By Polarized Light Examination Patents (Class 356/364)
  • Patent number: 10302433
    Abstract: The invention relates to a daytime and nighttime stellar sensor (1), comprising: at least one video camera (2) suitable for taking images of stars (3) in the sky; and a control unit (4), characterized in that it furthermore comprises: a polarizer (5), the control unit (4) being configured: to obtain an estimation of a direction of polarization of the polarized light received from the sky by the video camera (2); and to control the orientation of the polarizer (5) so that said polarizer (5) filters polarized light from the sky directed toward the video camera (2) and having said polarization direction.
    Type: Grant
    Filed: January 20, 2016
    Date of Patent: May 28, 2019
    Assignee: CENTRE NATIONAL D'ETUDES SPATIALES
    Inventor: Johan Montel
  • Patent number: 10288485
    Abstract: The present disclosure discloses a colorimetry calculation method for a display. The display includes a quantum dot backlight module and a first polarizer, wherein the quantum dot backlight module includes a light guide plate, a quantum dot thin film layer, and a backlight. The method obtains the correction spectrum of the quantum dot backlight module, and obtains the true spectrum of the quantum dot backlight module when the first polarizer is arranged on the light exit side of the quantum dot backlight module based on the correction spectrum and the measurement spectrum, that is, the modified spectrum, so as to accurately simulate the chromatic offset phenomenon due to the secondary excitation of the first polarizer, and provide the basis for the quantitative design of the display including the quantum dot backlight module. The present disclosure also discloses a chromaticity calculation method of a display.
    Type: Grant
    Filed: October 20, 2017
    Date of Patent: May 14, 2019
    Assignee: Wuhan China Star Optoelectronics Technology Co., Ltd
    Inventor: Guowei Zha
  • Patent number: 10282868
    Abstract: A method, non-transitory computer readable medium and apparatus for generating one or more graphical chromophore maps are disclosed. For example, the method includes receiving a plurality of images from a plurality of different customers, estimating a plurality of different illuminates that were used to capture each one of the plurality of images, calculating a correlation of a spectral reflectance of a lip region of a customer with an absorption curve of hemoglobin for the each one of the plurality of images for each one of the plurality of different illuminates that is estimated, selecting an illuminance of the plurality of different illuminates that provides a highest correlation and generating one or more graphical chromophore maps for subsequently received images of customers using the illuminance that is selected.
    Type: Grant
    Filed: January 24, 2017
    Date of Patent: May 7, 2019
    Assignee: The Procter & Gamble Company
    Inventors: Martin Sidney Maltz, Luisa Fernanda Polania Cabrera, Paul Jonathan Matts, Ankur Purwar
  • Patent number: 10247610
    Abstract: A chromatic confocal sensor includes: a light source portion that emits a plurality of light beams having different wavelengths; a plurality of optical heads that converge the plurality of light beams emitted from the light source portion at different focal positions and emit measurement light reflected by a measurement point at the focal positions; a spectrometer including a line sensor, and an optical system that includes a diffraction grating that diffracts a plurality of measurement light beams emitted from the plurality of optical heads, and emits the plurality of measurement light beams diffracted by the diffraction grating to a plurality of different light-receiving areas of the line sensor; and a position calculation portion that calculates a position of a plurality of measurement points as a measurement target of the plurality of optical heads based on a light-receiving position of the plurality of light-receiving areas of the line sensor.
    Type: Grant
    Filed: October 5, 2017
    Date of Patent: April 2, 2019
    Assignee: MITUTOYO CORPORATION
    Inventor: Koji Kubo
  • Patent number: 10244154
    Abstract: An image collecting system, an image collecting processing system and an image collecting processing method are provided by embodiments of the present disclosure. The image collecting system (100) includes a pick-up device (130) and a polarizing device (152). The pick-up device (130) is configured to acquire a first image and a second image of a target scene. The polarizing device (152) is disposed in an input path of the pick-up device (130) corresponding to the second image when the pick-up device (130) acquires the second image, to allow first incident light (110) for forming the first image and second incident light (120) for forming the second image, entering the pick-up device (130), to have different polarization states. The embodiments of the present disclosure can reduce the amount of image information processing and improve the accuracy of image processing.
    Type: Grant
    Filed: May 20, 2016
    Date of Patent: March 26, 2019
    Assignees: BOE TECHNOLOGY GROUP CO., LTD., PEKING UNIVERSITY
    Inventors: Xinguo Li, Yi Wang, Xing Zhang, Yanbing Wu
  • Patent number: 10209134
    Abstract: An photosensitive device, the sensor comprising: a plurality of photosensitive units distributed in an array, each photosensitive unit configured to receive and convert light signal, wherein the photosensitive unit comprises a detecting element and a polarizer, the detecting element comprises a carbon nanotube structure comprising a plurality of carbon nanotubes oriented along the same direction, and the polarizer is configured to generate polarized light to irradiate a part surface of the carbon nanotube structure; a measuring device configured to measure temperature differences or potential differences generated in the carbon nanotube structure by irradiating; a data processor configured to analyze and calculate the potential differences or the temperature differences to obtain the wavelength of the light signal.
