Abstract: Disclosed is a method for detecting a short-circuit in an H-bridge electronic circuit, including: activating a current source on a first test branch; taking a first potential measurement of one of the output terminals; activating, if the first potential measurement is substantially different from the potential of the power supply terminal to which the first test branch is connected, a current source on a second, diametrically opposite test branch; taking a second potential measurement of each output terminal; and signalling the detection of a localized short-circuit in the output terminal having the potential resulting from the second potential measurement that is closest to the potential resulting from the first potential measurement.

Abstract: A method of inspection for a group of a same type of capacitors includes: a step of applying a DC bias voltage equal to or lower than the rated value of the group to a capacitor; and a vibration response voltage generating step of inputting an electric signal whose frequency continuously changes with time to a capacitor, causing mechanical vibration in the capacitor, generating a vibration response voltage from the capacitor, and outputting superposition of the DC bias voltage and the vibration response voltage as reaction voltage.

Abstract: Loop resistance is measured in a live-earth conductor loop comprising a residual current device powered by an alternating current mains supply. A measurement circuit having a low-pass filter characteristic arranged to substantially remove signal components at the frequency of the alternating current mains supply is used to measure, in a first period, a voltage across live and earth conductors of the live-earth conductor loop to determine a first voltage. A current application circuit is used to apply a unipolar test current having a magnitude below a trip current value of the residual current device for a second period and the measurement circuit is used to measure a second voltage between the live and earth conductors. Based on a difference in test current between the first and second periods and a difference in voltage between the first voltage and the second voltage, the resistance of the live-earth conductor loop is calculated.

Abstract: An earth fault detection apparatus includes a switch group configured to switch between a first measurement path including a battery and a capacitor, a second measurement path including the battery, a negative-side insulation resistance, and the capacitor, a third measurement path including the battery, a positive-side insulation resistance, and the capacitor; and a control unit configured to calculate a reference value, based on each charging voltage of the capacitor in each measurement path, and configured to calculate an insulation resistance with reference to a predetermined conversion map, in which the conversion map includes a conversion map corresponding to a capacitance of the capacitor, and the control unit estimates the capacitance of the capacitor, and refers to the conversion map corresponding to the capacitance of the capacitor that has been estimated.

Abstract: Provided is a method for determining insulation thermomechanical deterioration of a VPI wire rod of a pumped storage power generator motor. The method includes: periodically performing a cold-heat cycling test on a wire rod, and performing an insulation dielectric dissipation factor testing and a result interpretation of the insulation dielectric dissipation factor testing before and after each period to obtain corresponding data; in response to determining the interpretation result as the data being qualified, continuing to perform the cold-heat cycling test; and in response to determining the interpretation result as the data being unqualified, striking the wire rod with a copper hammer, and using an acoustic acquisition and analysis system to perform signal processing to determine spectral characteristics in a thermomechanical deterioration state as a deterioration criterion.

Abstract: A field device includes: a current controller configured to operate with a first power supply voltage and output a control signal for controlling a current to be output to a transmission line; a current output unit configured to operate with a second power supply voltage different from the first power supply voltage, the current output unit being capable of outputting a current of a magnitude corresponding to the control signal output from the current controller to the transmission line; and an abnormality notification unit configured to output, to the current output unit, a first signal for causing the current output unit to output a burnout current indicating that an abnormality has occurred in a case in which an abnormality occurs in the first power supply voltage.

Abstract: This disclosure describes a system and method for generating images by performing TEM surveys using pre-existing infrastructure such as transmission lines, or power lines, and naturally occurring transients such as lightning strikes or load switching. A relatively inexpensive sensor array can be installed on overhead power lines (e.g., electrical transmission or sub-transmission lines) which can detect transients in the overhead power lines. Transients in the overhead power lines can cause the power lines to emit pulses of electromagnetic (EM) radiation, which propagate into the earth's subsurface. This sudden change in electromagnetic field in the subsurface can induce eddy currents, which in turn emit return EM radiation that can propagate back to the overhead power line and induce secondary voltage and current transients. The magnitude of these secondary transients, and their time delay from the original transient are influenced by the properties of the subsurface in which the eddy currents formed.

Abstract: A semiconductor device according to an embodiment includes a holding circuit including a buffer configured to obtain a heat stress information having a temperature dependency every predetermined period and a stress counter configured to accumulate the heat stress information and hold the accumulated value as a cumulative stress count value, a control circuit including an operation determination threshold value, and a wireless communication circuit. According to the semiconductor device according to the embodiment, while reducing the power consumption, it is possible to wirelessly transmit the cumulative heat stress information.

