Abstract: An apparatus is provided for determining variable thickness of a coating on a surface of a substrate using in part a flash-lamp source, capable of generating a thermal pulse at the coating surface, and a image capture and processing device capable of capture sequential image frames of the coating surface, whereas each sequential image frame corresponds to an elapsed time and comprises a pixel array, and wherein each pixel of the array corresponds to a location on the coating surface. A method of calculating coating thickness is also provided.

Abstract: A system for determining the angular visual response of a cosmetic surface includes a sample support member configured to support a sample of material, a light detector arranged to travel along a first arcuate path about the sample of material, a light emitter arranged to travel along a second arcuate path about the sample of material, and an imaging device arranged to travel along a third arcuate path about the sample of material.

Abstract: A camera unit includes an image sensor, a circuit board in which a signal processor circuit to process an output signal of the image sensor is formed, a cable including a signal conductor element and a ground conductor element and connected at one end to the circuit board, and a shielding component formed to enclose the circuit board therewith. The ground conductor element is connected to both a ground terminal of the circuit board and the shielding component in a vicinity of the end of the cable.

Abstract: A method is disclosed for operating a machine vision inspection system to determine a fluorescent imaging height for acquiring a fluorescent image for repeatably determining the location of a feature within the fluorescent material. The height of an exposed workpiece portion exposed outside of the fluorescent material is determined (e.g., using a height sensor or autofocus operations). The determined height is repeatable. The exposed portion has a characteristic height relative to the fluorescent material and/or features located therein. The fluorescent imaging height, which may be inside the fluorescent material, is determined relative to the determined height of the exposed portion. The fluorescent imaging height is determined such that it enhances the detection of the desired feature located within the fluorescent material in the resulting fluorescent image.

Abstract: An optical system for measuring an irregularly shaped object includes a dimensioning station having a base, a first wall extending from the base, and a second wall extending from the base. A collimated light is passed from each of first and second collimated light sources arranged generally parallel to the base, illuminating the first and second walls and defining first and second shadows, respectively. A camera is arranged to obtain image data representing each of the first and second shadows. The system is configured to collect the image data for determining at least one dimension of an object from each of the first and second shadows. Each of the first and second collimated light sources may be a light with a collimating lens arranged between the light and the respective wall. The light source may be an LED and the collimating lens may be a collimating Fresnel lens.

Abstract: A method and an apparatus for detecting bubbles and/or creases on labeled containers. Bubbles/creases can be detected without comparison with a previously stored reference recording by virtue of the fact that a label to be examined is illuminated with a first flash of light, for example using the surface radiator, and is recorded in a first camera image, that the label is also illuminated with at least one second flash of light, for example using the directional radiator, with a changed directional characteristic and is recorded in a second camera image, and that a brightness difference between the first and second camera images is calculated.

Abstract: A defect detecting apparatus detects a defect that is present on the outer circumferential surface of work having the outer circumferential surface thereof formed as a bent surface. The defect detecting apparatus is provided with: a jig which supports the work, and holds the work in a state wherein the work is rotated by a predetermined angle; an image pickup device, which picks up an image of the outer circumferential surface of the work held by the jig, the work being in the state wherein the work is rotated by the predetermined angle; and a controller, which processes an image obtained by means of the image pickup device, and determines a defect.

Abstract: In an electrolyte sheet for a solid oxide fuel cell according to the present invention, the number of flaws on at least one of surfaces of the sheet detected by a fluorescent penetrant inspection is 30 points or less in each of sections obtained by dividing the sheet into the sections each measuring 30 mm or less on a side. A unit cell for a solid oxide fuel cell according to the present invention comprises a fuel electrode, an air electrode, and the electrolyte sheet for a solid oxide fuel cell according to the present invention, which is disposed between the fuel electrode and the air electrode. A solid oxide fuel cell of the present invention includes the unit cell for a solid oxide fuel cell according to the present invention.

Abstract: The invention relates to a device for monitoring a web. The device includes cameras imaging the web in order to take digital images of the web from a transverse area of the web at the imaging frequency. Each camera includes an image element, which consists of pixels. The individual pixels of the imaging element of the camera are real image-elements. The real image-elements are arranged to combine to form effective image-elements of the web in the machine direction. In addition, the cameras used in the device are matrix cameras, the imaging elements in which are arranged to be exposed simultaneously. The real image-elements are arranged to be combined to form effective image-elements by exploiting the binning function of the matrix camera. The device includes a strobe-lighting unit, the synchronization of which is arranged in step with the exposure of the matrix cameras, the imaging periods being common to all the cameras.

