Abstract: A method for measuring conditions in a pipe includes measuring a chosen electrical characteristic in the flow, measuring the density in essentially the same flow volume, and calculating a curve representing the relationship between the density and the electrical characteristic. The method further includes at least one of calculating the derivative of the curve, indicating the water to liquid ratio of the flow volume, and extrapolating the curve to the value representing density at no liquid, the value of the electric characteristic representing the characteristic of a possible deposit layer on the inner surface of the pipe.

Abstract: A test method for a semiconductor device includes determining a contact failure between a first semiconductor chip and a second semiconductor chip during assembly of a semiconductor package including the first semiconductor chip and the second semiconductor chip, using a test circuit embedded in the first semiconductor chip, and after the assembly of the semiconductor package, determining whether the semiconductor package is defective by using the test circuit.

Abstract: A system and method for online detection of a droplet deposition amount of a spraying operation of a plant protection machine, wherein the system is composed of parts such as a data processing module, a data collector, a temperature sensor, a spatial interdigital capacitive sensor, a communication module, a positioning module, a power supply module, and a control terminal, and wherein the spatial interdigital capacitive sensor is capable of outputting voltage data directly proportional to the droplet deposition amount; and provides a specific method and steps for detecting parameters of the droplet deposition amount, comprising: by the data processing module of the system for the online detection of the droplet deposition amount, acquiring the voltage data output from the spatial interdigital capacitive sensor via the data collector and processing the voltage data, and transmitting the processed voltage data to the control terminal via the communication module.

Abstract: A manufacturing method of a semi-finished product that includes a plurality of contact for a testing head of electronic devices comprises the steps of: providing a substrate made of a conductive material; and defining each contact probe by removing material from the substrate, each contact probes being anchored to the substrate by at least one bridge of material. The step of defining the contact probes includes a step of laser cutting, in correspondence with a contour of the contact probes and of that at least one bridge of material.

Abstract: First and second measurement probes come into contact with first and second electrode pads, respectively, and third and fourth measurement probes come into contact with the first and second electrode pads, respectively. A current flows in a current path including the first and second electrode pads and a plurality of lines through the first and second measurement probes. A value of the current in the current path is measured, and a value of a voltage between the third and fourth measurement probes is measured. Conductivity between the first and second electrode pads is inspected based on the measured value of the current and the measured value of the voltage.

Abstract: A system, method, and circuit to monitor a compliance voltage in an implantable stimulator device. An implantable medical device with a compliance voltage detector to monitor the voltage used by an output current source/sink circuit to ensure proper circuit performance while limiting power use.

Abstract: Disclosed herein are contact pads for use with integrated circuit (IC) packages. In some embodiments, a contact pad disclosed herein may be disposed on a substrate of an IC package, and may include a metal projection portion and a metal recess portion. Each of the metal projection portion and the metal recess portion may have a solder contact surface. The solder contact surface of the metal recess portion may be spaced away from the solder contact surface of the metal projection portion. Related devices and techniques are also disclosed herein, and other embodiments may be claimed.

Abstract: In some embodiments in accordance with the present disclosure, a semiconductor device having a semiconductor substrate is provided. A metal structure is disposed over the semiconductor substrate, and a post-passivation interconnect (PPI) is disposed over the metal structure. In addition, the upper surface of the PPI is configured to receive a bump thereon. In certain embodiments, the upper surface of the PPI for receiving the bump is substantially flat. A positioning member is formed over the PPI and configured to accommodate the bump. In some embodiments, the positioning member is configured to limit bump movement after the bump is disposed over the PPI so as to retain the bump at a predetermined position.

Abstract: Disclosed herein are contact pads for use with integrated circuit (IC) packages. In some embodiments, a contact pad disclosed herein may be disposed on a substrate of an IC package, and may include a metal projection portion and a metal recess portion. Each of the metal projection portion and the metal recess portion may have a solder contact surface. The solder contact surface of the metal recess portion may be spaced away from the solder contact surface of the metal projection portion. Related devices and techniques are also disclosed herein, and other embodiments may be claimed.

Abstract: The present invention relates to a method of manufacturing a probe comprising a cantilever with a conduit. According to the invention, an etchant window is provided in a layer covering an elongated sacrificial conduit core that is to form the conduit. This allows for an etching process where the elongated sacrificial conduit core is etched away before all material of a substrate is etched away, the remaining material of the substrate material making the probe stronger without being in the way during use of the probe.