    Type: Grant
    Filed: January 19, 2017
    Date of Patent: February 19, 2019
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Ling Zhang, Yang Wu, Kai-Li Jiang, Chang-Hong Liu, Jia-Ping Wang, Shou-Shan Fan
  • Patent number: 10184796
    Abstract: Apparatuses and methods for sensing rotations are provided. One embodiment of the apparatus includes a cell containing alkali and active nuclear magnetic resonance (NMR) isotope(s) atoms, a magnet providing a first magnetic field, a light source, and optics which circularly polarize light to generate a pump beam for optically pumping the alkali atoms and, together with a second magnetic field orthogonal to the first magnetic field or a modulation of the light, causing the alkali and the NMR isotope atoms to precess about the first magnetic field. The apparatus further includes a partial reflector opposite the light source and configured to, in conjunction with a first linear polarizer, generate a reflected linearly-polarized probe beam from a portion of the pump beam, and one or more polarizing beam splitters configured to split light of the probe beam incident thereon into orthogonally polarized components that are detected and used to determine rotations.
    Type: Grant
    Filed: April 10, 2014
    Date of Patent: January 22, 2019
    Assignee: Microsemi Frequency and Time Corporation
    Inventors: Kim Richard Overstreet, II, John Alexander Malcolmson, Jr., Robert Ira Lutwak
  • Patent number: 10168273
    Abstract: Disclosed are methods and apparatus for measuring and controlling polarization for inspection of a semiconductor sample.
    Type: Grant
    Filed: October 26, 2017
    Date of Patent: January 1, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Haifeng Huang, Rui-Fang Shi, Damon F. Kvamme, Amrish Kelkar
  • Patent number: 10156669
    Abstract: This patent describes an optical element, which converts incident linearly or circularly polarized visible light into radially or azimuthally polarized light beam. The polarization converter is a single optical element, produced by direct laser writing technique in an optically transparent substrate. Direct laser writing based on ultra-short pulsed laser radiation forms form birefringence self-assembled nanogratings in optically transparent material, such as fused silica. The period of gratings is smaller than wavelengths of a visible light.
    Type: Grant
    Filed: May 3, 2012
    Date of Patent: December 18, 2018
    Assignee: University of Southampton
    Inventors: Martynas Beresna, Peter Kazansky
  • Patent number: 10107807
    Abstract: Techniques for enhanced fluorescence include a functionalized substrate for a target optical frequency comprising a one dimensional photonic crystal that is functionalized with a bioactive target molecule that has an affinity for a particular analytic. The one dimensional photonic crystal includes a plurality of dielectric layers including a plurality of high index of refraction layers alternating with a plurality of low index of refraction layers. The thickness of each layer is within a factor of four of a wavelength of the optical frequency in the layer. For emissions from a fluorophore bound to the target molecule and excited by incident light, there is an emission intensity maximum centered at an angle independent of the direction of the incident light.
    Type: Grant
    Filed: May 21, 2015
    Date of Patent: October 23, 2018
    Assignee: The University of Maryland, Baltimore
    Inventors: Joseph R. Lakowicz, Ramachandram Badugu
  • Patent number: 10080515
    Abstract: Systems and methods are disclosed for non-invasively measuring blood glucose levels in a biological sample based on spectral data. This includes utilizing at least one light source configured to strike a target area of a sample, utilizing at least one light filter positioned to receive light transmitted through the target area from the at least one light source, utilizing at least one light detector positioned to receive light from the at least one light source and filtered by the at least one light filter, and to generate an output signal, having a time dependent current, which is indicative of the power of light detected, receiving the output signal from the at least one light detector with a processor and based on the received output signal, calculating the attenuance attributable to blood in a sample with a signal-to-noise ratio of at least 20-to-1; and determining a blood glucose level.
    Type: Grant
    Filed: January 17, 2017
    Date of Patent: September 25, 2018
    Assignee: St. Louis Medical Devices, Inc.
    Inventor: Zhi Xu
  • Patent number: 10070809
    Abstract: Systems and methods are disclosed for non-invasively measuring blood glucose levels in a biological sample based on spectral data. This includes utilizing at least one light source configured to strike a target area of a sample, utilizing at least one light filter positioned to receive light transmitted through the target area of the sample from the at least one light source, utilizing at least one light detector positioned to receive light from the at least one light source and filtered by the at least one light filter, and to generate an output signal, having a time dependent current, which is indicative of the power of light detected, receiving the output signal from the at least one light detector with a processor, calculating the attenuance attributable to blood with a ratio factor based on the received output signal, and determining a blood glucose level based on the calculated attenuance.
    Type: Grant
    Filed: January 10, 2017
    Date of Patent: September 11, 2018
    Assignee: St. Louis Medical Devices, Inc.
