Abstract: A gate driver with an integrated Miller clamp controls a high-power drive device coupled to a terminal of a package that houses an integrated circuit coupled to the terminal. A method includes generating an indication of a level of a signal on the terminal with respect to a predetermined signal level. The method includes configuring a variable strength driver of the integrated circuit to charge, discharge, or clamp the terminal based on a control signal and the indication.

Abstract: An integrated circuit includes rows of circuits. A first region of the integrated circuit includes a first portion of each of the rows of circuits, and a second region of the integrated circuit includes a second portion of each of the rows of circuits. The integrated circuit shifts functions for a first subset of the rows of circuits to a second subset of the rows of circuits in the first region based on a first defect in a first one of the rows of circuits in the first region. The integrated circuit shifts functions for a third subset of the rows of circuits to a fourth subset of the rows of circuits in the second region based on a second defect in a second one of the rows of circuits in the second region.

Abstract: A system and method for reducing power consumption in a reconfigurable integrated circuit. Some embodiments provide placement and routing programs that reduce the number of bits to be reconfigured. Some embodiments provide placement and routing programs that increase the number of groups of circuits that do not need reconfiguration at some times. Some embodiments include circuits that selectively block reconfiguration.

Abstract: The disclosure relates generally to sequential state elements (SSEs), triple-mode redundant state machines (TMRSMs), and methods and systems for testing triple-mode redundant pipeline stages (TMRPSs) within the TMRSMs using triple-mode redundant SSEs (TMRSSEs). The SSEs, TMRSMs, TMRPSs, and TMRSSEs may be formed as integrated circuits on a semiconductor substrate. Of particular focus in this disclosure are SSEs used to sample and hold bit states. Embodiments of the SSEs have a self-correcting mechanism to protect against radiation-induced soft errors. The SSE may be provided in a pipeline circuit of a TMRSM to receive and store a bit state of a bit signal generated by combinational circuits within the pipeline circuit. More specifically, the SSEs may be provided in a TMRSSE configured to perform self-correction. Also disclosed are methods for using the TMRSSE to test redundant pipeline stages of the TMRSM.

Abstract: A circuit structure (200) for suppressing single event transients (SETs) or glitches in digital electronic circuits is provided. The circuit structure includes a first input (100) which receives an output of a digital electronic circuit (A), a second input (100?) which receives a redundant or duplicated output of the digital electronic circuit (A?), and two sub-circuits (102, 106) that each receive the inputs and have one output. One of the sub-circuits is insensitive to a change in the value of one of its inputs when the inputs are in a first logic state and the other sub-circuit is insensitive to a change in the value of one of the inputs when the inputs are in a second, inverted logic state. The sub-circuit outputs are input into a two-input multiplexer (202) which has its output (204) connected to its selection port (SEL), and the sub-circuits are arranged so that the sub-circuit which is insensitive to a change in the value of one of its inputs is selected whenever the output of the multiplexer changes.

Abstract: A circuit structure (200) for suppressing single event transients (SETs) or glitches in digital electronic circuits is provided. The circuit structure includes a first input (100) which receives an output of a digital electronic circuit (A), a second input (100?) which receives a redundant or duplicated output of the digital electronic circuit (A?), and two sub-circuits (102, 106) that each receive the inputs and have one output. One of the sub-circuits is insensitive to a change in the value of one of its inputs when the inputs are in a first logic state and the other sub-circuit is insensitive to a change in the value of one of the inputs when the inputs are in a second, inverted logic state. The sub-circuit outputs are input into a two-input multiplexer (202) which has its output (204) connected to its selection port (SEL), and the sub-circuits are arranged so that the sub-circuit which is insensitive to a change in the value of one of its inputs is selected whenever the output of the multiplexer changes.

Abstract: A latch circuit includes a feedback circuit having inverter circuits and at least two input terminals and an input circuit for inputting input signals or signals having the same phase as the input signals to the input terminals of the feedback circuit in synchronization with a clock signal. In the feedback circuit section, only when the input signals or the signals having the same phase as the input signals are input to the at least two input terminals at the same time, positive feedback using a predetermined number of amplification stages is applied to the input terminals.

