Abstract: A receiver comprises: optical signal distributing means for distributing an optical signal transmitted to detect a detection target on a traveling path to two or more paths; a detection unit configured to detect a received light intensity of the optical signal at a first position where the received light intensity increases when the optical axis is shifted and at a second position where the received light intensity decreases; an intensity ratio calculation unit configured to calculate a ratio between the received light intensity at the first position and the second position based on the output of the detection unit; and a determination unit configured to determine whether or not there is an optical axis shift based on a change in the ratio of the received light intensity calculated by the intensity ratio calculation unit.

Abstract: An energy measuring apparatus according to one aspect of the present disclosure includes a first beam splitter, a second beam splitter, a third beam splitter, and a fourth beam splitter, which sequentially reflect part of a main beam and input the beam to an energy sensor. The first beam splitter, the second beam splitter, the third beam splitter, and the fourth beam splitter are each arranged to have such an incident angle and a folding direction of an optical path as to suppress a change in detection value of the energy sensor due to a change in incident angle and a change in polarization purity of the main beam.

Abstract: An optical environment oscillation detection system and an optical measurement method using the same are provided. This system includes a laser light source, a polarizer, a liquid crystal (LC) element, an analyzer, and an optical sensor arranged in sequence. A polarization axis of the polarizer and that of the analyzer are respectively parallel to a first and a second axis direction being perpendicular to each other. When there is no environmental disturbance, the alignment of LC cells in the LC element has an original pretilt angle, and the optical sensor senses a first scattered light intensity of the laser beam outputted from the analyzer. When there is environmental disturbance, the alignment of the LC cells has a changed pretilt angle in relative to the original pretilt angle, and the optical sensor senses a second scattered light intensity of the laser beam outputted from the analyzer.

Abstract: A method for inspecting a pillar-shaped honeycomb structure including the steps of: imaging a pattern of transmitted light from the second end face according to arrangement of the plugged portions of first cells and second cells, with a camera via a light diffusing film placed parallel to a second end face of the pillar-shaped honeycomb structure in a non-contact state with the second end face, which pattern is obtained by irradiating a first end face with light; and detecting a defective plugged portion(s) of the second cells based on an image of the pattern of transmitted light imaged with the camera.

Abstract: Some embodiments provide imaging polarimeter systems comprising: a polarization modulator system configured to modulate a polarization state of an incident beam at a repetition frequency, and outputting a polarized modulated beam; a polarizer positioned to produce an intensity modulated beam; and a detector system comprising: an optical sensor array; a digital read-out integrated circuit (DROIC); and a polarization state system; wherein the optical sensor array is optically aligned with at least a portion of the beam path such that the intensity modulated beam impinges on the sensor array; wherein the DROIC, for each pixel of the optical sensor array, is configured to separate, over time and within an integration frame rate, sets of photo-generated counts; and wherein the polarization state system is configured to identify a series of polarization states for each pixel based on the sets of photo-generated counts and according to the integration frame rate.

Abstract: An unmanned aerial vehicle (UAV) assessment and reporting system may conduct micro scans of a wide variety of property types. Scan data from any of a wide variety of sensor types may be compared with profile data using computer vision techniques to identify characteristics, defects, damage, construction materials, and the like. A hierarchal structure of the scan data may reduce the size of data sets used for property identification. For example, identifying a material type of a property may reduce or eliminate the need to compare scan data with specific data profiles for defects not related to the identified material type. Similarly, identifying a particular characteristic of a property may narrow down the data sets of possible material types. A rule set evaluator may evaluate matched profile data to determine adaptive actions to modify the navigation or scanning process of the UAV.

Abstract: An apparatus measures the transverse profile of vectorial optical field beams, including both the phase and the polarization spatial profile. The apparatus contains a polarization separation module, a weak perturbation module, and a detection module. Characterizing the transverse profile of vector fields provides an optical metrology tool for both fundamental studies of vectorial optical fields and a wide spectrum of applications, including microscopy, surveillance, imaging, communication, material processing, and laser trapping.