    Inventor: Zhi Xu
  • Patent number: 10049444
    Abstract: A fuel filter inspection method includes capturing an image of a fuel filter sample using an imaging device and sending the captured image to an image processor. The method further includes the image processor receiving the captured image, thresholding the captured image to generate a binary image, determining sizes for a plurality of particles present in the binary image, comparing the size of each of particle of the plurality of particles to a particle size threshold, and quantifying the number of particles of the plurality of plurality of particles with a size greater than the particle size threshold. The method further includes the image processor comparing the number of particles of the plurality of particles with a size greater than the particle size threshold to a particle count threshold, and modifying a graphical user interface to indicate a state of the fuel filter sample based on the comparison.
    Type: Grant
    Filed: March 25, 2016
    Date of Patent: August 14, 2018
    Assignee: Lockheed Martin Corporation
    Inventors: Mike Ivor Jones, Kyle Alson McGehee, Eric White, Richard Parker McElveen, Jr., Jennifer C. Byrne
  • Patent number: 10048129
    Abstract: A total reflection spectroscopic measurement device includes a terahertz wave generation unit, an internal total reflection prism, a detection unit configured to detect the terahertz wave, an electric field vector measurement unit configured to measure an electric field vector of the terahertz wave, and an analysis unit configured to acquire information about an optical constant of the object to be measured. Proportions of S polarization component and P polarization component of the terahertz wave are constant. The analysis unit acquires the information about the optical constant on the basis of a ratio between S polarization component and P polarization component of the measured electric field vector when the object is not arranged on the total reflection surface and a ratio between S polarization component and P polarization component of the measured electric field vector when the object is arranged on the total reflection surface.
    Type: Grant
    Filed: May 17, 2017
    Date of Patent: August 14, 2018
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventor: Yoichi Kawada
  • Patent number: 10041838
    Abstract: A metrology system is presented for measuring parameters of a structure. The system comprises: an optical system and a control unit. The optical system is configured for detecting light reflection of incident radiation from the structure and generating measured data indicative of angular phase of the detected light components corresponding to reflections of illuminating light components having different angles of incidence. The control unit is configured for receiving and processing the measured data and generating a corresponding phase map indicative of the phase variation along at least two dimensions, and analyzing the phase map using modeled data for determining one or more parameters of the structure.
    Type: Grant
    Filed: February 23, 2015
    Date of Patent: August 7, 2018
    Assignee: NOVA MEASURING INSTRUMENTS LTD.
    Inventors: Gilad Barak, Dror Shafir, Danny Grossman
  • Patent number: 10031069
    Abstract: Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light source polarization axis generally perpendicular to the first light source polarization axis. Also, a first polarized light receiver having a first polarized light receiver polarization axis and configured to measure an intensity of light transmitted from the first light receiver polarizer and a second polarized light receiver having a second polarized light receiver polarization axis substantially perpendicular to the first light receiver polarization axis and configured to measure an intensity of light transmitted from the second light receiver polarizer, wherein the first and second light receiver polarization axes are generally +/?45 degrees relative to the first and second light source polarization axes.
    Type: Grant
    Filed: June 12, 2017
    Date of Patent: July 24, 2018
    Assignee: DEKA Products Limited Partnership
    Inventors: Jacob W. Scarpaci, Jason M. Sachs, Simon C. Helmore
  • Patent number: 10026202
    Abstract: The invention discloses a wearable molecular imaging navigation system comprising: a multi-spectral light transceiver configured to transmit a multi-spectral light to a detected subject in a detection region and acquire an emitting light regarding the detected subject and acquire a reflecting light regarding the detected subject; an image processor configured to receive the reflecting light and the emitting light from the multi-spectral light transceiver, execute a three-dimensional reconstruction and fusion process on the reflecting light and the emitting light to obtain a fusion image; a wireless signal processor configured to enable a wireless communication; and a wearable device, configured to receive the fusion image from the image processor via the wireless signal processor, display the fusion image and control the multi-spectral light transceiver and the image processor based on instructions received.
    Type: Grant
    Filed: October 10, 2016
    Date of Patent: July 17, 2018
    Assignee: INSTITUTE OF AUTOMATION, CHINESE ACADEMY OF SCIENCES
    Inventors: Jie Tian, Kunshan He, Chongwei Chi, Xin Yang
  • Patent number: 10026167
    Abstract: Anisotropic contrast methodology in combination with use of sample investigating polarized electromagnetic radiation to provide Jones or Mueller Matrix imaging data corresponding to areas on samples.
    Type: Grant
    Filed: December 9, 2015
    Date of Patent: July 17, 2018
    Assignees: BOARD OF REGENTS OF THE UNIVERSITY OF NEBRASKA, J. A. WOOLLAM CO., INC.
    Inventors: Tino Hofmann, Mathias M. Schubert, Tadas Kasputis, Angela K. Pannier, Craig M. Herzinger, John A. Woollam
  • Patent number: 10001444
    Abstract: A surface inspecting method includes: irradiating an incident light beam of a first polarized state on a target object, the incident light beam comprising parallel light and having a cross-sectional area: measuring a second polarized state of a reflected light beam reflected from the target object; and performing inspection on an entire area of the target object on which the incident light beam is irradiated, based on a variation between the first polarized state and the second polarized state.
