Crystal Or Gem Examination Patents (Class 356/30)
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Patent number: 6813007Abstract: An apparatus for generating data for use in determining a property of a gemstone, such as a cut diamond, the apparatus comprising: a support structure for supporting a gemstone placed at an observation position, the support structure being arranged such that, if the gemstone has an axis of symmetry, the gemstone is supportable such that the axis of symmetry is parallel to an axis X passing through the observation position; illumination means arranged to illuminate a gemstone so placed with a spatially varied light pattern; rotation means arranged to cause relative rotation between the light pattern and the support structure generally about the axis X; a camera arranged to capture, at each of a plurality of rotational positions, an image of light returned by the gemstone and to output said images as image data.Type: GrantFiled: March 25, 2002Date of Patent: November 2, 2004Assignee: Overseas Diamonds TechnologiesInventors: Dave Lapa, Marc Frans Alida Van de Velde, Christiaan Louis Cecile Keersmaekers
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Patent number: 6800487Abstract: Method for monitoring the crystallization of at least one organic material from a liquid. According to the method, a liquid having at least one organic material capable of existing in at least one non-centrosymmetric phase is prepared. The liquid is interrogated with a laser beam at a chosen wavelength. As at least a portion of the at least one organic material crystallizes from the liquid, the intensity of any light scattered by the crystallized material at a wavelength equal to one-half the chosen wavelength of the interrogating laser beam is monitored. If the intensity of this scattered light, increases, then the crystals that form include at least one non-cetrosymmetric phase.Type: GrantFiled: September 26, 2002Date of Patent: October 5, 2004Assignee: The Regents of the University of CaliforniaInventors: Blaine W. Asay, Bryan F. Henson, Robert K. Sander, Jeanne M. Robinson, Steven F. Son, Peter M. Dickson
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Patent number: 6798504Abstract: Light beam is irradiated onto a surface of a substrate to be inspected and scattered lights from the surface of the substrate are received at different light reception angles, so that first and second light detection signals corresponding to the different light reception angles are generated. Reference function defining a correlation in level value between the first and second light detection signals is set, a comparison is made between respective level values of the first and second light detection signals using the reference function as a comparison reference, and it is determined, on the basis of a result of the comparison, which of a plurality of different types of defects, such as a foreign substance and crystal-originated pit, a possible defect present on the surface of the substrate, which is represented by the light detection signals, corresponds to.Type: GrantFiled: September 24, 2001Date of Patent: September 28, 2004Assignee: Hitachi High-Tech Electronics Engineering Co., Ltd.Inventors: Tatsuya Sato, Yuichiro Kato, Kenji Mitomo
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Patent number: 6798498Abstract: A polysilicon film evaluation apparatus is provided which enables objective automatic evaluation of the status of a polysilicon film, as formed to a high accuracy in a contact-free fashion.Type: GrantFiled: January 18, 2002Date of Patent: September 28, 2004Assignees: Sony Corporation, Sony Precision Technology Inc.Inventors: Hiroyuki Wada, Koichi Tatsuki, Nobuhiko Umezu, Eiji Isomura, Tetsuo Abe, Tadashi Hattori, Akifumi Ooshima, Makoto Uragaki, Yoshiyuki Noguchi, Hiroyuki Tamaki, Masataka Ebe, Tomohiro Ishiguro, Yasuyuki Kato
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Patent number: 6795171Abstract: The invention is a multicolored reflecting surface that can be mounted beneath a lens for facilitating the grading of a gemstone's brightness and symmetry. The multicolored reflective surface may be a disc that has an opening or aperture surrounded by multicolored concentric rings through which the gemstone is viewed on the object side of the lens. Alternatively, the multicolored reflective surface may be a cylinder formed of multicolored bands through which the gemstone is viewed. Light reflecting from the multicolored rings or bands creates specific colors on the gemstone that allow symmetry and brightness of the stone to be evaluated.Type: GrantFiled: August 31, 2000Date of Patent: September 21, 2004Assignee: EightStar Diamond Company, Inc.Inventor: Al Gilbertson
