Calibration Or Standardization Methods Patents (Class 250/252.1)
  • Patent number: 11911206
    Abstract: Disclosed is a calibration object for an x-ray system and an optical system, the calibration object comprising: a first part made of a first material having a matte surface, the first material having a first attenuation coefficient of x-rays; a second part made of a second material having a second attenuation coefficient of x-rays different from the attenuation coefficient of the first material; wherein the first part is attached to the second part so that one or more features are detectable by one or more optical cameras.
    Type: Grant
    Filed: August 23, 2019
    Date of Patent: February 27, 2024
    Assignee: NEWTON2 APS
    Inventor: Bo Esbech
  • Patent number: 11913831
    Abstract: An optical sensor includes at least one photodetector configured to be reverse biased at a voltage exceeding a breakdown voltage by an excess bias voltage. At least one control unit is configured to adjust the reverse bias of the at least one photodetector. A method of operating an optical sensor is also disclosed.
    Type: Grant
    Filed: June 13, 2022
    Date of Patent: February 27, 2024
    Assignee: STMICROELECTRONICS (RESEARCH & DEVELOPMENT) LIMITED
    Inventors: Neale Dutton, John Kevin Moore
  • Patent number: 11914087
    Abstract: A method for generating a response function of a scintillator to incident gamma rays of energy within a range of energies of interest, the method including: obtaining the responses {Si} of the scintillator to a plurality of known radionuclides i (i=1, . . . N), each radionuclide i emitting gamma rays with known energetic properties (Eij, Yij), decomposing, for each radionuclide i, response Si into primary responses of the scintillator Sij=ƒ(?ij, Yij, Xij), each primary response corresponding to the response of the scintillator to a received gamma ray of a known energy Eij for this radionuclide i, deriving from the primary responses {Sij} the response function ƒ(?, X) of the scintillator to an incident gamma ray of any energy E within the range of energies of interest.
    Type: Grant
    Filed: May 5, 2022
    Date of Patent: February 27, 2024
    Assignee: SOLETANCHE FREYSSINET
    Inventors: Ludmila Konecná, Tomás Grísa
  • Patent number: 11892356
    Abstract: Test procedures and equipment for the test and calibration of ultra-small thermal imaging cores, or micro-cores are disclosed. Test fixtures for calibration and adjustment that allow for operation and image acquisition of multiple cores at a time may also be provided. Test procedures and fixtures that allow for full temperature calibration of each individual core, as well as providing data useful for uniformity correction during operation, may also be provided as part of the test and manufacture of the core.
    Type: Grant
    Filed: August 27, 2020
    Date of Patent: February 6, 2024
    Assignee: Seek Thermal, Inc.
    Inventors: William J. Parrish, Derek Moran, Blake Henry
  • Patent number: 11879856
    Abstract: A method and a system for providing calibration for a photon counting detector forward model for material decomposition. The flux independent weighted bin response function is estimated using the expectation maximization method, and then used to estimate the pileup correction terms at each tube voltage setting for each detector pixel.
    Type: Grant
    Filed: January 7, 2022
    Date of Patent: January 23, 2024
    Assignee: CANON MEDICAL SYSTEMS CORPORATION
    Inventors: Xiaohui Zhan, Xiaofeng Niu
  • Patent number: 11879838
    Abstract: A method for vicarious spatial characterization of a remote sensor system. The method includes detecting, via the remote sensor system, radiation reflected from at least one body of water corresponding to a plurality of point reflector images, selecting a set of point reflector images from the plurality of point reflector images, the selected set of point reflector images corresponding to sub-pixel point reflector images, analyzing the selected set of point reflector images by executing an algorithm for fitting the point reflector images to obtain a point spread function of the remote sensor system, and determining a spatial characteristic of the remote sensor system based on the point spread function.
    Type: Grant
    Filed: April 13, 2021
    Date of Patent: January 23, 2024
    Assignee: RAYTHEON COMPANY
    Inventors: Randall W. Zywicki, Stephen J. Schiller
  • Patent number: 11879785
    Abstract: A method includes imaging a first graybody with a focal plane array (FPA), wherein the first graybody has a first emissivity, and imaging a second graybody having a lower emissivity than the first graybody. The method includes using data captured while imaging the first and second graybodies to perform non-uniformity correction (NUC) of the FPA.
    Type: Grant
    Filed: September 25, 2020
    Date of Patent: January 23, 2024
    Assignee: Goodrich Corporation
    Inventors: David Eric Berman Lees, Richard Norris Lane
  • Patent number: 11874230
    Abstract: A method for determining an amount of a Raman-invisible gas in a multi-component gas stream includes performing a first and second absolute Raman analysis on the gas stream. A decrease in the absolute Raman bands from the first analysis to the second analysis is attributed to an increase of the Raman-invisible gas in the gas stream. The amount of the Raman-invisible gas is calculated from the difference between the first and second sets of Raman bands. The calculation of the Raman-invisible gas is verified via a measurement and a calculation of a secondary property of the gas stream such as the thermal conductivity of the gas stream or the density of the gas stream.
