With Counting Means Patents (Class 250/559.47)
  • Patent number: 8324558
    Abstract: The device (10) according to the invention for counting and detecting flat products (14) comprises a light source (16) having an illumination beam profile (24), an optical sensor (18) having a detection beam profile (30) and an evaluation unit (20) connected to the optical sensor (18). The detection beam profile (30) overlaps the illumination beam profile (24) in a detection region in which a section (33) of a surface profile of the flat products (14) is illuminated, the section being at least partially delimited by the illumination beam profile (24). A detection signal generated by the optical sensor (18) is fed to the evaluation unit (20), which determines therefrom the number of flat products located in the detection region.
    Type: Grant
    Filed: March 5, 2008
    Date of Patent: December 4, 2012
    Assignee: Ferag AG
    Inventors: Steven Brossi, Carl Conrad Maeder
  • Patent number: 7095763
    Abstract: An improved laser-based wafer carrier mapping sensor is provided. The sensor includes a number of improvements including laser source improvements; optical improvements; and detector improvements. Laser source improvements include the type of laser sources used as well as the specification of size and power of such sources. Optical improvements include features that intentionally defocus the laser stripe on the wafer as well as additional features that help ensure precision stripe generation. Detector improvements include increasing gain while decreasing the effects of ambient light. Various combinations of these features provide additional synergies that facilitate the construction of a sensor with significantly improved dynamic response while decreasing the frequency of false cross slot errors.
    Type: Grant
    Filed: December 16, 2002
    Date of Patent: August 22, 2006
    Assignee: CyberOptics Semiconductor, Inc.
    Inventor: Felix J. Schuda
  • Patent number: 7027637
    Abstract: A method for determining a number of balls in a projection space comprises determining a projection of a portion of a ball grid array, determining at least one local maximum of the projection space for a given threshold, and determining at least a distance between adjacent maximum. The method further comprises determining an inter-peak histogram of the distances, determining an inter-ball distance for each pair of adjacent balls that has the maximum value of the inter-peak distance histogram corresponding to the pair of adjacent balls, and determining a position of a first ball and a position of a last ball. The method comprises verifying the position of the first ball and the position of the last ball based on a general inter-ball distance, and determining the number of balls.
    Type: Grant
    Filed: February 21, 2002
    Date of Patent: April 11, 2006
    Assignee: Siemens Corporate Research, Inc.
    Inventors: Tong Fang, Ming Fang
  • Patent number: 6683321
    Abstract: The present invention provides a portable counter and corresponding method for counting articles arranged in a stack, like compact discs and dvds. The portable nature of the counter enables the counter to be brought and placed adjacent to the stack of discs, which are often times relatively much heavier than the counter, for providing an accurate count of the discs. The counter further employs several error checking type functions, which serves to insure and enhance the accuracy of the count, as well as alert the user of potential problems.
    Type: Grant
    Filed: September 28, 2001
    Date of Patent: January 27, 2004
    Assignee: Record Products of America, Inc.
    Inventors: Rod Livingston, Robert Roczynski
  • Patent number: 6346986
    Abstract: A method to monitor a dimension of a pellicle includes projecting a first light signal against a surface of the pellicle. A second light signal reflected from the surface of the pellicle is detected, with the second light signal being a representation of the first light signal. The method determines if the dimension of the pellicle is within an allowable value based on a characteristic of the detected second light signal. The characteristic of the detected second light signal can include time periods between pulses of the detected second light signal, an intensity of the detected second light signal, or a positional displacement of the detected second light signal.
    Type: Grant
    Filed: March 14, 2000
    Date of Patent: February 12, 2002
    Assignee: Wafertech, Inc.
    Inventor: Phong T. Nguyen