With Evacuation Or Sealing Means Patents (Class 250/289)
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Patent number: 7148475Abstract: An instrument including a chromatographic column with a final detector and a mass spectrometer. A temperature of an interface including an output tube and a capillary tube adjusting the flow to the spectrometer is adjusted using a leakage flow or pressure sensor outputting data to a control module that adjusts the interface temperature to equalize flows in the tubes.Type: GrantFiled: January 9, 2004Date of Patent: December 12, 2006Assignees: Commissariat a l'Energie Atomique, Centre National de la Recherche ScientifiqueInventors: Ronan Cozic, Jean-Louis Gass, Jean Bourliaud
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Patent number: 7145137Abstract: A nebulizer adapted for adjusting a position of a capillary tube contained within the nebulizer is provided. The nebulizer includes an elongated tubular shell having a gas input port and a gas output port, a capillary adjustment adapter for displacing the capillary tube in a lateral direction via a rotational force, and a connector for connecting the elongated tubular shell, the capillary adjustment adapter and the capillary tube.Type: GrantFiled: December 22, 2004Date of Patent: December 5, 2006Assignee: The George Washington UniversityInventors: Akbar Montaser, Craig S. Westphal, Kaveh Kahen, William F. Rutkowski, Billy W. Acon
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Patent number: 7119329Abstract: In a mass spectrometer, an ion of a sample gas is produced in an ion source by colliding the gas with an electron beam, and is introduced into a magnetic field or an electric field. The ion is separated based on the mass number, and the sample is analyzed from a mass spectrum. The ion source has an electrode made of stainless steel, which is baked at a temperature in a range from 200° C. to 700° C. in an air atmosphere.Type: GrantFiled: May 26, 2005Date of Patent: October 10, 2006Assignee: Shimadzu CorporationInventors: Manabu Shimomura, Hiroto Itoi
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Patent number: 7119330Abstract: A plasma source mass spectrometer (20) having an ion beam extraction electrode (45) associated with a skimmer cone (40) to restrict the pumping of gas from a region (60) immediately behind the skimmer cone orifice (42) to provide a higher pressure (e.g. 1–10?2 Torr) in the region (60) compared to the pressure downstream of the electrode (45) (e.g. 10?3–10?4 Torr). This provides a collisional gas volume (60) for plasma (28) for attenuating polyatomic and multicharged interfering ions prior to extraction of an ion beam (49). In one embodiment a substance (e.g. hydrogen) can be supplied into the region (60) to assist attenuation of polyatomic and multicharged interfering ions by reactive or collisional interactions.Type: GrantFiled: February 27, 2003Date of Patent: October 10, 2006Assignee: Varian Australia PTY LTDInventor: Iouri Kalinitchenko
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Patent number: 7095016Abstract: A method and apparatus are provided for analyzing an analyte at low concentration in a liquid sample by photoionization and mass spectrometry. An inlet system is provided for direct injection of the liquid sample using a capillary tube. The method and apparatus allow for 20 to 2000-fold improvement of the lower detection limit of an analyte in a liquid sample compared to a conventional liquid chromatography/mass spectrometer apparatus.Type: GrantFiled: April 29, 2004Date of Patent: August 22, 2006Assignee: SRI InternationalInventors: Harald Oser, Michael J. Coggiola, Steven E. Young, David R. Crosley
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Patent number: 7064321Abstract: An ion funnel screen ions from a gas stream flowing into a differential pump stage of a mass spectrometer, transfers them to a subsequent differential pump stage. The ion funnel uses apertured diaphragms between which gas escapes easily. Holders for the apertured diaphragms are also provided that offer little resistance to the escaping gas while, at the same time, serving to feed the RF and DC voltages.Type: GrantFiled: April 6, 2004Date of Patent: June 20, 2006Assignee: Bruker Daltonik GmbHInventor: Jochen Franzen
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Patent number: 7034292Abstract: A mass spectrometer is configured with individual multipole ion guides, configured in an assembly in alignment along a common centerline wherein at least a portion of at least one multipole ion guide mounted in the assembly resides in a vacuum region with higher background pressure, and the other portion resides in a vacuum region with lower background pressure. Said multipole ion guides are operated in mass to charge selection and ion fragmentation modes, in either a high or low pressure region, said region being selected according to the optimum pressure or pressure gradient for the function performed. The diameter, lengths and applied frequencies and phases on these contiguous ion guides may be the same or may differ. A variety of MS and MS/MSn analysis functions can be achieved using a series of contiguous multipole ion guides operating in either higher background vacuum pressures, or along pressure gradients in the region where the pressure drops from high to low pressure, or in low pressure regions.Type: GrantFiled: May 30, 2003Date of Patent: April 25, 2006Assignee: Analytica of Branford, Inc.Inventors: Craig M. Whitehouse, David G. Welkie, Gholamreza Javahery, Lisa Cousins
