Sensing By Utilizing Light Or Passage Of Electric-field Current Through Molding Material Patents (Class 264/408)
  • Patent number: 11945888
    Abstract: A method for monitoring polymerization processes can include reacting by polymerization a feedstock in the presence of a catalyst in a reactor to produce an effluent comprising a polymer and a solvent; measuring a density of the effluent; and calculating a monomer conversion rate and/or a polymerization rate for the polymerization based on the density of the effluent. A system for monitoring polymerization processes can include a reactor containing an effluent comprising a solvent, a polymer, and a monomer; a flash vessel fluidly coupled to the reactor to receive the effluent from the reactor; and an inline density meter fluidly coupled to the reactor, placed between the reactor and the flash vessel, and configured to measure a density of the effluent.
    Type: Grant
    Filed: April 14, 2020
    Date of Patent: April 2, 2024
    Assignee: ExxonMobil Chemical Patents Inc.
    Inventors: Yifeng Hong, Jay L. Reimers
  • Patent number: 11808918
    Abstract: Provided are meta-surface optical device and methods of manufacturing the same. The meta-surface optical device may include a meta-surface arranged on a region of a substrate and a light control member arranged around the meta-surface. The light control member may be arranged on or below the substrate. A material layer formed of the same material used to form the meta-surface may be disposed between the light control member and the substrate. Also, the meta-surface may be a first meta-surface arranged on an upper surface of the substrate, and a second meta-surface may be arranged on a bottom surface of the substrate. Also, the meta-surface may include a first meta-surface and at least one second meta-surface may formed on the first meta-surface, and the light control member may be arranged around the at least one second meta-surface.
    Type: Grant
    Filed: October 12, 2021
    Date of Patent: November 7, 2023
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jaekwan Kim, Jeongyub Lee, Seunghoon Han, Yongsung Kim, Byunghoon Na, Jangwoo You, Changseung Lee
  • Patent number: 11633918
    Abstract: Methods and devices for additive manufacturing of workpieces are provided. For analysis during production, a test is carried out using a selected test method. The test results are compared with simulated test results derived during a simulation of the manufacturing and testing. The test may use one or more of a laser ultrasound test unit, an electronic laser speckle interferometry test unit, an infrared thermography test unit, or an x-ray test unit.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: April 25, 2023
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Michael Totzeck, Danny Krautz, Diana Spengler, Uwe Wolf, Christoph-Hilmar Graf Vom Hagen, Christian Holzner, Lars Omlor
  • Patent number: 11598715
    Abstract: A detection apparatus according to an embodiment of the present technology includes: an imaging unit; an illumination unit; a polarization control unit; and a generation unit. The imaging unit generates image data on the basis of incident light. The illumination unit illuminates a subject with linearly polarized light. The polarization control unit controls a polarization state of light to be detected, the light to be detected travelling toward the imaging unit. The generation unit generates information regarding a degree of linear polarization of the light to be detected, on the basis of image data regarding the light to be detected, the polarization state of the light to be detected having been controlled, the image data regarding the light to be detected being generated by the imaging unit.
    Type: Grant
    Filed: October 11, 2018
    Date of Patent: March 7, 2023
    Assignee: SONY CORPORATION
    Inventors: Yasunori Imai, Yasuyuki Sato
  • Patent number: 11577272
    Abstract: The present invention relates to the field of magnetic assemblies, magnetic apparatuses and processes for producing optical effect layers (OEL) comprising magnetically oriented non-spherical magnetic or magnetizable pigment particles on a substrate and providing an impression of a crescent moon-shaped element moving or rotating upon tilting the optical effect layer (OEL). In particular, the present invention relates to magnetic assemblies, magnetic apparatuses and processes for producing said OELs as anti-counterfeit means on security documents or security articles or for decorative purposes.
    Type: Grant
    Filed: May 7, 2019
    Date of Patent: February 14, 2023
    Assignee: SICPA HOLDING SA
    Inventors: Cédric Amerasinghe, Mathieu Schmid, Claude-Alain Despland
  • Patent number: 11515571
    Abstract: A method of co-extruding battery components includes forming a first thin film battery component via hot melt extrusion, and forming a second thin film battery component via hot melt extrusion. A surface treatment is applied to a surface region of at least one of the first and second components so that, relative to a remainder of the at least one component, the surface region has at least one of a decreased inter-particle distance, a decreased amount of polymer binder material, and an increased amount of exposed ionically conductive material. The first and second components are fed through a co-extrusion die to form a co-extruded multilayer thin film.
