Abstract: A signal control system is configured to perform diagnostic testing on an electrical system. The signal control system includes a first control switch electrically coupled to a second control switch. A first multimeter lead terminal and a second multimeter lead terminal are electrically coupled to the first control switch and the second control switch. A battery is electrically coupled to the first control switch and the second control switch. A control system is electrically coupled to the first control switch, the second control switch, the first multimeter lead terminal, the second multimeter lead terminal, and the battery and configured to perform the diagnostic testing on the electrical system.

Abstract: The thermionic valve tester (10) has a casing (11) and three valve sockets (12) each of which is adapted to receive and has terminals for connection with the electrode pins of different types of thermionic valves. The thermionic valve tester (10) also has a display (13) comprising a series of LED lights, three user operated buttons (16), and a single power supply socket or terminal (14) which supplies power to all components of the valve tester and which is adapted for connection to a low voltage DC power supply lead. Internally, the thermionic valve tester (10) has a plurality of voltage regulators each with a switchable connection to at least one valve electrode terminal of the valve sockets (12) and a memory in which is stored the tests and the performance criteria for different types of thermionic valves.

Abstract: A passive device for the detection and indication of non-ionizing electromagnetic radiations and static electricity is provided. The device is especially designed to be applied to or integrated in an anti-radiation/anti-static/anti-reflection filter intended to block the aforementioned emissions, particularly in devices with cathode ray tubes(CRT).

Abstract: A circuit for testing high-pressure lamps and components used therewith includes standard components which form a conventional high-pressure lamp circuit. The components can be replaced by components under test. Circuits are provided to prevent damage to the device as a result of malfunctions or of normal operation of the components. Provisions are made for measuring efficiency of various lamp systems.