Abstract: This invention comprises a layout method to effectively protect logic circuits against soft errors (non-destructive errors) and circuit cells, with layout, which are protected against soft errors. In particular, the method protects against cases where multiple nodes in circuit are affected by a single event. These events lead to multiple errors in the circuit, and while several methods exist to deal with single node errors, multiple node errors are very hard to deal with using any currently existing protection methods. The method is particularly useful for CMOS based logic circuits in modern technologies (.ltoreq.90 nm), where the occurrence of multiple node pulses becomes high (due to the high integration level). It uses a unique layout configuration, which makes the circuits protected against single event generated soft-errors.

Abstract: A semiconductor integrated circuit according to one embodiment includes a plurality of flip-flop groups configured by dividing a plurality of flip-flops, connected in series, for carrying out a serial operation of serially transferring data, a continuous signal determination circuit configured to output a first signal if outputs of the flip-flops contained in the flip-flop group match, and output a second signal in other cases; and a clock gating circuit configured not to provide a clock signal when receiving the first signal and to provide a clock signal when receiving the second signal with respect to the flip-flops other than a head of the flip-flop group.

Abstract: A selectable latch has a pair of parallel pass gates (a first parallel pass gate that receives a seed signal, and a second parallel pass gate that receives a data signal). A first latch logic circuit performs logic operations using signals output by the parallel pass gates to produce an updated data signal. An additional pass gate is operatively connected to the first latch logic circuit. An additional pass gate controls passage of the updated data signal. The output of the parallel pass gates and the additional pass gate is connected to a feedback loop. The feedback loop operates as a dynamic latch for high frequency applications or as a static latch for low frequency applications. Thus, the selectable latch comprises two inputs into the pair of parallel pass gates and performs only one of four logical operations on a received data signal.

Abstract: A soft-error resistant redundant latch including a first stage and second stage, each stage coupled to receive and to latch a binary signal in a latched state. Each stage is arranged to maintain the latched state at an intermediary node of the stage in response to a feedback path internal to the stage and in response to a stage output signal from the other stage. Each stage is arranged to generate a stage output signal in response to the latched state of the stage. The state of each stage is set to a first selected state by selectively coupling a stage set transistor between a first power rail and the intermediary node of the first stage in response to a set signal. The stage set transistor of the first stage and the stage set transistor of the second stage are complementary types.

Abstract: A three dimensional semiconductor device is described with two transistor layers overlaid. The first transistor layer comprises a plurality of flip-flops each having an input and an output, wherein the inputs are selectively coupleable to the second transistor layer.

Abstract: A semiconductor device according to a first aspect of the present invention includes: a first circuit that outputs a first output value having a majority of output values received from N (N is three or more odd numbers) pieces of data hold circuits receiving a same input value; and a second circuit that outputs a second output value which is less than the majority of output values received from the N pieces of the data hold circuits.

Abstract: According to one general aspect, an apparatus may include a clock channel, a shielding tunnel, and clock repeaters. In various embodiments, the clock channel may be configured to carry the clock signal, and may include a portion of a metal layer of an integrated circuit. In some embodiments, the shielding tunnel may be configured to shield, in at least four directions, the clock channel from other signals, and may include portions of a at least three metal layers of the integrated circuit. The shielding tunnel may be connected to the positive and negative supplies in order to provide the required power for the clock repeaters.

Abstract: Managing reliability of a circuit that includes a plurality of duplicate components, with less than all of the components being active at any time during circuit operation, where reliability is managed by operating, by the circuit, with a first set of components that includes a predefined number of components; selecting, without altering circuit performance and in accordance with a circuit reliability protocol, a second set of components with which to operate, including activating an inactive component and deactivating an active component of the first set of components; and operating, by the circuit, with the second set of components.

Abstract: An embodiment may include circuitry that may be comprised in a host. The host may include memory and a host processor to execute an operating system. The circuitry may be to determine, independently of the operating system and the host processor, the authenticity of signature list information, based at least in part upon authentication information received by the circuitry from a remote server. The circuitry also may be to determine, independently of the operating system and the host processor, based at least in part upon comparison of at least one portion of the signature list information with at least one portion of contents of the memory, whether authorized and/or malicious data are present in the at least one portion of the contents of the memory. Of course, many variations, modifications, and alternatives are possible without departing from this embodiment.

