With Internal Standard Comparison Patents (Class 356/306)
  • Patent number: 11835525
    Abstract: A measurement system includes a system for causing relative motion between a sample and an irradiation spot. The sample includes fluorescent markers having respective wavelengths. A gating system provides a gating signal based at least in part on resultant light substantially at an irradiation wavelength. A detection system detects fluorescent light from the irradiated markers and provides detection signals representing the fluorescent light detected concurrently with a gate-open signal. In some examples, the detection system detects fluorescent light at multiple wavelengths and provides respective detection signals. A spectral discriminator arranged optically between the sample and the detection system receives the fluorescent light from the sample and provides respective fluorescent light at the wavelengths to the detection system. A flow cytometer can spectrally disperse resultant fluorescent light and measure the wavelengths separately.
    Type: Grant
    Filed: April 3, 2020
    Date of Patent: December 5, 2023
    Assignee: Miftek Corporation
    Inventors: Masanobu Yamamoto, J. Paul Robinson
  • Patent number: 11680893
    Abstract: A device may receive information identifying results of a spectroscopic measurement of an unknown sample. The device may perform a first classification of the unknown sample based on the results of the spectroscopic measurement and a global classification model. The device may generate a local classification model based on the first classification. The device may perform a second classification of the unknown sample based on the results of the spectroscopic measurement and the local classification model. The device may provide information identifying a class associated with the unknown sample based on performing the second classification.
    Type: Grant
    Filed: May 7, 2019
    Date of Patent: June 20, 2023
    Assignee: VIAVI Solutions Inc.
    Inventors: Changmeng Hsiung, Christopher G. Pederson, Peng Zou, Lan Sun
  • Patent number: 10598587
    Abstract: An optical device includes a door, a door control unit, a polarized light generation unit and a spectrum response analysis unit. The polarized light generation unit and the spectrum response analysis unit are located at a first side of the door. When the door is opened by the door control unit, a polarized light from the polarized light generation unit is transmitted through the door and externally projected on an under-test object at a second side of the door, so that a scattered light is generated. After the scattered light is returned back and transmitted through the door, the scattered light is projected on the spectrum response analysis unit, so that the spectrum response analysis unit performs a spectrum response analysis. The optical device has enhanced signal-to-noise ratio. Moreover, the optical device is capable of acquiring more explicit and diverse inherent information of the under-test object.
    Type: Grant
    Filed: May 26, 2016
    Date of Patent: March 24, 2020
    Assignee: EVERREADY PRECISION IND. CORP.
    Inventors: Jyh-Long Chern, Chih-Ming Yen
  • Publication number: 20150092191
    Abstract: Systems and methods for measuring spectra and other optical characteristics such as colors, translucence, gloss, and other characteristics of objects and materials such as skin. Instruments and methods for measuring spectra and other optical characteristics of skin or other translucent or opaque objects utilize an abridged spectrophotometer and improved calibration/normalization methods. Improved linearization methods also are provided, as are improved classifier-based algorithms. User control is provided via a graphical user interface. Product or product formulations to match the measured skin or other object or to transform the skin or other object are provided to lighten, darken, make more uniform and the like.
    Type: Application
    Filed: September 18, 2014
    Publication date: April 2, 2015
    Applicant: SPECTRAL SENSORS INC.
    Inventors: Wayne D. Jung, Russell W. Jung, Walter W. Sloan, Paresh Patel, Alan R. Loudermilk, Joseph Dale Martens
  • Publication number: 20150085279
    Abstract: Systems and methods for measuring spectra and other optical characteristics such as colors, translucence, gloss, and other characteristics of objects and materials such as skin. Instruments and methods for measuring spectra and other optical characteristics of skin or other translucent or opaque objects utilize an abridged spectrophotometer and improved calibration/normalization methods. Improved linearization methods also are provided, as are improved classifier-based algorithms. User control is provided via a graphical user interface. Product or product formulations to match the measured skin or other object or to transform the skin or other object are provided to lighten, darken, make more uniform and the like.
    Type: Application
    Filed: September 18, 2014
    Publication date: March 26, 2015
    Applicants: Spectral Sensors Inc., L'Oréal
    Inventors: Guive Balooch, Chloe A. Legendre, Wayne D. Jung, Russell W. Jung, Walter W. Sloan, Paresh Patel, Alan R. Loudermilk
  • Patent number: 8947660
    Abstract: An improved method and an improved device for carrying out an optical comparison between at least two samples, preferably by comparing sections that can be selected, is characterized by the following characteristics: the sample (UR, LE, I) that is to be examined and is characterized by a non-uniformity in the structure and/or color is illuminated by diffused light; from the light reflected by the sample (UR, LE, I) to be examined, an interference spectrum is created by means of a spectrometer; the interference spectrum created by the spectrometer is depicted on a camera; the interference spectrum obtained in this way and/or values of the sample (I) to be examined derived therefrom are used as sample values which are compared to sample values of a reference sample (UR, LE) obtained accordingly.
