Abstract: A system for debugging circuits includes an integrated circuit configured to implement a circuit under test and a logic analyzer controller coupled to the circuit under test. The system includes a host computing system configured to communicate with the logic analyzer controller and provide a debug command to the logic analyzer controller. The logic analyzer controller, in response to the debug command, controls operation of the circuit under test.

Abstract: A method is provided for operating a volatile memory device. The method includes performing a first initialization operation for the volatile memory device based on a boot code received from an external memory controller, storing the boot code in an internal register, reading the boot code stored in the internal register based on a first signal received from the external memory controller when the first initialization operation is not normally performed, and performing a second initialization operation for the volatile memory device based on the boot code read from the internal register.

Abstract: A semiconductor apparatus includes a direct access section, an interface section, and a through-silicon via region. The direct access section receives a normal clock, a first clock, and a control signal through a direct access pad. The interface section comprises a plurality of channel circuits suitable for aligning the control signal to the first clock, and outputting an aligned control signal. The through-silicon via region transfers the normal clock and the aligned control signal from the interface section to a plurality of channels corresponding to the respective channel circuits.

Abstract: An integrated circuit includes a duty cycle detection circuit, a comparator circuit, and a tuning circuit. The duty cycle detection circuit receives a clock signal, such as a system clock signal, and detects the level of duty cycle distortion in the clock signal. The comparator circuit then generates an output based on the level of duty cycle distortion that is detected in the clock signal. The tuning circuit may accordingly adjust the clock signal based on the output generated by the comparator circuit to produce an adjusted clock output signal. As an example, the clock output signal produced by the tuning circuit after the adjustment may have a 50% (or significantly close to 50%) duty cycle.

Abstract: A semiconductor integrated circuit includes a plurality of semiconductor chips stacked in a multi-layer structure; a correction circuit in each semiconductor chip configured to reflect a delay time corresponding to the position of the chip in the stack into an input signal to output to each semiconductor chip; and a plurality of through-chip vias formed vertically through each of the semiconductor chips and configured to transmit the input signal to the semiconductor chip.

Abstract: A semiconductor integrated circuit includes a plurality of semiconductor chips stacked in a multi-layer structure; a correction circuit in each semiconductor chip configured to reflect a delay time corresponding to the position of the chip in the stack into an input signal to output to each semiconductor chip; and a plurality of through-chip vias formed vertically through each of the semiconductor chips and configured to transmit the input signal to the semiconductor chip.

Abstract: In certain arrangements and methods, a reset-able counter (100) produces multiple delay times as required by, for example, a finite state machine. The counter (100) counts a stored value by a configurable amount. That configurable amount is determined based upon the period of a clock cycle divided by a desired time unit. The value held by the counter does not represent a count of clock cycles, but rather a count of time units. In other aspects, a device generates fixed delays derived from a variable frequency input clock. The device includes a count circuit (100) and a comparator (114, 116). The number of time-units between consecutive clock edges of the input clock is stored, and the count circuit changes a current-count value by a corresponding amount, with the change being responsive to a clock edge of the input clock. The comparator (114, 116) compares the current-count value to a fixed value that represents a fixed delay time.

Abstract: A timer circuit, comprises a delay indication circuit, a frequency indication circuit, and a plurality of counters. The delay indication circuit is for providing a delay time indication. The frequency indication circuit is for providing a frequency indication of a frequency of a clock signal. Each counter of the plurality of counters includes a load input to receive an initial value, and an indication output to provide a count complete indication of the counter. During operation a set of the counters of the plurality of counters is coupled in series to provide an indication that a delay time has expired. At least a portion of the frequency indication is provided to the load input of one counter of the set and at least a portion of the delay time indication is provided to the load input of another counter of the set.

Abstract: A counter circuit is provided that can switch delay times by use of a simple circuit configuration. A counter circuit includes plural stages of flip flops connected in cascade, in which a flip flop in a first stage receives a clock from an oscillator as an input signal, and a flip flop in a given stage after the first stage receives a Q output of a preceding stage as an input signal, wherein all or part of the plural stages of flip flops receive a mode signal, and wherein each of the plural stages of flip flops divides by 2 a frequency of the received input signal for output as a Q output when the mode signal indicates a normal delay mode, and each stage of the flip flops that receives the mode signal allows through passage of the received input signal for output as a Q output when the mode signal indicates a delay shortened mode.

