Abstract: A scanning cannula for scanning an electrosurgical instrument for electrical insulation defects includes an elongated sleeve having a receiving end, an opposite exit end, and a passageway extending from the receiving end to the exit end. At least one sweeping contact is disposed in the passageway with a limit switch or photocell upstream. A circuit is electrically connected to the at least one sweeping contact. A communication device is connected to the circuit to transmit signals from the circuit to a controller of a surgical instrument. An electrosurgical instrument inserted into the receiving end of the sleeve passes through the at least one sweeping contact, and any electrical defect of the electrosurgical instrument detected by the at least one sweeping contact and assessed by the software is relayed as an error signal to the circuit, which communicates the error signal to the controller. The controller cuts current to the electrosurgical instrument and signals an alarm.

Abstract: A method of evaluating an electrically conductive wire segment having an insulated intermediate portion and non-insulated ends includes passing the insulated portion of the wire segment through an electrically conductive brush. According to the method, an electrical potential is established on the brush by a power source. The method also includes determining a value of electrical current that is conducted through the wire segment by the brush when the potential is established on the brush. The method additionally includes comparing the value of electrical current conducted through the wire segment with a predetermined current value to thereby evaluate the wire segment. A system for evaluating an electrically conductive wire segment is also disclosed.

Abstract: Capacitive leadframe testing techniques are improved through knowledge of characteristics of semiconductor junctions specific to nodes of device under test (DUT) that are connected to nodes under test of the DUT.

Abstract: A semiconductor device and a fabrication method thereof are provided. The semiconductor device has a probing pad formed on a chip. The probing pad is connected to an output pad and an internal circuit though a fuse. After an electrical testing of the chip by the probing pad, the fuse is cut by a laser beam. Therefore, the probing pad is disconnected from the output pad and the internal circuit. The output pad is connected to an output lead of a package, which is encapsulating the chip. According to the device and the fabrication methods thereof, performance of the device can be enhanced by a low parasitic capacitance and a low parasitic resistance.

Abstract: An apparatus for detecting flaws in a tire. The apparatus may contain a frame sized to be placed in the interior of the tire, at least one device operably connected to the frame so that upon rotation of the tire the frame travels around the interior of the tire, where the frame is substantially supported by the tire, and at least one pin attached to the frame, where the at least one pin is adapted to be connected to a voltage generator to create an electric field near the surface of the tire when in use so that an electric arc is produced upon the presence of a flaw in the tire.

Abstract: A method and apparatus for detecting interruptions of continuity in a circuit is provided. The method includes transmitting a signal through a brush contacting a conductive band of a slipring, wherein the brush and the slipring have a relative motion. The apparatus is configured to determine a circuit interruption using a plurality of parameters of the signal transmitted through the brush and the slipring, and provide an indication of an interruption when the parameters of the signal transmitted through the brush and slipring are indicative of a circuit interruption.

Abstract: An apparatus for detecting flaws in a tire. The apparatus may contain a frame sized to be placed in the interior of the tire, at least one device operably connected to the frame so that upon rotation of the tire the frame travels around the interior of the tire, wherein the frame is substantially supported by the tire, and at least one pin attached to the frame, wherein the at least one pin is adapted to be connected to a voltage generator to create an electric field therein and near the surface of the tire when in use so that an electric arc is produced upon the presence of a flaw in the tire.

Abstract: A condom testing apparatus utilizing an arcing electrical current to detect holes and excessively thin wall areas in a condom mounted on a conductive testing mandrel, where the condom is passed across a conductive fabric member to test the main body and transition portion of the condom, and is passed through the bristles of a conductive brush member to test the nipple end of the condom. In alternative embodiments, the apparatus may utilize only conductive fabric or only conductive brushes.