Crystal Or Gem Examination Patents (Class 356/30)
  • Patent number: 6813007
    Abstract: An apparatus for generating data for use in determining a property of a gemstone, such as a cut diamond, the apparatus comprising: a support structure for supporting a gemstone placed at an observation position, the support structure being arranged such that, if the gemstone has an axis of symmetry, the gemstone is supportable such that the axis of symmetry is parallel to an axis X passing through the observation position; illumination means arranged to illuminate a gemstone so placed with a spatially varied light pattern; rotation means arranged to cause relative rotation between the light pattern and the support structure generally about the axis X; a camera arranged to capture, at each of a plurality of rotational positions, an image of light returned by the gemstone and to output said images as image data.
    Type: Grant
    Filed: March 25, 2002
    Date of Patent: November 2, 2004
    Assignee: Overseas Diamonds Technologies
    Inventors: Dave Lapa, Marc Frans Alida Van de Velde, Christiaan Louis Cecile Keersmaekers
  • Patent number: 6800487
    Abstract: Method for monitoring the crystallization of at least one organic material from a liquid. According to the method, a liquid having at least one organic material capable of existing in at least one non-centrosymmetric phase is prepared. The liquid is interrogated with a laser beam at a chosen wavelength. As at least a portion of the at least one organic material crystallizes from the liquid, the intensity of any light scattered by the crystallized material at a wavelength equal to one-half the chosen wavelength of the interrogating laser beam is monitored. If the intensity of this scattered light, increases, then the crystals that form include at least one non-cetrosymmetric phase.
    Type: Grant
    Filed: September 26, 2002
    Date of Patent: October 5, 2004
    Assignee: The Regents of the University of California
    Inventors: Blaine W. Asay, Bryan F. Henson, Robert K. Sander, Jeanne M. Robinson, Steven F. Son, Peter M. Dickson
  • Patent number: 6798504
    Abstract: Light beam is irradiated onto a surface of a substrate to be inspected and scattered lights from the surface of the substrate are received at different light reception angles, so that first and second light detection signals corresponding to the different light reception angles are generated. Reference function defining a correlation in level value between the first and second light detection signals is set, a comparison is made between respective level values of the first and second light detection signals using the reference function as a comparison reference, and it is determined, on the basis of a result of the comparison, which of a plurality of different types of defects, such as a foreign substance and crystal-originated pit, a possible defect present on the surface of the substrate, which is represented by the light detection signals, corresponds to.
    Type: Grant
    Filed: September 24, 2001
    Date of Patent: September 28, 2004
    Assignee: Hitachi High-Tech Electronics Engineering Co., Ltd.
    Inventors: Tatsuya Sato, Yuichiro Kato, Kenji Mitomo
  • Patent number: 6798498
    Abstract: A polysilicon film evaluation apparatus is provided which enables objective automatic evaluation of the status of a polysilicon film, as formed to a high accuracy in a contact-free fashion.
    Type: Grant
    Filed: January 18, 2002
    Date of Patent: September 28, 2004
    Assignees: Sony Corporation, Sony Precision Technology Inc.
    Inventors: Hiroyuki Wada, Koichi Tatsuki, Nobuhiko Umezu, Eiji Isomura, Tetsuo Abe, Tadashi Hattori, Akifumi Ooshima, Makoto Uragaki, Yoshiyuki Noguchi, Hiroyuki Tamaki, Masataka Ebe, Tomohiro Ishiguro, Yasuyuki Kato
  • Patent number: 6795171
    Abstract: The invention is a multicolored reflecting surface that can be mounted beneath a lens for facilitating the grading of a gemstone's brightness and symmetry. The multicolored reflective surface may be a disc that has an opening or aperture surrounded by multicolored concentric rings through which the gemstone is viewed on the object side of the lens. Alternatively, the multicolored reflective surface may be a cylinder formed of multicolored bands through which the gemstone is viewed. Light reflecting from the multicolored rings or bands creates specific colors on the gemstone that allow symmetry and brightness of the stone to be evaluated.
    Type: Grant
    Filed: August 31, 2000
    Date of Patent: September 21, 2004
    Assignee: EightStar Diamond Company, Inc.
    Inventor: Al Gilbertson
  • Patent number: 6791675
    Abstract: An optical waveguide path coupling structure is realized without requiring highly accurate alignment.
