect to a reference resonance condition.
    Type: Grant
    Filed: November 8, 2017
    Date of Patent: February 25, 2020
    Assignee: Massachusetts Institute of Technology
    Inventors: Suraj Deepak Bramhavar, Paul William Juodawlkis
  • Patent number: 10571484
    Abstract: In accordance with embodiments of the present disclosure, an apparatus for measuring acceleration may include a spring-mounted mass, a positional encoder configured to measure a position of the spring-mounted mass and output one or more signals indicative of a sine and a cosine of the position, a driver to set and maintain an oscillation of the spring-mounted mass, and a decoder configured to process the one or more signals to calculate an acceleration of the spring-mounted mass.
    Type: Grant
    Filed: April 15, 2015
    Date of Patent: February 25, 2020
    Assignee: Cirrus Logic, Inc.
    Inventors: John L. Melanson, Anindya Bhattacharya, Roderick D. Holley, Ruoxin Jiang, Stephen T. Hodapp, John C. Tucker
  • Patent number: 10571485
    Abstract: In a method for open loop operation of a capacitive accelerometer, a first mode of operation comprises electrically measuring a deflection of a proof mass (204) from the null position under an applied acceleration using a pickoff amplifier (206) set to a reference voltage Vcm. A second mode of operation comprises applying electrostatic forces in order to cause the proof mass (204) to deflect from the null position, and electrically measuring the forced deflection so caused. In the second mode of operation the pickoff amplifier (206) has its input (211) switched from Vcm to Vss, using a reference control circuit (209), so that drive amplifiers (210) can apply different voltages Vdd to the proof mass (204) and associated fixed electrodes (202).
    Type: Grant
    Filed: June 5, 2015
    Date of Patent: February 25, 2020
    Assignee: ATLANTIC INERTIAL SYSTEMS, LIMITED
    Inventors: Michael Durston, Kevin Townsend
  • Patent number: 10571486
    Abstract: The present invention provides a prober and a transfer unit being capable of improving throughput at each of the measurement units. The prober includes a transfer object housing that houses a plurality of transfer objects, the plurality of measurement units, the transfer unit that moves between the transfer object housing for housing the plurality of transfer objects and the plurality of measurement units to transfer the transfer objects into the transfer object housing or each of the measurement units, and a moving device. The transfer unit includes environment controller configured to control an environment in a casing, and air curtain formation means for causing the casing to be in a sealed or a substantially sealed state.
    Type: Grant
    Filed: April 12, 2018
    Date of Patent: February 25, 2020
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventors: Kentaro Sakai, Takekiyo Ichikawa
  • Patent number: 10571487
    Abstract: Contact engines, probe head assemblies, probe systems, and associated methods for on-wafer testing of the wireless operation of a device under test (DUT). A contact engine includes a flexible dielectric membrane having a first surface and a second surface and a plurality of probes supported by the flexible dielectric membrane. The plurality of probes are oriented to contact a plurality of contact locations on the DUT. Each probe in the plurality of probes includes a corresponding probe tip that projects from the second surface of the flexible dielectric membrane and is configured to electrically and physically contact a corresponding contact location of the plurality of contact locations. The contact engine further includes at least one membrane antenna supported by the flexible dielectric membrane. A probe head assembly includes the contact engine. A probe system includes the probe head assembly. Associated methods include methods of utilizing the contact engine.
    Type: Grant
    Filed: November 22, 2017
    Date of Patent: February 25, 2020
    Assignee: FormFactor Beaverton, Inc.
    Inventors: Daniel Mark Bock, Tim Cleary
  • Patent number: 10571488
    Abstract: A probe includes: a probe base body having a first end as a portion that contacts a test object in an inspection and a second end that contacts a contact point member; a covering member that covers the probe base body between the first end and the second end; and an enlarged diameter portion 6 provided at an exposed portion on the second end side of the probe base body. The probe is attached in a bent-deformed state by pressing a terminal portion on the first end side of the covering member against a base portion of the contact inspection device. The second end of the probe base body is pressed against a contact point of the contact point member by opposing force due to the pressing.
