Measuring Dimensions Patents (Class 250/559.19)
  • Patent number: 11867499
    Abstract: An apparatus and method is provided for verifying the position of an edge of component on an object. The apparatus includes an optical sensor configured to receive light reflected from the component and the object. A contrast element disposed on or adjacent to the edge. One or more processors operably coupled to the optical sensor for determining the position of the edge at an inspection point. A system is also provided for cutting plies of a layup assembly and applying a contrast element to make the cut edge visible to position verification systems.
    Type: Grant
    Filed: January 13, 2021
    Date of Patent: January 9, 2024
    Assignee: FARO Technologies, Inc.
    Inventors: Maxime Thierry Isabelle, Benjamin Parkin
  • Patent number: 11816467
    Abstract: A refrigerator production line and a method for upgrading a refrigerator software of an assembled refrigerator on the refrigerator production line are provided. The refrigerator production line includes a conveying device for conveying an assembled refrigerator; a scanning device for scanning and confirming an identification code of the assembled refrigerator and an address code of a communication module in the assembled refrigerator; and a local server for saving the identification code of the assembled refrigerator and the address code of the communication module and further acquiring, in response to a firmware upgrade request, a firmware upgrading package for the assembled refrigerator that corresponds to the identification code. After the assembled refrigerator is powered on, the communication module receives the firmware upgrade package, and a control module upgrades a public version software program according to the firmware upgrade package.
    Type: Grant
    Filed: July 30, 2019
    Date of Patent: November 14, 2023
    Assignees: HEFEI HUALING CO., LTD., HEFEI MIDEA REFRIGERATOR CO., LTD., MIDEA GROUP CO., LTD.
    Inventors: Zongke Wu, Zhen Li, Jirong Wu, Zhi Li, Xibing Cheng, Zhiguang Liu, Yuejin Gao, Zhenwei Li
  • Patent number: 11578967
    Abstract: One example of an inspection system includes a laser, a magnification changer, and a first camera. The laser projects a line onto a wafer to be inspected. The magnification changer includes a plurality of selectable lenses of different magnification. The first camera images the line projected onto the wafer and outputs three-dimensional line data indicating the height of features of the wafer. Each lens of the magnification changer provides the same nominal focal plane position of the first camera with respect to the wafer.
    Type: Grant
    Filed: June 8, 2018
    Date of Patent: February 14, 2023
    Assignee: ONTO INNOVATION INC.
    Inventors: John Schaefer, Christopher Voges, Nicholas Smith, Jeffrey Treptau
  • Patent number: 11573188
    Abstract: The present invention provides an image processing method for CDSEM for determining a measuring range of an image of a target pattern measured by a CDSEM machine. The image processing method of CDSEM comprises: obtaining a first gray scale image based on the image of the target pattern; performing Fourier transform to the first gray scale image to obtain a first frequency spectrum distribution; filtering out frequency spectrum components whose absolute values of ordinate are greater than preset threshold in the first frequency spectrum distribution to obtain a second frequency spectrum distribution, the preset threshold relates to the background noise and the signal frequency of SRAF features; and determining the measuring range based on the second frequency spectrum distribution.
    Type: Grant
    Filed: March 10, 2021
    Date of Patent: February 7, 2023
    Assignee: SHANGHAI HUALI INTEGRATED CIRCUIT CORPORATION
    Inventors: Jiaqi Liu, Lin Li, Shirui Yu
  • Patent number: 11561089
    Abstract: To implement, when a plurality of patterns are included in a field of view during measurement of scattered light in spectral scatterometry, removal of an influence of a pattern outside a dimension (three-dimensional shape) management target from spectral reflection intensity in the field of view without modeling the pattern outside the dimension management target. A three-dimensional shape detection apparatus 100 includes a spectral reflection intensity measurement unit configured to measure spectral reflection intensity in a field of view of a light spot by irradiating a sample 103 as a target with the light spot, and detects a three-dimensional shape in the field of view of the light spot based on the measured spectral reflection intensity.
    Type: Grant
    Filed: July 4, 2019
    Date of Patent: January 24, 2023
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Kenichiro Yamada, Mitsuru Nagasawa
  • Patent number: 11480664
    Abstract: An optical detection device of detecting a distance relative to a target object includes a substrate, an optical sensor and a processor. The optical sensor is disposed on the substrate and adapted to capture an image about the target object. The processor is disposed on the substrate and electrically connected with the optical sensor. The processor is adapted to mark a first region and a second region within the image for acquiring first quantity of the first region and second quantity of the second region, and compare the first quantity with the second quantity for determining whether the distance is varied to a predefined condition.
    Type: Grant
    Filed: June 5, 2019
    Date of Patent: October 25, 2022
    Assignee: PixArt Imaging Inc.
