Abstract: A microwave sensor determines an electric-field strength of a microwave field populated by quantum particles in an ultra-high vacuum (UHV) cell. A probe laser beam and a coupling laser beam are directed into the UHV cell so that they are generally orthogonal to each other and intersect to define a “Rydberg” intersection, so-called as the quantum particles within the Rydberg intersection transition to a pair of Rydberg states. The frequency of the probe laser beam is swept so that a frequency spectrum of the probe laser beam can be captured. The frequency spectrum is analyzed to determine a frequency difference between Autler-Townes peaks. The electric-field strength of the microwave field within the Rydberg intersection is then determined based on this frequency difference.

Abstract: The optical scanning device includes a swingable reflector; a blocking unit that is provided in the reflector to move in linkage with the reflector; and a sensor unit that includes at least a first sensor unit and a second sensor unit, wherein each of the first and second sensor units includes an output unit, which is a light generator or an electromagnetic wave generator configured to output a detection target and a detection unit, which is a light receiver or an electromagnetic wave receiver configured to detect the detection target. The output unit is at a position that faces the detection unit. When the reflector is in a predetermined swing angle range, the blocking plate blocks a path of the detection target between the output unit and the detection unit.

Abstract: A microwave sensor includes a cloud of particles, e.g., Rubidium 87 atoms. A probe laser beam transitions ground-state particles in its path to an excited state. A set of one or more coupling laser beams causes excited particles to transition to a first Rydberg state so that particles in the intersection of the laser beams are in a dark superposition which is transparent to the probe laser beam so that a frequency spectrum of the probe laser beam shows a transmission peak at the laser frequency. A microwave lens focuses a microwave vector (e.g., a microwave signal) within the intersection, causing particles in the first Rydberg state to transition to a second Rydberg state, splitting the transmission peak into a pair of peaks. The intensity of the microwave vector can be calculated based on the frequency difference between the pair of peaks. The direction of the microwave vector can be determined from the location of the laser-beam intersection.

Abstract: A thin-plate-typed rotating module includes a rotating element, a driving unit and a base board. The rotating element is rotatable about a first axial direction and a second axial direction in a limited degree. The driving unit connects the rotating element for driving the rotating element to rotate about the first and second axial directions. The base board is furnished with a control module which is connected with the driving unit for controlling the driving unit to operate.

Abstract: Disclosed in the present invention is a method for suppressing airborne transient electromagnetic in-band vibration noise, comprising: dividing the data after current turn-off into two segments according to whether the useful signal is attenuated to the system noise level: the segment A is the useful signal segment, and the segment B is the pure noise segment; limiting the bandwidth of the data of the segment B according to the frequency range of the in-band noise, and labeling the result as BL; training a neural network using the BL, utilizing the well trained neural network to predict the in-band vibration noise contained in the data of the segment A, and labeling the prediction result as PNA; and subtracting the PNA from the data of the segment A to suppress the in-band vibration noise contained in the data of the segment A.

Abstract: A thin-plate-typed rotating module includes a rotating element, a driving unit and a base board. The rotating element is rotatable about a first axial direction and a second axial direction in a limited degree. The driving unit connects the rotating element for driving the rotating element to rotate about the first and second axial directions. The base board is furnished with a control module which is connected with the driving unit for controlling the driving unit to operate.

Abstract: A method and apparatus for generating high-order harmonics in a solid-state medium comprising integrated semiconductor devices and electronics. The high-order harmonics interact with and are modified by the internal electric field associated with the operation of the integrated semiconductor devices and electronics. Measurement of the high-order harmonics after modification by the internal electric fields amounts to high resolution (temporal and spatial) dynamic imaging of the internal electric fields associated with the integrated semiconductor devices and electronics.

Abstract: A nanoparticle sensor apparatus includes a silicon-based nanoparticle having a centrosymmetric crystalline structure. A lanthanide atom embedded within the silicon-based nanoparticle provides light emission when the sensor apparatus undergoes pressure loading. This sensor apparatus may be encapsulated in a polymer matrix to form a nanoparticle sensor matrix apparatus which may be located on or in a structure. To measure the pressure on such a structure, a UV light source illuminates the sensor apparatus. An optical emission detector detects the intensity of light emitted from the sensor in response, while a processor correlates that intensity to the pressure loading.

