Abstract: The present invention relates to an electronic device, the electronic device comprising at least one LED, a driving unit for applying a driving algorithm for driving the LED during normal operation, and a measurement unit for determining a forward voltage of the LED by imposing a test current to the LED, the measurement unit being programmed for determining test current characteristics taking into account said driving algorithm.

Abstract: A detection apparatus for light-emitting diode chips comprises a transparent chuck with the light-concentration capability, a probing device and a light-sensing device. The transparent chuck comprises a light-incident plane and a light-emitting plane. The light-incident plane is used to bear a plurality of light-emitting diode chips under detection. The probing device comprises two probe pins and a power supply. The two ends of each probe pin is electrically connected to one of the light-emitting diode chips and the power supply, respectively, to make the light-emitting diode chip emit a plurality of light beams. The light beams penetrate through the transparent chuck by emitting into the incident plane of the transparent chuck. The light-sensing device is disposed on one side of the light-emitting plane of the transparent chuck to receive the light beams which penetrate through the transparent chuck.

Abstract: A device and method may include, in a display device, emitting visible light in a humanly imperceptible manner and sensing said light to verify operation of the display device.

Abstract: The present disclosure relates to a method for measuring thermal electric characteristics of a semiconductor device, including the steps of: providing at least one current to the LED device over a time interval; recording a voltage transient response of the LED device, wherein the voltage transient response has a plurality of time segments different in gradient; computing a voltage difference from one of the plurality of time segments in the voltage transient response; and determining whether the LED device is defective based on the voltage difference, wherein the voltage difference is thermal dependent. The present disclosure also provides a testing method for defining a plurality of time segments.

Abstract: The present invention suggests an apparatus for detecting the operation status of a fluorescent light source. The apparatus comprises an antenna for receiving and sending electromagnetic waves. The apparatus further comprises a modulation frequency correlator and a signal generator for generating an indication signal. According to a second aspect the present invention proposes a method for detecting the operation status of a fluorescent light source. The method comprises the steps of: receiving an electromagnetic wave; detecting a modulation of the received electromagnetic wave; correlating the modulation frequency of the received electromagnetic wave with a predetermined frequency; generating an indication signal if a correlation between the modulation frequency and the predetermined frequency is detected.

Abstract: The disclosure discloses a light emitting diode testing apparatus, which includes a power supply module, a probe, a control unit and a data acquisition unit. The power supply module provides a first current or a second current to a testing item. The probe measures characteristics of the testing item. The control unit controls the power supply module to provide the first current or the second current. The data acquisition unit acquires the characteristics of the testing item from the probe. The power supply module includes a first current source, at least one second current source and at least one protector. The first current source provides the first current to the testing item. The at least one second current source provides at least one additional current. The at least one protector prevents the first current from feeding back to the at least one second current source.

Abstract: A test machine and a test method for a Light Emitting Diode (LED) backlight driver and a manufacturing method for a monitor power board are disclosed. A switch-controlled LED-light-bar load is coupled to an LED backlight driver on a monitor power board. The switch-controlled LED-light-bar load includes a plurality of light bars and a plurality of switches. Each light bar has a plurality of the LEDs which are connected in series. Each switch is connected in parallel to a portion of the LEDs of one light bar such that an effective amount of the LEDs of each light bar is adjustable. The switches are controlled according to a monitor specification that the monitor power board is adapted to.

Abstract: A test structure of a display panel is provided. The display panel has a display region, a non-display region, and a buffer display region between the display region and non-display region. The test structure is within the buffer display region and includes a substrate, at least one signal line on the substrate, an insulation layer covering the signal line, a planar layer on the insulation layer, and an electrode layer on the planar layer. The planar layer has at least one opening exposing a portion of the insulation layer. The electrode layer has a display electrode portion on the planar layer, at least one test electrode portion connecting the insulation layer via the opening of the planar layer, and a ring-like opening that surrounds the test electrode portion and exposes a portion of the planar layer. The display electrode portion surrounds the ring-like opening and connects the test electrode portion.

Abstract: The invention relates to a method for measuring the light properties of light-emitting diodes (LEDs) in an arrangement of a plurality of channels connected in parallel, each having at least one LED per channel and a driver for driving the channels by means of pulse width modulation (PWM), in such a way that at least one pulse of predetermined width can be generated for each channel within a PWM period, wherein the LED of a selected channel is measured during a measurement interval, the measurement interval overlapping a pulse, lying within the PWM period, of a selected channel.