    Inventor: Sai Mun Lee
  • Patent number: 11415696
    Abstract: An optical sensor for appropriately updating a crosstalk value is provided with: a photon-counting type of first light-receiving unit for receiving target object reflected light and cover panel reflected light; and a determination circuit that determines whether or not the target object reflected light is received by the first light-receiving unit, on the basis of a first received light pulse signal that is based on at least one of the target object reflected light and the cover panel reflected light, and a reference pulse signal.
    Type: Grant
    Filed: March 14, 2018
    Date of Patent: August 16, 2022
    Assignee: SHARP KABUSHIKI KAISHA
    Inventors: Hideki Sato, Takuma Hiramatsu, Takayuki Shimizu, Yoshiki Ikuta
  • Patent number: 11272648
    Abstract: A component mounting machine, includes a mounting base provided in a component mounting machine main body and movable at least in the horizontal direction; a mounting/demounting tool, detachably mounted on the mounting base and movable in the up-down direction while holding a component; a tool moving mechanism configured to move the mounting/demounting tool in the up-down direction; a mounting base moving mechanism configured to move the mounting base at least in the horizontal direction; and a control device configured to perform a seating improvement process for applying a force in a predetermined direction, including the horizontal direction, to the mounting base on which the mounting/demounting tool is mounted after the mounting/demounting tool is mounted on the mounting base and before the mounting/demounting tool holds the component, by a moving operation different from a moving operation for holding the component on the mounting/demounting tool in the mounting base moving mechanism.
    Type: Grant
    Filed: August 9, 2017
    Date of Patent: March 8, 2022
    Assignee: FUJI CORPORATION
    Inventors: Koji Kawaguchi, Toshihiko Yamasaki
  • Patent number: 11250335
    Abstract: Systems and methods are provided for embedded data inference. The systems and methods may process camera and other sensor data in by leveraging processing and storage capacity of one or more devices nearby or in the cloud to augment or update the sensor processing of an embedded device. The joint processing may be used in stationary cameras or in vehicular systems such as cars and drones, and may improve crop assessments, navigation, and safety.
    Type: Grant
    Filed: October 25, 2016
    Date of Patent: February 15, 2022
    Assignee: NETRADYNE, INC.
    Inventors: David Jonathan Julian, Avneesh Agrawal
  • Patent number: 11209262
    Abstract: An electronic apparatus, comprises a projection unit configured to project an image, a measurement unit configured to measure a distance to an object, a projection control unit configured to control, based on the distance to the object measured by the measurement unit, projection of the image by the projection unit so that the image projected onto the object has a preliminarily set actual size length.
    Type: Grant
    Filed: May 13, 2020
    Date of Patent: December 28, 2021
    Assignee: CANON KABUSHIKI KAISHA
    Inventor: Kenji Onuki
  • Patent number: 11060546
    Abstract: An Internet of Thing (IoT) device includes a body network; and one or more devices, each device having a head portion, a sensor, a vibrator in the elongated body, a processor coupled to the sensor and the vibrator, and a wireless transceiver in the elongated body coupled to the body network.
    Type: Grant
    Filed: January 15, 2020
    Date of Patent: July 13, 2021
    Inventors: Bao Tran, Ha Tran
  • Patent number: 10794690
    Abstract: An apparatus for laser profiling inspection includes a camera housing having a longitudinal axis and a substantially hemispherical viewing window positioned transversely relative to the longitudinal axis. A camera with a fisheye lens is positioned within the camera housing to capture images through the viewing window. A laser mounting is mounted to the viewing window with the laser mounting extending outwardly from the viewing window along the longitudinal axis of the housing. A laser is positioned at a remote end of the laser mounting. The laser projects a laser beam toward the camera. A mirror is supported by the laser mounting between the laser and the camera. The mirror is configured to reflect outwardly a laser beam from the laser to form a laser ring encircling the laser mounting.
    Type: Grant
    Filed: May 10, 2017
    Date of Patent: October 6, 2020
    Assignee: INUKTUN Services Ltd.
    Inventors: Colin Dobell, Jefferson S. G. Stanway, Abbasali Dehghan Tezerjani, Gabriel Neaga
  • Patent number: 10788756
    Abstract: The present invention provides a method for detecting a size of a pattern made by photolithography, which being applied for detecting a size of a pattern formed on an array substrate of a liquid crystal display including: deriving function layer parameters and position parameters of a detection-pattern; deriving a thickness-profile of the detection-pattern according to the function layer parameters and the position parameters of the detection-pattern; deriving a plane-profile of the detection-pattern according to the thickness-profile of the detection-pattern; proceeding a size-detection to the plane-profile of the detection-pattern.
