Abstract: An analog-to-digital converter (ADC) includes a first ADC stage with a first sub-ADC stage configured to sample the analog input voltage in response to a first phase clock signal and output a first digital value corresponding to an analog input voltage in response to a second phase clock signal. A current mode DAC stage is configured to convert the analog input voltage and the first digital value to respective first and second current signals, determine a residue current signal representing a difference between the first and the second current signal, and convert the residue current signal to an analog residual voltage signal. A second ADC stage is coupled to the first ADC stage to receive the analog residual voltage signal, and convert the analog residue voltage signal to a second digital value. An alignment and digital error correction stage is configured to combine the first and the second digital values.

Abstract: A solid state imaging element according to an embodiment includes: a converter (14) that converts an analog pixel signal read out from a pixel into a bit value, successively for each of a plurality of bits, on the basis of a threshold voltage set according to a conversion history of the bit converted before a target bit; a plurality of voltage generation units (102a and 102b) that each generate a plurality of reference voltages; and a setting unit (12d) that sets the threshold voltage using the reference voltage selected from the reference voltages generated by each of the voltage generation units on the basis of a conversion result.

Abstract: Certain aspects of the present disclosure provide a digital-to-analog converter (DAC). The DAC generally includes a plurality of current-steering cells, each having a bypass switch, and a resistor ladder circuit having multiple segments. Each segment may include a first resistive element and a second resistive element, the bypass switch being configured to selectively provide a bypass current to a common node between the first resistive element and the second resistive element.

Abstract: A radar level indicator comprising a processor, an analogue-digital converter circuit and an intermediate memory connected therebetween. The intermediate memory is configured to receive digital signals from the analogue-digital converter circuit at a first data rate. The processor is configured to read out the intermediate memory at a second data rate that is different from the first data rate. It is thus possible to reduce the transmission time while maintaining the same energy requirement.

Abstract: The invention provides a digital background calibration system and method for a successive approximation analog-to-digital converter comprising a digital to analog converter (DAC) having a plurality of weighted capacitors to be calibrated; means for splitting each of said weighted capacitors into a plurality of sub-capacitors and at least one redundant capacitor; means for multiplying the voltage level of at least one of the sub-capacitors with a PN sequence; and means for calibrating the weighted capacitor from the multiplied sub-capacitor and the redundant capacitor.

Abstract: The invention relates to integrated circuits comprising a set of identical differential pairs of two transistors each (T1, T2; T3, T4) one receiving a variable voltage (Vinp, Vinn) at its base and the other receiving a fixed reference voltage (Vrefp, Vrefn). In order to reduce the dispersion of the offset voltages of said differential pairs, it is provided that the transistor (T2, T4) that receives a fixed reference voltage has an emitter surface at least twice as large as the transistor (T1, T3) that receives a variable voltage at its base. Application to signal folding circuits and to analog-to-digital converters using differential pairs of transistors.

Abstract: The present invention provides a DAC constructed from a series of floating gate devices which are programmable to a series of predetermined values. Addressing one or more of the programmed floating gate devices will select from a wide variety of analog outputs. Reprogramming the floating gate devices, can provide a different variety of analog outputs. For example, the floating gate devices can be preprogrammed to a different range of outputs matching a range of perceptible signals.

Abstract: The present invention provides a DAC constructed from a series of floating gate devices which are programmable to a series of predetermined values. Addressing one or more of the programmed floating gate devices will select from a wide variety of analog outputs. Reprogramming the floating gate devices, can provide a different variety of analog outputs. For example, the floating gate devices can be preprogrammed to a different range of outputs matching a range of perceptible signals.

Abstract: A digital communication system for transmitting and receiving Digital Visual Interface (DVI) communication data signals and Display Data Channel (DDC) communication signals over a transmission line comprises an open-loop equalizer circuit and a DDC extension circuit. The open-loop equalizer circuit is operable to receive DVI communication signals transmitted over the transmission line and output equalized DVI communication data signals. The DDC extension circuit is operable to inject a boost current at the receive end of the transmission line during a positive transition in the DDC communication signal, and clamp the receive end of the transmission line during a negative transition of the DDC communication signal.

Abstract: The present invention provides a DAC constructed from a series of floating gate devices which are programmable to a series of predetermined values. Addressing one or more of the programmed floating gate devices, will select from a wide variety of analog outputs. Reprogramming the floating gate devices, can provide a different variety of analog outputs. For example, the floating gate devices can be preprogrammed to a different range of outputs matching a range of perceptible signals.

Abstract: An apparatus for converting a digital input signal to an analog signal for transmission. The input signal can include more than one carrier signal. A plurality of delta-sigma modulation loop circuits are connected in an increasing order of operating frequency so as to reduce a word length of the input signal. A tuning circuit adjusts the signal frequency to a transmitting frequency for conversion to analog by a digital-to-analog converter. A first loop circuit is implemented using CMOS gates, and a second loop circuit and the tuning circuit are implemented using indium phosphide gates. The apparatus allows a high-resolution, wide-band RF multiple-carrier signal to be re-quantized to a lower-resolution signal while an acceptable signal-to-noise ratio is maintained.