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Patent number: 6791675Abstract: An optical waveguide path coupling structure is realized without requiring highly accurate alignment.Type: GrantFiled: November 29, 2001Date of Patent: September 14, 2004Assignee: NEC Toppan Circuit Solutions, Inc.Inventors: Hideo Kikuchi, Kiminori Ishido
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Publication number: 20040051861Abstract: A gemstone rating system is provided particularly for rating the cut of diamonds in which particular cuts and features are measured and the results compared with and provided with a predetermined score depending upon deviations from a theoretical perfect cut; and wherein the deviation scores are summed and then subtracted from an initially perfect score to provide a universally comparable indication of quality of cut.Type: ApplicationFiled: June 9, 2003Publication date: March 18, 2004Inventor: William R. Bray
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Patent number: 6683680Abstract: A method and system are provided for representing a structure of a kind characterized by a specific radiation response to a predetermined incident radiation. The incident radiation is applied to the structure to produce the radiation response thereof, which is detected and data indicative thereof is generated. This data is processed and analyzed to produce a predetermined output representative of a structure-related data. The output includes a non-visual portion derived from the specific radiation response of the structure and is sensory perceptible by a human being.Type: GrantFiled: December 20, 2000Date of Patent: January 27, 2004Assignee: Crystal Beam Melody, Inc.Inventors: Nicolae Dinu, Gideon Tolkowsky, Gabi Tolkowsky, Uri Tolkowsky
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Patent number: 6673639Abstract: A method of evaluating a state of a polysilicon film objectively, accurately, automatically, and in a non-contact manner is provided. The method includes the steps of picking up a surface of a polysilicon film formed by excimer laser annealing, dividing the picked-up image into meshes each having a specific size, calculating a contrast in each of the meshes, extracting a highest contrast value and a lowest contrast value in the picked-up image, calculating a contrast ratio therebetween, and judging an average grain size of the polysilicon film on the basis of the contrast ratio.Type: GrantFiled: February 12, 2002Date of Patent: January 6, 2004Assignee: Sony CorporationInventors: Hiroyuki Wada, Nobuhiko Umezu, Koichi Tatsuki
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Patent number: 6665058Abstract: The invention is a multicolored reflecting disc that can be mounted to a lens for grading gemstone brightness and symmetry. The disc has an opening or aperture through which the gemstone is viewed on the object side of the lens. The aperture is surrounded by multicolored concentric rings which face the gemstone. Light reflecting from the multicolored rings creates specific colors on the gemstone that allow symmetry and brightness of the tone to be evaluated.Type: GrantFiled: May 24, 2000Date of Patent: December 16, 2003Assignee: EightStar Diamond Company, Inc.Inventor: Al Gilbertson
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Publication number: 20030223054Abstract: An apparatus for obtaining information about inclusion geo-spatial orientation within a gemstone comprises a means to measure the distance to and location of one or more selected inclusions within said gemstone relative to one or more points of assessment situated on or within said gemstone; and a monitoring system for collecting, compiling and analyzing data on the same.Type: ApplicationFiled: May 29, 2002Publication date: December 4, 2003Applicant: NATURAL CRYSTAL INFORMATION SYSTEMSInventor: Malcolm Raymond Warwick
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Patent number: 6650489Abstract: A gem identifying device using filtered transmitted light for use in distinguishing type-I colorless diamonds from type II colorless diamonds, and natural diamonds and gems from synthetic or treated diamonds and gems.Type: GrantFiled: July 17, 2002Date of Patent: November 18, 2003Assignee: Gemological Institute of America, Inc.Inventors: Gilbert N. Ravich, Shane Elen, James Shigley
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Patent number: 6603547Abstract: The method for determining radiation stability of a crystal to radiation of a working wavelength to be employed in a subsequent application includes taking a first absorption spectrum (A) of a cleaved piece of the crystal with a given thickness (D) over a predetermined wavelength range from a first wavelength (&lgr;1) to a second wavelength (&lgr;2) by means of a spectrophotometer. Then the cleaved piece of the crystal is irradiated with an energetic radiation source so as to form all theoretically possible color centers (saturation). After the irradiating a second absorption spectrum (B) of the cleaved piece of crystal is taken over the same predetermined wavelength range. Then a surface integral of a difference spectrum of the first absorption spectrum and the second absorption spectrum over the predetermined wavelength range is formed and divided by the thickness (D) to obtain a scaled surface integral value.Type: GrantFiled: October 11, 2001Date of Patent: August 5, 2003Assignee: Schott GlasInventors: Ewald Moersen, Burkhard Speit, Lorenz Strenge, Joerg Kandler