    Type: Grant
    Filed: November 29, 2001
    Date of Patent: September 14, 2004
    Assignee: NEC Toppan Circuit Solutions, Inc.
    Inventors: Hideo Kikuchi, Kiminori Ishido
  • Publication number: 20040051861
    Abstract: A gemstone rating system is provided particularly for rating the cut of diamonds in which particular cuts and features are measured and the results compared with and provided with a predetermined score depending upon deviations from a theoretical perfect cut; and wherein the deviation scores are summed and then subtracted from an initially perfect score to provide a universally comparable indication of quality of cut.
    Type: Application
    Filed: June 9, 2003
    Publication date: March 18, 2004
    Inventor: William R. Bray
  • Patent number: 6683680
    Abstract: A method and system are provided for representing a structure of a kind characterized by a specific radiation response to a predetermined incident radiation. The incident radiation is applied to the structure to produce the radiation response thereof, which is detected and data indicative thereof is generated. This data is processed and analyzed to produce a predetermined output representative of a structure-related data. The output includes a non-visual portion derived from the specific radiation response of the structure and is sensory perceptible by a human being.
    Type: Grant
    Filed: December 20, 2000
    Date of Patent: January 27, 2004
    Assignee: Crystal Beam Melody, Inc.
    Inventors: Nicolae Dinu, Gideon Tolkowsky, Gabi Tolkowsky, Uri Tolkowsky
  • Patent number: 6673639
    Abstract: A method of evaluating a state of a polysilicon film objectively, accurately, automatically, and in a non-contact manner is provided. The method includes the steps of picking up a surface of a polysilicon film formed by excimer laser annealing, dividing the picked-up image into meshes each having a specific size, calculating a contrast in each of the meshes, extracting a highest contrast value and a lowest contrast value in the picked-up image, calculating a contrast ratio therebetween, and judging an average grain size of the polysilicon film on the basis of the contrast ratio.
    Type: Grant
    Filed: February 12, 2002
    Date of Patent: January 6, 2004
    Assignee: Sony Corporation
    Inventors: Hiroyuki Wada, Nobuhiko Umezu, Koichi Tatsuki
  • Patent number: 6665058
    Abstract: The invention is a multicolored reflecting disc that can be mounted to a lens for grading gemstone brightness and symmetry. The disc has an opening or aperture through which the gemstone is viewed on the object side of the lens. The aperture is surrounded by multicolored concentric rings which face the gemstone. Light reflecting from the multicolored rings creates specific colors on the gemstone that allow symmetry and brightness of the tone to be evaluated.
    Type: Grant
    Filed: May 24, 2000
    Date of Patent: December 16, 2003
    Assignee: EightStar Diamond Company, Inc.
    Inventor: Al Gilbertson
  • Publication number: 20030223054
    Abstract: An apparatus for obtaining information about inclusion geo-spatial orientation within a gemstone comprises a means to measure the distance to and location of one or more selected inclusions within said gemstone relative to one or more points of assessment situated on or within said gemstone; and a monitoring system for collecting, compiling and analyzing data on the same.
    Type: Application
    Filed: May 29, 2002
    Publication date: December 4, 2003
    Applicant: NATURAL CRYSTAL INFORMATION SYSTEMS
    Inventor: Malcolm Raymond Warwick
  • Patent number: 6650489
    Abstract: A gem identifying device using filtered transmitted light for use in distinguishing type-I colorless diamonds from type II colorless diamonds, and natural diamonds and gems from synthetic or treated diamonds and gems.
    Type: Grant
    Filed: July 17, 2002
    Date of Patent: November 18, 2003
    Assignee: Gemological Institute of America, Inc.
    Inventors: Gilbert N. Ravich, Shane Elen, James Shigley
  • Patent number: 6603547
    Abstract: The method for determining radiation stability of a crystal to radiation of a working wavelength to be employed in a subsequent application includes taking a first absorption spectrum (A) of a cleaved piece of the crystal with a given thickness (D) over a predetermined wavelength range from a first wavelength (&lgr;1) to a second wavelength (&lgr;2) by means of a spectrophotometer. Then the cleaved piece of the crystal is irradiated with an energetic radiation source so as to form all theoretically possible color centers (saturation). After the irradiating a second absorption spectrum (B) of the cleaved piece of crystal is taken over the same predetermined wavelength range. Then a surface integral of a difference spectrum of the first absorption spectrum and the second absorption spectrum over the predetermined wavelength range is formed and divided by the thickness (D) to obtain a scaled surface integral value.