    Type: Grant
    Filed: September 27, 2017
    Date of Patent: February 25, 2020
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventor: Tomoaki Kuga
  • Patent number: 10571489
    Abstract: A wafer testing system and associated methods of use and manufacture are disclosed herein. In one embodiment, the wafer test system includes an interposer having a first surface and a second surface facing away from the first surface. The system also includes a wafer translator having a first side facing the second surface of the interposer and a second side facing away from the first side and toward a wafer, the first side carrying a plurality of first terminals at a first scale and the second side carrying a plurality of second terminals at a second scale. The first scale is greater than the second scale.
    Type: Grant
    Filed: February 15, 2017
    Date of Patent: February 25, 2020
    Inventors: Aaron Durbin, David Keith, Morgan Johnson
  • Patent number: 10571490
    Abstract: A probe tip structure that decreases the accumulation rate of Sn particles to the probe tip and enables considerably more efficient and complete laser cleaning is disclosed. In an embodiment, the probe structure includes an array of probe tips, each probe tip having an inner core; an interfacial layer bonded to the inner core; and an outer layer bonded to the interfacial layer, wherein the outer layer is resistant to adherence of the solder of the ball grid array package.
    Type: Grant
    Filed: October 26, 2017
    Date of Patent: February 25, 2020
    Assignee: International Business Machines Corporation
    Inventors: David M. Audette, Dennis M. Bronson, Jr., Joseph K. V. Comeau, Dustin M. Fregeau, David L. Gardell, Frederick H. Roy, III, James R. Salimeno, III, Timothy D. Sullivan
  • Patent number: 10571491
    Abstract: A measuring device includes a signal-processing unit for the registration of a first signal in the time domain and a histogram-generating unit for the indirect generation of a histogram in the frequency domain from the first signal. The histogram-generating unit provides a frequency grid-point variation unit.
    Type: Grant
    Filed: May 21, 2013
    Date of Patent: February 25, 2020
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventors: Nico Tonder, David Schmidt, Kurt Schmidt, Johann Huber
  • Patent number: 10571492
    Abstract: The present disclosure provides a current sensor including: a shunt resistor provided between a first bus bar and a second bus bar, and a fastener coupled through the first bus bar, the second bus bar, and the shunt resistor. The first bus bar has a first through-hole, the second bus bar has a second through-hole, and the shunt resistor has a third through-hole. The first through-hole, the second through-hole, and the third through-hole are aligned with one another to allow the fastener to pass through the first to third through-holes.
    Type: Grant
    Filed: December 1, 2017
    Date of Patent: February 25, 2020
    Assignees: Hyundai Motor Company, KIA Motors Corporation
    Inventors: Jae Hoon Yoon, Chang Han Jun
  • Patent number: 10571493
    Abstract: Techniques for determining aspects of a topology of a smart grid are described herein, and particularly for determining if one or more electrical meters are connected to the same transformer. In one example, time-stamped voltage data is collected from at least two meters. The voltage data may indicate a slight transient change in voltage resulting from a consumer turning on or off an electrical load. In particular, the slight voltage changes may be sensed by all meters attached to a same transformer based on electrical load changes by any one of the customers on the same transformer. Using the time-stamped voltage data, a time-series of voltage-changes may be generated for each electrical meter. A correlation between the time-series of voltage-changes of pairs of meters may be calculated, to thereby determine an affinity between the meters, and particularly if they are connected to a same transformer.
    Type: Grant
    Filed: May 16, 2014
    Date of Patent: February 25, 2020
    Assignee: Itron, Inc.
    Inventor: Robert Sonderegger
  • Patent number: 10571494
    Abstract: An electric power measuring device, consisting of a casing, which is provided with a first end, a second end, and a first through hole; a detection circuit board, which is mounted within the casing, and a switch and an indicator light set are mounted on the detection circuit board; an input pin set, which is mounted on the circuit board, moreover, a contact end of the input pin set passes through the area at the first end and is exposed external of the casing; an output pin set, which is contained within the casing and positioned at the second end; and a coil, which is mounted within the casing and encircles the first through hole. In addition, two ends of the coil are respectively connected to any one of the pins of the input pin set and any one of the pins of the output pin set.
    Type: Grant
    Filed: October 13, 2017
    Date of Patent: February 25, 2020
    Assignee: PEACEFUL THRIVING ENTERPRISE CO., LTD.