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Patent number: 6589848Abstract: A photodetector device and a process for manufacturing the same are described. The photodetector device comprises a doped semiconductor substrate; an intrinsic semiconductor material layer formed over the substrate, for absorbing incident light; an upper semiconductor material layer doped with the opposite type to the substrate, formed on a portion of the intrinsic semiconductor material layer to allow at least a portion of the incident light to directly enter the intrinsic semiconductor material layer; an upper electrode formed in a predetermined pattern on the upper semiconductor material layer, the upper electrode electrically connected to the upper semiconductor material layer; and a lower electrode electrically connected to the substrate, wherein a portion of the intrinsic semiconductor material layer constitutes at least a part of a photo-receiving surface.Type: GrantFiled: July 12, 2000Date of Patent: July 8, 2003Assignee: Samsung Electronics Co., Ltd.Inventors: Woong-lin Hwang, Jun-young Kim
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Publication number: 20030112422Abstract: An apparatus for generating data for use in determining a property of a gemstone, such as a cut diamond, the apparatus comprising:Type: ApplicationFiled: March 25, 2002Publication date: June 19, 2003Inventors: Dave Lapa, Marc Frans Alida Van de Velde, Christiaan Louis Cecile Keersmaekers
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Publication number: 20030107722Abstract: Process for the measurement of the surface of a polished precious stone, wherein firstly the position of at least some of the flat facet surfaces of the stone is measured in space, in particular by rotating the stone in front of a light source and examination of the shadow cast by the stone, and the facet surface is then observed under direct light.Type: ApplicationFiled: November 22, 2002Publication date: June 12, 2003Inventor: Peter Klingler
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Patent number: 6567156Abstract: A method for examining a gemstone includes the steps of coating the gemstone with a removable diffusing coating and determining the silhouette of the gemstone in three dimensions. The method further includes performing structured light triangulation by using laser light to obtain an image of the surface of the gemstone, the gemstone being transparent and/or reflective to the laser light in the absence of the coating. The method further includes the step of using the silhouette in conjunction with the image to determine the location of any recesses on the surface.Type: GrantFiled: August 31, 2000Date of Patent: May 20, 2003Assignee: Sarin Technologies Ltd.Inventor: Abraham Kerner
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Publication number: 20030030786Abstract: Techniques for monitoring the quality (e.g., optical and mechanical properties) in optical waveguides (e.g., photonic crystal fibers) are disclosed. Additionally, techniques for detecting and localizing defects in the waveguides are also described. Pulses of light are launched into one end of an optical waveguide. The amount of light scattered out of the same end of the waveguide (i.e., a backscattered or reflected signal) is monitored at certain wavelengths specific to the spectral characteristics of the waveguide. Transmission characteristics and defect localization can be determined from the backscattered signal.Type: ApplicationFiled: February 7, 2002Publication date: February 13, 2003Inventors: Max Shurgalin, Yoel Fink, Steven G. Johnson, Mihai Ibanescu
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Patent number: 6515738Abstract: The method of determining the authenticity and the geographical origin of gemstones of crystalline structure comprises the steps consisting in: applying an electromagnetic beam to the gemstone; determining values associated with the absorbance of the gemstone for wavelengths of the beam in an absorption direction that is predetermined relative to a characteristic axis of the crystal; calculating at least one ratio between these values; and comparing the or each ratio with predetermined corresponding ratios belonging to gemstones of predetermined authenticity and origin.Type: GrantFiled: July 17, 2000Date of Patent: February 4, 2003Assignee: Mauboussin Successeur de NouryInventors: Odile Barres, Bruno Sabot, Alain Cheilletz, Philippe de Donato