    Type: Grant
    Filed: April 29, 2010
    Date of Patent: February 3, 2015
    Assignee: Schattdecor AG
    Inventors: Johannes Jaschul, Martin Kosina, Kai Rainer Hummel
  • Patent number: 8929642
    Abstract: A three-dimensional scanner according to one aspect of the embodiments includes an irradiation unit, an imaging unit, a position detecting unit, and a scanning-region determining unit. The irradiation unit emits a slit-shaped light beam while changing an irradiation position with respect to a measuring object. The imaging unit sequentially captures images of the measuring object irradiated with the light beam. The position detecting unit detects a position of the light beam in an image captured by the imaging unit by scanning the image. The scanning-region determining unit determines a scanning region in an image as a scanning target by the position detecting unit based on a position of the light beam in an image captured by the imaging unit before the image as a scanning target.
    Type: Grant
    Filed: March 5, 2012
    Date of Patent: January 6, 2015
    Assignee: Kabushiki Kaisha Yasakawa Denki
    Inventor: Yuji Ichimaru
  • Publication number: 20140152984
    Abstract: A method of evaluating dispersion degrees of mixed epoxy resins includes, first, obtaining a resin mixture by mixing a plurality of aromatic epoxy resins, and taking a plurality of measurement samples from a plurality of sites of the resin mixture. The measurement samples are spectroscopically analyzed to obtain the spectra, and a plurality of common functional group peaks in the spectra are selected. The absorbances of the selected peaks are standardized to obtain absorbance ratios, based on the absorbance of a standard peak, in each of the spectra. Then, the standard deviations of the absorbance ratios of the selected peaks are calculated between the measurement samples. The maximum value of the obtained standard deviations is compared with a predetermined threshold value to evaluate the dispersion degrees of the aromatic epoxy resins.
    Type: Application
    Filed: December 2, 2013
    Publication date: June 5, 2014
    Applicant: HONDA MOTOR CO., LTD.
    Inventor: Shuichiro Yoshida
  • Patent number: 8699022
    Abstract: This disclosure relates to a method for analyzing a sample of material. The method includes (a) converting a portion of the sample into a plasma multiple times; (b) recording a spectrum of electromagnetic radiation emitted in response to each of the sample conversions to define a sequence of spectra for the sample, in which each member of the sequence corresponds to the spectrum recorded in response to a different one of the sample conversions; (c) using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of at least one reference sample in a reference library; and (d) using the electronic processor to determine information about the sample based on the comparison to the reference samples in the library.
    Type: Grant
    Filed: February 6, 2013
    Date of Patent: April 15, 2014
    Assignee: Materialytics, LLC
    Inventors: Catherine E. McManus, James W. Dowe, III, Tristan M. Likes, James W. Dowe, IV
  • Publication number: 20130321802
    Abstract: Wavelength information indicating a correspondence relationship between a plurality of light receiving elements of a light receiving unit and wavelengths of pieces of lights is stored. First and second intensity distributions of the light related to first and second dispersion images are acquired based on a signal outputted from each of the light receiving elements when a monochromatic light is passed through a opening of a light shielding body and first and second dispersion images related to primary and secondary diffracted light are formed on the light receiving unit. An estimated intensity distribution of the light related to the second dispersion image is calculated from the first intensity distribution according to a predetermined relational expression. A change amount related to the wavelength information is calculated based on the estimated intensity distribution and the second intensity distribution. The wavelength information is corrected according to the change amount.
    Type: Application
    Filed: February 3, 2012
    Publication date: December 5, 2013
    Inventor: Kenji Imura
  • Publication number: 20130250291
    Abstract: The invention relates to a check-tile for validating instrument scales of colour measurement instruments, in particular of goniospectrophotometers, said check-tile comprising a transparent substrate coated with a multi-layer coating, said multi-layer coating comprising: A) a pigmented mid-coat applied to the transparent substrate, wherein said pigmented mid-coat is translucent and made of a base coat coating composition I comprising at least one transparent interference pigment and at least one transparent or semi-transparent solid pigment, and B) a pigmented ground coat applied to the pigmented mid-coat, wherein said pigmented ground coat is opaque and made of a base coat coating composition II comprising at least one achromatic solid pigment.
    Type: Application
    Filed: December 20, 2011
    Publication date: September 26, 2013
    Applicant: U S Coatings IP Co., LLC
    Inventors: Wilhelm Kettler, Uwe Johansson
  • Publication number: 20130250292
    Abstract: The invention relates to a check-tile for validating instrument scales of colour measurement instruments, in particular of goniospectrophotometers, said check-tile comprising a transparent substrate coated with a multi-layer coating, said multi-layer coating comprising: A) a pigmented mid-coat applied to the transparent substrate, wherein said pigmented mid-coat is translucent and made of a base coat coating composition I comprising at least one transparent interference pigment, and B) a pigmented ground coat, wherein said pigmented ground coat is opaque and made of a base coat coating composition II comprising at least one opaque solid coloured pigment.
