Absorber Continuously Variable (e.g., Wedge) Patents (Class 356/235)
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Patent number: 11487096Abstract: The patent discloses a differential phase contrast (DPC) quantitative phase microscopy method based on the optimal illumination pattern design. Firstly, the optimal illumination pattern corresponding to the isotropic phase transfer function of DPC quantitative phase imaging is derived, which is determined as a semi-annular illumination pattern with the illumination numerical aperture NAill equal to the numerical aperture NAobj of the objective lens. The illumination intensity distribution varies with the cosine of the illumination angle, and it can be expressed as S(?)=cos(?). This patent effectively compensates for the frequency loss of phase transfer, not only the high-frequency responses of PTF are enhanced, but also the transfer responses of low-frequency phase information is significantly improved.Type: GrantFiled: July 5, 2019Date of Patent: November 1, 2022Assignee: NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGYInventors: Qian Chen, Chao Zuo, Yao Fan, Jiasong Sun, Jiaji Li, Shijie Feng, Yuzhen Zhang
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Patent number: 11402426Abstract: A testing probe apparatus for testing die. The testing probe may include a probe interface and a carrier for supporting at least one die comprising 3D interconnect (3DI) structures. The probe interface may be positionable on a first side of the at least one die and include a voltage source and at least one first inductor operably coupled to the voltage source. A voltage sensor and at least one second inductor coupled to the voltage sensor may be disposed on a second opposing side of the at least one die. The voltage source of the probe interface may be configured to inductively cause a voltage within the 3DI structures of the at least one die via the at least one first inductor. The voltage sensor may be configured to sense a voltage within the at least one 3DI structure via the at least one second inductor. Related systems and methods are also disclosed.Type: GrantFiled: October 28, 2020Date of Patent: August 2, 2022Assignee: Micron Technology, Inc.Inventors: Tony M. Lindenberg, Kurt J. Bossart, Jonathan S. Hacker, Chandra S. Tiwari
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Patent number: 11375133Abstract: A method for automatically determining exposure settings for an image acquisition system comprises maintaining a plurality of look-up tables, each look-up table being associated with a corresponding light condition and storing image exposure settings associated with corresponding distance values between a subject and the image acquisition system. An image of a subject is acquired from a camera module; and a light condition occurring during the acquisition is determined based on the acquired image. A distance between the subject and the camera module during the acquisition is calculated.Type: GrantFiled: June 29, 2020Date of Patent: June 28, 2022Assignee: FotoNation LimitedInventor: Istvan Andorko
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Patent number: 10701277Abstract: A method for automatically determining exposure settings for an image acquisition system comprises maintaining a plurality of look-up tables, each look-up table being associated with a corresponding light condition and storing image exposure settings associated with corresponding distance values between a subject and the image acquisition system. An image of a subject is acquired from a camera module; and a light condition occurring during the acquisition is determined based on the acquired image. A distance between the subject and the camera module during the acquisition is calculated.Type: GrantFiled: May 31, 2017Date of Patent: June 30, 2020Assignee: FotoNation LimitedInventor: Istvan Andorko
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Patent number: 8659753Abstract: A laser energy sensor and methodology for measuring laser energy in a laser beam by photoacoustic means. Laser energy is converted into acoustic energy which is then measured and converted to an energy reading corresponding to the energy of a laser beam.Type: GrantFiled: September 21, 2011Date of Patent: February 25, 2014Assignee: The United States of America as Represented by the Secretary of the ArmyInventor: Jerry B. Cabalo
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Patent number: 7764366Abstract: A robotic die sorter having pick and place arm assemblies and a multi-camera optical inspection system is disclosed. A pick arm of the pick arm assembly picks a die from a semiconductor wafer, and a place arm of the place arm assembly receives the die from the pick arm and places same in a reel of pocketed tape. After picking, the pick arm and the place arm are rotated into facing arrangement, whereupon the die is transferred to the place head of the place arm and a camera of the optical inspection system to detect defects in the die. After inspection, the place arm rotates toward the pocketed tape and places the die into the pocketed tape. Additional cameras of the optical inspection system allow for calibration of the pick and place arms, as well as monitoring of the die transfer process.Type: GrantFiled: July 11, 2006Date of Patent: July 27, 2010Assignee: BESI North America, Inc.Inventors: John D. Moore, Lawrence F. Roberts, Miroslaw Sokol
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Patent number: 7428051Abstract: The invention relates to a device for the IR-spectrometric analysis of a solid, liquid or gaseous medium. The device includes a process probe, which has a reflection element. The device additionally includes a linear variable filter, at least one detector element, and a control/evaluation unit. At least one light source is also provided, the light of which is coupled into the reflection element via a collimating optics. At least one optical waveguide having a light input section and a light output section is provided. The light is guided via the light output section of the optical waveguide into a defined region of the linear variable filter. The detector element and the linear variable filter are arranged movably relative to one another over approximately the length of the linear variable filter. The control/evaluation unit determines the spectrum of the medium on the basis of the measured values delivered from the detector element.Type: GrantFiled: July 18, 2003Date of Patent: September 23, 2008Assignee: Endress + Hauser Conducta Gesellschaft fur Mess-u. Regeltechnik mgH + Co. KGInventors: Camiel Heffels, Dirk Steinmueller, Dick Scholten, Peter Lindmueller