Abstract: A pulsed thermography defect detection apparatus including active and passive infrared (IR) thermography for non-destructive testing (NDT) of powdermetallic (P/M) components for on-line and off-line inspection.

Abstract: A multi-camera skin inspection system for inspecting the outer skin and the skin perimeter of extruded ceramic honeycomb structures is disclosed. The system has a camera that captures first digital line images of a line-illuminated portion of the outer skin as the ceramic honeycomb structure rotates to form a scanned digital image of the outer skin. The system also has second and third cameras that respectively capture second and third digital line images of illuminated first and second endfaces, including the corresponding first and second skin perimeters, as the ceramic honeycomb structure rotates to form scanned digital images of the ceramic honeycomb structure perimeters. The system also forms a composite image from the three scanned images and identifies at least one defect in the ceramic honeycomb structure from the composite image.

Abstract: The invention provides an image processing device and an image processing method which can efficiently make use of memory resources, and can also edit and simulate a registered image or the like so as to reflect the registered image or the like after editing in a normal operation without stopping the normal operation, and further to enhance production efficiency. When data for image processing edited in a second processing section is to be reflected in image processing (normal operation) that is continuously executed in a first processing section, the edited data for image processing is transmitted from a third data storage area to a second data storage area, and the edited data for image processing is read from the second data storage area when image processing is executed by use of the edited data for image processing in the first processing section.

Abstract: Selectively mobile system and method detect and locate information to determine repair or replacement needs for bridge and roadway infrastructure by detection of subsurface defects. Multiple sensors collect data to be fused include 1) Visual capture device or devices (16) aboard a mobile carrier (10) capture visual spectrum in either HD or regular video and/or as still frame camera images; 2) Infrared spectrum sensors (18) aboard the mobile carrier capture video or still frame images; 3) Global positioning sensors (GPS) (12) aboard the mobile carrier determine position; 4) Light detection and ranging system (LIDAR) aboard the mobile carrier gives precise locations. Further, 5) ground penetrating microwave radar (GPR) sensors carried by a vehicle (22) and related electronics determine depth of subsurface defects. The sensor systems supply data to a digital processor (40) having analysis and graphical information system (GIS) software (44) that fuses the data and presents it for delivery and use.

Abstract: A road surface inspection device detects an abnormal region on a road surface from the road surface on a road image captured by a camera. The road surface inspection device determines whether the detected abnormal region overlaps a trace on the road image, along which the wheels of a patrol car are expected to pass on the road surface. When the abnormal region overlaps the trace of wheels, the road surface inspection device determines whether an acceleration at the measurement time corresponding to the captured time of the road image among the accelerations measured during driving on the road surface by a G-sensor is outside a predetermined range.

Abstract: A method for determining surface quality for a glass surface is provided. The method includes depositing a pattern of drops over the glass surface using a drop dispensing apparatus. Adjacent drops have a predetermined deposit size and a predetermined deposit spacing. Drop information for the pattern of drops is generated using a vision apparatus. An out-of-parameter condition is detected by analyzing the drop information and an indication of the out-of-parameter condition is provided.

Abstract: A for inspecting the internal surface located between a first and a second bead of a tire (P), comprising means for acquiring the image of the internal surface (1) of the tire, and centering means that are able to lock the first bead around its entire circumference on a reference plate, and to set the tire into relative rotation about its axis XX? with respect to said image acquisition means. This device comprises means for opening and for holding the second bead, said means comprising two internal holding rollers (32, 32) which have a generally radial axis, and at least one external holding roller (33) which has a generally radial axis, is disposed substantially in the middle of the angular sector formed by the two internal holding rollers (31, 32) and is able to come into abutment against the external part of said second bead, the internal (31, 32) and external (33) holding rollers being mounted so as to rotate as one about the axis XX? of said image acquisition means (1).

Abstract: Provided is an in-vehicle image display device capable of providing, from among images of the peripheral area of a vehicle that can change in accordance with the driving state, an image of a part needed by the driver at an appropriate timing so that the driver can recognize the positional relationship between the vehicle and the peripheral area of the vehicle. Images captured with in-vehicle cameras are acquired, and a vehicle periphery image is generated from such images. Then, a collision-warned part of the vehicle that has a possibility of hitting a nearby object is selected based on the vehicle driving state, and the acquired image is processed to generate an enlarged image of the peripheral area of the collision-warned part of the vehicle selected by the collision-warned part selection part. Then, a composite display image, in which the positions of the enlarged image and the vehicle periphery image are displayed in a correlated manner, is generated and displayed.