    Type: Grant
    Filed: February 26, 2019
    Date of Patent: November 29, 2022
    Assignee: Robert Bosch GmbH
    Inventors: Ram Subbaraman, Saravanan Kuppan
  • Patent number: 11426914
    Abstract: In a resin film manufacturing device according to an embodiment, a current state and a reward for a previously selected action are determined for each heat bolt based on a control error calculated from a thickness distribution of a resin film acquired from a thickness sensor. Then, control conditions, which are a combination of states and actions, are updated based on the reward, and a most appropriate action corresponding to the current state is selected from the updated control conditions. Then, the heater is controlled based on the most appropriate action.
    Type: Grant
    Filed: February 16, 2020
    Date of Patent: August 30, 2022
    Assignee: THE JAPAN STEEL WORKS, LTD.
    Inventors: Ryuichiro Maenishi, Nobuhiro Haramoto, Fumitake Fujii
  • Patent number: 11390030
    Abstract: According to some aspects, techniques are provided to more accurately produce fine features in additive fabrication. According to some embodiments, the techniques comprise a process that amplifies exposure to edges and thin positive features whilst not substantially affecting negative features. In particular, an area to be cured may be adapted using signal processing techniques to produce an energy density map. The area may subsequently be cured according to the generated energy density map by, for example, adjusting the scan speed, light power and/or number of passes of the light beam according to the map. As a result, the net exposure to edges and thin positive features may be amplified.
    Type: Grant
    Filed: March 12, 2020
    Date of Patent: July 19, 2022
    Assignee: Formlabs, Inc.
    Inventors: Andrew M. Goldman, Henry Whitney, Justin Keenan, Benjamin FrantzDale, Michael Fogleman, Dmitri Megretski
  • Patent number: 11204548
    Abstract: An imprint apparatus forms a pattern of an imprint material in a shot area of the substrate using the mold, and includes a heating mechanism that changes a shape of the substrate by irradiating the shot area of the substrate with light, wherein the heating mechanism includes a plurality of optical modulators that forms an illuminance distribution in the shot area of the substrate, and light beams from the plurality of optical modulators illuminate mutually different areas of the shot area.
    Type: Grant
    Filed: November 27, 2017
    Date of Patent: December 21, 2021
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Kazuhiro Sato, Takafumi Miyaharu
  • Patent number: 11131923
    Abstract: Systems and processes for controlling an imprinting process that dispenses a plurality of droplets onto a substrate. Droplet information representative of droplets is acquired. A set that includes droplet parameters of the droplets based on the droplet information may be estimated. Each of the droplet parameters is representative of particular droplets. Prior to a template being brought into contact with the droplets, either any of the set is outside ranges, or all of the set are inside ranges, may be determined. In a first case when any of the set are outside the ranges, then the imprinting process may be aborted prior to the template being brought into contact with the droplets. In a second case when all of the set are inside the ranges, then the imprinting process may be performed with the template.
    Type: Grant
    Filed: October 10, 2018
    Date of Patent: September 28, 2021
    Assignee: CANON KABUSHIKI KAISHA
    Inventor: Christopher Ellis Jones
  • Patent number: 11077500
    Abstract: A three-dimensional shaping method in which the powder supplying blade 2 is able to travel without any problems, in which a control system stores in advance a fine sintered region 11 so that any one of a cross-sectional area or a mean diameter in the horizontal direction, a shaping width and an undercut angle at the end is equal to or less than a predetermined extent, or the control system makes a determination in a sintering step, for said each element, so in the case of the raised sintered portions 12 forming on the upper side of the sintered region 11, a rotating cutting tool 3 cuts the raised sintered portions 12 entirely or partially, thereby achieving the object.
    Type: Grant
    Filed: September 24, 2018
    Date of Patent: August 3, 2021
    Assignee: Matsuura Machinery Corporation
    Inventors: Kousuke Ishimoto, Makoto Ichimura, Kouichi Amaya
  • Patent number: 10987734
    Abstract: A lamination molding apparatus includes a chamber, covering at least a molding area which is the maximum range in which a three-dimensional object can be produced; a molding table, disposed in the molding area in the chamber, on which material powder layers are formed by uniformly spread material powder for each of divided layers, wherein the divided layers are obtained by dividing a desired three-dimensional object for each of a specific thickness; a powder holding wall, surrounding the molding table and holding the material powder supplied onto the molding table; a laser irradiation device, forming sintered layers by irradiating laser beam on specific irradiation areas defined by the contour shape of the desired three-dimensional object of the divided layers on the material powder layers; and a numerical control device, determining, at least before sintering, whether the irradiation areas of all the divided layers are included in the molding area.
    Type: Grant
    Filed: May 24, 2020
    Date of Patent: April 27, 2021
    Assignee: SODICK CO., LTD.