Abstract: In certain arrangements and methods, a reset-able counter (100) produces multiple delay times as required by, for example, a finite state machine. The counter (100) counts a stored value by a configurable amount. That configurable amount is determined based upon the period of a clock cycle divided by a desired time unit. The value held by the counter does not represent a count of clock cycles, but rather a count of time units. In other aspects, a device generates fixed delays derived from a variable frequency input clock. The device includes a count circuit (100) and a comparator (114, 116). The number of time-units between consecutive clock edges of the input clock is stored, and the count circuit changes a current-count value by a corresponding amount, with the change being responsive to a clock edge of the input clock. The comparator (114, 116) compares the current-count value to a fixed value that represents a fixed delay time.

Abstract: Delay lock loop circuits are described, which may include two or more delay stages that each includes a plurality of selectable delay elements. A reference signal drives an input of the first delay stage, which provides a first output. The first output drives an input of the second delay stage, which provides a second output. The circuits further include a first selector register that is associated with the first delay stage. A value maintained in the first selector register determines a number of the selectable delay elements utilized in the first delay stage. The circuits further include a second selector register associated with the second delay stage. A value maintained in the second selector register determines a number of the selectable delay elements utilized in the second delay stage. Modification of the values maintained in the first and second selector registers are synchronized to the first and second outputs, respectively.

Abstract: A timing generator that needs no analog circuit for adding jitters and allows the circuit scale and power consumption to be reduced.

Abstract: An output enable signal generating circuit including a first count value generation unit that provides a first count value by executing a counting operation, starting from an initial count value corresponding to a CAS latency information, the counting operation being executed in response to an internal clock signal, a second count value generation unit that provides a second count value that is counted in response to an external clock signal and an output enable signal generation unit for generating an output enable signal that is activated at every timing when the second count value and the first count value become equal to each other, in response to each of a plurality of read commands.

Abstract: When certain digital circuit devices receive data bus signals, I/O interfaces need to sample the data signals during a time when these signals are both valid and stable. Typically, the data signals are sampled at a time corresponding to a point halfway between rising and falling edges of a reference clock signal associated with the data bus, which sampling time corresponds to a 90-degree phase shift of the reference clock signal. In one embodiment of the invention, a delay count generator determines a delay value corresponding to a quarter cycle (i.e., 90 degrees) of the reference clock signal. In making this determination, a counter counts the number of clock cycles of an internally generated, relatively high-frequency clock signal, where the number corresponds to a specified portion (e.g., one half) of a period of a divided-down version of the reference clock signal. That number can then be used to generate the 90-degree delay value.

Abstract: Methods, circuits, devices, and systems are provided, including a delay line for a delay-locked loop. One method includes providing a reference clock to a first delay unit in a delay line. The delay line includes a number of delay units coupled together. Even delay units, among the delay units, are coupled to an even clock line to generate a first intermediate clock. Odd delay units are coupled to an odd clock line to generate a second intermediate clock. The even and odd delay units are configured to in a manner intended to restrict an increase in drive to load ratio and to intrinsic delay as additional delay units are coupled to the number of delay units.

Abstract: A logic circuit block and a memory circuit block are provided on a semiconductor chip. A timing adjustment circuit block for adjusting the propagation timing of signals is provided on a line between the circuit blocks. A timing adjustment circuit unit includes: a delay element block including a plurality of delay elements for adding different delay amounts to the inter-block signals; a counter circuit block for receiving a timing adjustment control signal from the timing adjustment circuit block; and a fuse circuit block in which a fuse is melted down based on a fuse information signal held by the counter circuit block after a timing verification and which replaces the function of the counter circuit block.

Abstract: A timing generator includes a reference signal generating unit for generating a reference signal of a predetermined frequency, a variable delay circuit unit for outputting the timing signal which results from delaying the reference signal by a predetermined time, and a delay amount measuring unit for measuring a delay amount of the variable delay circuit unit, whereby the timing generator controls the delay amount of the variable delay circuit unit based on the delay amount measured by the delay amount measuring unit. Since the frequency of the reference signal is continuously modulated within a very small frequency range, the delay amount measuring unit can measure the delay amount of the variable delay circuit unit highly accurately. In addition, since the delay amount of the variable delay circuit unit can be controlled on the basis of the measured delay amount, it is possible to generate the accurately delayed timing signal.

