Light Beam Type (e.g., Mirror Galvanometer, Parallax-free Scale) Patents (Class 324/97)
  • Patent number: 10895755
    Abstract: A thin-plate-typed rotating module includes a rotating element, a driving unit and a base board. The rotating element is rotatable about a first axial direction and a second axial direction in a limited degree. The driving unit connects the rotating element for driving the rotating element to rotate about the first and second axial directions. The base board is furnished with a control module which is connected with the driving unit for controlling the driving unit to operate.
    Type: Grant
    Filed: October 29, 2018
    Date of Patent: January 19, 2021
    Inventors: Cheng Kai Yu, Chao Chang Hu, Chih Wei Weng
  • Patent number: 10877178
    Abstract: Disclosed in the present invention is a method for suppressing airborne transient electromagnetic in-band vibration noise, comprising: dividing the data after current turn-off into two segments according to whether the useful signal is attenuated to the system noise level: the segment A is the useful signal segment, and the segment B is the pure noise segment; limiting the bandwidth of the data of the segment B according to the frequency range of the in-band noise, and labeling the result as BL; training a neural network using the BL, utilizing the well trained neural network to predict the in-band vibration noise contained in the data of the segment A, and labeling the prediction result as PNA; and subtracting the PNA from the data of the segment A to suppress the in-band vibration noise contained in the data of the segment A.
    Type: Grant
    Filed: May 3, 2019
    Date of Patent: December 29, 2020
    Assignee: INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
    Inventors: Xin Wu, Guoqianq Xue, Qingyun Di
  • Patent number: 10126563
    Abstract: A thin-plate-typed rotating module includes a rotating element, a driving unit and a base board. The rotating element is rotatable about a first axial direction and a second axial direction in a limited degree. The driving unit connects the rotating element for driving the rotating element to rotate about the first and second axial directions. The base board is furnished with a control module which is connected with the driving unit for controlling the driving unit to operate.
    Type: Grant
    Filed: June 2, 2016
    Date of Patent: November 13, 2018
    Assignee: TDK Taiwan, Corp.
    Inventors: Cheng Kai Yu, Chao Chang Hu, Chih Wei Weng
  • Patent number: 10107846
    Abstract: A method and apparatus for generating high-order harmonics in a solid-state medium comprising integrated semiconductor devices and electronics. The high-order harmonics interact with and are modified by the internal electric field associated with the operation of the integrated semiconductor devices and electronics. Measurement of the high-order harmonics after modification by the internal electric fields amounts to high resolution (temporal and spatial) dynamic imaging of the internal electric fields associated with the integrated semiconductor devices and electronics.
    Type: Grant
    Filed: July 31, 2017
    Date of Patent: October 23, 2018
    Assignee: University of Ottawa
    Inventors: Giulio Vampa, Paul B. Corkum
  • Patent number: 10072991
    Abstract: A nanoparticle sensor apparatus includes a silicon-based nanoparticle having a centrosymmetric crystalline structure. A lanthanide atom embedded within the silicon-based nanoparticle provides light emission when the sensor apparatus undergoes pressure loading. This sensor apparatus may be encapsulated in a polymer matrix to form a nanoparticle sensor matrix apparatus which may be located on or in a structure. To measure the pressure on such a structure, a UV light source illuminates the sensor apparatus. An optical emission detector detects the intensity of light emitted from the sensor in response, while a processor correlates that intensity to the pressure loading.
    Type: Grant
    Filed: March 17, 2016
    Date of Patent: September 11, 2018
    Assignee: The United States of America as Represented by The Secretary of The Army
    Inventors: Munir H. Nayfeh, Charles P. Marsh, Ghassan K. Al-Chaar
  • Patent number: 9438968
    Abstract: An optical circuit switch, method, and apparatus are disclosed. The optical circuit switch may include a plurality of mirror elements, each mirror element uniquely associated with a port from a plurality of ports, each mirror element coupled to a dedicated electrode and configured to rotate in response to a voltage applied to the dedicated electrode. A command interpreter may receive a command defining a plurality of port-pairs to be connected via the optical circuit switch and determine a respective target voltage value to be applied to the dedicated electrode coupled to each of the mirror elements associated with each of the port-pairs. A transition manager may cause voltages applied to the dedicated electrodes coupled to the mirror elements associated with the port-pairs to concurrently transition from respective previous voltage values to the respective target voltage values.
    Type: Grant
    Filed: July 9, 2013
    Date of Patent: September 6, 2016
    Assignee: CALIENT Technologies, Inc.