    Type: Application
    Filed: December 20, 2011
    Publication date: September 26, 2013
    Applicant: U S COATINGS IP CO LLC
    Inventors: Wilhelm Kettler, Uwe Johansson
  • Patent number: 8538717
    Abstract: A method and apparatus for absorbance correction in a spectroscopic heating value sensor in which a reference light intensity measurement is made on a non-absorbing reference fluid, a light intensity measurement is made on a sample fluid, and a measured light absorbance of the sample fluid is determined. A corrective light intensity measurement at a non-absorbing wavelength of the sample fluid is made on the sample fluid from which an absorbance correction factor is determined. The absorbance correction factor is then applied to the measured light absorbance of the sample fluid to arrive at a true or accurate absorbance for the sample fluid.
    Type: Grant
    Filed: January 28, 2011
    Date of Patent: September 17, 2013
    Assignees: Gas Technology Institute, North Carolina State University
    Inventors: Alexei Saveliev, Vilas Vyankatrao Jangale, Sergeui Zelepouga, John Pratapas
  • Patent number: 8411928
    Abstract: An inspection region is specified using the design information to perform region division for measurement through a scatterometry method. The obtained detection data is classified by pattern into a periodic region and a non-periodic region. A spectroscopic characteristic is detected by an optical sensor to extract features. The extracted features are compared with features stored in a feature map database for each region to evaluate a state of a patterned medium.
    Type: Grant
    Filed: June 10, 2009
    Date of Patent: April 2, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hideaki Sasazawa, Takenori Hirose, Minoru Yoshida, Keiya Saito, Shigeru Serikawa
  • Publication number: 20130063721
    Abstract: In one embodiment, a pattern inspection apparatus includes a light source configured to generate light, and a condenser configured to shape the light into a line beam to illuminate a wafer with the line beam. The apparatus further includes a spectrometer configured to disperse the line beam reflected from the wafer. The apparatus further includes a two-dimensional detector configured to detect the line beam dispersed by the spectrometer, and output a signal including spectrum information of the line beam. The apparatus further includes a comparison unit configured to compare the spectrum information obtained from corresponding places of a repetitive pattern on the wafer with each other, and a determination unit configured to determine whether the wafer includes a defect, based on a comparison result of the spectrum information.
    Type: Application
    Filed: March 8, 2012
    Publication date: March 14, 2013
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Takayoshi FUJII, Yusaku KONNO, Makoto KANEKO, Yuichiro YAMAZAKI, Mitsutoshi WATABIKI, Kiminori YOSHINO, Yusuke IIDA
  • Publication number: 20120320367
    Abstract: In order to rapidly inspect shape defects in the object of inspection that is the minute pattern on a magnetic recording medium formed from patterned media, in the disclosed patterned media defect inspection method detected spectral waveform data is compared with reference-standard spectral reflectance waveform data, which is stored in a database and the pattern-shape of which is known, and defects are detected. The type of the defects is determined on the basis of the disparity, for each detected wavelength, between the spectral waveform data of the detected defects, and the reference-standard spectral reflectance waveform data.
    Type: Application
    Filed: February 1, 2011
    Publication date: December 20, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Yu Yanaka, Shigeru Serikawa, Kiyotaka Horie, Ryuta Suzuki
  • Publication number: 20120287431
    Abstract: Described herein are systems and methods for determining the location, composition and concentration of a hydrocarbon containing plume in environmental seawater. These systems and methods disclosed use multiple complex admittance measurements from seawater in order to identify the contents, concentration, and location of the hydrocarbon containing plume. In preferred variations system includes a sensor array that substantially simultaneously records plume location, depth, and composition.
    Type: Application
    Filed: September 8, 2010
    Publication date: November 15, 2012
    Inventors: Leonid Matsiev, James Bennett, Michael Weickert
  • Patent number: 8269965
    Abstract: A method for characterizing samples having units, by monitoring fluctuating intensities of radiation emitted, scattered and/or reflected by said units in at least one measurement volume, the monitoring being performed by at least one detection means, said method comprising the steps of: a) measuring in a repetitive mode a number of photon counts per time interval of defined length, b) determining a function of the number of photon counts per said time interval, c) determining a function of specific brightness of said units on basis of said function or the number of photon counts.
    Type: Grant
    Filed: May 5, 2010
    Date of Patent: September 18, 2012
    Assignee: Olympus Corporation
    Inventor: Peet Kask
  • Patent number: 8169607
    Abstract: A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.
    Type: Grant
    Filed: October 4, 2009
    Date of Patent: May 1, 2012
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Hiroyuki Sano, Makoto Okawauchi, Kosei Oshima, Kazuaki Ohkubo, Tsutomu Mizuguchi, Shiro Shima
  • Patent number: 8159656
    Abstract: A first step of measuring a change over time in the spectral transmission spectrum of a measurement sample by its exposure to the light of a light source including an ultraviolet radiation for a preset light exposure time, a second step of performing a correction according to the change over time in the spectral transmission spectrum of the measurement sample based on the result of the measurement obtained by the first step, and a third step of calculating the final in vitro predicted SPF of the measurement sample using the result of the correction obtained by the second step are included.