    Type: Grant
    Filed: August 18, 2015
    Date of Patent: September 29, 2020
    Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Kuanju Fu, Caiqin Chen, Zhonglai Wang
  • Patent number: 10781856
    Abstract: The present invention relates to improving precision in a gate-type moving device. The gate-type moving device includes: a base, a gate-type moving body that is placed on the base via an air layer and moves on the base in a non-contact state, and an air bearing that forms the air layer, wherein the gate-type moving body is comprised of two leg parts that stand on an upper surface of the base, a beam portion that connects the leg parts, and a beam-direction moving body that moves along the beam portion, the air bearing is provided at a rear surface of at least one of the leg parts, and comprises an air blowout port that opens toward an upper surface of the base and an air suction port that opens toward the upper surface of the base, and the air suction port sucks air around the air suction port.
    Type: Grant
    Filed: July 6, 2018
    Date of Patent: September 22, 2020
    Assignee: MITUTOYO CORPORATION
    Inventors: Seiichi Otsubo, Kenji Ueda
  • Patent number: 10725387
    Abstract: In a method of determining an edge roughness parameter of a periodic structure, the periodic structure is illuminated (602) in an inspection apparatus. The illumination radiation beam may comprise radiation with a wavelength in the range 1 nm to 100 nm. A scattering signal (604) is obtained from a radiation beam scattered from the periodic structure. The scattering signal comprises a scattering intensity signal that is obtained by detecting an image of a far-field diffraction pattern in the inspection apparatus. An edge roughness parameter, such as Lined Edge Roughness and/or Line Width Roughness is determined (606) based on a distribution of the scattering intensity signal around a non-specular diffraction order. This may be done for example using a peak broadening model.
    Type: Grant
    Filed: July 6, 2018
    Date of Patent: July 28, 2020
    Assignee: ASML Netherlands B.V.
    Inventors: Teis Johan Coenen, Sander Bas Roobol, Sipke Jacob Bijlsma
  • Patent number: 10684124
    Abstract: A scanning measurement systems for the repair of structures that includes laser base or hub assembly. The laser base assembly serves as a single rotating head emitting a pair of laser beams, and may include a device for detecting a reflected signal (if using retroreflective targets) such as an array of photo diodes, for example, and a system for transmitting this detected signal to a computer that analyzes the signals. One use of the system is to determine the amount of deformation from a manufacturer's standards of a structure such as a vehicle frame. The system provides a compact and cost-effective way to determining the deformation of various portions of the structure and a monitoring system to display real-time data as the structure is being changed (repaired). The system can be used to show a work plan for an estimate, or a detailed report of all changes made to the structure.
    Type: Grant
    Filed: July 16, 2018
    Date of Patent: June 16, 2020
    Inventor: Michael Hanchett
  • Patent number: 10430940
    Abstract: Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.
    Type: Grant
    Filed: July 18, 2016
    Date of Patent: October 1, 2019
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Seung Ae Seo, Won Mi Ahn, Hye In Lee, Jong Hui Lee
  • Patent number: 10337855
    Abstract: In a method of operating a dimensioning system with a plurality of laser scanners, a processor controls the operations of the scanners and processes the scanner signals, and further with memory for storing data delivered by the processor, the data acquired by the dimensioning system in its regular mode of operation are used to construct a three-dimensional model of surface points of the object including spatial coordinates and image intensity for each surface point. The three-dimensional model is stored in the memory. Based on the three-dimensional model, two-dimensional images from any desired viewing angle that was exposed to the scanner rays can be produced on demand to document the appearance of the object at the time the scan was taken.
    Type: Grant
    Filed: February 3, 2017
    Date of Patent: July 2, 2019
    Assignee: Mettler-Toledo GmbH
    Inventors: Einar Sorensen, Espen Rutger
  • Patent number: 10310388
    Abstract: Disclosed is a process monitoring method, and an associated metrology apparatus. The method comprises: comparing measured target response spectral sequence data relating to the measurement response of actual targets to equivalent reference target response sequence data relating to a measurement response of the targets as designed; and performing a process monitoring action based on the comparison of said measured target response sequence data and reference target response sequence data. The method may also comprise determining stack parameters from the measured target response spectral sequence data and reference target response spectral sequence data.
    Type: Grant
    Filed: January 19, 2018
    Date of Patent: June 4, 2019
    Assignee: ASML Netherlands B.V.
    Inventors: Adam Urbanczyk, Hans Van Der Laan, Grzegorz Grzela, Alberto Da Costa Assafrao, Chien-Hung Tseng, Jay Jianhui Chen
  • Patent number: 10309438
    Abstract: An Internet of Thing (IoT) device includes a head portion; an elongated stress sensor coupled to the head portion, the stress sensor coupled to a surface; a processor coupled to the stress sensor; and a wireless transceiver coupled to the processor.