    Type: Grant
    Filed: June 9, 2022
    Date of Patent: January 16, 2024
    Assignee: Endress+Hauser Optical Analysis, Inc.
    Inventors: Joseph B. Slater, Marc Winter, Oliver Link
  • Patent number: 11867853
    Abstract: A neutron detector having high sensitivity of detection for low energy neutrons is provided. The neutron detector 10 includes a detecting element including a Si semiconductor layer 2, a first electrode 1 formed on one main surface of the Si semiconductor layer 2 and a second electrode 4 formed on the other main surface of the Si semiconductor layer 2, in which the Si semiconductor layer 2 includes a P-type impurity region 2a in contact with the second electrode 4 and an N-type impurity region 2b in contact with the first electrode 1; and a radiator 8 arranged to face the first electrode 1. In addition, a personal dosemeter and a neutron fluence monitor including the same are provided.
    Type: Grant
    Filed: May 25, 2022
    Date of Patent: January 9, 2024
    Assignees: FUJI ELECTRIC CO., LTD., TAKASHI NAKAMURA
    Inventors: Kei Aoyama, Yohei Abe, Tomoya Nunomiya, Masataka Narita, Takashi Nakamura
  • Patent number: 11862429
    Abstract: An ion implantation system comprising: a sample platform; an ion gun; an electrostatic linear accelerator; a direct current (DC) final energy magnet (FEM); and a processor. The processor is programmed to control: a wafer acceptance test instrument, a DC recipe calculator, a DC real energy calculator, and a tool energy shift verifier. The wafer acceptance test instrument is configured to apply a wafer acceptance test (WAT) recipe to a test sample on the sample platform. The DC recipe calculator is configured to calculate a recipe for the DC FEM. The DC real energy calculator is configured to calculate a real energy of the DC FEM. The tool energy shift verifier is configured to verify a tool energy shift of the DC FEM. The ion implantation system is configured to tune the DC FEM based on the verified tool energy shift, and obtain a peak magnetic field of the DC FEM.
    Type: Grant
    Filed: November 1, 2021
    Date of Patent: January 2, 2024
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Yi-Hsiung Lin, Yao-Jen Yeh, Chia-Lin Ou, Cheng-En Lee, Hsuan-Pang Liu
  • Patent number: 11850448
    Abstract: An image calibration method includes capturing and correcting a flood field image for background signal and effects of known image-panel features (dead/bad pixels). The corrected image is processed to separate frequencies characteristic of relative pixel sensitivities from frequencies characteristic of radiation energy fluence. The incident energy fluence has a known maximum in-field energy fluence gradient. A model that describes the incident energy fluence on a detector is generated or received. The corrected image may be modeled at frequencies at or below the maximum in-field energy fluence gradient. A pixel sensitivity matrix (PSM) is generated by adjusting the corrected image with the model of the incident energy fluence on the detector. For example, the corrected image signal may be divided by the model or the model may be subtracted from the corrected image. The PSM may be used to correct additional raw images captured by the detector.
    Type: Grant
    Filed: December 14, 2022
    Date of Patent: December 26, 2023
    Inventors: Jeffrey Vincent Siebers, Mahmoud Ahmed
  • Patent number: 11854779
    Abstract: Systems and methods are described for reducing lab-to-lab and/or instrument-to-instrument variability of Multi-Attribute Methods (MAM) analyses via run-time signal intensity calibration. In various aspects, multiple MAM-based instruments each have detectors and different instrument conditions defined by different instrument models or sets of settings. Each MAM-based instrument receives respective samples and a reference standard as a calibrant. Each MAM-based instrument detects, via its detector, sample isoforms of its respective sample and reference standard isoforms of the reference standard. The MAM-based instruments are associated with processor(s) that determine, via respective MAM iterations, correction factors and sample abundance values corresponding to the sample isoforms. The correction factors are based on the reference standard, and the sample abundance values are based on the correction factors.
    Type: Grant
    Filed: June 6, 2019
    Date of Patent: December 26, 2023
    Assignee: Amgen Inc.
    Inventor: Zhongqi Zhang
  • Patent number: 11845224
    Abstract: An additive manufacturing system for extraction of impurities in additive manufacturing material, the system including an additive manufacturing machine for manufacturing a part using additive manufacturing material. The system may additionally include a conductive plate adjacent to the additive manufacturing material. The system can further include an energy source for distributing an electric charge through the conductive plate adjacent to the additive manufacturing material. Distributing the electric charge through the conductive plate can attract impurities from the additive manufacturing material to the conductive plate.