    Type: Grant
    Filed: October 11, 2001
    Date of Patent: August 5, 2003
    Assignee: Schott Glas
    Inventors: Ewald Moersen, Burkhard Speit, Lorenz Strenge, Joerg Kandler
  • Patent number: 6589848
    Abstract: A photodetector device and a process for manufacturing the same are described. The photodetector device comprises a doped semiconductor substrate; an intrinsic semiconductor material layer formed over the substrate, for absorbing incident light; an upper semiconductor material layer doped with the opposite type to the substrate, formed on a portion of the intrinsic semiconductor material layer to allow at least a portion of the incident light to directly enter the intrinsic semiconductor material layer; an upper electrode formed in a predetermined pattern on the upper semiconductor material layer, the upper electrode electrically connected to the upper semiconductor material layer; and a lower electrode electrically connected to the substrate, wherein a portion of the intrinsic semiconductor material layer constitutes at least a part of a photo-receiving surface.
    Type: Grant
    Filed: July 12, 2000
    Date of Patent: July 8, 2003
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Woong-lin Hwang, Jun-young Kim
  • Publication number: 20030112422
    Abstract: An apparatus for generating data for use in determining a property of a gemstone, such as a cut diamond, the apparatus comprising:
    Type: Application
    Filed: March 25, 2002
    Publication date: June 19, 2003
    Inventors: Dave Lapa, Marc Frans Alida Van de Velde, Christiaan Louis Cecile Keersmaekers
  • Publication number: 20030107722
    Abstract: Process for the measurement of the surface of a polished precious stone, wherein firstly the position of at least some of the flat facet surfaces of the stone is measured in space, in particular by rotating the stone in front of a light source and examination of the shadow cast by the stone, and the facet surface is then observed under direct light.
    Type: Application
    Filed: November 22, 2002
    Publication date: June 12, 2003
    Inventor: Peter Klingler
  • Patent number: 6567156
    Abstract: A method for examining a gemstone includes the steps of coating the gemstone with a removable diffusing coating and determining the silhouette of the gemstone in three dimensions. The method further includes performing structured light triangulation by using laser light to obtain an image of the surface of the gemstone, the gemstone being transparent and/or reflective to the laser light in the absence of the coating. The method further includes the step of using the silhouette in conjunction with the image to determine the location of any recesses on the surface.
    Type: Grant
    Filed: August 31, 2000
    Date of Patent: May 20, 2003
    Assignee: Sarin Technologies Ltd.
    Inventor: Abraham Kerner
  • Publication number: 20030030786
    Abstract: Techniques for monitoring the quality (e.g., optical and mechanical properties) in optical waveguides (e.g., photonic crystal fibers) are disclosed. Additionally, techniques for detecting and localizing defects in the waveguides are also described. Pulses of light are launched into one end of an optical waveguide. The amount of light scattered out of the same end of the waveguide (i.e., a backscattered or reflected signal) is monitored at certain wavelengths specific to the spectral characteristics of the waveguide. Transmission characteristics and defect localization can be determined from the backscattered signal.
    Type: Application
    Filed: February 7, 2002
    Publication date: February 13, 2003
    Inventors: Max Shurgalin, Yoel Fink, Steven G. Johnson, Mihai Ibanescu
  • Patent number: 6515738
    Abstract: The method of determining the authenticity and the geographical origin of gemstones of crystalline structure comprises the steps consisting in: applying an electromagnetic beam to the gemstone; determining values associated with the absorbance of the gemstone for wavelengths of the beam in an absorption direction that is predetermined relative to a characteristic axis of the crystal; calculating at least one ratio between these values; and comparing the or each ratio with predetermined corresponding ratios belonging to gemstones of predetermined authenticity and origin.
    Type: Grant
    Filed: July 17, 2000
    Date of Patent: February 4, 2003
    Assignee: Mauboussin Successeur de Noury
    Inventors: Odile Barres, Bruno Sabot, Alain Cheilletz, Philippe de Donato
  • Patent number: 6496255
    Abstract: A sample is rotated about an axis perpendicular to a surface of the sample in predetermined angular steps. The surface of the sample is irradiated with linearly polarized light, and a reflected intensity of light reflected from the surface of the sample is detected in each angular step. Based on a rotational angle dependency of the reflected intensity, the crystal face orientation of the sample is determined. To improve signal-to-noise ratio, the crystal lattice of the sample is excited. Further, the surface of the sample is irradiated with a plurality of linearly polarized light beams to obtain a plurality of reflected intensities.
