With Comparison To Reference Or Standard Patents (Class 250/559.2)
  • Patent number: 11872755
    Abstract: An additive manufacturing apparatus includes a supporting portion, a powder supplying portion, a flattening member, a curing portion, and a controller. The supporting portion is configured to detachably support a shaping stage. The powder supplying portion is configured to supply powder. The flattening member is configured to move in a scanning manner above the shaping stage attached to the supporting portion. The controller is configured to execute a measuring process of detecting inclination between a shaping surface of the shaping stage attached to the supporting portion and a trajectory plane of a trajectory of scanning movement of the flattening member, an adjustment process of adjusting an orientation of the shaping stage on a basis of a detection result of the measuring process such that a degree of parallel between the shaping surface and the trajectory plane increases, a powder layer formation process, and a curing process.
    Type: Grant
    Filed: April 28, 2020
    Date of Patent: January 16, 2024
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Yoshiyuki Beniya, Kota Kiyohara, Hitoshi Murao
  • Patent number: 11529681
    Abstract: A method of forming a three dimensional object using a low pressure cold spray process for is disclosed. Powdered material is delivered at a temperature below the melting point of the powdered material. A nozzle of a cold spray gun is aligned at an angle ?1 to the substrate. The powdered material is delivered at a supersonic speed to the substrate causing the powdered material to adhere to the substrate for forming a first layer of material. An amount of optical distortion caused by the first layer of material adhered to the substrate is determined relative to the substrate and the nozzle is reoriented to an angle ?2 being offset from an axis defined by the first layer of material. A second layer of material is deposited onto the first layer of material with the nozzle being oriented at the angle ?2 to the first layer of material.
    Type: Grant
    Filed: August 14, 2017
    Date of Patent: December 20, 2022
    Assignee: Tessonics, Inc.
    Inventors: Roman Gr. Maev, Volf Leshchynsky, Emil Strumban, Damir Ziganshin, Raymond Belenkov, Dmitry Dzhurinskiy, Dmitriy Jurievich Gavrilov
  • Patent number: 11391563
    Abstract: An ultra-sensitive speckle-analyzing system is disclosed which includes an image capture device configured to receive a scattered field having a speckle configuration and thereby capture i) a reference speckle image, and ii) a subsequent speckle image, each of the reference and the subsequent speckle images having a plurality of speckles on a background; and a processor configured to generate a cross-correlation between the plurality of speckles of the reference and the subsequent speckle images, to thereby represent a change in the speckle configuration.
    Type: Grant
    Filed: January 15, 2021
    Date of Patent: July 19, 2022
    Assignee: Purdue Research Foundation
    Inventors: Qiaoen Luo, Justin A. Patel, Kevin J. Webb
  • Patent number: 11181886
    Abstract: A robot system is configured to fabricate three-dimensional (3D) objects using closed-loop, computer vision-based control. The robot system initiates fabrication based on a set of fabrication paths along which material is to be deposited. During deposition of material, the robot system captures video data and processes that data to determine the specific locations where the material is deposited. Based on these locations, the robot system adjusts future deposition locations to compensate for deviations from the fabrication paths. Additionally, because the robot system includes a 6-axis robotic arm, the robot system can deposit material at any locations, along any pathway, or across any surface. Accordingly, the robot system is capable of fabricating a 3D object with multiple non-parallel, non-horizontal, and/or non-planar layers.
    Type: Grant
    Filed: April 24, 2017
    Date of Patent: November 23, 2021
    Assignee: AUTODESK, INC.
    Inventors: Evan Atherton, David Thomasson, Maurice Ugo Conti, Heather Kerrick, Nicholas Cote
  • Patent number: 11015923
    Abstract: A measuring device includes processing circuitry. The processing circuitry is configured to project a pattern light beam onto a measurement object; acquire, as measurement data, a projection image of the measurement object onto which the pattern light beam is projected; predict, using fabrication data for fabricating the measurement object, a probable image formed by projection of the pattern light beam onto the measurement object to form prediction data; correct the measurement data with the prediction data to form corrected data; and calculate three-dimensional data to the measurement object, using the corrected data.
    Type: Grant
    Filed: June 24, 2019
    Date of Patent: May 25, 2021
    Assignee: Ricoh Company, Ltd.