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Patent number: 7005634Abstract: An ionization apparatus according to the present invention has a mechanism for causing metal ions emitted from an ion emitter to attach to an introduced target gas so as to generate ions of the sample gas and emits the ions of the sample gas to a mass spectrometer. The mass spectrometer has a zone in which one or both of an electric field and magnetic field are formed. As the electrode for causing the generation of cleaning plasma in the ionization zone generating the ions of the sample gas, the ion emitter is used. The ion emitter causes the generation of plasma in connection with a hollow vessel and removes deposits on components facing the ionization zone by the plasma. The plasma cleaning process is performed consecutively at a suitable timing after the ionization process. Due to the above configuration, deteriorated performance in ionization can be restored in a short time, a memory effect can be prevented, and accurate mass spectrometry becomes possible.Type: GrantFiled: March 22, 2002Date of Patent: February 28, 2006Assignee: Anelva CorporationInventors: Yoshiro Shiokawa, Megumi Nakamura, Tohru Sasaki, Toshihiro Fujii
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Patent number: 7002147Abstract: A vacuum system comprising: 1) an ion pump; 2) power supply; 3) a high voltage DC—DC converter drawing power from the power supply and powering the vacuum pump; 4) a feedback network comprising an ammeter circuit including an operational amplifier and a series of relay controlled scaling resistors of different resistance for detecting circuit feedback; 5) an optional power block section intermediate the power supply and the high voltage DC—DC converter; and 6) a microprocessor receiving feedback information from the feedback network, controlling which of the scaling resistors should be in the circuit and manipulating data from the feedback network to provide accurate vacuum measurement to an operator.Type: GrantFiled: October 6, 2004Date of Patent: February 21, 2006Assignee: Southeastern Univ. Research Assn.Inventor: John Christopher Hansknecht
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Patent number: 6989532Abstract: The present invention provides a mass spectrometer including an ion source for atomizing a liquid sample into ionized droplets and spraying ions in a predetermined direction. According to the present invention, the ion source includes a gas transport pipe and a liquid supply pipe; the gas transport pipe has an ejection port at its front end and a gas supply passage for sending an assist gas to the ejection port; the inner surface of the gas supply passage has a tapered section located in proximity to the ejection port, where the diameter of the tapered section decreases toward the ejection port; the liquid supply pipe is inserted into the gas supply passage so that the front end of the liquid supply pipe is located in proximity to the ejection port; three or more spheres having the same size are inserted between the inner surface of the gas supply passage and the outer surface of the liquid supply pipe; and a pressing mechanism is used to press the spheres onto the tapered section.Type: GrantFiled: March 9, 2005Date of Patent: January 24, 2006Assignee: Shimadzu CorporationInventor: Takahiro Harada
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Patent number: 6949742Abstract: A system for producing electrospray ions includes a thermal inkjet material dispenser configured to selectively emit a plurality of sample material particles, and an electrically conducting grid disposed in proximity with the thermal inkjet material dispenser, the grid being configured to permit a selective passage of the emitted sample material particles.Type: GrantFiled: March 15, 2004Date of Patent: September 27, 2005Assignee: Hewlett-Packard Development Company, L.P.Inventor: Iddys D. Figueroa
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Patent number: 6936817Abstract: The invention provides a miniaturized optical column for a charged particle beam apparatus for examining a specimen (14). The column is constituted by, among other things, a charged particle source (2) for providing a beam of charged particles (10); a lens system for guiding the beam of charged particles (10) from the source (2) onto the specimen (14); and a housing (40) which, during operation, is set on beam boost potential.Type: GrantFiled: January 29, 2001Date of Patent: August 30, 2005Assignee: ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbHInventor: Hans-Peter Feuerbaum
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Patent number: 6894383Abstract: Briefly, a reduced substrate Micro-Electro-Mechanical Systems (MEMS) device, for example, a low-loss Film Bulk Acoustic Resonators (FBAR) filter or a low-loss FBAR Radio Frequency filter, and a process and a system to produce the same. A reduced substrate MEMS device in accordance with embodiments of the present invention may include a membrane bonded between packaging parts. A process in accordance with embodiments of the present invention may include bonding a first packaging part to a MEMS device including a support substrate, removing the support substrate, and bonding a second packaging part to the MEMS device.Type: GrantFiled: March 31, 2003Date of Patent: May 17, 2005Assignee: Intel CorporationInventors: Eyal Bar-Sadeh, Alexander Talalyevsky, Eyal Ginsburg
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Patent number: 6872956Abstract: A cascade type pump arrangement for a particle beam device has first and second turbomolecular pumps, wherein an outlet of the second turbomolecular pump is forepumped by an intermediate pressure region situated between a main pump port and an outlet of the first turbomolecular pump. The particle beam device has a particle beam source operated in ultra high vacuum and a specimen chamber operated at pressures from high vacuum at least up to 1 hPa.Type: GrantFiled: January 6, 2003Date of Patent: March 29, 2005Assignee: Carl Zeiss NTS GmbHInventors: Peter Gnauck, Volker Drexel