    Type: Grant
    Filed: August 6, 2001
    Date of Patent: December 17, 2002
    Assignee: NEC Corporation
    Inventors: Kazumi Sugai, Belgacem Haba, Yukio Morishige
  • Publication number: 20020180952
    Abstract: A gem identifying device using filtered transmitted light for use in distinguishing type-I colorless diamonds from type II colorless diamonds, and natural diamonds and gems from synthetic or treated diamonds and gems.
    Type: Application
    Filed: July 17, 2002
    Publication date: December 5, 2002
    Inventors: Gilbert N. Ravich, Shane Elen, James E. Shigley
  • Patent number: 6473164
    Abstract: The present invention comprises systems, apparatuses and methods for measuring and analyzing gem color in a way which reliably and consistently simulates visual color analysis methodology. The preferred system embodiment of the present invention comprises several aspects, including the use of daylight approximating lamps, such as daylight-approximating fluorescent tubes or halogen lamp boosted with a filter to approximate daylight, and a light detector which directs light of a specific angle such that the system approximates visual analysis methodology. In the case of diamond analysis, in one embodiment, the system of the invention includes three major elements: a daylight-approximating light source that illuminates the pavilion side of the diamond, a light detector which detects light coming out at a specific angle from the pavilion side of the diamond, and an optical measurement device which measures the light detected by the light detector.
    Type: Grant
    Filed: February 16, 2000
    Date of Patent: October 29, 2002
    Assignee: Gemological Institute of America, Inc.
    Inventors: Peter De Jong, Ronald Geurts
  • Patent number: 6465255
    Abstract: The present invention includes a method for identifying and probing phase transitions in materials. A polymorphic material capable of existing in at least one non-centrosymmetric phase is interrogated with a beam of laser light at a chosen wavelength and frequency. A phase transition is induced in the material while it is interrogated. The intensity of light scattered by the material and having a wavelength equal to one half the wavelength of the interrogating laser light is detected. If the phase transition results in the production of a non-centrosymmetric phase, the intensity of this scattered light increases; if the phase transition results in the disappearance of a non-centrosymmetric phase, the intensity of this scattered light decreases.
    Type: Grant
    Filed: January 28, 2000
    Date of Patent: October 15, 2002
    Assignee: The Regents of the University of California
    Inventors: Blaine W. Asay, Bryan F. Henson, Robert K. Sander, Jeanne M. Robinson, Steven F. Son, Peter M. Dickson
  • Patent number: 6426791
    Abstract: Reflectance of a p-Si film crystallized by laser annealing is measured, a wave length dependency of the reflectance is found, and a first order rate of change is calculated to determine a minimum value near a wave length of 500 nm. The value is to be an inherent optical value under the laser power and relates to a grain size measured by Secco etching or the like. A number of correspondence between the optical value and the grain size are recorded and linearly plotted. By calculating the optical value from the reflectance in the p-Si film at in-line, the grain size is correspondingly determined. Thus, the semiconductor film can be in-line monitored, thereby improving a yield and saving a cost in producing a semiconductor device.
    Type: Grant
    Filed: February 22, 2001
    Date of Patent: July 30, 2002
    Assignee: Sanyo Electric Co., Ltd.
    Inventors: Kazuhiro Imao, Takashi Kuwahara, Yoshihiro Morimoto, Kiyoshi Yoneda
  • Patent number: 6411391
    Abstract: A method of measuring a crystal section shape of a crystal being pulled from a crystal melt while rotating, including taking an image of the base of the crystal in horizontal and vertical directions with a two-dimensional camera set at an upper oblique position over the crystal; setting at least two horizontal light measuring lines in the image taken by the two-dimensional camera, being arranged in parallel in the vertical direction; detecting pairs of intersection points, at which a fusion ring intersects the two horizontal light measuring lines; transforming a position of each of the intersection points into a position of a point located on a line passing through a crystal center; determining diameters of the crystal based on the transformed positions and on time lags between two intersection points of each of the pairs of intersection points.