    Inventor: Tsukasa Ichijo
  • Patent number: 10556393
    Abstract: A method of manufacturing a tire is provided that includes curing the tire (10) in a curing press (12) and applying microwave energy at a given frequency band into the tire. The interaction between the microwave energy and the tire is monitored to obtain a complex reflection coefficient. A root-mean-squared error is calculated using the measured complex reflection coefficient and a reference reflection coefficient. The reference reflection coefficient is from a fully cured tire made from the same material as the tire. Continuous monitoring of the interaction takes place to obtain the complex reflection coefficient along with continuous calculation of the root-mean-squared error at different times during the curing of the tire in the curing press. The calculated root-mean-squared errors are used to determine whether to stop the curing of the tire in the curing press.
    Type: Grant
    Filed: July 18, 2017
    Date of Patent: February 11, 2020
    Assignee: The Curators of the University of Missouri
    Inventors: David Judd, Frank Gramling, Reza Zoughi, Mohammad Tayeb Ghasr
  • Patent number: 10139345
    Abstract: A method of fabricating composite structures comprising carbon nanotubes. The method including providing a nanotube starting material, forming the composite structure with the nanotube starting material and monitoring at least a magnetic or Raman property of the composite structure while forming the composite structure.
    Type: Grant
    Filed: October 2, 2015
    Date of Patent: November 27, 2018
    Assignee: THE UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA
    Inventors: Russell A. Wincheski, Jae-Woo Kim, Godfrey Sauti, Emilie J. Siochi, Phillip A. Williams
  • Patent number: 9458536
    Abstract: A method is disclosed in which a vapor-deposited coating or layer is directly or indirectly applied to at least a portion of the internal wall of the barrel of a capped pre-assembly comprising a barrel, optionally a dispensing portion, and a cap. The cap is secured to the barrel and at least substantially isolates the distal opening of the dispensing portion from pressure conditions outside the cap. A vapor-deposited coating or layer is applied directly or indirectly to at least a portion of the internal wall of the barrel while the pre-assembly is capped. The coating or layer is applied under conditions effective to maintain communication from the barrel lumen to the exterior via the front opening, optionally further via the dispensing portion lumen if present, at the end of the applying step. The capped pre-assembly can be pressure tested easily and rapidly, for example with a test duration between 1 and 60 seconds, to determine whether it has container closure integrity.
    Type: Grant
    Filed: October 12, 2012
    Date of Patent: October 4, 2016
    Assignee: SIO2 MEDICAL PRODUCTS, INC.
    Inventors: John T. Felts, Thomas E. Fisk, Shawn Kinney, Christopher Weikart, Benjamin Hunt, Adrian Raiche, Brian Fitzpatrick, Peter J. Sagona, Adam Stevenson
  • Patent number: 9450644
    Abstract: A method of MIMO signal transmission on a cable is disclosed. The cable includes at least a first inner conductor, a second inner conductor, and an outer conductive shield. A first data signal is transmitted using the conductive shield and the first inner conductor. A second data signal is transmitted using at least the second inner conductor. The first and second data signals may be transmitted concurrently. For some embodiments, the second data signal may be transmitted using the first and second inner conductors. Thus, the second data signal may be a differential signal. For other embodiments, the first data signal may be transmitted using the conductive shield and the first inner conductor, and the second data signal may be transmitted using the conductive shield and the second inner conductor.
    Type: Grant
    Filed: September 11, 2013
    Date of Patent: September 20, 2016
    Assignee: QUALCOMM Incorporated
    Inventors: Danlu Zhang, Guining Shi, William J. McFarland, Yin Huang, Gerardo Romo Luevano, Jae Min Shin, Kevin Khanh Dao
  • Publication number: 20150145173
    Abstract: A discharge plasma machining device that includes punches as a pressing unit for applying a pressure with respect to a machined item, a direct current pulse current generator as a pulse current applying unit for applying a pulse current with respect to the machined item, a spectroscope as a detection unit for detecting a spectrum of light of plasma generated by application of a pulse current, and a control unit for controlling a pulse current in accordance with a detection result of the detection unit.
    Type: Application
    Filed: January 14, 2015
    Publication date: May 28, 2015
    Inventors: Satoru Hachinohe, Osamu Sakai
  • Publication number: 20150104344
    Abstract: Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser or welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.
    Type: Application
    Filed: August 25, 2014
    Publication date: April 16, 2015
    Inventors: Paul J.L. Webster, James M. Fraser, Victor X.D. Yang
  • Patent number: 8969752
    Abstract: The present invention provides a laser processing method comprising the steps of attaching a protective tape 25 to a front face 3 of a wafer 1a, irradiating a substrate 15 with laser light L while employing a rear face of the wafer 1a as a laser light entrance surface and locating a light-converging point P within the substrate 15 so as to form a molten processed region 13 due to multiphoton absorption, causing the molten processed region 13 to form a cutting start region 8 inside by a predetermined distance from the laser light entrance surface along a line 5 along which the object is intended to be cut in the wafer 1a, attaching an expandable tape 23 to the rear face 21 of the wafer 1a, and expanding the expandable tape 23 so as to separate a plurality of chip parts 24 produced upon cutting the wafer 1a from the cutting start region 8 acting as a start point from each other.
