Stress In Material Measurement Patents (Class 324/209)
  • Patent number: 10883815
    Abstract: According to one embodiment, a sensor includes a film portion, one or more detectors fixed to the film portion, and a processor. The detector includes first and second detecting elements. The first detecting element includes a first magnetic layer. The second detecting element includes a second magnetic layer. A first change rate of a first signal is higher than a second change rate of the first signal. The first signal corresponds to a first electrical resistance of the first detecting element. A change rate of a second signal with respect to the change of the magnitude of the strain is higher than the second change rate. The second signal corresponds to a second electrical resistance of the second detecting element. The processor is configured to perform at least a first operation of outputting a second value. The second value is based on the second signal and a first value.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: January 5, 2021
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Yoshihiko Fuji, Yoshihiro Higashi, Michiko Hara, Kazuaki Okamoto, Shotaro Baba
  • Patent number: 10768129
    Abstract: To provide a surface characteristics evaluation method that evaluates the residual stress in a subject made of steel material subjected to a surface modification treatment. A surface characteristics evaluation method includes a step of preparing a surface characteristics evaluation apparatus, a step of placing the subject in such a manner that an alternating magnetic field induced by a coil of the surface characteristics evaluation apparatus permeates into the steel material, a step of generating an eddy current in the subject, a step of successively changing the alternating magnetic field applied to the coil, a step of calculating the impedance Z1 for each of different frequencies from the potential difference across the coil and the value of the current flowing through the coil, a step of performing computation based on the impedance Z1, and a step of evaluating the residual stress in the steel material based on the computation result.
    Type: Grant
    Filed: June 7, 2016
    Date of Patent: September 8, 2020
    Assignee: SINTOKOGIO, LTD.
    Inventor: Yoshiyasu Makino
  • Patent number: 10763823
    Abstract: A magnetoelastic resonator device comprises a housing, at least one elliptically-shaped or substantially elliptically-shaped magnetoelastic element disposed within the housing, and at least one bias magnet disposed in the housing, wherein the at least one elliptically-shaped or substantially elliptically-shaped magnetoelastic element is configured to couple to an external magnetic field at a particular frequency and convert the magnetic energy into mechanical energy, in the form of oscillations.
    Type: Grant
    Filed: December 15, 2016
    Date of Patent: September 1, 2020
    Assignee: 3M Innovative Properties Company
    Inventors: Curtis L. Shoemaker, Ding Wang, Ziyad H. Doany
  • Patent number: 10753840
    Abstract: A system is for determining a viscoelastic property of a flexible seal, such as for use in connection with a vessel having a junction formed between first and second rigid parts that serve to compress the seal in use. A magnetic material is coupled to the flexible seal, and a generator such as an electric coil is provided for generating a magnetic field for causing the magnetic material to output a signal representative of a dynamic mechanical response of the magnetic material. A sensor senses the signal. An analyzer may be provided for analyzing the signal to determine the viscoelastic property of the object. Flexible seals with one or more embedded permanent magnets are disclosed, as are a method and apparatus for manufacturing such a seal using superconductive levitation to position a magnetic material, such as a permanent magnet, in a mold cavity during injection of a molding material.
    Type: Grant
    Filed: August 24, 2017
    Date of Patent: August 25, 2020
    Inventor: Alexandre N. Terentiev
  • Patent number: 10746526
    Abstract: According to one embodiment, a strain sensing element includes a film unit being deformable, a first and a second magnetic unit, and a strain sensor. The first magnetic unit is provided on the film unit and is arranged with the film unit in a first direction. The first magnetic unit includes a first magnetic body layer and a first intermediate magnetic layer. The second magnetic unit is provided on the film unit and is arranged with the first magnetic unit in a second direction crossing the first direction. The second magnetic unit includes a second magnetic body layer and a second intermediate magnetic layer. The strain sensor is provided on the film unit between the first magnetic unit and the second magnetic unit. An electrical characteristic of the strain sensor changes according to a deformation of the film unit.
    Type: Grant
    Filed: March 14, 2018
    Date of Patent: August 18, 2020
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Shiori Kaji, Hideaki Fukuzawa, Tomohiko Nagata, Akio Hori, Yoshihiko Fuji
  • Patent number: 10641714
    Abstract: Disclosed is a wafer inspection apparatus. The wafer inspection apparatus includes: a magnetic field generating unit forming a magnetic field such that magnetic lines of force flow in a direction perpendicular or parallel to a first surface of a wafer on which a magnetic thin film is formed; a microwave guide unit emitting microwaves to a measurement region that is at least a partial region of the wafer and is a region affected by the magnetic field generated by the magnetic field generating unit; and a sensing unit receiving waves reflected or transmitted after the microwaves are emitted to the measurement region from the microwave guide unit.