    Inventors: Ryohsuke Nishi, Yasuaki Yorozu
  • Patent number: 10969222
    Abstract: Systems and methods are provided for obtaining measurements of an integrated circuit chip and a connected carrier to obtain the measurements of the interconnect heights. More specifically, a method is provided that includes defining a top best fit reference plane and a bottom best fit reference plane, and adjusting the top best fit reference and the bottom best fit reference to be superposed to one another. The method further includes calculating first distances between each height measurement for a first set of points and the adjusted top best fit reference plane, and calculating second distances between each height measurement for a second set of points and the adjusted bottom best fit reference plane. The method further includes calculating height values of a gap or interconnect between the first substrate and the second substrate by subtracting the thickness of the first substrate and the second distances from the first distances.
    Type: Grant
    Filed: November 30, 2017
    Date of Patent: April 6, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Elaine Cyr, Dominique L. Demers, Paul F. Fortier, Alexander Janta-Polczynski
  • Patent number: 10926525
    Abstract: A device and corresponding method for depositing a powder bed on a surface (1) is provided. The device comprises a deposition module (2) configured in order to scan the surface while delivering the powder onto the surface. The deposition module has at least one electromagnetic-response probe (5) capable of analysing a delivered portion (6) of the powder bed. The invention finds an application in sintering or selective laser melting machines.
    Type: Grant
    Filed: September 9, 2014
    Date of Patent: February 23, 2021
    Assignees: COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN, MICHELIN RECHERCHE ET TECHNIQUE, S.A.
    Inventors: Pierre Wiel, Jamasp Jhabvala, Eric Boillat, Gilles Santi, David Hippert
  • Patent number: 10921461
    Abstract: Disclosed embodiments include a method and apparatus for determining an unmanned vehicle positioning accuracy. In some embodiments, the method comprises: acquiring positioning coordinate information obtained by real-time positioning based on sensing positioning data of the unmanned vehicle; determining real coordinate information of the unmanned vehicle based on GPS (Global Positioning System) data, IMU (Inertia Measurement Unit) data and laser point cloud data of the unmanned vehicle; matching the obtained positioning coordinate information with the determined real coordinate information, and determining the positioning accuracy of the unmanned vehicle based on a matching result. According to technical solutions of some embodiments, the positioning accuracy of the unmanned vehicle can be determined with a higher accuracy, and preparation is made for determining a travel route of the unmanned vehicle based on the positioning result.
    Type: Grant
    Filed: February 6, 2017
    Date of Patent: February 16, 2021
    Assignee: Baidu Online Network Technology (Beijing) Co., Ltd.
    Inventor: Chuting Tan
  • Patent number: 10814439
    Abstract: A system includes a mounting plate having a plurality of reference members, an inspection system having a profiler device, and an additive manufacturing machine operatively coupled with the inspection system. A computer device scans the mounting plate with the profiler device to obtain position and orientation of the reference members and position and top surface profile data of any parts located on the mounting plate. A transmitting step transmits reference member position and orientation and part position and top surface profile data to the additive manufacturing machine. A detecting step detects mounting plate orientation and position inside the additive manufacturing machine. A combining step combines mounting plate orientation/position inside of the additive manufacturing machine and part position and top surface profile data to calculate a build path program for the additive manufacturing machine. A performing step performs a build process using the build path program to repair the parts.
    Type: Grant
    Filed: May 31, 2018
    Date of Patent: October 27, 2020
    Assignee: General Electric Company
    Inventors: Yusuf Eren Ozturk, Steven Charles Woods, Onur Onder, Mustafa Yuvalaklioglu, Birol Turan
  • Patent number: 10611093
    Abstract: Techniques of optically sensing fiducial targets, such as calibration patterns, within an additive fabrication device are provided. In some embodiments, fiducial targets may be disposed on a structure configured to contact source material of the additive fabrication device, the source material being a material from which the device is configured to fabricate solid objects. Indirect sensing means may be employed such that light emitted from a light source of the additive fabrication device scatters from the surface of a fiducial target. At least some of this scattered light can be measured by a sensor and used to determine a position of the fiducial target. In some embodiments, the fiducial target may be configured to move relative to the light source and/or sensor to provide additional information on the target's position via the light scattered from its surface.
    Type: Grant
    Filed: January 9, 2018
    Date of Patent: April 7, 2020
    Assignee: Formlabs, Inc.
    Inventors: Benjamin FrantzDale, Justin Keenan
  • Patent number: 10596238
    Abstract: Embodiments of the invention are directed to fibrillar adjuvants. Epitopes assembled into nanofibers by a short synthetic fibrillization domain elicited high antibody titers in the absence of any adjuvant.