    Type: Grant
    Filed: October 4, 2007
    Date of Patent: April 17, 2012
    Assignee: Shiseido Company, Ltd.
    Inventors: Yoshimasa Miura, Masayuki Shirao, Takashi Ohmori, Takuya Saiwaki
  • Patent number: 8139222
    Abstract: A method and system for measuring a physical property of a fluid in which light having wavelengths in the near-infrared is directed into a test cell containing the fluid and portions of the light not absorbed by the fluid and passing out of the cell are spatially dispersed by wavelength, forming a light spectrum that is projected onto a detector. The light spectrum is digitized and inputted into a data processing unit in which it is compared to the actual spectrum of the light source stored in the system to determine the absorbance spectrum of the fluid. The system is spectrally calibrated by identifying known spectral features of the fluid absorbance spectrum. To correct for deviations in the original light source spectrum, a calibration method in which the pressure of the fluid in the test cell is alternated between a first positive pressure and a second positive pressure is employed.
    Type: Grant
    Filed: March 1, 2010
    Date of Patent: March 20, 2012
    Assignee: Gas Technology Institute
    Inventors: Alexei Saveliev, Serguei Zelepouga, David M. Rue
  • Patent number: 8069020
    Abstract: A first wafer is fabricated using a first value for a process parameter specifying a process condition in fabricating the structure. A first value of a dispersion is measured from the first wafer. A second wafer is fabricated using a second value for the process parameter. A second value of the dispersion is measured from the second wafer. A third wafer is fabricated using a third value for the process parameter. The first, second, and third values for the process parameter are different from each other. A third value of the dispersion is measured from the third wafer. A dispersion function is defined to relate the process parameter to the dispersion using the first, second, and third values for the process parameter and the measured first, second, and third values of the dispersion. The simulated diffraction signal is generated using the defined dispersion function. The simulated diffraction signal is stored.
    Type: Grant
    Filed: September 19, 2007
    Date of Patent: November 29, 2011
    Assignee: Tokyo Electron Limited
    Inventors: Shifang Li, Hanyou Chu
  • Publication number: 20110130995
    Abstract: In a spectrographic workpiece metrology system having an optical viewing window, the viewing window is calibrated against a reference sample of a known absolute reflectance spectrum to produce a normalized reflectance spectrum of the reference sample, which is combined with the absolute reflectance spectrum to produce a correction factor. Successive production workpieces are measured through the window and calibrated against the viewing window reflectance, and transformed to absolute reflectance spectra using the same correction factor without having to re-load the reference sample.
    Type: Application
    Filed: February 10, 2011
    Publication date: June 2, 2011
    Applicant: Applied Materials, Inc.
    Inventors: Edgar Genio, Edward W. Budiarto
  • Patent number: 7919753
    Abstract: A method of non-destructively determining the amount of ultraviolet degradation of a surface and/or paint adhesion characteristics of the surface corresponding with UV damage including determining a physical property of a composite material/surfacing film by providing a series of composite materials/surfacing films which are subjected to increasing UV light exposure to create a set of UV damage standards, collecting mid-IR spectra on those standards, performing data pre-processing and then multivariate calibration on the spectra of the composite materials/surfacing films, and using that calibration to predict the UV damage for samples in question.
    Type: Grant
    Filed: June 28, 2008
    Date of Patent: April 5, 2011
    Assignee: The Boeing Company
    Inventors: Paul H. Shelley, Greg J. Werner, Diane R. LaRiviere, Gwen M. Gross
  • Patent number: 7899650
    Abstract: In one aspect, a signal processing system includes a processor, an I/O device operatively associated with the processor, and a memory device bearing instructions configured to cause the processor to obtain a representation of signal data over a data domain and position a sliding-window over a portion of the signal data, such portion corresponding to a sliding-window domain, to analyze the signal data within the sliding-window domain to detect the presence of a signature multiplet and, based on the analysis of the data, to estimate the pedestal of the signal data within the sliding-window domain.
    Type: Grant
    Filed: June 4, 2008
    Date of Patent: March 1, 2011
    Assignee: University Of Maryland, Baltimore County
    Inventors: Abhijit Yeshwantpur, Joel M. Morris
  • Publication number: 20100106444
    Abstract: In a spectrographic workpiece metrology system having an optical viewing window, the viewing window is calibrated against a reference sample of a known absolute reflectance spectrum to produce a normalized reflectance spectrum of the reference sample, which is combined with the absolute reflectance spectrum to produce a correction factor. Successive production workpieces are measured through the window and calibrated against the viewing window reflectance, and transformed to absolute reflectance spectra using the same correction factor without having to re-load the reference sample.
    Type: Application
    Filed: February 18, 2009
    Publication date: April 29, 2010
    Applicant: Applied Materials, Inc.