    Type: Grant
    Filed: December 1, 2015
    Date of Patent: June 19, 2018
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Kang-woong Ko, Sung-yoon Ryu, Young-hoon Sohn, Gil-woo Song, Tae-heung Ahn, Hyoung-jo Jeon, Sang-kyeong Han, Masahiro Horie, Woo-seok Ko, Yu-sin Yang, Sang-kil Lee, Byeong-hwan Jeon
  • Patent number: 9995565
    Abstract: The optical coherence tomography includes a processor, wherein the processor is configured to: vectorize the Jones matrix and then convert the vectorized Jones matrix into an expanded matrix; calculate at least an eigenvalue and at least an eigenvector of the expanded matrix by performing an eigenvalue decomposition to the expanded matrix; and estimate the polarization characteristic of the subject by using at least an eigenvalue and at least an eigenvector of the Jones matrix acquired based on the at least eigenvalue and the at least eigenvector of the expanded matrix.
    Type: Grant
    Filed: April 21, 2016
    Date of Patent: June 12, 2018
    Assignee: TOMEY CORPORATION
    Inventor: Masahiro Yamanari
  • Patent number: 9921336
    Abstract: Accordingly the embodiment herein provides a device for recognizing a 3D posture and a location of a movable body. The device includes: a plurality of polarization modules individually attached to a plurality of surfaces of a 3D figure; a plurality of illumination modules individually corresponding to the polarization modules and generating and outputting illumination value information in which polarized light emitted from a polarization light source penetrates the corresponding polarization module to be received; and an interpretation unit generating posture information and location information of the movable body by using the illumination value information received from the illumination modules corresponding to the polarization modules attached to at least three considered target surfaces.
    Type: Grant
    Filed: April 27, 2017
    Date of Patent: March 20, 2018
    Assignee: Polariant, Inc.
    Inventors: Hyouk Jang, Hyeon Gi Jeon, Youngjae Choi
  • Patent number: 9921148
    Abstract: A polarized light imaging apparatus is provided. In an embodiment, the apparatus comprises a light source for producing light beams; an illumination optic coupled to the light source for guiding the light beams towards the sample; a linear polarizer coupled to the illumination optic and configured to produce a linearly polarized light towards the sample respective of the light beams; a TIR birefringent polarizing prism (BPP) coupled to the sample to maximize a refraction difference between ordinary waves and extraordinary waves of light returning from the sample; and a detection optic unit coupled to the non-TIR BPP for guiding the light waves returning from the sample towards a single polarization sensitive sensor element (SE), the SE is configured to capture at least one frame of the sample respective of the light waves returning from the superficial single-scattering layer of the sample apart from the deeper diffuse layer.
    Type: Grant
    Filed: April 20, 2014
    Date of Patent: March 20, 2018
    Assignee: MOBILEODT LTD.
    Inventors: David Levitz, Ariel Beery
  • Patent number: 9885670
    Abstract: An inspection apparatus which can be accurately calibrated regardless of a use environment or an amount of use time is implemented. A reference substrate 100 provided with a diffraction grating 107 is mounted on a transport system 110, an illumination region 106 is formed on the diffraction grating 107 by light 105 from an illumination optical system 104, reflected light is collected by a detection optical system 108, and an output value from a sensor 111 is measured. It is determined whether or not a difference between a simulation value preserved in a processing section 112 and the output value from the sensor 111 is within a predetermined allowable range, and the optical system is adjusted so that the difference enters the allowable range. Since standard data for performing calibration on the inspection apparatus is obtained by using the diffraction grating, it is possible to implement the inspection apparatus which can be accurately calibrated regardless of a use environment or an amount of use time.
    Type: Grant
    Filed: December 19, 2013
    Date of Patent: February 6, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventor: Takahiro Jingu
  • Patent number: 9841372
    Abstract: This invention is directed to methods of unambiguously measuring the absolute retardance, ?A of an optical sample. A method for measuring absolute retardance of an optical sample includes directing light comprising a plurality of wavelengths through a polarization state generator source, the optical sample, and a polarization state analyzer, detecting, at an imaging device, retardance measurement light emanating from the optical sample after also passing through the polarization state analyzer at the plurality of wavelengths, determining a measurement retardance associated with the detected retardance measurement light at each of the wavelengths, and determining an absolute retardance associated with the optical sample based on the measurement retardances determined at each of the wavelengths.
    Type: Grant
    Filed: September 25, 2015
    Date of Patent: December 12, 2017
    Assignee: Hinds Instruments, Inc.
    Inventors: John Freudenthal, Baoliang Wang
  • Patent number: 9825698
    Abstract: A method and apparatus for determining in-band OSNR in optical information signals, e.g. in polarization-multiplexed QPSK and higher-order M-ary QAM signals, are disclosed. A correlation measurement of the signal amplitude or power at two distinct optical frequencies of the signal may be used to determine the in-band optical noise in the signal. A measurement of the signal power may be used to determine the OSNR based on the determined in-band noise.
    Type: Grant
    Filed: December 9, 2014
    Date of Patent: November 21, 2017
    Assignee: VIAVI SOLUTIONS INC.