Abstract: In a conductive conductivity sensor having a probe, which is immersible in a measured medium and which comprises at least two electrodes made of a first, electrically conductive material and at least one probe body made of a second, electrically non-conductive material, the electrodes are at least partially embedded in the probe body and insulated from one another by the probe body, wherein the electrodes and the probe body are embodied as a composite workpiece. There especially exists between the first material and the second material in at least one section of a material transition between the first and the second material a secure bond, especially a bond based on intermolecular interactions or chemical bonds.

Abstract: A method for automatically measuring a property of a fluid associated with a drilling application, including obtaining a sample of the fluid, wherein the sample of the fluid is obtained by directing the fluid through an electrode probe assembly comprising an electrode probe and depositing the fluid in a probe gap between electrodes of the electrode probe, ramping up a voltage applied to the electrodes of the electrode probe until a threshold current is obtained, recording the breakdown voltage at the threshold current value, and using the breakdown voltage to compute the property of the sample of the fluid.

Abstract: According to an embodiment, a microprobe includes a base and a lever. The base includes a first electrode provided on a surface thereof. The lever is supported by the base and includes a second electrode and a third electrode. The second electrode is connected between the first electrode and the third electrode. The third electrode is formed to project from the second electrode in a first direction in a main surface of the lever. A width of the third electrode in a second direction perpendicular to the first direction in the main surface defines a width of an electrical contact area when a scanning operation is performed by use of the third electrode in a third direction perpendicular to the main surface.

Abstract: A positioning device includes a positioning mechanism, a contacting mechanism located in the positioning mechanism, and a connecting mechanism located adjacent to an end of the positioning mechanism. The positioning mechanism includes a receiving member, a positioning member received in the receiving member, and a cover rotatable connected to the receiving member. The receiving member defines two sliding grooves. The cover defines two driving grooves corresponding to the two sliding grooves, each of the two driving grooves forms a driving surface, and the sliding block includes a slanted surface corresponding to the driving surface. When the cover is rotated to cover the receiving member, the driving surface resists with the slanted surface to drive the sliding block to move towards the positioning groove until the first contacting member contacts one testing point of the camera module.

Abstract: A testing device for testing resistance value includes a base, an operation pole, a sliding device, and a housing for enclosing the base. The base defines a hook receiving slot. A plurality of contact tabs is formed inside the hook receiving slot for contacting pins of the expansion card. A plurality of conductive tabs is formed on the base for being electrically coupled to the contact tabs. A ground terminal is electrically coupled to one of the conductive tabs coupling to the ground pins. The sliding device includes a resilient tab. The resilient tab includes a first end contacting one of the conductive tabs and a second end. The housing includes a connection portion for contacting the second end of the resilient tab and a test terminal electrically coupled to the connection portion.

Abstract: A contact structure for inspection that is installed on a bottom surface of a circuit board includes a ground conductor that is grounded; an elastic contact member that is brought into contact with an inspection target object; and a conductive line that electrically connects the circuit board and the elastic contact member. Here, the elastic contact member may be provided on a bottom surface of the ground conductor that is grounded. The elastic contact member may include an insulating layer, a wiring layer, a contactor and an elastic body provided at a position corresponding to the contactor. The elastic body provides the elastic contact member with elasticity when the contactor is brought into contact with an electrode. The elastic contact member is provided in parallel with the ground conductor. The wiring layer and the ground conductor form a microstrip line.

Abstract: An apparatus and method of testing electrical impedance of a multiplicity of regions of a photovoltaic surface includes providing a multi-tipped impedance sensor with a multiplicity of spaced apart impedance probes separated by an insulating material, wherein each impedance probe includes a first end adapted for contact with a photovoltaic surface and a second end in operable communication with an impedance measuring device. The multi-tipped impedance sensor is used to contact the photovoltaic surface and electrical impedance of the photovoltaic material is measured between individual first ends of the probes to characterize the quality of the photovoltaic surface.

