With Compensation For Test Variable Patents (Class 324/225)
  • Patent number: 6172499
    Abstract: A device is disclosed for measuring the position (location and orientation) in the six degrees of freedom of a receiving antenna with respect to a transmitting antenna utilizing multiple frequency AC magnetic signals. The transmitting component consists of two or more transmitting antenna of known location and orientation relative to one another. The transmitting antenna are driven simultaneously by an AC excitation, with each antenna occupying one or more unique positions in the frequency spectrum. The receiving antennas measure the transmitted AC magnetic field plus distortions caused by conductive metals. A computer then extracts the distortion component and removes it from the received signals providing the correct position and orientation output to a high degree of accuracy.
    Type: Grant
    Filed: October 29, 1999
    Date of Patent: January 9, 2001
    Assignee: Ascension Technology Corporation
    Inventor: Westley Ashe
  • Patent number: 6166537
    Abstract: Method to measure the variations in section of a hot rolled bar (12) as it is fed, the method including the generation of a variable frequency magnetic field by at least a generator device (14) defining an inner space (214) for the transit of the bar (12), the variations in section of the bar (12) in transit being measured by a receiver device (15) suitable to monitor the perturbations induced on the magnetic field by the variations in the area of section of the bar (12) in transit. The receiver device (15) is arranged coaxial and inside the generator device (14) and defines inside the same a surface for the transit of the bar. The (12) has a transverse section of (A.sub.S "), and the value ("f.sub.0 ") of the frequency of the magnetic field generated by the generator device (14) is suitable to minimize the influence of the real temperature of the bar (12) on the measurement.
    Type: Grant
    Filed: March 24, 1998
    Date of Patent: December 26, 2000
    Assignee: Centro Automation SpA
    Inventor: Ferruccio Della Vedova
  • Patent number: 6154027
    Abstract: The current flow from a temperature-variable current source to a Hall-effect element is adjusted according to sensed temperature conditions of the element to compensate for temperature-dependent changes in the magnetic-field sensitivity of the Hall-effect element and in the magnitude of the permanent magnetic fields of magnetic components sensed by the element. A trimmable resistor is connected between two external terminals of a Monolithically integrated circuit to provide external control over the sensitivity of the temperature variable current source to changing temperature conditions. The device also alternately switches the quadrature states of output and bias supply contacts of the Hall-effect element to compensate for the offset and drift thereof.
    Type: Grant
    Filed: October 20, 1997
    Date of Patent: November 28, 2000
    Assignee: Analog Devices, Inc.
    Inventors: Alasdair G. W. Alexander, Paul R. Nickson, David P. Foley
  • Patent number: 6154026
    Abstract: An asymmetric planar gradiometer for use in making biomagnetic measurements. The gradiometer is formed from a magnetometer which is inductively-coupled to the smaller of two connected loops patterned in a superconducting film which form a flux transformer. The magnetometer is based on a SQUID formed from a high T.sub.c superconducting material. The flux transformer and magnetometer may be formed on separate substrates, allowing the baseline to be increased relative to presently available devices.
    Type: Grant
    Filed: April 29, 1998
    Date of Patent: November 28, 2000
    Assignee: The Regents of the University of California
    Inventors: Eugene Dantsker, John Clarke
  • Patent number: 6150811
    Abstract: A magnetic field sensor consists of a cylinder (2) with a core of premagnetized amorphous ferromagnetic metal. The inductance of the coil (2) is controlled by earth magnetic field H.sub.E and forms part of an L.C. oscillator (1). An adjusting device is provided to smooth out fluctuations from a target value in the oscillator frequency caused by the action of the field H.sub.E on the oscillator coil (2). This is done by allowing another adjustable magnetic field to influence the inductance (2) of the oscillator (1): the adjustable magnetic field is generated by a second coil (3) in the form of a compensating coil and the current flux (1) through the second coil (3) is controlled by the adjusting device in such a way that the magnetic field generated by the second coil (3) compensates for the action of the field H.sub.
    Type: Grant
    Filed: April 18, 1998
    Date of Patent: November 21, 2000
    Assignee: Mannesmann VDO AG
    Inventors: Thomas Grill, Helmut Bacic, Martin Gruler, Oliver Springmann
  • Patent number: 6150809
    Abstract: An apparatus and method for detecting defects in electrically conductive materials. A detection method and apparatus are provided for using applied magnetic fields to induce magnetic fields in the material under test, and then directly detecting changes in the induced magnetic field attributable to corrosion, cracks, flaws, or anomalies in the material under test. The invention features the use of one or more giant magnetoresistance sensors to detect directly the changes in the induced magnetic field, which changes provoke a response in the giant magnetoresistance sensors in the form of a change in resistance signal. The apparatus may be configured in various ways, including absolute field detection and differential field detection configurations, with either passive or active field compensation, and single sensor or multiple sensor arrays. A plurality of giant magnetoresistance sensors may be disposed upon a single substrate, or on multiple substrates.
    Type: Grant
    Filed: September 18, 1997
    Date of Patent: November 21, 2000
    Assignee: TPL, Inc.
    Inventors: Timothy C. Tiernan, Raymond L. Jarratt, Jr.
