With Particular Sweep Circuit Patents (Class 324/76.27)
  • Patent number: 10579092
    Abstract: Aspects include a method for generating a signal in response to an event. The method includes receiving, from a clock signal generator, a clock signal, wherein the clock signal has a fixed clock period. The method further includes receiving an indication of a pulse and, responsive to receiving the indication of the pulse, generating an output comprising a high voltage having a starting time and an ending time. The starting time is a first time when the indication of the asynchronous event is received, and the ending time is a second time at one fixed clocked period from the starting time.
    Type: Grant
    Filed: November 1, 2016
    Date of Patent: March 3, 2020
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Daniel J. Friedman, Seongwon Kim, Bipin Rajendran
  • Patent number: 10554144
    Abstract: This invention relates to a method of controlling a Solid State Transformer (SST).
    Type: Grant
    Filed: April 5, 2019
    Date of Patent: February 4, 2020
    Assignee: Nanyang Technological University
    Inventors: Shuyu Cao, Brihadeeswara Sriram Vaisambhayana, Anshuman Tripathi, Fengjiao Cui, Abishek Sethupandi, Hossein Dehghani Tafti
  • Patent number: 9742452
    Abstract: A local oscillator outputs a local oscillator signal that provides an upper side heterodyne mode or a lower side heterodyne mode for a received RF signal. A first converter converts the received RF signal into an IF signal, based on the local oscillator signal output from the local oscillator. An FM detector subjects the IF signal produced by conversion to detection. A first measurement unit measures a signal intensity of the IF signal before the IF signal is input to the FM detector. A second measurement unit measures a squelch voltage of a signal detected by the FM detector. A controller that controls the local oscillator based on the signal intensity measured by the first measurement unit and the squelch voltage measured by the second measurement unit.
    Type: Grant
    Filed: November 11, 2015
    Date of Patent: August 22, 2017
    Assignee: JVC KENWOOD Corporation
    Inventor: Motohiro Ohkura
  • Patent number: 9678123
    Abstract: A radio frequency (RF) measurement system acting as a spectrum analyzer and a method of operating the same eliminates image signals from a detected input RF spectrum. The method includes determining at least three local oscillator (LO) frequencies; determining LO offsets between the LO frequencies; and mixing the LO frequencies with the input RF spectrum to provide corresponding intermediate frequency (IF) signals having an IF bandwidth, where at least one of the IF signals has the input RF spectrum mixed to a different portion of the IF bandwidth than at least one other of the IF signals, providing overlapping coverage. The method further includes acquiring ADC time records for the IF signals; performing Fourier transforms (FTs) on the ADC time records to provide IF spectrums; and detecting RF responses from the IF spectrums to determine an RF response trace corresponding to the input RF spectrum.
    Type: Grant
    Filed: May 12, 2015
    Date of Patent: June 13, 2017
    Assignee: Keysight Technologies, Inc.
    Inventors: Joel P. Dunsmore, Jean-Pierre Teyssier, Jad Faraj, James B. Kerr
  • Patent number: 9641146
    Abstract: Apparatus and methods are disclosed related to radio frequency (RF) power detection. One such apparatus includes a directional coupler, an RF switch, and an RF power detector. The RF switch can selectively change coupling between the directional coupler and the RF power detector. This can enable accurate power detection based on a ratio of power levels, without factory calibration or laser trimming.
    Type: Grant
    Filed: May 12, 2010
    Date of Patent: May 2, 2017
    Assignee: Analog Devices, Inc.
    Inventors: Eamon Nash, Dale Wilson, Carlos Calvo
  • Patent number: 9223300
    Abstract: A servo-parameter adjusting apparatus includes an acquiring unit that acquires an adjustment result measured by a servo control apparatus concerning position adjustment for a control target performed according to the servo parameters set in the servo control apparatus; a display control unit that simultaneously displays, on a display screen, a waveform corresponding to the acquired adjustment result, waveform values that are attributes concerning a part of the waveform, and servo parameters corresponding to the waveform; and a waveform-value changing unit that changes the displayed waveform values. When a waveform value is changed, the display control unit displays the changed waveform value on the display screen and displays, on the display screen, a waveform corresponding to the changed waveform value and a servo parameter corresponding to the changed waveform value.
    Type: Grant
    Filed: May 17, 2012
    Date of Patent: December 29, 2015
    Assignee: Mitsubishi Electric Corporation
    Inventor: Shinji Tanaka
  • Patent number: 9207269
    Abstract: A test and measurement instrument according to an embodiment of the present invention automatically detects excessive in-band but out-of-span energy and notifies the user of the condition.
