Using Modulation-type Electrometer Patents (Class 324/458)
  • Patent number: 9885861
    Abstract: A method for rapid imaging of a material specimen includes positioning a tip to contact the material specimen, and applying a force to a surface of the material specimen via the tip. In addition, the method includes moving the tip across the surface of the material specimen while removing electrical charge therefrom, generating a signal produced by contact between the tip and the surface, and detecting, based on the data, the removed electrical charge induced through the tip during movement of the tip across the surface. The method further includes measuring the detected electrical charge.
    Type: Grant
    Filed: April 22, 2014
    Date of Patent: February 6, 2018
    Assignee: UCHICAGO ARGONNE, LLC
    Inventors: Andreas Roelofs, Seungbum Hong
  • Patent number: 9857403
    Abstract: A mobile trolley for resistance measurement comprises: a frame, a resistance measurer, a lifting system, a substrate, at least a first electrode, plural second electrodes and a control module, wherein the set locations of the first and the second electrodes agree with the test method of the “ESD association” standard, whereby the electric resistance between the first and the second electrodes are measured; thereby it is easy to measure the resistance value of a floor according to the test method of the “ESD association” standard.
    Type: Grant
    Filed: February 18, 2016
    Date of Patent: January 2, 2018
    Inventor: Chien-Ten Huang
  • Patent number: 9829527
    Abstract: An ion generating device includes a controller, positive and negative ion generating circuits, an airflow generator, and a detecting element. The controller is preinstalled with a constant of proportionality, controls the positive and the negative ion generating circuits, and the airflow generator directs the ions to a destination. The detecting element detects the balanced voltage of the positive and negative ions at the destination, and responds with the detecting result to the controller. The controller increases or decreases the ion numbers. The variation of the ion numbers is x, and the balanced voltage at the destination is y. The controller compares the function of x and y with the constant of proportionality to determine whether they are similar. If the comparison result is similar, then the electrostatic dissipation capability of the ion generating device is normal.
    Type: Grant
    Filed: December 5, 2014
    Date of Patent: November 28, 2017
    Assignee: Yi Jing Technology Co., Ltd
    Inventor: Kuan-Ting Wu
  • Patent number: 9804233
    Abstract: The disclosure provides a magnetic field sensor for sensing the magnetic field caused by a current to be measured, which includes: substrate; a first drive electrode with a path for flowing a reference current supplied from the substrate arranged so as to be moveable by the magnetic field of the current to be measured; and a second drive electrode with a path for flowing a reference current supplied from the substrate arranged so as to be moveable by the magnetic field of the current to be measured, thus measuring the variation of a capacitance caused by the movement of the first drive electrode and the second drive electrode. Hence, the sensing is achieved by the two drive electrodes with no reference electrode, thus maximizing the mechanical displacement to improve the sensing capability.
    Type: Grant
    Filed: April 24, 2014
    Date of Patent: October 31, 2017
    Assignee: LG INNOTEK CO., LTD.
    Inventors: Sang Won Seo, Yong Jun Ko, Seung Hwa Kwon, Jeong Gi Seo, Chil Young Ji, Wan Seop Choi
  • Patent number: 9664720
    Abstract: A device for the contactless determination of an electrical potential of an object, has an electrode and a potential controller which is electrically connected to the electrode. The potential controller changes a reference potential applied to the electrode to a final value in such a way that an electric field between the object and the electrode disappears at the final value if the electrode is located at a distance from the object. The electrical potential is determined from the final value.
    Type: Grant
    Filed: April 14, 2011
    Date of Patent: May 30, 2017
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Jens Makuth, Dirk Scheibner, Jürgen Schimmer
  • Patent number: 9348287
    Abstract: A detecting device for detecting a surface potential of a photosensitive member includes a first electrode adapted to be positioned with a space relative to a surface of the photosensitive member; a second electrode adapted to be positioned relative to the surface of the photosensitive member at the distance from the first electrode away from the surface; a first detecting portion configured to detect induced charge in the first electrode; a second detecting portion configured to detect induced charge in the second electrode; a calculating portion configured to calculate a surface potential of the photosensitive member on the basis of an output of the first detecting portion and an output of the second detecting portion.
    Type: Grant
    Filed: January 6, 2015
    Date of Patent: May 24, 2016
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Seiji Hara, Mineto Yagyu, Masaya Kobayashi
  • Patent number: 9121878
    Abstract: The electrical potential of an object is determined by providing a mechanically oscillating electrode located at a distance from the object and making the electrode mechanically oscillate. A change in a state of electric charge of the electrode over time and amplitudes of at least two frequency components during the change in the state of electric charge over time are determined. Based on the amplitudes, at least one parameter that forms part of the value of a capacitance of an arrangement formed by the electrode and the object is determined, so that the capacitance of the arrangement formed by the electrode and object can be determined based on the parameter. Finally, the electrical potential is determined from the change in the state of electric charge and the capacitance.