    Type: Grant
    Filed: July 14, 2021
    Date of Patent: December 19, 2023
    Assignee: The Boeing Company
    Inventor: Nathan D. Hiller
  • Patent number: 11842881
    Abstract: A measurement device that comprises a photoelectric conversion element and a signal processing part that receives, from the photoelectric conversion element, detected pulses that include dark pulses and signal pulses that are outputted in accordance with inputted photons. The signal processing part performs amplitude discrimination on the detected pulses on the basis of a pre-acquired dark pulse amplitude distribution for the photoelectric conversion element.
    Type: Grant
    Filed: December 18, 2018
    Date of Patent: December 12, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Akio Yamamoto, Kazuki Ikeda, Wen Li, Shunsuke Mizutani, Hiroyuki Takahashi
  • Patent number: 11816865
    Abstract: Disclosed are an extrinsic camera parameter calibration method, apparatus and system. The method includes: obtaining a calibration image photographed for a target location in a calibration cabin by a first camera provided therein; determining calibration feature information of the target location from the calibration image; obtaining reference feature information pre-determined from a reference image photographed for a target location in a reference cabin by a second camera provided therein; determining position-posture change data of the first relative to the second camera based on a calibration location of the calibration feature information in the calibration image and a reference location of the reference feature information in the reference image; and determining an extrinsic parameter of the first camera based on the position-posture change data. The extrinsic parameter of the first camera can be calibrated in real time and is closer to a currently actual state of the first camera when used.
    Type: Grant
    Filed: November 24, 2021
    Date of Patent: November 14, 2023
    Inventors: Ye Tao, Hongzhi Zhang
  • Patent number: 11808719
    Abstract: A device for measuring a total cross-sectional phase fraction of a multiphase flow includes a scintillation crystal and a detector. The scintillation crystal is coupled to the detector; and the scintillation crystal includes lutetium-176.
    Type: Grant
    Filed: June 29, 2021
    Date of Patent: November 7, 2023
    Assignee: SEA PIONEERS TECHNOLOGIES CO., LTD.
    Inventor: Jige Chen
  • Patent number: 11809004
    Abstract: In some implementations, a device may include a first flexible barrier that is configured to prevent dust from passing through a cable slot of a network device. The device may further include a second flexible barrier that is configured to absorb at least a portion of an amount of electromagnetic energy generated by the network device.
    Type: Grant
    Filed: May 6, 2022
    Date of Patent: November 7, 2023
    Assignee: Juniper Networks, Inc.
    Inventors: Sameer Walunj, Philippe C. Sochoux, Kaustav Ghosh
  • Patent number: 11804360
    Abstract: The present invention quickly calculates values of optimal excitation parameters which are set in lenses in multiple stages. A multi charged particle beam adjustment method includes forming a multi charged particle beam, calculating, for each of lenses in two or more stages disposed corresponding to object lenses in two or more stages, a first rate of change and a second rate of change in response to change in at least an excitation parameter, the first rate of change being a rate of change in a demagnification level of a beam image of the multi charged particle beam, the second rate of change being a rate of change in a rotation level of the beam image, and calculating a first amount of correction to the excitation parameter of each of the lenses based on an amount of correction to the demagnification level and the rotation level of the beam image, the first rate of change, and the second rate of change.
    Type: Grant
    Filed: November 4, 2020
    Date of Patent: October 31, 2023
    Assignee: NuFlare Technology, Inc.
    Inventors: Tsubasa Nanao, Hirofumi Morita, Takanao Touya
  • Patent number: 11795648
    Abstract: A system configured to determine a property of a paving-related material is provided. The system includes a measuring device configured for measuring a property of a paving-related material and a cellular computer device configured for being in communication with and receiving data from the measuring device.
    Type: Grant
    Filed: April 12, 2021
    Date of Patent: October 24, 2023
    Assignee: TRoxley Electronic Laboratories, INC
    Inventors: Robert Ernest Troxler, Dirk M. Steckmann, Donald E. Weger
  • Patent number: 11800051
    Abstract: A calibration disc for providing uniform irradiance to an optical sensor system includes a first major surface, a second major surface opposite the first major surface, and an edge surface extending around a circumference of the calibration disc. The first major surface is fully reflective and partially diffuse, the second major surface is partially reflective and partially diffuse, and the edge surface is fully reflective and partially diffuse and has an entrance aperture positioned at the edge surface and configured to receive light into the calibration disc. The first major surface, the second major surface and the edge surface are configured to scatter the light received by the entrance aperture within the calibration disc. The second major surface is configured to emit at least some of the light with uniform irradiance.