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Patent number: 6496255Abstract: A sample is rotated about an axis perpendicular to a surface of the sample in predetermined angular steps. The surface of the sample is irradiated with linearly polarized light, and a reflected intensity of light reflected from the surface of the sample is detected in each angular step. Based on a rotational angle dependency of the reflected intensity, the crystal face orientation of the sample is determined. To improve signal-to-noise ratio, the crystal lattice of the sample is excited. Further, the surface of the sample is irradiated with a plurality of linearly polarized light beams to obtain a plurality of reflected intensities.Type: GrantFiled: August 6, 2001Date of Patent: December 17, 2002Assignee: NEC CorporationInventors: Kazumi Sugai, Belgacem Haba, Yukio Morishige
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Publication number: 20020180952Abstract: A gem identifying device using filtered transmitted light for use in distinguishing type-I colorless diamonds from type II colorless diamonds, and natural diamonds and gems from synthetic or treated diamonds and gems.Type: ApplicationFiled: July 17, 2002Publication date: December 5, 2002Inventors: Gilbert N. Ravich, Shane Elen, James E. Shigley
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Patent number: 6473164Abstract: The present invention comprises systems, apparatuses and methods for measuring and analyzing gem color in a way which reliably and consistently simulates visual color analysis methodology. The preferred system embodiment of the present invention comprises several aspects, including the use of daylight approximating lamps, such as daylight-approximating fluorescent tubes or halogen lamp boosted with a filter to approximate daylight, and a light detector which directs light of a specific angle such that the system approximates visual analysis methodology. In the case of diamond analysis, in one embodiment, the system of the invention includes three major elements: a daylight-approximating light source that illuminates the pavilion side of the diamond, a light detector which detects light coming out at a specific angle from the pavilion side of the diamond, and an optical measurement device which measures the light detected by the light detector.Type: GrantFiled: February 16, 2000Date of Patent: October 29, 2002Assignee: Gemological Institute of America, Inc.Inventors: Peter De Jong, Ronald Geurts
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Patent number: 6465255Abstract: The present invention includes a method for identifying and probing phase transitions in materials. A polymorphic material capable of existing in at least one non-centrosymmetric phase is interrogated with a beam of laser light at a chosen wavelength and frequency. A phase transition is induced in the material while it is interrogated. The intensity of light scattered by the material and having a wavelength equal to one half the wavelength of the interrogating laser light is detected. If the phase transition results in the production of a non-centrosymmetric phase, the intensity of this scattered light increases; if the phase transition results in the disappearance of a non-centrosymmetric phase, the intensity of this scattered light decreases.Type: GrantFiled: January 28, 2000Date of Patent: October 15, 2002Assignee: The Regents of the University of CaliforniaInventors: Blaine W. Asay, Bryan F. Henson, Robert K. Sander, Jeanne M. Robinson, Steven F. Son, Peter M. Dickson
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Patent number: 6426791Abstract: Reflectance of a p-Si film crystallized by laser annealing is measured, a wave length dependency of the reflectance is found, and a first order rate of change is calculated to determine a minimum value near a wave length of 500 nm. The value is to be an inherent optical value under the laser power and relates to a grain size measured by Secco etching or the like. A number of correspondence between the optical value and the grain size are recorded and linearly plotted. By calculating the optical value from the reflectance in the p-Si film at in-line, the grain size is correspondingly determined. Thus, the semiconductor film can be in-line monitored, thereby improving a yield and saving a cost in producing a semiconductor device.Type: GrantFiled: February 22, 2001Date of Patent: July 30, 2002Assignee: Sanyo Electric Co., Ltd.Inventors: Kazuhiro Imao, Takashi Kuwahara, Yoshihiro Morimoto, Kiyoshi Yoneda