Abstract: A soft-error resistant redundant latch including a first stage and second stage, each stage coupled to receive and to latch a binary signal in a latched state. Each stage is arranged to maintain the latched state at an intermediary node of the stage in response to a feedback path internal to the stage and in response to a stage output signal from the other stage. Each stage is arranged to generate a stage output signal in response to the latched state of the stage. The state of each stage is set to a first selected state by selectively coupling a stage set transistor between a first power rail and the intermediary node of the first stage in response to a set signal. The stage set transistor of the first stage and the stage set transistor of the second stage are complementary types.

Abstract: A system and method for soft error detection in digital ICs is disclosed. The system includes an observing circuit coupled to a latch, which circuit is capable of a response upon a state change of the latch. The system further includes synchronized clocking provided to the latch and to the observing circuit. For the latch, the clocking defines a window in time during which the latch is prevented from receiving data, and in a synchronized manner the clocking is enabling a response in the observing circuit. The clocking is synchronized in such a manner that the circuit is enabled for its response only inside the window when the latch is prevented from receiving data. The system may also have additional circuits that are respectively coupled to latches, with each the additional circuit and its respective latch receiving the synchronized clocking Responses of a plurality of circuits may be coupled in a configuration corresponding to a logical OR.

Abstract: Self Restoring Logic (SRL) provides for SEU tolerance in high speed circuits. An SRL cell is designed to be stable in one of two internal states. Upon an SEU event, the SRL cell will not transition between the internal stable states and recover from an SEU. SRL circuits are realized with SRL storage cells driving succeeding SRL storage cells directly or through combinational logic such that the corruption of any one internal state variable in the driving SRL cell and it's the associated combinational output logic can affect at most one internal state variable of the succeeding SRL cell. An SRL circuit does not allow propagation of single SEU faults.

Abstract: The different advantageous embodiments provide an integrated circuit comprising a number of latches and a number of filters. Each latch in the number of latches has a plurality of inputs and a plurality of storage nodes. The plurality of storage nodes includes a number of pairs of circuit nodes that form a number of upsettable circuit node pairs. Each input of the plurality of inputs is connected to a corresponding storage node in the plurality of storage nodes. Each filter in the number of filters has an input and a plurality of outputs. Each of the plurality of outputs is connected to a corresponding input of the plurality of inputs of a latch in the number of latches. Each filter in the number of filters is located between two circuit nodes forming an upsettable circuit node pair of the latch in the number of latches to increase critical node spacing.

Abstract: A latch circuit includes a feedback circuit having inverter circuits and at least two input terminals and an input circuit for inputting input signals or signals having the same phase as the input signals to the input terminals of the feedback circuit in synchronization with a clock signal. In the feedback circuit section, only when the input signals or the signals having the same phase as the input signals are input to the at least two input terminals at the same time, positive feedback using a predetermined number of amplification stages is applied to the input terminals.

Abstract: New and improved methods and circuit designs for asynchronous circuits that are tolerant to transient faults, for example of the type introduced through radiation or, more broadly, single-event effects. SEE-tolerant configurations are shown and described for combinational logic circuits, state-holding logic circuits and SRAM memory circuits.

Abstract: A system and method for soft error detection in digital ICs is disclosed. The system includes an observing circuit coupled to a latch, which circuit is capable of a response upon a state change of the latch. The system further includes synchronized clocking provided to the latch and to the observing circuit. For the latch, the clocking defines a window in time during which the latch is prevented from receiving data, and in a synchronized manner the clocking is enabling a response in the observing circuit. The clocking is synchronized in such a manner that the circuit is enabled for its response only inside the window when the latch is prevented from receiving data. The system may also have additional circuits that are respectively coupled to latches, with each the additional circuit and its respective latch receiving the synchronized clocking. Responses of a plurality of circuits may be coupled in a configuration corresponding to a logical OR.

Abstract: A semiconductor integrated circuit device includes a target circuit of a low power consumption mode having at least one flip-flop circuit to which a clock signal is supplied in a normal operation mode and in a low power consumption mode, and a logic circuit to which each output of the at least one flip-flop circuit is input, wherein each of the flip-flop circuits includes a selector that selects a normal data signal in the normal operation mode, selects an inverted output of the flip-flop circuit in the low power consumption mode, based on an operation-mode switching signal that designates switching between the normal operation mode and the low power consumption mode, and inputs the selected signal to a data input terminal of the flip-flop circuit.