  • Patent number: 6100685
    Abstract: A high frequency magnetic properties measuring system is used for measurement of high frequency magnetic properties, for example high frequency core-loss and magnetic hysteresis curve (coercivity force, magnetic flux density, permeability) in soft magnetic materials such as ferrites, permalloy and amorphous magnetic cores used in inductors, transformers and filters of various electric and electromagnetic systems and devices such as computers and multimedia devices. A digital oscilloscope is operated as a waveform detection unit for measuring magnetic fields and magnetic flux density. A signal generator and a power amplifier are operated as a signal input unit. The digital oscilloscope and the signal generator are remotely controlled through a General Purpose Interface Bus by the computer. The high frequency magnetic properties are measured by remote control and the resulting data can be outputted and stored by the computer.
    Type: Grant
    Filed: February 19, 1998
    Date of Patent: August 8, 2000
    Assignee: Korea Electrotechnology Research Institute
    Inventors: Ki Uk Kim, Jae Sung Song
  • Patent number: 6075361
    Abstract: The device comprises a Wheatstone bridge with at least four magnetoresistive elements (1a, 1b, 1c, 1d) on a substrate (15), each magnetoresistive element comprising at least one sensitive portion (13) comprising successively a first ferromagnetic layer (19) having a magnetic easy axis (27) extending in a first direction, a non-magnetic layer (21) and a second ferromagnetic layer (23) having a magnetic easy axis (29) extending in a second direction that is different from the first direction. The sensitive portions (13) have mutually parallel sensitive directions that are parallel to a third direction (X). Each magnetoresistive element (1a, 1b, 1c, 1d) is associated with a current conductor (35a, 35b, 35c, 35d) provided in the immediate vicinity of that magnetoresistive element. The first direction (27) is canted through an acute angle with respect to the third direction (X), and the second direction (29) is canted in the opposite sense through an acute angle with respect to the third direction.
    Type: Grant
    Filed: November 25, 1997
    Date of Patent: June 13, 2000
    Assignee: U.S. Philips Corporation
    Inventors: Reinder Coehoorn, Jacques C. S. Kools
  • Patent number: 6069476
    Abstract: A magnetic field sensor having a magnetoresistance bridge. The sensor includes two longitudinally connected multilayer magnetoresistances and two transversely connected multilayer magnetoresistances. The two longitudinally connected magnetoresistances are sensitive to the magnetic field to be measured. The four magnetoresistances are connected to a wheatstone bridge.
    Type: Grant
    Filed: March 31, 1998
    Date of Patent: May 30, 2000
    Assignee: Commissariat A L'Energie Atomique
    Inventors: Line Vieux-Rochaz, Jean-Marc Fedeli, Robert Cuchet
  • Patent number: 6069474
    Abstract: A correction winding in which an alternating current flows attributable to magnetic flux generated in an exciting winding when an alternating current is allowed to flow in the exciting winding, is provided for a sensing device. In a state where the characteristics of the sensing device are not changed, electric power is supplied to the exciting winding so that a reference value, which is a digital value of the difference in the potential between the two ends of the correction winding detected by the correction detection circuit, is stored in a RAM of a microcomputer by operating a setting switch, and then divided with a digital value of the difference in the potential between the two ends of the correction winding detected by the correction detection circuit. A value Vso/Vs, which is a result of the division, is used to multiply the digital value of the difference in the potential between the two ends of the detection winding detected by the detection circuit.
    Type: Grant
    Filed: October 7, 1997
    Date of Patent: May 30, 2000
    Assignee: Yazaki Corporation
    Inventors: Hideyuki Aoshima, Kathuji Suzuki
  • Patent number: 6064202
    Abstract: The method serves for dynamically compensating the offset voltage of a Hall device. The Hall device can have either a platelike structure with at least two contact pairs, or any other arrangement deriveable by conformal mapping. The contact pairs are angled by e.g. 90.degree.. Each pair is supplied with a periodically alternating current whereby the phase shift of the supply currents corresponds to the spatial phase shift of the contact pairs and is e.g. 90.degree.. Superposition of the supplied currents results in a continuously spinning current vector in the Hall device. By measuring simultaneously the voltages between corresponding terminals, a signal consisting of the Hall voltage and a periodic offset voltage can be isolated. The offset voltage is eliminated by averaging the signal over at least one period.
    Type: Grant
    Filed: August 24, 1998
    Date of Patent: May 16, 2000
    Assignee: Physical Electronics Laboratory
    Inventors: Ralph Steiner, Andreas Haeberli, Franz-Peter Steiner, Christoph Maier
  • Patent number: 6057684
    Abstract: A magnetic sensor in which magnetic leakage flaw detection can be performed with high accuracy without so reducing liftoff, and a magnetic flaw detection method and apparatus to which the magnetic sensor is applied. The magnetic sensor 50 for detecting magnetic flux generated due to a defect portion of a magnetized subject to be inspected has an E-shaped core 51 having magnetic poles (51a, 51b and 51c) arranged in the neighborhood of a steel plate (13) to be inspected, and a search coil (52) wound on the center magnetic pole (51b) of the E-shaped core for detecting the magnetic flux. An external magnetic field floating in the circumference of the E-shaped magnetic sensor passes through the opposite side magnetic poles (51a and 51c) of the E-shaped core 51 but does not cross the center magnetic pole (51b) of the E-shaped core. Accordingly, no voltage due to the external magnetic field is induced in the search coil (52), so that only the magnetic flux caused by the defect portion is detected.