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Patent number: 6411391Abstract: A method of measuring a crystal section shape of a crystal being pulled from a crystal melt while rotating, including taking an image of the base of the crystal in horizontal and vertical directions with a two-dimensional camera set at an upper oblique position over the crystal; setting at least two horizontal light measuring lines in the image taken by the two-dimensional camera, being arranged in parallel in the vertical direction; detecting pairs of intersection points, at which a fusion ring intersects the two horizontal light measuring lines; transforming a position of each of the intersection points into a position of a point located on a line passing through a crystal center; determining diameters of the crystal based on the transformed positions and on time lags between two intersection points of each of the pairs of intersection points.Type: GrantFiled: October 28, 1999Date of Patent: June 25, 2002Assignee: Sumitomo Metal Industries. Ltd.Inventors: Keiichi Takanashi, Kazuo Hiramoto, Tokuji Maeda
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Patent number: 6377340Abstract: A method for detecting whether a natural diamond has been processed at high pressure and high temperature (HPHT) conditions comprises steps of disposing the diamond in a cyrostat that is provided at temperatures equal to or less than liquid nitrogen; illuminating the diamond with a laser beam; recording an optical spectrum of the diamond with a photoluminescence spectrometer; and examining the optical spectrum of the diamond to detect an absence of selected photoluminescent spectral lines.Type: GrantFiled: October 29, 1999Date of Patent: April 23, 2002Assignee: General Electric CompanyInventors: Thomas Richard Anthony, John Kieran Casey, Alan Cameron Smith, Suresh Shankarappa Vagarali
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Patent number: 6348964Abstract: A viewer for gemstones allowing a person to view the light performance of a gemstone having a 360-degree light unit positioned above a base where the stone is placed. The light unit is attached to an adjustable mounting bracket which allows the bracket and light unit to move vertically through use of a control mechanism. The base allows for secure and consistent placement of the gemstone, and positioning of a light control structure, preferably made from a reflective material, over the stone. The position of the stone is under the center of the light unit and light control structure. The light control structure has an aperture to allow the light from the light unit to enter.Type: GrantFiled: August 25, 1999Date of Patent: February 19, 2002Inventors: Randall M. Wagner, Kurt Schoeckert
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Publication number: 20010023925Abstract: In order to test whether a diamond has had a layer a synthetic diamond deposited thereon, the diamond is radiated with ultraviolet radiation so as to form a pattern of beams of refracted and reflected radiation, the pattern of refracted and reflected radiation being observed on a screen behind the diamond.Type: ApplicationFiled: January 19, 2001Publication date: September 27, 2001Inventor: Martin Phillip Smith
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Patent number: 6275293Abstract: A novel automated method for measuring oxygen stacking fault density on silicon wafers using methods for measuring surface roughness of a silicon wafer. A silicon wafer manufactured according to processes that include the novel automated method for measuring oxygen stacking fault density on silicon wafers using methods for measuring surface roughness of a silicon wafer.Type: GrantFiled: May 10, 2000Date of Patent: August 14, 2001Assignee: SEH America, Inc.Inventor: Timothy L. Brown
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Publication number: 20010006415Abstract: A method and system are provided for representing a structure of a kind characterized by a specific radiation response to a predetermined incident radiation. The incident radiation is applied to the structure to produce the radiation response thereof, which is detected and data indicative thereof is generated. This data is processed and analyzed to produce a predetermined output representative of a structure-related data. The output includes a non-visual portion derived from the specific radiation response of the structure and is sensory perceptible by a human being.Type: ApplicationFiled: December 20, 2000Publication date: July 5, 2001Inventors: Nicolae Dinu, Gideon Tolkowsky, Gabi Tolkowsky, Uri Tolkowsky
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Patent number: 6239867Abstract: A method and associated apparatus for the standardized grading of gemstones is provided. The system gauges the spectral response of a gemstone subject to a plurality of incident light sources within an imaging apparatus. The operation of the imaging apparatus is controlled by an instruction set of a local station control data processor. Light energy data is captured in the form of pixel data sets via a charge coupled device of the imaging apparatus of the local station. The control data processor of the local station is operable linked to an analysis station, the station includes an analysis data processor and mass storage memory device. The memory device provides storage space for the instruction set of the analysis data processor as well as database records. The analysis station employs a data processor and model database for assessing the aesthetic and/or monetary value of gemstones by way of the communicated pixel data sets.Type: GrantFiled: December 7, 1999Date of Patent: May 29, 2001Assignee: Imagestatistics, Inc.Inventor: Lalit K. Aggarwal