    Type: Grant
    Filed: December 18, 2015
    Date of Patent: March 24, 2020
    Assignee: The University of Chicago
    Inventors: Joel H. Collier, Jai Simha Rudra
  • Patent number: 10580152
    Abstract: Deriving data for calibration or improving the positioning of a computer-controlled machine involves a movable carrier for changing the position of a first machine part relative that of second machine part. The carrier is moved to a plurality of carrier positions. At each position, a pattern generator attached to the first machine part is illuminated such that at least one three-dimensional pattern of light is created in space. Position data is recorded and images of the three-dimensional pattern are recorded in at least two different optical configurations of the illuminator, the pattern generator, and at least one camera. The recorded image data is compared with image data of a reference database, and pairs of similar images are found. Image translation off set data is derived for each pair, and translation and rotation data are derived.
    Type: Grant
    Filed: June 4, 2015
    Date of Patent: March 3, 2020
    Assignee: LUMINCODE AS
    Inventor: Gudmund Slettemoen
  • Patent number: 10433636
    Abstract: A personal hygiene device has a handle, a treatment head mounted for relative movement of at least a portion thereof with respect to the handle against a restoring force when a treatment force is applied in at least one direction onto the treatment head, a treatment-force-measurement unit for determining the applied treatment force comprising a light-emitting element, a light-sensitive element, and a light-changing element arranged at least partly in the light path between the light-emitting element and the light-sensitive element, wherein the light-changing element and at least one of the light-emitting element and light-sensitive element are arranged to be moved relatively to each other when at least the portion of the treatment head is moved.
    Type: Grant
    Filed: May 12, 2016
    Date of Patent: October 8, 2019
    Assignee: BRAUN GMBH
    Inventors: Jannik Scheele, Martin Haas, Norbert Schaefer, Robert Schäfer, Sven Alexander Franke, Uwe Schober, Ingo Vetter, Frank Ziegler
  • Patent number: 10406599
    Abstract: An apparatus for forming a three-dimensional article is provided, comprising means for providing a predetermined amount of powder, a powder distributor, means for directing an energy beam over a first powder layer causing it fuse in selected locations according to a model, a camera for capturing at least one image of a shape of at least one portion of the predetermined amount of powder that has yet to be initially distributed, the at least one image being captured prior to distribution of an entirety of all portions of the predetermined amount of powder over the surface, and means for comparing at least one value of at least one parameter in the image detected with a corresponding reference parameter value, wherein the at least one parameter is associated with the shape of the powder that has yet to be initially distributed.
    Type: Grant
    Filed: June 22, 2017
    Date of Patent: September 10, 2019
    Assignee: Arcam AB
    Inventors: Ulric Ljungblad, Martin Wildheim
  • Patent number: 9908289
    Abstract: A printer is configured to detect a missing material drop in a top layer of a part being printed in the printer. Upon detection of a missing material drop, the printer moves the platform on which the part is being formed in a direction opposite to the process direction to position the area in which the drop is missing beneath an ejector that is operated to eject a drop in the area. This procedure is performed for each area in which a missing drop was detected before the next layer of the part is formed.
    Type: Grant
    Filed: March 11, 2015
    Date of Patent: March 6, 2018
    Assignee: Xerox Corporation
    Inventor: Gary W. Roscoe
  • Patent number: 9897444
    Abstract: Systems and methods are provided for obtaining measurements of an integrated circuit chip and a connected carrier to obtain the measurements of the interconnect heights. More specifically, a method is provided that includes defining a top best fit reference plane and a bottom best fit reference plane, and adjusting the top best fit reference and the bottom best fit reference to be superposed to one another. The method further includes calculating first distances between each height measurement for a first set of points and the adjusted top best fit reference plane, and calculating second distances between each height measurement for a second set of points and the adjusted bottom best fit reference plane. The method further includes calculating height values of a gap or interconnect between the first substrate and the second substrate by subtracting the thickness of the first substrate and the second distances from the first distances.
    Type: Grant
    Filed: December 23, 2014
    Date of Patent: February 20, 2018
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Elaine Cyr, Dominique L. Demers, Paul F. Fortier, Alexander Janta-Polczynski
  • Patent number: 9849174
    Abstract: Embodiments of the invention are directed to fibrillar adjuvants. Epitopes assembled into nanofibers by a short synthetic fibrillization domain elicited high antibody titers in the absence of any adjuvant.
    Type: Grant
    Filed: September 25, 2015
    Date of Patent: December 26, 2017
    Assignees: THE BOARD OF REGENTS OF THE UNIVERSITY OF TEXAS SYSTEM, THE UNIVERSITY OF CHICAGO
    Inventors: Joel H. Collier, Jai S Rudra
  • Patent number: 9241987
    Abstract: Embodiments of the invention are directed to fibrillar adjuvants. Epitopes assembled into nanofibers by a short synthetic fibrillization domain elicited high antibody titers in the absence of any adjuvant.