Abstract: An optical circuit switch, method, and apparatus are disclosed. The optical circuit switch may include a plurality of mirror elements, each mirror element uniquely associated with a port from a plurality of ports, each mirror element coupled to a dedicated electrode and configured to rotate in response to a voltage applied to the dedicated electrode. A command interpreter may receive a command defining a plurality of port-pairs to be connected via the optical circuit switch and determine a respective target voltage value to be applied to the dedicated electrode coupled to each of the mirror elements associated with each of the port-pairs. A transition manager may cause voltages applied to the dedicated electrodes coupled to the mirror elements associated with the port-pairs to concurrently transition from respective previous voltage values to the respective target voltage values.

Abstract: An electromagnetic wakefield detector placed in close proximity to a design trajectory of a non-relativistic charged particle beam produces an optical signal in response to passage of the charged particle beam without interrupting the charged particle beam. A photon detector receives the optical signal and produces a corresponding output. The wakefield detector may be based on the electro optic effect. Specifically, the detector may measure the effect of the charged particle beam a beam of radiation on the phase of radiation travelling parallel to the beam in a nearby electro optic waveguide. This abstract is provided to comply with rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.

Abstract: Provided is an image processing method wherein an edge is detected from an image to which a sharpening process is to be applied, and on the basis of a length of the edge which is present near a pixel to which the sharpening process is to be applied, the strength of the sharpening process to the pixel is determined.

Abstract: A bi-directional current limiter may be configured to receive an AC signal and bi-directionally limit the loop current to a predetermined current value. A first and second zone may be configured in series with the AC signal and bi-directional current limiter. The first and second zone may include unidirectional current limiters to limit a unidirectional current that is proportionately less than the bi-directionally limited current. A first opto-coupler circuit (ISO1) may be configured to detect both high and low current states in the current loop circuit. Second and third opto-coupler circuits (ISO2 and ISO3) associated with the first and second zones may be configured to detect only high current states in the current loop circuit. The status of the first and second zones may then be determined by an analysis of the current level in the current loop circuit during two half cycles as determined by the various current limiters.

Abstract: An optical fiber current sensor includes a transmitter optical subassembly (TOSA) that is formed in a package of a linear polarizer that applies light from a light source to a sensor coil that is formed with an optical fiber by linearly polarizing, a polarization beam splitter that separates light that is reflected from the sensor coil according to polarization, and a receiver optical subassembly (ROSA) that is formed in a package together with first and second photodetectors that detect separated light according to polarization.

Abstract: An electric measuring apparatus is constructed in such a way as to include a signal processing circuit equipped with at least a polarized light separating unit, Faraday rotators, a light source, a photoelectric conversion element, and optical fibers for a sensor. The optical fibers for the sensor are placed around the periphery of an electrical conductor through which electric current to be measured flows. Furthermore, the rotation angle of each Faraday rotator at the time when the magnetism of each Faraday rotator is saturated is set to 22.5°+?° at a temperature of 23° C., thereby changing the rotation angle of each Faraday rotator by ?° from 22.5°.

Abstract: A measurement tool for measuring an electrical parameter of a metal film deposited on a front side of a workpiece includes an electrical sensor connected to a workpiece contact point, an energy beam source with a beam impact location on the front side, a holder and a translation mechanism capable of translating the holder relative to the workpiece support, the beam source supported on the holder, and a computer programmed to sense a behavior of an electrical parameter sensed by the sensor.

Abstract: Systems and methods related to optical current and voltage sensors and, more particularly, to filters for use in such sensors. A fiber optic current sensor comprising: a light source; a polarization beam splitter connected to said light source having a reciprocal port and a non-reciprocal port; a Faraday rotator connected to said polarization beam splitter; a first quarter-wave plate connected to said Faraday rotator; a polarization maintaining fiber connected to said first quarter-wave plate; a second quarter-wave plate connected to said polarization maintaining fiber; a sensing fiber connected to said second quarter-wave plate; a detector connected to said polarization beam splitter via said non-reciprocal port and having an output; and an adaptive filter for filtering said output.

