Abstract: A metrological scale for use in optoelectronic scale reading apparatus comprising a tape made of spring steel and having a surface layer of copper. The scale has scale marks constituted by a zig-zag or other profile impressed into the surface layer by a rolling process. During rolling, the relatively soft copper is readily deformed to accept the profile while the spring steel resists plastic elongation of the tape.
Type:
Grant
Filed:
June 15, 1989
Date of Patent:
May 22, 1990
Assignee:
Renishaw PLC
Inventors:
D. R. McMurtry, W. F. N. Stephens, M. Kirkbride
Abstract: The invention refers to a length measuring device, with which a working length of a work piece may be determined for milling machines and sawing machines. The measuring device comprises one unit with a movable buffer which is laid out and secured parallel to the table on a level and vertical to the cutting tool of the machine. An electrical sensor device operable relative to an electrical ruler is synchronized to move with the buffer and the sensor device is electrically connected with an indicator to provide a read out of the measurement.
Abstract: Disclosed is a capacitive measurement system. The system comprises structure for generating a plurality of waveforms, a calibrated reference member for use with a reader head in making a measurement, and a reader element configured for lateral movement with respect to the calibrated reference member. The calibrated reference member comprises one element of a capacitor. The reader element comprises a plurality of reader regions comprising the other element of the capacitor. The reader element also includes structure for receiving two signals resulting from coupling of the two capacitor elements. The system functions to detect a phase shift level between the two signals and to determine magnitude of lateral movement in a particular direction from the magnitude of the phase shift.
Type:
Grant
Filed:
August 19, 1988
Date of Patent:
October 17, 1989
Assignee:
Delta International Machinery Corp.
Inventors:
David J. Luttmer, Thomas L. Panian, Barry D. Wixey, Raymond L. Wilson