    Inventors: EDGAR GENIO, EDWARD W. BUDIARTO
  • Patent number: 7707003
    Abstract: A method and system collects and manipulates information from various sources for the purpose of determining the location of loads of material in a bulk material storage container and tracing the number and identity of bulk material sources, such as farms or processing plants, for loads located within a bulk material storage container. Such production source information is thus uniquely associated with a particular non-liquid bulk material load. Surface mapping of a surface of bulk material stored in a storage container is performed before and after material is added to the container, and are used to determine position of loads within the storage container. Embodiments of the present invention, using knowledge of the position of loads within the container, may be used for the purposes of preplanning and enhancing blended load-out batches.
    Type: Grant
    Filed: February 23, 2006
    Date of Patent: April 27, 2010
    Assignee: Bin Tech L.L.L.P.
    Inventors: Timothy C. O'Connor, Guy A. Fromme
  • Publication number: 20090316147
    Abstract: A method and apparatus for continuous monitoring of a light bulb or group of light bulbs. The light emission of a light bulb is compared with known emission failure values for similar types of light bulbs, and a determination of a near failure status for the bulb is made.
    Type: Application
    Filed: March 6, 2009
    Publication date: December 24, 2009
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Rick A. Hamilton, II, Paul Moskowitz, Brian M. O'Connell, Clifford A. Pickover, Keith R. Walker
  • Patent number: 7534576
    Abstract: A Method for identifying one or a small number of molecules, especially in a dilution of ?1 ?M, using laser excited FCS with measuring times ?500 ms and short diffusion paths of the molecules to be analyzed, wherein the measurement is performed in small volume units of preferably ?10?14 l, by determining material-specific parameters which are determined by luminescence measurements of molecules to be examined. The device which can be preferably used for performing the method according to the invention is a per se known system of microscope optics for laser focusing for fluorescence excitation in a small measuring compartment of a very diluted solution and for imaging the emitted light in the subsequent measurement through confocal imaging wherein at least one system of optics with high numerical aperture of preferably ?1.2 N.A.
    Type: Grant
    Filed: April 4, 2007
    Date of Patent: May 19, 2009
    Assignee: Olympus Corporation
    Inventors: Rudolf Rigler, Manfred Eigen, Karsten Henco, Ulo Mets, Jerker Widengren, Michael Stuke, Michael Brinkmeyer, Wolfgang Simm, Olaf Lehman
  • Patent number: 7533000
    Abstract: A method of analyzing a dataset of spectra is provided in which each spectrum has a count value for each of a number of parameter values within a parameter range. The method is for identifying one or more parameter values that exhibit a significant variation within the dataset. A dataset of spectra is obtained and a statistical analysis is applied to the count values for each of the parameter values. The result of the analysis for each parameter value is a function of the variation in the count values. A spectrum that is representative of at least part of the dataset of spectra is then displayed together with the results of the statistical analysis. A corresponding computer program and system for performing the method are also disclosed.
    Type: Grant
    Filed: July 28, 2006
    Date of Patent: May 12, 2009
    Assignee: Oxford Instruments Analytical Limited
    Inventors: Peter John Statham, Charles Penman
  • Publication number: 20090073433
    Abstract: A method of arranging and utilizing a multivariate optical computing and analysis system includes transmitting a o first light from a light source; generating a second light by reflecting the first light from the sample; directing a portion of the second light with a beamsplitter; and arranging an optical filter mechanism in a normal incidence orientation to receive the portion of the second light, the optical filter mechanism being configured to optically filter data carried by the portion of the second light.
    Type: Application
    Filed: November 27, 2006
    Publication date: March 19, 2009
    Applicant: Univeristy of South Carolina
    Inventors: Michael L. Myrick, Robert P. Freese, John C. Blackburn, Ryan J. Priore
  • Publication number: 20080297791
    Abstract: In a reflection characteristic measuring apparatus 10 and a method for calibrating the reflection characteristic measuring apparatus, multiple standard spectral characteristics, or multiple calibration data based on the multiple standard spectral characteristics are obtained in advance with corresponding reference values relating to an emission characteristic of a light source 21. An optimum standard spectral characteristic or an optimum calibration data is selected from the multiple standard spectral characteristics or the multiple calibration data obtained. A spectral reflection characteristic of a sample is calculated using the selected standard spectral characteristic or the selected calibration data.
    Type: Application
    Filed: May 29, 2008
    Publication date: December 4, 2008
    Inventor: Kenji Imura
  • Patent number: 7398119
    Abstract: A non-invasive method for analyzing the blood-brain barrier includes obtaining a Raman spectrum of a selected portion of the eye and monitoring the Raman spectrum to ascertain a change to the dynamics of the blood brain barrier. Also, non-invasive methods for determining the brain or blood level of an analyte of interest, such as glucose, drugs, alcohol, poisons, and the like, comprises: generating an excitation laser beam at a selected wavelength (e.g., at a wavelength of about 400 to 900 nanometers); focusing the excitation laser beam into the anterior chamber of an eye of the subject so that aqueous humor, vitreous humor, or one or more conjunctiva vessels in the eye is illuminated; detecting (preferably confocally detecting) a Raman spectrum from the illuminated portion of the eye; and then determining the blood level or brain level (intracranial or cerebral spinal fluid level) of an analyte of interest for the subject from the Raman spectrum.