    Type: Grant
    Filed: September 11, 2003
    Date of Patent: March 3, 2015
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Kenshi Fukumitsu, Fumitsugu Fukuyo, Naoki Uchiyama
  • Patent number: 8945439
    Abstract: A method for manufacturing a lens having a refractive index distribution includes: a step of contacting a monomer with a structural member of a polymer, the monomer and a material obtained by polymerization of the monomer showing refractive indices which are different from the refractive index of the polymer; a step of diffusing the contacted monomer in the structural member; and a step of polymerizing the monomer. In the step of diffusing the contacted monomer in the structural member, the method further includes the steps of: irradiating light on at least 50% of one of the surfaces of the structural member which is parallel to the diffusion direction of the monomer, and measuring the intensity of the light passing through the structural member in a predetermined region, and when the measured intensity of the light reaches a predetermined value, the step of polymerizing the monomer is started.
    Type: Grant
    Filed: September 6, 2011
    Date of Patent: February 3, 2015
    Assignee: Canon Kabushiki Kaisha
    Inventors: Kenichi Akashi, Toshiki Ito
  • Publication number: 20140252686
    Abstract: A method of detecting bubbles during operations for injecting resin for the manufacture of fibre composite components, is noteworthy in that the electrical capacitance or conductivity of at least one part of the medium formed by the fibres and the liquid is measured.
    Type: Application
    Filed: May 23, 2014
    Publication date: September 11, 2014
    Applicants: AIRCELLE, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Florent BOUILLON, Joël BREARD, Laurent BIZET, Sébastien GUEROULT
  • Patent number: 8765034
    Abstract: According to one embodiment, a pattern formation method includes placing a master on a substrate including a concave-convex pattern, performing alignment between the master and the substrate, curing a photosensitive resin applied onto the substrate, with the pattern brought into contact with the resin, and removing the master from the resin. The performing alignment includes measuring amount of misalignment of first marks provided at least three of four corners of the shot region and performing alignment of the corners, after the alignment of the corners, measuring misalignment of a second mark, calculating a target value of amount of movement of the corners so as to minimize the amount of misalignment of the first marks and amount of misalignment of the second mark, and performing alignment between the master and the substrate so that the amount of movement of the corners is made close to the value.
    Type: Grant
    Filed: February 14, 2013
    Date of Patent: July 1, 2014
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Manabu Takakuwa
  • Publication number: 20140147577
    Abstract: An apparatus for ablating a substrate of a display apparatus, the apparatus including a stage, the stage being configured to receive thereon a carrier substrate, the carrier substrate having attached thereto the display apparatus, a light source unit, the light source unit being configured to emit light towards the stage, a measuring unit, the measuring unit being configured to measure a transmittance of the carrier substrate, and a control unit, the control unit being configured to control the light source unit to emit light sufficient to ablate the substrate of the display apparatus according to the transmittance of the carrier substrate as measured by the measuring unit.
    Type: Application
    Filed: March 29, 2013
    Publication date: May 29, 2014
    Inventor: Seong Ryong LEE
  • Publication number: 20140103582
    Abstract: A hollow high aspect ratio sample, such as a nano-test-tube, with a tip that is closed off is secured in a particle beam device, such as a transmission electron microscope. The tip is engaged with the particle beam of the particle beam device until a hole opens up on the tip, thereby turning the high aspect ratio sample into a nano-pipet. Alternatively, a nano-pipet having a hole that does not meet desired parameter values is secured in a particle beam device. The nano-pipet is engaged with the particle beam to attain the desired values of the hole parameters.
    Type: Application
    Filed: October 15, 2012
    Publication date: April 17, 2014
    Applicant: International Business Machines Corporation
    Inventors: Stefan Harrer, John A. Ott, Stanislav Polonsky
  • Patent number: 8691124
    Abstract: An imprint lithography alignment apparatus is disclosed that includes at least two detectors which are configured to detect an imprint template alignment mark, wherein the alignment apparatus further comprises alignment radiation adjustment optics which are configured to provide adjustment of locations from which the at least two alignment detectors receive alignment radiation.
    Type: Grant
    Filed: September 30, 2010
    Date of Patent: April 8, 2014
    Assignee: ASML Netherlands B.V.
    Inventors: Sander Frederik Wuister, Yvonne Wendela Kruijt-Stegeman
  • Patent number: 8529823
    Abstract: A method of determining an offset between an imprint template and a substrate using an alignment grating on the imprint template and an alignment grating on the substrate is disclosed. The method includes bringing the imprint template alignment grating and the substrate alignment grating sufficiently close together such that they form a composite grating, directing an alignment radiation beam at the composite grating while modulating the relative position of the imprint template and the substrate, detecting the intensity of alignment radiation which is reflected from the composite grating, and determining the offset by analyzing modulation of the detected intensity.