Abstract: An embodiment of the present invention relates to a method for detection of short circuit conditions in an LED array having one or more LED strings, each of which includes one or more LED devices. The method includes determining a minimum voltage that is the lowest of voltages associated with cathode terminals of the one or more LED strings. The method also includes determining if said minimum voltage is between a lower limit voltage and an upper voltage limit. If said minimum voltage is between the lower limit voltage and the upper voltage limit, then a result of a short circuit testing can be considered valid. Here, the short circuit testing includes comparing a sampled voltage associated with a cathode voltage of one of the LED strings with a short-circuit reference voltage.

Abstract: A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided.

Abstract: A LED light source measuring instrument includes a shell portion and a test portion. The shell portion supports the test portion. The test portion includes a carrier plate for placing a LED light source to be tested. A conductive structure is set on the carrier plate for electrically connecting with an underside surface of the LED light source; a cooling chip is set on the carrier plate; a vacuum suction device is provided for generating a vacuum force on the test portion for securely attaching the LED light source to the carrier plate. The cooling chip is used for controlling the temperature of the LED light source within a limited range. A fan is provided for generating a cooling airflow to the LED light source. A heat sink fin extends from the carrier plate toward the fan.

Abstract: A display apparatus is disclosed. The apparatus includes a plurality of unit pixels each comprising a plurality of sub pixels, a plurality of scan wires, and a plurality of scan lines branching off from each of the scan wires and extending in a first direction. The number of scan lines from each scan wire equals the number of sub pixels for each pixel, and each scan line connects one of the scan wires with one of the sub pixels of each of a plurality of unit pixels. The apparatus also includes a plurality of data lines extending in a second direction orthogonal to the first direction and which are connected to the plurality of sub pixels. The apparatus also includes a first power supply line extending in the second direction and connected to the sub pixels, and a plurality of test pads, each connected to the scan lines of one of the scan wires.

Abstract: A combination (10) of a power-supply control device (12) and at least one light-control device (14) of a motor vehicle operates at least one semiconductor light source (36, 38). The control device (12) supplies the light-control device (14) with power via a supply line (18) connected to a first connection pin (20) of the control device (12), monitors current flowing through connection pins of the control device (12), and makes use of diagnoses thereof. The light-control device (14) is connected to an additional connection pin (28) of the control device (12) via an error line (26) and checks function of the connected semiconductor light source (36, 38) and, in the case of a malfunction, triggers a current flow in the error line (26). The control device (12) reacts to the triggered current flow with generation of an error message.

Abstract: An organic light emitting diode display apparatus and a method and apparatus for easily inspecting the organic light emitting diode display apparatus to determine whether an electrical failure occurs. The organic light emitting diode display apparatus comprises a plurality of pixels each comprising a pixel electrode, an intermediate layer including an organic emission layer, and an opposite electrode; scan lines and data lines corresponding to the plurality of pixels; first power supply lines connected to the plurality of pixels and extending in a first direction; second power supply lines connected to the first power supply lines; and a control line unit for simultaneously supplying control signals to the plurality of pixels, the control line unit including a plurality of control lines extending in one direction and two common lines being respectively connected to both ends of each of the plurality of control lines.

Abstract: An apparatus and method for detecting a status of at least one of a plurality of light emitting diodes (LEDs), is disclosed in embodiments of the invention. The apparatus includes a first node, a second node, a voltage generator, a current source and a first comparator. The voltage generator generates an output voltage to the first external circuit via the second node. The current source provides a current to the first external circuit via the first node to generate a first node voltage. The first comparator generates a first comparison result according to the first node voltage and a reference voltage, wherein the first comparison result indicates whether the status of at least one of the LEDs is short or not.

Abstract: A pixel includes an organic light emitting diode, a first transistor that is connected to a first power source and that supplies a driving current according to a corresponding data voltage to the organic light emitting diode, a second transistor that is connected to a scan line and that transmits the corresponding data voltage from a data line to a driving transistor according to a scan signal transmitted from the scan line, and a first capacitor including one electrode connected to a gate electrode of the first transistor. The first capacitor stores the corresponding data voltage as a first voltage and a size of the first capacitor is in a range of about 2 times to about 4 times a size of a gate insulating layer of the first transistor.