    Type: Grant
    Filed: May 8, 2018
    Date of Patent: May 5, 2020
    Assignees: KOREA BASIC SCIENCE INSTITUTE, KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Seung-young Park, Sang-il Kim, Younghun Jo, Byoung-Chul Min
  • Patent number: 10458775
    Abstract: An apparatus is provided to measure a depth of a hardened layer formed at a surface layer of a quenched workpiece. The apparatus includes an exciting coil configured to generate a magnetic flux to magnetize the workpiece and a detecting coil configured to detect the magnetic flux generated by the exciting coil. The exciting coil has a U-shaped excitation core portion and an excitation coil portion wound on the excitation core portion. The excitation core portion is arranged such that distal ends of magnetic poles of the excitation core portion face the workpiece. The detecting coil has a detection core portion and a detection coil wound on the detection core portion. The detection core portion is arranged between the magnetic poles of the excitation core portion and along a surface of the workpiece.
    Type: Grant
    Filed: March 2, 2016
    Date of Patent: October 29, 2019
    Assignees: NETUREN CO., LTD., OITA UNIVERSITY
    Inventors: Yoshitaka Misaka, Kazuhiro Kawasaki, Kenta Sakurai, Yuji Gotoh
  • Patent number: 10422769
    Abstract: A tester for bonded composite materials uses a magnetic source to generate a response signal from wires infused in an adhesive used between layers of the composite material. Acoustic or magnetic response signals, separately or in combination, can be received and analyzed to detect stresses in wires indicative of voids in the adhesive or other defects affecting the bond quality between layers of the composite material.
    Type: Grant
    Filed: June 17, 2015
    Date of Patent: September 24, 2019
    Assignee: The Boeing Company
    Inventors: John R. Hull, Robert J. Miller
  • Patent number: 10359324
    Abstract: A sensor for sensing stress in a ferromagnetic material includes a non-magnetic substrate. The substrate has a first surface and a second surface opposite the first surface. A first coil is attached to or formed on the first surface of the substrate. The first coil is configured to induce a magnetic flux in the ferromagnetic material being driven by an alternating current (AC) signal. At least one second coil is attached to or formed on the first surface of the substrate. The at least one second coil is spaced from the first coil. In addition, the second coil is configured to detect changes in the magnetic flux induced in the ferromagnetic material.
    Type: Grant
    Filed: August 18, 2016
    Date of Patent: July 23, 2019
    Assignee: General Electric Company
    Inventors: Pekka Tapani Sipilä, Mark Ronald Lynass, Victor Donald Samper, Ronghui Zhou
  • Patent number: 10330640
    Abstract: A building structure includes a block of building material and a magnetic circuit buried in the block of building material. The structure also includes a plurality of sensing devices buried in the block of building material. Each sensing device may include a contactless power supplying circuit magnetically coupled with the magnetic circuit to generate a supply voltage when the magnetic circuit is subject to a variable magnetic field.
    Type: Grant
    Filed: February 7, 2017
    Date of Patent: June 25, 2019
    Assignee: STMICROELECTRONICS S.R.L.
    Inventor: Alberto Pagani
  • Patent number: 10247627
    Abstract: A force measurement device may include a first magnetic field generating unit configured to generate a magnetic field for being applied to a test object; a first magnetic field sensing unit configured to sense the generated magnetic field; and a flux concentrator having a first pole, a second pole and a third pole. The first pole, the second pole and the third pole extend in the same direction. The first magnetic field generating unit is arranged at the first pole. The first magnetic field sensing unit is arranged at the second pole. A line enveloping a first end face of the first pole, a second end face of the second pole and a third end face of the third pole is concave shaped. A cross section of the first pole is greater than a cross section of the second pole and greater than a cross section of the third pole.
    Type: Grant
    Filed: November 4, 2015
    Date of Patent: April 2, 2019
    Assignee: Torque And More (TAM) GmbH
    Inventor: Lutz May
  • Patent number: 10076288
    Abstract: A medical treatment or examination device includes at least one device component that may move relative to at least one other device component via a drive device. A measuring device is provided for detecting a load acting on the movable device component. The measuring device includes a support that bends due to the load. The support, at least in a bending region, has a section producing a magnetic field. The measuring device also includes at least one coil that is assigned to the section and in which the magnetic field undergoing a change as a result of bending due to a load induces an induction current that serves as measurement signal describing the load.
    Type: Grant
    Filed: May 8, 2014
    Date of Patent: September 18, 2018
    Assignee: Siemens Aktiengesellschaft
    Inventors: Harald Mulzer, Wolfgang Neuber
  • Patent number: 10036673
    Abstract: Active Force measuring device for measuring a force impact onto a ferromagnetic object comprising a flux concentrator having a first and second ends facing the ferromagnetic object to me measured, a magnetic field generation coil arrangement being wound around the flux concentrator, wherein the magnetic field generating coil arrangement is adapted for generating a magnetic field having a main generating direction between the first end and the second end, and a magnetic field sensing arrangement, wherein the magnetic field sensing arrangement is arranged between the first end and the second end.