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Patent number: 6844546Abstract: An explosive detection system including a sample injection region, an ion source region for generating ions of a sample injected by the ion injection region, a mass analysis region for analyzing mass of the ions, a heater for heating the sample injection region and the ion source region, a plurality of pumps for exhausting a chamber in which the mass analysis region is disposed, and a controller for controlling the regions and the plurality of pumps. The controller conducts control so as to heat the sample injection region and the ion source region with the heaters, then reduce heating electric power supplied to the heaters in order to prevent a predetermined electric power value from being exceeded, and drive the plurality of pumps successively to exhaust the chamber.Type: GrantFiled: August 28, 2002Date of Patent: January 18, 2005Assignee: Hitachi, Ltd.Inventors: Hisashi Nagano, Yasuaki Takada, Izumi Waki, Koushou Aikawa, Masayuki Takizawa, Shigenori Morishima
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Patent number: 6844556Abstract: In an ion source, within a support body which supports a plasma production chamber for producing a plasma on the basis of an ion source flange, a cavity is provided ranging from a position near the plasma production chamber to a position near the ion source flange. The cavity serves as a cooling medium passage which introduces a cooling medium to a position near the plasma production chamber to cool the plasma production chamber. The plasma production chamber is cooled at a position very near it by the cooling medium. Therefore, temperature of the plasma production chamber at the time of plasma production is kept at low temperatures.Type: GrantFiled: May 21, 2003Date of Patent: January 18, 2005Assignee: Nissin Electronics Co., Ltd.Inventor: Toshiaki Kinoyama
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Patent number: 6835929Abstract: Disclosed herein is a mass spectrometer having an atmospheric pressure photoionization (APPI) source that comprises a discharge lamp coupled to a nebulizer, wherein the nebulizer is at, or near, atmospheric pressure. The discharge lamp curves around the vapor path and this coaxial design offers significant advantages over the prior art such as increased photon flux resulting in increased photoionization efficiency. One of the significant benefits of an increase in photon flux is that absorption of the UV radiation by solvents such as acetonitrile is minimized. The APPI source described herein also facilitates a larger photoionization interaction zone with effluent from the nebulizer, which may be heated. Additionally, no dopant is required in this coaxial APPI system.Type: GrantFiled: January 27, 2003Date of Patent: December 28, 2004Assignee: Waters Investments LimitedInventor: Jeffrey W. Finch
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Patent number: 6825466Abstract: The apparatus of the invention consists of two module, one of which carries an sample plate handling device, which is docked to the mass spectrometer in a working position for loading ionized samples from the atmospheric pressure environment to the vacuum chamber of the mass spectrometer, while the other one is used for picking up the sample plate carrier with preliminarily prepared and inserted sample plates into and from the storage cassette and for transferring the sample plates carriers to a stand-by position. The sample plate handling device is moveable between the aforementioned working position and the stand-by position and is provided with means for taking the stand-by sample plate from the carrier and for holding it during delivery of the ionized samples to the mass spectrometry, as well as with means for shifting the sample plate inside the sample plate handling device in the X-Y coordinate system for arranging a selected sample cell coaxially with the center of the ion-sampling orifice.Type: GrantFiled: July 9, 2003Date of Patent: November 30, 2004Assignee: Automated Biotechnology, Inc.Inventor: Vladimir Mordekhay
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Patent number: 6822224Abstract: A tandem mass spectrometer is disclosed. A first mass analyzer within a low-pressure region is provided for passing ions therethrough. A collision cell is at an ion outlet of the mass analyzer to provide a location for ions to collide therein with a collision gas to form resultant ions. The resultant ions are then provided to a FAIMS analyzer for separation thereof and the separate resultant ions are provided to a mass analyzer for analysis.Type: GrantFiled: September 3, 2002Date of Patent: November 23, 2004Assignee: National Research Council CanadaInventor: Roger Guevremont
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Patent number: 6812453Abstract: An ion guide is disclosed wherein a travelling DC wave is passed along the length of the ion guide so that ions exit the ion guide having substantially the same velocity.Type: GrantFiled: June 25, 2002Date of Patent: November 2, 2004Assignee: Micromass UK LimitedInventors: Robert Harold Bateman, Kevin Giles, Steve Pringle
