Abstract: A method for measuring scattering parameters in a device under test (DUT) using a vector network analyzer (VNA), includes calibrating the VNA to generate corrections for deterministic setup defects and mapping a plurality of error terms based on a plurality of time indices, wherein each time indicia is associated with an error term. A test signal is transmitted to the DUT to obtain a measurement signal from the DUT in response to the test signal. The generated corrections to obtained measurements are time aligned based on the mapped error terms.

Abstract: An electronic device may have control circuitry that uses a reflectometer to measure antenna impedance during operation. The reflectometer may have a directional coupler that is coupled between radio-frequency transceiver circuitry and an antenna. A calibration circuit may be coupled between the directional coupler and the antenna. The calibration circuit may have a first port coupled to the antenna, a second port coupled to the directional coupler, and a third port that is coupled to a calibration resistance. The reflectometer may have terminations of identical impedance that are coupled to ground. Switching circuitry in the reflectometer may be used to route signals from the directional coupler to a feedback receiver for measurement by the control circuitry or to ground through the terminations. Calibrated antenna reflection coefficient measurements may be used in dynamically adjusting the antenna.

Abstract: A semiconductor system includes a master chip and a plurality of slave chips. The master chip controls internal voltage levels of the respective slave chips based on signals outputted from the plurality of slave chips such that, by referring to any one slave chip of the plurality of slave chips, internal voltage levels of remaining slave chips are controlled.

Abstract: A circuit configured to sample a signal of a source circuit and to provide calibration signals to a testing device of the signal sampled from the source circuit. The circuit may include an amplifier, a sampling circuit, and a calibration circuit. The amplifier may be configured to drive signals on an internal node to the testing device. The sampling circuit may be configured to provide a sample of a signal from the source circuit to the internal node. The calibration circuit may be configured to provide a first calibration signal and a second calibration signal to the internal node. The second calibration signal may be a known proportion of the first calibration signal.

Abstract: A method performs a scan operation for a single-layer sensor array that includes transmit (TX) electrodes and receive (RX) electrodes. The method includes determining whether to include a signal value for an RX electrode in a computation of a slope parameter value for a TX electrode. The method computes an index sum based on an index of the RX electrode when the signal value for the RX electrode is included in the computation of the slope parameter value for the TX electrode. The method computes a signal sum based on the signal value for the RX electrode when the signal value for the RX electrode is included in the computation of the slope parameter value for the TX electrode. The method then computes the slope parameter value for the TX electrode based on the signal sum and the index sum.

Abstract: A measuring device comprises at least one port, an external cable connected to the at least one port, a transmitter connected to the at least one port through a switch, a receiver connected to the at least one port through the switch and a reference path connecting the transmitter with the receiver through the switch. The cable is connected to calibration elements, e.g., short and open. The switch alternately switch in a manner that in a first state the transmitter and the receiver are connected to the at least one port and that in a second state the transmitter and the receiver are connected via the reference path.

Abstract: A method for calibration of a capacitive touch screen and a capacitive touch apparatus are disclosed. The calibration method includes obtaining a temporary reference capacitance value of a touch detection point of the capacitive touch screen when the capacitive touch screen powers up. A first difference between a backup reference capacitance value of the touch detection point and the temporary reference capacitance value of the touch detection point is obtained and a reference capacitance value of the touch detection point is determined according to the first difference and a first preset threshold.

Abstract: The invention relates to a method for calibrating a conductivity measuring cell located in a measurement setup for determining conductivity of a liquid medium, especially very pure water, by means of two electrodes of predetermined area arranged in the liquid medium at a predetermined separation relative to one another, supplied with an alternating voltage and having a cell constant, which is predetermined by separation and electrode area and must be calibrated. In order to be able to determine the cell constant independently of calibration standards with predetermined conductivity and/or reference measurement cells, an electrical capacitance of the measuring cell is ascertained by means of an alternating voltage placed on the electrodes in a frequency range between 1 kHz and 1 MHz, following which the cell constant is determined from the ascertained capacitance and the permittivity of the liquid medium contained in the measuring cell.