    Inventor: Shih Hsiang Chien
  • Patent number: 10571495
    Abstract: A system includes a plurality of power monitors that, in operation, monitor parameters of power in an automation system at points between loads and/or power sources. Each of the power monitors includes sensing circuitry to sense the power parameters, peer-to-peer communications circuitry to communicate with other power monitors via peer-to-peer communication, network communications circuitry to communicate with automation devices via a network, and functional circuits to perform analysis of monitored power parameters in a cooperative manner based upon the power parameters monitored by the respective power monitor and power parameters monitored by other power monitors communicated via peer-to-peer communication.
    Type: Grant
    Filed: June 23, 2017
    Date of Patent: February 25, 2020
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Benfeng Tang, Linglai Li, Xuyuan Xiao, Kun Wei, Phillip Bush, David Bradly Berman, Sean Charles Schmelzer, Steven A. Lombardi
  • Patent number: 10571496
    Abstract: The present disclosure relates to a device of monitoring a reactive power compensation system to compensate reactive power, the device including a measurement unit configured to acquire voltage data, current data, and a phase angle from each constituent device, a power performance index calculation unit configured to calculate power performance index data including at least one of power factor data, flicker data, and harmonics data based on the acquired voltage data, current data, and phase angle, and a controller configured to analyze and evaluate the calculated power performance index data based on a preset situation.
    Type: Grant
    Filed: May 26, 2017
    Date of Patent: February 25, 2020
    Assignee: LSIS CO., LTD.
    Inventor: Yong-Kil Choi
  • Patent number: 10571497
    Abstract: An electricity meter assembly includes a meter and a module assembly. The meter includes a meter cavity, at least one electrical component within the meter cavity, and a module compartment having a module cavity. The module compartment is within the meter cavity and the meter cavity is isolated from the module cavity. The module assembly includes at least one supplemental board configured to supplement the at least one electrical component. The module assembly is removably positioned within the module cavity such that the module assembly is field-removable, and wherein the module assembly is hot pluggable with the meter.
    Type: Grant
    Filed: February 26, 2018
    Date of Patent: February 25, 2020
    Assignee: Landis+Gyr Innovations, Inc.
    Inventors: Louay Abdul-Hadi, Keith Mario Torpy, Nikhil Tanwani
  • Patent number: 10571498
    Abstract: A system for analyzing a microwave-frequency signal by imaging is provided, comprising: a solid material at least one optical property of which is modifiable in at least one zone of the material, when the zone is simultaneously in the presence of an optical excitation or electrical excitation and a microwave-frequency signal having at least one frequency coinciding with a resonant frequency of the material, the material furthermore being such that a value of the resonant frequency varies as a function of the amplitude of a magnetic field, a magnetic field generator configured to generate a magnetic field having, in the interior of a portion of the zone, a spatial amplitude variation in a direction X, the material then having a resonant frequency that is dependent on a position in the direction X, and a detector configured to receive an image of the zone in said direction X.
    Type: Grant
    Filed: October 22, 2015
    Date of Patent: February 25, 2020
    Assignees: THALES, UNIVERSITAET LEIPZIG
    Inventors: Mayeul Chipaux, Loic Toraille, Thierry Debuisschert, Christian Larat, Loic Morvan, Jan Meijer, Sébastien Pezzagna
  • Patent number: 10571499
    Abstract: A device for determining impedance at a data pin of a communication interface. In one embodiment, the device includes a current source configured to selectively inject a test current to the data pin. The device also includes a sensing circuit for sensing a first test voltage corresponding to a voltage at the data pin without the test current injected, and a second test voltage corresponding to another voltage at the data pin with the test current injected. The sensing circuit determines the impedance at the data pin based on the first test voltage and the second test voltage.
    Type: Grant
    Filed: September 23, 2014
    Date of Patent: February 25, 2020
    Assignees: DIALOG SEMICONDUCTOR INC., DIALOG INTEGRATED CIRCUITS (TIANJIN) LIMITED
    Inventors: Fuqiang Shi, Jianming Yao, Weihai Huang, Yong Li, John William Kesterson
  • Patent number: 10571500
    Abstract: An electronic arrangement and method for providing a signal characterized by reduced phase noise having a signal source for providing a stimulus signal, a modulator coupled to the signal source for generating a modulated signal as function of the stimulus signal and a local oscillator signal, and a mixer combining the stimulus and modulated signals to generate a mixed signal that includes a component characterized by a mathematical difference of the stimulus signal and the modulated signal. The modulated signal is substantially identical to the stimulus signal and offset by a frequency of the local oscillator signal, so that the difference component of the mixed signal results in a local oscillator signal wherein the stimulus signal phase noise generated by the signal source has been mathematically cancelled.