Abstract: A method for testing an array for a pixel circuit of an organic light emitting diode display, which includes a first transistor that transmits a driving current corresponding to a data signal to an organic light emitting diode according to a scan signal and at least one capacitor, uses an array test device having a control device and a driver. The method includes performing a first irradiation of electron beams to an exposed portion of a first electrode of the at least one capacitor before manufacturing of the organic light emitting diode is completed, calibrating the control device of the array test device based on secondary electrons output by the at least one capacitor, performing a second irradiation of electron beams to an anode of the pixel circuit, and detecting whether the first transistor is normally operated based on an output amount of secondary electrons output by the anode.

Abstract: A method for testing an array, by using an array testing device for detecting a voltage distribution formed on an array substrate, includes resetting pixel voltages of a plurality of pixel circuits formed on the array substrate with a predetermined voltage, detecting the voltage distribution of the array substrate, generating a correction value for correcting the voltage distribution of the array substrate, and measuring a threshold voltage of a driving transistor included in the plurality of pixel circuits formed on the array substrate by applying the correction value.

Abstract: The present invention is a trailer light tester that includes a 7-way plug that is inserted into and connected to a trailer to check a plurality of various trailer lights of the trailer, an elongated casing and a turning and stop light switch that is disposed on the elongated casing. The trailer light tester also includes a taillight and marker light switch that is disposed on the elongated casing, a rechargeable battery that powers the elongated casing and a plurality of circuit breakers that are housed in the interior of the elongated casing and protect the trailer light tester against a short or damage from an excessive amount of current.

Abstract: Disclosed herein is a trailer light checking system for a vehicle for checking an electrical connection between the vehicle and a trailer comprising a plurality of exterior vehicle lights, the exterior vehicle lights including a left turn indicator light, a right turn indicator light and a brake indicator light, and further comprises a terminal connection configured to electrically connect each of the plurality of exterior vehicle lights to a respective trailer light. The trailer light checking system also comprises a vehicle controller having a trailer connection checking mode configured to check the terminal connection by simulating manual operation of each of the plurality of exterior vehicle lights according to a timed sequence, such that a respective trailer light will actuate in combination with the simulated manual operation of each of the plurality of exterior vehicle lights if the terminal connection and the respective trailer light are functioning correctly.

Abstract: A light emitting diode (LED) based illumination module performs on-board diagnostics. For example, diagnostics may include estimating elapsed lifetime, degradation of phosphor, thermal failure, failure of LEDs, or LED current adjustment based on measured flux or temperature. The elapsed lifetime may be estimated by scaling accumulated elapsed time of operation by an acceleration factor derived from actual operating conditions, such as temperature, current and relative humidity. The degradation of phosphor may be estimated based on a measured response of the phosphor to pulsed light from the LEDs. A thermal failure may be diagnosed using a transient response of the module from a start up condition. The failure of LEDs may be diagnosed based on measured forward voltage. The current for LEDs may adjusted using measured flux values and current values and a desired ratio of flux values. Additionally, the LED current may be scaled based on a measured temperature.

Abstract: A method for testing LED light bar includes steps: providing a jig with a pair of aligning plates, and a testing device with an electrical clamp and a sensor; adjusting alignment of LEDs via the pair of aligning plates when soldering the LEDs; clamping one of the LEDs by the electrical clamp and supplying a current of microampere to the LED via the electrical clamp when soldering the LEDs; and detecting whether there is light emitted from the LED via the sensor when supplying the current of microampere to the LED.

Abstract: A method includes, in at least one aspect, receiving a digital voltage signal representing a voltage supplied to a circuit having a load, identifying a first time stamp associated with a voltage value representing an extrema in the digital voltage signal, receiving a digital current signal representing a current drawn by the load in response to the supplied voltage, identifying a second time stamp associated with the digital current signal, the second time stamp being within a threshold time of the first time stamp, and identifying a current value associated with the second time stamp as the current drawn by the load.

Abstract: An apparatus for detecting abnormality in an LED (light-emitting diode) vehicle lamp includes a detecting module and a warning module . The LED vehicle lamp includes a plurality of LEDs. The detecting module is to be electrically coupled to the LED vehicle lamp for acquiring voltage information that represents an operating voltage level of the LED vehicle lamp, and determines based on the voltage information thus acquired whether the LED vehicle lamp may have functioned abnormally. The warning module is electrically coupled to the detecting module to be driven thereby to generate a warning message when the result of determination by the detecting module indicates that the LED vehicle lamp may have functioned abnormally.

