Lumped Type Parameters Patents (Class 324/649)
- With loss characteristic evaluation (Class 324/659)
- With variable electrode area (Class 324/660)
- With variable distance between capacitor electrodes (Class 324/661)
- Where a material or object forms part of the dielectric being measured (Class 324/663)
- With pulse signal processing circuit (Class 324/676)
- With comparison or difference circuit (Class 324/679)
- With frequency signal response, change or processing circuit (Class 324/681)
- With phase signal processing circuit (Class 324/683)
- With compensation means (Class 324/684)
- With a capacitive sensing means (Class 324/686)
- With living organism condition determination using conductivity effects (Class 324/692)
- With object or substance characteristic determination using conductivity effects (Class 324/693)
- With radiant energy effects (Class 324/702)
- With ratio determination (Class 324/704)
- With comparison or difference circuit (Class 324/705)
- With frequency response, change or processing circuit (Class 324/707)
- With phase signal processing circuit (Class 324/709)
- With pulse signal processing circuit (Class 324/710)
- With voltage or current signal evaluation (Class 324/713)
- With semiconductor or IC materials quality determination using conductivity effects (Class 324/719)
- With compensation means (Class 324/720)
- Device or apparatus determines conductivity effects (Class 324/722)