    Type: Grant
    Filed: June 27, 1997
    Date of Patent: May 2, 2000
    Assignees: Yoshihiro Murakami, NKK Corporation
    Inventors: Yoshihiro Murakami, Akio Nagamune, Hiroharu Kato, Junichi Yotsuji, Kozo Maeda, Kenichi Iwanaga
  • Patent number: 6037768
    Abstract: A pulsed eddy current (PEC) instrument acquires PEC pulse responses from different locations on a structure being inspected. The difference between the acquired PEC pulse responses and a reference PEC response is determined to obtain time-domain difference signals having a time value and a magnitude value. The time and magnitude values are stored in memory with location information. An image display is provided that is determined from the stored magnitude values, although magnitude values for difference signals whose time values do not meet a defined time condition are filtered from the display. The time condition filters from the display known conditions such as the presence of fasteners, the presence of air-gaps between layers of the structure, and excessive PEC probe lift-off from the structure and filters the display so that only information from a particular layer or depth of the inspected structure is displayed.
    Type: Grant
    Filed: April 2, 1997
    Date of Patent: March 14, 2000
    Assignee: Iowa State University Research Foundation, Inc.
    Inventors: John C. Moulder, Sunil K. Shaligram, Jay A. Bieber, James H. Rose
  • Patent number: 6034527
    Abstract: A method and apparatus employs Hall probes for contactless, longitudinal and transversal homogeneity examination of a critical current density j.sub.c in a superconductor tape that is cooled to below a transition temperature T.sub.c. The cooled superconductor tape is pulled through an external, locally limited magnetic field that has a constant gradient and a fixed magnetic field axis. The magnetic field generated by a screening current induced in a region of the superconductor tape penetrated by the external magnetic field is scanned using a first Hall probe at a distance of a few tenths of millimeters to the superconductor tape. The external magnetic field outside of a field range of the induced persistent currents is measured with a second Hall probe. A compensated difference between the first and second Hall probe signals is used as a qualitative measure for a critical current density j.sub.
    Type: Grant
    Filed: April 24, 1998
    Date of Patent: March 7, 2000
    Assignee: Forschungszentrum Karlsruhe GmbH
    Inventors: Heinz-Peter Schiller, Wolfgang Schauer, Hans Reiner, Kai Grube, Milan Polak
  • Patent number: 6020737
    Abstract: A rotary resolver having a stator housing with electromagnetic coils and a permanent magnetic rotor rotatable therein is improved to provide a resolver system with more precise angular rotor position readings. Interacting system features include a ring of soft magnetic material interposed between north and south magnetic pole structure on the rotor, which is enhanced in performance by a particular one of the soft magnetic materials RSi 24, RNi 8 and RNi 5. Adjustable compensation coil structure in the stator housing interacting with the rotor flux pattern obtains more precise angular readings in different working locations. A digital control system dynamically processes flux compensation information. Resolver units may be positioned at an end of a rotating shaft in a working position for detecting the angular rotation position of the shaft.
    Type: Grant
    Filed: June 27, 1997
    Date of Patent: February 1, 2000
    Inventor: Walter Wyss
  • Patent number: 6014024
    Abstract: The present invention uses a magnet and sensor coil unilaterial and in relative motion to a conductive material, to measure perturbation or variation in the magnetic field in the presence of a flaw. A liftoff compensator measures a distance between the conductive material and the magnet.
    Type: Grant
    Filed: March 17, 1998
    Date of Patent: January 11, 2000
    Assignee: Battelle Memorial Institute
    Inventors: Ronald L. Hockey, Douglas M. Riechers
  • Patent number: 6008641
    Abstract: Inventive electrical-computational method and system for aligning a magnetic gradiometer, and for determining magnetic gradients using a magnetic gradiometer which is inventively aligned. For each correlation of a correction magnetometer's vector with a reference magnetometer's vector, three correction coefficients and an offset coefficient are evaluated, using a mathematical approximation technique (such as least-squares) upon voltage outputs for various relative orientations of magnetic fields in relation to a magnetic gradiometer. An inventive matrix formula is used for determining magnetic gradients. A correction magnetometer matrix (matrix of voltages generated by each correction vector of the correction magnetometer) is multiplied by a coefficient matrix (matrix of correction and offset coefficients).
    Type: Grant
    Filed: October 22, 1997
    Date of Patent: December 28, 1999
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: Barry Penfold, Stephen W. Frommer
  • Patent number: 5990678
    Abstract: A non-destructive testing equipment comprises a magnetic field generator for generating a uniform magnetic field, and a magnetic sensor accommodated in a thermal insulation container and filled with a liquid nitrogen. The thermal insulation container is located within a magnetic shield container having an opening. The magnetic sensor includes a SQUID that is a magnetic sensor having very high sensitivity. The magnetic sensor can detect, through the opening, an appreciable variation of the magnetic field that is caused by small impurities or minor defects contained in the object to be tested.
    Type: Grant
    Filed: May 24, 1996
    Date of Patent: November 23, 1999
    Assignee: Sumitomo Electric Industries, Ltd.
