Abstract: A differential pressure measuring device (10, 50) comprising a housing (18) having two pressure areas (20, 22) which are sealed relative to each other and are separated from each other by a membrane (12, 54). The membrane (12, 54) comprises a pressure plate (14) surrounded by an elastic circumferential area (16) allowing axial movement of the pressure plate (14). An indicator element (24, 56) is permanently connected to the pressure plate (14) and whose position can be evaluated in a non-contact manner by a sensor (34, 58). At least one pair of springs (28, 52) is provided, with one spring (30, 32) each of said pair of springs being located in an allocated pressure area (20, 22). Each spring (30, 32) of said pair of springs (28, 52) exerts an opposing spring force on the pressure plate (14).

Abstract: Provided are a bending sensor that is less dependent on an input speed of a strain and in which a response delay is unlikely to occur, and a deformed shape measurement method using the bending sensor. The bending sensor is configured to include a base material; a sensor body arranged on a surface of the base material and containing a matrix resin and conductive filler particles filled in the matrix resin at a filling rate of 30% by volume or more, and in which three-dimensional conductive paths are formed by contact among the conductive filler particles, and electrical resistance increases as an deformation amount increases; an elastically deformable cover film arranged so as to cover the sensor body; and a plurality of electrodes connected to the sensor body and capable of outputting electrical resistances. In the sensor body, cracks are formed in advance in such a direction that the conductive paths are cut off during a bending deformation.

Abstract: Provided are a bending sensor that is less dependent on an input speed of a strain and in which a response delay is unlikely to occur, and a deformed shape measurement method using the bending sensor. The bending sensor is configured to include a base material; a sensor body arranged on a surface of the base material and containing a matrix resin and conductive filler particles filled in the matrix resin at a filling rate of 30% by volume or more, and in which three-dimensional conductive paths are formed by contact among the conductive filler particles, and electrical resistance increases as an deformation amount increases; an elastically deformable cover film arranged so as to cover the sensor body; and a plurality of electrodes connected to the sensor body and capable of outputting electrical resistances. In the sensor body, cracks are formed in advance in such a direction that the conductive paths are cut off during a bending deformation.

Abstract: A micromovement measuring device has a first element such as a probe tip or flat plate coupled to a test body (107) the movement of which is to be measured. A second element (104) is located adjacent to the first element, to form a gap (108) therebetween. As the test body and the first element gradually move away from the measuring element, so increasing the size of the gap, the second element is repeatedly moved up, to restore the gap to its original size. These repeated small quantized movements of the measuring element (104) are counted, and are used to provide an indication of how far the test body (107) has moved. In other embodiments, the first element may gradually move toward the second element, with the latter repeatedly moving away.

Abstract: A micromovement measuring device has a first element such as a probe tip or flat plate coupled to a test body (107) the movement of which is to be measured. A second element (104) is located adjacent to the first element, to form a gap (108) therebetween. As the test body and the first element gradually move away from the measuring element, so increasing the size of the gap, the second element is repeatedly moved up, to restore the gap to its original size. These repeated small quantized movements of the measuring element (104) are counted, and are used to provide an indication of how far the test body (107) has moved. In other embodiments, the first element may gradually move toward the second element, with the latter repeatedly moving away.

Abstract: A micromovement measuring device has a first element such as a probe tip or flat plate coupled to a test body (107) the movement of which is to be measured. A second element (104) is located adjacent to the first element, to form a gap (108) therebetween. As the test body and the first element gradually move away from the measuring element, so increasing the size of the gap, the second element is repeatedly moved up, to restore the gap to its original size. These repeated small quantized movements of the measuring element (104) are counted, and are used to provide an indication of how far the test body (107) has moved. In other embodiments, the first element may gradually move toward the second element, with the latter repeatedly moving away.

Abstract: A micromovement measuring device has a first element such as a probe tip or flat plate coupled to a test body (107) the movement of which is to be measured. A second element (104) is located adjacent to the first element, to form a gap (108) therebetween. As the test body and the first element gradually move away from the measuring element, so increasing the size of the gap, the second element is repeatedly moved up, to restore the gap to its original size. These repeated small quantized movements of the measuring element (104) are counted, and are used to provide an indication of how far the test body (107) has moved. In other embodiments, the first element may gradually move toward the second element, with the latter repeatedly moving away.

Abstract: A device for measuring physical variables comprises a pair of thin planar members disposed symmetrically in a face-to-face arrangement about a plane including a reference axis defining the direction of displacement of a target object mechanically coupled to the pair of thin planar members, wherein the displacement in a first direction parallel to the reference axis increases the separation distance between the pair of thin planar members and the displacement in a second direction opposite to the first direction decreases the separation distance between the pair of thin planar members. The physical variable related to the displacement is determined as a function of an electrical parameter varying as a function of the separation distance between the pair of thin planar members such as the electrical capacitance or resistance therebetween measured by a capacitance or ohm meter.

Abstract: A Strain Follower comprises cantilevered beams mounted by gripping means on opposite sides of an object to be loaded, which beams are deflected in relationship to the deformation of the object by axial forces, and strain gages mounted on the beams and electrically within a wheatstone bridge circuit for providing an output representative of the axial deformation of the loaded object, while minimizing the impact, on the output by bending and torsional forces acting on the object.

Abstract: A stem load determining system comprises a method and apparatus for determining the load developed on a threaded stem, including a valve stem driven by a valve operator. An integral component of the apparatus is a stem strain transducer uniquely designed to girp a threaded stem to define a guage length on the threaded stem and to detect and measure deformation of the stem at the guage length when subjected to a compressive or tensile load.

Abstract: An electronic indicator comprising a first portion attached at one end to an object to be controllably stretched or elongated and a second portion slideably connected to the first portion for relative movement therewith and connected at one end remote from the object attachment of the first portion. Electrical connections donating relative movement between the two indicator portions are attached to monitoring equipment to indicate stretch length.

Abstract: A capacitive extensometer has an extensometer frame formed of a pair of arms connected together about a hinge axis at first remote ends, and having second ends which include specimen contacting members for engaging the surfaces of a specimen to be tested. A capacitive type sensing arrangement is mounted on the arms, and is used with conventional circuitry for determining arm motion. The sensing is made so that it can be compensated for nonlinearities and minimizes undesirable extraneous effects by utilizing concave and convex shaped mating surfaces on the sensing elements. The ability to mount and protect the capacitor sensor approximately, while obtaining a relatively large output signal enhances the operability of the extensometer.