    Type: Grant
    Filed: April 14, 2011
    Date of Patent: September 1, 2015
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Jens Makuth, Dirk Scheibner, Jürgen Schimmer
  • Patent number: 9121875
    Abstract: There is provided a potential measuring device of non-contact type which can improve measurement sensitivity. A potential measuring device which measures a charged object in a non-contact manner with a sensor includes: a first shutter and a second shutter each having a shutter part provided with an opening and a leaf spring part; a magnet attached to the leaf spring part of each of the first shutter and the second shutter; a yoke on which a coil is disposed, the coil applying an alternating magnetic field to the magnet of each of the first shutter and the second shutter to cause the shutter part to reciprocate via the leaf spring part; and a natural frequency adjusting means for adjusting a natural frequency of at least one of a first shutter system including the first shutter and the magnet and a second shutter system including the second shutter and the magnet.
    Type: Grant
    Filed: April 22, 2013
    Date of Patent: September 1, 2015
    Assignee: KOGANEI CORPORATION
    Inventors: Yoshinari Fukada, Fumihito Meguro
  • Patent number: 9110109
    Abstract: A potential measuring device which measures a charged object in a non-contact manner with a sensor may include a first shutter having a first shutter part, which is provided with a first opening which can be positioned at a position opposing the sensor, and leaf spring parts extending from both ends thereof; a second shutter having a second shutter part, which is provided with a second opening which can be positioned at a position opposing the sensor and the first opening, and leaf spring parts extending from both ends thereof; a coil provided so that a direction along a center axis opposes portions of the leaf spring parts; and a magnet provided on each of regions opposing both end sides of the coil in the leaf spring parts extending from the both ends of each of the first shutter part and the second shutter part.
    Type: Grant
    Filed: April 22, 2013
    Date of Patent: August 18, 2015
    Assignee: KOGANEI CORPORATION
    Inventor: Yoshinari Fukada
  • Patent number: 8990759
    Abstract: The fabrication of the wafer may be analyzed starting from when the wafer is in a partially fabricated state. The value of a specified performance parameter may be determined at a plurality of locations on an active area of a die of the wafer. The specified performance parameter is known to be indicative of a particular fabrication process in the fabrication. Evaluation information may then be obtained based on a variance of the value of the performance parameter at the plurality of locations. This may be done without affecting a usability of a chip that is created from the die. The evaluation information may be used to evaluate how one or more processes that include the particular fabrication process that was indicated by the performance parameter value was performed.
    Type: Grant
    Filed: June 1, 2010
    Date of Patent: March 24, 2015
    Assignee: tau-Metrix, Inc.
    Inventors: Majid Aghababazadeh, Jose J. Estabil, Nader Pakdaman, Gary L. Steinbrueck
  • Patent number: 8963552
    Abstract: A device for detecting an electrostatic discharge event by an object, the device comprising: a receiver for forming a first capacitive coupling with the object and a second capacitive coupling with a ground; and a first discharge path for discharging the second capacitive coupling to the ground, such that an electrostatic discharge event by the object charges the second capacitive coupling by an amount in a first time interval ?t1 that is substantially less than a second time interval ?t2 that it takes for the second capacitive coupling to discharge by the same amount through the first discharge path.
    Type: Grant
    Filed: April 26, 2012
    Date of Patent: February 24, 2015
    Assignee: 3M Innovative Properties Company
    Inventor: Siarhei V. Savich
  • Patent number: 8839461
    Abstract: A device includes: an electrode; a displacement measurement unit outputting voltage corresponding to electrostatic force between the electrode and a sample; a first power supply applying a first voltage between the electrode and sample; a second power supply adding, to the first voltage, a second voltage having a different frequency than the first voltage, and applying the added voltage; and a signal detection unit outputting a particular frequency component's magnitude contained in the displacement measurement unit's output, in which the signal detection unit extracts, from the output by the displacement measurement unit, and outputs, to a potential calculation unit, magnitude and phase of a frequency component of a frequency identical to the frequency of the first voltage, and magnitude of a frequency component of a frequency identical to a frequency equivalent to a difference between the frequencies of the first and second voltages, to measure the sample's surface potential.