    Type: Grant
    Filed: December 12, 2013
    Date of Patent: July 31, 2018
    Assignee: TORQUE AND MORE (TAM) GMBH
    Inventor: Lutz May
  • Patent number: 10012552
    Abstract: A system for monitoring a component is provided. The system may include a strain sensor configured on the component, an electrical field scanner for analyzing the strain sensor, and a processor in operable communication with the electrical field scanner. The processor may be operable for measuring an electrical field value across the strain sensor along a mutually-orthogonal X-axis and Y-axis to obtain a data point set. The processor may further be operable for assembling a field profile of the strain sensor based on the data point set. Methods of using the system are also provided.
    Type: Grant
    Filed: November 23, 2015
    Date of Patent: July 3, 2018
    Assignee: General Electric Company
    Inventors: Thomas James Batzinger, Bryan J. Germann, William F. Ranson
  • Patent number: 10006974
    Abstract: An automated magnet quality measurement system includes a magnet measuring component and an automated magnet moving component. The magnet measuring component can be configured to measure EMF for a plurality of magnets. The automated magnet moving component can move each of the plurality of magnets into and out of the magnet measuring component without requiring any manual intervention, with only one of the plurality of magnets being within the magnet measuring component at a given time. The magnet measuring component can be a Helmholtz coil and the automated magnet moving component can be a rotating disk. The overall system can also include a loading system configured to load each of the magnets onto the automated magnet moving component on an individual and sequential basis, and a sorting system configured to sort the magnets based upon their EMF measurements.
    Type: Grant
    Filed: September 21, 2016
    Date of Patent: June 26, 2018
    Assignee: Apple Inc.
    Inventors: John C. Difonzo, Maurizio Bertoldo
  • Patent number: 9989429
    Abstract: The present invention relates to an arrangement for measuring a force and/or a torque on a machine element extending in an axis, using the inverse magnetostrictive effect. The machine element has at least one permanent magnetization. The permanent magnetization extends along a closed magnetization path. The magnetization path runs preferably at least partially along the surface of the machine element. The arrangement further includes at least one magnetic field sensor which is arranged opposite the machine element. The magnetic field sensor serves to determine a magnetic field and is designed to measure at least one vector component of a magnetic field coming from the machine element, which field is produced on the one hand by the permanent magnetization and on the other hand by the force and/or by the torque. According to the invention, the orientation of the permanent magnetization relative to the axis changes along the magnetization path.
    Type: Grant
    Filed: December 18, 2014
    Date of Patent: June 5, 2018
    Assignee: Schaeffler Technologies AG & Co. KG
    Inventors: Jan Matysik, Christian Mock, Stephan Neuschaefer-Rube
  • Patent number: 9952030
    Abstract: According to one embodiment, a strain sensing element includes a film unit being deformable, a first and a second magnetic unit, and a strain sensor. The first magnetic unit is provided on the film unit and is arranged with the film unit in a first direction. The first magnetic unit includes a first magnetic body layer and a first intermediate magnetic layer. The second magnetic unit is provided on the film unit and is arranged with the first magnetic unit in a second direction crossing the first direction. The second magnetic unit includes a second magnetic body layer and a second intermediate magnetic layer. The strain sensor is provided on the film unit between the first magnetic unit and the second magnetic unit. An electrical characteristic of the strain sensor changes according to a deformation of the film unit.
    Type: Grant
    Filed: October 20, 2015
    Date of Patent: April 24, 2018
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Shiori Kaji, Hideaki Fukuzawa, Tomohiko Nagata, Akio Hori, Yoshihiko Fuji
  • Patent number: 9909938
    Abstract: A sensor assembly for detecting surfaces stresses and/or the microstructure state of a ferromagnetic workpiece, wherein at least one first base coil system having a first directional sensitivity is provided, at least one second base coil system having a second directional sensitivity is provided, and at least one third base coil system having a third direction and a third directional sensitivity is provided, and wherein at least the first base coil system and the second base coil system form a first differential angle and the second base coil system and the third base coil system form a second differential angle, and wherein the first base coil system, the second base coil system, and the third base coil system are arranged such that the mechanical surface stresses of the workpiece can be at least partially determined. A method for determining the mechanical surface stresses is also provided.
    Type: Grant
    Filed: August 25, 2014
    Date of Patent: March 6, 2018
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Hans-Gerd Brummel, Uwe Pfeifer
  • Patent number: 9857244
    Abstract: A force sensor can include a magnetic field generator, a magnetic flux return, and a magneto-elastic layer. The magnetic flux return can extend along a first portion of at least one pathway of magnetic flux generated by the magnetic field generator. The magneto-elastic layer can be operable to be in contact with a surface subjected to force and thereby strained. The magneto-elastic layer can extend along a second portion of the at least one pathway of magnetic flux distinct from the first portion.
    Type: Grant
    Filed: September 2, 2014
    Date of Patent: January 2, 2018
    Assignee: Eaton Corporation
    Inventors: Mark Allan Juds, John Albert Kovacich
  • Patent number: 9851265
    Abstract: An apparatus for measuring material properties of an object of ferromagnetic material, the apparatus including a probe, the probe including an electromagnet core defining two spaced-apart poles for inducing a magnetic field in the object, and a drive coil wound around the electromagnet core, and means to supply an alternating electric current to the drive coil to generate an alternating magnetic field in the electromagnet core and consequently in the object, wherein the probe also includes two sensing coils arranged in the vicinity of each of the poles, for sensing the magnetic flux density that links the core and the object, such sensing coils are significantly more sensitive to changes in material properties than are sensing coils overwound onto the drive coil.