Abstract: Contamination monitoring of high voltage insulators provides a system and method producing an early predictor for high voltage insulator failure, allowing repairmen to either already be on site when a high voltage insulator fails in order to expedite repair time, or allowing repair and/or replacement of a faulty insulator before the failure actually occurs. The system and method provide transmission of an alarm signal when contaminant levels (such as equivalent salt deposit density (ESDD) levels) formed on a high voltage insulator exceed pre-selected threshold values, indicating the likelihood of high voltage insulator failure.

Abstract: A method and apparatus are provided for automatic application and monitoring of a structure to be applied onto substrate. A plurality of cameras positioned around an application facility are utilized to monitor the automatic application of a structure on a substrate by means of a stereometry procedure. Three-dimensional recognition of a reference contour position results in the overlapping area to be used for gross adjustment of the application facility prior to applying the structure.

Abstract: The apparatus for detecting surface defects of a glass substrate, having a dark field optical system, includes: a first photographing device for photographing first image; a second photographing for photographing second image; a dark field illumination system disposed below the glass substrate for serving as a dark field illumination; and a detection signal processor operating coordinates of a defect position on the first image and the second image, wherein the first photographing device and the second photographing device form photographing areas in the shape of lines which are not parallel to at least the transferring direction of the glass substrate, form photographing areas for a top surface of the glass substrate to be overlapped by each other and form photographing areas for a bottom surface of the glass substrate differently from each other.

Abstract: A device for optical characterization of a sample is provided, the sample being accommodated in a receptacle container transparent to light. The device includes a camera, using which the sample may be detected, and a first light source is situated in such a way that the sample is transilluminated opposite to the viewing direction of the camera, a second light source is situated on the same side as the camera, and a laser source is situated transversely to the viewing direction of the camera.

Abstract: A shape measurement method for a tire includes: detecting an outer surface shape data and an inner surface shape of the tire from image data of the outer surface and the inner surface; subjecting irregularities along the tire circumferential direction around the tire in the outer surface shape data and in the inner surface shape data to Fourier transformation to take out primary waveform components respectively; adjusting the tire circumferential positions of both of the waveform components to adjust the tire circumferential positions thereof; adjusting the tire radial direction cross section positions of the outer surface shape data and the inner surface shape data from information about the placement angles and the positions of the first camera and the second camera; and synthesizing the outer surface shape data and the inner surface shape data based on the adjusted tire circumferential positions and the tire radial direction cross section positions.

Abstract: An apparatus and method are provided for measuring the end surface of a disk-shaped semiconductor wafer based on its projection image, without the influence of contaminants on the end surface. A rotation supporting mechanism supports a wafer between a first supporting position rotated by +?relative to a predetermined reference position and a second supporting position rotated by ??degrees at two or more supporting positions. An image sensor picks up a projection image of the wafer's end surface. An index value for the end surface is calculated for each of a plurality of obtained projection images. One representative value of the calculated index values or an aggregate value is obtained, and a shape measurement of the wafer's end surface corresponding to the reference supporting position is derived. When the wafer's radius and a chamfer width are set as r and k, ??cos?1 ((r-k)/r) is satisfied.

Abstract: Edge points are extracted by specifying a height (values indicating a distance from a substrate) on a pattern when edges of the pattern are extracted from a CD-SEM image. Further, LER values obtained by the extraction of a Fourier spectrum of the LER are obtained. When the same sample is previously observed with the AFM and the CD-SEM, a size of the LER obtained by specifying a height, an auto-correlation distance of the LER, or an index called the spectrum is obtained from results of the AFM observation. Further, theses indices obtained by specifying image processing conditions for detecting the edge points from the CD-SEM observation result are obtained. Also, it is determined that heights providing values when the values are matched correspond to the image processing conditions and then, the edge points are extracted from the CD-SEM IMAGE instead of the AFM observation by using the image processing conditions.

Abstract: An apparatus for the inspection a vehicle component to detect the presence of a part defect and a method for performing the inspection. According to one embodiment, the apparatus for inspecting the vehicle component comprises: a camera having a lens; a borescope having a first end and a second end, the first end operatively disposed adjacent the camera and the second end having a mirror disposed therein; and a light source for supplying light to the borescope whereby the mirror is operative to reflect an image of an area of the vehicle component to be inspected to the camera.