Abstract: A speed performance measurement circuit that may perform speed performance measurement is provided between a first logic circuit and a second logic circuit. The speed performance measurement circuit includes a first flip flop that stores first data, a first delay circuit that delays the first data and generates second data, and a second flip flop that stores the second data. Furthermore, the speed performance measurement circuit includes a first comparator circuit that compares output of the first flip flop to output of the second flip flop, and a third flip flop that stores output data from the first comparator circuit in accordance with timing of the first clock signal. Data in a normal path is compared to data in a path delayed by a certain time to measure speed, and power voltage of a circuit is determined based on such comparison. Thus, change in speed with respect to power voltage in a critical path can be measured.

Abstract: An exemplary aspect of the invention is to conduct delay tests under actual operating conditions for a semiconductor integrated circuit including multiple logic circuits operating based on clocks of different frequencies, without causing any inconveniences when a test clock is set to a high-frequency side or a low-frequency side. The semiconductor integrated circuit includes: a first logic block that operates based on a first clock; a second logic block that operates based on a second clock having a frequency different from that of the first clock; and a test circuit connected between the first logic block and the second logic block. The test circuit outputs an output of the first logic block set as a test target, without passing through the second logic block, and transmits an input value received without being passed through the first logic circuit, to the second logic circuit set as a test target.

Abstract: A method of ACM acquisition/confirmation of a plurality of logic signals SI(i) combines a loop for the single confirmation processing for all the sampled signals, with a sequential sampling of these signals. On each sampling, the confirmation loop processes the current sampled signal SI(i), in order to decide on the updating of an output register Qs(i) with the current sampled state Sk, depending on whether or not it is confirmed, either that this state is not to be confirmed, or that this state is to be confirmed, and that the associated confirmation duration ? has elapsed.

Abstract: This invention comprises a layout method to effectively protect electronic circuits against soft errors (non-destructive errors) and circuit cells, which are protected against soft errors. The invention applies a layout method to sequential and combinational logic to generate specific circuit cells with netlists and layouts which are hardened against single event generated soft-errors. It also devices methods of how two or more such cells should be laid out and placed relative to each other, in order to have the best global soft-error protection.

Abstract: The invention relates to a testable integrated circuit. In order to replace ground and VDD in certain points of such a circuit, the circuit comprises a cell (34) which comprises a flipflop (11) and means (31) able to set the output voltage of the cell when the circuit is in the operation mode. These means for setting the output voltage are controlled by a control signal (15) which depends on the mode signal that indicates whether the signal is in the test mode or in the operation mode.

Abstract: A method and a Dual Interlocked Storage Cell (DICE) latch implementing enhanced testability includes an L1 latch and an L2 latch coupled to the L1 latch. Each L1 latch and each L2 latch includes redundant latch structures. A separate output is provided with the redundant L2 latch. The DICE latch includes a Redundant Test Latch Enable (RTLE) input. Each L1 latch and each L2 latch includes a path selector control in the redundant latch structures controlled by the RTLE input providing each of the redundant latch structures in a scan path during a test mode.

Abstract: A method and Dual Interlocked Storage Cell (DICE) latch for implementing enhanced testability, and a design structure on which the subject DICE latch circuit resides are provided. DICE latch includes an L1 latch and an L2 latch are coupled to the L1 latch. Each L1 latch and each L2 latch includes redundant latch structures. A separate output is provided with the redundant L2 latch. The DICE latch includes a Redundant Test Latch Enable (RTLE) input. Each L1 latch and each L2 latch includes a path selector control in the redundant latch structures controlled by the RTLE input providing each of the redundant latch structures in a scan path during a test mode.

Abstract: A redundancy scrubber. The novel scrubber includes fault detection logic for detecting if a circuit has been upset and a mechanism for automatically rewriting data to the circuit when an upset is detected. In an illustrative embodiment, the scrubber corrects for upsets in a circuit comprised of a plurality of redundant circuits, each redundant circuit including a data port for receiving data and a load enable port for controlling when the redundant circuit should load new data. The fault detection logic processes the outputs from each of the redundant circuits and outputs a fault detect signal indicating whether an upset has been detected in one or more of the redundant circuits. The fault detect signal is coupled to the load enable ports, forcing the redundant circuits to immediately reload with corrected data from a voter or with new incoming data when an upset is detected.