    Type: Grant
    Filed: April 7, 2018
    Date of Patent: June 4, 2019
    Inventors: Bao Tran, Ha Tran
  • Patent number: 10277832
    Abstract: An image processing method for processing a plurality of images is provided. The image processing method includes: acquiring a plurality of first images, each of the plurality of first images taken with each of a plurality of imaging devices; acquiring first imaging clock times, each of the first imaging clock times corresponding to each of the plurality of first images; selecting a plurality of second images from the plurality of first images; and generating an image set constructed with the plurality of second images. Each of second imaging clock times correspond to each of the plurality of second images. The second imaging clock times are (i) substantially matched with each other and (ii) included in the first imaging clock times.
    Type: Grant
    Filed: November 22, 2016
    Date of Patent: April 30, 2019
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Toru Matsunobu, Toshiyasu Sugio, Youji Shibahara, Yuki Maruyama
  • Patent number: 10228467
    Abstract: A device and method for inspecting the deposition of hot melt onto an object to be assembled. A comparison is made between sensed images of the object after application of the hot melt and a predetermined standard to determine if the construction integrity of the object made with the hot melt is within the range established by the standard. Composite images from a sensor operating in the infrared band and another sensor reveal physical features of the object, as well as provide registration information about the placement of the hot melt on the assembled object. Composite images also present a way to visually ascertain ongoing or past production operations in order to trace problems with the raw material used for the object, as well as for the construction process of the object with the hot melt.
    Type: Grant
    Filed: April 4, 2017
    Date of Patent: March 12, 2019
    Assignee: Valco Cincinnati, Inc.
    Inventors: Kevin J. Lowe, Graham T. Manders, Stelian N. Vasiu, James Brashear, Aiqiu Zuo, Denis Tran, Mehdi Bahrami
  • Patent number: 10161568
    Abstract: An LED-based light has an elongate housing having a longitudinal axis and a vertical axis, the housing defined by a base and two canted outer walls meeting opposite the base, the housing defining a cavity. An LED circuit board on which a plurality of LEDs are located is positioned within the cavity. End caps are positioned at opposite ends of the housing.
    Type: Grant
    Filed: August 14, 2015
    Date of Patent: December 25, 2018
    Assignee: iLumisys, Inc.
    Inventors: James M. Amrine, Jr., John Ivey
  • Patent number: 9964134
    Abstract: An Internet of Thing (IoT) device includes a head portion; an elongated stress sensor coupled to the head portion, the stress sensor coupled to a surface; a processor coupled to the stress sensor; and a wireless transceiver coupled to the processor.
    Type: Grant
    Filed: May 3, 2016
    Date of Patent: May 8, 2018
    Inventor: Bao Tran
  • Patent number: 9621780
    Abstract: An efficient method and system for estimating an optimal focus position for capturing an image are presented. Embodiments of the present invention initially determine an initial lens position dataset. Then, scores are calculated for each value of the initial lens position dataset producing a plurality of scores. Embodiments of the present invention then determine an optimum focus position through interpolation and extrapolation by relating the initial lens position dataset to the score dataset, in which the score dataset comprises of the plurality of scores.
    Type: Grant
    Filed: October 4, 2012
    Date of Patent: April 11, 2017
    Assignee: NVIDIA CORPORATION
    Inventor: Hugh Phu Nguyen
  • Patent number: 9594230
    Abstract: A focus height sensor in an optical system for inspection of semiconductor devices includes a sensor beam source that emits a beam of electromagnetic radiation. A reflector receives the beam of electromagnetic radiation from the sensor beam source and directs the beam toward a surface of a semiconductor device positioned within a field of view of the optical system. The reflector is positioned to receive at least a portion of the beam back from the surface of the semiconductor device to direct the returned beam to a sensor. The sensor receives the returned beam and outputs a signal correlating to a position of the surface within the field of view along an optical axis of the optical system.
    Type: Grant
    Filed: December 20, 2012
    Date of Patent: March 14, 2017
    Assignee: Rudolph Technologies, Inc.
    Inventors: Dennis L. Ohren, Christopher J. Voges, Andrew E. Rotering
  • Patent number: 9582116
    Abstract: Several systems for tracking one or more radiation blocking objects on a surface are disclosed. At least three radiation sensors are provided adjacent the surface and a plurality of radiation sensers are provided adjacent the surface. Radiation from at least some of the radiation sources can reach each of the radiation sensors. One or more radiation blocking objects on the surface attenuate radiation from one or more radiation sources from reaching each of the sensors. One or more polygons is calculated based on the attenuated radiation sources and the positions of the sensors. The position of the one or more radiation blocking objects is estimated and may be tracked based on the polygons.