    Inventor: Hirokazu Kugai
  • Patent number: 5990679
    Abstract: Inventive electrical-computational method and system for aligning a magnetic gradiometer, and for determining magnetic gradients using a magnetic gradiometer which is inventively aligned. For each correlation of a correction magnetometer's vector with a reference magnetometer's vector, three correction coefficients and an offset coefficient are evaluated, using a mathematical approximation technique (such as least-squares) upon voltage outputs for various relative orientations of magnetic fields in relation to a magnetic gradiometer. An inventive matrix formula is used for determining magnetic gradients. A correction magnetometer matrix (matrix of voltages generated by each correction vector of the correction magnetometer) is multiplied by a coefficient matrix (matrix of correction and offset coefficients).
    Type: Grant
    Filed: October 22, 1997
    Date of Patent: November 23, 1999
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventors: Stephen W. Frommer, Barry Penfold
  • Patent number: 5982188
    Abstract: According to the present invention, entry into the test mode of an integrated circuit device is possible even when there is no device pin dedicated to a test mode function. Test mode control circuitry allows a pin of the integrated circuit device to be double mapped to a normal operation function and to a test mode function. The test mode control circuitry has a polarity circuit having a polarity bond pad and a fuse circuit having a fuse element, either of which may determine when the polarity of the pin is representative of a test mode function. Either down-bonding the polarity bond pad to the lead frame of the integrated circuit device or blowing the fuse renders the pin representative of the test mode function. Additionally, once the test mode of the device is entered, the device may be adequately stress tested.
    Type: Grant
    Filed: July 29, 1994
    Date of Patent: November 9, 1999
    Assignee: STMicroelectronics, Inc.
    Inventor: Mark Alan Lysinger
  • Patent number: 5977766
    Abstract: A method and a device for inductive measurement of physical parameters of an object of metallic material by generating a time-varying magnetic field from a primary coil in a measurement range. The magnetic field induces eddy currents in the object which influence the time-varying magnetic field. The field is detected by a measuring coil from which a signal is obtained which carries information about the desired parameters. A field-measuring coil is introduced outside the measurement range, but surrounded by an electric circuit generated at the measurement range. The field-measuring coil senses a current induced in the electric circuit by the time-varying magnetic field. The interfering magnetic field generated by the current, and which influences the time-varying magnetic field, adds an error to the measurement of the measuring coil.
    Type: Grant
    Filed: May 27, 1998
    Date of Patent: November 2, 1999
    Assignee: ASEA Brown Boveri AB
    Inventors: Sten Linder, Lennart Thegel, Anders Eidenvall
  • Patent number: 5942893
    Abstract: An eddy current sensor comprises a generally E-shaped core having three parallel legs joined together by a bridge. Current carrying coils are mounted on each of the outer legs and a signal coil is mounted on the central leg. Identical a.c. currents are caused to flow through the two outer coils for generating two magnetic fields which combine to form a sensing magnetic field extending outwardly from the ends of the legs for sensing purposes but which cancel one another within the central leg. The sensor is disposed within an E-shaped, hollow shield of an eddy current producing, electrically conductive material. The sensor fits within the shield as fingers in a glove with the parallel legs of the sensor magnetically separated from one another by walls of the shield. Only the ends of the sensor legs are exposed through apertures through the shield for emergence of the various magnetic fields. The shield cancels unwanted fringing fields and better guides the magnetic fields in desired directions.
    Type: Grant
    Filed: December 12, 1997
    Date of Patent: August 24, 1999
    Assignee: General Dynamics Advanced Technology Systems
    Inventor: Gregory Weston Terpay
  • Patent number: 5926020
    Abstract: The eddy current probe for non-destructive testing of a conductive elongated member includes an oscillating magnetic field generator for producing a magnetic field directed towards a cross-sectional peripheral surface of the elongated member. The magnetic field generator includes a pair of coils arranged to be spaced apart along the elongated member to produce an enhanced combined magnetic field component perpendicular to the cross-sectional peripheral surface in a space between the coils and a reduced magnetic field component lengthwise along the elongated member. A ferromagnetic member is movably mounted for altering the magnetic field at points along the cross-sectional peripheral surface provided between the coils. A detecting and analyzing system measures an impedance of the coils as the generator is moved along the elongated member and as the field altering member is moved over the peripheral surface. An enhanced signal is obtained.
    Type: Grant
    Filed: May 16, 1997
    Date of Patent: July 20, 1999
    Inventor: Rock Samson
  • Patent number: 5914593
    Abstract: The novel temperature gradient compensation circuit is designed to overcome temperature gradient problems in inductive or capacitive circuits, such as, differential variable reluctance transducers. The system comprises, in one embodiment, the use of an inductive or alternating current bridge which sends its output to a low pass filter in order to remove the alternating current component of the bridge output. The output of the low pass filter is fed into an instrumentation amplifier whose gain can be adjusted. The output of this instrumentation amplifier is a signal that is proportional to the temperature gradient experienced by the alternating current bridge. The output of the alternating current bridge is also fed to a high pass filter and then sent to a demodulator and amplifier. By subtracting the direct current output from the alternating current output, the effects of temperature do not have an effect upon the result.
    Type: Grant
    Filed: July 6, 1998
    Date of Patent: June 22, 1999
    Assignee: Micro Strain Company, Inc.