Abstract: An apparatus includes a plurality of semiconductor devices and an electrical input device for applying voltage to the plurality of semiconductor devices. There is a switching array configured to sequentially interconnect the electrical input device to each of the semiconductor devices and disconnect the other semiconductor devices from the electrical input device. The semiconductor device connected to the electrical input device is a device under test that produces a test current and the other semiconductor devices are devices not under test that produce, in the aggregate, a leakage current. There is an output node interconnected to the switching array for enabling the measurement of the test current at the output node. There is also a leakage current compensator connected to the output node and the switching array that is configured to divert the leakage current away from the output node.

Abstract: A Serializer/Deserializer (SerDes) is described with improved transmitter driver architecture. The transmitter driver architecture consumes significantly less power than other transmitter driver architectures as most of the circuits are driven by a low power supply. Furthermore, there is no need for level shifting even though the transmitter driver architecture is capable of supporting over as 1V of differential peak-to-peak voltage across the communication channel.

Abstract: A measuring device including a signal-processing device, a processor for controlling the measuring device and a communications device. The signal-processing device and the communications device are each connected to the processor. The measuring device further includes a calibration-parameter store connected to the processor for the storage of calibration parameters. The processor is configured to communicate calibration parameters, which are stored in the calibration-parameter store, to a calibration device using the communications device and to implement calibration measurements using the signal-processing device.

Abstract: The present invention relates to a method for characterizing at a given frequency reflected waves of a frequency translating device having at least two ports, whereby information is available on the phase of a local oscillator driving the frequency translating device.

Abstract: A surface acoustic wave sensor system for use with a moving platform. The system comprises an interrogator for producing an RF interrogating signal transmitted from a first antenna. A substrate that supports surface acoustic waves is attached to the moving platform and an interdigital transducer (IDT) and reflector are mounted on the substrate. The IDT produces surface acoustic waves (SAW) responsive to the RF interrogating signal. The reflector produces reflected SAW responsive to the incident SAW and responsive to a characteristic of the moving platform. A position indicator produces a synchronization signal input to the interrogator for triggering the RF interrogating signal. The synchronization signal is timed to trigger the RF interrogating signal when the interdigital transducer is within a field-of-view of the first antenna.

Abstract: A semiconductor device having a circuit that selectively adjusts an impedance of an output buffer. A calibration operation can be performed automatically without issuing a calibration command from a controller. Because a calibration operation to a memory is performed in response to an auto refresh command having been issued for a predetermined number of times, a periodic calibration operation can be secured, and a read operation or a write operation is not requested from a controller during a calibration operation. A start-up circuit activates the calibration circuit when a refresh counter indicates a predetermined value, and prohibits a refresh operation in response to the auto refresh command when the calibration circuit is activated. A temperature detecting circuit may be used to change the frequency of performing a calibration operation.

Abstract: A reflectometer for use in measuring scattering (S-) parameters for a device under test (DUT) includes a test port, a radio frequency (RF) output signal source, and a local oscillator (LO) signal. The LO signal is used to downconvert the RF output signal to an incident IF signal. The reflectometer is useable as a master reflectometer with a slave reflectometer such that the master reflectometer provides the slave reflectometer with a synchronization signal to synchronize signals generated by the second reflectometer to the incident IF signal. Phase and magnitude of transmission S-parameters of the DUT are measurable when the reflectometer is used as the master reflectometer in combination with the slave reflectometer. The master reflectometer and the slave reflectometer can be reconfigurable to reverse the master/server roles of the reflectometers.

Abstract: Methods for adhering parts together using part gap spacers are provided herein. Part gap spacers are formed in a selected pattern and a selected height on a surface of at least one surface of two parts to be oppositely disposed. When disposed opposite each other, at least some of the part gap spacers contact the opposite surface, and establish a standoff distance that is generally uniform, and thereby creating voids. Adhesive is disposed in at least some of the voids to adhere the part surfaces to each other. Further methods comprise forming part gap spacers on multiple sides of a third part to be disposed intermediate two surfaces. The part gap spacers can be formed in a variety of shapes, including bumps, tapers, ribs, and flange edges.