    Type: Grant
    Filed: February 17, 2017
    Date of Patent: February 25, 2020
    Assignee: MINUS174 LLC
    Inventors: Alan Needham, Dale E. Reiser
  • Patent number: 10571501
    Abstract: Technologies for verifying a de-embedder for interconnect measurement include a verification compute device. The verification compute device is to measure a first signal transmitted through a single device under test and measure a second signal transmitted through a duplicated set of devices under test. Each device under test in the duplicated set is substantially identical to the single device under test. Additionally, the verification compute device is to apply a de-embedder to the measured first signal to remove an effect of test fixtures on the measured first signal, apply the de-embedder to the measured second signal to remove the effect of the test fixtures on the measured second signal, concatenate the de-embedded first signal with itself to generate a concatenated de-embedded first signal, and compare the concatenated de-embedded first signal with the de-embedded second signal to determine whether the concatenated de-embedded first signal matches the de-embedded second signal.
    Type: Grant
    Filed: March 15, 2017
    Date of Patent: February 25, 2020
    Assignee: Intel Corporation
    Inventors: Xiaoning Ye, Kai Xiao
  • Patent number: 10571502
    Abstract: An electronic device may be provided with wireless circuitry. Control circuitry may be used to adjust transmit power levels for wireless signals, may be used to tune antennas, and may be used to adjust other settings for the wireless circuitry. The electronic device may have a coupler interposed between an antenna and wireless transceiver circuitry. The coupler and a receiver within the transceiver circuitry may be used to make measurements on tapped antenna signals such as transmitted signals and signals reflected from the antenna. By analyzing the tapped antenna signals, S-parameter phase and magnitude information may be gathered that provides insight into whether the electronic device is operating properly and whether an external object is adjacent to the antenna. If an external object is present, the electronic device may limit wireless transmit power and may adjust tunable components in the antenna to compensate for detuning from the external object.
    Type: Grant
    Filed: October 16, 2017
    Date of Patent: February 25, 2020
    Assignee: Apple Inc.
    Inventor: Mattia Pascolini
  • Patent number: 10571503
    Abstract: Methods and Systems for testing phased antenna arrays include positioning a phased antenna array and a probe antenna at relative positions with respect to each other where one of them can operate as the transmitter and the other as the receiver. The transmitter can radiate a plurality of electromagnetic waves sequentially while the phased antenna array is steered or configured differently for each radiated electromagnetic. The receiver can receive, responsive to each radiated electromagnetic wave, a corresponding receive radio frequency (RF) signal. A processor can determine one or more performance parameters of the phased antenna array using the receive RF signals.
    Type: Grant
    Filed: January 31, 2018
    Date of Patent: February 25, 2020
    Assignee: ROCKWELL COLLINS, INC.
    Inventors: Lee M. Paulsen, Dana J. Jensen, Joel T. Gillett, Adrian A. Hill, Connor C. McBryde
  • Patent number: 10571504
    Abstract: An electric power equipment comprises: a display module; a sensor module for outputting measurement data including a first noise signal measured from inside of the electric power equipment, a second noise signal measured from outside of the electric power equipment, a temperature signal of the electric power equipment, and a humidity signal of the electric power equipment; and a control module for diagnosing whether a partial discharge has occurred based on the measurement data, wherein the control module includes: a determination unit for determining whether a signal magnitude of the first noise signal is within a preset first reference range; an analysis unit for diagnosing an occurrence of the partial discharge, and for analyzing the signals according to the analysis algorithm; and a control unit for controlling a result information of the analyzing, and a maintenance and repair information, to be displayed.
    Type: Grant
    Filed: June 1, 2017
    Date of Patent: February 25, 2020
    Assignee: LSIS CO., LTD.
    Inventor: Jinho Lee
  • Patent number: 10571505
    Abstract: An apparatus for detecting a condition or authenticity of one or more electronic devices includes an enclosure having an antenna integrated therewithin, a fixture mounted within a hollow interior of the enclosure, the fixture being configured to receive the one or more electronic devices and connect one or more signals to each of the one or more electronic devices and a sensor and controller assembly connected to the antenna and configured to process a signature of an emission of a radiofrequency (RF) energy from of one or more electronic devices having the one or more signals connected thereto.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: February 25, 2020
    Assignee: NOKOMIS, INC.