    Inventors: Steven W. Arms, Christopher P. Townsend
  • Patent number: 5898304
    Abstract: A sensor arrangement (1) comprising at least one measuring coil (2), at least one voltage source (3) for the measuring coil (2), and an evaluation unit (4) with means for detecting, processing, and evaluating measured signals. This sensor arrangement (1) is used to measure distances and thicknesses substantially independently of the material involved, without the user having to know the physicomathematical relations between the influencing quantities and the measured values. In order to evaluate the measured signals, the evaluation unit (4) of the sensor arrangement comprises a neural network (5) with an input layer, at least one hidden layer, an output layer, and connection weights for the individual layers. The connection weights are determined and stored in a learning phase by measurements taken on a plurality of different suitable learning objects with known actual values.
    Type: Grant
    Filed: March 21, 1997
    Date of Patent: April 27, 1999
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventor: Roland Mandl
  • Patent number: 5896031
    Abstract: A metal detector (1) having an oscillator coil (10) which radiates an electromagnetic field in the vicinity of an article to be tested. The field is detected by a primary set of receiver coils (15) which are in close proximity to the oscillator coil (10), as well as by a secondary set of receiver coils (18) located relatively more distant from the oscillator coil. Moving or vibrating metal external to the detector cavity (7) surrounded by the coils (15, 18) will produce a modulated waveform (48) in the primary coils (15) which is similar in period to the modulated waveform (56) produced by the secondary coils (18), while metal passing through the detector cavity (7) will produce a waveform (24) from the primary coils (15) which has a period which differs from the period of the waveform (31) produced by the secondary coils (18).
    Type: Grant
    Filed: March 17, 1997
    Date of Patent: April 20, 1999
    Assignee: Thermo Sentron, Inc.
    Inventor: Kevin James King
  • Patent number: 5828212
    Abstract: An apparatus for determining paint damage including a magnetic-field responsive sensor and display elements. The sensor signal function of the thickness of the paint on a substrate is fed by a discriminator to one of at least two tracks in relation to the amplitude of said signal. A display element is assigned to each track and in the presence of a signal will display said track.
    Type: Grant
    Filed: March 27, 1996
    Date of Patent: October 27, 1998
    Assignees: Automation Hans Nix KG, Fabrik f. ind. Erzeugnisse & Co.
    Inventor: Norbert Nix
  • Patent number: 5825182
    Abstract: In order to enhance the sensitivity of a nondestructive testing system, a pair of superconducting coils are disposed in the same plane such that a current flowing through the respective coils when exposed to a uniform magnetic field cancels out. As a result of this configuration, the detection coils are immune to noise, offset fields or other uniform ambient phenomena. In one embodiment, the nondestructive testing unit includes a plurality of detection coils, a SQUID having a pair of connectors for connection to the detection coils, a probe for supporting the detection coils and the SQUID in a coolant, a cryostat for supporting the probe and for keeping the coolant constant, a controller for processing a signal transmitted from the SQUID, and a display device for displaying the result of the processing. At least two detection coils are disposed in the same plane, are directly connected to the SQUID and are integrated on a semiconductor substrate.
    Type: Grant
    Filed: October 19, 1994
    Date of Patent: October 20, 1998
    Assignee: Seiko Instruments Inc.
    Inventors: Satoshi Nakayama, Kazuo Chinone, Akikazu Odawara, Tatsuaki Ataka
  • Patent number: 5825179
    Abstract: A technique for suppression of stray pickup interference signal during testing of a magneto-resistive head assembly with an external exciting magnetic field. An interruptable phase lock loop and an interruptable amplitude lock loop temporarily hold a replica of the stray-pickup interference signal.
    Type: Grant
    Filed: January 3, 1997
    Date of Patent: October 20, 1998
    Assignee: Seagate Technology, Inc.
    Inventors: Paul Dylan Sherman, Shiuh-Shyan Wang
  • Patent number: 5818225
    Abstract: The sensor apparatus includes a sensor device having a control current (I.sub.H) flowing through it, a sensitivity and a temperature dependence of the control current characterized by a temperature coefficient, and a temperature compensating circuit for compensating temperature changes adversely effecting the sensitivity of the sensor device. The temperature compensating circuit includes a circuit portion which sets or adjusts the temperature coefficient of the control current(I.sub.H) according to changes in the temperature dependent internal resistance of the sensor device so that changes in negative temperature coefficients of other physical quantities determining the sensor sensitivity are compensated.
    Type: Grant
    Filed: December 2, 1996
    Date of Patent: October 6, 1998
    Assignee: Robert Bosch GmbH
    Inventors: Klaus Miekley, Erich Rubel, Ralf Noltemeyer
  • Patent number: 5793203
    Abstract: A measurement system for measuring material deterioration in accordance with a magnetic field of the material in the presence of radiation. The measurement system includes a detection circuit which detects a magnetic field of the material and generates a signal indicative thereof which signal includes noise due to the radiation, a signal processing circuit including semiconductor devices to process the signal generated from the detection circuit and a noise reducing circuit for at least reducing noise in the generated signal which is due to the radiation. The signal processing circuit is installed at a place where a dose equivalent of radiation is equal to or smaller than that of a place where the detection circuit is installed.
    Type: Grant
    Filed: December 5, 1995
    Date of Patent: August 11, 1998
    Assignee: Hitachi, Ltd.