Abstract: A method of estimating the output light flux of a light emitting diode, comprises applying a drive current waveform to the LED over a period of time comprising a testing period. The forward voltage across the LED is monitored during the testing period, and the output light flux is estimated as a function of changes in the forward voltage.

Abstract: The invention relates to a system for recording characteristic curves for a light-emitting diode arrangement (1) comprising at least one light-emitting diode (2). A control unit (4) is used to operate the light-emitting diode arrangement (1) and to record the diode current (8) and the voltage (9) on the light-emitting diode arrangement (1). The control unit (4) is also used to record a first current/voltage pair (P1) and a different second current/voltage pair (P2), at a first temperature of the light-emitting diode arrangement (1), and a third current/voltage pair (P3) and a different fourth current/voltage pair (P4), at a second temperature of the light-emitting diode arrangement (1). The invention also relates to a method for recording characteristic curves of a light-emitting diode arrangement.

Abstract: Systems, methods, and devices are provided for detecting short circuits in a backlight assembly without a resistor-based current sensor. For example, an electronic display according to the present disclosure may include a display panel and a backlight assembly to illuminate the display panel. The backlight assembly may drive a backlight element to illuminate the display panel and may include backlight short-circuit detection circuitry. The backlight short-circuit protection circuitry may detect a feedback voltage associated with the backlight element and determine when a short circuit has occurred based at least in part on the feedback voltage.

Abstract: A device for detecting a fault of at least one street lamp of a plurality of street lamps which are connectable in common to an AC power supply is proposed. The proposed device allows detecting whether a fault has occurred based on obtaining measures representative of the total active and reactive power supplied by the AC power supply to the plurality of street lamps, and detecting variations in these measures. Optionally, also the type of fault can be determined based on detected variations in the power measures.

Abstract: An emergency lighting module for providing emergency power to a solid state luminaire. The emergency lighting module includes a first input configured to receive a DC input voltage from the solid state luminaire, a second input configured to receive a status signal indicative of the status of an AC line voltage, and a first output configured to supply a DC output voltage to the solid state luminaire. The emergency lighting module is configured to supply the DC output voltage to the solid state luminaire in response to a reduction of the AC line voltage.

Abstract: An organic light emitting display apparatus includes: a substrate on which a display area and a non-display area are defined; a first electrode disposed over the display area; an intermediate layer that is disposed over the first electrode and includes an organic emissive layer; a second electrode disposed over the intermediate layer; and a plurality of detection patterns displaced over the non-display area, each of which includes a first electrically conductive pattern layer formed of the same material as the first electrode and a second electrically conductive pattern layer that is formed over the first electrically conductive pattern layer.

Abstract: A method of performing a hot test of a wafer-level, packaged high-brightness phosphor converted light-emitting diode (pc-HBLED) includes selectively heating portions of the phosphor layer using a laser to provide a predetermined temperature gradient in the phosphor layer. The selective heating can directly heat the silicone in a silicone-based phosphor layer, or directly heat the active ion(s) of the phosphor in a Lumiramic™-based phosphor or even the active ion(s) of a silicone-based phosphor layer. A current is applied to the InGaN film to establish a predetermined temperature at the InGaN film junction, the film junction being adjacent to the phosphor layer. Photometric measurements are performed on the HBLED after the selective heating and during the applied electroluminescent current. This method quickly establishes the temperatures and temperature gradients in the HBLED consistent with those of an operating, product-level HBLED, thereby ensuring accurate binning of the HBLED.

Abstract: A generator generates electricity by non-combustion means. A battery stores the generated electricity. An electrical appliance is powered by the stored electricity. A metering device tallies an operating parameter indicative of the amount of electrical energy consumed by the appliance. A housing supports the generator, the battery, the appliance and the metering device. A device, including the generator, the battery, the metering device and the housing, is manually portable.

Abstract: An electronic ballast for driving a gas discharge lamp comprises an inverter circuit, a resonant tank circuit, and a control circuit operable to determine an approximation of a resonant frequency of the resonant tank circuit and to control the inverter circuit in response to the approximation of the resonant frequency. The control circuit determines the approximation of the resonant frequency by adjusting an operating frequency of a high-frequency inverter output voltage provided to the resonant tank circuit from a frequency above the resonant frequency down towards the resonant frequency, measuring the magnitude of a lamp voltage across the lamp, and storing the present value of the operating frequency as the resonant frequency when the magnitude of the lamp voltage reaches a maximum value. The control circuit may control the operating frequency of the inverter output voltage in response to the approximation of the resonant frequency and a target intensity of the lamp.