    Inventors: Jitender Miglani, Mike Deacon, Vijayan Thattai
  • Patent number: 9390887
    Abstract: An electromagnetic wakefield detector placed in close proximity to a design trajectory of a non-relativistic charged particle beam produces an optical signal in response to passage of the charged particle beam without interrupting the charged particle beam. A photon detector receives the optical signal and produces a corresponding output. The wakefield detector may be based on the electro optic effect. Specifically, the detector may measure the effect of the charged particle beam a beam of radiation on the phase of radiation travelling parallel to the beam in a nearby electro optic waveguide. This abstract is provided to comply with rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.
    Type: Grant
    Filed: September 15, 2014
    Date of Patent: July 12, 2016
    Assignee: KLA-Tencor Corporation
    Inventors: Thomas Plettner, John Gerling
  • Patent number: 9083913
    Abstract: Provided is an image processing method wherein an edge is detected from an image to which a sharpening process is to be applied, and on the basis of a length of the edge which is present near a pixel to which the sharpening process is to be applied, the strength of the sharpening process to the pixel is determined.
    Type: Grant
    Filed: August 6, 2010
    Date of Patent: July 14, 2015
    Assignee: NEC CORPORATION
    Inventors: Masato Tsukada, Johji Tajima
  • Patent number: 9024616
    Abstract: A bi-directional current limiter may be configured to receive an AC signal and bi-directionally limit the loop current to a predetermined current value. A first and second zone may be configured in series with the AC signal and bi-directional current limiter. The first and second zone may include unidirectional current limiters to limit a unidirectional current that is proportionately less than the bi-directionally limited current. A first opto-coupler circuit (ISO1) may be configured to detect both high and low current states in the current loop circuit. Second and third opto-coupler circuits (ISO2 and ISO3) associated with the first and second zones may be configured to detect only high current states in the current loop circuit. The status of the first and second zones may then be determined by an analysis of the current level in the current loop circuit during two half cycles as determined by the various current limiters.
    Type: Grant
    Filed: November 29, 2012
    Date of Patent: May 5, 2015
    Assignee: Tyco Safety Products Canada Ltd.
    Inventors: Andrei Bucsa, Stephen D. W. Fosty
  • Publication number: 20150102802
    Abstract: An optical fiber current sensor includes a transmitter optical subassembly (TOSA) that is formed in a package of a linear polarizer that applies light from a light source to a sensor coil that is formed with an optical fiber by linearly polarizing, a polarization beam splitter that separates light that is reflected from the sensor coil according to polarization, and a receiver optical subassembly (ROSA) that is formed in a package together with first and second photodetectors that detect separated light according to polarization.
    Type: Application
    Filed: February 4, 2014
    Publication date: April 16, 2015
    Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
    Inventors: Hyoungjun PARK, Young Soon HEO, Kwon-Seob LIM, Keo-Sik KIM, Eun Kyoung JEON, Jeong Eun KIM, Hyun Seo KANG, Young Sun KIM
  • Patent number: 8957667
    Abstract: An electric measuring apparatus is constructed in such a way as to include a signal processing circuit equipped with at least a polarized light separating unit, Faraday rotators, a light source, a photoelectric conversion element, and optical fibers for a sensor. The optical fibers for the sensor are placed around the periphery of an electrical conductor through which electric current to be measured flows. Furthermore, the rotation angle of each Faraday rotator at the time when the magnetism of each Faraday rotator is saturated is set to 22.5°+?° at a temperature of 23° C., thereby changing the rotation angle of each Faraday rotator by ?° from 22.5°.
    Type: Grant
    Filed: May 18, 2010
    Date of Patent: February 17, 2015
    Assignee: Adamant Kogyo Co., Ltd.
    Inventors: Yoshihiro Konno, Masaru Sasaki
  • Publication number: 20140367265
    Abstract: A measurement tool for measuring an electrical parameter of a metal film deposited on a front side of a workpiece includes an electrical sensor connected to a workpiece contact point, an energy beam source with a beam impact location on the front side, a holder and a translation mechanism capable of translating the holder relative to the workpiece support, the beam source supported on the holder, and a computer programmed to sense a behavior of an electrical parameter sensed by the sensor.
    Type: Application
    Filed: October 29, 2013
    Publication date: December 18, 2014
    Applicant: APPLIED MATERIALS, INC.