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Patent number: 6809322Abstract: The invention provides for a scanning electron or ion beam instrument capable of transferring the beam from a high vacuum chamber (8) into a high pressure chamber (5) via aperture (1) and aperture (2). The beam is deflected and scanned by coils (3) generally positioned between apertures (1) and (2). The amplitude of deflection of the beam over a specimen placed inside chamber (5) is substantially larger than the diameter of aperture (1). Leaking gas through aperture (1) is removed via port (7) by appropriate pumping apparatus. The size of aperture (1) is such that the pressure in chamber (6) combined with the supersonic jet and shock waves naturally forming therein do not result in catastrophic electron beam loss in chamber (6). The addition of appropriate detection means result in an instrument characterised by superior performance over prior art by way of better field of view at low magnification, better vacuum system and improved detection and imaging capabilities.Type: GrantFiled: February 3, 2003Date of Patent: October 26, 2004Inventor: Gerasimos Daniel Danilatos
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Patent number: 6809312Abstract: The present invention is for an improved ionization source chamber and ion beam delivery system which includes a vacuum chamber and flange arrangement, for mounting the means for transferring sample ions from the port to a mass analyzer and for mounting the ion production means, respectively. The flange containing the ion production means may be attached to the vacuum chamber via a hinge such that the flange can open as a door to provide easy access to the ion transfer electrodes in the vacuum chamber. Further, a variety of different ion production means may be mounted on the flange of the ionization source chamber of the present invention. As a result, any ion production means may be used with the present invention by substituting a flange which includes the desired ion production means.Type: GrantFiled: May 12, 2000Date of Patent: October 26, 2004Assignee: Bruker Daltonics, Inc.Inventors: Melvin A. Park, Houle Wang
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Patent number: 6806464Abstract: In a method for detecting and identifying bioaerosol particles in the air, the bioaerosol particles in a particle stream are selected in an ATOFMS (aerosol time-of-flight mass spectrometer) by means of fluorescence techniques, and only the selected bioaerosol particles are ionized, for instance on the basis of MALDI (matrix-assisted laser desorption/ionization), after which the resulting ions are detected and the bioaerosol particles are identified. The selection of bioaerosol particles takes place by means of laser radiation, generated by a first laser device, of a wavelength which in specific substances in bioaerosol particles effects a fluorescence, after which by means of a fluorescence detector the bioaerosol particles are selected and a second laser device is triggered to emit light of a wavelength which effects the ionization of the bioaerosol particles selected only by the fluorescence detector.Type: GrantFiled: December 10, 2003Date of Patent: October 19, 2004Assignee: Technische Universiteit DelftInventors: Michael Anthony Stowers, Arjan Laurens Wuijckhuijse, Johannes Cornelis Maria Marijnissen, Charles Eliza Kientz
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Patent number: 6791079Abstract: A mass spectrometer of the present invention is based on the use of quadrupole lenses with angular gradient of the electrostatic field. The device consists of an ion source connected to an ion mass separation chamber that contains a plurality of sequentially arranged electrostatic quadrupole lenses which generate a helical electrostatic field for sending ions along helical trajectories in a direct and return stroke. Scattering of positions of points of return is reduced by means of electrostatic mirrors located at the end of the direct stroke, while ions of different masses perform their return strokes along helical trajectories different from those of the direct strokes due to the use of a magnetic and/or electrostatic mirrors. An ion-electron emitting screen is installed on the path of ions in the reverse stroke, and positions of collision of the ions with the ion-electron emitting screen over time and space are detected with the use of micro-channel plate detectors.Type: GrantFiled: January 29, 2002Date of Patent: September 14, 2004Inventor: Yuri Glukhoy
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Patent number: 6642516Abstract: Mass spectometer system and method of use are disclosed. Briefly described, one embodiment of the mass spectrometry system, among others, includes a radio frequency multipole assembly, an inner structure, and a laser diode array system. The inner structure has an outside, an inside, and an opening. The inner structure substantially surrounds the radio frequency multipole assembly. The laser diode array system is disposed on the outside of the inner structure adjacent the side opening such that laser radiation emitted from the laser diode array system travels through the side opening.Type: GrantFiled: December 18, 2002Date of Patent: November 4, 2003Assignee: Agilent Technologies, Inc.Inventors: Stuart C Hansen, Christian A. Le Cocq, Gangqiang Li, Scott W Corzine
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Publication number: 20030193019Abstract: An explosive detection system including a sample injection region, an ion source region for generating ions of a sample injected by the ion injection region, a mass analysis region for analyzing mass of the ions, a heater for heating the sample injection region and the ion source region, a plurality of pumps for exhausting a chamber in which the mass analysis region is disposed, and a controller for controlling the regions and the plurality of pumps. The controller conducts control so as to heat the sample injection region and the ion source region with the heaters, then reduce heating electric power supplied to the heaters in order to prevent a predetermined electric power value from being exceeded, and drive the plurality of pumps successively to exhaust the chamber.Type: ApplicationFiled: August 28, 2002Publication date: October 16, 2003Inventors: Hisashi Nagano, Yasuaki Takada, Izumi Waki, Koushou Aikawa, Masayuki Takizawa, Shigenori Morishima