    Type: Grant
    Filed: October 28, 1999
    Date of Patent: June 25, 2002
    Assignee: Sumitomo Metal Industries. Ltd.
    Inventors: Keiichi Takanashi, Kazuo Hiramoto, Tokuji Maeda
  • Patent number: 6377340
    Abstract: A method for detecting whether a natural diamond has been processed at high pressure and high temperature (HPHT) conditions comprises steps of disposing the diamond in a cyrostat that is provided at temperatures equal to or less than liquid nitrogen; illuminating the diamond with a laser beam; recording an optical spectrum of the diamond with a photoluminescence spectrometer; and examining the optical spectrum of the diamond to detect an absence of selected photoluminescent spectral lines.
    Type: Grant
    Filed: October 29, 1999
    Date of Patent: April 23, 2002
    Assignee: General Electric Company
    Inventors: Thomas Richard Anthony, John Kieran Casey, Alan Cameron Smith, Suresh Shankarappa Vagarali
  • Patent number: 6348964
    Abstract: A viewer for gemstones allowing a person to view the light performance of a gemstone having a 360-degree light unit positioned above a base where the stone is placed. The light unit is attached to an adjustable mounting bracket which allows the bracket and light unit to move vertically through use of a control mechanism. The base allows for secure and consistent placement of the gemstone, and positioning of a light control structure, preferably made from a reflective material, over the stone. The position of the stone is under the center of the light unit and light control structure. The light control structure has an aperture to allow the light from the light unit to enter.
    Type: Grant
    Filed: August 25, 1999
    Date of Patent: February 19, 2002
    Inventors: Randall M. Wagner, Kurt Schoeckert
  • Publication number: 20010023925
    Abstract: In order to test whether a diamond has had a layer a synthetic diamond deposited thereon, the diamond is radiated with ultraviolet radiation so as to form a pattern of beams of refracted and reflected radiation, the pattern of refracted and reflected radiation being observed on a screen behind the diamond.
    Type: Application
    Filed: January 19, 2001
    Publication date: September 27, 2001
    Inventor: Martin Phillip Smith
  • Patent number: 6275293
    Abstract: A novel automated method for measuring oxygen stacking fault density on silicon wafers using methods for measuring surface roughness of a silicon wafer. A silicon wafer manufactured according to processes that include the novel automated method for measuring oxygen stacking fault density on silicon wafers using methods for measuring surface roughness of a silicon wafer.
    Type: Grant
    Filed: May 10, 2000
    Date of Patent: August 14, 2001
    Assignee: SEH America, Inc.
    Inventor: Timothy L. Brown
  • Publication number: 20010006415
    Abstract: A method and system are provided for representing a structure of a kind characterized by a specific radiation response to a predetermined incident radiation. The incident radiation is applied to the structure to produce the radiation response thereof, which is detected and data indicative thereof is generated. This data is processed and analyzed to produce a predetermined output representative of a structure-related data. The output includes a non-visual portion derived from the specific radiation response of the structure and is sensory perceptible by a human being.
    Type: Application
    Filed: December 20, 2000
    Publication date: July 5, 2001
    Inventors: Nicolae Dinu, Gideon Tolkowsky, Gabi Tolkowsky, Uri Tolkowsky
  • Patent number: 6239867
    Abstract: A method and associated apparatus for the standardized grading of gemstones is provided. The system gauges the spectral response of a gemstone subject to a plurality of incident light sources within an imaging apparatus. The operation of the imaging apparatus is controlled by an instruction set of a local station control data processor. Light energy data is captured in the form of pixel data sets via a charge coupled device of the imaging apparatus of the local station. The control data processor of the local station is operable linked to an analysis station, the station includes an analysis data processor and mass storage memory device. The memory device provides storage space for the instruction set of the analysis data processor as well as database records. The analysis station employs a data processor and model database for assessing the aesthetic and/or monetary value of gemstones by way of the communicated pixel data sets.
    Type: Grant
    Filed: December 7, 1999
    Date of Patent: May 29, 2001
    Assignee: Imagestatistics, Inc.