    Inventors: Abraham Ravid, Dmitry A. Dzilno, Todd J. Egan, Robert O. Miller
  • Patent number: 8890508
    Abstract: Systems and methods related to optical current and voltage sensors and, more particularly, to filters for use in such sensors. A fiber optic current sensor comprising: a light source; a polarization beam splitter connected to said light source having a reciprocal port and a non-reciprocal port; a Faraday rotator connected to said polarization beam splitter; a first quarter-wave plate connected to said Faraday rotator; a polarization maintaining fiber connected to said first quarter-wave plate; a second quarter-wave plate connected to said polarization maintaining fiber; a sensing fiber connected to said second quarter-wave plate; a detector connected to said polarization beam splitter via said non-reciprocal port and having an output; and an adaptive filter for filtering said output.
    Type: Grant
    Filed: May 2, 2008
    Date of Patent: November 18, 2014
    Assignee: Alstom Technology Ltd
    Inventors: James N. Blake, Carl Glasow
  • Publication number: 20140333319
    Abstract: Short-circuit current, maximum power, and open circuit voltage during a single flash are determined by varying intensity, voltage, and current. An apparatus determines the substrate doping and the series resistance of the solar cell. The series resistance of the cell is determined from a voltage step from the maximum power voltage operating point to the open-circuit condition. Methods are described for determining the substrate doping from stepping or sweeping the voltage. The first uses a voltage step and finds the change in charge that results. This determines a unique doping if the series resistance is known. The second uses data for a case of varying current, voltage, and light intensity, and compares this data to the case of varying voltage and intensity with no current. By transposing both cases into the steady state, agreement between the two data sets is found for unique doping and series resistance values.
    Type: Application
    Filed: May 9, 2014
    Publication date: November 13, 2014
    Inventors: Ronald A. SINTON, Michael K. FORSYTH, Adrienne L. BLUM, James S. SWIRHUN
  • Publication number: 20140300341
    Abstract: An optical sensor that senses current by directing polarized light across an airgap that is orthogonal to a direction of current running through a conductor. The sensor includes a prism having a high Verdet constant for high sensitivity to magnetic fields, which cause an angle of polarization of the polarized light to be rotated as an indication of the magnitude of current. A polarizing beamsplitter having a low Verdet constant is mounted to the prism so that incoming light that is traveling in a direction orthogonal to the magnetic field being sensed across the airgap is insensitive to unwanted magnetic fields produced by nearby conductors. The distance the light travels in this orthogonal direction is minimized, reducing the overall volume of the sensor, making a compact sensor highly sensitive to magnetic fields of interest, largely insensitive to unwanted magnetic fields, and having a very high dynamic range for sensing current.
    Type: Application
    Filed: May 15, 2014
    Publication date: October 9, 2014
    Applicant: Mark Weisbart as Trustee for the Bankruptcy Estate of Optisense Networks LLC
    Inventors: Philip B. Davis, Ye Li, Theodore C. Konetski
  • Patent number: 8829890
    Abstract: A polarizing optical system (15, 16) is disposed perpendicular to an optical axis of incoming light from a light source (12), having the optical axis (12) as a center axis, and configured for polarization of incoming light to a prescribed reference state, an electro-optical device (17) is disposed perpendicular to the optical axis, having the optical axis as a center axis, and adapted, as a voltage to be measured is imposed thereon, to respond to the imposed voltage by polarizing light polarized by the polarizing optical system (15, 16), and an analyzer (18) is disposed perpendicular to the optical axis, having the optical axis as a center axis, and adapted for detection of light polarized by the electro-optical device (17), to irradiate a detector (21) configured for conversion of incoming light into an electric signal.
    Type: Grant
    Filed: May 27, 2009
    Date of Patent: September 9, 2014
    Assignees: Kabushiki Kaisha Toshiba, Toshiba Industrial Products Manufacturing Corporation
    Inventors: Masao Takahashi, Junichi Sato, Takashi Miyabe, Tokihiro Umemura, Tsuyoshi Kuwabara
  • Patent number: 8754633
    Abstract: An apparatus and method for laser probing of a DUT is disclosed. The system enables laser voltage imaging state mapping of devices within the DUT. A selected area of the DUT is illuminating a while the DUT is receiving test signals causing certain of the active devices to modulate. Light reflected from the DUT is collected and is converted into an electrical signal. Phase information is extracting from the electrical signal and a two-dimensional image is generated from the phase information, wherein the two-dimensional image spatially correlates to the selected area.
    Type: Grant
    Filed: May 3, 2010
    Date of Patent: June 17, 2014
    Assignee: DCG Systems, Inc.