    Type: Grant
    Filed: March 3, 2013
    Date of Patent: February 28, 2017
    Assignee: Baanto International Ltd.
    Inventors: Avanindra Utukuri, Jonathan Clarke, Allen Rego, Bhupinder Randhawa
  • Patent number: 9453726
    Abstract: Various system and methods for estimating the position of one or more radiation blocking objects on a surface are disclosed. A plurality of radiation sources and radiation sensors are positioned about the surface. A plurality of sectors corresponding to the position of at least some of the radiation blocking objects relative to each of the radiation sensors is determined based on a radiation intensity signal for each radiation sensor. The position of the radiation blocking objects is estimated by analyzing various combinations of the sectors. In some embodiments, the size of a radiation blocking object may be estimated based on characteristics of a polygon corresponding to a combination of sectors.
    Type: Grant
    Filed: August 27, 2013
    Date of Patent: September 27, 2016
    Assignee: Baanto International Ltd.
    Inventors: Avanindra Utukuri, Jonathan Clarke
  • Patent number: 9410895
    Abstract: A method of sequentially performing a plurality of jointing operations includes positioning an automated device to form a mechanical joint into a workpiece and forming a mechanical joint into the workpiece. Once the mechanical joint is formed, the workpiece is scanned to generate data indicating the surface geometry of the workpiece at a location including the mechanical joint. One or more geometric features of the surface geometry are identified, and if the identified geometric features are within respective predetermined specification thresholds, the automated device is repositioned to form a subsequent mechanical joint into the workpiece.
    Type: Grant
    Filed: March 12, 2014
    Date of Patent: August 9, 2016
    Assignee: Comau LLC
    Inventors: Velibor Kilibarda, He Wang, Martin Kinsella
  • Patent number: 9223306
    Abstract: A method is provided for defining and utilizing an editing initialization block for a part program. The part program comprises a plurality of steps for taking measurements of a part and is displayed in an editing interface. An option is provided in the editing interface for selecting which steps are in an editing initialization block. After the part program has been saved, at a later time when the part program is recalled for editing, the editing initialization block may be run before additional steps are added to the part program. At least some of the data that would have been obtained by one or more of the initial part program steps that are not in the editing initialization block may be based on estimated data that is related to (e.g., modified based on) data determined from running the editing initialization block.
    Type: Grant
    Filed: November 15, 2011
    Date of Patent: December 29, 2015
    Assignee: Mitutoyo Corporation
    Inventors: Ryan Northrup, Dahai Yu
  • Patent number: 9182217
    Abstract: A method for measuring displacement of a large-range moving platform, comprising: arranging multiple beams of first measuring light parallel to one another and generated by an optical path distribution device and a position sensitive detector array in a certain manner, to ensure that at least one beam of first measuring light is detected by the position sensitive detector array when a moving platform is at any position of a moving area; a detection head array capable of determining whether a light beam is shaded being used for auxiliary measurement of a position of the moving platform; and determining a position of the moving platform that corresponds to the first measuring light measured by the position sensitive detector array, to calculate displacement of the moving platform. The method effectively enlarges a measurement range of the position sensitive detector array, and implements measurement of long range displacement of the moving platform.
    Type: Grant
    Filed: April 10, 2013
    Date of Patent: November 10, 2015
    Assignee: TSINGHUA UNIVERSITY
    Inventors: Ming Zhang, Yu Zhu, Hao Liu, Yi Jiang, Zhao Liu, Kaiming Yang, Jinchun Hu, Dengfeng Xu, Haihua Mu, Wensheng Yin
  • Patent number: 9113019
    Abstract: In image reading apparatus, reading control portion causes image reading portion to read at least line of image data when pivoting angle of cover member with respect to document sheet table has changed from angle exceeding predetermined detection angle to angle equal to or less than detection angle. Photoelectric conversion portion is disposed in area that is out of predetermined maximum readable size area in image reading portion, and is covered by cover member when cover member is closed. Data correcting portion corrects image data read by reading control portion, based on output of photoelectric conversion portion output when pivoting angle has changed from angle exceeding detection angle to angle that is equal to or less than detection angle. Document sheet width detecting portion detects width, in main scanning direction, of document sheet placed on document sheet mounting surface, based on image data corrected by data correcting portion.
    Type: Grant
    Filed: December 22, 2014
    Date of Patent: August 18, 2015
    Assignee: KYOCERA Document Solutions Inc.