Abstract: A semiconductor integrated circuit, able to repair a fault and normally operate as an overall circuit even when a fault occurs in a portion of the circuit, and able to reduce a change of signal delay along with the repair of the fault, including N (larger than 2) number of circuit modules which can replace each other's functions; circuit blocks each including R (larger than 1 but smaller than N) number of I/O units for outputting at least one signal to one circuit module, and receiving at least one signal generated in the one circuit module; and a circuit module selection unit configured to select R number of circuit modules from among the N number of circuit modules in response to a control signal, connect the selected R number of circuit modules and R number of I/O units of the circuit block in a 1:1 correspondence, and connect one circuit module selected from at least two circuit modules in response to the control signal to each of the R number of I/O units, and a method of producing the same.

Abstract: New and improved methods and circuit designs for asynchronous circuits that are tolerant to transient faults, for example of the type introduced through radiation or, more broadly, single-event effects. SEE-tolerant configurations are shown and described for combinational logic circuits, state-holding logic circuits and SRAM memory circuits.

Abstract: A method and apparatus for a structure of a flip-flop that is tolerant to the noise pulses occurring due to the presence of crosstalk faults by sampling the input data multiple times before and after the active clock edge. The final stored value at the flip-flop is determined by the resolution of a counter circuit residing in the flip-flop, which is activated at the change of the sampled input data. This counter based resolution mechanism allows for the detection and filtering of the noise pulse induced at the input of the flip-flop due to a crosstalk fault.

Abstract: A method for single event transient filtering in an integrated circuit device is described. The device comprises three sequential elements, each having a data input and a data output with each of the three data outputs coupled to one of three inputs of a voting gate. The method comprises generating first and second nominally equivalent logic signals in first and second SET domains, converting the first and second nominally equivalent logic signals into first, second and third nominally equivalent data channels, and transmitting the first, second and third nominally equivalent data channels to the data inputs of the first, second and third sequential elements.

Abstract: There is provided a semiconductor device including: plural macros each having plural normal blocks and a redundant block to be used as a replacement for a normal block; a first replacement information storage unit storing first replacement macro information to designate a macro to be subjected to the replacement out of the plural macros and first replacement block information to designate a normal block to be subjected to the replacement; a first transmission line serially connecting the plural macros; and a replacement information transmission circuit transmitting replacement information to the designated normal block in the designated macro via the first transmission line based on the first replacement macro information and the first replacement block information.

Abstract: New and improved methods and circuit designs for asynchronous circuits that are tolerant to transient faults, for example of the type introduced through radiation or, more broadly, single-event effects. SEE-tolerant configurations are shown and described for combinational logic circuits, state-holding logic circuits and SRAM memory circuits.

Abstract: The invention relates to a testable integrated circuit. In order to replace ground and VDD in certain points of such a circuit, the circuit comprises a cell (34) which comprises a flipflop (11) and means (31) able to set the output voltage of the cell when the circuit is in the operation mode. These means for setting the output voltage are controlled by a control signal (15) which depends on the mode signal that indicates whether the signal is in the test mode or in the operation mode.

Abstract: A register designed to detect and correct soft errors in real time. A redundant latch is added to the existing structure of a flip flop and functional data is simultaneously registered at multiple latches. The content of these multiple latches are fed to a majority voting circuit. If the content of any of these latches is corrupted by soft error, it is filtered out through the majority voting circuit and correct data is passed out from the output of the flip flop. In one embodiment, this design operates as a simple scan flip flop or scan-hold flip flop, and is useful for system testability purposes.

Abstract: A latch circuit includes a feedback circuit having inverter circuits and at least two input terminals and an input circuit for inputting input signals or signals having the same phase as the input signals to the input terminals of the feedback circuit in synchronization with a clock signal. In the feedback circuit section, only when the input signals or the signals having the same phase as the input signals are input to the at least two input terminals at the same time, positive feedback using a predetermined number of amplification stages is applied to the input terminals.

Abstract: The invention relates to a testable integrated circuit. In order to replace ground and VDD in certain points of such a circuit, the circuit comprises a cell (34) which comprises a flipflop (11) and means (31) able to set the output voltage of the cell when the circuit is in the operation mode. These means for setting the output voltage are controlled by a control signal (15) which depends on the mode signal that indicates whether the signal is in the test mode or in the operation mode.