Abstract: In a tire type determination method, a surface image of a tread portion of a tire mounted on a vehicle is captured by a camera fixed at a predetermined position in a tilted hanger conveyor line, which is located downstream in a vehicle-carrying direction with respect to a position at which the tire of the vehicle is lifted from the ground and starts moving diagonally upward. Further, image information is extracted from the surface image of the tread portion, and a tire type is determined by checking the image information against registered information. A vehicle inspection system includes a tire type determination portion and a vehicle type information obtaining portion so as to determine the tire type using the method. A conformance determination portion determines whether the tire type determined by the tire type determination portion conforms to a specified tire type searched based on the vehicle type information.

Abstract: An optical fingerprint recognition system has a finger board. The finger board has a plurality of micro-structures, and a plate face of the finger board is to be in contact with a finger, and the other plate face of the finger board has an image capturing element and at least one light emitting element disposed thereon. The image capturing element and the light emitting element are separated from the finger board for a distance. When the light emitting element emits a light ray towards the finger board, the light ray is guided by the plurality of micro-structures to be uniformly distributed in the finger board, so as to facilitate the image capturing element to capture the light ray applied on the finger, thus improving the recognition rate of the fingerprint.

Abstract: This invention is directed to easily set the image sensing conditions of an image sensing apparatus. The image sensing apparatus includes a first control means for controlling to change the image sensing conditions, an image sensing means to sense an image sensing target at every first time interval, and to calculate the evaluation value of the sensed image, and a second control means for controlling to change the image sensing conditions within the range where the evaluation value obtained by the first control means changes from increase to decrease, the image sensing means to sense the image sensing target at every second time interval smaller than the first time interval, and to calculate the evaluation value of the sensed image.

Abstract: An image projection system outputs an image from a lens and projects it onto a projection plane, and if resolution of the image projected onto the projection plane in each region is not uniform among respective regions, will correct resolutions of the respective regions of the image based on an inverse characteristic of the lens optical characteristic and will project the image onto the projection plane. Moreover, when the resolution of one region of the image falls lower than the resolutions of other regions by projecting the image onto the projection plane so that a shape of the image may not be distorted, the system projects an image whose resolution is deteriorated so that the resolutions of the other regions become substantially the same as the resolution of the one region.

Abstract: In a measuring system comprising an optical image recording system and a relative movement between the measured object and the image recording system, it is provided that the focal point (F) of the image recording system (3) be allowed to oscillate in scanning direction in order to generate—by superimposition of the oscillation movement of the focal point with the scanning movement—image recording intervals, during which the focal point (F) stops on the surface of the measured object (2) or, correspondingly, the image projected on the camera chip (7) stops on the camera chip. This preferably occurs during a steady unaccelerated relative movement between the measured object and the image recording system. Blurring of the edges of the images is avoided despite relatively long exposure times and moderate illumination intensities.

Abstract: A method of assessing the quality of metal parts, for example through detection of defects in a metal part induced by processing the metal part, comprises acquiring a thermal image of the metal part after processing the metal part, determining a difference image by comparing the thermal image to a reference image, the difference image being related to temperature differences between temperature data represented by the thermal image and by the reference image, and determining a gradient image using the difference image, the gradient image representing temperature difference gradients within the difference image. An example apparatus comprises a camera, such as a thermal camera, an image processor, and an output device such as a display.

Abstract: The microscopic imaging apparatus includes a system controlling unit for obtaining a VD time setting value, and for obtaining the number of electric charge subtracting pulses, a synchronization signal generating unit for generating a vertical synchronization signal on the basis of the VD time setting value output from the system controlling unit and the horizontal synchronization signal, and a timing generating unit for extracting the electric charge of the imaging device by supplying the horizontal synchronization signal by the number of electric charge subtracting pulses to the imaging device as the electric charge subtracting pulses, and for generating a read pulse synchronous with the vertical synchronization signal in order to stop the accumulation of the electric charge of the imaging device after exposure is started.

Abstract: A method is disclosed for operating a machine vision inspection system to determine a fluorescent imaging height for acquiring a fluorescent image for repeatably determining the location of a feature within the fluorescent material. The height of an exposed workpiece portion exposed outside of the fluorescent material is determined (e.g., using a height sensor or autofocus operations). The determined height is repeatable. The exposed portion has a characteristic height relative to the fluorescent material and/or features located therein. The fluorescent imaging height, which may be inside the fluorescent material, is determined relative to the determined height of the exposed portion. The fluorescent imaging height is determined such that it enhances the detection of the desired feature located within the fluorescent material in the resulting fluorescent image.