    Type: Grant
    Filed: September 27, 2010
    Date of Patent: September 10, 2013
    Assignee: ASML Netherlands B.V.
    Inventors: Arie Jeffrey Den Boef, Vadim Yevgenyevich Banine, Andre Bernardus Jeunink, Sander Frederik Wuister, Yvonne Wendela Kruijt-Stegeman
  • Patent number: 8432548
    Abstract: Systems and methods for alignment of template and substrate at the edge of substrate are described.
    Type: Grant
    Filed: October 27, 2009
    Date of Patent: April 30, 2013
    Assignee: Molecular Imprints, Inc.
    Inventors: Byung-Jin Choi, Pawan Kumar Nimmakayala, Philip D. Schumaker
  • Patent number: 8394216
    Abstract: The disclosure relates to systems and methods for detecting features on billets of laminated veneer lumber (LVL). In some embodiments, an LVL billet is provided and passed through a scanning assembly. The scanning assembly includes an x-ray generator and an x-ray detector. The x-ray generator generates a beam of x-ray radiation and the x-ray detector measures intensity of the beam of x-ray radiation after is passes through the LVL billet. The measured intensity is then processed to create an image. Images taken according to the disclosure may then be analyzed to detect features on the LVL billet.
    Type: Grant
    Filed: September 11, 2012
    Date of Patent: March 12, 2013
    Assignee: Weyerhaeuser NR Company
    Inventors: David C. Irving, Thomas J. Taylor
  • Patent number: 8318065
    Abstract: The present invention relates to methods for making oxidation resistant medical devices that comprise polymeric materials, for example, ultra-high molecular weight polyethylene (UHMWPE). The invention also provides methods of making antioxidant-doped medical implants, for example, doping of medical devices containing cross-linked UHMWPE with vitamin E by diffusion, post-doping annealing, and materials used therein.
    Type: Grant
    Filed: October 14, 2010
    Date of Patent: November 27, 2012
    Assignees: The General Hospital Corporation, Cambridge Polymer Group, Inc.
    Inventors: Orhun K. Muratoglu, Stephen H. Spiegelberg
  • Patent number: 8319968
    Abstract: A method of determining a position of a substrate relative to an imprint template is described, wherein the imprint template has at least three gratings and the substrate has at least three gratings positioned such that each imprint template grating forms a composite grating with an associated substrate grating, the at least three imprint template gratings and associated substrate gratings having offsets relative to one another. The method includes detecting an intensity of radiation which is reflected by the three composite gratings, and using the detected intensities to determine displacement of the substrate or imprint template from a position.
    Type: Grant
    Filed: September 10, 2009
    Date of Patent: November 27, 2012
    Assignee: ASML Netherlands B.V.
    Inventors: Arie Jeffrey Den Boef, Andre Bernardus Jeunink, Johannes Petrus Martinus Bernardus Vermeulen, Pascal Antonius Smits, Sander Frederik Wuister, Yvonne Wendela Kruijt-Stegeman, Catharinus De Schiffart
  • Patent number: 8208141
    Abstract: Systems and methods for in-line inspection of plastic blow molded containers. The inspection system may comprise a plurality of emitter assemblies arranged in a vertical array. Each emitter assembly may cyclically emit light energy in at least two different narrow wavelength bands at a container as the container passes through an inspection area. The system may also comprise a plurality of broadband photodetectors arranged in a vertical array, each photodetector facing at least one of the emitter assemblies with the inspection area therebetween such that the photodetectors are capable of sensing light energy that passes through the container when it is in the inspection area. The system may also comprise a processor in communication with the photodetectors for determining a characteristic of the container based on signals from the photodetectors.
    Type: Grant
    Filed: March 9, 2011
    Date of Patent: June 26, 2012
    Assignee: AGR International, Inc.
    Inventors: William E. Schmidt, Georg V. Wolfe
  • Patent number: 8197622
    Abstract: The disclosure relates to systems and methods for detecting features on billets of laminated veneer lumber (LVL). In some embodiments, an LVL billet is provided and passed through a scanning assembly. The scanning assembly includes an x-ray generator and an x-ray detector. The x-ray generator generates a beam of x-ray radiation and the x-ray detector measures intensity of the beam of x-ray radiation after is passes through the LVL billet. The measured intensity is then processed to create an image. Images taken according to the disclosure may then be analyzed to detect features on the LVL billet.