    Inventor: Hayato Hirayama
  • Patent number: 9046497
    Abstract: A system including a positioning system with a component manipulator structured to position a component in response to a positioning algorithm; a scanning system capable of producing a set of light waves directed at a surface of the component, detecting a set of reflected light waves from the surface of the component, and producing a reflectivity data set in response to the set of reflected light waves; and a microprocessor structured to apply a fuzzy logic algorithm to the reflectivity signal to determine a solution set and produce a grain structure characterization in response to the solution set.
    Type: Grant
    Filed: March 9, 2012
    Date of Patent: June 2, 2015
    Assignee: Rolls-Royce Corporation
    Inventors: Matthew T. Kush, Kong Ma, Robert Moriarty
  • Patent number: 8766155
    Abstract: According to one embodiment, a coordinate recognizing apparatus includes plural light emitting elements, plural light receiving elements, a memory, and a controller. The memory stores, concerning plural pairs of the light emitting elements and the light receiving elements set in advance, reference values used for determination of blocking of a light path. The controller performs, concerning the respective pairs, actions for collecting, plural times, a difference between first intensity indicated by a detection signal output from the light receiving element, which is a pair of the light emitting element, in a state in which the light emitting element is caused to emit light and second intensity indicated by a detection signal output from the light receiving element during non-light emission of the light emitting element and updating the reference value of the pair stored in the memory using a minimum of differences collected plural times.
    Type: Grant
    Filed: November 1, 2011
    Date of Patent: July 1, 2014
    Assignee: Toshiba TEC Kabushiki Kaisha
    Inventors: Yuishi Takeno, Shinji Saegusa, Takuya Ogishima, Sadatoshi Oishi
  • Patent number: 8743346
    Abstract: The present invention provides an inexpensive range image sensor and etc. A range image sensor comprises diffractive optical elements and on which are formed diffractive gratings that change a traveling direction of incident parallel light so that in a coordinate space defined by a xyz-axis, the incident parallel light is split into split beams, and angles formed by the x-axis and line segments determined by projected light spots formed by the split beams on a predetermined projection plane intersecting the z-axis become predetermined angles. Furthermore, the range image sensor is provided with a distance determining unit for determining distances to the projected light spots on the basis of the tilting with respect to the x-axis of the line segments determined by the projected light spots formed on the object by the split beams.
    Type: Grant
    Filed: August 12, 2011
    Date of Patent: June 3, 2014
    Assignee: Casio Computer Co., Ltd.
    Inventor: Hideaki Inoue
  • Patent number: 8679260
    Abstract: A method of cleaning an area using an automatic cleaning device may include receiving, from a video camera, information associated with an edge located on a surface, determining, by an automatic cleaning device, a position of the automatic cleaning device on the surface relative to the edge and using the received information to move the automatic cleaning device from the determined position along a path so that the automatic cleaning device cleans the surface along the path. The path may be substantially parallel to the edge, and the edge may be located a distance from a reference point on the automatic cleaning device during movement of the automatic cleaning device.
    Type: Grant
    Filed: November 11, 2009
    Date of Patent: March 25, 2014
    Assignee: Intellibot Robotics LLC
    Inventors: Henry L. Hillman, Jr., David M. Knuth, Jr., Daniel M. Daly, Vinton Coffman, Ralph McCann, Stephen D. Herr, Kevin L. Thomas
  • Patent number: 8593649
    Abstract: A defect detector for corrugated cardboard flutes comprises an optical projector for projecting to traveling flutes an inspection light having an effective line of which the length is about one pitch of flutes inclined slightly so that a tip of a normal flute is positioned on or slightly under the posterior end of the effective line and simultaneously a slope of an adjacent normal flute is positioned on the anterior end side of the effective line, an optical receiver equipped with a light-receiving element for receiving the inspection light reflected by a flute to output information according to the light-receiving position, and normal or abnormal determining means which determines that the flute height is normal if the light-receiving position detected is within an allowable range Wp.
    Type: Grant
    Filed: December 11, 2007
    Date of Patent: November 26, 2013
    Assignee: Phonic Co., Ltd.
    Inventor: Shinichi Mouri
  • Patent number: 8462355
    Abstract: A scanning microscope includes an acousto-optic scanner that produces a scanned beam. A beam separator based on total internal reflection or angle tuning of a dielectric filter separates an unscanned portion of an excitation light flux from a scanned portion. The scanned beam is directed to a specimen, and optical radiation generated in response to the scanned beam is directed to a detector that produces a detected signal that can be used to determine an image. The scanned beam can be directed to the specimen without formation of any intermediate focusing.