    Type: Grant
    Filed: January 24, 2013
    Date of Patent: December 26, 2017
    Assignee: GE Oil & Gas UK Limited
    Inventor: David John Buttle
  • Patent number: 9816905
    Abstract: Process for analyzing a fracture or crack surface of a TiAl turbomachine part, comprising at least one of the steps consisting in: a) marking on the surface the position and the orientation of cleavage facets, so as to identify a region of fracture or crack initiation and to determine the direction of propagation of this fracture or crack, b) examining the surface and detecting the regions with the presence of equiaxed grains and/or lamellar grains, so as to evaluate the temperature at which the fracture or crack has taken place, and c) comparing the heat tintings of the surface with those of samples from a heat tinting color chart so as to evaluate the speed of propagation of the fracture or crack.
    Type: Grant
    Filed: April 11, 2014
    Date of Patent: November 14, 2017
    Assignee: SNECMA
    Inventor: Fabrice Colladon
  • Patent number: 9751220
    Abstract: An example device may include an annular flexure hub including a first stationary head, a second stationary head, a first rotatable head, and a second rotatable head. Each of the heads comprise an annular sector of the flexure hub, and the first and second stationary heads are interleaved between the first and second rotatable heads. The device may also include a stationary housing coupled to the first stationary head and the second stationary head of the flexure hub. The device may also include a first sensor positioned adjacent to the first rotatable head of the flexure hub, and a second sensor positioned adjacent to the second rotatable head of the flexure hub. The device may also include a rotatable housing coupled to the first rotatable head and the second rotatable head of the flexure hub.
    Type: Grant
    Filed: March 31, 2015
    Date of Patent: September 5, 2017
    Assignee: Google Inc.
    Inventors: Michael Patrick Murphy, Donald Campbell
  • Patent number: 9746443
    Abstract: In at least one illustrative embodiment, a method for in-situ pathogen detection may comprise distributing one or more magnetoelastic measurement sensors on a surface of a test object, wherein each of the one or more magnetoelastic measurement sensors includes a biorecognition element configured to bind with a pathogen to cause a shift in a characteristic frequency of the associated measurement sensor; applying a varying magnetic field, using a test coil, to the one or more magnetoelastic measurement sensors distributed on the surface of the test object, wherein the test object is positioned outside of an inner volume defined by the test coil; detecting a frequency response of the one or more magnetoelastic measurement sensors using the test coil, while applying the varying magnetic field; and determining whether the pathogen is present based on the detected frequency response of the one or more magnetoelastic measurement sensors.
    Type: Grant
    Filed: October 28, 2013
    Date of Patent: August 29, 2017
    Assignee: AUBURN UNIVERSITY
    Inventors: Bryan A. Chin, Zhongyang Cheng, Suiqiong Li, Mi-Kyung Park, Shin Horikawa, Yating Chai, Kanchana Weerakoon, Stevie R. Best, Martin E. Baltazar-Lopez, Howard C. Wikle
  • Patent number: 9722175
    Abstract: The present invention discloses a design and manufacturing method for a single-chip magnetic sensor bridge. The sensor bridge comprises four magnetoresistive elements. The magnetization of the pinned layer of each of the four magnetoresistive elements is set in the same direction, but the magnetization directions of the free layers of the magnetoresistive elements on adjacent arms of the bridge are set at different angles with respect to the pinned layer magnetization direction. The absolute values of the angles of the magnetization directions of the free layers of all four magnetoresistive elements are the same with respect with their pinning layers. The disclosed magnetic biasing scheme enables the integration of a push-pull Wheatstone bridge magnetic field sensor on a single chip with better performance, lower cost, and easier manufacturability than conventional magnetoresistive sensor designs.
    Type: Grant
    Filed: August 26, 2015
    Date of Patent: August 1, 2017
    Assignee: MultiDimension Technology Co., Ltd.
    Inventors: Xiaofeng Lei, Insik Jin, James Geza Deak, Weifeng Shen, Mingfeng Liu, Songsheng Xue
  • Patent number: 9709532
    Abstract: There is provided a pipeline inspection device including: a body part contacting a pipeline and accommodating the pipeline; a coupling part coupled to the body part to enclose the pipeline; and a sensor part including a sensor on at least one of one side of the body part and one side of the coupling part which are in contact with the pipeline to inspect an internal state of the pipeline. The pipeline inspection device according to exemplary embodiments is capable of inspecting pipelines without increasing a gap between the pipelines even in a case in which the gap therebetween is relatively narrow, and is capable of readily and rapidly inspecting a large area of pipelines.
    Type: Grant
    Filed: July 17, 2013
    Date of Patent: July 18, 2017
    Assignees: Korea Electric Power Corporation, Korea East-West Power Co., Ltd.