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Patent number: 6608304Abstract: A mass spectrometer (MS) which uses the Fourier transform ion cyclotron resonance (FTICR) technique to determine the mass of ions. The MS is prepared with a surface that guarantees that a particle striking the surface will have at least one contact with the cathode and will most likely be re-pumped before escaping into the vacuum chamber volume.Type: GrantFiled: October 2, 2000Date of Patent: August 19, 2003Assignee: Siemens Energy & AutomationInventors: Duane P. Littlejohn, Thomas Knudsen
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Patent number: 6586730Abstract: A compact, easy-to-use device is provided which takes in a sample over a shorter distance, the sample introducing time is shortened, and contamination is prevented when the sample is introduced. A burner for generating a plasma, a deflecting portion provided with parallel electrodes for deflecting ions, and an analyzer room for performing mass separation of the deflected ions, these being disposed in a plane in the horizontal direction, and a sample setting portion for setting a sample, a peristaltic pump for aspirating the sample and the burner for introducing and burning the aspirated sample are disposed in a plane in the vertical direction relative to the aforesaid plane. The sample is supplied to the burner from below, and the ions generated by the plasma are made to flow on a horizontal plane.Type: GrantFiled: February 16, 2000Date of Patent: July 1, 2003Assignee: Hitachi, Ltd.Inventors: Seiji Kamimura, Isamu Takekoshi, Yasushi Terui, Yasuaki Takada, Takayuki Nabeshima, Minoru Sakairi
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Patent number: 6573110Abstract: A combinatorial chemistry system allows for the dual processing of different molecules coated on a library of beads. The system includes beads coated with different molecules on each bead, a bead holder, screening equipment and characterization equipment. Molecules on the beads are both screened and characterized simultaneously.Type: GrantFiled: December 15, 1999Date of Patent: June 3, 2003Assignee: The Penn State Research FoundationInventors: Robert J. Hessler, Robert Braun, Nicholas Winograd
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Patent number: 6548263Abstract: The present invention describes novel methods for making a substrate for selective cell patterning, and the substrates themselves, wherein the method comprises contacting reactive hydroxyl groups on the surface of a substrate with a hydroxyl-reactive bifunctional molecule to form a monolayer, and using stencils to deposit cell repulsive or cell adhesive moieties in controlled locations on the cell culture substrate. Methods comprising selective differentiation of stem cells to create tissue specific and organ-specific cell substrates, as well as the cell substrates themselves are also provided.Type: GrantFiled: March 31, 2000Date of Patent: April 15, 2003Assignee: Cellomics, Inc.Inventors: Ravi Kapur, Terri Adams
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Publication number: 20030038245Abstract: A field ionizing element formed of a membrane that houses electrodes therein that are located closer to one another than the mean free path of the gas being ionized. The membrane includes a supporting portion, and a non supporting portion where the ions are formed. The membrane may be used as the front end for a number of different applications including a mass spectrometer, a thruster, an ion mobility element, or an electrochemical device such as a fuel cell.Type: ApplicationFiled: June 25, 2002Publication date: February 27, 2003Applicant: Ionfinity LLCInventor: Frank T. Hartley
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Patent number: 6521887Abstract: An ungated, time-of-flight ion mass spectrograph utilizing a continuous ion beam that is rastered (swept) by electrostatic deflection plates at the entrance of a time-of-flight drift tube is described. After an ion is deflected, it follows a trajectory in the drift tube that depends on the phase of the raster and is detected by a position-sensitive detector. The detected position provides information concerning the time when the ion entered the drift tube. This information, when combined with knowledge of the raster voltage at the time that the ion was detected, provides a method for determining the time-of-flight of the ion in the drift tube. Using the time-of-flight and the distance traveled in the drift tube, which is also determined by the detected position of the ion, ion speed is determined. Ion mass-per-charge ratio can then be determined for a monoenergetic ion beam.Type: GrantFiled: May 12, 1999Date of Patent: February 18, 2003Assignee: The Regents of the University of CaliforniaInventors: Herbert O. Funsten, David J. McComas
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Patent number: 6498344Abstract: A mass spectrometer (MS) which uses the Fourier transform ion cyclotron resonance (FTICR) technique to determine the mass of ions. The MS is prepared with a surface that guarantees that a particle striking the surface will have at least one contact with the cathode and will most likely be re-pumped before escaping into the vacuum chamber volume.Type: GrantFiled: October 2, 2000Date of Patent: December 24, 2002Assignee: Siemens Energy & Automation, Inc.Inventor: Duane P. Littlejohn