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Patent number: 6049384Abstract: An apparatus for three dimensional imaging using multi-phased structured light. Measurement of dimensions as small as two hundred microns within one percent accuracy is possible, and multiple scans of a target object, such as the solder pads on an electronic circuit board substrate, are not required. A light source, having a pair of synchronized lamps and a specially designed reticle, projects two different phases of structured light onto a target object. The two phases are projected nearly instantaneously, and the detector is able to discriminate between the two exposures presented by the two out of phase illuminations. The method for presenting the three dimensional image uses filtering techniques and certain assumptions to resolve intensity equations having three unknowns from the two exposures of out of phase structured light.Type: GrantFiled: March 18, 1997Date of Patent: April 11, 2000Assignee: CyberOptics CorporationInventors: Eric P. Rudd, David Fishbaine, Paul R. Haugen, David M. Kranz
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Patent number: 5986751Abstract: An atomic absorption photometer with a hollow cathode lamp and a deuterium lamp uses for each a power source which receives a variable current and switches it on and off so as to output a constant voltage.Type: GrantFiled: May 18, 1998Date of Patent: November 16, 1999Assignee: Shimadzu CorporationInventor: Masumi Sakai
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Patent number: 5910837Abstract: The invention relates to a photomechanical transducer which comprises a photochromic element made of a first material and attached on a carrier element made of a deformable second material. The first material of the photochromic element changes its molecular shape when it is irradiated with light and thereby introduces a strain into the carrier element which as a result is deformed.Type: GrantFiled: September 25, 1996Date of Patent: June 8, 1999Assignee: International Business Machines CorporationInventor: James Kazimierz Gimzewski
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Patent number: 5218428Abstract: An optical transmittance apparatus has a pair of reference channels of glass rods and a pair of sample channels containing sample fluid. A beam splitter and mirror pass a first portion of an incident beam through an ingoing reference channel, and a second portion through an ingoing sample channel. The first portion is reflected back through an outgoing reference channel, and the second portion back through an outgoing sample channel. The beam splitter and mirror directs the outgoing beams into a common outlet path. A partial disk selectively passes either portion. For positioning the disk, poles of a magnet mounted on the disk axle face windings made about an axis perpendicular to the axle, the windings being on the opposite side of a barrier plate from the poles. Current of one polarity through the windings effects one orientation of the disk, and reversed olarity reorients it perpendicularly.Type: GrantFiled: October 8, 1991Date of Patent: June 8, 1993Assignee: The Perkin-Elmer CorporationInventor: Robert A. Hoult
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Patent number: 5148233Abstract: The invention is designed to calibrate a low-level optical power by a substitution method using a pulse generating section in which a light-shielding disk having a sectorial opening, as a component capable of accurate optical attenuation, is rotated in a light beam to generate an intermittent pulse signal having a duty ratio corresponding to the size of the opening, and the pulse signal is averaged to obtain an optical attenuation equal to the duty ratio. More specifically, while an object to be calibrated is set in a given standard state, a first pulse train having a duty ratio d1=Tw.sub.1 /Tf.sub.1 is input to the object, and an average optical power value A of an output from the object is measured and stored. Subsequently, a second pulse train having a duty ratio d2=Tw.sub.2 /Tf.sub.2 is input to the object, and the object is adjusted such that an average optical power value of an output from the object becomes the value A.Type: GrantFiled: October 25, 1990Date of Patent: September 15, 1992Assignee: Anritsu CorporationInventors: Takayuki Imamura, Yuji Ohuchi
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Patent number: 4441096Abstract: A method and apparatus for converting the intensity of an unknown optical signal (B) into an electrical signal in digital form utilizes two elongated optical attenuators (11, 13), one for the unknown optical signal from a source (10) and one for a known optical signal (A) from a variable source (12), a plurality of photodetectors (e.g., 17, 18) along each attenuator for detecting the intensity of the optical signals, and a plurality of comparators (e.g., 21) connected to the photodetectors in pairs to determine at what points being compared the attenuated known signal equals the attenuated unknown signal. The intensity of the unknown relative to the known is thus determined by the output of a particular comparator. That output is automatically encoded to a relative intensity value in digital form through a balancing feedback control (24) and encoder (23).Type: GrantFiled: August 13, 1982Date of Patent: April 3, 1984Assignee: California Institute of TechnologyInventor: Vincent L. Evanchuk
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Patent number: 4387985Abstract: A unique light attenuator is positioned between a bank of lamps and the underside of a light diffuser which supports a subject to be photographed in a process camera, such light attenuator comprising a first circular pattern of constant width, constant density lines and a second superimposed pattern of straight lines which compensate for nonuniformity of illumination of the subject.Type: GrantFiled: October 5, 1981Date of Patent: June 14, 1983Assignee: Itek CorporationInventors: Irving J. Magin, Erik K. Nelson
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Patent number: 4260256Abstract: An apparatus for measuring the intensity of light reflected from a scene along an optical path includes a photoelectric cell, an optical lens and a light-attenuating device that has a gradation of opacity along one dimension that extends generally transversely to the optical path. The device may be moved transversely of the optical path to vary the average amount of light impinging upon the cell. The cell has a gradation of sensitivity to light along a dimension that extends generally transversely of the optical path. The sensitivity varies along the cell dimension and the cell is so disposed so as to be correspondingly more sensitive to light that has passed through more opaque portions of the light attenuating device and less sensitive to light that has passed through less opaque portions of the light attenuating device. The apparatus may be incorporated in a photographic camera and may be coupled to the camera's exposure control mechanism.Type: GrantFiled: November 17, 1978Date of Patent: April 7, 1981Assignee: Eastman Kodak CompanyInventor: David C. Smart