    Type: Grant
    Filed: December 17, 2021
    Date of Patent: October 24, 2023
    Assignee: Raytheon Company
    Inventor: Dominic R. Gooden
  • Patent number: 11790671
    Abstract: A vision based light detection and ranging (LIDAR) system captures images including a targeted object and identifies the targeted object using an object recognition model. To identify the targeted object, the vision based LIDAR system determines a type of object and pixel locations or a boundary box associated with the targeted object. Based on the identification, the vision based LIDAR system directs a tracking beam onto one or more spots on the targeted object and detects distances to the one or more spots. The vision based LIDAR system updates the identification of the targeted object based on the one or more determined distances.
    Type: Grant
    Filed: October 5, 2020
    Date of Patent: October 17, 2023
    Assignee: Crazing Lab, Inc.
    Inventors: Sang-Pyo Kim, Sreenivasa Kosireddy
  • Patent number: 11772191
    Abstract: A method of processing a substrate includes placing a mask on a top surface of a processing substrate, the mask including openings, placing a cover substrate on the mask, the cover substrate overlapping the openings of the mask, placing the processing substrate on a vessel that accommodates an etching solution, and irradiating a beam onto the top surface of the processing substrate to form processing holes in the processing substrate, where a bottom surface of the processing substrate contacts the etching solution.
    Type: Grant
    Filed: September 29, 2020
    Date of Patent: October 3, 2023
    Assignee: SAMSUNG DISPLAY CO., LTD.
    Inventor: Takayuki Fukasawa
  • Patent number: 11761818
    Abstract: The present invention provides a temperature control method for a heating element, a night vision system calibration device and a system. The night vision system calibration device includes: a first housing, a heating element and a second housing covering the first housing. The heating element includes a heating area, a shape of the heating area being a shape of a target heating body used when a night vision system is calibrated. The second housing and the first housing form an accommodating cavity, and the heating element is disposed in the accommodating cavity. The second housing is provided with a through hole communicating with the accommodating cavity and adapted to the shape of the heating area, and the heating area is configured to emit infrared radiation through the through hole.
    Type: Grant
    Filed: October 17, 2020
    Date of Patent: September 19, 2023
    Assignee: AUTEL INTELLIGENT TECHNOLOGY CORP., LTD.
    Inventors: Yong Chen, Xinguang Tang
  • Patent number: 11764049
    Abstract: Exemplary embodiments may deploy a valve that introduces a sample of a calibrant coaxially with flow exiting a source of a mobile phase flow, such as a liquid chromatography (LC) column, on a path to an ion source for the mass spectrometer (MS). The valve may be positioned remotely on a branch that has a junction with the path leading form the source of the mobile phase flow to the ion source. Alternatively, the valve may be positioned in line on the flow path from the source of the mobile phase flow to the ion source of the MS. A novel five port valve design may be employed. With this valve design, a first position of the valve allows a sample loop for the calibrant to be filled. In a second position, the calibrant is added coaxially to the flow from the source of the mobile phase to the MS. In a third position of the valve, diversion of or infusion to a post-source flow is enabled.
    Type: Grant
    Filed: April 14, 2021
    Date of Patent: September 19, 2023
    Assignee: Waters Technologies Corporation
    Inventors: Michael O. Fogwill, Joseph D. Michienzi, Sylvain Gilles Cormier
  • Patent number: 11759163
    Abstract: A radiation imaging system operable to generate a plurality of radiation images based on different radiation energies, comprises: a communication unit configured to obtain at set communication intervals a temperature of a radiation tube by communication with a radiation generating unit; and a control unit configured to control, based on comparison of the temperature obtained at the communication intervals and a change rate of the temperature and respectively set threshold ranges, an operation for maintaining a driving state of the radiation tube or execution of image processing for obtaining a substance amount of a substance that forms an object using the plurality of radiation images.
    Type: Grant
    Filed: June 25, 2021
    Date of Patent: September 19, 2023
    Assignee: Canon Kabushiki Kaisha
    Inventor: Tomohiro Kawanishi
  • Patent number: 11762105
    Abstract: The present invention relates to an apparatus for determining the location of a radiation source. The apparatus for determining the location of a radiation source according to the present invention comprises: a collimator part for selectively passing radiation therethrough according to the direction in which the radiation is incident; a scintillator part for converting the radiation incident from the collimator part into a light ray; a first optical sensor for converting the light ray incident from one end of the scintillator part into a first optical signal; a second optical sensor for converting the light ray incident from the other end of the scintillator part into a second optical signal; and a location information acquisition part for acquiring information on the location where the light ray is generated in the scintillator part, by using the second optical signal and the second optical signal.