    Type: Grant
    Filed: September 12, 2012
    Date of Patent: September 16, 2014
    Assignee: National University Corporation Kanazawa University
    Inventors: Takeshi Fukuma, Naritaka Kobayashi
  • Patent number: 8816693
    Abstract: An ESD test method for testing an object is disclosed. The object is activated and controlled to separate from a horizontal plane by a pre-determined distance. A first discharge voltage is provided to an external metal portion of the object. A first error is determined to have or have not occurred during the operation of the object each time after the first discharge voltage is provided to the external metal portion. The object is processed to eliminate the first error and then the first discharge voltage is provided to the external metal portion when the first error occurs during the operation of the object. The first error is induced by a hardware structure of the object. The object is moved to contact with the horizontal plane and a specific action is executed when the first error has not occurred during the operation of the object.
    Type: Grant
    Filed: June 28, 2012
    Date of Patent: August 26, 2014
    Assignee: Wistron Corp.
    Inventors: Lung-Fai Tuen, Chiu-Hsien Chang
  • Publication number: 20140091806
    Abstract: A static-electricity-quantity measuring apparatus and a static-electricity-quantity measuring method are optimum for a manufacturing site under a difficult-to-measure situation and measure the quantity of static electricity of electronic parts, machine parts, etc. simply with high accuracy. A static-electricity-quantity measuring apparatus of the present invention has: a receiving unit which receives virtual electromagnetic waves generated by vibrations applied to a measured object; a measuring unit which measures at least one of the intensity, frequency, and phase of the virtual electromagnetic waves received by the receiving unit; and a calculating unit which calculates the quantity of static electricity of the measured object based on the measurement result of the measuring unit.
    Type: Application
    Filed: April 11, 2012
    Publication date: April 3, 2014
    Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    Inventors: Kazuya Kikunaga, Kazuhiro Nonaka
  • Patent number: 8686358
    Abstract: Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.
    Type: Grant
    Filed: September 14, 2011
    Date of Patent: April 1, 2014
    Assignee: University of Washington through its Center for Commercialization
    Inventors: David Ginger, Rajiv Giridharagopal, David Moore, Glennis Rayermann, Obadiah Reid
  • Patent number: 8619350
    Abstract: Methods and devices for calibrating and controlling the actuation of an analog interferometric modulator configured to have a plurality of actuation states. Devices and methods for calibrating an analog interferometric modulator to respond in linear relation to an applied voltage.
    Type: Grant
    Filed: June 27, 2011
    Date of Patent: December 31, 2013
    Assignee: Qualcomm MEMS Technologies, Inc.
    Inventors: Chong U. Lee, John H. Hong, Marc M. Mignard, Alok Govil
  • Patent number: 8594957
    Abstract: A system for detecting an electrostatic discharge event with respect to a device to be monitored includes a current measurement device configured to measure a current flowing via a power supply connection connecting the device to be monitored with the power supply to obtain a current measurement signal representing the current or a current component. Alternatively, a current flowing through a protective earth connection connecting the device to be monitored with the protective earth is measured to obtain the measurement signal. The system includes an electrostatic discharge event detector configured to detect an electrostatic discharge event in response to a pulse of the current measurement signal. The system may optionally include data processing of current measurement signals or values.
    Type: Grant
    Filed: February 20, 2008
    Date of Patent: November 26, 2013
    Assignee: Advantest (Singapore) Pte Ltd
    Inventors: Pierre Gauthier, Maximilian Weinzierl, David Spiteri, Bela Szendrenyi
  • Publication number: 20130307554
    Abstract: A potential measuring device which measures a charged object in a non-contact manner with a sensor may include a first shutter having a first shutter part, which is provided with a first opening which can be positioned at a position opposing the sensor, and leaf spring parts extending from both ends thereof; a second shutter having a second shutter part, which is provided with a second opening which can be positioned at a position opposing the sensor and the first opening, and leaf spring parts extending from both ends thereof; a coil provided so that a direction along a center axis opposes portions of the leaf spring parts; and a magnet provided on each of regions opposing both end sides of the coil in the leaf spring parts extending from the both ends of each of the first shutter part and the second shutter part.
    Type: Application
    Filed: April 22, 2013
    Publication date: November 21, 2013
    Applicant: KOGANEI CORPORATION
    Inventor: KOGANEI CORPORATION
  • Publication number: 20130307553
    Abstract: There is provided a potential measuring device of non-contact type which can improve measurement sensitivity. A potential measuring device which measures a charged object in a non-contact manner with a sensor includes: a first shutter and a second shutter each having a shutter part provided with an opening and a leaf spring part; a magnet attached to the leaf spring part of each of the first shutter and the second shutter; a yoke on which a coil is disposed, the coil applying an alternating magnetic field to the magnet of each of the first shutter and the second shutter to cause the shutter part to reciprocate via the leaf spring part; and a natural frequency adjusting means for adjusting a natural frequency of at least one of a first shutter system including the first shutter and the magnet and a second shutter system including the second shutter and the magnet.