Abstract: In a general aspect, a structured optical beam with position-dependent polarizations is prepared for human observation. In some examples, an optics method includes processing an optical beam to produce a structured optical beam for human observation. Processing the optical beam includes receiving the optical beam from a laser source; attenuating the optical beam to an exposure irradiance level that is safe for direct viewing by a human eye; expanding the optical beam to a size configured for a field of view of the human eye; and preparing the optical beam with a position-dependent polarization profile. The structured optical beam, which has the position-dependent polarization profile, is directed towards an observation region for human observation.

Abstract: A device for detecting a sparkle effect of a transparent sample arranged in front of an image source, to which also a first polarizer having an optical axis of polarization is associated, wherein the detection device includes an imaging system, and wherein the transparent sample, the first polarizer and the imaging system are arranged along an optical path originated from the image source. The detection device includes a second polarizer, arranged between the transparent sample and the imaging system, having an optical axis of polarization directed at ninety degrees with respect to the optical axis of polarization of the first polarizer.

Abstract: A system to generate image representations includes a first objective that receives a first light beam emitted from a sample and a second objective that receives a second light beam emitted from the sample, where the first light beam and the second light beam have conjugate phase. The system also includes a first diffractive element to receive the first light beam and separate it into a first plurality of diffractive light beams that are spatially distinct, and a second diffractive element to receive the second light beam and separate it into a second plurality of diffractive light beams that are spatially distinct. The system further includes a detector that receives the first and second plurality of diffractive light beams. The first plurality of diffractive light beams and the second plurality of diffractive light beams are simultaneously directed and focused onto different portions of an image plane of the detector.

Abstract: We have invented an EUV spectroscopic polarimeter including a light receiving element, a first polarizing modulation element, a second polarizing modulation element, an energy splitting element and a light detecting and analyzing apparatus. The light receiving element is for receiving a target light. The first polarizing modulation element is rotatably connected to the light receiving element for generating a first polarized light. The second polarizing modulation element is rotatably connected to the first polarizing modulation element for generating a second polarized light. The energy splitting element receives the second polarized light so as to generate a modulated-polarization and energy-resolved light.

Abstract: An illumination arrangement for a microscope includes an illumination input configured to inject an illumination beam bundle and an illumination output configured to output at least two partial beam bundles generated from the illumination beam bundle. At least one diffractive optical element is configured to split the illumination beam bundle into the at least two partial beam bundles that propagate along partial beam paths, and is configured to effect a relative change in respective propagation directions of the at least two partial beam bundles with respect to one another, such that the at least two partial beam bundles output by the illumination arrangement are non-collinear with respect to one another at the illumination output.

Abstract: A polarization property image measurement device includes: a first radiation unit that radiates light beams in different polarization conditions onto a target object after subjecting the light beams to intensity modulation at frequencies different from one another; a light receiving unit including first photoelectric conversion units that photoelectrically convert the light beams having been radiated from the first radiation unit and scattered at the target object in correspondence to each of the different polarization conditions, and second photoelectric conversion units that photoelectrically convert visible light from the target object; and a processor that detects signals individually output from the first photoelectric conversion units at the different frequencies and differentiates each signal from other signals so as to determine an origin of the signal as one of the light beams; and creates an image of the target object based upon signals individually output from the second photoelectric conversion un

Abstract: A depth map generation unit generates a depth map from images obtained by picking up a subject at a plurality of viewpoint positions by an image pickup unit. On the basis of the depth map generated by the depth map generation unit, an alignment unit aligns polarized images obtained by the image pickup unit picking up the subject at the plurality of viewpoint positions through polarizing filters in different polarization direction at the different viewpoint positions. A polarization characteristic acquisition unit acquires a polarization characteristic of the subject from a desired viewpoint position by using the polarized images aligned by the alignment unit to obtain the high-precision polarization characteristic with little degradation in temporal resolution and spatial resolution. It becomes possible to acquire the polarization characteristic of the subject at the desired viewpoint position.

