Absorber Continuously Variable (e.g., Wedge) Patents (Class 356/235)
  • Patent number: 11487096
    Abstract: The patent discloses a differential phase contrast (DPC) quantitative phase microscopy method based on the optimal illumination pattern design. Firstly, the optimal illumination pattern corresponding to the isotropic phase transfer function of DPC quantitative phase imaging is derived, which is determined as a semi-annular illumination pattern with the illumination numerical aperture NAill equal to the numerical aperture NAobj of the objective lens. The illumination intensity distribution varies with the cosine of the illumination angle, and it can be expressed as S(?)=cos(?). This patent effectively compensates for the frequency loss of phase transfer, not only the high-frequency responses of PTF are enhanced, but also the transfer responses of low-frequency phase information is significantly improved.
    Type: Grant
    Filed: July 5, 2019
    Date of Patent: November 1, 2022
    Assignee: NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
    Inventors: Qian Chen, Chao Zuo, Yao Fan, Jiasong Sun, Jiaji Li, Shijie Feng, Yuzhen Zhang
  • Patent number: 11402426
    Abstract: A testing probe apparatus for testing die. The testing probe may include a probe interface and a carrier for supporting at least one die comprising 3D interconnect (3DI) structures. The probe interface may be positionable on a first side of the at least one die and include a voltage source and at least one first inductor operably coupled to the voltage source. A voltage sensor and at least one second inductor coupled to the voltage sensor may be disposed on a second opposing side of the at least one die. The voltage source of the probe interface may be configured to inductively cause a voltage within the 3DI structures of the at least one die via the at least one first inductor. The voltage sensor may be configured to sense a voltage within the at least one 3DI structure via the at least one second inductor. Related systems and methods are also disclosed.
    Type: Grant
    Filed: October 28, 2020
    Date of Patent: August 2, 2022
    Assignee: Micron Technology, Inc.
    Inventors: Tony M. Lindenberg, Kurt J. Bossart, Jonathan S. Hacker, Chandra S. Tiwari
  • Patent number: 11375133
    Abstract: A method for automatically determining exposure settings for an image acquisition system comprises maintaining a plurality of look-up tables, each look-up table being associated with a corresponding light condition and storing image exposure settings associated with corresponding distance values between a subject and the image acquisition system. An image of a subject is acquired from a camera module; and a light condition occurring during the acquisition is determined based on the acquired image. A distance between the subject and the camera module during the acquisition is calculated.
    Type: Grant
    Filed: June 29, 2020
    Date of Patent: June 28, 2022
    Assignee: FotoNation Limited
    Inventor: Istvan Andorko
  • Patent number: 10701277
    Abstract: A method for automatically determining exposure settings for an image acquisition system comprises maintaining a plurality of look-up tables, each look-up table being associated with a corresponding light condition and storing image exposure settings associated with corresponding distance values between a subject and the image acquisition system. An image of a subject is acquired from a camera module; and a light condition occurring during the acquisition is determined based on the acquired image. A distance between the subject and the camera module during the acquisition is calculated.
    Type: Grant
    Filed: May 31, 2017
    Date of Patent: June 30, 2020
    Assignee: FotoNation Limited
    Inventor: Istvan Andorko
  • Patent number: 8659753
    Abstract: A laser energy sensor and methodology for measuring laser energy in a laser beam by photoacoustic means. Laser energy is converted into acoustic energy which is then measured and converted to an energy reading corresponding to the energy of a laser beam.
    Type: Grant
    Filed: September 21, 2011
    Date of Patent: February 25, 2014
    Assignee: The United States of America as Represented by the Secretary of the Army
    Inventor: Jerry B. Cabalo
  • Patent number: 7764366
    Abstract: A robotic die sorter having pick and place arm assemblies and a multi-camera optical inspection system is disclosed. A pick arm of the pick arm assembly picks a die from a semiconductor wafer, and a place arm of the place arm assembly receives the die from the pick arm and places same in a reel of pocketed tape. After picking, the pick arm and the place arm are rotated into facing arrangement, whereupon the die is transferred to the place head of the place arm and a camera of the optical inspection system to detect defects in the die. After inspection, the place arm rotates toward the pocketed tape and places the die into the pocketed tape. Additional cameras of the optical inspection system allow for calibration of the pick and place arms, as well as monitoring of the die transfer process.
    Type: Grant
    Filed: July 11, 2006
    Date of Patent: July 27, 2010
    Assignee: BESI North America, Inc.
    Inventors: John D. Moore, Lawrence F. Roberts, Miroslaw Sokol
  • Patent number: 7428051
    Abstract: The invention relates to a device for the IR-spectrometric analysis of a solid, liquid or gaseous medium. The device includes a process probe, which has a reflection element. The device additionally includes a linear variable filter, at least one detector element, and a control/evaluation unit. At least one light source is also provided, the light of which is coupled into the reflection element via a collimating optics. At least one optical waveguide having a light input section and a light output section is provided. The light is guided via the light output section of the optical waveguide into a defined region of the linear variable filter. The detector element and the linear variable filter are arranged movably relative to one another over approximately the length of the linear variable filter. The control/evaluation unit determines the spectrum of the medium on the basis of the measured values delivered from the detector element.
    Type: Grant
    Filed: July 18, 2003
    Date of Patent: September 23, 2008
    Assignee: Endress + Hauser Conducta Gesellschaft fur Mess-u. Regeltechnik mgH + Co. KG
    Inventors: Camiel Heffels, Dirk Steinmueller, Dick Scholten, Peter Lindmueller
  • Patent number: 6049384
    Abstract: An apparatus for three dimensional imaging using multi-phased structured light. Measurement of dimensions as small as two hundred microns within one percent accuracy is possible, and multiple scans of a target object, such as the solder pads on an electronic circuit board substrate, are not required. A light source, having a pair of synchronized lamps and a specially designed reticle, projects two different phases of structured light onto a target object. The two phases are projected nearly instantaneously, and the detector is able to discriminate between the two exposures presented by the two out of phase illuminations. The method for presenting the three dimensional image uses filtering techniques and certain assumptions to resolve intensity equations having three unknowns from the two exposures of out of phase structured light.