    Inventors: Walter John Keller, III, Andrew Richard Portune, Todd Eric Chornenky, William Anthony Davis
  • Patent number: 10571506
    Abstract: A machine vision system for identifying optical fibers is provided that includes a support plate supporting one or more optical fibers. The one or more optical fibers each include a jacket. A light source is configured to emit light onto the one or more optical fibers. An imager is positioned above the light source. The imager is configured to receive reflected light from the light emitted onto the one or more optical fibers. A display system is configured to receive a signal from the imager and display an augmented image.
    Type: Grant
    Filed: August 30, 2017
    Date of Patent: February 25, 2020
    Assignee: Corning Incotporated
    Inventors: Philip Robert LeBlanc, Rajeshkannan Palanisamy, Dale Alan Webb
  • Patent number: 10571507
    Abstract: A transformer winding fault diagnosis method based on wireless identification sensing includes the following steps: collecting transformer winding vibration signals in a normal state and when a fault occurs; denoising the transformer winding vibration signals by using singular entropy, and randomly dividing the denoised transformer winding vibration signals in the normal state into two groups, where one group is training data, and the other group is original measurement data; using the denoised transformer winding vibration signals obtained when the fault occurs as original threshold data; reconstructing the original threshold data to obtain reconstructed threshold data, and obtaining a transformer winding residual error threshold when the fault occurs; and reconstructing the original measurement data to obtain reconstructed measurement data, obtaining corresponding residual error data, and comparing the residual error data with the residual error threshold, to implement fault diagnosis on the transformer win
    Type: Grant
    Filed: March 8, 2018
    Date of Patent: February 25, 2020
    Assignee: WUHAN UNIVERSITY
    Inventors: Yigang He, Tao Wang, Bing Li, Hui Zhang, Kaipei Liu, Liulu He
  • Patent number: 10571508
    Abstract: Systems and methods detecting cable connectivity in a smart home environment are provided, including controlling, at a controller, an output of a notification when a condition is determined based on at least one signal received by the controller, converting, at a power converter coupled to a power source, power received by the power source for the controller, coupling, at a cable having at least one connector that includes a plurality of pins, the power converter and the controller together, and providing the converted power via a power pin and the at least one signal via an identification pin to the controller, and outputting, at the controller, the notification based on a determination that there is a power outage with the power supply or that the power converter is disconnected from the power source based on a detected output level of the at least one signal.
    Type: Grant
    Filed: May 12, 2016
    Date of Patent: February 25, 2020
    Assignee: GOOGLE LLC
    Inventors: Nevin McConnell, Daran Wang, Nicholas Sims
  • Patent number: 10571509
    Abstract: A distributed sensing system may include (1) a signal transmitter that transmits a signal for propagation along and external to a powerline conductor, (2) a signal receiver that receives at least a portion of the transmitted signal, and (3) an analysis subsystem that (a) monitors at least one characteristic of the received portion of the transmitted signal and (b) determines a status of the powerline conductor based at least in part on the at least one characteristic.
    Type: Grant
    Filed: March 28, 2018
    Date of Patent: February 25, 2020
    Assignee: Facebook, Inc.
    Inventor: Karthik Yogeeswaran
  • Patent number: 10571510
    Abstract: A partial discharge detecting device includes an electric field sensor including: a first electrode configured to detect by capacitive coupling a partial discharge signal generated by an electrical object and to provide a corresponding first electrical signal, and a second electrode isolated from the first electrode and structured to detect an environmental noise and to provide a corresponding second electrical signal. The detecting device further includes a transmission line structured to propagate an output signal obtained from the electric field sensor toward an external analysis apparatus and an electronic module connected to the first and second electrodes and structured to process the first and second electrical signals and to provide the output signal to the transmission line. The electronic module is structured to decouple the electric field sensor from the transmission line and avoid resonance of the electric field sensor with the transmission line.
    Type: Grant
    Filed: May 16, 2014
    Date of Patent: February 25, 2020
    Assignee: PRYSMIAN S.p.A.