    Inventor: Lalit K. Aggarwal
  • Patent number: 6182729
    Abstract: An apparatus for manufacturing a plurality of wafers by slicing a cylindrical ingot with a wire saw. The apparatus includes a measuring device for measuring the crystal orientation of the ingot; an adhering device for adhering a support to the surface of the ingot based on the orientation where the support includes an intermediate plate and a support plate, where the support plate is adapted to fit the wire saw, and where the adhering device includes an auxiliary adhering element for adhering the intermediate plate to the surface of the ingot and an adhering element for adhering the support plate to the intermediate plate; a dryer for drying and solidifying an adhesive applied between the ingot and the intermediate plate and an adhesive applied between the intermediate plate and the support plate; and the wire saw for slicing the ingot into the plurality of wafers while the ingot is supported on the support.
    Type: Grant
    Filed: January 29, 1998
    Date of Patent: February 6, 2001
    Assignee: Nippei Toyama Corporation
    Inventors: Yoshiaki Banzawa, Nobuaki Hayashi, Kiyoakira Shimizu
  • Patent number: 6144443
    Abstract: An apparatus for measuring crystal strain in a microscopic region within a semiconductor crystal.
    Type: Grant
    Filed: August 24, 1999
    Date of Patent: November 7, 2000
    Assignee: NEC Corporation
    Inventor: Takashi Ide
  • Patent number: 6143572
    Abstract: A pen-like device having a scriber for scratching a deep groove in a yellow colored, metal article object, such as jewelry, being tested for the gold content thereof, and an applicator provided on an opposite end of the pen-like device for conveying an acid solution, which is housed within the pen-like device, onto, around and in the groove to observe whether there is a color change to the testing area, on which the acid solution was applied, making the the testing area darker or black, where such a color change would indicate that the metal article or object is imitation gold, or has a gold content which is less than minimum karat requirement of the test.
    Type: Grant
    Filed: September 14, 1998
    Date of Patent: November 7, 2000
    Inventors: Rami Grand, Ella Grand
  • Patent number: 6111262
    Abstract: A method and system for accurately measuring a diameter of a crystal including independently detecting a first intersection point and a second intersection point on a periphery of the crystal. The first intersection point and the second intersection point correspond to a respective intersection between a fusion ring formed on the periphery of the crystal and a light measuring line. The light measuring line may be produced by a camera, for example. In addition, the frequency components caused by shaking the crystal, are removed from the detected first intersection point and the detected second intersection point. In addition, a timing difference between when the first detected intersection point and the second detected intersection point intersect the light measuring line is determined. Finally, an interval between the detected first intersection point and the detected second intersection point using the determined timing difference is obtained.
    Type: Grant
    Filed: October 30, 1998
    Date of Patent: August 29, 2000
    Assignee: Sumitomo Metal Industries, Ltd.
    Inventor: Keiichi Takanashi
  • Patent number: 6103194
    Abstract: Apparatus (1) for testing items of metal such as jewelry comprises a housing (3) which is closed at one end (3a) and partly open at the other end (3b). Sealed within the housing is an insert comprising a reservoir (5) containing a testing chemical and an applicator (7). The applicator extends into the reservoir (5) and projects from the housing through its partly open end (3b). The outer surface of the applicator (7) projecting from the housing forms a tip which is used to apply the testing chemical to the surface of the metal under test.
    Type: Grant
    Filed: March 10, 1998
    Date of Patent: August 15, 2000
    Inventor: Richard Jackson
  • Patent number: 6056031
    Abstract: An apparatus for connecting a cylindrical ingot to a support plate includes means for measuring a crystal orientation of the ingot based on a diffraction of x-rays, means for rotating the ingot about a center axis based on the crystal orientation so that a center axis of the ingot is held parallel to a first plane and an orientation axis based on the crystal orientation is placed in a plane parallel to the first plane, means for adhering an intermediate plate to the ingot, means for adjusting a position of one of the support plate and the ingot in a plane parallel to the first plane based on the crystal orientation so that a mounting axis of the support plate is in a specific relationship with the orientation axis, and means for attaching the support plate to the intermediate plate.
    Type: Grant
    Filed: November 6, 1998
    Date of Patent: May 2, 2000
    Assignee: Nippei Toyama Corporation
    Inventors: Yoshiaki Banzawa, Nobuaki Hayashi, Kiyoakira Shimizu
  • Patent number: 6043742
    Abstract: An apparatus and process for detecting man-made gemstones using an alternating current conducted through a sample gemstone is provided. The apparatus includes a hand-held housing in which is disposed electronic circuitry, a probe which extends from the housing, and a transmitting stimulus electrode in the form of a body-contact touchpad. The electronic circuitry includes a filter for eliminating non-transmitted signals sensed by the probe, and produces an alternating current signal, preferably in sine wave form, for delivery to the touchpad. The alternating current signal is transmitted through the operator of the apparatus into the sample gemstone. The operator probes the gemstone by touching the conductive probe to the gemstone in an attempt to sense signals conducted through the gemstone. An alarm is activated upon the detection of the conducted transmitted signal, indicating that the gemstone is man-made.