    Type: Grant
    Filed: October 8, 2021
    Date of Patent: September 19, 2023
    Assignees: Korea University Research and Business Foundation, Korea Atomic Energy Research Institute
    Inventors: Jung-Yeol Yeom, Seop Hur, Inyong Kwon, Chanho Kim
  • Patent number: 11756766
    Abstract: According to one embodiment, a charged particle beam writing apparatus includes, a writing mechanism, a writing control circuit, a deflection operation control circuit configured to generate control data for controlling the blanking of each of the charged particle beams based on the shot data, a storage, a blanking control circuit configured to control the blanking based on the control data, and a detector. The writing control circuit is configured to, when the detector detects the abnormality during the writing, interrupt the writing, and generate interrupt position information at a position where the writing is interrupted based on the shot data which has been stored at the storage and is related to the control data that has not been used for controlling the blanking.
    Type: Grant
    Filed: April 5, 2022
    Date of Patent: September 12, 2023
    Assignee: NuFlare Technology, Inc.
    Inventors: Takahito Nakayama, Hirofumi Morita
  • Patent number: 11706380
    Abstract: A radiometric camera having internal black body components and a method for calibrating a radiometric camera having internal black body components. A radiometric camera includes a detector, the detector further including a thermal detector configured to capture thermal images, wherein the thermal detector is pointed in a direction, wherein the radiometric camera is adapted to receive at least one black body element in front of the detector with respect to the direction of the thermal detector, the thermal detector having a plurality of portions including at least one first portion, wherein the at least one black body element affects radiation readings by the at least one first portion of a plurality of portions of the thermal detector when disposed in the radiometric camera.
    Type: Grant
    Filed: September 17, 2020
    Date of Patent: July 18, 2023
    Assignee: ADASKY, LTD.
    Inventors: Oleg Kuybeda, Igor Ivanov, Yair Alpern, Vitaly Kuperman, Neta Sherer
  • Patent number: 11698337
    Abstract: A method including generating integrated computational element (ICE) models and determining a sensor response as the projection of a convolved spectrum associated with a sample library with a plurality of transmission profiles determined from the ICE models. The method includes determining a regression vector based on a multilinear regression that targets a sample characteristic with the sensor response and the sample library and determine a plurality of regression coefficients in a linear combination of ICE transmission vectors that results in the regression vector. The method further includes determining a difference between the regression vector and an optimal regression vector. The method may also include modifying the ICE models when the difference is greater than a tolerance, and fabricating ICEs based on the ICE models when the difference is within the tolerance. A device and a system for optical analysis including multiple ICEs fabricated as above, are also provided.
    Type: Grant
    Filed: October 30, 2020
    Date of Patent: July 11, 2023
    Assignee: Halliburton Energy Services, Inc.
    Inventors: James M. Price, Bin Dai, Christopher Michael Jones
  • Patent number: 11692946
    Abstract: A method for aligning to a pattern on a wafer is disclosed. The method includes the steps of obtaining a first inline image from a first sample wafer, obtaining a first contour pattern of an alignment mark pattern from the first inline image, using the first contour pattern to generate a first synthetic image in black and white pixels, using the first synthetic image as a reference to recognize the alignment mark pattern on a tested wafer, and aligning to a tested pattern on the tested wafer according to a position of the alignment mark pattern on the tested wafer and a coordinate information.
    Type: Grant
    Filed: May 12, 2021
    Date of Patent: July 4, 2023
    Assignee: United Semiconductor (Xiamen) Co., Ltd.
    Inventors: Dian Han Liu, Maohua Ren, Yuan-Chi Pai, Wen Yi Tan
  • Patent number: 11692874
    Abstract: Aspects of the present disclosure provide a method for wavelength calibration of a spectrometer. The method can include receiving a calibration light signal having first spectral components of different first wavelengths; separating and projecting the first spectral components onto pixels of a detector of the spectrometer; establishing a relation between the first wavelengths and pixel numbers of first pixels on which the first spectral components are projected; calculating first residual errors between the first wavelengths and estimated wavelengths that are associated by the relation to the pixel numbers of the first pixels; receiving an optical signal having a second spectral component of a second wavelength; projecting the optical signal onto a second pixel; and calibrating the second wavelength based on a second residual error calculated based on one of the first residual errors that corresponds to a pair of the first pixels between which the second pixel is located.
    Type: Grant
    Filed: June 1, 2021
    Date of Patent: July 4, 2023
    Assignee: Tokyo Electron Limited
    Inventors: Yan Chen, Xinkang Tian
  • Patent number: 11684326
    Abstract: Various methods and systems are provided for laser alignment systems, particularly laser alignment systems of medical imaging systems. In one example, a medical imaging system comprises: a gantry; and a laser mount including: a first section fixedly coupled to the gantry; a second section seated within the first section and slideable within the first section; and a third section seated within the second section and rotatable within the second section, the third section adapted to house a laser radiation source.