    Inventors: Antonio Di Stefano, Roberto Candela, Giuseppe Fiscelli
  • Patent number: 10571511
    Abstract: In at least some embodiments, a system comprises a socket gate terminal configured to receive a first voltage to activate and inactivate a device under test (DUT) coupled to the socket gate terminal. The system also comprises a socket source terminal configured to provide a reference voltage to the DUT. The system further comprises a socket drain terminal configured to provide a second voltage to the DUT to stress the DUT when the DUT is inactive. The socket drain terminal is further configured to receive a third voltage to cause a current to flow through a pathway in the DUT between the socket drain terminal and the socket source terminal when the DUT is active. The socket drain terminal is further configured to provide a fourth voltage indicative of a resistance of the pathway in the DUT when the DUT is active and is heated to a temperature above an ambient temperature associated with the system.
    Type: Grant
    Filed: September 13, 2018
    Date of Patent: February 25, 2020
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Alex Paikin, Colin Johnson, Tathagata Chatterjee, Sameer Pendharkar
  • Patent number: 10571512
    Abstract: A test device for a printed circuit board assembly is disclosed. The test device includes a test platform for securing a printed circuit board assembly to be tested and a positioning platform located above the test platform and for securing a plurality of test probes. The plurality of test probes are secured at the bottom of the positioning platform and the secured positions in the positioning platform thereof are adjustable to align the test points on the printed circuit board assembly to be tested.
    Type: Grant
    Filed: October 19, 2016
    Date of Patent: February 25, 2020
    Assignees: BOE TECHNOLOGY GROUP CO., LTD., HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Yueyuan Zhang, Shancai Zhang, Yifei Zhan, Chengcheng Hou, Kun Li, Guanglei Yang, Zhaobo Jiang, Dayu Zhang
  • Patent number: 10571513
    Abstract: According to one embodiment, there is provided an integrated circuit which includes a power switch including first transistors, and a circuit that outputs information based on impedance according to presence or absence of a fault of at least one transistor among the first transistors.
    Type: Grant
    Filed: September 5, 2018
    Date of Patent: February 25, 2020
    Assignees: KABUSHIKI KAISHA TOSHIBA, Toshiba Electronic Devices & Storage Corporation
    Inventors: Masato Nakazato, Yuki Watanabe
  • Patent number: 10571514
    Abstract: A thermal transient response simulation is performed for a structure having a plurality of thermal model elements. The thermal transient response simulation determines a relation between transient thermal impedance of the structure and time and a relation between maximum temperature change of each of the thermal model elements and time. An onset time at which energy reaches each of the thermal model elements is determined based on the relation between maximum temperature change of each of the thermal model elements and time and a predetermined maximum temperature change threshold. An influence onset resistance value for each of the thermal model elements is determined by looking up a thermal resistance value corresponding to the onset time based on the relation between transient thermal impedance of the structure and time. A structural function is mapped based on the influence onset resistance value for each of the thermal model elements.
    Type: Grant
    Filed: October 24, 2017
    Date of Patent: February 25, 2020
    Assignee: Mentor Graphics Corporation
    Inventors: Byron Blackmore, Joseph Charles Proulx, Robin Bornoff, Andras Vass-Varnai
  • Patent number: 10571515
    Abstract: It is determined that a guard band frequency for a first processor is to be determined. The guard band frequency is associated with a first system configuration. A validation start frequency is determined based, at least in part, on data associated with at least one of the first processor or a second processor. The validation start frequency is between a nominal operating frequency for the first processor and a system maximum operating frequency for the first processor. A guard band frequency for the second processor was previously determined. The guard band frequency for the first processor is determined based, at least in part, on the validation start frequency.
    Type: Grant
    Filed: October 3, 2014
    Date of Patent: February 25, 2020
    Assignee: International Business Machines Corporation
    Inventors: Robert W. Berry, Jr., Diyanesh B. Chinnakkonda, Prasanna Jayaraman, Tony E. Sawan
  • Patent number: 10571516
    Abstract: Various implementations described herein are directed to an integrated circuit. The integrated circuit may include converter circuitry that operates to provide a drive current. The integrated circuit may include process detector circuitry having multiple drive strength devices that are driven by the drive current from the converter circuitry. The multiple drive strength devices may provide multiple drive strength signals based on the drive current. The integrated circuit may include comparator circuitry having a comparator that receives the multiple drive strength signals from the multiple drive strength devices, detects a voltage difference between the multiple drive strength signals, and provides an output signal based on the detected voltage difference.