    Inventors: Eriko Takeda, Toshikazu Nishino, Masahiro Otaka, Ren Morinaka, Fuminobu Takahashi
  • Patent number: 5789929
    Abstract: A measuring method of the SAR is provided, which makes it possible to measure the SAR on the surface of a human body with high accuracy when the human body is approached to an antenna. After a probe for receiving at least one of two orthogonally-intersecting magnetic fields is prepared, a simulated biological body having approximately the same dielectric constant and approximately the same permeability as those of a human body is placed at a wanted point. A first magnetic field radiated from an antenna and a second magnetic field generated by reflection of the first magnetic field on the surface of the simulated biological body are separately measured at different measuring points by using the probe. A compensated magnetic field is calculated using the measured values of the first and second magnetic fields. A current distribution of the antenna is calculated by using the calculated values of the compensated magnetic field.
    Type: Grant
    Filed: December 16, 1996
    Date of Patent: August 4, 1998
    Assignee: NEC Corporation
    Inventor: Eiji Hankui
  • Patent number: 5767669
    Abstract: The position and orientation of remote sensors is determined using pulsed magnetic fields generated from a fixed location. Pulsed magnetic fields are sequentially generated from a plurality of spatially independent components defining a source coordinate frame. The pulsed magnetic fields are sensed by a remote sensor having a plurality of passive field sensing elements. Eddy current distortions are sensed separately and subtracted by the system. The system measures the effect of metallic objects present in the environment and dynamically adjusts the measured values accordingly. The sensed magnetic fields, free of eddy current distortion, are used in order to calculate the position and orientation of the remote object. The system shortens the duration of pulsed magnetic fields and operates correctly at much further distances for the same energy output as compared to known systems.
    Type: Grant
    Filed: June 14, 1996
    Date of Patent: June 16, 1998
    Assignee: Ascension Technology Corporation
    Inventors: Per Krogh Hansen, Westley S. Ashe
  • Patent number: 5764055
    Abstract: An alternating bias current is made to flow through a coil wound around an MI device incorporated in an oscillation circuit, and an alternating-current bias magnetic field is applied to the MI device. An amplitude-modulated waveform corresponding to peaks which alternate between two different heights is provided at the output of the oscillation circuit in accordance with an impedance variation in the MI device according to an external magnetic field and the alternating-current bias magnetic field. The difference in height between the peaks corresponds to the strength of the external magnetic field. The output of the oscillation circuit is envelope-detected by an envelope detecting circuit, and an alternating-current component from which a direct-current component is eliminated is inputted to a comparator. The comparator provides an output signal having a digital waveform pulse-width modulated according to the difference in height between the peaks.
    Type: Grant
    Filed: October 24, 1996
    Date of Patent: June 9, 1998
    Assignee: Canon Denshi Kabushiki Kaisha
    Inventor: Masahiro Kawase
  • Patent number: 5757181
    Abstract: A smart angular position sensor includes electronic circuitry for automatically compensating for errors in the output signal of the sensor. The electronic circuitry includes an electronic memory for storing predetermined compensation values used to compensate the output signal of the sensor. The predetermined compensation values are determined by comparing the output signal of the sensor with ideal values at predetermined angular positions. The deviation of the actual values relative to the ideal values is used in determining the compensation values. The compensation values are stored in the electronic memory and are used to automatically compensate the output signal of the sensor.
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: May 26, 1998
    Assignee: Durakool Incorporated
    Inventors: Ronald J. Wolf, Martin James Lynch, John Richard Nuss
  • Patent number: 5747988
    Abstract: A leakage flux flaw detection apparatus in which an object material is magnetized and leakage fluxes derived from a flaw are detected to thereby search for a flaw of the object material in a predetermined flaw-detection direction. The apparatus has a pair of magnet poles for magnetizing the object. material in a direction different from the flaw-detection direction, another pair of magnet poles for magnetizing the object material in a direction different from the magnetization direction and flaw-detection direction of the first pair of magnet poles at a predetermined distance in the flaw-detection direction from the magnetization area of the two magnet poles, and two leakage sensors each of which is interposed between each of the two pairs of magnet poles.
    Type: Grant
    Filed: November 8, 1995
    Date of Patent: May 5, 1998
    Assignee: Sumitomo Metal Industires Limited
    Inventor: Toshiyuki Suzuma
  • Patent number: 5744954
    Abstract: A novel test method enables physical properties in ferromagnetic metals to be more reliably measured with induced eddy current flow. An adverse Barkhausen effect is prevented during the test measurements to enable detection of extremely small conductivity changes in the particular ferromagnetic metal object being tested.
    Type: Grant
    Filed: November 25, 1996
    Date of Patent: April 28, 1998
    Assignee: Cleveland State University
    Inventor: Jack Arbuthnott Soules
  • Patent number: 5742161
    Abstract: A method and apparatus for detecting displacement of valve rod movement in electropneumatic position regulators, by generating a high-frequency electromagnetic alternating field by exciting a high-frequency oscillation within an LC oscillating circuit in an inductive sensor, damping the high-frequency oscillation as a function of displacement via an electrically conductive body moved along by the valve rod, demodulating the oscillator signal and feeding the demodulated signal to a microcomputer without amplification for evaluation of the displacement-dependent damping of the oscillation amplitude, measuring the temperature within the inductive sensor, correlating the temperature with the measured oscillation amplitude in the microcomputer, and determining a corrected displacement signal from the correlation.