    Type: Grant
    Filed: November 19, 2010
    Date of Patent: January 26, 2016
    Assignee: The University of Chicago
    Inventors: Joel H. Collier, Jai Simha Rudra
  • Patent number: 8835881
    Abstract: A writing area of a sample is divided into a plurality of stripes having a width corresponding to an area density of a pattern to be written on the sample with a charged-particle beam. The writing is stopped when writing of at least one stripe is terminated, and a drift amount is measured. An irradiation position of the charged-particle beam is corrected with the use of the drift amount. When the average value of the area density is more than a predetermined value, a stripe has a width smaller than the reference width, and when the average value of the area density is less than the predetermined value, the stripe has a width larger than the reference width. The width of the stripe is preferably a width corresponding to the variation of a drift from the beginning of irradiation with the charged-particle beam.
    Type: Grant
    Filed: June 11, 2013
    Date of Patent: September 16, 2014
    Assignee: NuFlare Technology, Inc.
    Inventor: Takashi Kamikubo
  • Patent number: 8786867
    Abstract: An inspection device and an inspection method for boiler furnace water wall tubes. The inspection device includes a scanner including columns placed upright and fixed by magnets onto the surfaces of multiple water wall tubes extending in the up-down direction on the inner wall surfaces of the boiler furnace, a support frame fixed to the columns to support a displacement sensor producing laser light to be irradiated onto the surface of a water wall tube, and a moving mechanism for moving the displacement sensor in the axial direction of the water wall tube relative to the support frame. A signal processing unit calculates the amount of reduced wall thickness of the water wall tube from a difference between the cross-sectional surface shape of the water wall tube based on a signal from the displacement sensor and a reference shape without reduction in wall thickness.
    Type: Grant
    Filed: July 9, 2009
    Date of Patent: July 22, 2014
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventors: Hirotoshi Matsumoto, Keiji Ida, Hideaki Murata, Kai Zhang
  • Patent number: 8610096
    Abstract: A charged-particle beam writing apparatus used for writing a predetermined pattern on a sample placed on a stage with a charged-particle beam. The apparatus comprises a height measuring unit that measures a height of the sample by irradiating the sample with light and receiving light reflected from the sample, and a control unit that receives either of height data acquired from a height data map prepared based on values measured by the height measuring unit before writing and height data measured by the height measuring unit during writing, thereby adjust an irradiation position of the charged-particle beam on the sample.
    Type: Grant
    Filed: December 6, 2011
    Date of Patent: December 17, 2013
    Assignee: NuFlare Technology, Inc.
    Inventor: Takanao Touya
  • Patent number: 8405613
    Abstract: A method for measuring relative motion between an illuminated portion of a surface and an optical sensing device comprising a coherent light source and a photodetector device comprising an array of pixels and comparators for extracting motion features. The method includes the steps (a)-(d). Step (a) includes illuminating with the coherent light source the surface portion at a determined flash rate. Step (b) includes detecting, using the array of pixels a speckled light intensity pattern of the illuminated portion of the surface for each flash. Step (c) includes extracting edge direction data of two different types from the detected speckled light intensity patterns. Step (d) includes measuring relative motion between the optical sensing device and the illuminated portion of the surface based on extracted edge direction data.
    Type: Grant
    Filed: June 16, 2006
    Date of Patent: March 26, 2013
    Assignee: EM Microelectronic-Marin SA
    Inventors: Lawrence Bieber, Michel Willemin, Gil Afriat, James Harlod Lauffenburger, Kevin Scott Buescher
  • Patent number: 8119964
    Abstract: A safety device for a machine, such as a press brake, has a light transmitter, a light receiver and an evaluation unit. The light receiver is coupled to a moving machine part such that it runs ahead of a front edge of the machine part during the operational movement. The light transmitter comprises a light source having a predominantly incoherent radiation for generating a light beam that runs substantially parallel to the edge and illuminates the light receiver. The light receiver has an image sensor with a plurality of pixels for recording a spatially resolved image of the light beam, and it has an imaging optics having a focal point and an aperture stop which is substantially arranged at the focal point.