Abstract: A system includes a first connection configured to allow current flow between a first node and a second node through a first transistor when it is enabled, and a first diode configured to allow current flow between the first node and the second node when the first transistor is disabled. A second connection is configured to allow current flow between the first node and the second node through a second transistor when it is enabled, and a second diode configured to allow current flow between the first node and the second node when the second transistor is disabled. A fault detection circuit is configured to test the first connection by detection of current flow on the second connection with the second transistor disabled, and is configured to test the second connection by detection of current flow on the first connection with the first transistor disabled.

Abstract: An electrical circuit for testing primary internal signals of an ASIC. Only test pin is provided via which a selection can be made of a digital or analog signal to be observed. The electrical circuit includes a Schmitt trigger between the test pin and an output terminal of the electrical circuit. A test mode id activated when a switching threshold of the Schmitt trigger is exceeded. At least one sub-circuit is provided for the observation of a digital signal, having a resistor, an NMOS transistor, and an AND gate, at whose first input the digital signal is present. The resistor is between the test pin and the drain terminal of the NMOS transistor. The source terminal is connected to ground, and the gate terminal is connected to the output of the AND gate. The second input of the AND gate being connected to the output terminal of the electrical circuit.

Abstract: An earth fault detection apparatus includes a switch group configured to switch between a first measurement path including a battery and a capacitor, a second measurement path including the battery, a negative-side insulation resistance, and the capacitor, a third measurement path including the battery, a positive-side insulation resistance, and the capacitor; and a control unit configured to calculate a reference value, based on each charging voltage of the capacitor in each measurement path, and configured to calculate an insulation resistance with reference to a predetermined conversion map, in which the conversion map includes a conversion map corresponding to a capacitance of the capacitor, and the control unit estimates the capacitance of the capacitor, and refers to the conversion map corresponding to the capacitance of the capacitor that has been estimated.

Abstract: A method for determining degradation of a capacitor in an electric meter includes, charging the capacitor to a predetermined voltage value during a charging period using charging circuitry of the electric meter, discharging the capacitor, during a discharge period, from the predetermined voltage value using discharging circuitry of the electric meter, measuring, during the discharge period, a first capacitor voltage value at a first time and a second capacitor voltage value at a second time later than the first time using capacitor measurement circuitry of the electric meter, determining, by a processor of the electric meter, a capacitance value of the capacitor based on the first voltage value, the second voltage value, the first time, and the second time, comparing the determined capacitance value to a capacitance threshold value, and determining that the capacitor is in a degraded condition when the calculated capacitance value is below the capacitance threshold value.

Abstract: An integrated circuit device includes a controller, a voltage source coupled to the controller, a voltage sampler coupled to the controller, a to current detector coupled to the controller and memory coupled to the controller, where memory includes code segments executable by the controller for: (a) measuring a cell voltage to determine an initial voltage; (b) holding the cell voltage at the initial voltage using a power source; and (c) determining the leakage current of the cell by the current provided by the current power source with a low current detector. The power source can be one or both of a voltage source and a current source.

Abstract: A smart cord reel cable including at least one sensor for measuring cord or cord reel usage, a memory for receiving sensor input to create usage records, and a processor for analyzing the usage records to provide information for maintenance status indication and/or usage analytics.

Abstract: Examples of operating an Intelligent Electronic Device (IED) during power swings, are described. In an example, voltage measurements for a phase is received and sampled. Root mean square (RMS) values of the voltage samples is calculated based on the voltage measurements. Delta quantities for each phase are calculated based on the RMS values. Each of the RMS values and delta quantities are associated with respective sampling instants. In response to a delta quantity being greater than a predefined threshold, a peak delta quantity is detected. A time interval between a sampling instant associated with the peak delta quantity and a sampling instant associated with a first delta quantity is determined. Based on a comparison of the time interval with a threshold time, a disturbance condition may be detected as a power swing and consequently, fault detection at the IED may be blocked.

Abstract: An apparatus for performing thermal testing of a memory device and a method of thermally testing the memory device. The apparatus includes a tester; an interface board disposed over the tester and configured to receive the semiconductor device and connect the semiconductor device to the tester; a shield disposed over the interface board and including a recess; a gas-supplying unit including a conduit extending through the shield and accessible to the recess; a temperature-sensing device disposed within the recess; and a controller configured to control and communicate with the tester, the gas-supplying unit and the temperature-sensing device.