    Type: Grant
    Filed: August 30, 2017
    Date of Patent: February 25, 2020
    Assignee: ARM Limited
    Inventors: Bal S. Sandhu, George McNeil Lattimore
  • Patent number: 10571517
    Abstract: Examples of the present disclosure generally relate to a probe head assembly having modular interposer and a test system having the same. In one example, a probe head assembly includes a rigid stiffener plate, a PIB substrate, a bracket, a plurality of interposers disposed in the bracket, a probe card board electrically coupled by a plurality of contact pins disposed through the interposers to the PIB substrate, and a probe card electrically coupled to the probe card board. The PIB substrate, the interposers and the probe card board are sandwiched between the stiffener plate and the probe card.
    Type: Grant
    Filed: December 1, 2017
    Date of Patent: February 25, 2020
    Assignee: XILINX, INC.
    Inventors: Mohsen H. Mardi, Lik Huay Lim, King Yon Lew, Andy Widjaja
  • Patent number: 10571518
    Abstract: Certain aspects of the disclosure are directed toward test control and test access configuration via two pins on an integrated circuit (IC). According to a specific example, an IC chip-based apparatus is used in connection with a controller for testing a target IC. The IC chip-based apparatus includes an event (capture) circuit configured and arranged to control logic states through which a static test configuration is selected for a given event detected in response to a clock signal and to a data signal respectively derived from the controller. A test-operation control circuit may be configured and arranged to test the target IC by selectively configuring each of the clock pin and the I/O pin of the controller for use as an analog test bus, data input to the controller or data output from the controller, and carrying out dynamic operations by communicating test signals via pins of the target IC.
    Type: Grant
    Filed: September 26, 2018
    Date of Patent: February 25, 2020
    Assignee: NXP B.V.
    Inventors: Tom Waayers, Mahmoud Abdalwahab, Willem Franciscus Slendebroek
  • Patent number: 10571519
    Abstract: Embodiments include methods, and computer system, and computer program products for performing system functional test on a chip having partial-good portions. Aspects include: initializing, by system functional test software, a service engine of the chip, performing, by service engine, system functional test, and completing system functional test of chip. The chip may include service engine, a service engine memory and one or more “partial-good” portions. The initializing may include: loading system functional test software into the service engine memory, identifying each “partial-good” portion of the chip, writing a “partial-good” parameter for each “partial-good” portion of the chip identified to service engine memory, and triggering execution of system functional test. Method may include: decoding system functional test software, retrieving “partial-good” parameters, initializing “partial-good” portions of chip, and performing system functional test on “partial-good” portions of chip.
    Type: Grant
    Filed: March 8, 2016
    Date of Patent: February 25, 2020
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Mitesh A. Agrawal, Preetham M. Lobo, Franco Motika, John D. Parker, Gerard M. Salem
  • Patent number: 10571520
    Abstract: A scan chain latch circuit, a method of operating a latch circuit in a scan chain, and a computer-readable medium having stored thereon a data structure defining a scan chain latch circuit for instantiation on a semiconductor die are disclosed. In an embodiment, the scan chain latch circuit comprises a first latch for holding one data value, a second latch for holding another data value, and a multiplexor. The one data value is applied to a first data input of the multiplexor and the another data value is applied to a second data input of the multiplexor. An alternating clock signal is applied to a select input of the multiplexor to control the output of the multiplexor, wherein the output of the multiplexor toggles between the two data values held in the two latches at a defined frequency.
    Type: Grant
    Filed: May 9, 2017
    Date of Patent: February 25, 2020
    Assignee: Internatioanl Business Machines Corporation
    Inventors: Dzmitry S. Maliuk, Franco Stellari, Alan J. Weger, Peilin Song
  • Patent number: 10571521
    Abstract: A method for detecting a failure mode in an electronic selector having a button coupled to a first switch, a second switch, and a third switch, the method includes incrementing a button activation counter once for each button activation event and incrementing a first switch-closed counter, a second switch-closed counter, and a third switch-closed counter once for each button activation event if the respective switch is closed at any time during the button activation event. The method further includes incrementing a first switch-opened counter, a second switch-opened counter, and a third switch-opened counter once for each button activation event. The method further includes evaluating a fault status of the first switch, the second switch, or the third switch when the button activation counter reaches or exceeds a predetermined threshold; and reporting the fault status of the first switch, the second switch or the third switch.
    Type: Grant
    Filed: May 30, 2018
    Date of Patent: February 25, 2020
    Assignee: GM Global Technology Operations, LLC
    Inventors: Dhammika S. Wijesundera, Ming Zhao, Joshua McDonough, Junghyun Kim