    Inventor: Fred L. Heismann
  • Patent number: 9825073
    Abstract: An image sensor includes a photodiode disposed in semiconductor material to accumulate image charge in response to light directed through a back side of the semiconductor material. A scattering structure is disposed proximate to the front side of the semiconductor material such that the light that is directed into the semiconductor material through the back side is scattered back through the photodiode. A deep trench isolation structure is disposed in the semiconductor material that isolates the photodiode and defines an optical path such that the light that is scattered back through the photodiode in the optical path is totally internally reflected by the DTI. An antireflective coating is disposed on the back side of the semiconductor material and totally internally reflects the light scattered by the scattering structure to confine the light to remain in the optical path until it is absorbed.
    Type: Grant
    Filed: May 23, 2014
    Date of Patent: November 21, 2017
    Assignee: OMNIVISION TECHNOLOGIES, INC.
    Inventor: Eric A. G. Webster
  • Patent number: 9804384
    Abstract: The invention relates to a laser scanning system and associated method. In a disclosed arrangement the method comprises using a laser source to produce a laser beam; using a scanning module to scan the laser beam over the surface of a substrate; and using a redirecting unit at a position in a beam path of the laser beam between the scanning module and the substrate to control the direction of incidence of the laser beam onto the substrate, wherein: the laser beam is scanned over a predetermined region on the substrate in such a way that each portion of the region is exposed by the laser beam from a plurality of different directions of incidence.
    Type: Grant
    Filed: May 9, 2014
    Date of Patent: October 31, 2017
    Assignee: M-SOLV LIMITED
    Inventors: David Charles Milne, Philip Thomas Rumsby
  • Patent number: 9752980
    Abstract: Systems and methods for detecting a biological analyte are provided. The biological analyte can be, for example, cortisol. Detection can be achieved without external labels/mediators. Microfluidic systems can be incorporated into the optical sensor for enhanced point-of-care applications. The sensor can be used in a variety of low-power electronics for wearable applications.
    Type: Grant
    Filed: December 6, 2016
    Date of Patent: September 5, 2017
    Assignee: The Florida International University Board of Trustees
    Inventors: Nezih Pala, Raju Sinha, Phani Kiran Vabbina
  • Patent number: 9725759
    Abstract: The present invention is directed to a method of designing a plurality of capture oligonucleotide probes for use on a support to which complementary oligonucleotide probes will hybridize with little mismatch, where the plural capture oligonucleotide probes have melting temperatures within a narrow range. The present invention further relates to an oligonucleotide array comprising of a support with the plurality of oligonucleotide probes immobilized on the support, a method of using the support to detect single-base changes, insertions, deletions, or translocations in a plurality of target nucleotide sequences, and a kit for such detection, which includes the support on which the oligonucleotides have been immobilized.
    Type: Grant
    Filed: April 12, 2016
    Date of Patent: August 8, 2017
    Assignee: Cornell Research Foundation, Inc.
    Inventors: Francis Barany, Monib Zirvi, Norman P. Gerry, Reyna Favis, Richard Kliman
  • Patent number: 9726560
    Abstract: An optical sensor, an optical encoder, a torque detection apparatus, and an electric power steering apparatus less affected by fluctuations in the amount of detected light and with an improved resolution are provided. The optical sensor includes a first polarizing layer that splits incident light to light with a first polarization direction, a first photoreceiver that receives first polarized light split by the first polarizing layer, a second polarizing layer that splits the incident light to light with a second polarization direction, and a second photoreceiver that receives second polarized light split by the second polarizing layer. The first photoreceiver and the second photoreceiver are positioned alternatingly and spaced uniformly with each other.
    Type: Grant
    Filed: October 31, 2012
    Date of Patent: August 8, 2017
    Assignee: NSK LTD.
    Inventors: Toshiaki Oguchi, Kunihiko Sasao, Sumio Sugita
  • Patent number: 9720075
    Abstract: A system and method for remote object sensing which features a spatially polarization-inhomogeneous light beam that is directed on the remote object. A polarimetry receiver receives the light beam after it contacts the remote object. The changes in the spatially polarization-inhomogeneous light beam from contacting the remote object are a result of spatial features of the remote object. The polarimetry receiver is configured to measure the spatially inhomogeneous electric field of the light beam after it contacts the remote object and compute the changes in the spatially polarization-inhomogeneous light beam in order to detect spatial features of the remote object. The system obtains high-resolution, real-time information concerning important spatial features of the remote object.
    Type: Grant
    Filed: November 19, 2015
    Date of Patent: August 1, 2017
    Assignee: NEC Corporation
    Inventors: Giovanni Milione, Neda Cvijetic, Ting Wang
  • Patent number: 9705277
    Abstract: A gas detection system uses intracavity fiber laser absorption spectroscopy. The fiber laser is stabilized by a saturable absorber, and the sensitivity is enhanced by multiple circulations of amplified spontaneous emission light under threshold conditions, and multi-longitudinal mode oscillation of the laser.