Abstract: An injection molded article is obtained by injection molding a molten resin into a mold. The injection molded article includes: a base as a thin plate-shaped member that is connected to a gate of the mold; and a plurality of protrusions each integrally molded on the base and having a thickness greater than a plate thickness of the base. The plurality of protrusions have holes each extending through the base, and the holes in the respective protrusions are connected through another component to form a flow channel. A processed region processed to have a surface roughness greater than a surface roughness of a mirror surface region including a region between the holes on the base is formed in a projected region where a region having a predetermined thickness value is projected on the base.

Abstract: A method for determining degradation of a capacitor in an electric meter includes, charging the capacitor to a predetermined voltage value during a charging period using charging circuitry of the electric meter, discharging the capacitor, during a discharge period, from the predetermined voltage value using discharging circuitry of the electric meter, measuring, during the discharge period, a first capacitor voltage value at a first time and a second capacitor voltage value at a second time later than the first time using capacitor measurement circuitry of the electric meter, determining, by a processor of the electric meter, a capacitance value of the capacitor based on the first voltage value, the second voltage value, the first time, and the second time, comparing the determined capacitance value to a capacitance threshold value, and determining that the capacitor is in a degraded condition when the calculated capacitance value is below the capacitance threshold value.

Abstract: A cover for an electrical rail mount device is provided. Further, an electrical rail mount device for mounting on a rail is provided, comprising at least ono input terminal configured to receive an input line, fixing means configured to fix the input line to the input terminal to establish an electrical connection, a lockable cover reversibly movable from an open state into a closed state, whereas the cover is configured to cover the fixing means in the closed state, such that the fixing means can only be accessed by moving the cover from the closed state into the open state, an electrical element arranged in the cover and configured to provide an electrical function to an active electronic element of the electrical rail mount device, wherein an electrical connection is provided between the electrical element and the active electronic element.

Abstract: A chip system including I/O pins, a memory chip and a processing chip is provided. The processing chip includes I/O pads, memory access pads, a processor, an I/O controller, a memory controller and a transmission gate module. Under an operation mode, the I/O controller allows the processor to communicate with an external circuit device through the I/O controller, the I/O pads and the I/O pins. Under the operation mode, the memory controller allows the processor to access the memory chip through the memory controller and the memory access pads. The transmission gate module is enabled during a program mode or a test mode to allow the external circuit device to perform programming or testing on the memory chip through the I/O pins, the I/O pads, the transmission gate module and the memory access pads.

Abstract: Prober for a test system for testing a device under test is disclosed. In one example, the prober comprises a busbar mechanism for transporting electric signals to and away from the device under test.

Abstract: A pixel driving circuit, an organic light emitting display panel and a pixel driving method. The pixel driving circuit includes: a switching sub-circuit, a driving sub-circuit, a storage capacitor and a charge eliminating sub-circuit; the charge eliminating sub-circuit has a control terminal connected to a first scanning signal line, and other terminals connected to the first terminal of the driving sub-circuit, a cathode of the organic light emitting element (OLED) and a reference voltage terminal respectively, and can enable a potential between the anode and the cathode of the organic light emitting element to be reversed under control of the first scanning signal line.

Abstract: This disclosure describes techniques for separately determining isolation resistances from nodes of a power system of an electric vehicle (EV) to a chassis of the EV. Processing circuitry may determine a first isolation resistance between a first node of the power system in the EV and a chassis of the EV, determine a second isolation resistance between a second node of the power system in the EV and the chassis of the EV, determine that the first isolation resistance or the second isolation resistance is less than a threshold resistance, and output information based on the determination that the first isolation resistance or the second isolation resistance is less than the threshold resistance.

Abstract: The present application discloses a display-driving circuit including a pixel sub-circuit, a sensing-control sub-circuit, and an emission-control sub-circuit. The pixel sub-circuit includes four transistors and one storage capacitor and is coupled respectively with a first power-supply line, a data-sensing line, a first scan line, and a second scan line to determine a drive current flowing from a driving transistor to a light-emitting diode based on a data signal received via the data-sensing line. The sensing-control sub-circuit is coupled between the light-emitting diode and the first power-supply line and configured to enable a sensing signal to be detected via the data-sensing line with a reduced scan rate in a sensing time. The emission-control sub-circuit is coupled between the light-emitting diode and a second power-supply line to pass the drive current for driving the light-emitting diode to emit light under control of an emission-control signal in a displaying time after the sensing time.