    Type: Grant
    Filed: May 6, 1999
    Date of Patent: March 28, 2000
    Inventor: James Austin
  • Patent number: 6024814
    Abstract: A method for connecting a cylindrical ingot to a support plate includes measuring a crystal orientation of the ingot based on a diffraction of x-rays, rotating the ingot about a center axis based on the crystal orientation so that a center axis of the ingot is held parallel to a first plane and an orientation axis based on the crystal orientation is placed in a plane parallel to the first plane, adhering an intermediate plate to the ingot, adjusting a position of one of the support plate and the ingot in a plane parallel to the first plane based on the crystal orientation so that a mounting axis of the support plate is in a specific relationship with the orientation axis, and attaching the support plate to the intermediate plate.
    Type: Grant
    Filed: November 26, 1996
    Date of Patent: February 15, 2000
    Assignee: Nippei Toyama Corporation
    Inventors: Yoshiaki Banzawa, Nobuaki Hayashi, Kiyoakira Shimizu
  • Patent number: 6020954
    Abstract: A method and associated apparatus for the standardized grading of gemstones is provided. The system gauges the spectral response of a gemstone subject to a plurality of incident light sources within an imaging apparatus. The operation of the imaging apparatus is controlled by an instruction set of a local station control data processor. Light energy data is captured in the form of pixel data sets via a charge coupled device of the imaging apparatus of the local station. The control data processor of the local station is operably linked to an analysis station, the station includes an analysis data processor and mass storage memory device. The memory device provides storage space for the instruction set of the analysis data processor as well as database records. The analysis station employs a data processor and model database for assessing the aesthetic and/or monetary value of gemstones by way of the communicated pixel data sets.
    Type: Grant
    Filed: May 28, 1998
    Date of Patent: February 1, 2000
    Assignee: Imagestatistics, Inc.
    Inventor: Lalit K. Aggarwal
  • Patent number: 5966673
    Abstract: A system and method for computerized grading of the cut of a gemstone. The system includes a gemstone model and an illumination model. The gemstone model defines the cut of the gemstone in three dimensions with reference to the facets of the gemstone. The illumination model defines light projected onto the gemstone. The method includes the steps of determining a beam of light refracted into the gemstone from the illumination model for at least one of the facets, tracing reflections of the beam of light within the gemstone, and measuring at least one light beam refracted out of the gemstone model. The measurements of the refracted light are used to evaluate the gemstone.
    Type: Grant
    Filed: January 10, 1997
    Date of Patent: October 12, 1999
    Assignee: Diamond Technologies, Inc.
    Inventor: Paul T. Shannon, Sr.
  • Patent number: 5955735
    Abstract: A target gemstone is irradiated with ultraviolet energy while sensing the electrical potential across the gemstone. A silicon carbide gemstone will generate an electrical potential and, therefore, can be positively identified, as distinct from other gemstones such as diamond and cubic zirconia that do not produce a potential.
    Type: Grant
    Filed: September 29, 1997
    Date of Patent: September 21, 1999
    Assignee: C3, Inc.
    Inventor: Thomas G. Coleman
  • Patent number: 5883388
    Abstract: In order to test whether a diamond has had a layer of synthetic diamond material deposited thereon, infrared radiation including radiation of wavelength substantially 7 .mu.m to 25 .mu.m preferably 7 .mu.m to 10 .mu.m emitted or transmitted by the diamond is observed, to detect differences between the compositions of different zones of the diamond.
    Type: Grant
    Filed: June 19, 1997
    Date of Patent: March 16, 1999
    Assignee: Gersan Establishment
    Inventors: Martin Phillip Smith, James Gordon Charters Smith, Martin Cooper, Ricardo Simon Sussmann
  • Patent number: 5883389
    Abstract: In order to provide a method of distinguishing natural from synthetic diamond which does not involve costly equipment or long periods to make a measurement, a diamond is irradiated with ultraviolet radiation which is preponderantly of wavelength 225 nm or less, such that substantially only the surface region of the diamond is irradiated. By observing the pattern or luminescence and/or phosphorescence produced by the diamond, an observer can identify the diamond as a natural or synthetic diamond.