    Type: Grant
    Filed: December 7, 2020
    Date of Patent: June 27, 2023
    Assignee: General Electric Company
    Inventors: Vishwanath Nayak K, Saiesh Raiker, Dhaval Pravinbhai Dangashiya
  • Patent number: 11656188
    Abstract: Systems and methods are provided for scanning an item utilizing an X-ray scanner in order to facilitate a determination of whether the X-ray radiation penetrated through the entirety of the scanned item. Various embodiments comprise a conveying mechanism, an X-ray emitter, a detector, and an X-ray penetration grid (XPG). The XPG may comprise a radiopaque grid that may serve as a reference for determining whether radiation passes through the scanned item, the grid oriented such that the grid members are neither parallel nor perpendicular to the direction of travel. Such orientation may minimize or eliminate “ghosted” radiation signals included in a visual display of the radiation received by the detector. A scanned item may be oriented with the XPG such that radiation emitted by the X-ray emitter that passes through a portion of the scanned item must also pass through the XPG before being received by the detector.
    Type: Grant
    Filed: December 31, 2019
    Date of Patent: May 23, 2023
    Assignee: UNITED PARCEL SERVICE OF AMERICA, INC.
    Inventors: Wendie Patricia Hayler, Mark Rutherford, Marcus A. Jones, Anthony David Kirk, Gilbert Walter Vanorder, Roy Douglas Hudson, Paul Mason, James Termini
  • Patent number: 11642093
    Abstract: For calibration of internal dose in nuclear imaging, the dose model used for estimating internal dose in a patient is calibrated. One or more values of the dose model (e.g., a physics simulation, dose kernels, or a transport model) are set based on measured dose. The dose may be measured relative to specific tissues and/or isotopes, providing for tracer and tissue specific calibration. For example, dose from the tracer to be injected into the patient is estimated from emissions as well as measured by a dosimeter in a tissue mimicking tissue mimicking object. These doses are used to calibrate the dose model, which calibrated dose model is then used to determine internal dose for the patient.
    Type: Grant
    Filed: September 10, 2020
    Date of Patent: May 9, 2023
    Assignee: Siemens Medical Solutions USA, Inc.
    Inventors: Alexander Hans Vija, Michal Cachovan, Miesher Rodrigues
  • Patent number: 11630022
    Abstract: Various techniques are disclosed to provide a quantification of a gas leak based on an image of a gas plume generated by the leak. An image location that corresponds to the origin of the gas leak is determined. An exit border is disposed on the image based on the image location that corresponds to the origin of the gas leak. A gas leak rate is computed based at least on gas concentration values of the pixels that overlap the exit border.
    Type: Grant
    Filed: December 11, 2019
    Date of Patent: April 18, 2023
    Assignee: FLIR SYSTEMS AB
    Inventor: Hugo Hedberg
  • Patent number: 11619746
    Abstract: An apparatus and method of intersensor calibration including using a zero airmass response constant proportional to sensor absolute radiometric gain coefficients to monitor sensor radiometric stability. Tracking the ratio of zero airmass response constant values for similar bands between two sensors provides a parameter on a common radiometric scale for evaluating interoperability performance. The method includes imaging a solar signal using a mirror to create an image reference target, detecting the image reference target using a first sensor, generating a zero airmass response constant based on a ground sampling distance of the first sensor and an at-sensor radiance value, computing a radiometric gain coefficient of the first sensor using the zero airmass response constant, and comparing the radiometric gain coefficient of the first sensor to a radiometric gain coefficient of a second sensor to determine a gain ratio between the first sensor and second sensor.
    Type: Grant
    Filed: February 18, 2021
    Date of Patent: April 4, 2023
    Assignee: RAYTHEON COMPANY
    Inventor: Stephen J. Schiller
  • Patent number: 11619897
    Abstract: In an image forming apparatus, an image forming unit configured to form a toner image on a transfer medium includes four sets of a photoconductor drum and a development roller, respectively, for forming toner images of first, second, third and fourth colors, arranged in this order, in a direction opposite to a direction of movement of the transfer medium moving toward a detector configured to detect a toner image formed on the transfer medium. A controller executes a bias-corrective test image forming process in which a first bias-corrective test image of the first color is arranged in a position downstream of other three first bias-corrective test images, and a second bias-corrective test image of the first color is arranged in a position between two first bias-corrective test images selected among other three first bias-corrective test images, in the direction of movement of the transfer medium.
    Type: Grant
    Filed: June 3, 2022
    Date of Patent: April 4, 2023
    Assignee: BROTHER KOGYO KABUSHIKI KAISHA
    Inventors: Miho Ishida, Shintaro Fukuoka, Toshio Furukawa, Toshinori Araki, Masaya Takasu, Takuro Nishimura
  • Patent number: 11609593
    Abstract: An LCR meter with a fast balancing method, with only one necessary measurement of voltages. The LCR meter uses to speed up balancing, separation in time measurement of a device under test (DUT), and other parasitic impedances, including a leakage impedance. The leakage impedance and the other parasitic impedances of a fixture and the LCR meter itself are measured during open/short calibration and saved to memory. The DUT is measured during measurement using already known parasitic impedances. This allows calculating balancing conditions using only one measurement of voltages.