Abstract: An analyte sensor apparatus and a corresponding fluid medium, the analyte sensor apparatus comprising a sensing element, the external surface of which comprises a membrane to inhibit exposure of the sensing element; the corresponding fluid medium comprising a receptor species and an activatable species, the receptor species for interacting with an analyte to activate the activatable species, activation of the activated species causing increased porosity of the membrane of an in-contact analyte sensor apparatus to correspondingly increase exposure of the sensing element to allow for production of a detectable electrical signal which can be used to sense the presence of the analyte.

Abstract: A conductive conductivity sensor, comprising: a probe immersible in a measured medium. The probe has an inner space, which is connected to an environment of the probe via at least one opening leading out from the inner space and in which are arranged two electrodes, which are supplied with an alternating voltage during measurement operation and which have inner surfaces facing into the inner space and outwardly facing outer surfaces covered by insulation, wherein the inner surfaces have edge surfaces adjoining the openings. Measuring characteristics of the conductivity sensor have a smallest possible dependence on objects arranged in the vicinity of the conductivity sensor. At least the edge surfaces adjoining one of the openings have a surface geometry directing thereon beginning or ending, electric field lines in a direction facing away from such opening and into the inner space.

Abstract: The embodiments described above provide mechanisms for bump resistivity measurement. By using designated bumps on one or more corners of dies, the resistivity of bumps may be measured without damaging devices and without a customized probing card. In addition, bump resistivity may be collected across the entire wafer. The collected resistivity data may be used to monitor the stability and/or health of processes used to form bumps and their underlying layers.

Abstract: Provided are probes featuring multiple electrodes, which probes have diameters in the nanometer range and may be inserted into cells or other subjects so as to monitor an electrical characteristic of the subject. The probes may also include a conductive coating on at least one probe element to improve the probes' performance. The probes may also be used to inject a fluid or other agent into the subject and simultaneously monitor changes in the subject's electrical characteristics in response to the injection. Related methods of fabricating and of using the inventive probes are also provided.

Abstract: A device for use with a conduit having a first conduit end and a conduit second end, into which conduit a cable can be installed using a flow of air into the first conduit end, the device being suitable for confirming that the air is flowing out from the second conduit end. In an embodiment, the device includes a housing, means to enable connection of the device to the second conduit end, a detector arranged to detect an electrical property change, and an actuator for causing an electrical property change detectable by the detector, wherein in use, the air flowing into the device causes the detector and the actuator to move relative to each other, causing an electrical property change detectable by the detector.

Abstract: Method and device for measuring the content of a fluid flow, the fluid containing a combination of at least two of gas, oil and/or water. The method comprising the steps of:—repeatedly measuring the electrical properties of a cross section of the fluid and detecting time sequences identified by low gas content, especially characterized in that a gas bubble is not present,—in said periods of low gas content measuring the density of the fluid in the flow, wherein the density measurements are performed in at least one period of low gas content and the a fluid density is calculated based on the measured densities over said period or periods.

Abstract: A positioning device includes a positioning mechanism, a contacting mechanism located in the positioning mechanism, and a connecting mechanism located adjacent to an end of the positioning mechanism. The positioning mechanism includes a receiving member, a positioning member received in the receiving member, and a cover rotatable connected to the receiving member. The receiving member defines two sliding grooves. The cover defines two driving grooves corresponding to the two sliding grooves, each of the two driving grooves forms a driving surface, and the sliding block includes a slanted surface corresponding to the driving surface. When the cover is rotated to cover the receiving member, the driving surface resists with the slanted surface to drive the sliding block to move towards the positioning groove until the first contacting member contacts one testing point of the camera module.

Abstract: An integrated circuit chip includes a mainline function logic path communicatively connected to a first input/output (I/O) pin, a test logic path communicatively connected to the first I/O pin, a latch disposed between the communicative connection between the test logic function path and the first I/O pin, a second I/O pin communicatively connected to the latch, the second I/O pin operative to send a signal operative to change a state of the latch.

Abstract: A pH-meter capable of measuring conductivity and dissolved oxygen at the same time is composed of a gauge and three probes. Three power sources and three measuring circuits are mounted to the gauge. The detectors of the probes include a pH detector, a conductivity detector and a dissolved oxygen detector. Each of the probes is independently connected with the gauge via a transmission cable to be independently supplied with electricity and the signals of two probes are independently transmitted by electric insulation. Thus, the detecting elements can measure the pH value, conductivity, and dissolved oxygen at the same time with interference with one another.