    Type: Grant
    Filed: November 20, 2009
    Date of Patent: June 12, 2012
    Assignee: Weyerhaeuser NR Company
    Inventors: David C. Irving, Thomas J. Taylor
  • Publication number: 20120032377
    Abstract: Method, apparatus and stamp for aligning a first surface (11) of a first object (10) with a second surface (22) of a second object (20), facing said first surface, wherein light of a predetermined wavelength is introduced into one (10) of said objects and caused to propagate by internal reflection therein. The first and second surfaces carry correlating structures (13,25) which, when arranged at close distance from each other, couple light from said one object to the other of said objects by near-field tunneling, to a degree dependent on the overlap of said structures. A light detector (26) is devised to detect a signal which is dependent on the amount of light coupled between said objects, for producing an alignment control signal. The invention is suitable for use in nanoimprint lithography.
    Type: Application
    Filed: October 25, 2004
    Publication date: February 9, 2012
    Inventors: Lars Montelius, Marc Beck, Patrick Carlberg, Claes-Göran Wahlström, Anders Persson, Stefan Andersson-Engels
  • Publication number: 20120021140
    Abstract: A method of aligning a template and a substrate for imprint lithography involves using a mask pattern of the template and a luminescent marker pattern of the substrate, the method including aligning the template mask pattern and the substrate marker pattern using a radiation intensity measurement of radiation emitted by the luminescent marker pattern and having passed the template mask pattern. The mask pattern and the luminescent marker pattern may each be shaped to provide a turning point in the intensity of detected radiation emitted from the marker pattern, and passing through the mask pattern to a detector, as a function of relative displacement at the aligned position. The displacement of the template and substrate may be aligned by identifying the turning point in radiation intensity. The marker pattern may be fluorescent with the emitted radiation excited by a radiation source.
    Type: Application
    Filed: July 22, 2011
    Publication date: January 26, 2012
    Applicant: AMSL NETHERLANDS B.V.
    Inventors: Johan Frederik Dijksman, Anke Pierik, Sander Frederik Wuister, Roelof Koole
  • Publication number: 20120018925
    Abstract: Systems and methods for in-line inspection of plastic blow molded containers. The inspection system may comprise a plurality of emitter assemblies arranged in a vertical array. Each emitter assembly may cyclically emit light energy in at least two different narrow wavelength bands at a container as the container passes through an inspection area. The system may also comprise a plurality of broadband photodetectors arranged in a vertical array, each photodetector facing at least one of the emitter assemblies with the inspection area therebetween such that the photodetectors are capable of sensing light energy that passes through the container when it is in the inspection area. The system may also comprise a processor in communication with the photodetectors for determining a characteristic of the container based on signals from the photodetectors.
    Type: Application
    Filed: March 9, 2011
    Publication date: January 26, 2012
    Applicant: AGR International, Inc. (a Pennsylvania corporation)
    Inventors: William E. Schmidt, Georg V. Wolfe
  • Patent number: 8097189
    Abstract: A method for manufacturing an optical disc master using an existing exposure system, and a method for manufacturing an optical disc having higher recording capacity. The method for manufacturing an optical disc, using a master to produce the optical disc having an irregular pattern thereon, the master being produced by the steps of forming a resist layer composed of a resist material including an incomplete oxide of a transition metal such as W or Mo on a substrate, the oxygen content of the incomplete oxide being smaller than the oxygen content of the stoichiometric composition corresponding to a valence of the transition metal; selectively exposing the resist layer with laser according to a recording signal pattern using a light source with an irradiation power that is less than an irradiation threshold power at which exposure of the resist starts; and developing the resist layer to form the predetermined irregular pattern.
    Type: Grant
    Filed: December 10, 2009
    Date of Patent: January 17, 2012
    Assignee: Sony Corporation
    Inventors: Akira Kouchiyama, Katsuhisa Aratani Aratani
  • Patent number: 8075809
    Abstract: In a method for the production of optical bands with several optical fibers, the surface of the optic fibers in said bands is treated such as to increase the optical damping in sections of the optic fibers. The generated damping may be reliably adjusted, whereby during (or after) the processing of the surfaces a measuring light is introduced into the fiber optic and the light output at the other end of the band is measured by means of a sensor such as a CCD camera. Possible production errors can thus be compensated for during the production process, for example, by an increased process time for the optic fiber. Optical sensor bands can be produced by the above method for application in the bumpers of motor vehicles as recognition sensors for the impact of a pedestrian. Other applications in which the bending of a sensor band is to be determined by optical means are also envisaged.
    Type: Grant
    Filed: May 23, 2006
    Date of Patent: December 13, 2011
    Assignee: Siemens Aktiengesellschaft
    Inventors: Martin Franke, Tobias Happel, Andre Matthias Kwiatek
  • Publication number: 20110233825
    Abstract: An imprint lithography apparatus is disclosed which includes a pattern fixing system configured to use actinic radiation to fix a pattern provided in a layer of imprintable medium by an imprint lithography template, and an inspection system configured to use inspection radiation to inspect an element constituting or, in use, being located within, the imprint lithography apparatus. The imprint lithography apparatus is configured such that the pattern fixing system and the inspection system are provided, in use, with, respectively, actinic radiation and inspection radiation from a single source of radiation.