    Type: Grant
    Filed: May 22, 2012
    Date of Patent: December 8, 2015
    Assignee: Tektronix, Inc.
    Inventors: John F. Turpin, Alfred K. Hillman, Jr.
  • Patent number: 8670077
    Abstract: A method of performing a service scan for available channels across a bandwidth of an input signal, the method comprising the steps of: acquiring a power spectrum of the input signal bandwidth; analyzing the power spectrum to identify a list of candidate channels, each candidate channel being identified by at least a center frequency; processing each of the candidate channels in a receiver unit to extract service information, if present, relating to the candidate channel; and storing the service information for the channel in a memory.
    Type: Grant
    Filed: September 14, 2010
    Date of Patent: March 11, 2014
    Assignee: NXP B.V.
    Inventors: Ewout Brandsma, Klaas de Waal, Konstantinos Doris, Erwin Janssen
  • Patent number: 8368382
    Abstract: A spectrum analyzer includes: two sets of measuring units having mixers, local oscillators, and IF sections for separately measuring frequency characteristics of two input signals; a trigger control section which generates a trigger signal for specifying a measurement start timing in each of the two sets of measuring units; a sweep control section which simultaneously sends an instruction to the two local oscillators when a trigger signal is inputted and performs a sweep control so that the two local oscillators output local oscillation signals of the same frequency at the same timing. This provides a frequency characteristics measuring device which can simplify the configuration for performing a measurement and reduce the undue effort required for the measurement.
    Type: Grant
    Filed: September 14, 2009
    Date of Patent: February 5, 2013
    Assignee: Advantest Corporation
    Inventors: Satoru Aoyama, Wataru Doi
  • Patent number: 7933559
    Abstract: A system for testing radio frequency (RF) communications of a device capable of such communications is provided. The system includes a chamber for isolating the device from RF interference, an antenna that is suitable for RF communications with the device wherein the antenna is capable of communications over a range of frequencies, the antenna being located within the chamber, and a digital communication link for providing non-RF communications with the device.
    Type: Grant
    Filed: November 9, 2007
    Date of Patent: April 26, 2011
    Assignee: Psion Teklogix Inc.
    Inventor: Zivota Zeke Stojcevic
  • Publication number: 20090160429
    Abstract: It is possible to provide a frequency component measuring device capable of narrowing the range of transmission frequency of a local oscillator, preventing degradation of the level measurement accuracy, and measuring the level of a modulation wave. The device includes: a local oscillator (24) capable of performing sweep in a predetermined frequency range; a mixer (22) for mixing a local oscillation signal outputted from the local oscillator (24) and a measured signal so as to subject the measured signal to a frequency conversion; a plurality of intermediate-frequency filters (44, 46) for extracting and outputting components of different intermediate frequencies from a signal outputted from the mixer (22); and an image removal processing section (66) for performing image removal according to the plurality of intermediate-frequency signals separately outputted from the intermediate-frequency filters (44, 46) corresponding to frequency sweep operations performed by the local oscillator (24) more than once.
    Type: Application
    Filed: April 26, 2007
    Publication date: June 25, 2009
    Applicant: ADVANTEST CORPORATION
    Inventor: Yohei Hirakoso
  • Patent number: 7519338
    Abstract: A measurement apparatus (1) for measuring peak pulses of a radio frequency input signal (RFinput) comprises mixing means for mixing the radio frequency input signal (RFinput) with a local oscillator signal (LO) in order to convert the radio frequency input signal (RFinput) directly to zero centre frequency thereby suppressing frequency components in a range close to zero frequency. Control means (20) control the frequency (fLO) of the local oscillator signal (LO) in a manner that a first measurement is performed in a first frequency range and that a second measurement is performed in a second frequency range shifted from the first frequency range.
    Type: Grant
    Filed: June 23, 2005
    Date of Patent: April 14, 2009
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventors: Reiner Hausdorf, Pavel Baros, Leo Brueckner
  • Publication number: 20090085555
    Abstract: A method for displaying signal analysis data comprises performing a plurality of sweep operations upon a received signal. With the sweep operations, spectral analysis is performed upon a first frequency band of the received signal. Displays are rendered of data generated from the spectral analysis in the first band and a second band different from the first band simultaneously, and the displays in the first band and the second bands are updated according to the sweep operations.