    Inventors: Yin Shyang Ng, Dmitry Skvortsov
  • Patent number: 8749225
    Abstract: The present invention provides a power measurement apparatus and method for a pulsed terahertz quantum-cascade laser (THz QCL). The apparatus includes a light source part, a light path part, and a detection part. Terahertz light emitted by a THz QCL reaches a terahertz quantum-well photodetector (THz QWP) through the measurement apparatus, and is absorbed to generate a corresponding current signal. A signal processing circuit extracts a voltage signal from the current signal, amplifies the voltage signal, and inputs the amplified voltage signal to an oscilloscope for reading and displaying. According to a responsivity of the THz QWP at a lasing frequency of the laser, the measurement of the output power of the pulsed THz QCL is acquired.
    Type: Grant
    Filed: August 29, 2011
    Date of Patent: June 10, 2014
    Assignee: Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences
    Inventors: Zhiyong Tan, Juncheng Cao, Yingjun Han, Zhen Chen
  • Publication number: 20140103904
    Abstract: The present invention provides a power measurement apparatus and method for a pulsed terahertz quantum-cascade laser (THz QCL). The apparatus includes a light source part, a light path part, and a detection part. Terahertz light emitted by a THz QCL reaches a terahertz quantum-well photodetector (THz QWP) through the measurement apparatus, and is absorbed to generate a corresponding current signal. A signal processing circuit extracts a voltage signal from the current signal, amplifies the voltage signal, and inputs the amplified voltage signal to an oscilloscope for reading and displaying. According to a responsivity of the THz QWP at a lasing frequency of the laser, the measurement of the output power of the pulsed THz QCL is acquired.
    Type: Application
    Filed: August 29, 2011
    Publication date: April 17, 2014
    Inventors: Zhiyong Tan, Juncheng Cao, Yingjun Han, Zhen Chen
  • Publication number: 20140084902
    Abstract: A measurement apparatus for surface analysis carried out in a gaseous environment such as air comprises a measurement device capable of measuring a contact potential difference between a probe and a surface, and a light source that triggers photoelectric emission from a sample. The apparatus may operate in “dual” photoemission and contact potential difference (CPD) measurement modes.
    Type: Application
    Filed: February 21, 2013
    Publication date: March 27, 2014
    Inventor: Iain Baikie
  • Publication number: 20140049249
    Abstract: The present invention relates to an AC or DC power transmission system. The system comprises a first electrical conductor, a second electrical conductor and an insulating space there between. The system further comprises an electric field measurement device comprising the following components being mounted in optical continuation: a first optical fibre being connected to a light source, a first optical lens, a circular polarization filter, a crystal rod having electro-optical properties, a linear polarization filter, a second optical lens, and a second optical fibre being connected to a light detection unit. The electric field measurement device is located adjacent the first electrical conductor and defines a first minimum distance between the crystal rod and the first electrical conductor and a second minimum distance between the crystal rod and the second electrical conductor. The second minimum distance is at least 10 times larger than the first minimum distance.
    Type: Application
    Filed: January 17, 2012
    Publication date: February 20, 2014
    Applicant: Powersense A/S
    Inventor: Per Jespersen
  • Patent number: 8581572
    Abstract: An apparatus for testing photovoltaic cells wherein an array of light sources are provided. The light sources can have a collimating lens. In addition, one or more feedback circuits can be provided which monitor and maintain one or more of the light sources.
    Type: Grant
    Filed: February 5, 2013
    Date of Patent: November 12, 2013
    Assignee: Alpha-Omega Power Technologies, Ltd. Co.
    Inventor: William Ray Cravey
  • Publication number: 20130207639
    Abstract: A voltage sensing apparatus on a semiconductor substrate, including one or more inputs comprising metal contacts, an output comprising a laser transmitter, circuitry electrically connecting and interfacing the inputs to the output; and a power module. A method of fabricating the apparatus is also described.
    Type: Application
    Filed: February 11, 2013
    Publication date: August 15, 2013
    Applicant: California Institute of Technology
    Inventor: California Institute of Technology
  • Publication number: 20130099774
    Abstract: A method for characterizing the sensitivity of an electronic component with respect to a natural radiating environment. The safe operating area (SOA) voltage range beyond which destructive events occur is determined for the electronic component for given characteristics of a particle or incident beam. The electronic component is turned on and energized with the particle or incident beam having the given characteristics under the operating conditions that are close to the highest voltage value of the determined SOA voltage range. An efficient section of amplified transient events, which corresponds to an estimation of the destructive occurrences for the electronic component is determined. The characteristics of the particle or beam is modified and the method is repeated with the modified characteristics.