    Type: Grant
    Filed: July 30, 2009
    Date of Patent: February 21, 2012
    Assignee: Pilz GmbH & Co. KG
    Inventors: Mark Hufnagel, Guillaume Barthe, Soeren Hader
  • Patent number: 7718938
    Abstract: A spatial information detection system, which is capable of, even when detecting spatial information from a common target space by use of a plurality of detection devices, achieving accurate detection without causing interference between the detection devices. Each of the detection devices has a light emitting source for projecting light intensity-modulated with a modulation period into the target space, a photodetector for receiving light from the target space, and an evaluation portion for detecting the spatial information of the target space from a change between the light projected from the light emitting source and the light received by the photodetector. The system includes a timing control portion for controlling the timings of projecting the lights from the light emitting sources such that a light projection period of the light emitting source of one of the detection devices does not overlap with the light projection period of the light emitting source of another detection device.
    Type: Grant
    Filed: April 17, 2006
    Date of Patent: May 18, 2010
    Assignee: Panasonic Electric Works Co., Ltd.
    Inventors: Fumikazu Kurihara, Yuji Takada, Yusuke Hashimoto, Fumi Tsunesada
  • Patent number: 7650019
    Abstract: A method is used for the early identification of a deviation in the printed images which have been formed by a printing press during continuous production. A second decision threshold is provided, in addition to a decision regarding good or bad print quality. A current printed image, that has been captured, is compared with a reference image. If the current image deviates from the reference image, that deviation is evaluated using two decision thresholds.
    Type: Grant
    Filed: March 15, 2005
    Date of Patent: January 19, 2010
    Assignee: Koenig & Bauer Aktiengesellschaft
    Inventors: Thomas Türke, Harald Heinrich Willeke
  • Patent number: 7578068
    Abstract: A detecting apparatus includes a detecting plate, a controlling box, and an indicator installed on the detecting plate. A region is defined on one face of the detecting plate, for supporting a workpiece thereon, with an edge of the workpiece abutting against one side of the region. A first slot and a second slot are defined in the detecting plate on an opposite side of the region. The controlling box having a circuit board with a processor is installed on an opposite face of the detecting plate. Two light sensors are installed on the circuit board aligning with the first and second slots of the detecting plate respectively. The indicator is electrically connected with the light sensors and controlled by the processor, for showing whether the dimension of the workpiece is eligible, according to detection by the light sensors.
    Type: Grant
    Filed: July 27, 2007
    Date of Patent: August 25, 2009
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Bing-Jun Zhang, Lian-Zhong Gong
  • Publication number: 20090002656
    Abstract: A device is provided for transmission image detection of an aerial image formed in a lithographic projection apparatus. The device has a structure provided with an object mark, an projection system and a detector. The object mark is arranged to form a object mark pattern upon illumination by radiation with a predetermined wavelength. The projection system is arranged to form an object mark aerial image of the object mark pattern at an image side of the projection system, where the image side has a numerical aperture larger than 1. The detector has a slit pattern and a photo-sensitive device. The slit pattern is positioned in a plane proximate to image plane of the projection system. The device can be configured to satisfy the following condition: d < 0.85 · ? NA , where d represents a critical dimension of the object mark aerial image at the image plane, ? represents the predetermined wavelength of the radiation, and NA represents the numerical aperture.
    Type: Application
    Filed: June 29, 2007
    Publication date: January 1, 2009
    Applicant: ASML NETHERLANDS B.V.
    Inventor: Bearrach Moest
  • Patent number: 7439534
    Abstract: A measuring optical system for emitting and receiving light is fixedly installed in a ceiling portion of a measuring device, and a wafer holding part for supporting a semiconductor wafer is provided in a bottom portion of the measuring device. A support table is horizontally laid between support pins of the wafer holding part, and a calibration standard member for calibration is placed on an upper surface of the support table. When a semiconductor wafer is supported by the support pins, light emerging from the measuring optical system impinges upon the semiconductor wafer, and the reflection intensity of the light is measured. When no semiconductor wafer is supported by the support pins, light emerging from the measuring optical system impinges upon the calibration standard member, whereby the calibration can be done at any time.
    Type: Grant
    Filed: June 30, 2006
    Date of Patent: October 21, 2008
    Assignee: Dainippon Screen Mfg. Co., Ltd.
    Inventor: Hirotsugu Kaihori
  • Patent number: 7423269
    Abstract: One embodiment relates to a method of automated microalignment using off-axis beam tilting. Image data is collected from a region of interest on a substrate at multiple beam tilts. Potential edges of a feature to be identified in the region are determined, and computational analysis of edge-related data is performed to positively identify the feature(s). Another embodiment relates to a method of automated detection of undercut on a feature using off-axis beam tilting. For each beam tilt, a determination is made of difference data between the edge measurement of one side and the edge measurement of the other side. An undercut on the feature is detected from the difference data. Other embodiments are also disclosed.
