Abstract: The present disclosure provides a ringspinning system for producing a yarn. It is provided a the ringspinning system comprising a bobbin holder for holding a bobbin from which a first filament is supplied, a drafting stage for drafting the first filament together with a second filament, which is fed to the drafting stage, and a spindle, the ringspinning system further contains at least one sensor for detecting a breakage of the first and/or second filament and/or a roving comprising the first and second filament, which roving comes out of the drafting stage, and a clamp assembly comprising a clamp for fixing the second filament in the case that the sensor detects the breakage, wherein the clamp is provided adjacent the bobbin holder. It is further provided a method for stopping the supply of filaments to a drafting stage of a ring spinning system.

Abstract: A gas analysis device includes a light source configured to emit laser beam to a target gas, a reflection body which reflects the laser beam, a light reception device that receives the laser beam reflected by the reflection body, a container which contains the light source and the light reception device, and an alignment mechanism that includes an insertion member inserted from outside of the container to inside of the container to move, along a plane intersecting with the irradiation direction of the laser beam, at least any one of the light source and the light reception device.

Abstract: A substrate warpage detection device for detecting warpage of a substrate loaded on a substrate loading region having a recess shape formed on a rotary table along a circumferential direction during rotation of the rotary table, includes a light transmitting part configured to transmit a light beam obliquely upward from a side of the rotary table such that a lower portion of the light beam collides with an upper end of a side surface of the rotary table and an upper portion of the light beam positioned more upward than the lower portion of the light beam passes a portion near the surface of the rotary table, and a light receiving part installed to face the light transmitting part and configured to receive the light beam passing the portion near the surface of the rotary table so as to detect an amount of received light.

Abstract: Embodiments provide a pre-cut infeed system for a machine center, such as an edger. A pre-cut infeed system may include an infeed, one or more saws arranged along the infeed, and a scanner optimizer system. The scanner optimizer system may scan a workpiece and determine whether greater value can be obtained from the workpiece by cutting the workpiece transversely into two or more pieces upstream of the machine center. If so, the workpiece may be cut transversely by the saw(s) positioned along the infeed, and the cut pieces may be fed sequentially into the machine center.

Abstract: A method includes applying pulsed light to a first end of an optical fiber from an optical fault locator during a first distance test. The method includes determining an estimated distance to a fault based on the pulsed light. The method includes sending information indicative of the estimated distance to a remote device. The method also includes applying first visible light from the optical fault locator to the first end of the optical fiber to facilitate identification of the fault at a first site that is remote from the first end of the optical fiber.

Abstract: There are provided a method of evaluating an area located behind a structure and a system thereof. The system includes: at least one source of electro-magnetic radiation adapted to illuminate a structure portion and to illuminate a area portion via openings formed between elements of the structure while a relative movement is introduced between the structure and the system; multiple detectors adapted to detect electro-magnetic radiation returned from the structure portion and from the area portion; a computing unit adapted to: (i) generate, in response to the detected electro-magnetic radiation, a simplified representation the area portion; and (ii) evaluate the area portion in response to a relationship between the simplified representation of the area portion and a reference simplified representation of the area portion.

Abstract: An automated object inspection system is presented. The inspection system includes an imaging system to produce at least two images of said object having different optical properties and an analyzer coupled to the imaging system to receive the images and to perform a variety of inspection operations on said images. The imaging system may produce images of the object under inspection in the visible range having varying exposure values. A vision engine included in the analyzer may combine said images through an algorithmic process into one image having high light dynamic range. Alternatively, the imaging system may produce images of the object in the visible or non-visible electromagnetic range. The analyzer may perform inspection routines on said images. An imaging system capable of producing digital video is presented, wherein each frame of video produced by said camera is composed of multiple images having different optical properties.

Abstract: A folding apparatus (30) having at least one conveyor belt (10) which is used to convey signatures (64) at least on a section of a path (66, 68) of the signatures (64) through the folding apparatus (30). The folding apparatus (30) features at least one monitoring device (12) with which the conveyor belt (10) is associated. The monitoring device (12) contains a detector (20) for radiation (22) scattered from at least a part (24) of the conveyor belt (10). The condition of the conveyor belt (10) can be determined and classified in an advantageous manner so that the machine operator can receive a signal for timely replacement so as to avoid an unexpected breakage of the conveyor belt (10).

Abstract: An inspection tool or inspection system can be utilized to determine whether the appropriate pattern is on a reticle. The reticle can be associated with EUV lithographic tools. The system utilizes at least two wavelengths of light. The light is directed to the reticle at the at least two wavelengths of light and detected by a detector. The image associated with the first wavelength is subtracted from or otherwise processed with respect to the image associated with the second wavelength to improve contrast ratio.

Abstract: A retroreflective detector comprises a detection unit which houses two transmitting elements and two receiving elements, in which a transmitting element and a receiving element form a pair and two such pairs are disposed in a matrix arrangement. Every row and column of the matrix includes one or more transmitting elements.

Abstract: A wafer-fetching sensing device for wafer storage apparatus uses a planar detection means to replace a conventional linear detection means to detect if a wafer is properly positioned at a desirable access level before being moved out of an access opening of the wafer storage apparatus by a robot. Wafer tilting and damage incident that might otherwise happen thus may be avoided. Only a correctly positioned wafer will be fetched. A warning signal will be generated when the wafer is not properly positioned so that preventive action may be taken to avoid wafer damage. Production yield thus may be increased.

Abstract: A method of reviewing classification data and image data for defects detected in a series of semiconductor manufacturing processes. An inspection wafer is selected from a production lot of wafers and is inspected after the completion of each of the series of semiconductor manufacturing processes. The classification data for each defect is sent to a defect management system and an image for selected defects is sent to an image storage system. Identification data is sent to the defect management system and the image storage system. The image storage system sends a cookie to the defect management system allowing the defect management system to identify defects having an image. A operator controlled review station allows an operator to select defects for review that have an image available for review.