Abstract: Forward voltage drift in a probe system for the characterization of a light-emitting wafer is virtually eliminated by directing compressed air to the probe so as to ensure that the exact same temperature conditions exist during repeated measurements of the wafer. In one embodiment of the invention, an air flow at room temperature is used, either continuously or intermittently. In another embodiment, the temperature of the probe is controlled by flowing a liquid or a gas through micro-channels built into the probe. In yet another embodiment, the probe is connected to a solid-state Peltier cell that is computer-controlled to maintain the probe's temperature at a predetermined set-point. A temperature-controlled chamber or a thermal reservoir enclosing the probe could be used as well. The results obtained showed remarkable repeatability.

Abstract: A hand carry type portable curing apparatus using a long-arc UltraViolet (UV) lamp for concentrating the external air on the long-arc UV lamp and enhancing cooling efficiency by disposing a fan at a tilt angle and in addition installing a means for forcibly inducing a flow of air inside is provided. The apparatus includes a housing having an accepting part therein, the long-arc UV lamp installed in the accepting part of the housing, and a fan installed in the housing and cooling the long-arc UV lamp. The fan is installed on the slant to tilt toward the front in a front surface of the housing.

Abstract: A testing apparatus for flip chip LEDs includes a transparent substrate, a spacing member, a flexible transparent carrier, and a vacuum generator. The spacing member is configured on a first surface of the transparent substrate. The flexible transparent carrier is removably assembled to the spacing member so that a closed space is formed by the flexible transparent carrier, the spacing member, and the first surface of the transparent substrate. The vacuum generator is connected to the closed space for pumping air out of the closed space, and then a part of the transparent substrate clings to the first surface to form a testing area for loading the flip chip LED.

Abstract: A display panel includes a display unit including a plurality of pixels, and a test pad unit having a plurality of pads configured to transmit a test signal to the display unit during a test period, the plurality of pads being disabled after the test period is completed, the test pad unit including a plurality of first pads that transmit the test signal, applied from outside during the test period, to the display unit, and a plurality of second pads and an auxiliary pad that disable the plurality of first pads when the test period is completed.

Abstract: The present invention discloses a current controlling circuit wherein the circuit (200) comprises a DC power source (202), an inductor (204), a N-channel Metal Oxide Semiconductor (NMOS) (206), one or more LEDs (208) connected in series, a first resistor (Rsense) and a switching arrangement (210). The positive terminal of the DC power source (202) is connected to the inductor (204) in series. The series of LED (208) is connected in series with the inductor (204) and the first resistor (Rsense). According to an embodiment the switching arrangement (210) comprises a second resistor (Rslt), a first switch (212) and a second switch (214). The second resistor (Rslt) is connected in series with the second switch (214) and connected in parallel with the first switch (212). The switching arrangement (210) is connected in series with the first resistor (Rsense) and the negative terminal of the DC supply (202).

Abstract: An apparatus and method for determining and quantifying “sparkle”—the random noise that is generated when a pixelated image is viewed through a roughened surface of a transparent sample. The apparatus includes a pixelated source and an imaging system located in an optical path originating from the pixelated source, wherein a transparent sample may be placed in the optical path between the pixelated source and the optical system. The degree of sparkle is determined by obtaining an integrated image for the pixelated image; and calculating a standard deviation of the integrated pixel power. An objective level of sparkle can be defined by correlating the amount of sparkle provided by the apparatus with visual impressions.

Abstract: A probe includes a main body and a sensor circuit board. The main body includes a through hole capable of accommodating an LED under test and an accommodation space capable of accommodating the sensor circuit board. The main body is made of opaque material. The sensor circuit board includes a light sensor, a body and a connector. The light sensor is opposite to the through hole. The probe separates the light sensor and the LED under test from ambient light, thereby enhancing the precision of test results.

Abstract: A method includes receiving a first voltage from an intermediate node in a string of multiple light emitting diodes (LEDs). The method also includes receiving at least one second voltage based on a string voltage (VLED) across the string of LEDs. The method further includes identifying whether at least one of the LEDs has a fault using the first voltage and the at least one second voltage. The second voltage could be a single reference voltage, and a difference between the first voltage and the reference voltage could be compared to a threshold. Multiple second voltages could define a voltage range that includes a reference voltage, and a determination could be made whether the first voltage falls within the voltage range.