    Type: Grant
    Filed: January 11, 1996
    Date of Patent: April 21, 1998
    Assignee: Mannesmann Aktiengesellschaft
    Inventor: Thomas Karte
  • Patent number: 5739685
    Abstract: A leakage flux flaw detection apparatus in which an object material is magnetized and leakage fluxes derived from a flaw are detected to thereby search for a flaw of the object material in a predetermined flaw-detection direction. The apparatus has a pair of magnet poles for magnetizing the object material in a direction different from the flaw-detection direction, another pair of magnet poles for magnetizing the object material in a direction different from the magnetization direction and flaw-detection direction of the first pair of magnet poles at a predetermined distance in the flaw-detection direction from the magnetization area of the two magnet poles, and two leakage sensors each of which is interposed between each of the two pairs of magnet poles.
    Type: Grant
    Filed: November 18, 1996
    Date of Patent: April 14, 1998
    Assignee: Sumitomo Metal Industries Limited
    Inventor: Toshiyuki Suzuma
  • Patent number: 5729130
    Abstract: In a proximity-detector, a Hall transducer produces a signal Vsig. Two counters, P-counter and N-counter count pulses from a clock and produce count signals respectively to two DACs, PDAC and NDAC. The DACs output signals track and hold, respectively, the positive pulses and negative pulses in Vsig. These output signals are compared with Vsig to produce a proximity-detector binary output voltage Vout that becomes high when a tracking voltage V.sub.DAC-P produced by PDAC rises to each peak positive voltage V.sub.pk in Vsig, and that becomes low when a tracking voltage V.sub.DAC-P falls to each peak negative voltage in Vsig. The peak V.sub.DAC-P is held until Vsig drops by a fixed amount below V.sub.pk to produce an output pulse that resets the counter connected to PDAC at a time shortly following the actual peak in Vsig. Similarly, the peak V.sub.DAC-N is held until Vsig rises a fixed amount above V.sub.DAC-N to produce an output pulse that resets the counter connected to NDAC. The N-counter is reset at t.sub.
    Type: Grant
    Filed: January 17, 1996
    Date of Patent: March 17, 1998
    Inventors: Kristann L. Moody, Ravi Vig, Jay M. Towne, Teri L. Tu
  • Patent number: 5729143
    Abstract: A metal detector includes a receive coil and a transmit coil connected in an inductive bridge. To overcome imbalances in the bridge due for instance to misalignment of the coils or the presence of mineralization in the medium which is being examined, the metal detector automatically produces a nulling (bucking) signal to cancel out the effects of any unwanted receive coil signals detected during calibration. This nulling signal is a nulling current both in terms of level and phase, and its level and phase are determined during a calibration process prior to actual metal detection. By inclusion in the metal detector of a microprocessor (microcontroller) operating at a much higher frequency than the variations in the magnetic field used to detect metal, the nulling signal generation is performed with a high degree of time resolution, resulting a precision metal detector which adaptively ignores any unwanted signals.
    Type: Grant
    Filed: June 3, 1996
    Date of Patent: March 17, 1998
    Assignee: Zircon Corporation
    Inventors: Russell E. Tavernetti, Paul W. Dodd
  • Patent number: 5729135
    Abstract: A non-destructive testing equipment comprises a magnetic sensor located within a magnetic shield container. The magnetic sensor includes a SQUID that is a magnetic sensor having a very high sensitivity. A magnetically uniform inspection zone is formed in the magnetic shield container. While a rod-like material to be tested passes through the inspection zone at a uniform velocity, the magnetic sensor can detect an appreciable magnetic field variation that is caused by impurities or minor defects contained in the object to be tested.
    Type: Grant
    Filed: July 11, 1994
    Date of Patent: March 17, 1998
    Assignee: Sumitomo Electric Industries, Ltd.
    Inventor: Hirokazu Kugai
  • Patent number: 5729137
    Abstract: A magnetic field sensor having a plurality of interconnected magnetoresistive magnetic field sensing structures with at least one thereof having a permeable material mass adjacent thereto to shield it from externally applied magnetic fields. Another has a shunting structure adjacent a side thereof to remove a fraction of externally applied magnetic fields from affecting same.
    Type: Grant
    Filed: October 22, 1996
    Date of Patent: March 17, 1998
    Assignee: Nonvolatile Electronics, Incorporated
    Inventors: James M. Daughton, Theodore M. Hermann
  • Patent number: 5698982
    Abstract: An induction logging tool is disclosed for utilization in conjunction with surface electronic equipment for measuring a characteristic of subsurface formations. A transmit signal which is comprised of a repetitive sequential series of at least three transmit frequencies is generated by coupling an oscillator to a transmitter coil and a plurality of selectable tuning capacitors. A signal characteristic of the response of the formation to this transmit signal is detected at a receiver coil array and two phase sensitive detectors are then utilized to generate output signals indicative of the magnitude of the X and R components of the formation signal which is in phase with a reference phase signal. The output signal of each phase sensitive detector is then utilized to accurately determine the X and R component of the receiver coil signal for each frequency by nulling the output of the phase sensitive detector utilizing a closed loop conversion circuit which eliminates errors due to phase and gain variations.
    Type: Grant
    Filed: March 18, 1996
    Date of Patent: December 16, 1997
    Assignee: Computalog Research, Inc.