    Type: Grant
    Filed: April 2, 2022
    Date of Patent: March 21, 2023
    Inventor: Oleksandr Kokorin
  • Patent number: 11604146
    Abstract: A luminometer (400) includes a light detector (630) configured to sense photons (135). The luminometer (400) includes an analog circuit (915a) configured to provide an analog signal (965) based on the photons (135) emitted from assay reactions over a time period and a counter circuit (915b) configured to provide a photon count (970) based on the photons (135) emitted from the assay reactions over the time period. The luminometer (400) includes a luminometer controller (905) configured to, in response to an analog signal value of the analog signal (965) being greater than a predetermined value, determine and report a measurement value of the photons (135) emitted from the assay reactions over the time period based on the analog signal value of the analog signal (965) and a linear function (1010). Optionally, the linear function (1010) is derived from a relationship between the analog signal (965) and the photon count (970).
    Type: Grant
    Filed: September 19, 2018
    Date of Patent: March 14, 2023
    Assignee: Beckman Coulter, Inc.
    Inventors: Richard Wolf, David Sorrentino, Takayuki Mizutani, Glenn Davis
  • Patent number: 11595593
    Abstract: An infrared image sensor includes: a plurality of reference circuits configured to provide a plurality of reference analog values to a plurality of bolometer cells, respectively; a front-end analog circuit configured to collect a plurality of output analog values according to the plurality of reference analog values; and a noise suppression circuit configured to switch a correspondence between the plurality of bolometer cells and the plurality of reference analog values at unit time intervals.
    Type: Grant
    Filed: March 24, 2021
    Date of Patent: February 28, 2023
    Assignee: Samsung Electro-Mechanics Co., Ltd.
    Inventors: Chang Seok Lee, Joon Hyung Lim, Ji Hwan Kim
  • Patent number: 11592858
    Abstract: An LCR meter to increase accuracy of balancing uses sub-balancing method, additional to analog balancing by trans-impedance amplifier (TIA). For this, the LCR meter, based on TIA, to correct analog auto-balancing, applies the inverted voltage equal to unbalanced voltage to noninverting input of the TIA. And only one measurement of voltages is needed for.
    Type: Grant
    Filed: July 26, 2022
    Date of Patent: February 28, 2023
    Inventor: Oleksandr Kokorin
  • Patent number: 11576746
    Abstract: The embodiments of the present invention provide a system and method for light and shadow guided needle positioning. DICOM images of a patient are captured for identifying a point of insertion of a needle on the patient's body and a target point inside the patient's body. Needle coordinates are computed based on the captured DICOM images to position the mechanical arms. Light is projected at a particular angle on the needle to form shadows of the needle. Laser light beams are projected to form cross hair at the point of insertion. Images or videos of the point of insertion, shadow of the needle and the cross hair are captured and displayed on a monitoring unit. A virtual circle is projected on the displayed image and is aligned with the point of insertion, shadow of the needle and cross hair in order to insert the needle precisely.
    Type: Grant
    Filed: September 19, 2017
    Date of Patent: February 14, 2023
    Assignee: Kornerstone Devices Pvt. Ltd.
    Inventors: Santosham Roy, Cherukandath Rajendran
  • Patent number: 11573190
    Abstract: A calibration method for an X-ray measuring device includes mounting a calibration tool on a rotating table, identifying centroid positions from an output of an X-ray image detector, calculating projection transformation matrixes from the centroid positions and known relative positional intervals, repeating to identify the centroid positions from the output of the X-ray image detector and to calculate the projection transformation matrixes from the centroid positions and known relative positional intervals while the rotating table is rotated twice or more by a predetermined angle, and calculating a rotation center position of the rotating table on the basis of the projection transformation matrixes. The calibration method thereby allows easy calculation of the rotation center position of the rotating table on which an object to be measured is mounted in a rotatable manner, with the simple process.
    Type: Grant
    Filed: June 28, 2021
    Date of Patent: February 7, 2023
    Assignee: MITUTOYO CORPORATION
    Inventors: Masato Kon, Hiromu Maie, Seiji Sasaki, Jyota Miyakura
  • Patent number: 11573339
    Abstract: A method and system for providing improved timing calibration information for use with apparatuses performing Time of Flight Positron Emission Tomography scans. Relative timing offset, including timing walk, within a set of processing units in the scanner are obtained and corrected using a stationary limited extent positron-emitting source, and timing offset between the set of processing units is calibrated using an internal radiation source, for performing calibration.