Abstract: A method of characterising particles in a sample, comprising: obtaining a scattering measurement comprising a time series of measurements of scattered light from a detector, the scattered light produced by the interaction of an illuminating light beam with the sample; producing a corrected scattering measurement, comprising compensating for scattering contributions from contaminants by reducing a scattering intensity in at least some time periods of the scattering measurement; determining a particle characteristic from the corrected scattering measurement.

Abstract: An optical measurement device includes: a light source, which emits light; a light reception portion, which detects a light reception amount of reflected light reflected on a target; a measurement portion, which measures a distance from the optical measurement device to the target based on the light reception amount of the reflected light; and a detection portion, which detects a portion of the target in which a light reception amount per unit time of the reflected light is smaller than a threshold value.

Abstract: The present disclosure relates to a confocal imaging apparatus using a chromatic aberration lens, which is capable of quickly implementing multiple tomographic images by making it possible to quickly scan the entire object without moving the light source or the object. Since the present invention is configured to generate a three-dimensional image using multiple tomographic images by a chromatic aberration lens without moving the light source or the object up and down, there is an effect of remarkably shortening the time it takes to implement the multiple tomographic images.

Abstract: The invention relates to methods and devices to identify an infection via light scatter from a tissue surface.

Abstract: Methods and systems for performing spectroscopic measurements of semiconductor structures including ultraviolet, visible, and infrared wavelengths greater than two micrometers are presented herein. A spectroscopic measurement system includes a combined illumination source including a first illumination source that generates ultraviolet, visible, and near infrared wavelengths (wavelengths less than two micrometers) and a second illumination source that generates mid infrared and long infrared wavelengths (wavelengths of two micrometers and greater). Furthermore, the spectroscopic measurement system includes one or more measurement channels spanning the range of illumination wavelengths employed to perform measurements of semiconductor structures. In some embodiments, the one or more measurement channels simultaneously measure the sample throughout the wavelength range. In some other embodiments, the one or more measurement channels sequentially measure the sample throughout the wavelength range.

Abstract: The invention relates to a device and a method for characterizing a microlithographic mask. A device according to the invention has an illumination optical unit for illuminating structures of a mask intended for use in a lithography process in a microlithographic projection exposure apparatus, a detector unit, and an evaluation unit for evaluating the data recorded by the detector unit, wherein the detector unit is configured for the spatially resolved determination of both the intensity and the polarization state of the respectively impinging light emanating from the mask.

Abstract: Grating-coupled surface plasmon resonance response of a calibration grating is used to calibrate the azimuth angle offset between a sample on the stage and the plane of incidence (POI) of the optical system of an optical metrology device. The calibration grating is configured to produce grating-coupled surface plasmon resonance in response to the optical characteristics of the optical metrology device. The calibration grating is coupled to the stage and positioned at a known azimuth angle with respect to the optical channel of the optical metrology device while the grating-coupled surface plasmon resonance response of the calibration grating is measured. The azimuth angle between an orientation of the calibration grating and the POI of the optical system is determined based on the grating-coupled surface plasmon resonance response. The determined azimuth angle may then be used to correct for an azimuth angle offset between the sample and the POI.

Abstract: A small angle laser scatterometer with a temperature-pressure-controllable sample cell and a characterization method, the scatterometer formed by sequentially arranging a laser source, an adjustable attenuator, a beam expanding lens, a polarizer, the temperature-pressure-controllable sample cell, an analyzer, a transmission-type projection screen and an image acquisition device. The temperature-pressure-controllable sample cell is composed of a visual autoclave, a temperature control component, a rapid cooling component and a pressure control component. An evolution process of microstructures of polymer materials in specific atmosphere and rapid temperature and pressure changing environments on a scale of 0.5 ?m to 10 ?m.

Abstract: In a method of testing an interconnection substrate, a blocking condition of a reference light reflected from a probe having an intrinsic optical characteristic may be set. An electric field emitted from a test interconnection substrate having a plurality of circuits may change the intrinsic optical characteristics of the probe into test optical characteristics. Light may be irradiated to the probe having the test optical characteristics. The reference light reflected from the probe having the test optical characteristic may be blocked in accordance with the blocking condition. The remaining reflected light that may be due to an abnormal circuit may be detected.