    Type: Application
    Filed: June 30, 2011
    Publication date: April 25, 2013
    Applicant: EUROPEAN AERONAUTIC DEFENSE AND SPACE COMPANY EADS FRANCE
    Inventors: Florent Miller, Sebastien Morand
  • Patent number: 8378661
    Abstract: A solar simulator which uses a honeycomb structure for providing highly collimated light for testing one or more photovoltaic cells.
    Type: Grant
    Filed: May 29, 2009
    Date of Patent: February 19, 2013
    Assignee: Alpha-Omega Power Technologies, Ltd.Co.
    Inventor: William Ray Cravey
  • Publication number: 20130033267
    Abstract: An optical sensor assembly, for installation on a current carrying cable, senses the current in the cable and provides an electrical output indicating the current. To sense the current, a magnetic concentrator is placed in close proximity to the cable and creates a magnetic field representing current in the cable. An optical current sensor, within the created magnetic field, exposes a beam of polarized light to the magnetic field. The beam of polarized light is rotated thereby, by Faraday effect, according to the current in the cable. The amount of rotation is analyzed and converted to electrical signals to portray the current in the cable. The electrical signals may be processed, evaluated and analyzed to provide one or more of several elements of quality of the current in the cable.
    Type: Application
    Filed: July 19, 2012
    Publication date: February 7, 2013
    Inventors: Joseph Yossi Harlev, Leonard Johnson, Rhad Veazey, Theodore Konetski
  • Publication number: 20120007585
    Abstract: A sensor that senses incident RF signals is provided. The sensor is capable of sensing signals in the Gigahertz (GHz) and Terahertz (THz) range. The sensor may utilize one or more cantilevers, an interferometer, or may be formed in a box-type configuration.
    Type: Application
    Filed: October 1, 2007
    Publication date: January 12, 2012
    Inventors: Kenneth E. Salsman, Daniel W. So
  • Patent number: 8076925
    Abstract: An optical sensor assembly has a base unit, an optical current sensor, and a magnetic concentrator. The optical current sensor is mounted on the base unit and includes a polarized light input, a reflective prism, and a light output. The magnetic concentrator defines an airgap and is mounted on a concentrator housing such that the magnetic concentrator fits around the current carrying cable when the base unit is hung from the current carrying cable by hooks and when the concentrator housing is moved to a closed position. The reflective prism of the base unit is operably positioned in the airgap of the magnetic concentrator when the concentrator housing is in the closed position. The assembly further includes a voltage sensor operably positioned in the base unit for measuring the voltage of the current carrying cable.
    Type: Grant
    Filed: October 28, 2009
    Date of Patent: December 13, 2011
    Assignee: Optisense Network, Inc.
    Inventors: Joseph Yossi Harlev, Rhad Veazey, Leonard Johnson, Theodore Konetski
  • Publication number: 20110301892
    Abstract: A system for characterizing the electrical properties of semiconductor wafers with high surface state densities, such as GaN wafers, includes a support subsystem for supporting the semiconductor sample, at least one light source for illuminating a spot on the sample, and a detection subsystem for measuring the photovoltage signal produced from illumination of the sample. In use, the system utilizes in-line, non-contact photovoltage techniques that exploits the presence of the high surface state density and the known components of its associated electrostatic barrier as part of its novel characterization process. Specifically, the system illuminates the sample with one or more light beams that vary in photon energy and duration in order to excite charge carriers in specific layers of the sample while either preserving or collapsing the electrostatic barrier. In this manner, the system is able to electrically characterize individual or combined layers of the sample as well as embedded junctions.
    Type: Application
    Filed: February 18, 2011
    Publication date: December 8, 2011
    Inventor: Emil Kamieniecki
  • Publication number: 20110204875
    Abstract: Systems and methods according to these exemplary embodiments provide for methods and systems related to optical current and voltage sensors and, more particularly, to filters for use in such sensors.
    Type: Application
    Filed: May 2, 2008
    Publication date: August 25, 2011
    Inventors: James Blake, Carl Glasow
  • Publication number: 20110169478
    Abstract: A method is provided for detecting laser optical paths in integrated circuit (IC) packages. The method provides an IC die encapsulated as a package in a compound of glass spheres and epoxy. Power is supplied to the IC. The IC is scanned with a laser. Typically, a laser wavelength is used that is minimally absorbed by the glass spheres in the epoxy compound of the IC package, and changes in current to the IC are detected. A detected current change is cross-referenced against a scanned IC package surface region. This process identifies an optical pathway underlying the scanned IC package surface region. In some aspects, this process leads to the identification of a glass sphere-collecting package structure underlying the optical pathway. Examples of a glass sphere-collecting structure might include an inner lead wire, lead frame edge, or die edge.