    Inventors: Doo-Song Gil, Yeon-Shik Ahn, Gye-Jo Jung, Sang-Ki Park
  • Patent number: 9645022
    Abstract: A magneto-elastic force sensor includes a sensor head (1) that has an emitting coil (9) which generates a magnetic field and at least one magnetic field sensor (11) for measuring a magnetic flux caused by the magnetic field of the emitting coil (9) in a measured object (13). The sensor head (1) also includes a recorder (14) for recording an electrical value that reflects the inductivity of the emitting coil (9) or that is clearly connected to the latter. The magneto-elastic force sensor allows for compensation of a distance dependency in the measurement signal by ascertaining the distance between the emitting coil (9) or the sensor head (1) and the measured object (13) based on the recorded electrical value and by compensating the distance dependency in the measurement signal based on the ascertained distance.
    Type: Grant
    Filed: November 7, 2012
    Date of Patent: May 9, 2017
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Hans-Gerd Brummel, Uwe Linnert, Carl Udo Maier, Jochen Ostermaier, Uwe Pfeifer
  • Patent number: 9618408
    Abstract: A system includes a magnetostrictive sensor having a sensor head including a driving pole. The driving pole includes a driving coil that may receive a driving current and may emit a magnetic flux portion through a rotary structure. The sensor head also includes a sensing pole including a sensing coil that may receive the magnetic flux portion and may transmit a signal based at least in part on the received magnetic flux portion. The received magnetic flux portion is based at least in part on a force on the rotary structure. The sensor head also includes a temperature sensor disposed on the sensor head. The temperature sensor may measure a temperature of the rotary structure.
    Type: Grant
    Filed: December 17, 2015
    Date of Patent: April 11, 2017
    Assignee: General Electric Company
    Inventors: Dan Tho Lu, Pekka Tapani Sipila, Clifford James Uber
  • Patent number: 9606085
    Abstract: A building structure includes a block of building material and a magnetic circuit buried in the block of building material. The structure also includes a plurality of sensing devices buried in the block of building material. Each sensing device may include a contactless power supplying circuit magnetically coupled with the magnetic circuit to generate a supply voltage when the magnetic circuit is subject to a variable magnetic field.
    Type: Grant
    Filed: September 16, 2013
    Date of Patent: March 28, 2017
    Assignee: STMICROELECTRONICS S.R.L.
    Inventor: Alberto Pagani
  • Patent number: 9574802
    Abstract: A method for refrigeration through voltage-controlled entropy change includes applying a voltage signal to a piezoelectric material to generate strain in the piezoelectric material, generating strain in a magnetic material attached to the piezoelectric material, and generating a change in a temperature of the magnetic material in response to the strain in the magnetic material.
    Type: Grant
    Filed: May 23, 2016
    Date of Patent: February 21, 2017
    Assignee: NUtech Ventures
    Inventor: Christian Binek
  • Patent number: 9541468
    Abstract: A method of modifying a workpiece includes providing a workpiece, determining a load stress profile associated with a load condition, the load stress profile comprising a load stress greater than a material stress limit of the workpiece, determining a residual stress profile, the residual stress profile comprising a residual stress less than the material stress limit of the workpiece, and providing the workpiece with the residual stress profile, wherein a sum of the load stress and the residual stress is less than the material stress limit of the workpiece.
    Type: Grant
    Filed: April 16, 2015
    Date of Patent: January 10, 2017
    Assignee: BELL HELICOPTER TEXTRON INC.
    Inventors: Ryan T. Ehinger, Ron Woods, David Bockmiller
  • Patent number: 9525298
    Abstract: A system is provided for balancing voltage of two rechargeable energy storage devices connected in series at a common node. A voltage divider is configured to divide a total voltage across the two devices into first and second reference voltages. First and second circuit elements include, respectively: first and second comparators, first and second P-channel MOSFETs, first and second current limiting resistors, and first and second networks of resistors. The first circuit elements are in electrical communication and configured to actively discharge a first device of the two devices when a difference between a voltage at the common node and the first reference voltage is greater than a first predetermined voltage. The-second circuit elements are in electrical communication and configured to actively charge the first device when a difference between the voltage at the common node and the second reference voltage is less than a second predetermined voltage.
    Type: Grant
    Filed: October 28, 2014
    Date of Patent: December 20, 2016
    Assignee: Microsemi Storage Solutions (U.S.), Inc.
    Inventor: Tan Pham
  • Patent number: 9488537
    Abstract: The present system determines a significant stress value (?) of a component made of magnetizable material. The system has a generating stage for generating a magnetic field of varying amplitude (H); and also includes a pickup stage for acquiring a Barkhausen noise signal (MBN) alongside variations in the amplitude (H) of the magnetic field. The system is characterized by having a processing unit for calculating the reciprocal (1/MBNmax) of the maximum value (MBNmax) of the signal (MBN), alongside variations in the amplitude (H) of the magnetic field. The processing unit has a memory stage storing a linear relation between the reciprocal (1/MBNmax) of the maximum value and the significant stress value (?).
    Type: Grant
    Filed: May 23, 2011
    Date of Patent: November 8, 2016
    Assignee: AGUSTA WESTLAND S.P.A.