Abstract: An imaging system comprises an optical sensor array with a plurality of sensor elements, an objective lens, an active polarization filter, and associated logic. The objective lens is configured to direct light from a field of view onto the plurality of sensor elements. Switchable electronically between first and second operational states, the active polarization filter is positioned to filter the light en route to the optical sensor array. The active polarization filter provides unequal relative attenuance, in the first versus the second operational state, of nonparallel polarization components of the light. The logic is configured to switch the active polarization filter from the first operational state to the second operational state, and to compare a light-intensity response of the plurality of sensor elements in the first operational state to the light-intensity response of the plurality of sensor elements in the second operational state.

Abstract: An optical filter including a polarizer and a visible light blocking filter is described. The polarizer is configured to transmit at least 60 percent of light in a first infrared wavelength range that is incident on the polarizer at normal incidence in a first polarization state, to transmit less than 30 percent of light in a second infrared wavelength that is incident on the polarizer at normal incidence in a second polarization state orthogonal to the first polarization state, and to transmit less than 30 percent of light in a third infrared wavelength range that is incident on the polarizer with a 50 degree angle of incidence in the second polarization state. The visible light blocking filter configured to transmit at least 60 percent of light in the first infrared wavelength range at normal incidence in the first polarization state.

Abstract: The present invention discloses a photo-alignment apparatus that realizes a desirable distribution through a single exposure and a method of manufacturing an optical element. The photo-alignment apparatus comprises a light source, a linear polarization film, a pixelated electronic-control phase retarder, and a phase retardation plate; the light source is used to provide light for a exposure; the linear polarization film is configured to convert the light emitted by the light source into a linearly-polarized light having a polarization direction parallel to the direction of the transmission axis of the linear polarization film; the pixelated electronic-control phase retarder is configured to generate phase retardations distributed in a desirable pattern; and the phase retardation plate is used to generate a non-pixelated phase retardation.

Abstract: A navigation control system for an autonomous vehicle comprises a transmitter and an autonomous vehicle. The transmitter comprises an emitter for emitting at least one signal, a power source for powering the emitter, a device for capturing wireless energy to charge the power source, and a printed circuit board for converting the captured wireless energy to a form for charging the power source. The autonomous vehicle operates within a working area and comprises a receiver for detecting the at least one signal emitted by the emitter, and a processor for determining a relative location of the autonomous vehicle within the working area based on the signal emitted by the emitter.

Abstract: Disclosed is a retroreflector-based sensor system for optical characterization of a sample, having a transmitter for irradiating the sample, a retroflector positioned behind the sample, the transmitter, the sample, and the retroreflector being positioned such that radiation reflected back from the retroreflector is again incident on the sample and is reflected back from the latter in the direction towards the transmitter, and a receiver which is positioned in the receiving beam path such that it detects radiation reflected back from the retroreflector, incident again on the sample and reflected back from the latter, in the direction towards the transmitter.

Abstract: The invention concerns an optoelectronic chip including a pair of optical inputs having a same bandwidth, and each being adapted to a different polarization, at least one photonic circuit to be tested, and an optical coupling device configured to couple the two inputs to the circuit to be tested.

Abstract: Optical polarization-based devices and techniques are provided to enable low cost construction and easy signal processing to measure the light frequency via measurements of signals associated with a delay between the two orthogonal polarizations after passing through a DGD element and the retardation value of the DGD element without directly measuring the optical frequency. The optical detection may be designed in various configurations. In particular, for example, the optical detection may split the optical output of the DGD into two optical beams with two different optical detectors so that the final frequency information can be deducted into a pair of sine and cosine functions, such as a pair of sine and cosine functions of measured optical signal levels and the retardation value of the DGD element.