    Type: Application
    Filed: April 22, 2013
    Publication date: November 21, 2013
    Applicant: KOGANEI CORPORATION
    Inventor: KOGANEI CORPORATION
  • Patent number: 8536879
    Abstract: A compact instrument package consisting of a rotating sensor and supporting signal-processing electronics is capable of measuring two-dimensional electric-field vectors, ranging from DC to an arbitrary upper AC frequency not limited by the rotation rate, with highly improved accuracy and sensitivity when compared with previous art. In addition, contrary to previous art, the sensor can measure the electric field gradient at its location. This is achieved by the use of a combination of quadrature modulation and phase-sensitive quadrature demodulation digital signal processing in a generic rotating electric-field sensor. Ground isolated versions of the instrument can be used singly or in arrays when precise measurements of the electric fields are necessary. Either grounded or isolated versions of the instrument can operate continuously without the need for internal batteries, making it extremely attractive for a wide-range of industrial and space applications.
    Type: Grant
    Filed: June 2, 2009
    Date of Patent: September 17, 2013
    Assignee: The Regents of The University of Michigan
    Inventors: Nilton O. Renno, Steven A. Rogacki
  • Patent number: 8392199
    Abstract: A clipping detection device calculates an amplitude distribution of an input signal for each predetermined period, calculates a deflection degree of the distribution on the basis of the calculated amplitude distribution, and then detects clipping of a communication signal on the basis of the calculated deflection degree of the distribution.
    Type: Grant
    Filed: May 21, 2009
    Date of Patent: March 5, 2013
    Assignee: Fujitsu Limited
    Inventors: Takeshi Otani, Masakiyo Tanaka, Yasuji Ota, Shusaku Ito
  • Patent number: 8373232
    Abstract: A device (10) to detect and measure static electric charge (q) on an object (100) being positioned in a distance (r.) from an input electrode (11) of the device (10) comprises at least one MOS field transistor (20). The input electrode (11) is connected with the gate electrode (21) of the MOS-FET (20) to detect said electrical charge. The MOS-FET (20) can comprise a gate oxide layer underneath the gate (21) and over the source (22) and drain (23) areas having a sufficient thickness to allow the MOS field transistor (20) to withstand several kilovolts (kV) of voltage and to avoid the loss of charges by tunnel effect due to the high potential of the gate electrode during ESD events.
    Type: Grant
    Filed: September 1, 2010
    Date of Patent: February 12, 2013
    Assignee: Microdul AG
    Inventors: José Solo De Zaldivar, Philip John Poole
  • Patent number: 8354847
    Abstract: An electrometer is disclosed. The electrometer has a high gain differential amplifier having a first input, a second input, and an output. The electrometer also has feedback switching circuitry. The electrometer further has a plurality of feedback elements configured to be selectively and cumulatively added in any parallel combination between the output and the first input of the high gain differential amplifier via the feedback switching circuitry. A method of adjusting a measurement range of an electrometer while the electrometer is being used to measure an electrostatic charge is also disclosed. One or more additional feedback elements are selectively added in parallel with one or more existing feedback elements which are coupled between an output and an input of a high gain differential amplifier of the electrometer.
    Type: Grant
    Filed: August 13, 2008
    Date of Patent: January 15, 2013
    Assignee: Electrostatic Answers LLC
    Inventor: Kelly S. Robinson
  • Publication number: 20120119750
    Abstract: A cellular electric potential measuring container includes a container body and an electrode substrate, the electrode substrate being attached to a lower end of the container body so as to form a plurality of wells. The container body is made from resin and comprises a plurality of tubular portions whose upper and lower ends are open, each of the tubular portions comprises in an inner cavity a measurement portion tapered toward the lower end and having a measurement hole at the lower end, and further on an inner wall at least two retaining means retaining the measurement portion. The electrode substrate comprises a substrate body, with a plurality of measurement electrodes and a plurality of reference electrodes being disposed on one surface of the substrate body. The container body is attached to the surface of the substrate body on which the measurement electrodes and the reference electrodes are disposed, such that the measurement electrodes are exposed through the measurement holes.
    Type: Application
    Filed: July 23, 2010
    Publication date: May 17, 2012
    Applicants: REPROCELL INCORPORATED, NIPRO CORPORATION
    Inventors: Shinji Morimoto, Yui Hagiwara
  • Patent number: 8168947
    Abstract: An electrostatic latent image evaluation device includes an optical scanner configured to irradiate laser light of a wavelength of 400 nm-800 nm on a photoreceptor sample, and form an electrostatic latent image, an electron gun configured to irradiate a charged particle beam to the photoreceptor sample having the electrostatic latent image, and surface electric charge distribution or surface electric potential distribution, a detector configured to detect an electron emitted from the photoreceptor sample by the irradiation of the charged particle beam, and an electrostatic latent image evaluation section configured to calculate sizes of a plurality of electrostatic latent images formed by the laser light each having different exposure energy density according to a detection signal detected by the detector, and evaluate the electrostatic latent image according to a change in the calculated sizes.