    Inventors: David C. Jiles, Lukasz Mierczak, Luigi Merletti, Gabriele Fantoni
  • Patent number: 9459086
    Abstract: Devices, systems and methods for detecting the shape of a moving strip of material with high resolution along the edges thereof. Device and system embodiments may include a plurality of displacement-type shape sensor assemblies that may be collectively linearly displaced in a direction substantially transverse to the direction of a moving strip of material being examined, and also selectively activated or deactivated as necessary so as to provide edge-to-edge strip coverage to the extent possible.
    Type: Grant
    Filed: February 17, 2014
    Date of Patent: October 4, 2016
    Assignee: Machine Concepts, Inc.
    Inventors: Guil Bergman, Anthony Enneking
  • Patent number: 9422150
    Abstract: According to one embodiment, a pressure sensor includes: a support section; a film section; and a strain sensing element. The film section is supported by the support section and deformable. The film section includes a first film and a second film. The first film includes a first region located in a central part and a second region located in a peripheral part around the first region. The second film is provided on the first region. The strain sensing element is provided on part of the second region. The strain sensing element includes a first magnetic layer; a second magnetic layer; and an intermediate layer. Magnetization of the first magnetic layer changes in response to deformation of the second region. The intermediate layer is provided between the first magnetic layer and the second magnetic layer.
    Type: Grant
    Filed: December 29, 2014
    Date of Patent: August 23, 2016
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Kazuaki Okamoto, Hideaki Fukuzawa, Yoshihiko Fuji, Akiko Yuzawa, Akio Hori, Kei Masunishi
  • Patent number: 9404989
    Abstract: A method for enhancing inspection of components of specific geometry based on Barkhausen noises. The method includes specifying a first calibration curve that is independent of the component geometry, which describes the relationship between surface hardness values and measured Barkhausen noise signals. A first noise signal is determined by the measuring device for a reference component having the specified geometry and a first hardness value. A second noise signal is determined for a second reference component, having the specified geometry and a second hardness value lower than the first. A second calibration curve is determined, in which the first calibration curve is fitted to the first noise signal at the first hardness value and to the second noise signal at the second hardness value, such that using the second calibration curve, the measured noise signal of a component having the specified geometry relates with a surface hardness value.
    Type: Grant
    Filed: March 4, 2013
    Date of Patent: August 2, 2016
    Assignee: ZF Friedrichshafen AG
    Inventors: Oliver Bleicher, Herman Yakaria, Yiwen Xu
  • Patent number: 9400166
    Abstract: The invention relates to a sensor arrangement (2) for determining a relative rotation of two shafts that are arranged coaxially to one another (4, 6), which sensor arrangement comprises at least one magnetic element (29) arranged on a first shaft (4), at least one magnetic element (29) arranged on a second shaft (6) and at least one magnetic field-sensitive sensing element (20), which is arranged in a stationary manner between the magnetic elements (29) of the two shafts (4, 6) and which captures a magnetic field that results from the superposition of the magnetic fields (32) of the magnetic elements (29) of both shafts (4, 6).
    Type: Grant
    Filed: August 7, 2012
    Date of Patent: July 26, 2016
    Assignee: Robert Bosch GmbH
    Inventor: Ronny Ludwig
  • Patent number: 9383339
    Abstract: A method of inspecting a component (1) on the basis of Barkhausen noises in which a plurality of Barkhausen noise signals are processed, which have been or are determined at measurement positions (PS1, PS2, . . . , PS9) along the surface of the component (1) by a measuring device. According to the method, a computer forms a measurement matrix (M) from the Barkhausen noise signals, which matrix contains the Barkhausen noise signals detected as entries. A variety of characteristics are specified, each of which represents at least one cause of a manufacturing defect(s) of the component (1), each characteristic is associated with a processing procedure of the measurement matrix (M). The procedure is specific for the characteristic concerned. Finally, for each characteristic the measurement matrix (M) undergoes the associated processing procedure in which the intensity of the characteristic concerned is determined.
    Type: Grant
    Filed: March 4, 2013
    Date of Patent: July 5, 2016
    Assignee: ZF Friedrichshafen AG
    Inventors: Oliver Bleicher, Herman Yakaria, Yiwen Xu
  • Patent number: 9270286
    Abstract: Present embodiments relate to a method for synchronizing an electric grid. The method includes receiving a phase voltage of the electric grid. The method further includes determining one or more disturbance frequencies in the phase voltage via a plurality of sequential tracking filters, wherein each of the plurality of tracking filters corresponds to a harmonic of the received phase voltage. The method further includes removing the disturbance frequencies components sequentially to produce a minimally distorted frequency, and performing a PLL operation on the clean frequency to determine a phase angle of the frequency.