Abstract: An optical characteristic evaluation method evaluates unevenness of an optical characteristic in an optical film based on analysis of a polarized state of light transmitting through an optical film and an analyzer. The method includes the following, measuring a phase difference and an orientation angle in a plurality of positions; and quantifying and evaluating the unevenness of the optical characteristic based on a parameter of a vector of output light calculated by a formula 1 using a vector showing a polarized state of input light and a matrix showing a polarizing characteristic of the optical film and the analyzer. The formula 1 is as follows, formula 1: F2=M×F1, F1: Stokes vector or Jones vector of input light, F2: Stokes vector or Jones vector of output light, M: Mueller matrix or Jones matrix of the optical film as the evaluation target and the analyzer.

Abstract: The precision TFF POSA is formed by pressing a TFF glass rod array into a top surface of a master glass block to flatten the otherwise curved TFFs formed using conventional TFF deposition processes on glass. The TFF glass rod array is secured to the master glass block with a securing material to form a fabrication structure, which is singulated to form precision TFF POSAs having TFF members with flat TFFs and long TFF member long axes. A fiber interface device is arranged at a back surface of the TFF POSA. Other fiber interface devices having device axes are arranged proximate the TFF members. The device axes are parallel to the TFF member long axes to form a WDM system with a parallel configuration. In this configuration, there is one positionally adjustable fiber interface device for each wavelength channel, which allows for optimizing WDM optical communication in Mux and DeMux directions.

Abstract: In a polarimeter, a polarization modulator changes a polarization phase of an output optical pulse with a modulation function that varies in time over the duration of the optical pulse. A static polarization state analyzer, which includes a one or more static polarization component analyzers and detectors, receives the modulated optical pulse after interaction with a target medium and provides time varying intensities of the polarization components of the received pulse. A signal processing module determines a polarization property of the target medium, such as a Mueller matrix, dependent upon time varied intensities over the duration of the received optical pulse. A time-division optical multiplexer may be used to combine the outputs from multiple static polarization component analyzers to form a single time-multiplexed signal comprising a plurality of optical pulses that are separated in time and passed to a single photo-detector.

Abstract: A modular system for organic sample analysis is disclosed which includes a sample stage including a support platform and a motorized positioning mechanism mounted on the support platform, and a sample holder mounted on the motorized positioning mechanism upon which a sample is placed. A probe support rack is mounted on the support platform and two or more bio-imaging probes mounted on the probe support and arranged in a pre-defined geometry with respect to each other, and at least one bio-imaging probe has a field of view independent of all other bio-imaging probes. The system includes a computer controller connected to the motorized positioning mechanism and the two or more bio-imaging probes. The computer is programmed for controlling motorized positioning mechanism to move the sample holder having the sample located thereon to positions in the field of view of each bio-imaging probe where the sample can be analyzed individually by each of the bio-imaging probes.

Abstract: An image processing apparatus includes an information obtaining unit configured to obtain three-dimensional polarization sensitive tomographic information and three-dimensional motion contrast information about a subject based on tomographic signals of lights having different polarizations, the lights being obtained by splitting a combined light obtained by combining a returned light from the subject illuminated with a measurement light with a reference light corresponding to the measurement light, an obtaining unit configured to obtain a lesion region of the subject using the three-dimensional polarization sensitive tomographic information, and an image generation unit configured to generate an image in which the lesion region is superimposed on a motion contrast image generated using the three-dimensional motion contrast information.

Abstract: Techniques that facilitate integrated circuit defect detection using pattern images are provided. In one example, a system generates an equalized pattern image of a pattern image associated with a module under test based on an adaptive contrast equalization technique. The system also identifies a first set of features of the equalized pattern image based on a feature point detection technique and aligns the equalized pattern image with a reference pattern image based on the first set of features and a second set of features of the reference pattern image. Furthermore, the system compares a first set of light intensities of the equalized pattern image to a second set of light intensities of the reference pattern image to identify one or more regions of the module under test that satisfy a defined criterion associated with a defect for the module under test.