Abstract: The present disclosure relates to a technical field of display, and provides a scan signal adjusting method, a scan signal adjusting device, and a display panel. The scan signal adjusting method is used to adjust a scan signal of a control end of a switching transistor in a pixel driving circuit. The method includes obtaining a threshold voltage of the switching transistor and adjusting a voltage of the scan signal during a turn-off period according to the threshold voltage of the switching transistor.

Abstract: A technique includes determining an approximate location of the fault based at least in part on a local current measurement and a local voltage measurement from a local relay and a remote current measurement and a remote voltage measurement from a remote relay. The technique includes determining a corrected location of the fault based on the approximate fault location and a correction factor. The correction factor is based on a propagation constant of the power line.

Abstract: Provided is a probe device used for electrical inspection of a printed wiring board, the probe device including at least one probe group including a plurality of wire probes configured to be able to simultaneously abut against a wire provided on the printed wiring board and extending in a specified direction, the plurality of wire probes abutting against the wire along the direction and being electrically connected to each other.

Abstract: A method includes obtaining a voltage or current signal associated with a component of a device and isolating and conditioning the voltage or current signal to generate an output signal. The method also includes processing the output signal to identify one or more surge events, where each surge event is associated with an excessive voltage or current experienced by the device. The method further includes generating information associated with the one or more surge events and transmitting or storing the information. The voltage or current signal could be obtained from a case or housing of the device, a cable coupled to the device, or an antenna coupled to the device. The information associated with the one or more surge events could include a date/time stamp, a severity, a duration, or a shape or profile of each surge event.

Abstract: The present invention provides a display panel, including a display area, a crack stop area on a periphery of the display area, and a cutting channel disposed on a periphery of the crack stop area; wherein the display panel further includes a monitoring circuit, and the monitoring circuit is used for monitoring cracks generated in the cutting channel when the cutting is proceeded; and wherein a metal signal line is disposed in the crack stop area surrounding the display area and is electrically connected to the monitoring circuit, the metal signal line is formed by electrically connecting two metal layers, the metal signal line is used for blocking the cracks generated extend toward the display area.

Abstract: In one embodiment, a wiring open detection circuit includes a signal processing circuit, a terminal, a diode, and an open decision circuit. The signal processing circuit is connected to one end of a first wiring and outputs a signal processed signal to the first wiring. The terminal is connected to the other end of the first wiring. The diode has one end connected to the terminal. The open decision circuit applies a first voltage to the other end of the diode, and detects change in a current flowing in the first wiring to decide whether or not the first wiring is open.

Abstract: Estimating a lifespan of a power supply. An internal computerized component periodically obtains a set of measurements read from one or more sensors affixed to a power supply. Such measurements may measure ambient temperature, temperature of an electrolytic capacitor of a power supply, voltage across a power supply, and/or current from the power supply. The internal computerized component analyzes the set of measurements using, at least in part, a weighted set of factors, to obtain an estimate of a lifespan of a power supply. The estimated lifespan may be sent over an optical link or wireless network to an entity monitoring the lifespan of the power supply.

Abstract: A method, system and computer readable medium for determination of distance to an electrical fault within a device. A signal generator excites the device with an electrical input signal. The device comprises an open circuited electrical transmission line. A frequency domain analyzer analyzes part of the signal reflected from the device for determination of the locations of resonant frequency of the signal within the device. A computer calculates the distance to the fault within the device, based on the resonant frequency. The distance to the fault is one quarter wavelength distance into the device at the resonant frequency. A frequency sweeper sweeps the frequency of the input signal and repeated calculation of the distance to the fault made at a plurality of resonant frequencies during the frequency sweep confirms the distance to the fault by convergence of the result of the repeated calculations to substantially the same location.

Abstract: There are included: a switching parameter detecting unit (21) that detects a switching voltage of a switching element (Q1); and an abnormality detecting unit (a first comparing unit (264a) and an abnormality determining unit (265)) that detects an abnormality caused by foreign matter, on the basis of a result of the detection by the switching parameter detecting unit (21).

Abstract: In an embodiment, the display light-on test device includes: a plurality of D-type connectors configured to be correspondingly connected to mobile phones with different connector types, and receive and transmit power signals; a sampling processor configured to receive the power signals, sample and quantize the power signals into digital data and/or image data, and output the data to a field programmable gate array chip, receive commands, and output, according to the commands, corresponding micro control commands; the field programmable gate array chip connected to the D-type connectors and the sampling processor, and configured to receive the data and the micro control commands, generate corresponding micro control parameters, and process, according to the micro control parameters, the data, to output data required to perform the light-on tests to the display modules to be tested, so that the light-on tests are performed on the display modules to be tested.