Abstract: Short-circuit current, maximum power, and open circuit voltage during a single flash are determined by varying intensity, voltage, and current. An apparatus determines the substrate doping and the series resistance of the solar cell. The series resistance of the cell is determined from a voltage step from the maximum power voltage operating point to the open-circuit condition. Methods are described for determining the substrate doping from stepping or sweeping the voltage. The first uses a voltage step and finds the change in charge that results. This determines a unique doping if the series resistance is known. The second uses data for a case of varying current, voltage, and light intensity, and compares this data to the case of varying voltage and intensity with no current. By transposing both cases into the steady state, agreement between the two data sets is found for unique doping and series resistance values.

Abstract: An optical sensor that senses current by directing polarized light across an airgap that is orthogonal to a direction of current running through a conductor. The sensor includes a prism having a high Verdet constant for high sensitivity to magnetic fields, which cause an angle of polarization of the polarized light to be rotated as an indication of the magnitude of current. A polarizing beamsplitter having a low Verdet constant is mounted to the prism so that incoming light that is traveling in a direction orthogonal to the magnetic field being sensed across the airgap is insensitive to unwanted magnetic fields produced by nearby conductors. The distance the light travels in this orthogonal direction is minimized, reducing the overall volume of the sensor, making a compact sensor highly sensitive to magnetic fields of interest, largely insensitive to unwanted magnetic fields, and having a very high dynamic range for sensing current.

Abstract: A polarizing optical system (15, 16) is disposed perpendicular to an optical axis of incoming light from a light source (12), having the optical axis (12) as a center axis, and configured for polarization of incoming light to a prescribed reference state, an electro-optical device (17) is disposed perpendicular to the optical axis, having the optical axis as a center axis, and adapted, as a voltage to be measured is imposed thereon, to respond to the imposed voltage by polarizing light polarized by the polarizing optical system (15, 16), and an analyzer (18) is disposed perpendicular to the optical axis, having the optical axis as a center axis, and adapted for detection of light polarized by the electro-optical device (17), to irradiate a detector (21) configured for conversion of incoming light into an electric signal.

Abstract: An apparatus and method for laser probing of a DUT is disclosed. The system enables laser voltage imaging state mapping of devices within the DUT. A selected area of the DUT is illuminating a while the DUT is receiving test signals causing certain of the active devices to modulate. Light reflected from the DUT is collected and is converted into an electrical signal. Phase information is extracting from the electrical signal and a two-dimensional image is generated from the phase information, wherein the two-dimensional image spatially correlates to the selected area.

Abstract: The present invention provides a power measurement apparatus and method for a pulsed terahertz quantum-cascade laser (THz QCL). The apparatus includes a light source part, a light path part, and a detection part. Terahertz light emitted by a THz QCL reaches a terahertz quantum-well photodetector (THz QWP) through the measurement apparatus, and is absorbed to generate a corresponding current signal. A signal processing circuit extracts a voltage signal from the current signal, amplifies the voltage signal, and inputs the amplified voltage signal to an oscilloscope for reading and displaying. According to a responsivity of the THz QWP at a lasing frequency of the laser, the measurement of the output power of the pulsed THz QCL is acquired.

Abstract: The present invention provides a power measurement apparatus and method for a pulsed terahertz quantum-cascade laser (THz QCL). The apparatus includes a light source part, a light path part, and a detection part. Terahertz light emitted by a THz QCL reaches a terahertz quantum-well photodetector (THz QWP) through the measurement apparatus, and is absorbed to generate a corresponding current signal. A signal processing circuit extracts a voltage signal from the current signal, amplifies the voltage signal, and inputs the amplified voltage signal to an oscilloscope for reading and displaying. According to a responsivity of the THz QWP at a lasing frequency of the laser, the measurement of the output power of the pulsed THz QCL is acquired.

Abstract: A measurement apparatus for surface analysis carried out in a gaseous environment such as air comprises a measurement device capable of measuring a contact potential difference between a probe and a surface, and a light source that triggers photoelectric emission from a sample. The apparatus may operate in “dual” photoemission and contact potential difference (CPD) measurement modes.