    Type: Application
    Filed: March 17, 2011
    Publication date: July 14, 2011
    Inventor: Joseph Martin Patterson
  • Publication number: 20110156695
    Abstract: A MOCT metering system includes a cutoff module that ensures zero output when values from an optical module fall below a threshold value. The cutoff module includes an RMS to DC converter that drives a comparator. The comparator drives a switch that causes the cutoff module to pass through the measured signal unmodified if above a threshold value and to output a zero voltage signal if below a threshold value.
    Type: Application
    Filed: December 9, 2010
    Publication date: June 30, 2011
    Applicant: ABB Technology AG
    Inventors: William Verbanets, Michael Mendik
  • Publication number: 20110095750
    Abstract: A method of measuring a current of a current carrying cable teaches the first step of providing an optical sensor assembly comprising a base unit, and an optical current sensor mounted on the base unit for transmitting a beam of polarized electromagnetic radiation to an optical fiber. A light detector is also provided having a first channel that operably connecting the light detector to an analog to digital converter through a programmable gain amplifier, a second channel that operably connects the light detector directly to the analog to digital converter, and a processor operably connected to the analog to digital converter. The optical sensor assembly is mounted adjacent the current carrying cable, and the fiber optic is operably connected to a light detector. A plurality of factors are then evaluated from rotation information from the light detector, by using the first and second channels for analog to digital conversion operably connected with the processor.
    Type: Application
    Filed: November 5, 2009
    Publication date: April 28, 2011
    Inventors: Joseph Yossi Harlev, Rhad Veazey, Leonard Johnson, Theodore Konetski
  • Publication number: 20110095749
    Abstract: An optical sensor assembly has a base unit, an optical current sensor, and a magnetic concentrator. The optical current sensor is mounted on the base unit and includes a polarized light input, a reflective prism, and a light output. The magnetic concentrator defines an airgap and is mounted on a concentrator housing such that the magnetic concentrator fits around the current carrying cable when the base unit is hung from the current carrying cable by hooks and when the concentrator housing is moved to a closed position. The reflective prism of the base unit is operably positioned in the airgap of the magnetic concentrator when the concentrator housing is in the closed position. The assembly further includes a voltage sensor operably positioned in the base unit for measuring the voltage of the current carrying cable.
    Type: Application
    Filed: October 28, 2009
    Publication date: April 28, 2011
    Inventors: Joseph Yossi Harlev, Rhad Veazey, Leonard Johnson, Theodore Konetski
  • Publication number: 20110001971
    Abstract: There is provided an electromagnetic field measurement apparatus capable of achieving correct and timely circuit operation detection in an area where electronic devices are mounted at high density. An electromagnetic field measurement apparatus includes: a laser light source; a polarized wave controller that linearly polarizes laser light; an optical fiber probe that has an electrooptic material or a magnetooptic material at its leading end and in which the laser light reflected at the leading end is subjected to polarization modulation in accordance with an electric field intensity or a magnetic field intensity; and an analyzer that converts the laser light reflected by the optical fiber probe into intensity modulated light. The laser light source emits time-multiplexed laser light of a plurality of wavelengths different from one another.
    Type: Application
    Filed: February 4, 2009
    Publication date: January 6, 2011
    Inventors: Mizuki Iwanami, Tsuneo Tsukagoshi, Risato Ohhira, Masafumi Nakada, Tomonori Yamada
  • Publication number: 20100277159
    Abstract: An apparatus and method for laser probing of a DUT is disclosed. The system enables laser voltage imaging state mapping of devices within the DUT. A selected area of the DUT is illuminating a while the DUT is receiving test signals causing certain of the active devices to modulate. Light reflected from the DUT is collected and is converted into an electrical signal. Phase information is extracting from the electrical signal and a two-dimensional image is generated from the phase information, wherein the two-dimensional image spatially correlates to the selected area.
    Type: Application
    Filed: May 3, 2010
    Publication date: November 4, 2010
    Inventors: Yin Shyang NG, Dmitry Skvortsov
  • Publication number: 20100264904
    Abstract: An apparatus, for measuring an applied electrical field and for reducing perturbation to the electrical field being measured, includes a laser integrated into an electro optic crystal sensor head prior to the output fiber. A probe beam is passed along the crystal direction of low birefringence of nearly circular optical indicatrix, rather than one of high EO modulation. The EO crystal is placed between two crossed polarizers and oriented such that a small tilt angle is subtended between its optic axis and the path of the probe beam. Improved optical coupling is achieved by using a large core multimode fiber at the output, to reduce optical insertion losses. A collimating lens emits the intensity modulated laser beam back to a photodetector, where the intensity modulated laser beam is converted to an electrical signal representing both field strength and phase of the electrical field applied to the sensor head.