Abstract: According to an embodiment, a power source device includes a direct current power source, an alternating current power source, a bypass capacitor, and a power source control unit. The direct current power source outputs a direct current voltage. The alternating current power source outputs a superimposed voltage having an alternating current voltage superimposed on the direct current voltage. The bypass capacitor partially accumulates a charge of alternating current for prevention of flow of current into the direct current power source from the alternating current power source. The power source control unit switches control of the direct current voltage from constant current control to constant voltage control and causes a charge of the alternating current to be accumulated in the bypass capacitor in a short time period between a transfer period and a non-transfer period both related to image formation.

Abstract: A testing apparatus and a testing method for a display panel. The testing apparatus includes a microcontroller unit (MCU) module; an electrical monitoring module, a power supply module, and a field programmable gate array (FPGA) module that are connected to the MCU module; a user interface (UI) display module; an optical monitoring module connected to the UI display module; and a gate driver on array (GOA) signal processing module and a digital-to-analog converter (DAC) module that are connected to the FPGA module. The power supply module, the GOA signal processing module, the DAC module, the electrical monitoring module, and the optical monitoring module are connected to a to-be-tested display panel.

Abstract: A method for the electrical characterization of a photovoltaic cell of a photovoltaic module, the method including steps of obtaining the irradiance received by the photovoltaic module, obtaining a temperature of each photovoltaic cell of a first submodule of the photovoltaic module, comparing the temperature obtained for each photovoltaic cell of the first submodule with a reference temperature, determining the state of each photovoltaic cell of the first submodule between a healthy state, in which its temperature is equal to the reference temperature, and a faulty state, in which its temperature is different from the reference temperature, estimating the I-V curve associated with a first photovoltaic cell of the first submodule, by searching in a database of I-V curves.

Abstract: A power over Ethernet device is provided. The power over Ethernet device includes a first Ethernet connector, an Ethernet transformer circuit, and a detection circuit. The first Ethernet connector is coupled to a second Ethernet connector of a network device via an Ethernet cable and has a first reserve pin and a second reserve pin. The Ethernet transformer circuit is coupled to the first Ethernet connector to provide a supply voltage to the Ethernet cable to transfer the supply voltage to the network device. The detection circuit receives the supply voltage and is coupled to the Ethernet transformer circuit, the first reserve pin, and the second reserve pin to provide a reference voltage to the first reserve pin and receives an identification voltage from the second reserve pin to determine whether the network device is a powered device.

Abstract: A current measurement device including current sensors positioned around current conductors in order to form a passage for the current conductors along an axis oriented in a first direction and a differential current sensor positioned around the set of current conductors in order to form a common passage for the current conductors along an axis oriented in a second direction. The current sensors and the differential current sensor are located in spaces that are separated by an interface plane. A method for manufacturing such a current measurement device, to a protection module and a differential circuit breaker including such a device.

Abstract: An assembly of strip conductors for determining errors in a semiconductor circuit, the strip conductors may be situated on a level of the semiconductor circuit. The assembly includes multiple sections, the sections being arranged as a series circuit, each section including a number of strip conductors, the number of strip conductors in the particular sections being different, each section including a start area and an end area, a voltage difference value between the start area and the end area of the particular section being detectable, and the voltage difference values of the particular sections being different in the case of an error.

Abstract: The vehicle light tester is a testing instrument configured for use with a trailer. The trailer comprises a plurality of operating lights and a trailer port. The trailer port attaches the plurality of operating lights to a vehicle electric power system. The vehicle light tester attaches to the trailer port of the trailer. The vehicle light tester provides electrical power to the plurality of operating lights. The vehicle light tester further simulates the control signals that operate the plurality of lights. The vehicle light tester allows for testing of the operation of a plurality of operating lights without requiring the trailer port to be connected to the vehicle electric power system. The vehicle light tester further allows for the flashing of the plurality of operating lights in an emergency situation. The vehicle light tester comprises a housing and a testing circuit. The housing contains the testing circuit.

Abstract: Synchronous capture of a forward signal and a related CPD signal at a remote PHY device (RPD) for detecting and locating CPD is disclosed. The RPD delivers the forward signal to a coaxial cable plant. The forward signal propagates from the RPD to a CPD source and the CPD signal propagates from the source to the RPD within a round-trip interval. The steps include: (a) capturing the forward signal from the RPD during the round-trip interval; (b) generating a reference signal, substantially simulating the CPD signal, from the forward signal; (c) supplying the reference signal to the RPD; (d) receiving the reference signal in the RPD via a return channel; and (e) capturing the CPD signal at the RPD in the return channel during the round-trip interval. Reference and actual CPD signals are processed as a combined return signal for detecting CPD.