Abstract: The present invention discloses a high temporal resolution Mueller matrix elliptical polarization measuring device and method. In the incident light path, four polarization modulation channels are used to split and modulate a pulse laser beam into four polarized beams in independent polarization states. Due to different light path differences, the pulse beams have a time interval of several nanoseconds, and thus four pulse laser beams are successively irradiated on the surface of the sample. In the reflected light path, six channel polarization detection modules are used to synchronously measure the Stokes vectors of the reflected beams on the sample surface. By using known incident and reflected Stokes vectors of the four pulse beams, linear equations can be solved to obtain the Mueller matrix of the sample.

Abstract: A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.

Abstract: The polarization acquisition apparatus is configured to allow an image capturing system including an interchangeable lens and an image capturing apparatus to perform image capturing using polarized light. The polarization acquisition apparatus includes a variable polarization axis element in which a direction of its polarization transmission axis is variable, a driver configured to operate the variable polarization axis element so as to change the direction of the polarization transmission axis, a first mount to which the image capturing apparatus is detachably attachable, and a second mount to which the interchangeable lens is detachably attachable. The driver is configured to operate the variable polarization axis element so as to change the direction of the polarization transmission axis to at least three directions when the image capturing is performed multiple times.

Abstract: A thin film analysis apparatus and method for a curved surface is disclosed. The apparatus includes an illuminator, a sample, an imaging group, one or more beamsplitters, optional focusing groups, polarization analyzers, detectors and optional display and analysis systems. The image series are recorded, preferably substantially synchronously. The system can be calibrated by as few as one reference phantom that has the same or substantially similar geometry as the sample under test. Based on calibration, a lookup table of the effective reflectance can be created, which is proportional to the portion of the light that reaches the detectors, or the mutual subtraction of the effective reflectance values of all possible combinations of the unknown optical parameters within certain search ranges of the sample. The experimentally measured results are compared with the lookup table, and optical properties, for example, the thicknesses and refractive indices of the thin film can be determined.

Abstract: In some embodiments, a system for measuring surface features may include a pattern projector, at least one digital imaging device, and an image processing device. The pattern projector may project, during use, a pattern of light on a surface of an object. In some embodiments, the pattern projector moves, during use, the pattern of light along the surface of the object. In some embodiments, the pattern projector moves the pattern of light in response to electronic control signals. At least one of the digital imaging devices may record, during use, at least one image of the projected pattern of light. The image processing device which, during use, converts projected patterns of light recorded on at least one of the images to three-dimensional data points representing a surface geometry of the object using relative positions and relative angles between the at least one imaging device and the pattern projector.

Abstract: An optical element is disclosed. The optical element includes a plurality of layers. The plurality of layers includes a notch filter array that has a plurality of notch filter elements. Each notch filter element is configured to filter out energy within at least one wavelength band of interest. The plurality of layers further includes a polarization-responsive grid array having a plurality of polarization elements and includes a microlens array having a plurality of microlens elements. Each microlens element is configured to image a portion of a scene onto an image plane.

Abstract: A measurement apparatus measures an optical characteristic with high robustness and with a simple configuration. A measurement apparatus of the present invention measures optical characteristic of a sample. The measurement apparatus includes an irradiation unit to irradiate the sample with light emitted from a light source and transmitted through an opening member, an imaging unit to detect an image formed by the light irradiated by the irradiation unit and reflected by the sample, and a processing unit to obtain the optical characteristic of the sample on the basis of an output of the imaging unit. The opening member comprises plural openings through which the light emitted from the light source is transmitted, the irradiation unit irradiates the sample with the light transmitted through the plurality of openings, and the imaging unit detects an image formed by the light transmitted through the plurality of openings and reflected by the sample.

Abstract: An inspection apparatus includes a tone correction unit, a dimensional error acquisition unit, and a map generating unit. The correction unit acquires a transmissivity distribution for transmission of light from a light source through an incident surface of an inspection target based on the optical image data to correct a tone of the optical image data so as to eliminate variations in contrast of the optical image data which correspond to the transmissivity distribution. The acquisition unit determines a dimension of the pattern based on the corrected optical image data to acquire a dimensional error that is a difference between the dimension of the pattern and a design value for the pattern. The generating unit generates a map in which the dimensional error is associated with the position coordinates of the table on the inspection target based on the position coordinates and the dimensional error.