Abstract: Disclosed are apparatuses, methods, and lithographic systems for surface (e.g., mask) inspection. A surface inspection system can include a plurality of illumination sources, an optical system, and an image sensor. The plurality of illumination sources can be a standalone illumination system or integrated into the lithographic system, where the plurality of illumination sources can be configured to illuminate radiation onto a target portion of a surface. The optical system can be configured to receive at least a portion of reflected radiation from the target portion of the surface. Further, the image sensor can be configured to detect an aerial image corresponding to the portion of the reflected radiation. The surface inspection system can also include an analysis device configured to analyze the aerial image for defects.

Abstract: An appearance inspection device, which inspects an appearance of test objects, includes a first and second conveying means 21 and 22a conveying the test objects, a back/front reversal means 23 turning over the front and back surfaces of the test objects being conveyed by the first conveying means 21 and supplying the test objects to the second conveying means 22a, and a plurality of image-pickup means 30b and 30c capturing images of each test object from upper oblique directions while the test objects are conveyed by the first and second conveying means 21 and 22a. The appearance inspection device also includes a defect detection means detecting the presence of defects in the test objects based on image data captured by the image-pickup means 30b and 30c. This appearance inspection device makes it possible to reliably and readily inspect an entire appearance of the test objects.

Abstract: A method and apparatus for inspecting an object. In response to a presence of the object in an inspection area, a volume containing the object is identified. The volume has a plurality of portions. A number of sensor systems is assigned to the plurality of portions of the volume. Each sensor system in the number of sensors systems is assigned to a number of portions in the plurality of portions of the volume based on whether each sensor system is able to generate data with a desired level of quality about a surface of the object in a particular portion in the plurality of portions. Data about the surface of the object is generated using the number of sensor systems assigned to the plurality of portions of the volume. A determination is made as to whether a number of inconsistencies is present on the surface of the object using data.

Abstract: A surface inspecting device is provided in the present application. The surface inspecting device includes a pair of light modules respectively providing flashes to a surface from two different angles in sequence; an image sensing module acquiring an image of the surface upon a respective one of the flashes; and a computing module electrically connected with the image sensing module and processing the image by an image subtraction algorithm.

Abstract: The presence or absence of a deep machining work trace is detected, and the position and size of the machining work trace are allowed to be estimated, whereby an inspection time can be shortened. A surface inspecting device 9 for inspecting a polished inner surface 3A of a bore 3 formed in a cylinder block 5 by a boring work on the basis of a digital brightness image 70 of the inner surface 3A of the bore 3 is provided with an estimation image generator 55 for generating and parallel arranging one-dimensional power spectral images 71 in a direction perpendicular to the direction of cutting work traces P along the direction of the cutting work traces P on the basis of the digital brightness image 70 to generate an estimation image 73, and an estimator 57 for estimating the presence or absence of polishing residue Q on the inner surface 3A of the bore 3 on the basis of pixel values of respective pixels of the estimation image 73.

Abstract: Systems, methods, and apparatus for performing surface type detection in connection with locate and marking operations. In some embodiments, one or more sensors (e.g., radiation sensors, acoustic sensors, color sensors, light sensors, etc.) may be employed to collect information regarding a surface, such as a ground surface on which marking material is to be dispensed to mark the presence or absence of an underground facility. The collected sensor data may be analyzed to provide an estimate of a type of the surface that is being sensed. For example, a still-image or video camera may be used as a sensor that detects visible light reflecting from a surface. One or more images of the surface captured by the camera may be analyzed using some suitable image analysis software to identify one or more characteristics (e.g., color, intensity, randomness, presence/absence of lines, etc.) that may be indicative of a surface type.

Abstract: A surface is inspected by irradiating a light in a specific waveband onto a surface coated film which is formed on a surface of a workpiece and absorbs said specific waveband, picking up an image of a reflected light of the light irradiated onto the workpiece by an image pickup portion having a sensitivity to a light in said specific waveband, and inspecting a condition of the surface coated film based on the picked-up image.