Abstract: A redundant and diverse secondary control system mirrors a primary control system but has some fundamental structural difference as compared to the primary control system to prevent a spread of a security breach from the primary control system to the secondary control system. The secondary control system may operate on different hardware built on different software written with different programming language as compared to the primary control system while performing the same function as that of the primary system. By hardware coding the algorithm to produce actuation signals, software based viruses and worms cannot interfere with the secondary control system's operation. A monitor device receives actuation signals from both the primary and secondary controls signals to determine whether an error occurred and to provide correct actuation signals to the controlled system.

Abstract: A construction method of a software accelerated testing technology based on a noise resonance includes steps of: (1), collecting a source code of software to be tested; (2), automatically generating software test cases based on an intelligent evolving method, until information same or similar as a fault phenomenon is searched; (3), starting a saturation noise mode, and meanwhile exerting all controllable noise sources at a maximum intensity; (4), exerting all the controllable noise sources at a minimum intensity; (5), starting a strategy noise interference mode, and generating a noise resonance; (6), continuously exerting noises at a noise intensity able to generate the noise resonance; and (7), generating effective test sequences. Through the above steps, construction of the software accelerated testing technology based on the noise resonance is completed, which helps software testers accelerate recurrence of a software fault during testing and update the software to increase a reliability thereof.

Abstract: The disclosed embodiments relate to a system for validating a prognostic-surveillance mechanism, which detects anomalies that arise during operation of a computer system. During operation, the system obtains telemetry data comprising a set of raw signals gathered from sensors in the computer system during operation of the computer system, wherein the telemetry signals are gathered over a monitored time period. Next, for each raw signal in the set of raw signals, the system decomposes the raw signal into deterministic and stochastic components. The system then generates a corresponding set of synthesized signals based on the deterministic and stochastic components of the raw signals, wherein the synthesized signals are generated for a simulated time period, which is longer than the monitored time period. Finally, the system uses the set of synthesized signals to validate one or more performance metrics of the prognostic-surveillance mechanism.

Abstract: A state determination unit compares an output value obtained by a measuring unit with a reference characteristic value that serves as a reference, counts the number of times an excessive pressure application state occurs in which the output value is determined to be equal to or larger than the reference characteristic value, and determines whether the number of times reaches an upper limit that is set. An alarm output unit outputs an alarm when the state determination unit determines that the number of times the output value is equal to or larger than the reference characteristic value reaches the set upper limit.

Abstract: An electric power steering apparatus that enables more precise estimation of a coil temperature by considering a heat transfer phenomenon between a control substrate and a poly-phase coil in addition to a heat transfer phenomenon between respective phases of the coil. The apparatus includes a control substrate that controls a poly-phase motor, a temperature sensor that detects a substrate temperature of the control substrate and a coil temperature estimating section that estimates coil temperatures of respective phases of the poly-phase motor by a motor current of the phase and the substrate temperature based on a heat transfer phenomenon between the respective phases that is caused by a difference in temperature between coils of the respective phases and a heat transfer phenomenon between the coil and the control substrate.

Abstract: The invention is an electrical system comprising an electrical source, an electrical device (4), a capacitor (2?) and a controlled active filter (7, L) providing stabilization of the electrical quantities. The active filter (7, L) is mounted in parallel with a capacitor (2?) of reduced capacity in relation to conventional means. Active filter (7, L) is at least partly integrated within electrical device (4).

Abstract: A personal wearable EEG monitor comprising an implantable electrode part with at least two electrodes (2,3) for measuring an EEG signal of a person. The electrode part comprises an electronic circuit arranged in a housing (1) with each electrode arranged external to the housing. The electrode part comprises a testing circuit for testing functionality of the electrode part. The testing circuit comprises a capacitor (9) coupled in serial connection to at least one of the electrodes, and a test signal generator for providing a test signal. The EEG monitor is adapted for analyzing the signal resulting from the signal generator for identification of faults in the electrode part. The invention further provides a method for detecting a leak current in an implanted EEG monitor part.

Abstract: A probe includes a pedestal and at least one feature extending from the pedestal to engage a surface of a corresponding contact at a position offset from a central longitudinal axis of the contact.