Abstract: An image forming system comprises an external terminal and an image forming apparatus. The external terminal has a position information detection part for detecting terminal position information which is position information of the external terminal and a transmitting part capable of transmitting the terminal position information. The image forming apparatus has a communication part for receiving the terminal position information which is position information of the external terminal from the external terminal and an acquisition part for acquiring apparatus position information which is position information of the image forming apparatus on the basis of the terminal position information.

Abstract: A calibration device for sensing probes includes a housing; a test resistor within the housing; and probe holder by means of which the sensing probe's electrodes can be brought into electrical contact with the test resistor. The test resistor provides a known or a knowable test resistance between the sensing probe's electrodes. In an embodiment having a variable-resistance test resistor, the device includes an access point at which resistance across the test resistor can be measured using an ohm meter. Furthermore, the device includes one or more access points at which resistance, as measured by the sensing probe, can be measured using an ohm meter; using a monitoring device to which the sensing probe ordinarily is connected when in use; or, in some cases, using either.

Abstract: Presented herein are techniques for storing parameter values determined by a power sourcing equipment (PSE) device during a Power over Ethernet (PoE) detection process. More specifically, in one example, a voltage is applied to an end device connected, via an Ethernet cable, to a port of the PSE device. The PSE device measures the current drawn by the end device and calculates, based on the measured current, a resistance and/or a capacitance value for the end device. The resistance and/or capacitance values are then stored in a memory of the PSE device.

Abstract: A driver circuit includes unit slice circuits that generate an output data signal based on an input data signal. The driver circuit reduces a voltage swing of the output data signal without changing a termination resistance of the driver circuit in response to decreasing a number of the unit slice circuits that generate the output data signal based on the input data signal.

Abstract: An FSR assembly includes one or more active areas configured to respond to incident force by changing resistance. The FSR assembly also includes a test area constructed from the same FSR material as the active area(s), but for which the resistance remains substantially constant despite incident force on the assembly.

Abstract: Systems and methods for direct load impedance computation for a two-port network are disclosed. For a two-port network connected between a first port and a second port, a method can include defining an equivalent PI network including a first equivalent network element in communication with the first port, a second equivalent network element in communication with the second port, and a third equivalent network element connected between the first port and the second port. A linear passive load can be connected to the second port of the two-port network, currents through the linear passive load, the second equivalent network element, and the third equivalent network element can be measured, and a load impedance of the linear passive load can be determined based on predetermined values of a voltage at the first port and a voltage at the second port.

Abstract: An arrangement of semiconductor devices to monitor semiconductor defects. There is a first semiconductor device arranged in proximity to a second semiconductor device, the second semiconductor device having a plurality of temperature sensing devices at locations in the second semiconductor device; a plurality of through silicon vias extending between the first semiconductor device and the second semiconductor device to electrically connect the first semiconductor device to the second semiconductor device; and a testing program to cause the plurality of temperature sensing devices in the second semiconductor device to sense the temperature at a plurality of corresponding locations in the first semiconductor device such that a predetermined rise in temperature at one location of the plurality of temperature sensing devices in the second semiconductor device is indicative of a defect in the corresponding location in the first semiconductor device. Methods of monitoring defects are also disclosed.

Abstract: An example apparatus is for use in calibration of a test system having multiple channels and a socket for receiving a device under test. The example apparatus includes a device interface that is connectable to the socket; and multiple circuit paths, where each circuit path is connectable, through the device interface, to a corresponding channel of the test system and being connected to a common node. The example apparatus is configured so that, during calibration, signals either (i) each pass from the test system, through one of the multiple circuit paths, and back to the test system through others of the multiple circuit paths, or (ii) each pass from the test system, through the others of the multiple circuit paths, and back to the test system through the one of the multiple circuit paths.