    Type: Grant
    Filed: January 15, 2009
    Date of Patent: June 11, 2013
    Assignee: The Salk Institute for Biological Studies
    Inventors: Dejan Vucinic, Terrence J. Sejnowski
  • Patent number: 8243284
    Abstract: A method for measuring the roundness profiles moved forward in longitudinal direction inside a rolling mill, using two laser scanners, respectively provided with a light-sensitive sensor and a laser. At least three shadow edges that fit against the round profile to be measured and enclose the round profile to form a polygon are generated and measured and the corresponding tangents are computed.
    Type: Grant
    Filed: April 1, 2008
    Date of Patent: August 14, 2012
    Assignee: Zumbach Electronic AG
    Inventor: Urs-Peter Studer
  • Publication number: 20120148322
    Abstract: A method and system for accurately measuring a lead edge and a trail edge media curl utilizing an angled array sensor. One or more curled media sheets can be propelled in a process direction via a set of rollers/nips associated with a curler from a leading edge and/or trailing edge towards the angled array sensor. The angled array sensor having a rotation vector in the cross-process direction can be placed upstream or downstream of a media-propelling device and at an angle relative to the media sheet exiting the curler in order to calculate a function of sheet curl. The function of sheet curl can be obtained by measuring a point at which the propelled media sheet touches an array associated with the angled array sensor. Such a curl measurement approach enhances accuracy and robustness to environmental induced errors.
    Type: Application
    Filed: December 8, 2010
    Publication date: June 14, 2012
    Applicant: Xerox Corporation
    Inventor: Joannes N. M. de Jong
  • Patent number: 8132802
    Abstract: An apparatus for quickly retaining and releasing parts having a wide range of sizes and designs at an optical measurement station is provided. The apparatus includes a rod having proximal and distal ends. The apparatus further includes a part-engaging first tip attached to the distal end of the rod to move therewith. The apparatus still further includes a part-engaging second tip. The apparatus includes a support structure for supporting the second tip and the rod. The apparatus further includes a quick-release, clamping mechanism for adjustably and releasably clamping the rod to the support structure so that the rod can move the first tip between a part-release position in which a part held between the tips is released for removal from the station and a part-retaining position in which a part is firmly held between the tips. Held parts having a wide range of sizes and designs can be optically measured at the station.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: March 13, 2012
    Assignee: GII Acquisition, LLC
    Inventors: Kenneth S. Kolodge, Michael G. Nygaard, Gregory M. Nygaard
  • Patent number: 8040497
    Abstract: By encoding process-related non-uniformities, such as different height levels, which may be caused by CMP or other processes during the fabrication of complex device levels, such as metallization structures, respective focus parameter settings may be efficiently evaluated on the basis of well-established CD measurement techniques.
    Type: Grant
    Filed: May 30, 2007
    Date of Patent: October 18, 2011
    Assignee: GLOBALFOUNDRIES Inc.
    Inventors: Thomas Werner, Frank Feustel, Kai Frohberg
  • Patent number: 7999243
    Abstract: A tool determines a characteristic of an installed weld fastener using a dimensional measurement device, and includes a threaded portion engageable with the weld fastener and a cylindrical portion. A controller is in communication with the measurement device, and calculates the characteristic using raw dimensional data provided by the measurement device. The measurement device determines an approximate centerline of the cylindrical portion to thereby determine the raw dimensional data. A method determines the approximate centerline using the measurement device by connecting a threaded surface of a tool to the installed weld fastener, measuring dimensions of the cylindrical portion via the measurement device to determine the set of raw dimensional data, and determining the characteristic using the raw dimensional data. A control action can be executed when the characteristic is outside of a calibrated range.
    Type: Grant
    Filed: September 22, 2008
    Date of Patent: August 16, 2011
    Assignee: GM Global Technology Operations LLC
    Inventor: Robert J. Rosinski
  • Patent number: 7932485
    Abstract: An object geometry measurement apparatus (10, 20) for the dynamic generation and transmission of geometrical data of objects (14) moved on a conveying device (12) is set forth, wherein the apparatus has a first optoelectronic sensor (10) which is made for the detection of the object geometry in a section of the object (14) with reference to intervals and/or of the remission behavior, as well as a first control (20) which can calculate geometrical data from the object geometry of each section and can output them via a first interface. In this respect, the first control (20) is made to adapt the information density of the output geometrical data to a measure for changes of the object geometry from section to section.
    Type: Grant
    Filed: July 21, 2008
    Date of Patent: April 26, 2011
    Assignee: Sick AG
    Inventors: Achim Nübling, Thomas Schopp
  • Publication number: 20100284024
    Abstract: A scanning microscope includes an acousto-optic scanner that produces a scanned beam. A beam separator based on total internal reflection or angle tuning of a dielectric filter separates an unscanned portion of an excitation light flux from a scanned portion. The scanned beam is directed to a specimen, and optical radiation generated in response to the scanned beam is directed to a detector that produces a detected signal that can be used to determine an image. The scanned beam can be directed to the specimen without formation of any intermediate focusing.