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Patent number: 6182729Abstract: An apparatus for manufacturing a plurality of wafers by slicing a cylindrical ingot with a wire saw. The apparatus includes a measuring device for measuring the crystal orientation of the ingot; an adhering device for adhering a support to the surface of the ingot based on the orientation where the support includes an intermediate plate and a support plate, where the support plate is adapted to fit the wire saw, and where the adhering device includes an auxiliary adhering element for adhering the intermediate plate to the surface of the ingot and an adhering element for adhering the support plate to the intermediate plate; a dryer for drying and solidifying an adhesive applied between the ingot and the intermediate plate and an adhesive applied between the intermediate plate and the support plate; and the wire saw for slicing the ingot into the plurality of wafers while the ingot is supported on the support.Type: GrantFiled: January 29, 1998Date of Patent: February 6, 2001Assignee: Nippei Toyama CorporationInventors: Yoshiaki Banzawa, Nobuaki Hayashi, Kiyoakira Shimizu
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Patent number: 6144443Abstract: An apparatus for measuring crystal strain in a microscopic region within a semiconductor crystal.Type: GrantFiled: August 24, 1999Date of Patent: November 7, 2000Assignee: NEC CorporationInventor: Takashi Ide
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Patent number: 6143572Abstract: A pen-like device having a scriber for scratching a deep groove in a yellow colored, metal article object, such as jewelry, being tested for the gold content thereof, and an applicator provided on an opposite end of the pen-like device for conveying an acid solution, which is housed within the pen-like device, onto, around and in the groove to observe whether there is a color change to the testing area, on which the acid solution was applied, making the the testing area darker or black, where such a color change would indicate that the metal article or object is imitation gold, or has a gold content which is less than minimum karat requirement of the test.Type: GrantFiled: September 14, 1998Date of Patent: November 7, 2000Inventors: Rami Grand, Ella Grand
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Patent number: 6111262Abstract: A method and system for accurately measuring a diameter of a crystal including independently detecting a first intersection point and a second intersection point on a periphery of the crystal. The first intersection point and the second intersection point correspond to a respective intersection between a fusion ring formed on the periphery of the crystal and a light measuring line. The light measuring line may be produced by a camera, for example. In addition, the frequency components caused by shaking the crystal, are removed from the detected first intersection point and the detected second intersection point. In addition, a timing difference between when the first detected intersection point and the second detected intersection point intersect the light measuring line is determined. Finally, an interval between the detected first intersection point and the detected second intersection point using the determined timing difference is obtained.Type: GrantFiled: October 30, 1998Date of Patent: August 29, 2000Assignee: Sumitomo Metal Industries, Ltd.Inventor: Keiichi Takanashi
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Patent number: 6103194Abstract: Apparatus (1) for testing items of metal such as jewelry comprises a housing (3) which is closed at one end (3a) and partly open at the other end (3b). Sealed within the housing is an insert comprising a reservoir (5) containing a testing chemical and an applicator (7). The applicator extends into the reservoir (5) and projects from the housing through its partly open end (3b). The outer surface of the applicator (7) projecting from the housing forms a tip which is used to apply the testing chemical to the surface of the metal under test.Type: GrantFiled: March 10, 1998Date of Patent: August 15, 2000Inventor: Richard Jackson