Abstract: The present invention relates to an AC or DC power transmission system. The system comprises a first electrical conductor, a second electrical conductor and an insulating space there between. The system further comprises an electric field measurement device comprising the following components being mounted in optical continuation: a first optical fibre being connected to a light source, a first optical lens, a circular polarization filter, a crystal rod having electro-optical properties, a linear polarization filter, a second optical lens, and a second optical fibre being connected to a light detection unit. The electric field measurement device is located adjacent the first electrical conductor and defines a first minimum distance between the crystal rod and the first electrical conductor and a second minimum distance between the crystal rod and the second electrical conductor. The second minimum distance is at least 10 times larger than the first minimum distance.

Abstract: An apparatus for testing photovoltaic cells wherein an array of light sources are provided. The light sources can have a collimating lens. In addition, one or more feedback circuits can be provided which monitor and maintain one or more of the light sources.

Abstract: A voltage sensing apparatus on a semiconductor substrate, including one or more inputs comprising metal contacts, an output comprising a laser transmitter, circuitry electrically connecting and interfacing the inputs to the output; and a power module. A method of fabricating the apparatus is also described.

Abstract: A method for characterizing the sensitivity of an electronic component with respect to a natural radiating environment. The safe operating area (SOA) voltage range beyond which destructive events occur is determined for the electronic component for given characteristics of a particle or incident beam. The electronic component is turned on and energized with the particle or incident beam having the given characteristics under the operating conditions that are close to the highest voltage value of the determined SOA voltage range. An efficient section of amplified transient events, which corresponds to an estimation of the destructive occurrences for the electronic component is determined. The characteristics of the particle or beam is modified and the method is repeated with the modified characteristics.

Abstract: A solar simulator which uses a honeycomb structure for providing highly collimated light for testing one or more photovoltaic cells.

Abstract: An optical sensor assembly, for installation on a current carrying cable, senses the current in the cable and provides an electrical output indicating the current. To sense the current, a magnetic concentrator is placed in close proximity to the cable and creates a magnetic field representing current in the cable. An optical current sensor, within the created magnetic field, exposes a beam of polarized light to the magnetic field. The beam of polarized light is rotated thereby, by Faraday effect, according to the current in the cable. The amount of rotation is analyzed and converted to electrical signals to portray the current in the cable. The electrical signals may be processed, evaluated and analyzed to provide one or more of several elements of quality of the current in the cable.

Abstract: A sensor that senses incident RF signals is provided. The sensor is capable of sensing signals in the Gigahertz (GHz) and Terahertz (THz) range. The sensor may utilize one or more cantilevers, an interferometer, or may be formed in a box-type configuration.

Abstract: An optical sensor assembly has a base unit, an optical current sensor, and a magnetic concentrator. The optical current sensor is mounted on the base unit and includes a polarized light input, a reflective prism, and a light output. The magnetic concentrator defines an airgap and is mounted on a concentrator housing such that the magnetic concentrator fits around the current carrying cable when the base unit is hung from the current carrying cable by hooks and when the concentrator housing is moved to a closed position. The reflective prism of the base unit is operably positioned in the airgap of the magnetic concentrator when the concentrator housing is in the closed position. The assembly further includes a voltage sensor operably positioned in the base unit for measuring the voltage of the current carrying cable.

Abstract: A system for characterizing the electrical properties of semiconductor wafers with high surface state densities, such as GaN wafers, includes a support subsystem for supporting the semiconductor sample, at least one light source for illuminating a spot on the sample, and a detection subsystem for measuring the photovoltage signal produced from illumination of the sample. In use, the system utilizes in-line, non-contact photovoltage techniques that exploits the presence of the high surface state density and the known components of its associated electrostatic barrier as part of its novel characterization process. Specifically, the system illuminates the sample with one or more light beams that vary in photon energy and duration in order to excite charge carriers in specific layers of the sample while either preserving or collapsing the electrostatic barrier. In this manner, the system is able to electrically characterize individual or combined layers of the sample as well as embedded junctions.

Abstract: Systems and methods according to these exemplary embodiments provide for methods and systems related to optical current and voltage sensors and, more particularly, to filters for use in such sensors.