Abstract: A conductive conductivity sensor, comprising: a probe immersible in a measured medium. The probe has an inner space, which is connected to an environment of the probe via at least one opening leading out from the inner space and in which are arranged two electrodes, which are supplied with an alternating voltage during measurement operation and which have inner surfaces facing into the inner space and outwardly facing outer surfaces covered by insulation, wherein the inner surfaces have edge surfaces adjoining the openings. Measuring characteristics of the conductivity sensor have a smallest possible dependence on objects arranged in the vicinity of the conductivity sensor. At least the edge surfaces adjoining one of the openings have a surface geometry directing thereon beginning or ending, electric field lines in a direction facing away from such opening and into the inner space.

Abstract: An electronic salt meter including a sensor rod, salt meter body and receiving components to measure a temperature and salinity. The electronic salt meter includes a first and sensor electrode and a temperature sensor to detect a temperature of the measurement object. A measurement monitoring unit detects whether the first and second sensor electrodes are electrically connected to each other. A salinity measurement unit applies an AC power to the first and second sensor electrodes to measure salinity of the measurement object. A temperature measurement unit applies a power to the temperature sensor to measure the temperature of the measurement object. A thermal equilibrium detection unit stores the temperature value previously measured, and when the temperature variation is less than a predetermined threshold, it is determined as a thermal equilibrium state. A room-temperature salinity conversion unit converts the salinity value into a salinity value at room temperature.

Abstract: The invention relates to a moisture sensor which comprises a receiving area on its surface for a moisture film, the layer thickness of which is dependent on the relative humidity in the surrounding of the receiving area. The moisture sensor has a signal source which is connected to at least one control electrode at at least one infeed, the electrode abutting the receiving area, for providing a control voltage to the moisture film. The moisture sensor comprises at least one potential sensor which has at least one sensor area, under the receiving area, which is spaced apart from the at least one infeed. The sensor area is electrically insulated from the receiving area by an insulation layer, located between the sensor area and the receiving area, in such a way that an electrical potential can be capacitively detected by means of the potential sensor, the potential being dependent on the layer thickness of the moisture film and the control voltage.

Abstract: A fall of potential method of determining earth ground resistance which utilizes an earth ground tester and eliminates the need for utilizing removable ground stakes. Rather than utilizing a “far stake” the method provides connection of the earth ground tester to the telephone wires. Rather than utilizing a “near stake” the method provides for connection of the earth ground tester to the cable shield.

Abstract: An apparatus and method of testing electrical impedance of a multiplicity of regions of a photovoltaic surface includes providing a multi-tipped impedance sensor with a multiplicity of spaced apart impedance probes separated by an insulating material, wherein each impedance probe includes a first end adapted for contact with a photovoltaic surface and a second end in operable communication with an impedance measuring device. The multi-tipped impedance sensor is used to contact the photovoltaic surface and electrical impedance of the photovoltaic material is measured between individual first ends of the probes to characterize the quality of the photovoltaic surface.

Abstract: A hotplate chemical trace detector comprising a heatable conducting plate with a heater element having a predetermined temperature-power characteristic. A balancing circuit comprises an adjustable resistor for tuning the heater element to a predefined resistor value. A processor is provided for adjusting the adjustable resistor so as to provide a stabilized temperature in said heatable conducting plate and a detection circuit is provided for detecting a change of resistance in the heatable conducting plate in accordance with the presence of a chemical trace reacting in the presence of the conducting plate. According to the invention a test circuit is provided for measuring a dissipated power in the heater element and for calculating a real temperature from the dissipated power in the heater element based on the predetermined temperature-power characteristic.

Abstract: The embodiments described above provide mechanisms for bump resistivity measurement. By using designated bumps on one or more corners of dies, the resistivity of bumps may be measured without damaging devices and without a customized probing card. In addition, bump resistivity may be collected across the entire wafer. The collected resistivity data may be used to monitor the stability and/or health of processes used to form bumps and their underlying layers.