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Patent number: 6423965Abstract: Plasma ion source mass spectrometers or liquid chromatograph/mass spectrometers are provided: wherein photon noises and matrix molecule ions produced by the ion source are decreased, the decrease of the quantity of signal is suppressed, and the apparatus maintenance is improved. The photon noises are decreased with a shielding plate and a 90 degrees deflector. The maintainability in cleaning is improved by a combination of a leading electrode, the shielding plate having a small hole, and a gate valve. The decrease in the quantity of signal is suppressed with the leading electrode, and a double cylindrical type static lens. Position adjustment of the leading electrode is performed with a flat plate having plural holes. Using an ion trap mass analyzer, matrix molecule ions are eliminated by applying a resonance voltage between its end cap electrodes.Type: GrantFiled: August 23, 1999Date of Patent: July 23, 2002Assignee: Hitachi, Ltd.Inventors: Yuichiro Hashimoto, Takayuki Nabeshima, Yasuaki Takada, Minoru Sakairi, Masamichi Tsukada
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Publication number: 20020079442Abstract: A portable mass spectrometer for underwater use includes a watertight case having an inlet and means for transforming an analyte gas molecule from a solution phase into a gas phase positioned within the case. Means for directing a fluid to the transforming means from the inlet and means for analyzing the gas-phase analyte molecule to determine an identity thereof are also positioned within the case.Type: ApplicationFiled: October 4, 2001Publication date: June 27, 2002Inventors: David P. Fries, Robert Timothy Short, Robert H. Byrne
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Patent number: 6396064Abstract: An aperture (5) connects a first chamber (1) with a second chamber (2), and is surrounded by an annular nozzle (7) formed by inner and outer walls (6, 8), which connects the first chamber (1) with a third chamber (3). A supersonic annular gas jet (9) is ejected by the annular nozzle (7) into the first chamber (1), creating a Venturi pumping action at the core of the jet in the vicinity of the aperture (5). The second chamber (2) may thus be maintained at a substantially lower pressure than the first chamber (1). Inner wall (6) and outer wall (8) may be relatively movable for varying gas flow, and the first chamber (1) may include baffles or skimmers to modify gas flow, e.g., to create a high density molecular beam. An electron or ion beam (4) may be transferred from the second chamber (2) to the first chamber (1), e.g., as part of an environmental scanning electron microscope.Type: GrantFiled: May 24, 2000Date of Patent: May 28, 2002Inventor: Gerasimos Daniel Danilatos
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Patent number: 6320388Abstract: A multiple-channel photo-ionization detector (PID) determines the concentrations of specific gases or classes of gases. The PID includes a UV lamp, an optical window which is divided into multiple zones with each zone producing a UV light beam having a distinctive maximum photon energy. The ionization chamber of the PID includes multiple ion detectors. The PID measures ionization currents and concentrations of gases ionizable by each UV light beam. A method of determining the concentrations and/or identifications of the individual component gases uses differences and/or ratios of measured concentrations or currents.Type: GrantFiled: June 11, 1999Date of Patent: November 20, 2001Assignee: RAE Systems, Inc.Inventors: Hong T. Sun, Peter C. Hsi
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Patent number: 6265717Abstract: An apparatus and a method for inductively coupled plasma mass spectrometry (ICP-MS) with improved detection limits are disclosed. The ICP-MS includes apparatus for generating an inductively coupled plasma (ICP) in a gas at substantially atmospheric pressure to ionize a sample, a mass analyzer (MS) operable at a low pressure of the order of 10−2-10−4 Pa for detecting at least part of the sample ions, and an interface for transferring the sample ions from the ICP to the MS. The interface is provided with a controller for increasing the pressure in the interface from its normal pressure, for example, to 350-450 Pa. The increased pressure may reduce the sensitivity of the instrument, but can improve detection limits by selective reduction of interfering ions.Type: GrantFiled: December 8, 1998Date of Patent: July 24, 2001Assignee: Agilent TechnologiesInventors: Kenichi Sakata, Noriyuki Yamada, Ryotaro Midorikawa, James Charles Wirfel, Donald Lee Potter, Abelardo Gabriel Gutierre Martinez
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Patent number: 6114694Abstract: The present invention discloses a field emission type cold cathode incorporated device, which comprises a field emission type cold cathode having a number of electron emitting sections, said sections having sharp projections, and a vacuum tank for placing the field emission type cold cathode in a vacuum environment. In this device, a partial pressure of particular noble gas in residual gas contained in the vacuum tank is set equal to or lower than C/I (C is a constant and I is a maximum emission current value per one of the number of electron emitting sections during driving of the field emission type cold cathode). Also, in order to set a partial pressure of the particular noble gas in the residual gas contained in the vacuum tank equal to C/I (C: constant) or lower, a partial pressure of the particular residual gas in the vacuum tank is monitored by a mass analyzer during vacuum tank exhaustion.Type: GrantFiled: March 23, 1998Date of Patent: September 5, 2000Assignee: NEC CorporationInventor: Fuminori Ito