Abstract: A test method of a pixel circuit array in an organic light emitting diode (OLED) display, the pixel circuit including a first capacitor connected to a first transistor, the first transistor transmitting a data signal and controlling a light emitting amount of an organic light emitting element according to a scan signal, the method including irradiating an electron beam to a first electrode terminal of the first capacitor before completing formation of the organic light emitting element, the first electrode terminal being exposed during the irradiation, and testing operation of the first transistor based on emitted secondary electrons.

Abstract: A method includes receiving a first voltage from a first node associated with a first string of multiple light emitting diodes (LEDs). The method also includes receiving a second voltage from a second node associated with a second string of multiple LEDs. The method further includes identifying whether at least one of the LEDs has a fault using the first and second voltages. Identifying whether at least one of the LEDs has a fault could include comparing a difference between the first and second voltages to a threshold. Identifying whether at least one of the LEDs has a fault could also include determining whether a difference between the first and second voltages falls within a voltage range defined by higher and lower voltage limits.

Abstract: Provided is an apparatus for sensing a failure that may apply, using a current control unit, a current to at least one first light emitting diode (LED) string and at least one second LED string that may be connected in parallel with each other, and as a result of sensing whether a failure occurs with respect to each of the at least one first LED string and the at least one second LED string, when a failure is sensed with respect to at least one of the at least one first LED string and the at least one second LED string, may transmit failure information to the current control unit, thereby blocking the entire current that may be applied to the at least one first LED string and the at least one second LED string, using the current control unit.

Abstract: An LED short-circuit detection circuit produces an LED short-circuit detection signal by monitoring an LEDC terminal voltage (a first voltage obtained at a chip-to-chip node in a row of LED chips, or a divided voltage thereof) and an LEDR terminal voltage (a second voltage obtained by dividing the end-to-end voltage of the row of LED chips).

Abstract: An exemplary testing device for testing quality of indicator lights includes a light intensity tester and a control unit electrically connected to the light intensity tester. The light intensity tester includes a testing circuit, and the testing circuit is capable of generating testing parameters of corresponding indicator lights. The control unit is capable of providing electric energy to the indicator lights. The testing parameters from the testing circuit are changed according to light intensity of the indicator lights and are then transmitted to the control unit. Thus, the control unit is capable of comparing the testing parameters with predetermined parameters to detect the quality of the indicator lights.

Abstract: A test device for a liquid crystal display device includes a first shorting bar, a first, a second and a third control line, transmission lines and thin film transistor switch elements; in which the gate electrodes of thin film transistor switch element are respectively arranged on the first, the second and the third control line; the data lines are respectively connected to the first, the second and the third control line via the drain electrodes of thin film transistor switch elements, in which data lines for controlling the blue pixel units are connected to the first control line, data lines for controlling the red pixel units are connected to the second control line, data lines for controlling the green pixel units are connected to the third control line; and the source electrodes of multiple thin film transistor switch elements are connected to the first shorting bar via multiple transmission lines.

Abstract: An inspection system is provided, which applies a forward or reverse voltage on a light-emitting device and measures a current thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a current difference before and after the temperature rise is larger than a failure current determination value. Alternatively, the inspection system adopts a current applying device to apply a forward and reverse current on a light-emitting device and measures a voltage difference thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a difference of the voltage differences before and after the temperature rise is larger than a failure voltage determination value. Alternatively, the inspection system adopts a predetermined inspecting step and a rapid inspecting step respectively to determine whether a light-emitting device fails.

Abstract: An active matrix substrate including a substrate, a plurality of scan lines, a plurality of data lines, a plurality of independent common line patterns, and a plurality of pixels is provided. The scan lines, data lines, and common line patterns are disposed on the substrate. The pixels are arranged in array on the substrate, wherein each pixel is electrically connected to corresponding scan line and data line, and the common line patterns are distributed under each pixel. Each pixel includes a plurality of active components and a plurality of pixel electrodes. Each of the pixel electrodes is electrically connected to corresponding scan line and data line through different active components. The capacitance coupling effect between each of the pixel electrodes and common line patterns are different. Additionally, an inspection method for the active matrix substrate and a liquid crystal display having the active matrix substrate are further provided.