    Type: Grant
    Filed: May 18, 2016
    Date of Patent: July 11, 2017
    Assignee: LAKEHEAD UNIVERSITY
    Inventor: Gautam Das
  • Patent number: 9690212
    Abstract: A method for controlling semiconductor production through use of a hybrid Focus Exposure Matrix (FEM) model includes taking measurements of a set of structures formed onto a substrate. The method further includes using a FEM model to determine focus and exposure conditions used to form the structure The model was created through use of measurements of structures formed on a substrate under varying focus and exposure conditions, the measurements being taken using both an optical measurement tool and a scanning electron microscope.
    Type: Grant
    Filed: May 24, 2013
    Date of Patent: June 27, 2017
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Wen-Zhan Zhou, Heng-Jen Lee, Yen-Liang Chen, Kai-Hsiung Chen, Chih-Ming Ke, Ho-Yung David Hwang
  • Patent number: 9677997
    Abstract: Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light source polarization axis generally perpendicular to the first light source polarization axis. Also, a first polarized light receiver having a first polarized light receiver polarization axis and configured to measure an intensity of light transmitted from the first light receiver polarizer and a second polarized light receiver having a second polarized light receiver polarization axis substantially perpendicular to the first light receiver polarization axis and configured to measure an intensity of light transmitted from the second light receiver polarizer, wherein the first and second light receiver polarization axes are generally +/?45 degrees relative to the first and second light source polarization axes.
    Type: Grant
    Filed: April 11, 2016
    Date of Patent: June 13, 2017
    Assignee: DEKA Products Limited Partnership
    Inventors: Jacob W. Scarpaci, Jason M. Sachs, Simon C. Helmore
  • Patent number: 9674459
    Abstract: An image processing system includes a brightness polarization superimposing unit. The brightness polarization superimposing unit superimposes, on a brightness image, polarization information of an image IMP that includes the polarization information, as a change in brightness of each pixel. The image processing system has a function of outputting an image obtained by superimposition by the brightness polarization superimposing unit as an output image IMO.
    Type: Grant
    Filed: May 8, 2014
    Date of Patent: June 6, 2017
    Assignee: RICOH COMPANY, LIMITED
    Inventors: Ryosuke Kasahara, Koichiro Nakamura
  • Patent number: 9664619
    Abstract: The present invention relates to systems and methods for the arrangement of droplets in pre-determined locations. Many applications require the collection of time-resolved data. Examples include the screening of cells based on their growth characteristics or the observation of enzymatic reactions. The present invention provides a tool and related techniques which addresses this need, and which can be used in many other situations. The invention provides, in one aspect, a tool that allows for stable storage and indexing of individual droplets. The invention can interface not only with microfluidic/microscale equipment, but with macroscopic equipment to allow for the easy injection of liquids and extraction of sample droplets, etc.
    Type: Grant
    Filed: April 28, 2009
    Date of Patent: May 30, 2017
    Assignee: President and Fellows of Harvard College
    Inventors: Christian Boehm, Amy Rowat, Sarah Koester, Jeremy Agresti, David A. Weitz
  • Patent number: 9652865
    Abstract: An optical method for characterizing a diffractive surface having a crystal grain structure, including the steps of: a) successively illuminating said surface with a plurality of light beams (Fi) having propagation directions inclined by a same angle ?; relative to the normal to the surface and of which the projections on the surface form azimuth angle ?{umlaut over (?)} that are different relative to a reference direction; b) acquiring an image of the surface corresponding to each of the light beams; and c) digitally processing images to obtain at least one item of information on at least one property of the surface chosen from: the grain structure, texture and level of ordering thereof. An optical head (TO) and apparatus for implementing such a method.
    Type: Grant
    Filed: March 26, 2014
    Date of Patent: May 16, 2017
    Assignee: Commissariat a l'Energie Atomique et aux Energies Alternatives
    Inventors: Olivier Dellea, Simon-Frédéric Desage, Pascal Fugier
  • Patent number: 9645011
    Abstract: In the channeled spectroscopic polarimetry, a measurement error of a parameter showing a spectropolarization characteristic of a sample is effectively removed, the error being generated by various variations in retardation of a retarder depending upon the state of the sample. With attention being focused that the retardation of the retarder may be kept constant by stabilization of an incident direction of light that transmits through the retarder, the retarder was arranged on the light source side with respect to the sample so as to effectively remove an influence relative to a measurement error, such as variations in direction of a light ray due to the sample.
    Type: Grant
    Filed: December 10, 2010
    Date of Patent: May 9, 2017
    Assignees: Omron Corporation, National University Corporation Hokkaido University
    Inventors: Hiroshi Okabe, Kenichi Matoba, Kazuhiko Oka
  • Patent number: 9626767
    Abstract: The surface normal information producing apparatus acquires, as captured images of an object, multiple first images in which light source positions relative to the object are mutually different and three or more second images in which polarization states are mutually different, and performs area division of a surface of the object depending on at least one of luminance information that changes corresponding to the light source positions acquired from the first images and polarization information acquired from the second images. The apparatus selects, for each divided area obtained by the area division, information to be used in production of surface normal information from information relating to change of the luminance information corresponding to the light source positions and the polarization information to produce the surface normal information.