Abstract: Comparator systems are provided that substantially enhance comparator dynamic range. The enhancement is primarily realized by arranging the systems to apply comparator input signals at feedback taps positioned between the upper and lower ends of comparator strings of impedance elements.

Abstract: A system and method provide deglitch filtering. The system has a voltage-based deglitching filter and timing-based deglitching filter. The voltage-based deglitching filter connects with the timing-based deglitch filter, such that the output of the voltage-based deglitch filter connects to the input of the timing-based deglitch filter. The voltage-based deglitch filter is in feedback with the timing based deglitching filter.

Abstract: An algorithmic procedure automatically generates layout of matched capacitor arrays used in A/D converters, D/A converters and programmable gain amplifiers, among other types of devices, using templates to define the style of the layout. Since each array can be generated from a particular template, multiple arrays associated with an IC can be optimized for different purposes to preserve silicon area. The automated technique allows fast and easy migration of an array layout from one process to another and eliminates the manual design work generally associated with capacitor array layout.

Abstract: An electric current switch circuit in accordance with the present invention is arranged so that an output of an IIL logic circuit is connected with the base of the first transistor of NPN type that switches ON or OFF the electric current. The first constant current source and the second transistor cause the first transistor to switch ON during a period when the output of the IIL logic circuit is in an OFF state, to switch OFF during a period when the output of the IIL logic circuit is in an ON state. Thus, only a voltage of 0.9V to 1.1V (the sum of a drop voltage across the first resistor and the base-emitter voltage) is applied to the base of the first transistor. Accordingly, a voltage less than the withstand voltage of the IIL logic circuit is applied to the base of the first transistor.

Abstract: A current memory cell comprises a first bipolar transistor providing a current source and coupled to the emitters of a second and a third bipolar transistor, the latter forming the storage elements of the memory cell. The memory cell is calibrated, to avoid mismatch between the second and third transistors, by adjustment of the current source via a parallel arrangement of a resistor and a field effect transistor in the emitter circuit of the first transistor.

Abstract: A digital to analog converter and method for conversion is provided that includes an R-2R resistor ladder network formed with a plurality of current bit switches in a GaAs HI.sup.2 L integrated circuit. Each bit switch and R-2R node in the ladder network is associated with a corresponding bit position in the binary signal input to the converter. An arrangement of bipolar transistors (Q1, Q4) and diodes (D2-D3) is included in each bit switch (100) that steers current through one of two alternate paths, based on the logic state of the binary input signal (i e., "high" or "low" state). For one logic state of the binary input signal, current flows through the switch from the output of the digital to analog converter (110). For the alternate signal state, current flow from the output of the digital to analog converter is blocked. Therefore, each bit switch (100) operates as a single-pole-double-throw current mode switch under the control of the binary input signal (Ai).

Abstract: An analog/digital converter assembly includes a first analog/digital converter having N-bit resolution, operating by the parallel method and having comparators. A sample and hold element is connected upstream of the first analog/digital converter. A second analog/digital converter has M-bit resolution, operates by the parallel method and has comparators. A digital/analog converter is connected upstream of the second analog/digital converter. A subtractor is connected to the digital/analog converter and to the sample and hold element. An amplifier is connected downstream of the subtractor. Output signals of the comparators of the first analog/digital converter are provided directly with a 1.sup.x out of 2.sup.N code for triggering the digital/analog converter. The same reference voltage is applied to both the first analog/digital converter and the digital/analog converter.

Abstract: An analog-to-digital converter 10 employs a series of comparators 12, 14, 16 and 18. Each comparator includes at least one inverter consisting of a CMOS transistor pair including a P-channel transistor 22 and N-channel transistor 24. The threshold levels of the transistors 22, 24 are modified using focused ion beam implantation techniques to provide the comparators with monotonically increasing transistion levels.

Abstract: A single chip monolithic integrated successive approximation analog-to-digital converter includes a test mode terminal for receiving shift register test mode control signals and successive approximation mode control signals. Digital test data signals are applied to a test data terminal. A trimmable digital-to-analog converter (DAC) is connected to receive digital signals and converts these signals to analog signals of corresponding values. A successive approximation and shift register is coupled to the test mode terminal and the test data terminal. During post-fabrication processing, the successive approximation and shift register operates in a shift register test mode in response to the test mode control signals. Test signals of a known value are serially received and applied in parallel to the DAC. The DAC can then be trimmed to required specifications. The successive approximation and shift register operates in a successive approximation mode in response to successive approximation mode control signals.

Abstract: A digital communication system for transmitting and receiving Digital Visual Interface (DVI) communication data signals and Display Data Channel (DDC) communication signals over a transmission line comprises an open-loop equalizer circuit and a DDC extension circuit. The open-loop equalizer circuit is operable to receive DVI communication signals transmitted over the transmission line and output equalized DVI communication data signals. The DDC extension circuit is operable to inject a boost current at the receive end of the transmission line during a positive transition in the DDC communication signal, and clamp the receive end of the transmission line during a negative transition of the DDC communication signal.