    Type: Grant
    Filed: February 22, 2006
    Date of Patent: September 9, 2008
    Assignee: KLA-Tencor Technologies Corporation
    Inventors: Amir Azordegan, Hedong Yang, Gongyuan Qu, Gian Francesco Lorusso
  • Publication number: 20080149265
    Abstract: Stock having printed circuits thereon is conveyed in a transport plane by a conveying device, and electronic components carried by a transfer belt are transferred to the stock under pressure exerted by the belt. The electronic components are transferred to the belt by a feed device individually in such a way that the electronic components are accurately positioned on the stock by the transfer device.
    Type: Application
    Filed: October 26, 2007
    Publication date: June 26, 2008
    Applicant: MAN Roland Druckmaschinen AG
    Inventors: Markus Hosel, Thomas Walther
  • Patent number: 7385215
    Abstract: Sensing elements that quickly and accurately determine if a liquid or gas is present around the sensing elements are disclosed. These sensing elements find particular application in identifying the location of the cavity wall in which a supercavitating vehicle is operating, relative to the vehicle. In certain embodiments signal emitting elements carried on the vehicle emit signals towards the presumed position of the cavity wall, and sensing elements carried on the vehicle receive the emitted signals after they are reflected off of the cavity wall. The sensing elements identify the location where the reflected signal is received, and based on this identified location, the location of the cavity wall is determined. In alternative embodiments, sensing elements are positioned along fins extending outward with respect to the hull of the vehicle, and the sensors sense the presence of liquid or gas.
    Type: Grant
    Filed: June 30, 2006
    Date of Patent: June 10, 2008
    Assignee: The Johns Hopkins University
    Inventors: Kim R. Fowler, Leo R. Gauthier, Jr.
  • Patent number: 7385214
    Abstract: The invention relates to a measuring arrangement comprising a sensor head (13) that can be displaced over a surface (11) at a distance therefrom in a scanning direction (R), a plurality of distance sensors which are suitable for distance measurement and are interspaced in the scanning direction in a fixed manner, a displacement device for displacing the sensor head (13) in such a way that points of the surface (11) are detected in successive scanning steps carried out by a plurality of distance sensors, and an evaluation device to which the output signals of the distance sensors are supplied. According to the invention, one such measuring arrangement is improved by an angle measuring device (14, 15) for determining an angle value of the sensor head (13) in relation to the scanning direction (R), and for forwarding said angle value to the evaluation device. In this way, systematic measuring errors can be eliminated for the reconstruction of a topography of the surface (11) in the scanning direction (R).
    Type: Grant
    Filed: July 4, 2005
    Date of Patent: June 10, 2008
    Assignee: Bundesrepublik Deutschland, vertreten durch das Bundesministerium für Wirtschaft und Technologie, dieses vertreten durch den Präsidenten der Physikalisch-Technischen Bundesanstalt
    Inventors: Ingolf Weingaertner, Clemens Elster, Michael Schulz
  • Patent number: 7245386
    Abstract: A device for measuring one or more dimensions of an object. One or more light emitters direct light towards the object. At least one light blocking element, arranged between the light emitters and the object, blocks all but a bundle of light to form a light edge on the object. At least one sensor captures an image of the light edge, wherein the dimensions may be determined from image data of the sensor. The object and/or device may move relative to one another, along an axis, to change measurement location of the object.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: July 17, 2007
    Assignee: Pixargus GmbH
    Inventors: Jürgen Philipps, Björn Lindner, René Beaujean
  • Patent number: 7046377
    Abstract: The invention relates to connection of corresponding points measured by a computer vision system. The points are indicated by an illuminator (LASER), by means of which several points can be illuminated on the surface of the object at the same time. A camera system (CAM1, CAM2) measures the positions of the points. Using a data system (DTE), projection images are generated from a three-dimensional model of the object, in which images the positions of the points are calculated. To locate the actual point in the image perceived by the cameras, a search is performed in an area in the neighborhood of coordinates calculated from the point in the projection image. The point thus located can be connected to the perceptions of the other cameras by the aid of the projection images. After the corresponding points have been found, the actual three-dimensional coordinates of the measured point are calculated.
    Type: Grant
    Filed: November 20, 2002
    Date of Patent: May 16, 2006
    Assignee: Mapvision Oy Ltd.
    Inventor: Esa Leikas
  • Patent number: 6994432
    Abstract: A system of classifying incoming media entering an inkjet printing mechanism identifies transparency media without requiring any special manufacturer markings. The media is first optically scanned using a blue-violet light at an initial intensity to obtain both diffuse and specular reflectance data. If useable, the data is compared with known values to classify the media so an optimum print mode tailored for the particular media is used. The early transparency detection system avoids time-consuming further steps trying to classify the media as photo media, plain paper, and the like, and facilitates fast printing of transparencies, which can be critical in the business environment when making last minute changes for a presentation. A printing mechanism constructed to implement this method is also provided.