    Type: Grant
    Filed: March 25, 2003
    Date of Patent: July 8, 2008
    Assignees: Childrens Hospital Los Angeles, California Institute of Technology
    Inventors: James L. Lambert, Mark S. Borchert
  • Publication number: 20080094623
    Abstract: The present invention provides an autonomous calibration of a multivariate based spectroscopic system that is preferably implemented as a multivariate based spectrometer. The spectroscopic system is based on a multivariate optical element that provides a spectral weighting of an incident optical signal. Spectral weighting is performed on the basis of spatial separation of spectral components and subsequent spatial filtering by means of a spatial light modulator. Calibration of the spectroscopic system is based on a dedicated calibration segment of the spatial light modulator, whose position corresponds to a characteristic calibration or reference wavelength of the incident optical signal. Preferably, the calibration or reference wavelength is given by the wavelength of the excitation radiation generated by the optical source that serves to induce scattering processes in a volume of interest.
    Type: Application
    Filed: August 26, 2005
    Publication date: April 24, 2008
    Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V.
    Inventors: Frank Jeroen Pieter Schuurmans, Michael Cornelis Van Beek, Marjolein Van Der Voort
  • Patent number: 7336352
    Abstract: An apparatus for detecting a position of a target mark out of a plurality of marks in a region of an object to obtain a position of the region of the object. The apparatus includes a scope configured to sense a first image of the object at a first magnification and a second image of the object at a second magnification higher than the first magnification, and a processor configured to extract, from the first image, a position of a first mark out of the plurality of marks and a feature of a region outside the first mark, to identify the first mark based on the extracted feature, to extract, from the second image, a position of the target mark, to evaluate reliability of the extracted position of the target mark, to select a second mark, different from the target mark, from the plurality of marks as a new target mark based on the evaluated reliability and the identified first mark in order to extract a position of the selected second mark from an image sensed by the scope at the second magnification.
    Type: Grant
    Filed: March 24, 2004
    Date of Patent: February 26, 2008
    Assignee: Canon Kabushiki Kaisha
    Inventor: Hiroshi Tanaka
  • Patent number: 7280204
    Abstract: A multi-spectral detection and analysis system detects and classifies a targeted sample. The system may include a light source that causes the targeted sample to luminesce. A light dispersion element disperses the luminescence to a photodetector in a photodetector array. Each photodetector in the array transmits a signal indicating a portion of the spectrum to a multi-channel collection system. The multi-channel collection system processes the signal into a digital signal and forms the digital signal into a spectral signature. A processor analyzes the spectral signature and compares the spectral signature to known spectral signatures to identify the targeted sample.
    Type: Grant
    Filed: April 8, 2005
    Date of Patent: October 9, 2007
    Assignee: Purdue Research Foundation
    Inventors: Joseph Paul Robinson, Bartlomiej Rajwa, Gérald Grégori, Valery Patsekin
  • Patent number: 7265824
    Abstract: The invention relates to a method and a device for obtaining a low-noise optical signal. According to the method, a luminous beam is injected through two apertures and after detection respectively a basic optical signal (21) and a corrective optical signal (22) are generated. Both optical signals obtained (21, 22) are subtracted, so that a resulting optical signal is generated, forming the low-noise optical signal. The apertures are preferably two slits of a spectroscope, the optical signals being expressible relative to the wavelength.
    Type: Grant
    Filed: January 13, 2004
    Date of Patent: September 4, 2007
    Assignee: Jobin Yvon S.A.S.
    Inventor: Alain Le Marchand
  • Patent number: 7248357
    Abstract: A method and system for measuring heat energy of a combustible fluid in which light having wavelengths in the near-infrared is directed into a test cell containing the combustible fluid and portions of the light not absorbed by the combustible fluid and passing out of the cell are spatially dispersed by wavelength, forming a light spectrum that is projected onto a detector. The light spectrum is digitized and inputted into a data processing unit in which it is compared to the actual spectrum of the light source stored in the system to determine the absorbance spectrum of the combustible fluid. The system is spectrally calibrated by identifying known spectral features of the combustible gas absorbance spectrum. To correct for deviations in the original light source spectrum, a light source calibration system is employed.
    Type: Grant
    Filed: October 29, 2004
    Date of Patent: July 24, 2007
    Assignee: Gas Technology Institute
    Inventors: James Servaites, Serguei Zelepouga
  • Patent number: 7241569
    Abstract: A Method for identifying one or a small number of molecules, especially in a dilution of ?1 ?M, using laser excited FCS with measuring times ?500 ms and short diffusion paths of the molecules to be analyzed, wherein the measurement is performed in small volume units of preferably ?10?14 l, by determining material-specific parameters which are determined by luminescence measurements of molecules to be examined. The device which can be preferably used for performing the method according to the invention is a per se known system of microscope optics for laser focusing for fluorescence excitation in a small measuring compartment of a very diluted solution and for imaging the emitted light in the subsequent measurement through confocal imaging wherein at least one system of optics with high numerical aperture of preferably ?1.2 N.A.