    Inventor: William K. Mitchell
  • Patent number: 5698977
    Abstract: Flux-focusing electromagnetic sensor using a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks and material loss in high conductivity material. A ferrous shield isolates a high-turn pick-up coil from an excitation coil. Use of the magnetic shield produces a null voltage output across the receiving coil in presence of an unflawed sample. Redistribution of the current flow in the sample caused by the presence of flaws, eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal.Maximum sensor output is obtained when positioned symmetrically above the crack. By obtaining position of maximum sensor output, it is possible to track the fault and locate the area surrounding its tip.
    Type: Grant
    Filed: June 5, 1995
    Date of Patent: December 16, 1997
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: John W. Simpson, James P. Fulton, Russell A. Wincheski, Ronald G. Todhunter, Min Namkung, Shridhar C. Nath
  • Patent number: 5694041
    Abstract: The disclosure relates to a method of compensation of perturbations of magnetic field measurements made by a sensor (C) caused by sources of perturbation (S.sub.1, S.sub.2, S.sub.3, . . . S.sub.k) attached to the sensor. The method utilizes a first stage that expresses the perturbation caused by each of the sources, that are situated in any given ambient magnetic field, as an explicit function of the average magnetic field at the position of the source so as to build a model that can be used to calculate its perturbation at the center of the sensor, a second stage, said sensor being located in the magnetic field to be measured, to determine the perturbation caused by each of the sources of perturbation by using its model and knowing the average magnetic field at this position, a third stage that sums the perturbations of all the sources of perturbation, and a fourth stage that subtracts this sum from the measurement made by the sensor.
    Type: Grant
    Filed: June 28, 1995
    Date of Patent: December 2, 1997
    Assignee: Sextant Avionique
    Inventor: Jean-Louis Lescourret
  • Patent number: 5691640
    Abstract: Metal detector (1) including an oscillator (10) generates an RF field in the vicinity of the head (2). Two reference signals (13, 14) are generated, one signal (14) being in phase with the oscillator (10) and the other signal (13) being shifted from the oscillator signal by 90.degree.. The signal (8,9) from the receive coils (6,7) is amplified and quadrature demodulated into two signal channels, each channel giving the orthogonal component of the original signal (8,9). The signals of each channel are digitized and read by a microprocessor (37) that controls the amplitude of the balance signals (43, 49). One signal (43) is in phase with the oscillator signal (11) and the second signal (49) is shifted 90.degree. from the oscillator signal (11). Signals (43,49) return to detection circuitry (6,7), maintaining balance on each channel. By monitoring the magnitude of the phase shifted and unshifted signals (49,43), the microprocessor (37) determines the characteristics of the product.
    Type: Grant
    Filed: November 17, 1995
    Date of Patent: November 25, 1997
    Assignee: Ramsey Technology, Inc.
    Inventor: Kevin James King
  • Patent number: 5689183
    Abstract: An electromagnetic-induction type inspection device for inspecting a test specimen by placing the specimen in electromagnetic fields produced by exciting coils, detecting induction currents from induction coils set in the electromagnetic fields, and analyzing a composite signal composed of the amplitude and phase components contained in a differential current between the induction currents. The composite signal is expressed as a waveform which is displayed on a display unit, so that deformed portions of the waveform, which represent internal defects or other abnormalities in the specimen, can be identified.
    Type: Grant
    Filed: August 10, 1995
    Date of Patent: November 18, 1997
    Assignee: Kaisei Engineer Co., Ltd.
    Inventor: Hiroaki Kohama
  • Patent number: 5686836
    Abstract: An apparatus for measuring a weak magnetic field in a background D.C. magnetic field such as the earth's magnetic field or the like includes a magnetic pickup portion that is supported by a support mechanism which does not impede minute movement in the x- and y-axis direction. A pair of A.C. linear gradient magnetic fields whose directions of gradients are parallel to the x-axis and y-axis, respectively, are used for obtaining reference signals for sensing the position of the pickup portion. The frequencies of the A.C. linear gradient magnetic fields are set to be sufficiently higher than the frequency of the weak magnetic field that is to be measured. The A.C. linear gradient magnetic fields are provided by A.C. current flowing in two pairs of linear conductors which are perpendicular to each other.
    Type: Grant
    Filed: September 12, 1995
    Date of Patent: November 11, 1997
    Assignee: Kyushu University
    Inventors: Ichiro Sasada, Takao Yamauchi
  • Patent number: 5666051
    Abstract: Both a system and method are provided for mapping the magnitude of residual compressive stresses over the surface of a ferromagnetic machine component, such as a valve ring of the type used in refrigeration compressors. The system includes an eddy current probe having a detection coil for emanating a fluctuating electromagnetic field that shallowly penetrates the surface of the valve ring or other ferromagnetic component, a probe circuit connected to the coil for both conducting a high frequency alternating electric current through the coil and detecting changes in the impedance in the coil, and a scanning mechanism having a turntable for supporting and rotating the component. A support arm positions the coil of the eddy current over a central portion of the valve ring while the ring is rotated by the turntable and changes in coil impedance are detected by the probe circuit.
    Type: Grant
    Filed: October 4, 1995
    Date of Patent: September 9, 1997
    Assignee: Thermo King Corporation
    Inventors: Warren R. Junker, Lee W. Burtner, Michael G. Peck, Richard J. Makar, David A. Chizmar