Abstract: A bulk acoustic wave resonator (BAWR) sensor is provided. The BAWR sensor includes a signal BAWR that measures a resonance frequency that is modified due to a reaction with a target material, a reference BAWR that measures a reference resonance frequency without reaction with an external environment, and a sensing unit that senses the target material, based on the modified resonance frequency and the reference resonance frequency.

Abstract: In some embodiments, a method includes selecting a first and a second predetermined number of points of graphical data; determining an initial distance between each of the first predetermined number of points, generating a fast approximate distance oracle comprising identifiers of points and oracle distances between at least one point and another point, determining a graphical distance for each of the second predetermined number of points relative to other points of the first and second predetermined number of points, calculating a potential error between the determined graphical distance and a topologic distance between each of the second predetermined number of points, approximating a correction for at least one of the second predetermined number of points, adjusting a position of the at least one of the second predetermined number of points, and displaying the at least one of the second predetermined number of points.

Abstract: This disclosure relates generally to devices, systems, and methods that include conductive lines configured to transmit electrical signals between a first electronic component and a second electronic component between which the conductive lines are coupled. The devices, systems, and methods further include a transmitter, configured to generate the electrical signals, the transmitter including a source impedance based, at least in part, on a resistive coupling between individual ones of the conductive lines, a source impedance matrix of the source impedance being substantially proportional to the characteristic impedance matrix of the plurality of conductive lines.

Abstract: The present invention relates to an apparatus for calibrating a power measuring system for power transformers. The general inventive concept involves the two reference measuring systems that are known from the prior art for the calibration of a current transformer, a voltage transformer and an evaluation device being integrated in a shared apparatus, according to the invention, for calibrating a power measuring system for power transformers, which apparatus is furthermore arranged on a container such that the apparatus can be moved by means of a trailer that holds the container for the purpose of in-situ calibration of the power measuring system of power transformers.

Abstract: Examples of the present invention include apparatus and methods for monitoring aging of an item. A solid-state structure is located within, adjacent to, or otherwise proximate the item, the solid-state structure including nanostructures. The electrical resistance and/or magnetization of the solid-state structure is determined to determine the degree of aging of the item. In representative examples, the solid-state structure includes nanostructures of a metal, such as a ferromagnetic metal, within a non-magnetic matrix, such as a semimetal, semiconductor, or insulator.

Abstract: Provided is a method for adapting the sensitivity of a sensor system, in particular of a capacitive sensor system, which provides a sensor signal, wherein a first lower threshold value is adapted, if the sensor signal fulfills a first switching threshold criterion, a first upper threshold value is adapted, if the sensor signal fulfills a second switching threshold criterion, and at least one switching threshold value is adapted such that the switching threshold value has a predetermined first distance from the first upper threshold value and/or a predetermined second distance from the first lower threshold value.

Abstract: The present disclosure relates generally to patient monitoring systems and, more particularly, to a resistance emulator for patient monitors. In an embodiment, a resistance emulator includes a first plug configured to couple with a medical monitor. The medical monitor is configured to receive a calibration resistance value of a medical device sensor from a coded resistor. The resistance emulator further includes a second plug configured to couple with a medical device sensor. The medical device sensor is configured without the coded resistor. The resistance emulator also includes emulation circuitry configured to provide an emulated signal representative of the calibration resistance value to the medical monitor.

Abstract: The embodiments herein are generally directed to using a current-mode CBC circuit to maintain a voltage bias setting at a receiver when performing capacitive sensing. To do so, the CBC circuit may compensate for the change in voltage at a receiver by providing a current at the input of the receiver. Instead of using a passive CBC capacitor for each receiver, the input device may use a single CBC capacitor and a plurality of current mirrors to source and sink the current required to correct the input voltage at a plurality of receivers. As a result, the current-mode CBC circuit includes only one passive capacitor (or bank of capacitors) and a plurality of current mirrors which may provide space and cost benefits relative to a CBC circuit that uses a passive capacitor (or bank of capacitors) for each receiver channel.

Abstract: An antenna system including at least one antenna connected to a captured signal processing receiver, an antenna protection radome; and a plurality of electro-optical probes distributed on or inside of the radome.