Abstract: A semiconductor integrated circuit including: N modules set in their functions in accordance with input function setting data, a circuit block having R number of I/O parts, and a module selection part for selecting R number of modules from among the N number of modules connecting the selected R number of modules and R number of I/O parts of the circuit block and connecting one module selected from among at least two modules to each of the R number of I/O parts. Each of the R number of I/O parts has a data holding part for holding a function setting data and inputting the held function setting data to the destination module, and N modules are able to replace functions of each other when the input function setting data are the same.

Abstract: Methods and systems for hardening a clocked latch against single event effects are disclosed. A system includes a first three-input OR gate, a first NAND gate, a second three-input OR gate, and a second NAND gate. The first three-input OR gate receives as inputs a clock signal, a first signal, and a redundant first signal. An output of the first three-input OR gate is connected to an input of the first NAND gate. The second three-input OR gate receives as inputs the clock signal, a second signal, and a redundant second signal. An output of the second three-input OR gate is connected to an input of the second NAND gate. A first output signal of the first NAND gate is connected to another input of the second NAND gate and a second output signal of the second NAND gate is connected to another input of the first NAND gate.

Abstract: To strengthen tolerance to radiation. Source and back gate of P-channel transistor P1 are connected to power supply. Gate of the P-channel transistor P1 is connected to input terminal IN. Drain of P1 is connected to output terminal OUT. Source and back gate of N-channel transistor N1 are grounded. Gate of N1 is connected to IN. Drain of N1 is connected to OUT. Cathode of diode D1 is connected to power supply, anode of D1 being connected to OUT. Cathode of diode D2 is connected to OUT, anode of D2 being grounded. When seen from a direction perpendicular to a substrate on which an inverter circuit is formed, a projection plane of a region of a p+ diffusion layer 32 of D1 includes a projection plane of a region of an n+ diffusion layer 24 of N1, and a projection plane of a region of an n+ diffusion layer 41 of the diode D2 includes a projection plane of a region of a p+ diffusion layer 14 of P1.

Abstract: A semiconductor system and method for repairing failures of a packaged integrated circuit system are provided. The method includes detecting a failure associated with a packaged integrated circuit system after the packaged integrated circuit system is packaged, and repairing the failure by activating a redundancy circuit in the packaged integrated circuit system and deactivating a defective circuit associated with the failure. The process for repairing the failure includes applying a repair voltage to a polysilicon fuse to change a conductivity state of the polysilicon fuse from a first state to a second state. In another embodiment, the polysilicon fuse is replaced by a metal fuse, an anti-fuse, or a non-volatile random access memory.

Abstract: A decision block is incorporated into a circuit design to provide hardening against single event upset and to store data. The decision block includes a storage element that stores data as long as inputs to the decision block remain constant. The decision block receives a first data input and second data input from redundant logic blocks or from logic blocks designed to provide complementary outputs. The decision block provides an output that is at a same logic level as the first data input if the two data inputs are at expected logic levels during normal operating conditions (i.e., no disturbances). The decision block provides an output that is at a same logic level as a previous output of the decision block if the two data inputs are not at expected logic levels during normal operating conditions.

Abstract: An embodiment of the present invention provides a programmable logic device (“PLD”) including one or more dedicated blocks of circuitry within one or more repairable logic array regions. Aspects of the present invention provide circuitry and methods for controlling shifting of programming data in normal and redundant modes for both dedicated block regions and fully repairable logic array regions during both regular and test programming sequences of a PLD. Other aspects provide circuitry and methods for interface routing between dedicated blocks and repairable logic array regions in both normal and redundant modes. Various other aspects are also disclosed.

Abstract: A transceiver provides a high-speed transmission signal using shared resources and reduced area. A differential amplifier has its current source/sink connected to a supply terminal. A multiplexing circuit is configured to connect an input of the differential amplifier to an I/O pad so as to output a received input/output signal to internal integrated circuit logic during one mode, or alternatively connect an output of the differential amplifier to the I/O pad so as to output a signal received from the internal integrated circuit logic for input/output during another mode. A level translation operation on the signal may be performed with respect to outputting the signal received from the internal integrated circuit logic.

Abstract: A data processing apparatus comprises a plurality of input signal lines, a plurality of output signal lines and an electronic circuit. The electronic circuit inputs first data from the plurality of input signal lines and outputs second data to the plurality of output signal lines. The first data is one bit data represented by a combination of bits of the plurality of input signal lines. The second data is one bit data represented by a combination of bits of the plurality of output signal lines.