    Type: Application
    Filed: September 27, 2007
    Publication date: April 2, 2009
    Inventors: Mark D. Heerema, Corydon J. Boyan, Gordon Strachan
  • Patent number: 7501807
    Abstract: A spectrum analyzer is described which comprises a mixer for mixing the conjugate complex input signal v*(t) into a base band signal x(t), and a resolution filter for narrow-band filtering the base band signal. The resolution filter has a complex, discrete impulse response using a variation parameter k0 set to compensate for the frequency overshoot determined by the group delay of the resolution filter.
    Type: Grant
    Filed: November 11, 2004
    Date of Patent: March 10, 2009
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventor: Kurt Schmidt
  • Patent number: 7176670
    Abstract: An apparatus for analyzing a spectrum of an input signal (?(t)) having at least one line with a center frequency ({circumflex over (?)}x) at the center of the line includes: a mixer for zero-mixing the input signal (?(t)) to produce a base band signal (z(t)) by sweeping a local oscillator frequency (?s) generated by a local oscillator, a resolution filter for filtering the base band signal (z(t)) to produce a filtered base band signal (y(t) ), and an envelope reconstruction means for reconstructing the envelope (E(?)) of the spectrum of the input signal (?(t)) by using an estimated amplitude (?x) at an estimated center frequency ({circumflex over (?)}x) of each line of the input signal (?(t)). Further, only the real component (I) of the base band signal (z(t)) is filtered with the resolution filter and the imaginary component (Q) is generated from the filtered base band signal (y(t)) by performing a Hilbert transform in a Hilbert filter arranged downstream of the resolution filter.
    Type: Grant
    Filed: September 27, 2005
    Date of Patent: February 13, 2007
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventors: Reiner Hausdorf, Pavel Baros, Roman Striz
  • Patent number: 6891904
    Abstract: An analysis operation section uses a digital signal converted by an A/D converter, and performs frequency analysis for a modulation signal and modulation analysis for the modulation signal selected by a signal selection circuit in order to modulate/analyze a digital signal level of the modulation signal as an analysis object outputted from a level converter. A controller instructs the analysis operation section to execute an analysis instruction inputted via an operation input section, sends a selection instruction to the signal selection circuit in accordance with a modulation type of the inputted modulation signal, and sets a bandwidth of an RBW filter in accordance with the modulation type when the modulation signal having a band limited by the RBW filter is selected as the modulation signal inputted to the A/D converter, and the modulation analysis instruction is inputted.
    Type: Grant
    Filed: November 8, 2000
    Date of Patent: May 10, 2005
    Assignee: Anritsu Corporation
    Inventor: Tomohisa Okada
  • Publication number: 20040251888
    Abstract: An apparatus (1) for analyzing a spectrum of an input signal (x(t)) having at least one line with a center frequency (@s) comprises a mixer (2) for zero-mixing the input signal (x(t)) to produce a base band signal (z(t)) by sweeping a local oscillator frequency (@s) generated by a local oscillator (3) and a resolution filter (4) for filtering the base band signal (z(t)) to produce a filtered base band signal (y(t)). Detector means (7) detects the time of occurrence (ti), the duration (&Dgr;Ti) and the maximum value (y′i) of several halfwaves of the filtered base band signal (y(t)). Envelope reconstruction means (6) reconstructs the envelope (E(@)) of the spectrum of the input signal (x(t)) by using an estimated amplitude at an estimated center frequency of each line of the input signal (x(t)).
    Type: Application
    Filed: May 11, 2004
    Publication date: December 16, 2004
    Inventors: Pavel Baros, Leo Brueckner, Rudolf Reckziegel, Reiner Hausdorf
  • Patent number: 6763323
    Abstract: A spectrum analyzer comprises a mixer, which mixes complex conjugate input signal v*(t) into a base band signal x(t) and a resolution filter, which filters the base band signal for narrow band. In accordance with two aspects of the invention, the resolution filter has either a complex pulse response hused(t)=C1·e−C2·t2·e−j·C3·t2 or a real pulse response hused(t)=C4·e−C5·t2, in which C1, C2, C3, C4 and C5 are constants.
    Type: Grant
    Filed: February 5, 2002
    Date of Patent: July 13, 2004
    Assignee: Rohde & Schwarz GmbH & Co KG
    Inventor: Kurt Schmidt
  • Patent number: 6700366
    Abstract: Analyzing a swept spectrum signal formed by mixing a ramping local oscillator and an input signal to generate an IF signal, the resulting IF signal having a phase change with respect to the input signal, the phase change including a quadratic portion. For analysis, the IF signal is processed such that the quadratic component of the phase change is removed. The quadratic component of the phase change is removed with a complex filter.