Abstract: A surface inspection device (1) includes: a stage (10) for supporting a wafer (W); an illumination system (20) for illuminating with ultraviolet light a surface of the wafer (W) supported by the stage (10); a light reception system (30) for forming an image on a predetermined imaging surface with the light from the surface of the wafer (W); a camera unit (34) for capturing an image of the wafer (W) formed on the imaging surface by the light reception system (30); a pixel compensation drive unit (35) for performing pixel compensation; a control unit (40) for controlling the operation of the pixel compensation drive unit (35) and the camera unit (34) so that the camera unit (34) captures images of a plurality of wafers (W) while performing pixel compensation using the pixel compensation drive unit (35); and an image processing unit (45) for generating a synthesized image of the wafer (W) by successively arranging the pixels in the plurality of images captured by the camera unit (34) in the order based on the pi

Abstract: An imaging system for inspecting an inner surface bounding a component bore is provided along with a method of inspection therewith. The system includes a laser light source configured to emit a laser beam. Further, a camera is configured to image a reflection of the laser beam from the inner surface. At least a first minor is disposed within the bore. The laser light source is configured to emit the laser beam directly from the laser light source in substantially parallel relation to the central axis incident on the first mirror and the camera is configured to view a reflection of the laser beam from the inner surface.

Abstract: Every prescribed unit of video data is analyzed to estimate a degree of influence of pictures represented by every prescribed unit of video data on a viewer. For example, every prescribed unit of three-dimensional video data is analyzed to estimate a degree of influence of a depth in three-dimensional pictures represented by every prescribed unit of three-dimensional video data on a viewer. Information is generated which represents the estimated influence degree. Every prescribed unit of video data and the generated information are outputted while they are related to each other.

Abstract: The invention relates to an optical detection device for the detection of at least one surface (11a) of at least one component (11), the component (11) being capable of being transported from a first to a second workstation (2, 3) by means of a retaining element (15), and a camera instrument (18) being directed onto a first surface (11a) of the component (11), with at least one light-source (12) which transmits first light-beams (25, 26) in the short-wave range to the first surface (11a), with at least one second light-source (13a, 13b) which transmits second light-beams (29, 30) in the long-wave range to at least one second surface (11b, 11c) of the component (11) which is oriented differently in relation to the first surface (11a), and with the camera instrument which receives the first and second light-beams (27, 33, 34) reflected on the surfaces (11a-c) for the purpose of generating an image (37) of the surfaces.

Abstract: A device for monitoring surface alterations over time, preferably skin alterations, has means for capturing images of the alterations and for storing same in a memory. The device includes a screen and a processor for processing and managing said images, and the aforementioned image-capture means includes at least two cameras with overlapping viewing angles. The processor is configured to process skin alteration images taken from different angles and to obtain therefrom an image of said skin alteration that corresponds to a pre-determined viewing angle, lighting type and level and distance.

Abstract: A method for precisely detecting a width of a crack on a surface of an object is provided. The method includes positioning a crack width observation apparatus on the object, turning on a first light source at a first side of the crack, and photographing the surface with the first light source on to generate a first photograph to determine a boundary of the crack at the side distanced closest to the light source. A second light source at a second side of the crack is turned on to irradiate the surface of the object, and the surface is photographed with the second light source on to generate a second photograph to determine a boundary of the crack at the second side. The first photograph and the second photograph are processed to obtain a picture showing an actual boundary of the crack.

Abstract: Disclosed a method and device for detecting a shape of a sheet roll. The method for detecting a shape of a sheet roll comprises positioning a camera on a cylindrical side surface of the sheet roll; photographing a cylindrical side surface while rotating the camera along the cylindrical side surface of a sheet roll; and determining whether there is a defect in a shape of a winding roll by analyzing a pattern of an image acquired by photographing.

Abstract: Systems and methods of identifying and manipulating objects are disclosed. One system disclosed comprises a light source adapted to emit a collimated light beam onto a contoured surface, a sensor adapted to view a profile of the contoured surface illuminated by the collimated light beam, a processor in communication with the sensor, and a controller in communication with the processor. The controller may be adapted to generate a signal based on an attribute of a predefined profile.

Abstract: A method of measuring the quality of a surface of a substrate is described. The method includes the steps of obtaining a digital image of a portion of a surface of the substrate using an image obtaining apparatus; and measuring one or more physical characteristics of the obtained digital image so as to provide an indication of the quality of the surface of the substrate.

Abstract: An optical system for measuring an irregularly shaped object includes a dimensioning station having a base, a first wall extending from the base, and a second wall extending from the base. A collimated light is passed from each of first and second collimated light sources arranged generally parallel to the base, illuminating the first and second walls and defining first and second shadows, respectively. A camera is arranged to obtain image data representing each of the first and second shadows. The system is configured to collect the image data for determining at least one dimension of an object from each of the first and second shadows. Each of the first and second collimated light sources may be a light with a collimating lens arranged between the light and the respective wall. The light source may be an LED and the collimating lens may be a collimating Fresnel lens.