    Type: Grant
    Filed: May 12, 2003
    Date of Patent: July 10, 2007
    Assignee: Olympus Corporation
    Inventors: Rudolf Rigler, Manfred Eigen, Karsten Henco, Ulo Mets, Jerker Widengren, Michael Stuke, Michael Brinkmeyer, Wolfgang Simm, Olaf Lehman
  • Patent number: 6751012
    Abstract: An apparatus for measuring the noise figure in optical amplifiers employed for large bandwidth applications such as dense wavelength division multiplexing systems. A booster amplifier coupled to a light source increases the average power associated with a plurality of optical channels. A periodic filter is coupled to the booster amplifier to reflect noise between each of the optical channels across the predetermined bandwidth. An amplifier under test is coupled to the periodic filter and the noise figure associated with the amplifier under test is measured.
    Type: Grant
    Filed: December 13, 2001
    Date of Patent: June 15, 2004
    Assignee: Tyco Telecommunications (US) Inc.
    Inventors: Morten Nissov, Yanjie Chai, Gregory M. Wolter, Michael A. Mills, George T. Harvey
  • Patent number: 6582903
    Abstract: A method for identifying one or a small number of molecules, especially in a dilution of ≦1 &mgr;M, using laser excited FCS with measuring times ≦500 ms and short diffusion paths of the molecules to be analyzed, wherein the measurement is performed in small volume units of preferably ≦10−14 l, by determining material-specific parameters which are determined by luminescence measurements of molecules to be examined.
    Type: Grant
    Filed: February 10, 1998
    Date of Patent: June 24, 2003
    Assignee: Evotec OAI AG
    Inventors: Rudolf Rigler, Manfred Eigen, Karsten Henco, Ulo Mets, Jerker Widengren, Michael Stuke, Michael Brinkmeyer, Wolfgang Simm, Olaf Lehmann
  • Patent number: 6133988
    Abstract: The device for the measurement of distances and of the angle of incidence of a light beam comprises an optical emitting system in order to project the light beam onto the object to be measured, and an optical receiving system in order to project the reflected light onto position detectors. The optical receiving system comprises two prisms which refract the reflected light beam with an angular compression and expansion, respectively, thus allowing to reduce the dimensions and the sensitivity of a detector for the measurement of a given measuring range.
    Type: Grant
    Filed: February 2, 1999
    Date of Patent: October 17, 2000
    Assignee: Optosys SA
    Inventors: Charles Rheme, Peter Heimlicher
  • Patent number: 5995681
    Abstract: A digital image processing system reduces errors in the parameters of a sensor geometry model, through which points in a captured digital image are geolocated to the surface of the earth by means of a `real time` co-registration mechanism that refines the geometry model associated with the working image in a matter of seconds. Using a co-registration mechanism such as that described in the U.S. Pat. No. 5,550,937, the system co-registers the reduced accuracy working digital image with a reference image, geographical spatial locations of respective pixels of which have been previously determined with a high degree of accuracy. The imagery co-registration operator adjusts the respective geometry models associated with its input images, in accordance with differences in cross-correlations of the respectively different spatial resolution versions of the two images, so as to bring the respective images into effective co-registration on image registration surface.
    Type: Grant
    Filed: June 3, 1997
    Date of Patent: November 30, 1999
    Assignee: Harris Corporation
    Inventors: Andrew J. Lee, David M. Bell, Jack M. Needham
  • Patent number: 5991031
    Abstract: An optical system for measuring an optical density of a sample in which homogeneity of light employed for measuring the density thereof is secured by including optical information upon a light source uniformly inside a measurement space about an optical axis therein even if the fluctuation occur in the light source in the system. A beam of light emitted from the light source and then focused on an interference filter is transformed into a parallel light through a collimator lens, and the parallel light is then split into two parallel pencils of light by an optical mask. The parallel light uniformly includes the optical information upon the light source. A reference cell is placed in a first split parallel pencil of light, and a sample cell is placed in a second split parallel pencil of light. The lights that have passed through the two cells are focused on an optical receiver by a focusing lens.
    Type: Grant
    Filed: October 28, 1998
    Date of Patent: November 23, 1999
    Assignee: Kurashiki Boseki Kabushiki Kaisha
    Inventor: Noboru Higashi
  • Patent number: 5963309
    Abstract: A distance measuring system of the active type wherein a distance ranging from a short distance to a great distance can be measured with a high degree of accuracy in accordance with a ratio between outputs of two light receiving elements. The system comprises light emitting means which emits light twice to an object, three or more light receiving elements, and selecting means which selects output signals of different pairs of the light receiving elements when the light emitting means emits light for the first and second times for measurement of distances within short and long distance ranges, respectively. The selected output signals in each pair are compared with each other to take a ratio between them, and distances are calculated based on the ratios thus obtained. Finally, a distance to the object is determined based on the calculated two distances.