    Type: Grant
    Filed: February 5, 2002
    Date of Patent: March 2, 2004
    Assignee: Anritsu Company
    Inventor: Derek Truesdale
  • Patent number: 6631341
    Abstract: In an RBW filter, a bandwidth is set so as to selectively pass a frequency component of only a desired signal bandwidth of the measured signals that have been frequency converted into a normalized intermediate frequency signal. A waveform detector detects a signal that passes through the RBW filter. An A/D converter samples the signal detected by the waveform detector at a predetermined sampling rate at which a Nyquist frequency is within the frequency bandwidth of the RBW filter, thereby converting the sampled signal into digital data. A data storage section stores the digital data converted by the A/D converter. A signal processing section re-samples the digital data stored in the data storage section so as to reproduce a bandwidth of the detection signal of the waveform detector, thereby generating arbitrary time data.
    Type: Grant
    Filed: February 20, 2001
    Date of Patent: October 7, 2003
    Assignee: Anritsu Corporation
    Inventors: Keiji Kameda, Toshiyuki Matsuda, Yuichiro Hashimoto
  • Patent number: 6504354
    Abstract: A sweep controller supplies a current to a YTO(YIG-Yttrium-Iron-Garnet Tuned Oscillator) from a current drive circuit in such a manner that frequencies corresponding to a first range in an oscillation frequency of the YTO designated as a desired frequency range for analysis with one sweep, and a second range designated as a frequency range higher than the first range for the analysis with the next one sweep are oscillated by the YTO. Moreover, the sweep controller outputs an instruction for increasing the current flowing through the YTO from the current drive circuit over a part of a period between an end of the first range and a start of the second range in order to shorten the period between the end of the first range and the start of the second range when it is detected that a difference between an end frequency of the first range and a start frequency of the second range is larger than a predetermined frequency difference.
    Type: Grant
    Filed: June 18, 2001
    Date of Patent: January 7, 2003
    Assignee: Anritsu Corporation
    Inventor: Yuichi Waida
  • Patent number: 6479977
    Abstract: A load pull circuit with a monitoring port which provides a constant VSWR throughout a phase variation in excess of 360°. The fundamental circuit comprises a fixed resistor of fifty ohms placed in series with an external fifty ohm load monitoring port resistor to ground. In parallel with the two series resistors, which total 100 ohms, is placed a 33.3 ohm resistor that is connected to ground through a series L-C circuit. The capacitance in the L-C circuit is adjustable and can be varied to cause the L-C circuit to change in net value from being inductive, to being resonant, and finally being capacitive. This causes the 33.3 ohm resistor to be connected to ground through an inductor, then through a short, and finally through a capacitor, making the load pull circuit present a load that vary through 360 degree in phase, while still remaining at a VSWR of 2:1. The inductor in the L-C circuit is a varactor, making the sweep through all 360° totally electronically controllable and simple to automate.
    Type: Grant
    Filed: November 3, 2000
    Date of Patent: November 12, 2002
    Inventor: Mikhail Mordkovich
  • Patent number: 6392397
    Abstract: A spectrum analyser that includes means (8) for converting, at each of a series of frequency settings, a received radio frequency signal into an intermediate frequency signal, each intermediate frequency signal being derivable from more than one nominal received radio frequency signal. The spectrum analyser carries out a frequency analysis (14) of each intermediate frequency signal to produce a power spectrum thereof and constructs a composite received radio frequency signal power spectrum corresponding to each intermediate frequency signal power spectrum. The composite radio frequency signal power spectrums are then operated on by the spectrum analyser to provide the actual power spectrum of the received radio frequency signal.
    Type: Grant
    Filed: March 16, 2000
    Date of Patent: May 21, 2002
    Assignee: IFR Limited
    Inventor: Neil Edwin Thomas
  • Patent number: 6377900
    Abstract: A measuring system for measuring a transfer function matrix of a system to be controlled by applying sine-wave excitations to a test object simultaneously by multiple number of vibrators. In the measuring system, when sine-wave signals for driving multiple number of vibrators are generated, phases between the sine-wave signals are shifted randomly, first, and then multiple number of vibrators are excited simultaneously under the generated sine-wave signals. Then, an auto-spectrum and a cross-spectrum for one calculation are calculated from spectral data on a vibration frequency obtained from an analysis of excitation signals and response signals acquired during the excitations.