    Type: Grant
    Filed: June 9, 2009
    Date of Patent: May 1, 2012
    Assignee: Ricoh Company, Ltd.
    Inventor: Hiroyuki Suhara
  • Publication number: 20110316550
    Abstract: An ion analyzing apparatus includes a sensor; a counter electrode having openings, the counter electrode being positioned so as to substantially surround the sensor; and a bias generating circuit coupled to the sensor, wherein the sensor includes quartz crystal and a pair of electrodes positioned on surface of the quartz crystal, and one of the pair of electrodes is coupled to the bias generating circuit.
    Type: Application
    Filed: September 8, 2011
    Publication date: December 29, 2011
    Inventor: Ryozo TAKASU
  • Patent number: 8008926
    Abstract: Disclosed is a UHF partial discharge and its location measuring device for high-voltage power devices. The measuring device includes a partial discharge sensor, an external noise sensor, an analogue-digital converter, a peak detector, a partial discharge signal processor, an arrival time detector, a discharge location processor, and a display unit.
    Type: Grant
    Filed: December 29, 2008
    Date of Patent: August 30, 2011
    Assignee: Korea Electric Power Corporation
    Inventors: Ki-Jun Park, Sun-Geun Goo, Jin-Yul Yoon, Ki-Son Han, Hyung-Jun Ju
  • Patent number: 7924018
    Abstract: An apparatus for detecting a static field includes a microelectromechanical systems (MEMS) device having two cantilevered beams of conductive material that are adjacent and substantially parallel to each other. The two beams repel each other in the presence of a static field. At least one sensor detects a respective amount of displacement of the two cantilevered beams from a rest position and determines an amount of repulsion of the two cantilevered beams from each other.
    Type: Grant
    Filed: December 19, 2008
    Date of Patent: April 12, 2011
    Assignee: Illinois Tool Works Inc.
    Inventor: Roger J. Peirce
  • Publication number: 20100156429
    Abstract: An apparatus for detecting a static field includes a microelectromechanical systems (MEMS) device having two cantilevered beams of conductive material that are adjacent and substantially parallel to each other. The two beams repel each other in the presence of a static field. At least one sensor detects a respective amount of displacement of the two cantilevered beams from a rest position and determines an amount of repulsion of the two cantilevered beams from each other.
    Type: Application
    Filed: December 19, 2008
    Publication date: June 24, 2010
    Applicant: ILLINOIS TOOL WORKS INC.
    Inventor: Roger J. Peirce
  • Patent number: 7741851
    Abstract: A potential measuring apparatus has a detection electrode on which an electric charge is induced according to a potential of a detection object, and a modulator for altering the generated quantity of the electric charge. The detection electrode has at least one depressed portion on a surface opposite to the detection object.
    Type: Grant
    Filed: May 12, 2008
    Date of Patent: June 22, 2010
    Assignee: Canon Kabushiki Kaisha
    Inventors: Takashi Ushijima, Yoshikatsu Ichimura, Atsushi Kandori, Yoshitaka Zaitsu
  • Patent number: 7710129
    Abstract: A potential measurement apparatus is provided which can suitably maintain the oscillation state of an oscillator including a detection electrode and stably measure the potential of a measurement object. The potential measurement apparatus includes a bearing part, an elastic supporting part supported by the bearing part, an oscillator movably supported by the elastic supporting part, detection electrodes installed in the oscillator, a drive mechanism driving the oscillator and a signal detection unit. The signal detection unit is connected to the detection electrodes to detect electrical signals appearing in the detected electrodes. A stress detecting element for generating an electric signal according to the stress of the elastic suspension part 142 is provided.
    Type: Grant
    Filed: November 28, 2007
    Date of Patent: May 4, 2010
    Assignee: Canon Kabushiki Kaisha
    Inventors: Toshiyuki Ogawa, Yoshitaka Zaitsu, Takashi Ushijima, Atsushi Kandori, Kaoru Noguchi, Kazuhiko Kato, Futoshi Hirose
  • Patent number: 7676333
    Abstract: A method of analyzing partial discharge data collected from an electrical device includes collecting partial discharge data from a first electrical device belonging to a group of electrical devices. The group of electrical devices is at least partially defined by at least one electrical device classification. The method also includes generating a comparison of at least a portion of the partial discharge data collected from the first electrical device with at least a portion of the partial discharge data collected from at least one second electrical device. The at least one second electrical device is selected from the group of electrical devices that includes the first electrical device. The method further includes transmitting the results.