    Type: Application
    Filed: July 1, 2010
    Publication date: October 21, 2010
    Applicant: US Gov't Represented by the Secretary of the Navy Office of Naval Research (ONR/NRL) Code OOCCIP
    Inventors: Dong Ho Wu, Anthony Garzarella
  • Publication number: 20100241379
    Abstract: A method for analyzing an integrated circuit includes: a step (102) for applying laser radiation at a point on the surface of the circuit; a step (106) for exciting the circuit thus subjected to laser radiation by applying an electrical excitation signal; a step (106) for collecting the response of the circuit to the excitation, the circuit being subjected to laser radiation; a step (106) for measuring the phase difference between the response to the excitation of the circuit subjected to laser radiation and a reference response of the circuit in the absence of laser radiation applied to the circuit. An associated observation method and installation are also disclosed.
    Type: Application
    Filed: June 19, 2007
    Publication date: September 23, 2010
    Applicant: CENTRE NATIONAL D'ETUDES SPATIALES
    Inventors: Romain DESPLATS, Kevin SANCHEZ
  • Publication number: 20100231253
    Abstract: The magnitude of an amplitude waveform of an electromagnetic wave generated when irradiating a pulse laser beam to a structure A including diffusion regions provided in the structure of a semiconductor device to be inspected is compared with the magnitude of an amplitude waveform of an electromagnetic wave radiated when irradiating the pulse laser beam to a structure A of a reference device measured in advance, and the detection sensitivity of the electromagnetic wave is corrected (S14). Thereafter, measurement errors caused by variations in the detection sensitivity of electromagnetic waves of an inspecting apparatus are eliminated by inspecting the semiconductor device as an inspection target, so that the quality of the semiconductor device is precisely determined (S16).
    Type: Application
    Filed: February 26, 2008
    Publication date: September 16, 2010
    Applicant: Matsushita Electric Industrial Co., Ltd.
    Inventors: Hiroki Kitagawa, Hiroaki Katsura
  • Publication number: 20100185406
    Abstract: A system for an embodiment includes a sensor device having at least one sensor adapted to monitor at least one parameter associated with a circuit and selectively provide measurement information on the at least one parameter. The at least one sensor may include an electrical sensor adapted to monitor an electrical parameter of the circuit for the sensor device to selectively provide as the measurement information, and wherein the sensor device includes a wireless transceiver within the sensor device and is adapted to transmit the measurement information and receive control information.
    Type: Application
    Filed: March 26, 2010
    Publication date: July 22, 2010
    Applicant: FLIR SYSTEMS, INC.
    Inventor: Joseph Blanchard
  • Publication number: 20100052654
    Abstract: The present invention provides an optoelectronic memory device, the method for manufacturing and evaluating the same. The optoelectronic memory device according to the present invention includes a substrate, an insulation layer, an active layer, source electrode and drain electrode. The substrate includes a gate, and the insulation layer is formed on the substrate. The active layer is formed on the insulation layer, and more particularly, the active layer is formed of a composite material comprising conjugated conductive polymers and quantum dots. Moreover, both of the source and the drain are formed on the insulation layer, and electrically connected to the active layer.
    Type: Application
    Filed: June 15, 2009
    Publication date: March 4, 2010
    Inventors: Kung-Hwa WEI, Jeng-Tzong SHEU, Chen-Chia CHEN, Mao-Yuan CHIU
  • Publication number: 20090224753
    Abstract: An electric field sensor is obtained by directly forming an electrooptical film of Fabry-Perot resonator structure on a polished surface at a tip of an optical fiber by an aerosol deposition method.
    Type: Application
    Filed: June 29, 2006
    Publication date: September 10, 2009
    Applicant: NEC CORPORATION
    Inventors: Masafumi Nakada, Mizuki Iwanami, Keishi Oohashi, Norio Masuda
  • Publication number: 20090102454
    Abstract: An optical interferometer used to measure the current in a conductor, where the gap between the mirror and the quarter wave plate is minimized, and the gap is shielded magnetically. Additionally, at least the modulator is shielded, and preferably the case containing many of the components, such as the integral number of turns of optical fiber in a coil, is magnetically shielded. By shielding the components, and reducing the gap between the quarter wave plate and the mirror, the error in the current measurement is substantially reduced.