    Type: Grant
    Filed: May 4, 1999
    Date of Patent: April 23, 2002
    Assignee: IMV Corporation
    Inventors: Kazuyoshi Ueno, Yoshikado Yamauchi
  • Patent number: 6335615
    Abstract: A mode selection method for signal analyzers having alternative swept and Fast Fourier Transform (FFT) modes of operation enables tradeoffs between measurement speed and dynamic range to be optimized in selecting between the alternative operating modes. The method includes setting the signal analyzer to either a manual state or an automatic state according to a first input to a user interface. When the manual state is set, the analyzer is operated in either the swept operating mode or the FFT operating mode according to a second input to the user interface. When the automatic measurement state is set, a third input to the user interface determines whether measurement speed or dynamic range is optimized. Measurement speed is optimized according to a first optimization scheme and dynamic range is optimized according to a second optimization scheme.
    Type: Grant
    Filed: March 24, 2000
    Date of Patent: January 1, 2002
    Assignee: Agilent Technologies, Inc.
    Inventor: Joseph M Gorin
  • Patent number: 6316928
    Abstract: A spectrum analyzer that incorporates a YTO (YIG tuned oscillator) as a sweep frequency local oscillator and a YTF (YIG tuned filter) as a frequency pre-selector for an incoming signal and improves a C/N (carrier to noise) ratio with low cost.
    Type: Grant
    Filed: March 9, 1999
    Date of Patent: November 13, 2001
    Assignee: Advantest Corp.
    Inventor: Kouji Miyauchi
  • Patent number: 6275020
    Abstract: There are provided a frequency analysis method permitting a frequency analysis to be performed at a high rate and a sweep type spectrum analyzer using such frequency analysis method.
    Type: Grant
    Filed: May 14, 1999
    Date of Patent: August 14, 2001
    Assignee: Advantest Corporation
    Inventor: Masao Nagano
  • Patent number: 6265861
    Abstract: A frequency spectrum analyzer having an improved carrier to noise ration for analyzing frequency spectrum of an input signal.
    Type: Grant
    Filed: January 13, 2000
    Date of Patent: July 24, 2001
    Assignee: Advantest Corp.
    Inventor: Hirobumi Musha
  • Patent number: 6233288
    Abstract: A spectrum analyzer having an improved local oscillator for use in a digital step sweep is capable of minimizing a dynamic spurious response which is inverse proportional to a unit step time in the step sweep. The local oscillator includes a random clock delay which provides a random clock to a direct digital synthesizer to incorporate random timings in a time length of the unit step time for sweeping the local oscillator. In another aspect, the local oscillator includes a sweep step number control which maximizes the number of steps in the step sweep to ultimately decrease the dynamic spurious response.
    Type: Grant
    Filed: April 3, 1998
    Date of Patent: May 15, 2001
    Assignee: Advantest Corp.
    Inventors: Hiroaki Takaoku, Takayoshi Fukui
  • Patent number: 6229316
    Abstract: A spectrum analyzer in which automatic setting of parameters such as band width is done by the analyzer without manual operator input and noise measurements are determined and displayed to the operator. This is accomplished by an input signal being supplied to a frequency mixer via an input variable attenuator. The frequency of the input signal is mixed with the frequency of a local signal from a frequency sweep generator. The mixed signal is then supplied to a band pass filter and the output of the filter is amplified by an amplifier. The frequency of the amplified output is mixed with the frequency of a local signal from a local oscillator by a frequency mixer. The intermediate frequency signal is taken out by a band pass filter and the output is detected by a detector. The detected output is converted into a digital signal by an A/D converter after passing through a low pass filter and the digital signal is stored in a buffer memory. A CPU sets an attenuation amount.
    Type: Grant
    Filed: September 3, 1996
    Date of Patent: May 8, 2001
    Assignee: Advantest Corporation
    Inventors: Takayoshi Fukui, Kouichi Yamashita, Takahiro Yamaguchi, Osamu Aoyama, Takashi Kosuge, Yoshiaki Miyamae, Toshiharu Kasahara, Hiroaki Takaoku
  • Patent number: 6191571
    Abstract: A measuring device and method use a spectrum analyzer. The spectrum analyzer comprises a display screen controlled by a processor on which a spectrum of an input signal is displayed in a frequency region on a half portion of the display screen and a noise level at a frequency associated with the input signal is displayed in a time region on another half portion of the display screen.
    Type: Grant
    Filed: February 11, 1999
    Date of Patent: February 20, 2001
    Assignee: Advantest Corporation
    Inventors: Takayoshi Fukui, Kouichi Yamashita, Takahiro Yamaguchi, Osamu Aoyama, Takashi Kosuge, Yoshiaki Miyamae, Toshiharu Kasahara, Hiroaki Takaoku