    Type: Grant
    Filed: September 4, 2003
    Date of Patent: February 7, 2006
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Stuart A. Scofield, Steven H. Walker
  • Patent number: 6885466
    Abstract: In a process of manufacturing a semiconductor device, after a gate oxide film is formed, the thickness of the gate oxide film is measured by measuring an exposure period defined from a time at which the oxide film is formed to a time at which the thickness of the oxide film is measured. In addition, if necessary, the measurement of the oxide film is corrected to determine the real thickness based on the exposure period. Accordingly, the thickness of the gate oxide film can be measured accurately.
    Type: Grant
    Filed: July 13, 2000
    Date of Patent: April 26, 2005
    Assignee: Denso Corporation
    Inventors: Atsushi Komura, Hisato Kato, Hiroshi Otsuki
  • Patent number: 6875993
    Abstract: Laser optical sensing systems and methods for detecting object characteristics are disclosed. The system includes a laser source with at least two emission apertures from which laser signals are emitted. The system also includes at least one detector, which is operationally responsive to the laser source. The system can also include a microprocessor that is operationally coupled to the detector(s) for processing signal data, a memory accessible by the microprocessor for storing object characteristics (e.g., unique signals), and a software module accessible by the microprocessor for enabling system training and detection operations. The laser source emits into an environment at least two laser signals, one from each emission aperture. The detector detects the laser signals after the signals pass through the environment, which is occupied by an object, and the microprocessor determines object characteristics based on the matching of laser signals received by the detector(s) and characteristics stored in memory.
    Type: Grant
    Filed: April 12, 2001
    Date of Patent: April 5, 2005
    Assignee: Honeywell International Inc.
    Inventors: Jimmy A. Tatum, James K. Guenter
  • Patent number: 6768544
    Abstract: In a method for detecting impurities in a transparent material, the material (2) is scanned line by line and the light transmission through the material is measured and compared with a reference value. If the transmission value at one point of the material is in a predetermined relation to said reference value, indicating the occurrence of impurities, the light transmission is studied in an area around the measured point for this transmission value in order to determine the extent and shape of the impurity, the light transmission values in the central area of the impurity being compared with transmission values measured in surrounding parts of the impurity to determine whether the impurity is of gel type or an impurity of some other type.
    Type: Grant
    Filed: October 12, 2001
    Date of Patent: July 27, 2004
    Assignee: Semyre Photonic Systems AB
    Inventor: Göran Asemyr
  • Patent number: 6759669
    Abstract: A measurement device includes a laser or other light source for producing a light beam, and optics that split the light beam into a plurality of differentiable beam portions, such as a plurality of polarized beams. The optics also direct the differentiable beam portions toward a target to be measured. The measurement device also includes a detection component, such as a plurality of position sensitive detectors, positioned to intercept images created by simultaneous incidence of the differentiable beam portions on the target. The data collected by the detection component is used to calculate measurement data related to the target. When used with a head suspension target, displacement of various regions of the head suspension may be measured relative to a reference region, such as the mounting region of the head suspension.
    Type: Grant
    Filed: January 10, 2001
    Date of Patent: July 6, 2004
    Assignee: Hutchinson Technology Incorporated
    Inventors: Roger W. Schmitz, Senthil Balasubramaniam, Roger S. Posusta
  • Patent number: 6655005
    Abstract: A magnetic head positioning apparatus for adjusting the position of a head member relative to its support member by determining the boundary lines for the edge portion of the head body and the center of the pivot in the support member. Luminance variations near the boundary line between areas different in light reflections are derivated so as to determine the position of the boundary line with a high accuracy at a distance shorter than the unit block pitch of the camera photodetectors used to detect the image of the head body and the support member.
    Type: Grant
    Filed: May 2, 2001
    Date of Patent: December 2, 2003
    Assignee: Alps Electric Co., Ltd.
    Inventors: Toshiaki Ozawa, Shoichi Moriyama, Hiroshi Aimura
  • Patent number: 6640716
    Abstract: A method and apparatus for imaging material. A section of a medium is photographed with a first camera having a first field of view. The medium is advanced along a feed direction and the section is photographed with a second camera having a second field of view. At least one of the first field of view and the second field of view is shifted from a nominal location by one or more reflective surfaces. An actual advance of the medium is compared with an intended advance of the medium and it is determined whether at least one of a media advance error and a dimensional change in the media exists in response to the comparing step.