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Patent number: 6056031Abstract: An apparatus for connecting a cylindrical ingot to a support plate includes means for measuring a crystal orientation of the ingot based on a diffraction of x-rays, means for rotating the ingot about a center axis based on the crystal orientation so that a center axis of the ingot is held parallel to a first plane and an orientation axis based on the crystal orientation is placed in a plane parallel to the first plane, means for adhering an intermediate plate to the ingot, means for adjusting a position of one of the support plate and the ingot in a plane parallel to the first plane based on the crystal orientation so that a mounting axis of the support plate is in a specific relationship with the orientation axis, and means for attaching the support plate to the intermediate plate.Type: GrantFiled: November 6, 1998Date of Patent: May 2, 2000Assignee: Nippei Toyama CorporationInventors: Yoshiaki Banzawa, Nobuaki Hayashi, Kiyoakira Shimizu
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Patent number: 6043742Abstract: An apparatus and process for detecting man-made gemstones using an alternating current conducted through a sample gemstone is provided. The apparatus includes a hand-held housing in which is disposed electronic circuitry, a probe which extends from the housing, and a transmitting stimulus electrode in the form of a body-contact touchpad. The electronic circuitry includes a filter for eliminating non-transmitted signals sensed by the probe, and produces an alternating current signal, preferably in sine wave form, for delivery to the touchpad. The alternating current signal is transmitted through the operator of the apparatus into the sample gemstone. The operator probes the gemstone by touching the conductive probe to the gemstone in an attempt to sense signals conducted through the gemstone. An alarm is activated upon the detection of the conducted transmitted signal, indicating that the gemstone is man-made.Type: GrantFiled: May 6, 1999Date of Patent: March 28, 2000Inventor: James Austin
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Patent number: 6024814Abstract: A method for connecting a cylindrical ingot to a support plate includes measuring a crystal orientation of the ingot based on a diffraction of x-rays, rotating the ingot about a center axis based on the crystal orientation so that a center axis of the ingot is held parallel to a first plane and an orientation axis based on the crystal orientation is placed in a plane parallel to the first plane, adhering an intermediate plate to the ingot, adjusting a position of one of the support plate and the ingot in a plane parallel to the first plane based on the crystal orientation so that a mounting axis of the support plate is in a specific relationship with the orientation axis, and attaching the support plate to the intermediate plate.Type: GrantFiled: November 26, 1996Date of Patent: February 15, 2000Assignee: Nippei Toyama CorporationInventors: Yoshiaki Banzawa, Nobuaki Hayashi, Kiyoakira Shimizu
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Patent number: 6020954Abstract: A method and associated apparatus for the standardized grading of gemstones is provided. The system gauges the spectral response of a gemstone subject to a plurality of incident light sources within an imaging apparatus. The operation of the imaging apparatus is controlled by an instruction set of a local station control data processor. Light energy data is captured in the form of pixel data sets via a charge coupled device of the imaging apparatus of the local station. The control data processor of the local station is operably linked to an analysis station, the station includes an analysis data processor and mass storage memory device. The memory device provides storage space for the instruction set of the analysis data processor as well as database records. The analysis station employs a data processor and model database for assessing the aesthetic and/or monetary value of gemstones by way of the communicated pixel data sets.Type: GrantFiled: May 28, 1998Date of Patent: February 1, 2000Assignee: Imagestatistics, Inc.Inventor: Lalit K. Aggarwal
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Patent number: 5966673Abstract: A system and method for computerized grading of the cut of a gemstone. The system includes a gemstone model and an illumination model. The gemstone model defines the cut of the gemstone in three dimensions with reference to the facets of the gemstone. The illumination model defines light projected onto the gemstone. The method includes the steps of determining a beam of light refracted into the gemstone from the illumination model for at least one of the facets, tracing reflections of the beam of light within the gemstone, and measuring at least one light beam refracted out of the gemstone model. The measurements of the refracted light are used to evaluate the gemstone.Type: GrantFiled: January 10, 1997Date of Patent: October 12, 1999Assignee: Diamond Technologies, Inc.Inventor: Paul T. Shannon, Sr.