    Type: Application
    Filed: October 19, 2007
    Publication date: April 23, 2009
    Applicant: DYNAMP, LLC
    Inventors: Farid E. Masri, Christopher S. Sherman
  • Publication number: 20090039866
    Abstract: The current in a conductor is measured by exploiting the Faraday effect in a sensing fiber. The light returning from the sensing fiber is split into at least two parts, at least one of which is analyzed by a first circular analyzer for generating a first signal. A second part may e.g. be analyzed by a second circular analyzer, and a third part may be analyzed by a linear analyzer. By combining the signals obtained in this way, the current induced phase delay in the returning light can be measured efficiently and accurately.
    Type: Application
    Filed: October 22, 2008
    Publication date: February 12, 2009
    Inventors: Klaus Bohnert, Andreas Frank, Hubert Brandle
  • Publication number: 20090027038
    Abstract: Systems, methods and sensors detect changes in incident optical radiation. Current is driven through one or more active areas of a detector while the incident optical radiation illuminates the active areas. Voltage is sensed across one or more of the active areas, a change in the voltage being indicative of the changes in incident optical radiation.
    Type: Application
    Filed: June 30, 2008
    Publication date: January 29, 2009
    Inventors: Elsa Garmire, Ashifi Gogo, Jonathan T. Bessette
  • Patent number: 7391222
    Abstract: A deflector which enables to have a sufficient degree of freedom of designing and also to detect accurately a displacement angle of a movable plate can be provided. In order to accomplish this, the deflector includes a mirror, a base frame, a pair of torsion bars which pivotably support the mirror with respect to the base frame, a drive coil which is provided on the mirror, two permanent magnets which generate a magnetic flux which acts in the drive coil, two capacitive sensors which output an angle of oscillation of the mirror as electrical characteristics, a connecting portion which electrically connects on the mirror a first end out of two ends of the drive coil and one end of electric terminals of the two capacitive sensors, and a first wire which is drawn from the connecting portion up to the torsion bars via the base frame.
    Type: Grant
    Filed: December 8, 2005
    Date of Patent: June 24, 2008
    Assignee: Olympus Corporation
    Inventor: Masahiro Nishio
  • Patent number: 6961672
    Abstract: A universal diagnostic platform (UDP) is described which incorporates several measurement modules for testing a device under test (DUT). Users can switch between measurement modules without removing the DUT. The UDP employs a common fixturing and software system for all the modules.
    Type: Grant
    Filed: March 5, 2003
    Date of Patent: November 1, 2005
    Assignee: Credence Systems Coporation
    Inventor: Steven Kasapi
  • Publication number: 20040051515
    Abstract: The object of the invention is to provide technique and an apparatus for precisely measuring high frequency current that flows in a transmission line of a small impedance load circuit. A current waveform can be measured in wide bandwidth (at high-time resolution) and at high sensitivity without processing DUT (nondestructive) and without having an effect of the impedance of the apparatus (noninvasive) by installing a magnetooptical device in a magnetic field generated based upon current that flows in the transmission line, applying a bias magnetic field to the magnetooptical device by a magnetic field generator, making polarized light incident under the control of a position so that detection sensitivity is maximum and detecting the variation of polarization included in reflected light from the magnetooptical device.
    Type: Application
    Filed: June 26, 2003
    Publication date: March 18, 2004
    Inventor: Hiroshi Ikekame
  • Patent number: 6504355
    Abstract: A light beam output from a magneto-optical current transducer using the Faraday effect is divided into two output light beams. A first output light beam is applied, via an output polarizer, to a first optical input of a processing unit. A second output light beam is applied to a second optical input of the processing unit. The processing unit converts the two beams into electrical signals U1 and U2, then computes a first quantity R=U1/U2, determines the AC component (RAC) and the DC component (RDC) of the first quantity and deduces therefrom a second quantity S=RAC/RDC enabling the electric current to be measured to be determined.
    Type: Grant
    Filed: June 6, 2001
    Date of Patent: January 7, 2003
    Assignee: Schneider Electric Industries SA
    Inventor: Vincent Minier
  • Publication number: 20020140416
    Abstract: An electro-optic sampling probe is provided, capable of irradiating a plurality of excitation light beams on a plurality of light receiving portions mounted on an IC wafer which is an object for measurement.
    Type: Application
    Filed: May 18, 2000
    Publication date: October 3, 2002
    Inventors: Noriyuki Toriyama, Toshiyuki Yagi, Tadao Nagatsuma