Abstract: A method is provided for detecting laser optical paths in integrated circuit (IC) packages. The method provides an IC die encapsulated as a package in a compound of glass spheres and epoxy. Power is supplied to the IC. The IC is scanned with a laser. Typically, a laser wavelength is used that is minimally absorbed by the glass spheres in the epoxy compound of the IC package, and changes in current to the IC are detected. A detected current change is cross-referenced against a scanned IC package surface region. This process identifies an optical pathway underlying the scanned IC package surface region. In some aspects, this process leads to the identification of a glass sphere-collecting package structure underlying the optical pathway. Examples of a glass sphere-collecting structure might include an inner lead wire, lead frame edge, or die edge.

Abstract: A MOCT metering system includes a cutoff module that ensures zero output when values from an optical module fall below a threshold value. The cutoff module includes an RMS to DC converter that drives a comparator. The comparator drives a switch that causes the cutoff module to pass through the measured signal unmodified if above a threshold value and to output a zero voltage signal if below a threshold value.

Abstract: An optical sensor assembly has a base unit, an optical current sensor, and a magnetic concentrator. The optical current sensor is mounted on the base unit and includes a polarized light input, a reflective prism, and a light output. The magnetic concentrator defines an airgap and is mounted on a concentrator housing such that the magnetic concentrator fits around the current carrying cable when the base unit is hung from the current carrying cable by hooks and when the concentrator housing is moved to a closed position. The reflective prism of the base unit is operably positioned in the airgap of the magnetic concentrator when the concentrator housing is in the closed position. The assembly further includes a voltage sensor operably positioned in the base unit for measuring the voltage of the current carrying cable.

Abstract: A method of measuring a current of a current carrying cable teaches the first step of providing an optical sensor assembly comprising a base unit, and an optical current sensor mounted on the base unit for transmitting a beam of polarized electromagnetic radiation to an optical fiber. A light detector is also provided having a first channel that operably connecting the light detector to an analog to digital converter through a programmable gain amplifier, a second channel that operably connects the light detector directly to the analog to digital converter, and a processor operably connected to the analog to digital converter. The optical sensor assembly is mounted adjacent the current carrying cable, and the fiber optic is operably connected to a light detector. A plurality of factors are then evaluated from rotation information from the light detector, by using the first and second channels for analog to digital conversion operably connected with the processor.

Abstract: There is provided an electromagnetic field measurement apparatus capable of achieving correct and timely circuit operation detection in an area where electronic devices are mounted at high density. An electromagnetic field measurement apparatus includes: a laser light source; a polarized wave controller that linearly polarizes laser light; an optical fiber probe that has an electrooptic material or a magnetooptic material at its leading end and in which the laser light reflected at the leading end is subjected to polarization modulation in accordance with an electric field intensity or a magnetic field intensity; and an analyzer that converts the laser light reflected by the optical fiber probe into intensity modulated light. The laser light source emits time-multiplexed laser light of a plurality of wavelengths different from one another.

Abstract: An apparatus and method for laser probing of a DUT is disclosed. The system enables laser voltage imaging state mapping of devices within the DUT. A selected area of the DUT is illuminating a while the DUT is receiving test signals causing certain of the active devices to modulate. Light reflected from the DUT is collected and is converted into an electrical signal. Phase information is extracting from the electrical signal and a two-dimensional image is generated from the phase information, wherein the two-dimensional image spatially correlates to the selected area.

Abstract: An apparatus, for measuring an applied electrical field and for reducing perturbation to the electrical field being measured, includes a laser integrated into an electro optic crystal sensor head prior to the output fiber. A probe beam is passed along the crystal direction of low birefringence of nearly circular optical indicatrix, rather than one of high EO modulation. The EO crystal is placed between two crossed polarizers and oriented such that a small tilt angle is subtended between its optic axis and the path of the probe beam. Improved optical coupling is achieved by using a large core multimode fiber at the output, to reduce optical insertion losses. A collimating lens emits the intensity modulated laser beam back to a photodetector, where the intensity modulated laser beam is converted to an electrical signal representing both field strength and phase of the electrical field applied to the sensor head.