    Type: Grant
    Filed: November 6, 2007
    Date of Patent: March 9, 2010
    Assignee: General Electric Company
    Inventors: Abdelkrim Younsi, Sameh Ramadan Salem, Weizhong Yan, Gian Carlo Montanari
  • Patent number: 7639020
    Abstract: A potential sensor is provided in which the adhesion of toner particles to the potential sensor is reduced or prevented from occurring, reducing or preventing the occurrence of a situation that accurate detection cannot be performed. The potential sensor has a movable member, detecting electrodes formed on the movable member, a support which movably supports the movable member, a driving mechanism which drives the movable member, and a stationary member which supports the support. Between the movable member and the stationary member, a first gap is so formed as to make the movable member 101 movable. The first gap has a part that is not larger in width than the maximum size of toner particles when the movable member is not elastically deformed and is at a neutral position.
    Type: Grant
    Filed: October 25, 2007
    Date of Patent: December 29, 2009
    Assignee: Canon Kabushiki Kaisha
    Inventors: Takashi Ushijima, Kaoru Noguchi, Atsushi Kandori, Yoshitaka Zaitsu, Kazuhiko Kato, Toshiyuki Ogawa, Futoshi Hirose
  • Patent number: 7612569
    Abstract: Oscillating device including a movable member that is vibratable, a fixed section that is provided opposite to the movable member, a driving unit configured to drive the movable member, and at least two electrodes configured to generate a first signal corresponding to a drive state of the movable member. At least one electrode is provided on the movable member, and at least one electrode is provided on the fixed section. The driving unit can control the driving of the movable member on the basis of the first signal.
    Type: Grant
    Filed: February 1, 2007
    Date of Patent: November 3, 2009
    Assignee: Canon Kabushiki Kaisha
    Inventors: Takashi Ushijima, Yoshikatsu Ichimura, Atsushi Kandori, Yoshitaka Zaitsu
  • Patent number: 7598746
    Abstract: A surface voltmeter has a stage having a conductive surface, a vibrating electrode, a vibration part, and an elevation mechanism. While vibrating the vibrating electrode, displacement current from the conductive surface is acquired. A control part controls electrode voltage so that the displacement current becomes a value specified by a computer, and acquires a relationship between the displacement current and the electrode voltage while changing the displacement current. Acquisition of the relationship is performed a plurality of times while changing distance between the vibrating electrode and an object, the electrode voltage which is independent from the distance between the vibrating electrode and the object is obtained as reference voltage, and surface voltage on the object is obtained on the basis of the reference voltage.
    Type: Grant
    Filed: March 9, 2007
    Date of Patent: October 6, 2009
    Assignee: Dainippon Screen Mfg. Co., Ltd.
    Inventors: Motohiro Kono, Kazuhiko Fuse, Yoshiyuki Nakazawa
  • Patent number: 7583086
    Abstract: A potential sensor including first and second detection electrodes opposed to an object of which a potential is to be measured, and a movable shutter so positioned between the detection electrodes and the potential-measured object with gaps thereto. The movable shutter can assume a first state and a second state. The first detection electrode is exposed to the potential-measured object wider when the movable shutter assumes the second state. The second detection electrode is exposed to the potential-measured object narrower when the movable shutter assumes the first state than when the movable shutter assumes the second state.
    Type: Grant
    Filed: July 5, 2007
    Date of Patent: September 1, 2009
    Assignee: Canon Kabushiki Kaisha
    Inventors: Susumu Yasuda, Takayuki Yagi, Takashi Ushijima, Yoshitaka Zaitsu, Yoshikatsu Ichimura
  • Patent number: 7579843
    Abstract: Methods and apparatus for analyzing electrical insulation of an electrical machine are provided. The method includes receiving a first signal that includes a plurality of partial discharge pulses from the electrical machine and a plurality of noise pulses, receiving other signals that includes information relative to at least one process parameter associated with the electrical machine, determining the plurality of partial discharge pulses from the plurality of noise pulses, identifying characteristics of the plurality of partial discharge pulses relating to the location and character of partial discharges in the electrical machine, and determining a condition of the electrical insulation using the identified characteristics and the received information relative to at least one process parameter.
    Type: Grant
    Filed: October 13, 2006
    Date of Patent: August 25, 2009
    Assignee: General Electric Company
    Inventors: Abdelkrim Younsi, Sameh Ramadan Salem
  • Patent number: 7576546
    Abstract: An electric potential measuring device comprises a detection electrode of a conductive material disposed in opposition to an object and a movable structure comprised of a first solid material portion of a dielectric and a second solid material portion of another dielectric or a conductive material. A charge induced on the detection electrode by electric lines of force from the object is modulated by moving the movable structure with a drive mechanism, to measure an electric potential of the object. An image forming apparatus comprises the electric potential measuring device and an image forming means for performing a control of an image formation by using the electric potential measuring device.