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Patent number: 6087657Abstract: Ions generated under an atmospheric pressure pass through vacuum chambers partitioned through first, second and third fine holes. The ions are led to an MS part where the ions are mass-analyzed. A first vacuum chamber adjacent to an atmospheric pressure part has not vacuum pump for independently pumping this chamber. The first vacuum chamber is evacuated by a common pump together with a second vacuum chamber via a bypass hole formed in the wall having the second aperture. A pressure of the first vacuum chamber can be set to several 100 Pa, while a pressure of the second vacuum chamber can be set to several 10 Pa. Sufficient desolvation has been attained by an ion acceleration voltage of approximately 100 V in the first vacuum chamber, while a speed spread can be restrained. The ions are accelerated by approximately 10 V in the second vacuum chamber, and the speed can be restrained as low as possible.Type: GrantFiled: July 16, 1999Date of Patent: July 11, 2000Assignee: Hitachi, Ltd.Inventor: Yoshiaki Kato
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Patent number: 6068749Abstract: A subatmospheric, variable pressure sample delivery chamber, useful as an electrospray ionization device for introducing a sample into a mass spectrometer or as a sample delivery device for delivery of a sample to a collection device at subatmospheric pressures, is disclosed. The sample delivery chamber is configured to maintain an operating pressure between 1 and 750 Torr, preferably between 50 and 700 Torr. The chamber has an inlet port for introduction of a gas and an exit port capable of being coupled either to a sampling orifice for an analytical device, usually a mass spectrometer, or directly to a pump for removal of gas. A sample delivery device extends from outside the chamber into the interior of the chamber.Type: GrantFiled: January 17, 1997Date of Patent: May 30, 2000Assignee: Northeastern UniversityInventors: Barry L. Karger, Frantisek Foret, Daniel P. Kirby
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Patent number: 6069355Abstract: A mass spectrometer system with electrospray ion source for generating ions at atmospheric pressure and an ion trap mass analyzer has an improved ion optics for transporting ions from the atmospheric pressure region to the ion trap mass analyzer region. The system comprises a short ion guide having a predetermined characteristic length to radius ratio. The ion guide is coupled to the ion trap mass analyzer via an electrostatic ion optics. The electrostatic ion optics comprises an ion guide extraction optics and an ion trap mass analyzer injection optics. The ion guide extraction optics comprises the ion optical electrode with an aperture that is coupled to an exit of the ion guide and serves as a differential pressure restrictor between the vacuum chamber with the ion guide and the vacuum chamber with the ion trap mass analyzer. The design of the ion optics is tolerant to the mechanical imperfections in the ion optical system and practically eliminates the non-linear matrix effects.Type: GrantFiled: May 14, 1998Date of Patent: May 30, 2000Assignee: Varian, Inc.Inventor: Alexander Mordehai
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Patent number: 6002130Abstract: Ions generated under an atmospheric pressure pass through vacuum chambers partitioned through first, second and third fine holes. The ions are led to an MS part where the ions are mass-analyzed. A first vacuum chamber adjacent to an atmospheric pressure part has not vacuum pump for independently pumping this chamber. The first vacuum chamber is evacuated by a common pump together with a second vacuum chamber via a bypass hole formed in the wall having the second aperture. A pressure of the first vacuum chamber can be set to several 100 Pa, while a pressure of the second vacuum chamber can be set to several 10 Pa. Sufficient desolvation has been attained by an ion acceleration voltage of approximately 100 V in the first vacuum chamber, while a speed spread can be restrained. The ions are accelerated by approximately 10 V in the second vacuum chamber, and the speed can be restrained as low as possible.Type: GrantFiled: January 29, 1998Date of Patent: December 14, 1999Assignee: Hitachi, Ltd.Inventor: Yoshiaki Kato
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Patent number: 5998215Abstract: A portable analyzer for determining the size and chemical composition of particles suspended in an aerosol. The aerosol is accelerated through a nozzle and skimmers, to produce a well-defined beam of particles, the speed of which is inversely related to the particle size. A dual-beam laser system positioned along the beam path detects light scattered from each particle, to determine the particle's velocity and thus its aerodynamic size. The laser system also triggers a laser to produce a beam that irradiates the particle, to desorb it into its constituent molecules. The particle is desorbed in a source region of a bipolar, time-of-flight mass spectrometer, which provides a mass-to-charge spectrum of the desorbed molecule, thereby chemically characterizing the material of the particle. Several structural features provide sufficient ruggedness to allow the analyzer to be easily used in the field with minimum calibration and maintenance.Type: GrantFiled: October 3, 1997Date of Patent: December 7, 1999Assignee: The Regents of the University of CaliforniaInventors: Kimberly A. Prather, Joseph E. Mayer