    Type: Grant
    Filed: May 29, 1996
    Date of Patent: March 16, 1999
    Inventors: Paul Martyn Spear, Christopher Mark Welbourn
  • Patent number: 5880504
    Abstract: In order to test whether a diamond has had a layer of synthetic diamond deposited thereon, the surface area of the natural part of the stone is measured by measuring the radiant-flux density of radiation substantially of wavelength 230 nm to 320 nm in an integrating sphere containing the diamond. This is compared to the total surface area of the diamond.
    Type: Grant
    Filed: June 6, 1997
    Date of Patent: March 9, 1999
    Assignee: Gersan Establishment
    Inventors: Martin Phillip Smith, James Gordon Charters Smith, Martin Cooper, Christopher Mark Welbourn, Philip Maurice Martineau
  • Patent number: 5835200
    Abstract: In order to examine a gemstone, the stone is irradiated and observed though a filter (5) at a first wavelength which is characteristic of a first class of gemstones. The filter can be rocked from a setting normal to the optical axis to transmit radiation of at least one reference wavelength. The intensities of radiation transmitted at first and reference wavelengths are observed and compared, to classify the gemstone as belonging to the first class or not. In order to detect whether the gemstone is a diamond or diamond simulant, the first wavelength comprises raman emission characteristic of diamond. In order to detect whether the gemstone is definitely natural or not definitely natural, the gemstone is classified as definitely natural if there is a maximum of absorption of radiation at 415.5 nm.
    Type: Grant
    Filed: February 3, 1997
    Date of Patent: November 10, 1998
    Assignee: Gersan Establishment
    Inventors: Martin Phillip Smith, Robin Wynclyffe Smith, Christopher Mark Welbourn
  • Patent number: 5835205
    Abstract: Diamond gemstones and gemstones formed of crystals of silicon carbide are distinguished from each other by introducing a band of ultraviolet light into a target gemstone and measuring the transmissivity of that band of light by the gemstone. A diamond will transmit light within a certain band of the ultraviolet spectrum, while a silicon carbide gemstone will block light within this band. Several instruments for carrying out this procedure are described, including an instrument that utilizes a fiberoptic strand to convey ultraviolet light that has passed through the gemstone to a solid state photodetector.
    Type: Grant
    Filed: February 10, 1997
    Date of Patent: November 10, 1998
    Assignee: C3, Inc.
    Inventors: Charles Eric Hunter, Douglas G. Waltz
  • Patent number: 5828405
    Abstract: The gemstone recordal and retrieval system records optical images for gemstones in an effective manner. The optical image of a gemstone is captured using a two-dimensional charge coupled device whereby the time to capture the image is relatively short. The optical images can be improved in definition by varying the output of a laser LED. This fast feedback and adjustability provides accurate recordings.
    Type: Grant
    Filed: November 8, 1996
    Date of Patent: October 27, 1998
    Assignee: Omphalos Recovery Systems Inc.
    Inventors: Dana J. Vanier, Hermann F. Wallner, Michael Leydon
  • Patent number: 5811817
    Abstract: The detection of fractures in diamonds which are filled with high index of refraction glass is easily and quickly carried out by observation under ultra violet light. Such light having a wavelength between 300 and 400 nm, as reflected from, or transmitted through, such diamonds is imaged using a CCD camera, or directly by the use of fluorescent conversion to the visible spectrum. In either approach, the fracture fills are clearly and immediately distinguishable.
    Type: Grant
    Filed: August 28, 1997
    Date of Patent: September 22, 1998
    Inventor: Gilbert Norman Ravich
  • Patent number: 5811824
    Abstract: In order to test whether a diamond 2 comprises synthetic diamond material, a plurality of different zones of the diamond 2 are irradiated with radiation substantially of wavelength substantially 230 nm to 320 nm, an image or reading of the radiation transmitted by each zone of the diamond 2 being produced.
    Type: Grant
    Filed: September 23, 1996
    Date of Patent: September 22, 1998
    Assignee: Gersan Establishment
    Inventors: Martin Phillip Smith, James Gordon Charters Smith, Martin Cooper