    Type: Application
    Filed: January 15, 2009
    Publication date: November 11, 2010
    Inventors: Dejan Vucinic, Terrence J. Sejnowski
  • Patent number: 7784975
    Abstract: An apparatus (1) serves for linear illumination of a moving product web (6), the apparatus (1) having at least one light source (4) emitting light. In order to achieve high luminance in a linear subregion of the product web (6), at least a portion of the light emitted by the light source (4) is reflected towards the product web (6) by at least one tubular reflector (5). The tubular reflector (5) in this case has at least one light exit slit (7) which is assigned to the product web (6). Moreover, the tubular reflector has at least one observation slit (8) which lies opposite the light exit slit (7). The illuminated product web (6) can be observed through this observation slit (8) by means of a line camera (2).
    Type: Grant
    Filed: July 2, 2008
    Date of Patent: August 31, 2010
    Assignee: Texmag GmbH Vertriebsgesellschaft
    Inventors: Stephan Krebs, Alfred Eder, Juergen Eisen, Lars Zwerger
  • Patent number: 7759624
    Abstract: An image data generating device has a photoelectric sensor including an array of pixel generating units, each of which has one photoelectric conversion element and one floating diffusion. The photoelectric sensor includes a matrix of pixel sets, each of which includes a matrix of pixel generating units on two rows and two columns. To generate plane image data, the image data generating device finds a pixel value on a pixel basis from an output value for each pixel generating unit. To generate distance image data, the image data generating device finds a distance to a subject for each pixel set from an output value for each pixel generating unit belonging to the pixel set and calculates a pixel value per pixel set.
    Type: Grant
    Filed: December 21, 2007
    Date of Patent: July 20, 2010
    Assignee: DENSO CORPORATION
    Inventors: Yoshihide Tachino, Ryouichi Sugawara
  • Patent number: 7663129
    Abstract: The present invention provides an equipment for measuring the vertical distance or pitch between a plurality of thin substrates inside a container body, including an optical component to transmit a light beam to a thin substrate in the container body and receive light beam reflected from the thin substrate, a scanning device to drive the optical component to move along vertical direction of the thin substrates for measuring the vertical distance or pitch between the plurality of thin substrates in the container body, and a rotation base to carry and rotate the container body to a plurality of angles for the plurality of thin substrates inside the container body to be measured from different angular positions.
    Type: Grant
    Filed: September 30, 2008
    Date of Patent: February 16, 2010
    Assignee: Gudeng Precision Industrial Co, Ltd
    Inventor: Pao-Yi Lu
  • Patent number: 7652275
    Abstract: A probe control interface is provided for a structured light non-contact coordinate measuring machine probe. Portions of a video control signal for controlling the grey level of selected rows of pixels of a spatial light modulator of the probe can be decoded into control signals for additional probe components or functions that have been added to increase the measuring capabilities or versatility of the non-contact probe. By providing the additional probe component control signals in this manner, a versatile structured light non-contact probe system can be made compatible with a standard probe head autojoint system (e.g. a Renishaw™ type system), thus allowing the probe to be automatically exchanged with other standard probes and allowing existing systems to use the non-contact probe more easily. Various aspects of the probe control interface allow for relatively simple, compact, lightweight and robust implementation.
    Type: Grant
    Filed: July 28, 2006
    Date of Patent: January 26, 2010
    Assignee: Mitutoyo Corporation
    Inventor: Paul Gladnick
  • Patent number: 7649636
    Abstract: An optical metrology system is disclosed that has a measuring system configured to irradiate a metrology mark and record a portion of a reflected, a transmitted, or both, electromagnetic field and a characterization device configured to determine from the recorded field a mark shape parameter indicative of the structure of the metrology mark, the characterization device comprising: a field calculation unit configured to calculate an expected field for reflection, transmission, or both, from a theoretical reference mark based on an algebraic eigenvalue-eigenvector representation of the expected field, a field derivative calculation unit configured to calculate a first order derivative, a higher order derivative, or both, of the expected field with respect to the mark shape parameter by first deriving analytical forms for corresponding derivatives of eigenvalues and eigenvectors of the eigenvalue-eigenvector representation, and an optimization unit configured to use the outputs from the field and field derivati
    Type: Grant
    Filed: December 19, 2006
    Date of Patent: January 19, 2010
    Assignee: ASML Netherlands B.V.
    Inventors: Nicolaas Petrus Van Der Aa, Arie Jeffrey Den Boef, Robert Martinus Maria Mattheij, Henricus Gerhardus Ter Morsche