    Type: Grant
    Filed: January 20, 2016
    Date of Patent: April 18, 2017
    Assignee: CANON KABUSHIKI KAISHA
    Inventors: Yoshiaki Ida, Chiaki Inoue, Yuichi Kusumi
  • Patent number: 9606419
    Abstract: An adaptive photo thermal lens comprising at least one cell, each cell provided with at least one photo absorbing particle, a thermo-optical material in thermal contact with the cells and at least one controllable light source for illuminating the photo absorbing particles, the light source having at least one spectral component which can be absorbed by the photo-absorbing particles and being controllable in wavelength and/or power and/or polarization.
    Type: Grant
    Filed: March 21, 2014
    Date of Patent: March 28, 2017
    Assignees: FUNDACIÓ INSTITUT DE CIÈNCIES FOTÒNIQUES, INSTITUCIÓ CATALANA DE RECERCA I ESTUDIS AVANÇATS
    Inventors: Jon Donner, Renaud Marty, Romain Quidant
  • Patent number: 9574992
    Abstract: Methods and systems for performing single wavelength ellipsometry (SWE) measurements with reduced measurement spot size are presented herein. In one aspect, a pupil stop is located at or near a pupil plane in the collection optical path to reduce sensitivity to target edge diffraction effects. In another aspect, a field stop is located at or near an image plane conjugate to the wafer plane in the collection optical path to reduce sensitivity to undesired optical-structural interactions. In another aspect, a linear polarizer acting on the input beam of the SWE system includes a thin, nanoparticle based polarizer element. The nanoparticle based polarizer element improves illumination beam quality and reduces astigmatism on the wafer plane. The pupil and field stops filter out unwanted light rays before reaching the detector. As a result, measurement spot size is reduced and tool-to-tool matching performance for small measurement targets is greatly enhanced.
    Type: Grant
    Filed: July 20, 2016
    Date of Patent: February 21, 2017
    Assignee: KLA-Tencor Corporation
    Inventors: Esen Salcin, Fuming Wang, Kevin Peterlinz, Hidong Kwak, Damon Kvamme, Uri Greenberg, Daniel R. Hennigan
  • Patent number: 9556510
    Abstract: A method of achieving precision registration in a roll to roll process by simultaneously depositing multiple inks onto a printing roll. One of these inks prints a pattern of fiducial marks onto a substrate while another ink prints a predetermined pattern on the same substrate such that the predetermined pattern bears a predictable spatial relationship to the pattern of fiducial marks. Consequently, even if the ink forming the predetermined pattern is invisible, or has such low contrast with the substrate that it is effectively invisible, or even has been dissolved away in a subsequent processing step, it is still possible to know where the predetermined pattern is by referring to the pattern of fiducial marks.
    Type: Grant
    Filed: March 21, 2016
    Date of Patent: January 31, 2017
    Assignee: 3M INNOVATIVE PROPERTIES COMPANY
    Inventors: Mikhail L. Pekurovsky, Ann M. Gilman, Daniel J. Theis
  • Patent number: 9557216
    Abstract: A laser-based spectroscopy system that combines a distance/proximity standoff sensor, a high-repetition rate laser spectroscopy system, and software with a decision-making algorithm embedded in a processing unit which in combination performs selective firing of the laser when the target object is within an interrogation zone. In a related embodiment, the system provides selective sorting of spectroscopic signals based on information from the standoff signal and from information contained in the spectral signals themselves. The laser emission can be actively controlled while keeping the laser firing, thereby preserving the thermal stability and hence the power of the laser; and the standoff sensor information and the spectral information can be combined to determine the proper relative weighting or importance of each piece of spectral information.
    Type: Grant
    Filed: July 31, 2014
    Date of Patent: January 31, 2017
    Assignee: TSI, INCORPORATED
    Inventors: Steven G. Buckley, Kenneth R. Farmer, Darrick L. Niccum
  • Patent number: 9507176
    Abstract: An object of the present invention is to improve uneven coloring by polarization color due to birefringence of a polarization optical article. Disclosed is a polarization optical article in which uneven coloring by polarization color has been improved, the polarization optical article being a multi-layered polarization optical article including at least a linear polarization functional portion, a retardation functional portion and a back-up resin portion, characterized in that the linear polarization functional portion, the retardation functional portion and the back-up resin portion are arranged in order from an objective side toward an ocular side. The linear polarization functional portion is, for example, a linear polarizer, the retardation functional portion is, for example, a retardation sheet, and the retardation functional portion has, for example, a retardation of 1,000 nm or more. The back-up resin is a polycarbonate resin, a polyamide resin or the like.
    Type: Grant
    Filed: March 30, 2012
    Date of Patent: November 29, 2016
    Assignee: YAMAMOTO KOGAKU CO., LTD.