Abstract: A device, comprising an output terminal; an output circuit coupled to the output terminal and having an adjustable impedance; and an impedance adjustment circuit adjusting stepwise the adjustable impedance so as to head toward a first reference impedance. The impedance adjustment circuit changes the adjustable impedance by a first amount when the adjustable impedance is within a first range, and changes the adjustable impedance by a second amount when the adjustable impedance is out of the first range. The first amount is smaller than the second amount.

Abstract: According to one embodiment, a calibration assembly includes an outer layer having at least one calibration trench extending along a y-axis, and an encapsulation layer within the calibration trench. The encapsulation layer has a plurality of nanoparticles spaced apart along said y-axis of said at least one calibration trench. Each of said plurality of nanoparticles are provided at known y-axis locations in said calibration trench, and each of the plurality of nanoparticles have a known magnetic property.

Abstract: Signal measuring systems, and measurement methods are disclosed.

Abstract: When the excitation frequency of a touch panel and the frequency of external noise match or are close, noise cannot be removed by a bandpass filter. In addition, when a touch detection operating period is limited to a short period such as the no addressing period, the signal-to-noise ratio (S/N) decreases because frequency separation decreases and the noise removal effect by averaging is degraded. An electronic device of the present invention includes a sensor system (101), an excitation generator (102) that generates an intermittent sinusoidal signal and applies this signal to the sensor system, and a demodulator (105) that demodulates the amplitude modulated signal that is the output of the sensor system.

Abstract: Method and system for measuring the resistance of a resistive structure having at least three nodes. A first calibration signal is determined by measuring a voltage at an output of the resistance structure when no calibration current is injected into a third node between the first and second nodes of the structure. A calibration current is then injected into the third node and a second calibration signal is determined. The absolute value of the difference between the first calibration signal and the second calibration signal is determined, the absolute value being proportional to a product of the resistance of the resistive structure and the calibration current.

Abstract: By powering an electronic component operating in an ultra-low power mode from a pre-charged measuring capacitor and measuring the time to discharge the capacitor to a trip voltage level, measurement data can be obtained. In some implementations, the capacitance of the capacitor can be obtained by adding a known current to the unknown current drawn from the capacitor and calculating the capacitance using a mathematical formula.

Abstract: An auto-calibrated proximity sensor used with a protected item in a retail display security system includes a metalized surface that cooperatively interacts with a printed circuit board to form a capacitive cell. A microcontroller senses changes in the frequency of the capacitive circuit if the orientation of the metalized surface changes with respect to the printed circuit board.

Abstract: An apparatus and a method for automated testing of electrostatic discharge of a Device Under Test (DUT) are provided. In the apparatus and the method, an electrostatic pulse is applied to the DUT, a malfunction type is detected from the DUT, and a control command is transmitted to the DUT to return a test mode of the DUT to a normal mode according to the detected malfunction type.

Abstract: A method for measuring s-parameters of an N-port device under test (DUT), using an N-port test fixture and a network analyzer. The method includes: measuring calibration errors of the N-port test fixture using a reduced set of N/2 calibration standards; measuring calibration errors due to the network analyzer by calibrating only the network analyzer using analyzer-only calibration standards; isolating test fixture s-parameters errors using results of the analyzer-only calibration standards measurement and the N-port test fixture calibration standard measurement; measuring the s-parameters errors of the DUT; and correcting the s-parameters errors of the DUT corresponding to the isolated test fixture s-parameters errors and the calibration errors of the network analyzer.

Abstract: A sensing device comprises a microwave sensor (1) configured to emit microwave radiation and to receive microwave radiation reflected by a moving body in the field of detection of the microwave sensor and a wireless data transmitter (4) configured to transmit data to a remote receiver. A main power supply provides electrical power at a first voltage to the sensing device. A first regulator 6 provided between the main power supply and the microwave sensor (1) provides a sensor power supply to the microwave sensor (1) at a voltage below the voltage of the main power supply. The wireless data transmitter (4) is powered from the main power supply via a transmitter power supply connection arranged in parallel with the first regulator (6). The microwave sensor (1) is provided on a first circuit board and the wireless data transmitter (4) is provided on a second circuit board, with the second circuit board overlying the first circuit board and spaced therefrom.