    Type: Grant
    Filed: June 22, 2020
    Date of Patent: February 7, 2023
    Assignee: CANON MEDICAL SYSTEMS CORPORATION
    Inventors: Xiaoli Li, Yi Qiang, Kent C. Burr, Peng Peng
  • Patent number: 11565133
    Abstract: An image calibration method includes capturing and correcting a flood field image for background signal and effects of known image-panel features (dead/bad pixels). The corrected image is processed to separate frequencies characteristic of relative pixel sensitivities from frequencies characteristic of radiation energy fluence. The incident energy fluence has a known maximum in-field energy fluence gradient. A model that describes the incident energy fluence on a detector is generated or received. The corrected image may be modeled at frequencies at or below the maximum in-field energy fluence gradient. A pixel sensitivity matrix (PSM) is generated by adjusting the corrected image with the model of the incident energy fluence on the detector. For example, the corrected image signal may be divided by the model or the model may be subtracted from the corrected image. The PSM may be used to correct additional raw images captured by the detector.
    Type: Grant
    Filed: June 2, 2021
    Date of Patent: January 31, 2023
    Assignee: UNIVERSITY OF VIRGINIA PATENT FOUNDATION
    Inventors: Jeffrey Vincent Siebers, Mahmoud Ahmed
  • Patent number: 11569079
    Abstract: A gas analyzer and a method for performing mass spectrometry analysis includes a membrane configured to receive an input flow of carrier gas. The membrane defines a variable thickness region between first and second positions along an input face of the membrane and separates the analyte sample into an output flow of analyte molecules. A mass spectrometer is disposed downstream of the membrane and includes an input orifice for receiving the output flow. The mass spectrometer is configured to perform a response profile analysis of the analyte molecules in the sample analyte.
    Type: Grant
    Filed: April 13, 2021
    Date of Patent: January 31, 2023
    Assignee: INFICON, Inc.
    Inventor: Shawn M. Briglin
  • Patent number: 11568583
    Abstract: The disclosure relates to a system and method for medical imaging. The method may include: move, by a motion controller, a phantom along an axis of a scanner to a plurality of phantom positions; acquire, by a scanner of the imaging device, a first set of PET data relating to the phantom at the plurality of phantom positions; and store the first set of PET data as an electrical file. The length of an axis of the phantom may be shorter than the length of an axis of the scanner, and at least one of the plurality of phantom positions may be inside a bore of the scanner.
    Type: Grant
    Filed: January 25, 2021
    Date of Patent: January 31, 2023
    Assignee: SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD.
    Inventors: Weiping Liu, Xiaoyue Gu, Youjun Sun
  • Patent number: 11561131
    Abstract: A determination method determines a difference voltage between a breakdown voltage and a bias voltage. A temperature compensation unit provides temperature compensation for the gain of the APD by controlling the bias voltage based on the difference voltage. The bias voltage is “Vr”, and the gain of the APD to which the bias voltage is applied is “M”. The slope and intercept of the regression line having “(1/M)×(dM/dVr)” as an objective variable and “M” as an explanatory variable in data indicating the correlation between the bias voltage and the gain are obtained. “?V” calculated by substituting the slope into “a” in the Equation (1), substituting the intercept into “b” in the Equation (1), and substituting a gain to be set in an avalanche photodiode of a light detection device into “Md” in the Equation (1) is determined as the difference voltage.
    Type: Grant
    Filed: November 29, 2019
    Date of Patent: January 24, 2023
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventor: Hironori Sonobe
  • Patent number: 11549807
    Abstract: A pattern according to an embodiment includes first and second line patterns, each of the first and second line patterns extends in a direction intersecting a <111> direction and has a side surface, the side surface has at least one {111} crystal plane, the side surface of the first line pattern has a first roughness, and the side surface of the second line pattern has a second roughness larger than the first roughness.
    Type: Grant
    Filed: March 9, 2020
    Date of Patent: January 10, 2023
    Assignee: KIOXIA Corporation
    Inventors: Susumu Iida, Satoshi Tanaka, Takayuki Uchiyama
  • Patent number: RE49373
    Abstract: Methods and systems for operating a flow cytometer can include forward scatter values, side scatter values, and fluorescence intensity values for events of an unstained sample and associating the fluorescence intensity values with forward scatter-side scatter side scatter plot regions. Methods and systems for operating a flow cytometer can also include measuring forward scatter values, side scatter values, and fluorescence intensity values for events of a stained sample, determining forward scatter-side scatter plot locations for the events of the stained sample, and for each event of the stained sample, subtracting the fluorescence intensity value associated with the forward scatter-side scatter plot region that contains the forward scatter-side scatter plot location of the stained sample event from the measured fluorescence intensity value of the stained sample event at that forward scatter-side scatter plot location.
    Type: Grant
    Filed: June 4, 2019
    Date of Patent: January 17, 2023
    Assignee: Becton, Dickinson and Company
    Inventor: Heng Xu