Abstract: A method for analyzing an integrated circuit includes: a step (102) for applying laser radiation at a point on the surface of the circuit; a step (106) for exciting the circuit thus subjected to laser radiation by applying an electrical excitation signal; a step (106) for collecting the response of the circuit to the excitation, the circuit being subjected to laser radiation; a step (106) for measuring the phase difference between the response to the excitation of the circuit subjected to laser radiation and a reference response of the circuit in the absence of laser radiation applied to the circuit. An associated observation method and installation are also disclosed.

Abstract: The magnitude of an amplitude waveform of an electromagnetic wave generated when irradiating a pulse laser beam to a structure A including diffusion regions provided in the structure of a semiconductor device to be inspected is compared with the magnitude of an amplitude waveform of an electromagnetic wave radiated when irradiating the pulse laser beam to a structure A of a reference device measured in advance, and the detection sensitivity of the electromagnetic wave is corrected (S14). Thereafter, measurement errors caused by variations in the detection sensitivity of electromagnetic waves of an inspecting apparatus are eliminated by inspecting the semiconductor device as an inspection target, so that the quality of the semiconductor device is precisely determined (S16).

Abstract: A system for an embodiment includes a sensor device having at least one sensor adapted to monitor at least one parameter associated with a circuit and selectively provide measurement information on the at least one parameter. The at least one sensor may include an electrical sensor adapted to monitor an electrical parameter of the circuit for the sensor device to selectively provide as the measurement information, and wherein the sensor device includes a wireless transceiver within the sensor device and is adapted to transmit the measurement information and receive control information.

Abstract: The present invention provides an optoelectronic memory device, the method for manufacturing and evaluating the same. The optoelectronic memory device according to the present invention includes a substrate, an insulation layer, an active layer, source electrode and drain electrode. The substrate includes a gate, and the insulation layer is formed on the substrate. The active layer is formed on the insulation layer, and more particularly, the active layer is formed of a composite material comprising conjugated conductive polymers and quantum dots. Moreover, both of the source and the drain are formed on the insulation layer, and electrically connected to the active layer.

Abstract: An electric field sensor is obtained by directly forming an electrooptical film of Fabry-Perot resonator structure on a polished surface at a tip of an optical fiber by an aerosol deposition method.

Abstract: An optical interferometer used to measure the current in a conductor, where the gap between the mirror and the quarter wave plate is minimized, and the gap is shielded magnetically. Additionally, at least the modulator is shielded, and preferably the case containing many of the components, such as the integral number of turns of optical fiber in a coil, is magnetically shielded. By shielding the components, and reducing the gap between the quarter wave plate and the mirror, the error in the current measurement is substantially reduced.

Abstract: The current in a conductor is measured by exploiting the Faraday effect in a sensing fiber. The light returning from the sensing fiber is split into at least two parts, at least one of which is analyzed by a first circular analyzer for generating a first signal. A second part may e.g. be analyzed by a second circular analyzer, and a third part may be analyzed by a linear analyzer. By combining the signals obtained in this way, the current induced phase delay in the returning light can be measured efficiently and accurately.

Abstract: Systems, methods and sensors detect changes in incident optical radiation. Current is driven through one or more active areas of a detector while the incident optical radiation illuminates the active areas. Voltage is sensed across one or more of the active areas, a change in the voltage being indicative of the changes in incident optical radiation.

Abstract: A deflector which enables to have a sufficient degree of freedom of designing and also to detect accurately a displacement angle of a movable plate can be provided. In order to accomplish this, the deflector includes a mirror, a base frame, a pair of torsion bars which pivotably support the mirror with respect to the base frame, a drive coil which is provided on the mirror, two permanent magnets which generate a magnetic flux which acts in the drive coil, two capacitive sensors which output an angle of oscillation of the mirror as electrical characteristics, a connecting portion which electrically connects on the mirror a first end out of two ends of the drive coil and one end of electric terminals of the two capacitive sensors, and a first wire which is drawn from the connecting portion up to the torsion bars via the base frame.

Abstract: A universal diagnostic platform (UDP) is described which incorporates several measurement modules for testing a device under test (DUT). Users can switch between measurement modules without removing the DUT. The UDP employs a common fixturing and software system for all the modules.