Abstract: A two-terminal temperature sensor connects a first end of thermistor or other thermometer device to a first electrical terminal via an inner compression coil. A second electrical terminal is connected to a second end of the thermistor via an outer compression coil and a formed conductor. The inner compression coil and thermistor are positioned within the formed conductor. The inner compression coil and thermistor are prevented from contact with the formed conductor by an inner insulating tube. The first and second electrical contacts are mounted in a molded terminal assembly that insulates the electrical contacts from one another. The entire assembly is housed within a housing that is electrically isolated from the formed conductor and outer compression coil via an outer insulating tube and an insulating disk.

Abstract: A conductivity measuring apparatus includes a probe base having a pair of electrodes disposed on respective opposite surfaces of a portion of the probe base. Observing and grasping probes are supported by the probe base in a cantilever state and are arranged adjancent to and spaced apart from one another by a predetermined distance. The grasping probe has a pair of electrodes disposed on respective opposite surfaces of a portion of the grasping probe confronting the portion of the probe base. A voltage apparatus applies a voltage between the pairs of electrodes on the probe base and the grasping probe to adjust the predetermined distance between the grasping and observing probes. A movement mechanism moves a sample base and the observing and grasping probes relative to each other to bring conductive tips of the observing and grasping probes into contact with respective contact points on a sample supported on the sample base.

Abstract: A system and a method for the transmission of signals representative of an event include a first low frequency clock and a low frequency counter for generating a first delay, and a second high frequency clock and a high frequency counter for generating a second delay. The system further includes a transmitter for transmitting the representative signals after a delay from the event made up by the sum of the first and the second delay. The second delay can be generated also by an analog device including for example a capacitor, and devices for charging the capacitor up to the reaching of a preset voltage at its ends. A wireless transmission system according to the invention is utilized in a checking system with a contact detecting probe, for transmitting a signal representative of contact with the piece to be checked.

Abstract: In a conductive conductivity sensor having a probe, which is immersible in a measured medium and which comprises at least two electrodes made of a first, electrically conductive material and at least one probe body made of a second, electrically non-conductive material, the electrodes are at least partially embedded in the probe body and insulated from one another by the probe body, wherein the electrodes and the probe body are embodied as a composite workpiece. There especially exists between the first material and the second material in at least one section of a material transition between the first and the second material a secure bond, especially a bond based on intermolecular interactions or chemical bonds.

Abstract: A method is described for controlling the soot deposition on sensors. A sensor element is provided, which includes a first electrode and a second electrode. Different measuring voltages U1 and U2 can be applied to the sensor element. During a first time period t1, the sensor element is operated at a higher voltage U1 until a triggering threshold AP of the sensor element is exceeded, while it is operated at a voltage U2, which is different from higher voltage U1, U2 being lower than voltage U1, during a second time period t2.

Abstract: Probes are electrically connected to a surface of a tunnel junction film stack comprising a free layer, a tunnel barrier, and a pinned layer. Resistances are determined for a variety of probe spacings and for a number of magnetizations of one of the layers of the stack. The probe spacings are a distance from a length scale, which is related to the Resistance-Area (RA) product of the tunnel junction film stack. Spacings from as small as possible to about 40 times the length scale are used. Beneficially, the smallest spacing between probes used during a resistance measurement is under 100 microns. A measured in-plane MagnetoResistance (MR) curve is determined from the “high” and “low” resistances that occur at the two magnetizations of this layer. The RA product, resistances per square of the free and pinned layers, and perpendicular MR are determined through curve fitting.

Abstract: An electrical specific resistivity probing robot is directed to automatically measuring a three-dimensional electrical specific resistivity structure of an underground shallow region by installing a plurality of probing electrodes at regular intervals along a robot-moving caterpillar to measure difference of potentials of the electrodes at a ground plane. The electrical specific resistivity probing robot includes a frame, a driving member installed under the frame, a pair of insulating caterpillars installed to both sides of a lower portion of the frame and driven by the driving member, a plurality of probing electrodes installed along track circumferences of the caterpillars at regular intervals, a slip ring electrically slip-connected to the probing electrodes one by one, and a cable electrically connected to the slip ring.

Abstract: An apparatus for checking insulation of a cell module assembly composed of a plurality of pouch cells includes a first probing unit electrically contacted to an electrode of the cell module assembly; a second probing unit electrically contacted to aluminum films of selected ones of the pouch cells in the cell module assembly; and a measuring unit for measuring an insulation resistance between the first probing unit and the second probing unit. This apparatus may measure insulation resistances of a plurality of pouch cells of the cell module assembly at once, thereby ensuring faster insulation checking.