    Type: Application
    Filed: March 23, 2011
    Publication date: September 29, 2011
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Sander Frederik Wuister, Vadim Yevgenyevich Banine
  • Publication number: 20110076352
    Abstract: A method of determining an offset between an imprint template and a substrate using an alignment grating on the imprint template and an alignment grating on the substrate is disclosed. The method includes bringing the imprint template alignment grating and the substrate alignment grating sufficiently close together such that they form a composite grating, directing an alignment radiation beam at the composite grating while modulating the relative position of the imprint template and the substrate, detecting the intensity of alignment radiation which is reflected from the composite grating, and determining the offset by analyzing modulation of the detected intensity.
    Type: Application
    Filed: September 27, 2010
    Publication date: March 31, 2011
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Arie Jeffrey DEN BOEF, Vadim Yevgenyevich BANINE, Andre Bernardus JEUNINK, Sander Frederik WUISTER, Yvonne Wendela KRUIJT-STEGEMAN
  • Patent number: 7901611
    Abstract: An electrospinning system using a spinneret and a counter electrode is first operated for a fixed amount of time at known system and operational parameters to generate a fiber mat having a measured fiber mat width associated therewith. Next, acceleration of the fiberizable material at the spinneret is modeled to determine values of mass, drag, and surface tension associated with the fiberizable material at the spinneret output. The model is then applied in an inversion process to generate predicted values of an electric charge at the spinneret output and an electric field between the spinneret and electrode required to fabricate a selected fiber mat design. The electric charge and electric field are indicative of design values for system and operational parameters needed to fabricate the selected fiber mat design.
    Type: Grant
    Filed: November 20, 2008
    Date of Patent: March 8, 2011
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventor: Russell A. Wincheski
  • Publication number: 20110006461
    Abstract: A system and method is disclosed for measuring in real-time the moisture content of a ceramic-forming batch material to be extruded to form a ceramic article. The system includes a moisture-content-measurement (MCM) system that measures optical absorbance. Material-specific batch calibration samples can be used to calibrate optical absorption measurements to accurate moisture-content measurements. Because the surface of the batch material tends to dry during the extrusion process, a batch-material-removal (BMR) device is used to remove or displace batch surface material so that the moisture content of the underlying batch material can be measured.
    Type: Application
    Filed: February 25, 2009
    Publication date: January 13, 2011
    Inventors: David Dasher, Robert John Locker, James Monroe Marlowe, JR.
  • Patent number: 7867431
    Abstract: Prior to molding, an initial position of at least one movable reference mark, provided in the vicinity of an object of manufacture, is measured by a first position measuring means, and the initial position of the movable reference mark is measured by a second position measuring means provided in a processing means. During the course of molding, measurement of a position of the movable reference mark is carried out by the first position measuring means and the second position measuring means. Then, based on the initial position of the movable reference mark prior to molding and the position of the movable reference mark measured by the first and second position measuring means during the course of molding, an optical beam irradiating position of an optical beam and a processing position of the processing means are corrected.
    Type: Grant
    Filed: May 25, 2005
    Date of Patent: January 11, 2011
    Assignees: Matsuura Machinery Corporation, Panasonic Electric Works Co., Ltd.
    Inventors: Yoshikazu Higashi, Hirohiko Togeyama, Satoshi Abe, Isao Fuwa, Seiichi Tomita, Toshio Maeda, Norio Takinami
  • Patent number: 7785524
    Abstract: A CPU provides a fluorescent light detecting head with an irradiation instruction, in response to which the fluorescent light detecting head irradiates an ultraviolet ray for detection on an ultraviolet curing resin material to be examined. The CPU then acquires from the fluorescent light detecting head an intensity of a fluorescent light emitted from a photo polymerization initiator included in the ultraviolet curing resin material when receiving the ultraviolet ray for detection. The CPU retrieves a predetermined number of past data of the intensity of the fluorescent light from a storage unit and performs a (moving) average calculation processing to calculate the intensity of the fluorescent light at the current time. The CPU performs an estimation processing of a state of the ultraviolet curing resin material based on the calculated intensity of the fluorescent light.
    Type: Grant
    Filed: March 14, 2007
    Date of Patent: August 31, 2010
    Assignee: Omron Corporation
    Inventors: Kiyoshi Imai, Hiroyuki Inoue, Tadashi Senga, Kenichi Nakamune, Yoji Hasebe
  • Patent number: 7780898
    Abstract: A method and apparatus for manufacturing and inspecting plastic containers. The apparatus may comprise a blow-molder comprising a plurality of molds and spindles for forming a plastic container from a preform. The apparatus may also comprise an inspection device, located in the blow-molder, for inspecting the plastic container after formation by the blow-molder.