    Inventors: Nobuyuki Kobuchi, Keishi Yoshikawa, Koichiro Oka
  • Patent number: 9496677
    Abstract: An apparatus for generating burst-mode laser includes: a trigger signal generator for generating a burst trigger signal; a first light source for generating a first optical signal in a form of pulse; a second light source for generating a second optical signal in the form of pulse; an optical switch for selecting between the first optical signal and the second optical signal according to the burst trigger signal to output the selected one; an optical amplifier for amplifying the optical signal output from the optical switch; and a wavelength tuner for tuning a wavelength of the optical signal amplified by the optical amplifier. An oscillation line-width and/or a polarization state of the first optical signal are different from an oscillation line-width and/or a polarization state of the second optical signal.
    Type: Grant
    Filed: December 27, 2013
    Date of Patent: November 15, 2016
    Assignee: GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventor: Woo Jin Shin
  • Patent number: 9488568
    Abstract: Provided is a polarization analysis apparatus that can quickly measure the polarization properties of a sample. The polarization analysis apparatus includes a light source configured to emit light in a predetermined wavelength region, a polarizer configured to transmit the light emitted from the light source, a spatial phase modulator configured to transmit the light from the sample, an analyzer configured to transmit the light that has passed through the spatial phase modulator, and an imaging spectrometer configured to receive the light that has passed through the analyzer. The spatial phase modulator is formed of a birefringent material, and is configured to have different phase differences at respective positions in a first direction in a plane orthogonal to an optical axis. The imaging spectrometer disperses the received light in a second direction that is different from the first direction in the plane orthogonal to the optical axis.
    Type: Grant
    Filed: December 12, 2014
    Date of Patent: November 8, 2016
    Assignee: Otsuka Electronics Co., Ltd.
    Inventors: Kazuhiro Sugita, Yusuke Yamazaki, Haruka Otsuka
  • Patent number: 9470639
    Abstract: Methods and systems for performing broadband spectroscopic metrology with reduced sensitivity to grating anomalies are presented herein. A reduction in sensitivity to grating anomalies is achieved by selecting a subset of available system parameter values for measurement analysis. The reduction in sensitivity to grating anomalies enables an optimization of any combination of precision, sensitivity, accuracy, system matching, and computational effort. These benefits are particularly evident in optical metrology systems having large ranges of available azimuth angle, angle of incidence, illumination wavelength, and illumination polarization. Predictions of grating anomalies are determined based on a measurement model that accurately represents the interaction between the measurement system and the periodic metrology target under measurement. A subset of available system parameter values is selected to reduce the impact of grating anomalies on measurement results.
    Type: Grant
    Filed: February 3, 2016
    Date of Patent: October 18, 2016
    Assignee: KLA-Tencor Corporation
    Inventors: Guorong V. Zhuang, Shankar Krishnan, Lanhua Wei, Walter Mieher, Paul Aoyagi
  • Patent number: 9459152
    Abstract: Measuring the polarimetric response of an optical instrument includes the steps of: emitting light along an optical axis; receiving the light through first and second polarizers; and detecting the light received through the first and second polarizers, using a filter and a detector. A first set of measurements is obtained by measuring the intensity of light received through the first and second polarizers. A second set of measurements is obtained by placing an optical instrument along the optical axis in lieu of the filter and detector; and measuring the intensity of light received through the first polarizer, after the second polarizer has been removed. A third set of measurements is obtained using the optical instrument but having the second polarizer replace the first polarizer. The optical instrument may be characterized using the first, second and third sets of measurements. The characterization is completed without having to know the extinction ratios and the transmittance parameters of the polarizers.
    Type: Grant
    Filed: April 25, 2016
    Date of Patent: October 4, 2016
    Assignee: Exelis, Inc.
    Inventor: Kenneth K. Ellis
  • Patent number: 9429514
    Abstract: Apparatus is described for determining the optical quality of an optical element, the optical element having proximal and distal end portions. The apparatus also includes at least one non-polarizing beam splitter; at least one polarizing beam splitter; at least a first detector operatively associated with the at least one non-polarizing beam splitter; at least a second detector operatively associated with the at least one polarizing beam splitter.
    Type: Grant
    Filed: September 11, 2015
    Date of Patent: August 30, 2016
    Assignee: LUMENIS LTD.
    Inventors: Arkady Khachaturov, Assaf Preiss, Tal Waisman, Haim Epshtein
  • Patent number: 9386207
    Abstract: It is possible to obtain the distance to an object with high precision, and it is also possible to obtain a high-quality image. Provided is an image-capturing apparatus including an image-capturing lens that focuses light from a subject; an aperture member disposed adjacent to the image-capturing lens; an image-capturing device that captures an image of the light focused by the image-capturing lens and passing through the aperture member; and a microlens array disposed between the image-capturing device and the image-capturing lens, with gaps therebetween in an optical-axis direction, wherein the aperture member includes at least one normal aperture portion having a substantially circular opening and at least two coded aperture portions having openings in a prescribed pattern.
    Type: Grant
    Filed: June 4, 2015
    Date of Patent: July 5, 2016
    Assignee: OLYMPUS CORPORATION
    Inventor: Masao Sambongi