    Type: Grant
    Filed: June 30, 2014
    Date of Patent: February 23, 2016
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Ahmed Mohamed Sayed Ahmed, Russel J. Kerkman, Brian J. Seibel
  • Patent number: 9254863
    Abstract: There is provided a torque detecting device for providing a highly accurate torque signal, and an electric power steering device using the torque detecting device. A torque sensor is provided with a first coil pair and a second coil pair, which detect a relative displacement between an input shaft and an output shaft by corresponding the relative displacement to a change in impedance. Magnetization signal generating units supply exciting currents with different magnetization frequencies to the first coil pair and a second coil pair, respectively. The magnetization frequency difference is set to 3.5 kHz or higher. Moreover, low-pass filters for intercepting passage of a frequency equivalent to the magnetization frequency difference are deployed in signal processing circuits respectively.
    Type: Grant
    Filed: March 21, 2012
    Date of Patent: February 9, 2016
    Assignee: NSK Ltd.
    Inventors: Masaki Kuwahara, Takayuki Kobayashi, Kazuhiro Yoshida, Toshiyuki Onizuka, Takayoshi Sugawara, Nobuhiko Andou
  • Patent number: 9176096
    Abstract: A device for discovering, identification and monitoring of mechanical flaws in metallic structures is disclosed, based on magneto-graphic/magnetic tomography technique to identify stress-related defects. The device includes registration means that optimized for use with metallic structures of various types, shapes and sizes. Applications include a real-time quality control, monitoring and emergency alarms, as well structural repairs and maintenance work recommendations and planning. Examples of the device implementation include pipes for oil and gas industry monitoring, detection of flaws in rolled products in metallurgical industry, welding quality of heavy duty equipment such as ships, reservoirs. etc. It is especially important for loaded constructions, such as pressured pipes, infrastructure maintenance, nuclear power plant monitoring, bridges, corrosion prevention and environment protection.
    Type: Grant
    Filed: June 18, 2013
    Date of Patent: November 3, 2015
    Inventors: Valerian Goroshevskiy, Svetlana Kamaeva, Igor Kolesnikov, Leonid Ivlev
  • Patent number: 9134188
    Abstract: A contactless force measurement sensor for measuring an applied force onto an object is provided. The contactless force measurement sensor includes a first facing orientation which facing orientation defines an orientation pointing towards a surface of the object, a first magnetic field generating unit being adapted for generating a magnetic field towards the facing orientation, a first magnetic field detector unit being adapted for detecting a first magnetic field which field being generated by the first magnetic field generating unit and being influenced by an applied force to be measured, wherein the first magnetic field detector unit is further adapted for outputting a first signal being representative for the detected magnetic field, and an evaluating unit being adapted for evaluating a signal strength of the first signal and determining the applied force based on the first signal.
    Type: Grant
    Filed: December 10, 2012
    Date of Patent: September 15, 2015
    Assignee: PolyResearch AG
    Inventor: Lutz May
  • Publication number: 20150091555
    Abstract: An apparatus for detecting magnetic flux leakage signals is provided. The apparatus includes: M three-axis magnetic field sensors configured to detect a three-dimensional magnetic field intensity in M locations respectively to obtain M three-dimensional magnetic field intensity data, in which M is an integer larger than three; a field programmable gate array configured to receive and process the M three-dimensional magnetic field intensity data respectively; a main control chip configured to receive and pack the processed M three-dimensional magnetic field intensity data; and a data output interface configured to output the packed M three-dimensional magnetic field intensity data.
    Type: Application
    Filed: April 28, 2014
    Publication date: April 2, 2015
    Applicant: TSINGHUA UNIVERSITY
    Inventors: Songling Huang, Wei Zhao, Shen Wang, Qun Liu
  • Patent number: 8978464
    Abstract: An alternate construction and method for a magnetostrictive probe intended to be used as a tank monitoring device. Height determination, either water or fuel, is referenced to an ultrasonic pickup assembly located inside the shaft at the foot of the probe. With this inverse approach, height measurement uses the relative geothermal stability of underground storage tanks, or the temperature stability offered by the thermal mass of the fuel, to facilitate a tank level determination. At that new location, the detection circuit is isolated from the effect of magnetic risers, large temperature swings and other undesirable phenomenon that often affect magnetostrictive probe measurements that are referenced to the canister. Aside from its primary use as referred to by this disclosure, this probe could be adapted for any application necessitating precise knowledge of height or distance measurement in relation to the foot of the probe without using a reference magnet.
    Type: Grant
    Filed: February 14, 2013
    Date of Patent: March 17, 2015
    Inventor: Ambroise Prinstil
  • Patent number: 8981018
    Abstract: The condition of internal or hidden material layers or interfaces is monitored and used for control of a process that changes a condition of a material system. The material system has multiple component materials, such as layers or embedded constituents, or can be represented with multiple layers to model spatial distributions in the material properties. The material condition changes as a result of a process performed on the material, such as by cold working, or from functional operation. Sensors placed proximate to the test material surface or embedded between material layers are used to monitor a material property using magnetic, electric, or thermal interrogation fields. The sensor responses are converted into states of the material condition, such as temperature or residual stress, typically with a precomputed database of sensor responses.