    Type: Grant
    Filed: April 21, 2008
    Date of Patent: August 24, 2010
    Assignee: AGR International, Inc.
    Inventors: Craig Alan Birckbichler, Sudha Christy Jebadurai, Georg V. Wolfe, Ronald A. Puvak, William E. Schmidt
  • Patent number: 7754135
    Abstract: A three-dimensional object is made by repeating a process. An optical beam is irradiated on a predetermined portion of a powdery layer to form a sintered layer. A new powdery layer is formed on a surface of the sintered layer. An optical beam is irradiated on a predetermined portion of the new powdery layer to form a new sintered layer united with the underlying sintered layer. Because a portion of the sintered layer that is higher than a predetermined level is removed as occasion demands, the abnormally sintered portion on the sintered layer can be removed, making it possible to prevent stoppage of the shaping process, which may be caused by the abnormally sintered portion.
    Type: Grant
    Filed: February 25, 2004
    Date of Patent: July 13, 2010
    Assignee: Panasonic Electric Works Co., Ltd.
    Inventors: Satoshi Abe, Isao Fuwa, Yoshikazu Higashi, Hirohiko Togeyama, Norio Yoshida, Masataka Takenami, Takashi Shimizu, Shushi Uenaga
  • Patent number: 7745237
    Abstract: Method of forming a pattern by a nanoimprint technique starts with preparing a mold with nanostructures on its surface. The mold is pressed against a substrate or plate coated with a resin film. The positions of alignment marks formed on the rear surface of the plate coated with the resin film are detected. Thus, a relative alignment between the mold and the plate coated with the resin film is performed.
    Type: Grant
    Filed: January 24, 2007
    Date of Patent: June 29, 2010
    Assignee: Hitachi, Ltd.
    Inventors: Souichi Katagiri, Yasunari Sohda, Masahiko Ogino
  • Publication number: 20100102487
    Abstract: Imprint lithography benefits from precise alignment between a template and a substrate during imprinting. A moiré signal resulting from indicia on the template and the substrate are acquired by a system comprising a line-scan camera and a digital micromirror device (DMD) which provides a high bandwidth, low-latency signal. Once acquired, the moiré signal may be used directly to align the template and the substrate without need for discrete position/angle encoders.
    Type: Application
    Filed: October 16, 2009
    Publication date: April 29, 2010
    Applicant: MOLECULAR IMPRINTS, INC.
    Inventors: Philip D. Schumaker, Babak Mokaberi
  • Patent number: 7682552
    Abstract: The present invention relates to a capacitive measurement method and system for a nanoimprint process, which arranges a plurality of electrode plates on both the backside of the master mold and the surface of the supporting base carrying the wafer substrate to form a plurality of capacitive structures. By monitoring the capacitance variation signal caused by the continuous variations in the thickness and the material properties of the resist during the imprint process, the status of the resist can be monitored and recorded, which is used as the references for determining the timing to demold in the nanoimprint process and for maintaining the flatness of the resist. Accordingly, the nanoimprint process can be automated easier and the quality and the throughput of of the nanometer scaled imprint product can be improved.
    Type: Grant
    Filed: May 24, 2004
    Date of Patent: March 23, 2010
    Assignee: Industrial Technology Research Institute
    Inventors: Chin-Chung Nien, Ta-Chuan Liu, Hong Hocheng
  • Publication number: 20100065987
    Abstract: A method of determining a position of a substrate relative to an imprint template is described, wherein the imprint template has at least three gratings and the substrate has at least three gratings positioned such that each imprint template grating forms a composite grating with an associated substrate grating, the at least three imprint template gratings and associated substrate gratings having offsets relative to one another. The method includes detecting an intensity of radiation which is reflected by the three composite gratings, and using the detected intensities to determine displacement of the substrate or imprint template from a position.
    Type: Application
    Filed: September 10, 2009
    Publication date: March 18, 2010
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Arie Jeffrey DEN BOEF, Andre Bernardus Jeunink, Johannes Petrus Martinus Bernardus Vermeulen, Pascal Antonius Smits, Sander Frederik Wuister, Yvonne Wandela Kruijt-Stegeman, Catharinus De Schiffart
  • Publication number: 20100003830
    Abstract: A pattern is formed on a mask substrate. Positional deviation information between an actual position of the pattern formed on the mask substrate and a design position decided at the time of designing the pattern is calculated. A heterogeneous layer of which a volume expands more greatly than that of surrounding mask substrate region is formed in a predetermined position within the mask substrate so that volume expansion of the heterogeneous layer according to the positional deviation information is achieved.
    Type: Application
    Filed: January 8, 2009
    Publication date: January 7, 2010
    Inventor: Masamitsu Itoh