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Patent number: 5986260Abstract: A mass analyzer comprising a sample preparation mechanism for preliminarily preparing an analyzing sample, an interface mechanism for preparing the sample into ions after the required preliminary preparation, an ion trapping part and analyzing part for analyzing the ions, and a controller. The ion trapping part and analyzing part is placed in a box portion of the body, while the interface mechanism is arranged on the front top of the box portion of the body. When the cover at the front top is removed, the front, top and right side of the interface mechanism are opened.Type: GrantFiled: August 29, 1997Date of Patent: November 16, 1999Assignee: Hitachi, Ltd.Inventors: Mitsuru Oonuma, Seiji Kamimura, Tadao Mimura
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Patent number: 5952652Abstract: An ion mobility spectrometer includes a spectrometer housing (10) and, within the housing, an ion mobility spectrometer cell (12), a volume of vapour absorbent material (30), and a fan (38) for inducing a flow of recirculating cleaning air through the cell (12) and the absorbent material (30). The vapour absorbent material is held in close proximity with the cell, providing the possibility of constructing a miniature instrument without the need for any external air supply.Type: GrantFiled: February 20, 1998Date of Patent: September 14, 1999Assignee: Graseby Dynamics LimitedInventors: Stephen J. Taylor, Robert B. Turner
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Patent number: 5859433Abstract: The invention relates to an RF quadrupole ion trap mass spectrometer with ionization of the substance molecules outside the vacuum system.The invention consists of using only a single high-vacuum pump for generating the vacuum without any differential pump stages and generating the necessary pressure stages for operating the mass spectrometer by means of a sequence of openings with adjusted conductances. The necessarily very small inlet opening to the vacuum system is only able to transport very small quantities of ions of the analyzed substances in the gas stream. However, these quantities are adequate for operating the mass spectrometer because the ion trap used as mass spectrometer is capable of collecting and storing ions over relatively long periods of time.Type: GrantFiled: June 28, 1996Date of Patent: January 12, 1999Assignee: Bruker-Franzen Analytik GmbHInventor: Jochen Franzen
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Patent number: 5681752Abstract: The invention provides an improved mass spectrometer apparatus, and related method, that characterizes aerosol particles, in real time, according not only to their chemical composition, but also to their size. This added information can be of critical importance when evaluating risks associated with aerosol particles of particular chemical composition. The apparatus achieves this beneficial result in a reliable fashion by first detecting the presence and size of individual aerosol particles moving along a predetermined particle path and by then directing a pulse of high-intensity light at the particle, to desorb and ionize the particle, for analysis of its chemical composition.Type: GrantFiled: May 1, 1995Date of Patent: October 28, 1997Assignee: The Regents of the University of CaliforniaInventor: Kimberly A. Prather
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Patent number: RE37485Abstract: The system for analyzing multiple samples includes a plurality of portable of sample supports each for accommodating a plurality of samples thereon, and an identification mechanism for identifying each sample location on each of the plurality of sample supports. The mass spectrometer is provided for analyzing each of the plurality of samples when positioned within a sample receiving chamber, and a laser source strikes each sample with a laser pulse to desorb and ionize sample molecules. The support transport mechanism provided provides for automatically inputting and outputting each of the sample supports from the sample receiving chamber of the mass spectrometer. A vacuum lock chamber receives the sample supports and maintains at least one of the sample supports within a controlled environment while samples on another of the plurality of sample supports are being struck with laser pulses.Type: GrantFiled: March 11, 1998Date of Patent: December 25, 2001Assignee: PerSeptive Biosystems, Inc.Inventor: Marvin L. Vestal
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Patent number: RE39353Abstract: The system for analyzing multiple samples includes a plurality of portable of sample supports each for accommodating a plurality of samples thereon, and an identification mechanism for identifying each sample location on each of the plurality of sample supports. The mass spectrometer is provided for analyzing each of the plurality of samples when positioned within a sample receiving chamber, and a laser source strikes each sample with a laser pulse to desorb and ionize sample molecules. The support transport mechanism provided provides for automatically inputting and outputting each of the sample supports from the sample receiving chamber of the mass spectrometer. A vacuum lock chamber receives the sample supports and maintains at least one of the sample supports within a controlled environment while samples on another of the plurality of sample supports are being struck with laser pulses.Type: GrantFiled: January 4, 2001Date of Patent: October 17, 2006Assignees: Applera Corporation, MDS, Inc.Inventor: Marvin L. Vestal