Abstract: In a first step, two conductive plates such as two zinc galvanized (electroplated) steel plates with films formed on surfaces thereof, are prepared; a flexible conductive material is held between these two zinc galvanized (electroplated) steel plates. A spacer is also held between the two zinc galvanized (electroplated) steel plates to regulate the space therebetween and a measurement object such as a conductive cloth is held between the flexible conductive material and at least one of the zinc galvanized (electroplated) steel plates. In a second step, the electric resistance between the two zinc galvanized (electroplated) steel plates is measured while the flexible conductive material is held together with the measurement object between the two conductive plates.

Abstract: Provided are probes featuring multiple electrodes, which probes have diameters in the nanometer range and may be inserted into cells or other subjects so as to monitor an electrical characteristic of the subject. The probes may also include a conductive coating on at least one probe element to improve the probes' performance. The probes may also be used to inject a fluid or other agent into the subject and simultaneously monitor changes in the subject's electrical characteristics in response to the injection. Related methods of fabricating and of using the inventive probes are also provided.

Abstract: The invention concerns a probe with at least two test prods, which are provided on a changing device connected to the probe and which can be alternately connected to an electric waveguide running inside the probe.

Abstract: Disclosed is an arrangement for quickly measuring the phase distribution or the component distribution in a flow cross section for substance mixtures also of a non-conducting type by measuring the complex electrical admittance. Said arrangement essentially features the following: at least one sine wave generator (5) which is mounted upstream from the transmitter electrodes (3a) of the excitation level and applies an alternating voltage to the transmitter electrodes (3a); current-to-voltage converters (7) which are mounted downstream from the receiver electrodes (3b), amplify the alternating current that flows from at least one excitation electrode (3a) through the medium to the receiver electrodes (3b), and convert said alternating current into a voltage signal; filter groups (10, 11, 16) and vector voltmeters (8) which are mounted downstream from the current-to-voltage converters (7) and allow the complex signal ratio Ua/Ue to be metrologically detected.

Abstract: An electrical resistance measurement method and a component inspection process to which the electrical resistance measurement method is applied. In the first step, a measuring object, for example, one pair of zinc-plated steel plates on which surfaces films are formed is prepared. Then, an elastic electroconductive material is sandwiched by the pair of zinc-plated steel plates and a spacer which regulates a space between the zinc-plated steel plates. Next, in the second step, an electrical resistance is measured in a state in which the pair zinc-plated steel plates sandwich the elastic electroconductive material.

Abstract: Non-destructive method for detecting zones with non-conductive materials, such as materials that include glass fibers, in a part made of a conductive composite, such as a composite whose reinforcing fibers are carbon fibers, provided with an organic coating, that includes the following stages: a) providing a device for applying an electric potential on the surface of said part; b) determining the dielectric breakdown potential Pr corresponding to the thickness E of the coating; c) applying said dielectric breakdown potential Pr with said device to the part for the purpose of identifying those zones that have non-conductive materials when dielectric breakdown does not occur in them.

Abstract: This invention relates to a device of electrodes for measuring water content in foundry sand, an apparatus for measuring water content in foundry sand, and a method and an apparatus for supplying water to a sand mixer. When the prior art device for measuring water content in the foundry sand is disposed in it, the size or shape of the device of the electrodes is limited.

Abstract: An apparatus and technique for measuring the electrical capacitance between a conducting tip of a scanning probe microscope and a sample surface is described. A high frequency digital vector network analyzer is connected to the probe tip of the cantilever of an atomic force microscope, and data collection is coordinated by a digital computer using digital trigger signals between the AFM controller and the vector network analyzer. Methods for imaging tip-sample capacitance and spectroscopic measurements at a single point on the sample are described. A method for system calibration is described.

Abstract: A method for automatically measuring a property of a fluid associated with a drilling application, including obtaining a sample of the fluid, wherein the sample of the fluid is obtained by directing the fluid through an electrode probe assembly comprising an electrode probe and depositing the fluid in a probe gap between electrodes of the electrode probe, ramping up a voltage applied to the electrodes of the electrode probe until a threshold current is obtained, recording the breakdown voltage at the threshold current value, and using the breakdown voltage to compute the property of the sample of the fluid.