Abstract: A printed circuit board (OS) with a circuit for use in a television receiver is carried to a location of a conveyor (OD) for testing process. A printed circuit board takeout device (OB), automatic parts testing device (OF), first sorting device (OG), first automatic parts measuring/adjustment device (OI), second sorting device (OJ), second automatic parts measuring/adjustment device (OK), third sorting device (OL) etc. are sequentially arranged on a path of conveyance of the printed circuit board on the conveyor (OD). The automatic parts testing device (OF) is adapted to test whether or not a component part of a desired value exists in a desired location of the printed circuit board (OS). The first sorting device (OG) is adapted to transfer an unfit printed circuit board to a conveyor (OH) for unfit printed circuit board.

Abstract: Elongated magnetic articles 12 are introduced into vacant positions 31 on a carrier wheel 18 for a given operation. A magnetic bin 40 has a feed end in communication with wheel 18 and includes spaced sidewalls 41-44, with arm sections 43-44 thereof extending substantially beyond the periphery of wheel 18 and along the sides thereof. There is established between said sidewalls 41-44 a first, magnetic field and a second, stronger field to orient and suspend the articles 12 in bin 40. However, the field between arm sections 43-44 is established substantially within the periphery of wheel 18 and such field includes the stronger second field located in a specific region of arm sections 43-44.For loading articles 12 into continuously occurring vacant positions 31 which are advanced in an ascendent path, the stronger second field is located in a lower region of arm sections 43-44.

Abstract: A station for testing electrical components is provided with spaced pairs of cooperative lead-engageable contacts, these pairs being yieldingly openable to arrest a lead arriving therebetween for the test. At least one contact of each pair has an abrading edge which may be shaped to penetrate transversely any wire oxidation of the lead to obtain accurate electrical measurement though requiring only low contact force.

Abstract: A mechanism 30 ejects an article 12 in an ascending path from a position 10 on a carrier wheel 20. An inverted "V" shaped trough 43 is located to face the ascendent path of the article 12, and to be oriented substantially parallel thereto. The article 12 is captured and removably held in an apex portion 49 of the trough 43 by an elongated magnet 56 which establishes a force field parallel to such trough 43, concentrating in the apex portion 49. The article 12 is also oriented by magnet 56 and the apex portion 49 of trough 43 in a desired direction. An air nozzle 60 has a needle-like tube 64 disposed in the apex portion 49 ending adjacent to a body 16 of an article 12. A hose fitting 66 is attached to tube 64 for introducing an air stream therein which impinges upon body 16 and propels article 12 in the desired direction.

Abstract: Removing dice (16) from a wafer (10) which has been attached to a tape layer (12, 14) and severed into individual die (16) leaving the tape layer (12, 14) in one piece is accomplished by attaching the tape layer (12, 14) to a length of adhesive tape (18). The adhesive tape (18) is passed across a surface (20) and through a slot (38) in the surface (20) causing the die (16) to pass across the slot (38) and away from the tape layer (12, 14) which remains attached to the adhesive tape (18).

Abstract: A DIP-handling apparatus comprising a support chassis, an input tray attached to the support chassis and including a plurality of DIP-receiving input trays arrayed in parallel, a reorienting and metering device for receiving a DIP from one of the tracks of the input tray, for reorienting the received DIP and for discharging the DIP onto a track leading to a test head station, an output tray attached to the support chassis, and a shuttle device for transporting the DIP from the test station to a particular track of the output tray as determined by the result of the tests performed at the test station.

Abstract: An apparatus for the high-speed handling of integrated circuit parts. The apparatus consists essentially of two parts, a test wheel and a sort wheel. It singulates parts from a reservoir of untested parts, moves the parts to electrical contacts for test, moves the tested part out of the contacts and sorts the part into the proper bin.