    Type: Grant
    Filed: July 19, 2007
    Date of Patent: August 18, 2009
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yoshikatsu Ichimura, Takayuki Yagi, Yoshitaka Zaitsu
  • Patent number: 7554331
    Abstract: An electric potential measuring device has a detection electrode of a conductive material disposed in opposition to an object and a movable structure including a first solid material portion of a dielectric and a second solid material portion of another dielectric or a conductive material. A charge induced on the detection electrode by electric lines of force from the object is modulated by moving the movable structure with a drive mechanism, to measure an electric potential of the object. An image forming apparatus has the electric potential measuring device and an image forming unit for performing a control of an image formation by using the electric potential measuring device.
    Type: Grant
    Filed: March 28, 2007
    Date of Patent: June 30, 2009
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yoshikatsu Ichimura, Takayuki Yagi, Yoshitaka Zaitsu
  • Patent number: 7548066
    Abstract: A potential measuring device for measuring a potential of a measurement object, includes a detection electrode that faces the measurement object, a reference electrode disposed in a vicinity of the detection electrode that is electrostatically shielded by an electrostatic shield structure with respect to the measurement object, and capacitance modulator for modulating an electrostatic coupled capacitance between the detection electrode and the measurement object to measure a potential of the measurement object by using an electric signal generated on the detection electrode and an electric signal generated on the reference electrode.
    Type: Grant
    Filed: May 10, 2006
    Date of Patent: June 16, 2009
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yoshikatsu Ichimura, Takashi Ushijima, Atsushi Kandori, Yoshitaka Zaitsu
  • Patent number: 7489135
    Abstract: The electric potential measuring instrument comprises an electrode arranged on a semiconductor substrate at a position opposite to the object of measurement and a modulator for modulating the coupling capacitance between the object of measurement and the electrode. The electrode is the gate electrode of a field effect type transistor. The modulated electric current that flows between the source diffusion region and the drain diffusion region of the field effect type transistor is synchronously detected by a detection circuit with the modulation frequency of the modulator. The output signal that appears on the gate electrode of a field effect transistor can be measured with ease by changing the coupling capacitance between the electrode of an electric potential measuring instrument and an object of measurement.
    Type: Grant
    Filed: June 7, 2005
    Date of Patent: February 10, 2009
    Assignee: Canon Kabushiki Kaisha
    Inventor: Yoshikatsu Ichimura
  • Patent number: 7460803
    Abstract: To provide an electric potential measuring device which is useful in realizing size reduction, high sensitivity, and high reliability. The electric potential measuring device includes: an oscillating device which includes torsion springs, and an oscillating body axially supported by the springs to oscillate; and signal detecting unit which is located on a surface of the oscillating body. A capacitance between the detection electrode and a surface of an electric potential measuring object is varied by varying a distance therebetween by the oscillating device, whereby an output signal appearing on the detection electrode is detected.
    Type: Grant
    Filed: March 9, 2007
    Date of Patent: December 2, 2008
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yoshikatsu Ichimura, Yasuhiro Shimada, Yasushi Mizoguchi, Yoshitaka Zaitsu
  • Patent number: 7443325
    Abstract: An integrator circuit (110) is provided including an amplifier element (170) configured to receive an input signal at an input node, amplify the input signal, and provide an amplified input signal at an output node; a feedback capacitor element (175) connected between the output node and the input node; and a current matching circuit (120) connected to the output node, and configured to sense an output voltage of the amplifier element and to provide a supplemental current (IM) to the input node that is less than or equal to a feedback current (IF) charging the feedback capacitor element. This supplemental current is substantially equal and opposite in polarity to a feedback current when the output voltage satisfies a set criterion.
    Type: Grant
    Filed: October 31, 2007
    Date of Patent: October 28, 2008
    Assignee: Freescale Semiconductor, Inc.
    Inventor: Merit Y. Hong
  • Patent number: 7439746
    Abstract: An electrostatic voltmeter has an input sensing terminal, a first operational amplifier, a second operational amplifier, a first reference voltage terminal electrically connected to the non-inverting input of the second operational amplifier, a low reference voltage terminal electrically connected to the output of the second operational amplifier, and a voltage indicator, electrically connected between the low reference voltage terminal and the first reference voltage terminal.
    Type: Grant
    Filed: October 27, 2006
    Date of Patent: October 21, 2008
    Assignee: Trek, Inc.