    Type: Grant
    Filed: March 14, 2005
    Date of Patent: March 17, 2015
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Ian C. Shay, Christopher A. Craven, David C. Grundy, Volker Weiss, Andrew P. Washabaugh
  • Patent number: 8960012
    Abstract: Yield stress is an important indicator of the strength of a component such as a pipe section. A method and apparatus for measuring yield stress of components made from magnetic materials is provided. The magnetic permeability of the material is recorded at multiple stress levels below yield establishing a permeability-stress relationship. The yield stress is then estimated as a function of the recorded permeability-stress relationship. The permeability stress relationship may be non-linear for a range of stress levels, achieving a peak permeability response for a stress below yield. The yield stress may be estimated as a multiple of the stress at which the peak permeability response is recorded.
    Type: Grant
    Filed: October 30, 2013
    Date of Patent: February 24, 2015
    Assignee: JENTEK Sensors, Inc.
    Inventors: Todd M. Dunford, Neil J. Goldfine, Shayan Haque
  • Patent number: 8933693
    Abstract: In various embodiments, apparatus and methods of operating the apparatus are provided to determine existence and location of parasitic stress threes on a rod portion, the rod portion made of a magnetostrictive material and having a hollow tube. The apparatus may include a device comprising an envelope made of a non-magnetic material, a magnetic field source disposed inside the envelope, a motor to set the magnetic field source in rotational motion on the inside of the envelope, and a sensor to measure a value of the magnetic field and to deliver a signal representative of the value of the magnetic field. Operation of the apparatus may include penetration of the envelope into a portion of the hollow tube of the rod portion and translation of the envelope along the portion of the hollow tube. Additional apparatus, systems, and methods are disclosed.
    Type: Grant
    Filed: May 1, 2012
    Date of Patent: January 13, 2015
    Inventors: Jean-Pierre Martin, Phillippe Broun, Jean-Louis Coulomb, Vincent Bongiraud
  • Publication number: 20150008908
    Abstract: An apparatus for measuring material properties of an object of ferromagnetic material, the apparatus including a probe, the probe including an electromagnet core defining two spaced-apart poles for inducing a magnetic field in the object, and a drive coil wound around the electromagnet core, and means to supply an alternating electric current to the drive coil to generate an alternating magnetic field in the electromagnet core and consequently in the object, wherein the probe also includes two sensing coils arranged in the vicinity of each of the poles, for sensing the magnetic flux density that links the core and the object, such sensing coils are significantly more sensitive to changes in material properties than are sensing coils overwound onto the drive coil.
    Type: Application
    Filed: January 24, 2013
    Publication date: January 8, 2015
    Inventor: David John Buttle
  • Patent number: 8890516
    Abstract: A tension measurement apparatus that can carry out tension measurement of superior reproducibility with high sensitivity even for a target object of a stranded wire structure is provided. A cylindrical magnetizer arranged to surround a portion of a long magnetic element that becomes the target object of measurement direct-current magnetizes the magnetic element in the longitudinal direction up to the range of approach to saturation magnetization. Using a Hall element (magnetic sensor) arranged in proximity to the magnetic element at the central region in the longitudinal direction of the magnetic domain, the spatial magnetic field intensity in the neighborhood of the surface of the magnetic element, greatly differing corresponding to stress variation, is detected. Based on the detection value, the tension acting on the magnetic element is measured. Accordingly, a measurement result of superior reproducibility with high sensitivity is obtained.
    Type: Grant
    Filed: April 24, 2009
    Date of Patent: November 18, 2014
    Assignees: Sumitomo (SEI) Steel Wire Corp., Tokyo Rope Manufacturing Co., Ltd.
    Inventors: Kazuhiko Tsukada, Ippei Furukawa, Toshiro Kido, Masashi Oikawa
  • Patent number: 8829898
    Abstract: Aspects of the disclosure provide a method for testing. The method includes determining an electrical characteristic of an integrated circuit (IC), subjecting the IC to a stress test, characterizing the electrical characteristic of the IC subsequently to subjecting the IC to the stress test, and determining a quality attribute of the IC based on a comparison of the respective electrical characteristics of the IC before and after subjecting the IC to the stress test.
    Type: Grant
    Filed: June 7, 2011
    Date of Patent: September 9, 2014
    Assignee: Marvell Israel (M.I.S.L) Ltd.
    Inventors: Yosef Solt, Asaf Idan, Ofer Benjamin, Eli Kurin
  • Publication number: 20140197825
    Abstract: An arrangement for a metal making process for detecting cracks along a strip of a metallic material moving in relation to the arrangement. The arrangement includes a coil arrangement fixedly arranged during crack inspection, having: a first winding portion extending in a first direction for inducing a first current in the first direction; a second winding portion extending in a second direction for inducing a second current in the second direction, the first direction and the second direction intersecting each other; a first receiver coil arranged to detect a magnetic field generated by the first current; and a second receiver coil arranged to detect a magnetic field generated by the second current, the magnetic field generated by the first current and the magnetic field generated by the second current providing a measure of whether a crack is present in the portion of the strip.
    Type: Application
    Filed: March 10, 2014
    Publication date: July 17, 2014
    Inventors: Lennart Thegel, Sten Linder