Abstract: The present invention is related to method and apparatus for clock shrinking that includes a detector, a controller, a switching device, and a buffer. The detector includes one or more counters and detects activation of a trigger. The trigger starts and stops the counters. The controller generates select signals based on output from the counters. The switching device receives vectors and receives the select signals from the controller and outputs the vectors in a sequence based on the select signals. The buffer receives a clock signal and the sequence of vectors and outputs one or more shrunk clock pulses in the clock signal based on the received vectors continuously while the trigger is active. A mode selects the desired shrinking pattern for the clock pulses. The shrinking delays in time or advances in time the rising edge and/or the falling edge of the clock pulses.

Abstract: Disclosed is a semiconductor device for outputting an output signal with a given phase held relative to an external clock despite a difference in characteristic, a change in temperature, and a fluctuation in supply voltage. The semiconductor device comprises an input circuit for inputting the external clock and outputting a reference signal, an output circuit for receiving an output timing signal and outputting an output signal according to the timing of the output timing signal, and an output timing control circuit for controlling the output timing so that the output signal exhibits a given phase relative to the external clock.

Abstract: A system and method is provided for controlling clock skew to meet timing constraints for a semiconductor integrated circuit. On-chip self-tuning circuits can be connected to each latch in the integrated circuit for controlling clock skew. Each self-tuning circuit delays a clock signal that is input to a latch when the clock skew does not satisfy the timing constraint for that latch. The self-tuning circuit repeatedly delays the clock signal until the clock skew is satisfied or until the delay becomes greater than or equal to a predetermined threshold. The delayed clock signal is then pushed to other latches in the integrated circuit until all the timing constraints for the integrated circuit are satisfied.

Abstract: An improved DDLL containing a majority filter counter circuit is disclosed. The majority filter counter circuit is located between the phase detector and the shift register of the DDLL. The majority filter counter circuit receives shifting commands from the phase detector and filters the shift commands from reaching the shift register until a predetermined number (e.g., 16) have been received from the phase detector before transmitting a shift command (either shift right or shift left) to the shift register. Once the shift register receives the shift command, the shift register directs the delay line to shift by one tap in either a shift right or a shift left direction depending upon the phase relationship between CLKIn and CLKOut. By waiting for e.g., 16 shift commands, the majority filter counter circuit ensures that a premature shift command is not delivered to the shift register in the case of a noise event.

Abstract: A fixed-length delay generation circuit comprises a first variable delay circuit (VDC), a clock generation circuit, a VDC group including one or more second VDCs, and a delay controller. The clock signal is input to a second VDC disposed at the initial stage in the VDC group. The delay controller outputs a signal by which delay amount in the first and second VDCs are made smaller when a difference between phases of a delay clock signal output from the VDC group and of the clock signal generated by the clock generation circuit is greater than a predetermined value. The delay controller outputs a signal by which delay amount in the first and second VDCs are made larger when the difference between phases of a delay clock signal output from the VDC group and of the clock signal generated by the clock generation circuit is smaller than such value.

Abstract: A timing circuit which is used to synchronize different circuit to each other. The timing circuit includes adjustable delay apparatus which delay an input signal with a predetermined value. The timing circuit uses counting devices to count the input signal and the delayed output signal and thereby provides a simple and more cost effective timing circuit.

Abstract: A CMOS pulse shrinking delay element with deep subnanosecond resolution applicable to a Time-to-Digital Converter (TDC) can control its pulse shrinking or expanding capability be adjusting the dimension ratio between internal adjacent elements. This eliminates the need in prior CMOS pulse shrinking delay elements to adjust an external bias voltage or continuously calibrate the element in order to control pulse shrinking or expanding capabilities, facilitates simplification of circuits using the delay element, permits more precise design and control of the pulse shrinking or expanding capabilities of every element in a TDC circuit, and in practice reduces single shot errors in a cyclic TDC utilizing the pulse shrinking delay element to on the order of ten picoseconds, resulting in a TDC having extremely fine resolution, excellent accuracy, low power consumption, and low sensitivity to supply voltage and ambient temperature variations.