    Type: Grant
    Filed: July 30, 2002
    Date of Patent: November 4, 2003
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Xavier Alonso, Elisa Serra, Llorenç Vallès
  • Patent number: 6492651
    Abstract: A closed loop selective deposition modeling apparatus having a surface scanning system for actively monitoring the surface height of a layer of a three-dimensional object as it is being built by selectively dispensing a build material. The surface scanning system directs a beam of energy on the surface of the object that establishes an illumination zone which emits scattered light, and has a detector which senses the scattered light and produces a response indicative of the surface condition of the object. The response is processed to establish a plurality of height data signals that are further processed to produce feedback data. The feedback data is then utilized to selectively dispense the build material to desired locations on the surface of the object to therein dimensionally normalize the layer of the object being formed.
    Type: Grant
    Filed: February 8, 2001
    Date of Patent: December 10, 2002
    Assignee: 3D Systems, Inc.
    Inventor: Thomas A. Kerekes
  • Patent number: 6477265
    Abstract: A system and method for detecting defects in integrated circuit wafers related to photolithographic processing of the wafers. The system has an image processor, or image computer, and an image memory, which has image data for production wafer types stored therein. A defect detection wafer is scanned by an objective lens and the image is detected by an image detector. The image detector data output is fed to the image processor along with image data for a selected production wafer type from the memory. The image processor feeds image data to a visual display which displays a superimposed image of the defect detection wafer and the selected production wafer type. This superimposed image makes it easier to detect actual defects in a production wafer.
    Type: Grant
    Filed: December 7, 1998
    Date of Patent: November 5, 2002
    Assignee: Taiwan Semiconductor Manufacturing Company
    Inventor: Han-Ming Sheng
  • Patent number: 6452150
    Abstract: Apparatus is provided for on-line monitoring of objects such as cassettes and similar devices used for handling semiconductor wafers to determine whether the objects remain within relevant dimensional tolerances during wafer processing. The apparatus includes a high resolution digital camera for photographing an object to provide digital images to be used to determine whether relevant dimensions of the object are within tolerance limits, and a computer for storing images of the object taken by the camera and for analyzing the images to determine whether relevant dimensions of the object are still within tolerance limits. The camera and computer operate together in accordance with a method further provided by the invention.
    Type: Grant
    Filed: April 27, 2000
    Date of Patent: September 17, 2002
    Assignee: Applied Materials, Inc.
    Inventors: Kunihiko Mori, Tadao Sato
  • Patent number: 6437355
    Abstract: An apparatus to check a height of a bump includes a measuring device and a determining device. The measuring device is configured to measure a distance between an image position in an image of a reference object reflected in a surface of the bump and a predetermined position which is positioned on a line connecting the image position and a center of the bump such that the image position exists between the center and the predetermined position. The determining device is configured to determine whether the height of the bump is within a predetermined range by comparing the distance with a reference distance.
    Type: Grant
    Filed: March 30, 2000
    Date of Patent: August 20, 2002
    Assignee: Ibiden Co., Ltd.
    Inventor: Akira Nishino
  • Publication number: 20020104973
    Abstract: A closed loop selective deposition modeling apparatus having a surface scanning system for actively monitoring the surface height of a layer of a three-dimensional object as it is being built by selectively dispensing a build material. The surface scanning system directs a beam of energy on the surface of the object that establishes an illumination zone which emits scattered light, and has a detector which senses the scattered light and produces a response indicative of the surface condition of the object. The response is processed to establish a plurality of height data signals that are further processed to produce feedback data. The feedback data is then utilized to selectively dispense the build material to desired locations on the surface of the object to therein dimensionally normalize the layer of the object being formed.
    Type: Application
    Filed: February 8, 2001
    Publication date: August 8, 2002
    Inventor: Thomas A. Kerekes
  • Patent number: 6285034
    Abstract: An inspection system for evaluating rotationally asymmetric workpieces for conformance to configuration criteria having a track for causing the workpieces to translate through a test section, the test section including a plurality of electromagnetic energy sources, the plurality of electromagnetic energy sources oriented with respect to the track means such that the workpieces occlude the plurality of electromagnetic energy sources upon passing through the test section, the test section further having electromagnetic energy detectors for receiving the electromagnetic energy to provide output signals related to the intensity of the occluded electromagnetic energy incident on the electromagnetic energy detectors, and a signal processing means for receiving said output signals.
    Type: Grant
    Filed: November 4, 1998
    Date of Patent: September 4, 2001
    Inventors: James L. Hanna, Donald R. Smith