Abstract: An analyte test sensor for use in measuring the concentration of a particular analyte in a test sample includes a non-conductive substrate, a reference electrode deposited on the substrate, a working electrode deposited on the substrate and a compensation electrode deposited on the substrate. The compensation electrode is provided with a resistive ladder and is designed to correct for test result inaccuracies which are the result of variances in the manufacturing of the test sensor. Specifically, in one embodiment, the compensation electrode corrects for test result inaccuracies in an analog manner by shunting a portion of the working current away from working electrode. In another embodiment, the compensation electrode corrects for test result inaccuracies in a digital manner by providing a calibration code which is proportional its resistance value. A batch of analyte test sensors are preferably manufactured in the following manner. An initial batch of the test sensors is constructed.

Abstract: A circuit for calibrating a current transducer may include a first resistor and a second resistor, such that the first resistor and the second resistor may adjust a measurement output by a current sensor. The first resistor and the second resistor may adjust the measurement output by adjusting a phase of the measurement output and/or adjusting a sensitivity of the measurement output. The circuit may also include a first terminal and a second terminal, such that the first terminal may be electrically coupled to the first resistor and the second resistor. Here, the first terminal may receive the measurement output by the current sensor, and the second terminal may output the adjusted measurement output.

Abstract: Systems, devices and methods for sensing moisture within an electronic device are disclosed. A device may include a housing and a display defining an exterior of an electronic device and an interior of the electronic device. Further, the device may include an integrated circuit (IC) within the electronic device and a control element within the electronic device. The device may also include a moisture sensor such as an inductive sensor, a capacitance sensor, or both. The moisture sensor, which may be part of the IC, together with the control element may sense moisture within the electronic device.

Abstract: An electronic system having a high speed signaling bus requiring training (calibration) of a calibrated item in a driver circuitry or a receiver circuitry for reliable operation. At manufacturing or in a secure location, secure calibration coefficients are determined for the electronic system and are stored in a non-volatile storage. During operation, the high speed signaling bus may be re-calibrated, resulting in a new currently active calibration coefficient for the calibrated item. A coefficient watchdog checks a new coefficient value selected by the re-calibration at present environmental conditions such as voltage and temperature against the secure calibration coefficients. If the new calibration coefficient value is the same as a calibration coefficient value in an acceptably close secure calibration coefficient, the new calibration coefficient is accepted; if not, a potentially probed warning is created by the coefficient watchdog.

Abstract: A biomedical electrode structure is presented. The electrode structure comprises a contact member having a tissue interfacing face for contacting a tissue surface, and an opposite electrical coupling face; at least a first electrically conductive surface disposed within said tissue interfacing face, and being configured to electrically couple to a portion of the contacted tissue; and at least two electrical connectors mounted in a spaced apart relationship on said electrical coupling face and electrically coupled to different regions of said electrically conductive surface for allowing measurement of at least one electrical property of at least a portion of said at least first electrically conductive surface residing therebetween.

Abstract: Embodiments related to electrically characterizing a semiconductor device are provided. In one example, a method for characterizing a pin of a semiconductor device is provided, the method comprising providing a test pattern to the semiconductor device. Further, the method includes adjusting a selected electrical state of a pin of the semiconductor device and measuring a value for a dependent electrical state of the pin responsive to the selected electrical state. The example method also includes generating an electrical characterization for the pin by correlating the dependent electrical state with the selected electrical state and outputting the electrical characterization for display.

Abstract: A method and a device for canceling an offset voltage in an output of a comparator circuit include applying a signal to a first input of the comparator as a function of an initial tap point in a resistor ladder. While the signal is applied to the first input, a nominal voltage is applied to a second input of the comparator, and then an output of the comparator is analyzed. The signal to the first input is changed in response to the analyzing, by accessing a different tap point in the resistor ladder.