Abstract: A time delay from a triggering event to switching of an output signal in a microelectronic device can be adjusted to compensate for various characteristics of the electronic device. The characteristics include temperature, voltage, and manufacturing process conditions. The time delay is adjusted using a variable delay circuit having multiple delay cells that are selectively coupled to control the time delay. The conditions of the electronic device are detected using a process sensor, which includes an oscillator having a frequency that is sensitive to variations in the conditions.

Abstract: An apparatus and method for delaying a signal using a variable delay line circuit. A variable delay line circuit includes first and second delay lines, each including a plurality of delay elements. A multiplexer is coupled to respective outputs of the first and second delay lines and selectively couples the output of one of the first or second delay lines to an output of the multiplexer. A control circuit is coupled to the multiplexer and the first and second delay lines, and controls the multiplexer so as to produce a delayed signal at the multiplexer output using one of the first or second delay lines, and changes a delay factor of the other one of the first or second delay lines by varying a resistance and a current of one or more delay elements of the other one of the first or second delay lines.

Abstract: A ring oscillator is an oscillator, which is composed of serially connected buffers, for outputting a plurality of phases, and a last buffer output is inverted and fed back to a first buffer. A decoder selects one of outputs from the ring oscillator according to externally supplied digital data indicating an amount of a delay time to be set. A counter counts an output from the decoder, and outputs a delay signal if a count value reaches a predetermined number. That is, the counter outputs a signal with an amount of delay time according to digital data.

Abstract: An embedded electronic system includes a clock controller embedded in the same matrix material as a subsystem under test and the measurement devices needed to test it. This embedded clock controller controls the distribution and gating of a system clock that runs continuously, but is only supplied to the subsystem under test during normal operation or during pre-programmed intervals of testing operations. A test data bus supplies test data and a path for the return of test results. The test data supplied to the clock controller includes information to control time relationships between its trigger and gated clock outputs. Different versions of the clock controller are described, one for use with a serial test data bus and another for use with a parallel test data bus. The clock controller can also be configured to produce trigger signals with timing appropriate to operating either edge-sensitive or level-sensitive measurement devices.

Abstract: A clock is phase shifted by an amount controlled by the value of a control signal by establishing at least several discrete delay times to be imposed on the clock. The control signal value controls selection of the imposed discrete delay time. An analog-to-digital converter of a phase locked loop responds to intelligence representing variable phase bits and the selected phase shifted clock to control the signal value. The selected replica is derived by at least several cascaded substantially equal time delay units. In one embodiment, a multiplexer responds to the clock, and the signal value, which is Gray coded, to control connections from one of the delay units to an output terminal. In another embodiment, the number of cascaded delay units interposed between the clock and an output terminal is controlled by the signal value.

Abstract: A timing generator for generating delay timing signals which have delay time up to n-times of a reference clock period is capable of considerably reducing the hardware size. The timing generator is used in a semiconductor testing apparatus. The timing generator can contribute to reduce the total size and cost of the semiconductor testing apparatus. The timing generator includes a counter for counting the reference clock, an adder for adding the output of the counter to delay data, a series of registers for storing the output of the adder and shifting the output of the adder in synchronism with a delay trigger signal, a series of exclusive OR gates for comparing each output of the registers with the output of the counter and generating coincidence signals when the output from the register and the counter coincide with each other, and an OR gate for receiving the outputs of the exclusive OR gates and generating a signal which is combined of the outputs from the exclusive OR gates.

Abstract: A programmable delay line comprises a plurality of delay stages connected in series, each of the delay stages including: a basic path for passing an input signal; a delay path for passing the input signal with a predetermined delay time; and a selector for selecting either the basic path or the delay path to pass the input signal in accordance with digital data externally inputted, wherein differences in times for passing the input signal through the basic path and through the delay path in the plurality delay stages are UD.2.sup.n (n=0, 1, 2 . . . ), UD being unit delay time. A programmable delay apparatus comprises: an oscillator and counter, which determine a coarse delay time in accordance with the upper bit data of control data, and a programmable delay line, which determines a fine delay time according to the lower bit data of the control data after the finish of the coarse delay time to obtain a total delay time. The counter provides a wide range of available delay times.