Abstract: A display inspection device includes a light source, a light condenser unit, a light splitter unit, and a photoelectric converter that are arranged, in sequence, externally of a display-to-be-inspected. The light condenser unit provides constant-frequency excitement to the inspection light beam so as to make constant-frequency variation of focus of the inspection light beam. The range of variation of the focus of the inspection light beam always covers a focus point on a surface of the display-to-be-inspected so that the inspection device possess an active focusing function, allowing a surface configuration, reflectivity, or defect of the display-to-be-inspected to be reflected in variation of intensity of a reflected light beam and also allowing the focusing point of the inspection light beam not to be constrained to focus on the surface of an objected-to-be-inspected thereby greatly increasing an inspection range of the device and improving inspection efficiency.

Abstract: Disclosed are methods for the free solution measurement of molecular interactions by refractive index sensing other than backscattering interferometry. The disclosed methods can have very low detection limits and/or very low sample volume requirements. Also disclosed are various biosensor applications of the disclosed techniques. This abstract is intended as a scanning tool for purposes of searching in the particular art and is not intended to be limiting of the present invention.

Abstract: A polarization property image measurement device includes: a first radiation unit that radiates light beams in different polarization conditions onto a target object after subjecting the light beams to intensity modulation at frequencies different from one another; a light receiving unit including first photoelectric conversion units that photoelectrically convert the light beams having been radiated from the first radiation unit and scattered at the target object in correspondence to each of the different polarization conditions, and second photoelectric conversion units that photoelectrically convert visible light from the target object; and a processor that detects signals individually output from the first photoelectric conversion units at the different frequencies and differentiates each signal from other signals so as to determine an origin of the signal as one of the light beams; and creates an image of the target object based upon signals individually output from the second photoelectric conversion un

Abstract: Methods and systems for highly-sensitive label-free multiple analyte sensing, biosensing, and diagnostic assay are disclosed. The systems comprise an on-chip integrated two-dimensional photonic crystal sensor chip. The invention provides modulation methods, wavelength modulation and intensity modulation, to monitor the resonance mode shift of the photonic crystal microarray device and further provides methods and systems that enable detection and identification of multiple species to be performed simultaneously with one two-dimensional photonic crystal sensor chip device for high throughput chemical sensing, biosensing, and medical diagnostics. Other embodiments are described and claimed.

Abstract: The low-sensitivity polarization characteristic model calculation unit 31 of the polarized image processing unit 30-1 calculates the low-sensitivity polarization characteristic model on the basis of the low-sensitivity polarized image in the plurality of polarization directions that is generated by the low-sensitivity imaging unit 21. The non-saturation polarized image extraction unit 32 extracts an image in a polarization direction in which saturation has not occurred from the high-sensitivity polarized image in the plurality of polarization directions that is generated by the high-sensitivity imaging unit 22. The high-sensitivity component acquisition unit 33-1 calculates a high-sensitivity polarization characteristic model having the phase component identical to the low-sensitivity polarization characteristic model from an image in a plurality of polarization directions in which saturation has not occurred in the high-sensitivity polarized image.

Abstract: The disclosure is related to a sensor module, a sensor unit and a system for recognizing surrounding objects and defining an environment. The sensor module is installed in a sensor unit. The sensor module includes an optical element guiding the lights from the objects surrounding the sensor unit and to an image sensor, and the image sensor is used to sense the lights from the objects. The light can be directly from a light source inside the surrounding object or reflected by the object surface. The objects can be identified according to optical features obtained by the image sensor from surfaces of the objects. When the image sensor receives the two lights, guided by the optical element, and reads optical features being regarded as the unique IDs to identify the objects respectively. Therefore, an environment around the sensor unit can be defined.