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Patent number: 5955735Abstract: A target gemstone is irradiated with ultraviolet energy while sensing the electrical potential across the gemstone. A silicon carbide gemstone will generate an electrical potential and, therefore, can be positively identified, as distinct from other gemstones such as diamond and cubic zirconia that do not produce a potential.Type: GrantFiled: September 29, 1997Date of Patent: September 21, 1999Assignee: C3, Inc.Inventor: Thomas G. Coleman
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Patent number: 5883388Abstract: In order to test whether a diamond has had a layer of synthetic diamond material deposited thereon, infrared radiation including radiation of wavelength substantially 7 .mu.m to 25 .mu.m preferably 7 .mu.m to 10 .mu.m emitted or transmitted by the diamond is observed, to detect differences between the compositions of different zones of the diamond.Type: GrantFiled: June 19, 1997Date of Patent: March 16, 1999Assignee: Gersan EstablishmentInventors: Martin Phillip Smith, James Gordon Charters Smith, Martin Cooper, Ricardo Simon Sussmann
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Patent number: 5883389Abstract: In order to provide a method of distinguishing natural from synthetic diamond which does not involve costly equipment or long periods to make a measurement, a diamond is irradiated with ultraviolet radiation which is preponderantly of wavelength 225 nm or less, such that substantially only the surface region of the diamond is irradiated. By observing the pattern or luminescence and/or phosphorescence produced by the diamond, an observer can identify the diamond as a natural or synthetic diamond.Type: GrantFiled: May 29, 1996Date of Patent: March 16, 1999Inventors: Paul Martyn Spear, Christopher Mark Welbourn
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Patent number: 5880504Abstract: In order to test whether a diamond has had a layer of synthetic diamond deposited thereon, the surface area of the natural part of the stone is measured by measuring the radiant-flux density of radiation substantially of wavelength 230 nm to 320 nm in an integrating sphere containing the diamond. This is compared to the total surface area of the diamond.Type: GrantFiled: June 6, 1997Date of Patent: March 9, 1999Assignee: Gersan EstablishmentInventors: Martin Phillip Smith, James Gordon Charters Smith, Martin Cooper, Christopher Mark Welbourn, Philip Maurice Martineau
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Patent number: 5835200Abstract: In order to examine a gemstone, the stone is irradiated and observed though a filter (5) at a first wavelength which is characteristic of a first class of gemstones. The filter can be rocked from a setting normal to the optical axis to transmit radiation of at least one reference wavelength. The intensities of radiation transmitted at first and reference wavelengths are observed and compared, to classify the gemstone as belonging to the first class or not. In order to detect whether the gemstone is a diamond or diamond simulant, the first wavelength comprises raman emission characteristic of diamond. In order to detect whether the gemstone is definitely natural or not definitely natural, the gemstone is classified as definitely natural if there is a maximum of absorption of radiation at 415.5 nm.Type: GrantFiled: February 3, 1997Date of Patent: November 10, 1998Assignee: Gersan EstablishmentInventors: Martin Phillip Smith, Robin Wynclyffe Smith, Christopher Mark Welbourn
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Patent number: 5835205Abstract: Diamond gemstones and gemstones formed of crystals of silicon carbide are distinguished from each other by introducing a band of ultraviolet light into a target gemstone and measuring the transmissivity of that band of light by the gemstone. A diamond will transmit light within a certain band of the ultraviolet spectrum, while a silicon carbide gemstone will block light within this band. Several instruments for carrying out this procedure are described, including an instrument that utilizes a fiberoptic strand to convey ultraviolet light that has passed through the gemstone to a solid state photodetector.Type: GrantFiled: February 10, 1997Date of Patent: November 10, 1998Assignee: C3, Inc.Inventors: Charles Eric Hunter, Douglas G. Waltz
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Patent number: 5828405Abstract: The gemstone recordal and retrieval system records optical images for gemstones in an effective manner. The optical image of a gemstone is captured using a two-dimensional charge coupled device whereby the time to capture the image is relatively short. The optical images can be improved in definition by varying the output of a laser LED. This fast feedback and adjustability provides accurate recordings.Type: GrantFiled: November 8, 1996Date of Patent: October 27, 1998Assignee: Omphalos Recovery Systems Inc.Inventors: Dana J. Vanier, Hermann F. Wallner, Michael Leydon
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Patent number: 5811817Abstract: The detection of fractures in diamonds which are filled with high index of refraction glass is easily and quickly carried out by observation under ultra violet light. Such light having a wavelength between 300 and 400 nm, as reflected from, or transmitted through, such diamonds is imaged using a CCD camera, or directly by the use of fluorescent conversion to the visible spectrum. In either approach, the fracture fills are clearly and immediately distinguishable.Type: GrantFiled: August 28, 1997Date of Patent: September 22, 1998Inventor: Gilbert Norman Ravich
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Patent number: 5811824Abstract: In order to test whether a diamond 2 comprises synthetic diamond material, a plurality of different zones of the diamond 2 are irradiated with radiation substantially of wavelength substantially 230 nm to 320 nm, an image or reading of the radiation transmitted by each zone of the diamond 2 being produced.Type: GrantFiled: September 23, 1996Date of Patent: September 22, 1998Assignee: Gersan EstablishmentInventors: Martin Phillip Smith, James Gordon Charters Smith, Martin Cooper