    Type: Grant
    Filed: March 18, 1997
    Date of Patent: April 11, 2000
    Assignee: CyberOptics Corporation
    Inventors: Eric P. Rudd, David Fishbaine, Paul R. Haugen, David M. Kranz
  • Patent number: 5986751
    Abstract: An atomic absorption photometer with a hollow cathode lamp and a deuterium lamp uses for each a power source which receives a variable current and switches it on and off so as to output a constant voltage.
    Type: Grant
    Filed: May 18, 1998
    Date of Patent: November 16, 1999
    Assignee: Shimadzu Corporation
    Inventor: Masumi Sakai
  • Patent number: 5910837
    Abstract: The invention relates to a photomechanical transducer which comprises a photochromic element made of a first material and attached on a carrier element made of a deformable second material. The first material of the photochromic element changes its molecular shape when it is irradiated with light and thereby introduces a strain into the carrier element which as a result is deformed.
    Type: Grant
    Filed: September 25, 1996
    Date of Patent: June 8, 1999
    Assignee: International Business Machines Corporation
    Inventor: James Kazimierz Gimzewski
  • Patent number: 5218428
    Abstract: An optical transmittance apparatus has a pair of reference channels of glass rods and a pair of sample channels containing sample fluid. A beam splitter and mirror pass a first portion of an incident beam through an ingoing reference channel, and a second portion through an ingoing sample channel. The first portion is reflected back through an outgoing reference channel, and the second portion back through an outgoing sample channel. The beam splitter and mirror directs the outgoing beams into a common outlet path. A partial disk selectively passes either portion. For positioning the disk, poles of a magnet mounted on the disk axle face windings made about an axis perpendicular to the axle, the windings being on the opposite side of a barrier plate from the poles. Current of one polarity through the windings effects one orientation of the disk, and reversed olarity reorients it perpendicularly.
    Type: Grant
    Filed: October 8, 1991
    Date of Patent: June 8, 1993
    Assignee: The Perkin-Elmer Corporation
    Inventor: Robert A. Hoult
  • Patent number: 5148233
    Abstract: The invention is designed to calibrate a low-level optical power by a substitution method using a pulse generating section in which a light-shielding disk having a sectorial opening, as a component capable of accurate optical attenuation, is rotated in a light beam to generate an intermittent pulse signal having a duty ratio corresponding to the size of the opening, and the pulse signal is averaged to obtain an optical attenuation equal to the duty ratio. More specifically, while an object to be calibrated is set in a given standard state, a first pulse train having a duty ratio d1=Tw.sub.1 /Tf.sub.1 is input to the object, and an average optical power value A of an output from the object is measured and stored. Subsequently, a second pulse train having a duty ratio d2=Tw.sub.2 /Tf.sub.2 is input to the object, and the object is adjusted such that an average optical power value of an output from the object becomes the value A.
    Type: Grant
    Filed: October 25, 1990
    Date of Patent: September 15, 1992
    Assignee: Anritsu Corporation
    Inventors: Takayuki Imamura, Yuji Ohuchi
  • Patent number: 4441096
    Abstract: A method and apparatus for converting the intensity of an unknown optical signal (B) into an electrical signal in digital form utilizes two elongated optical attenuators (11, 13), one for the unknown optical signal from a source (10) and one for a known optical signal (A) from a variable source (12), a plurality of photodetectors (e.g., 17, 18) along each attenuator for detecting the intensity of the optical signals, and a plurality of comparators (e.g., 21) connected to the photodetectors in pairs to determine at what points being compared the attenuated known signal equals the attenuated unknown signal. The intensity of the unknown relative to the known is thus determined by the output of a particular comparator. That output is automatically encoded to a relative intensity value in digital form through a balancing feedback control (24) and encoder (23).
    Type: Grant
    Filed: August 13, 1982
    Date of Patent: April 3, 1984
    Assignee: California Institute of Technology
    Inventor: Vincent L. Evanchuk
  • Patent number: 4387985
    Abstract: A unique light attenuator is positioned between a bank of lamps and the underside of a light diffuser which supports a subject to be photographed in a process camera, such light attenuator comprising a first circular pattern of constant width, constant density lines and a second superimposed pattern of straight lines which compensate for nonuniformity of illumination of the subject.
    Type: Grant
    Filed: October 5, 1981
    Date of Patent: June 14, 1983
    Assignee: Itek Corporation
    Inventors: Irving J. Magin, Erik K. Nelson
  • Patent number: 4260256
    Abstract: An apparatus for measuring the intensity of light reflected from a scene along an optical path includes a photoelectric cell, an optical lens and a light-attenuating device that has a gradation of opacity along one dimension that extends generally transversely to the optical path. The device may be moved transversely of the optical path to vary the average amount of light impinging upon the cell. The cell has a gradation of sensitivity to light along a dimension that extends generally transversely of the optical path. The sensitivity varies along the cell dimension and the cell is so disposed so as to be correspondingly more sensitive to light that has passed through more opaque portions of the light attenuating device and less sensitive to light that has passed through less opaque portions of the light attenuating device. The apparatus may be incorporated in a photographic camera and may be coupled to the camera's exposure control mechanism.
    Type: Grant
    Filed: November 17, 1978
    Date of Patent: April 7, 1981
    Assignee: Eastman Kodak Company
    Inventor: David C. Smart