    Inventor: Bruce T. Williams
  • Publication number: 20080238434
    Abstract: In a surface voltmeter (1), a surface voltage on a measurement area on a semiconductor substrate (9) on which an insulating film is formed is measured while applying light to the measurement area. With this operation, a voltage induced on a main body of the substrate (9) by charge which is charged on a surface of the insulating film is balanced out. Consequently, it is possible to measure a surface voltage on the measurement area with high accuracy. Since an electrode wiring (164) used for application of an electrode voltage to an electrode (12) extends from the electrode (12) in a direction away from the substrate (9) along a vibration direction, it is possible to prevent influences of noises caused by vibration of the electrode wiring (164) in vibrating the electrode (12) and to measure the surface voltage on the measurement area more accurately.
    Type: Application
    Filed: March 25, 2008
    Publication date: October 2, 2008
    Inventors: Motohiro Kono, Toshikazu Kitajima, Kazuhiko Fuse, Yoshiyuki Nakazawa
  • Patent number: 7423435
    Abstract: A grammage measuring apparatus including a dielectric resonator which is arranged only at one side surface of a sample; a shielding container with which the dielectric resonator is substantially covered except for a sample measuring surface; a microwave excitation device which causes the dielectric resonator to generate an electric field vector; a detection device which detects transmission energy or reflection energy by the dielectric resonator; a storage device in which a calibration curve indicating a resonance frequency shift amount for a grammage is stored; and a data processing device which calculates the grammage of a measuring sample from the calibration curve and measurement result of the resonance frequency shift amount of the measuring sample.
    Type: Grant
    Filed: June 13, 2006
    Date of Patent: September 9, 2008
    Assignee: Oji Paper Co., Ltd.
    Inventors: Hidetada Sawamoto, Shinichi Nagata
  • Publication number: 20080129302
    Abstract: An electrical potential sensor device comprises sensor electrodes arranged to measure a voltage based on a change in electrical charge induced in the sensor electrodes by exposure to an electrical potential of a source to be measured. An electro-thermally operated mechanism, adjacent to the sensor electrodes, is movable between a first position in which only first ones of the sensor electrodes are exposed to the electrical potential of the source to be measured and other sensor electrodes are shielded from the electrical potential, and a second position in which other ones of the sensor electrodes are exposed to the electrical potential and the first ones are substantially shielded from the electrical potential. A controller combines the output from the two sets of electrodes which are alternately exposed to the electrical potential to calculate a resulting measured/sensed voltage or measured/sensed electrical potential of the device.
    Type: Application
    Filed: November 30, 2007
    Publication date: June 5, 2008
    Inventors: Cyrus Shafai, Behraad Bahreyni
  • Patent number: 7382137
    Abstract: A potential measuring apparatus has a detection electrode on which an electric charge is induced according to a potential of a detection object, and a modulator for altering the generated quantity of the electric charge. The detection electrode has at least one depressed portion on a surface opposite to the detection object.
    Type: Grant
    Filed: May 17, 2006
    Date of Patent: June 3, 2008
    Assignee: Canon Kabushiki Kaisha
    Inventors: Takashi Ushijima, Yoshikatsu Ichimura, Atsushi Kandori, Yoshitaka Zaitsu
  • Publication number: 20080116897
    Abstract: A potential sensor is provided in which the adhesion of toner particles to the potential sensor is reduced or prevented from occurring, reducing or preventing the occurrence of a situation that accurate detection cannot be performed. The potential sensor has a movable member, detecting electrodes formed on the movable member, a support which movably supports the movable member, a driving mechanism which drives the movable member, and a stationary member which supports the support. Between the movable member and the stationary member, a first gap is so formed as to make the movable member 101 movable. The first gap has a part that is not larger in width than the maximum size of toner particles when the movable member is not elastically deformed and is at a neutral position.
    Type: Application
    Filed: October 25, 2007
    Publication date: May 22, 2008
    Applicant: CANON KABUSHIKI KAISHA
    Inventors: Takashi Ushijima, Kaoru Noguchi, Atsushi Kandori, Yoshitaka Zaitsu, Kazuhiko Kato, Toshiyuki Ogawa, Futoshi Hirose
  • Patent number: 7372278
    Abstract: An electric potential measuring apparatus includes a detecting electrode, a modulator for changing an electrostatic capacitance between a measurement object and the detecting electrode by mechanical vibration, a charge detector for detecting the amount of charges electrostatically induced in the detecting electrode by the modulator, and a vibration generating-detecting unit for selectively performing either a vibration generating function of exciting the mechanical vibration, or a detecting function of detecting the condition of the mechanical vibration.
    Type: Grant
    Filed: August 9, 2006
    Date of Patent: May 13, 2008
    Assignee: Canon Kabushiki Kaisha
    Inventors: Atsushi Kandori, Yoshikatsu Ichimura, Takashi Ushijima, Yoshitaka Zaitsu, Kaoru Noguchi