    Type: Grant
    Filed: October 18, 1993
    Date of Patent: October 5, 1999
    Assignee: Minolta Co., Ltd.
    Inventors: Motohiro Nakanishi, Hiroshi Ootsuka
  • Patent number: 5920385
    Abstract: A method of collecting optical energy which allows the use of short focal length mirrors of relatively small physical size and in particular the use of the standard collecting mirrors usually employed in such spectrophotometers, for a wide range of sample sizes and collection configurations. A relatively large diameter internal surface, which in many cases can be incorporated into the design of other elements in the sampling system, is used. A physically large cell is interfaced to a radiation collector, such as a mirror. In this case the nut sealing the end window on the cell is internally coated (with gold in the preferred embodiment) to constitute a surface and this acts as a transfer mechanism for the backs-scattered radiation from sample. A solid collecting angle of 60 degrees (in this example) can be so obtained to transfer the energy to the standard radiation collector, such as a collecting mirror, of the spectrophotometer.
    Type: Grant
    Filed: July 10, 1997
    Date of Patent: July 6, 1999
    Inventor: Val J. Rossiter
  • Patent number: 5905567
    Abstract: An apparatus for optimizing sub-pixel resolution in a triangulation based target distance measuring device at a desired stand-off distance has a laser light source projecting a light beam along a light beam axis so as to project a light spot onto a surface of a workpiece, a lens having an optical axis and a depth of focus dependant on the target distance, the lens for gathering light reflected from the light spot on the surface of the workpiece, a linear photodetector array of adjacent light detecting pixels, the array having a longitudinal array axis, the array for detecting light impinging the pixels and generating an output signal indicative of the position of the pixels being impinged by the light, the light beam axis, the optical axis, and the longitudinal array axis co-planar, the lens imaging the reflected light across and impinging the array so as to form an image across the array, the output signal indicative of an intensity profile of the image impinging the array, the image defocused to a near-Sche
    Type: Grant
    Filed: May 5, 1997
    Date of Patent: May 18, 1999
    Assignee: CAE Newnes Ltd.
    Inventor: Brian Dewan
  • Patent number: 5894343
    Abstract: A passive rangefinder for determining the range to an object such as an aircraft, rocket or missile which emits electromagnetic radiation makes use of spectral measurements over a broad band of frequencies. The rangefinder includes means 202 for forming a real image of a field of view, spectrophotometer means 201 including an entrance aperture 27 placed to receive at least a part of said real image, dispersion means (15, 28, 29) for separating radiation of different wavelengths and detector means 24 for measuring the spectrum of radiation received from distinct portions of the entrance aperture. The detector output is connected to data processing means 204 arranged to deconvolve the received spectral profile with a stored representation (205) of a range-dependent atmospheric transmission spectral profile to obtain a representation of the spectral emission profile of radiation from the object.
    Type: Grant
    Filed: May 3, 1988
    Date of Patent: April 13, 1999
    Assignee: The Secretary of State for Defence in Her Britannic Majesty's Government of the United Kingdom of Great Britain and Northern Ireland
    Inventor: Herbert Alan French
  • Patent number: 5891314
    Abstract: A method and apparatus for correcting non-uniformities in the lens assembly of an electrophoresis apparatus is provided. Assuming a detector with a uniform responsivity as well as a uniform illumination source, correcting for lens non-uniformities allows accurate quantitative measurements of an electrophoresis gel to be made, thus increasing the information which can be obtained from an electrophoretic analysis. Applying the system, the non-uniformities due to the lens assembly are first characterized for a range of aperture and magnification settings. A look-up table is then created which contains the non-uniformities and/or correction data files for the lens assembly according to the aperture and magnification settings. In order to correct a sample image, the aperture and magnification settings used to obtain the sample image are provided to the system processor. These settings may be automatically obtained by the processor or manually input by the user.
    Type: Grant
    Filed: March 10, 1997
    Date of Patent: April 6, 1999
    Assignee: Bio-Rad Laboratories, Inc.
    Inventors: David M. Heffelfinger, Craig Van Horn
  • Patent number: 5866915
    Abstract: A method and apparatus for optically determining the dimension of part surfaces. Particular embodiments describe optical triangulation based coordinate measurement machines capable of accurate measurement of complex surfaces, such as gear teeth and turbine blades. Other embodiments provide highly useful sensors for robot guidance and related purposes. Up to 5 axis sensing capability is provided on surfaces of widely varying form.
    Type: Grant
    Filed: June 5, 1995
    Date of Patent: February 2, 1999
    Assignee: Sensor Adaptive Machines, Inc.
    Inventors: Timothy R. Pryor, Bernard Hockley, Nick Liptay-Wagner, Omer L. Hageniers, W. J. Pastorius