Abstract: The present invention discloses a method for determining an effective sound velocity in the deep sea. The method is applied to an apparatus for determining an effective sound velocity in the deep sea having a transmission point, a receiving point, and an underwater mobile carrier. The transmission point is installed on the sea surface such that the depth of the transmission point is unchanged. The receiving point is installed on the underwater mobile carrier such that the depth of the receiving point changes with movement of the underwater mobile carrier. The underwater mobile carrier can measure a sound velocity profile between the transmission point and the receiving point and a horizontal distance between the transmission point and the receiving point.

Abstract: An optical imaging system for imaging a target during a medical procedure is disclosed. The optical imaging system includes: a first camera for capturing a first image of the target; a second wide-field camera for capturing a second image of the target; at least one path folding mirror disposed in an optical path between the target and a lens of the second camera; and a processing unit for receiving the first image and the second image, the processor being configured to: apply an image transform to one of the first image and the second wide-field image; and combine the transformed image with the other one of the images to produce a stereoscopic image of the target.

Abstract: An optical imaging system for imaging a target during a medical procedure is disclosed. The optical imaging system includes: a first camera for capturing a first image of the target; a second wide-field camera for capturing a second image of the target; at least one path folding mirror disposed in an optical path between the target and a lens of the second camera; and a processing unit for receiving the first image and the second image, the processor being configured to: apply an image transform to one of the first image and the second wide-field image; and combine the transformed image with the other one of the images to produce a stereoscopic image of the target.

Abstract: In accordance with one embodiment of the present disclosure, a difference is detected between a first image and a second image. The second image can include at least a portion of the first image reflected from a display panel and light from an object passing through the display panel.

Abstract: A video calibration device comprising an elongated image tube having a length, a first opening at one end of the image tube and a second opening at the opposite end of the image tube. The device includes an elongated sensor tube having a length, a first opening at one end of the sensor tube and a second opening at the opposite end of the sensor tube. The first opening of the sensor tube is adapted to support a video calibration sensor. A video calibration sensor is disposed in the first opening of the sensor tube. The sensor tube is sealingly secured to the image tube at an angle whereby the second opening of the sensor tube and the second opening of the image tube are substantially juxtaposed.

Abstract: An optical comparator arranged for rear projection onto a viewing screen combines an optical projector that projects an optical image of a test part under inspection onto the viewing screen with a video projector that projects an optical image of a pixilated template pattern containing illustrated specifications of the test part onto the same viewing screen. The images of the test part and the pixilated template pattern are projected concurrently onto the viewing screen for visually comparing the form of the test part against its specified form.

Abstract: An optical comparator arranged for rear projection onto a viewing screen combines an optical projector that projects an optical image of a test part under inspection onto the viewing screen with a video projector that projects an optical image of a pixilated template pattern containing illustrated specifications of the test part onto the same viewing screen. The images of the test part and the pixilated template pattern are projected concurrently onto the viewing screen for visually comparing the form of the test part against its specified form.

Abstract: A test pattern for evaluating L/R crosstalk extinction ratio in a stereoscopic 3D system has a strip of one characteristic—polarization, white, color—associated with a plurality of calibrated chips in a left eye image and a strip of a contrasting characteristic—orthogonal polarization, white, contrasting color—associated with a plurality of calibrated chips in a right eye image such that, when the two images are superimposed, the strip of one image overlays the calibrated chips of the other image. By alternately occluding one eye while observing the superimposed image with the other eye, a portion of the strip of the occluded eye image appears across the chips of the viewing eye image when there is crosstalk. The extinction ratio value associated with the chip of the viewing eye image that most closely matches the portion of the strip from the occluded eye image is an estimate of the L/R crosstalk.

Abstract: An optical comparator arranged for rear projection onto a viewing screen combines an optical projector that projects an optical image of a test part under inspection onto the viewing screen with a video projector that projects an optical image of a pixilated template pattern containing illustrated specifications of the test part onto the same viewing screen. The images of the test part and the pixilated template pattern are projected concurrently onto the viewing screen for visually comparing the form of the test part against its specified form.

Abstract: A substrate inspection method includes forming a conductive thin film on a surface of an inspection target substrate with a pattern formed thereon, generating an electron beam and irradiating the substrate having the thin film formed thereon with the electron beam, detecting at least any of secondary electrons, reflected electrons and backscattered electrons released from the surface of the substrate and outputting signals constituting an inspection image, and selecting at least any of a material, a film thickness and a configuration for the thin film, or at least any of a material, a film thickness and a configuration for the thin film and an irradiation condition with the electron beam according to an arbitrary inspection image characteristic so that an inspection image according to an inspection purpose can be obtained.

Abstract: A method of using an in-situ aerial image sensor array is disclosed to separate and remove the focal plane variations caused by the image sensor array non-flatness and/or by the exposure tool by collecting sensor image data at various nominal focal planes and by determining best focus at each sampling location by analysis of the through-focus data. In various embodiments, the method provides accurate image data at best focus anywhere in the exposure field, image data covering an exposure-dose based process window area, and a map of effective focal plane distortions. The focus map can be separated into contributions from the exposure tool and contributions due to topography of the image sensor array by suitable calibration or self-calibration procedures. The basic method enables a wide range of applications, including for example qualification testing, process monitoring, and process control by deriving optimum process corrections from analysis of the image sensor data.

Abstract: A method and apparatus for efficiently executing two types of measurements with an optical measuring device and a scanning electron microscope are provided. For example, the method and apparatus may execute the following steps: calculating an average of the dimensional values of a plurality of scanned feature objects; and calculating an offset of a dimensional value on the basis of a difference between the calculated average value and the dimensional value of the feature object obtained when the light is irradiated. The offset between measurement values between the optical measuring device and the scanning electron microscope can be determined precisely.

Abstract: Comprises the following phases: in first phase a vehicle (1) is facing an obstacle (4), screen or wall defining a distance, in second phase is determined the type of headlamp or lighting projector and its space position in relation to the obstacle, screen or wall, automated or hand operated, in third phase the headlamp or lighting projector of the vehicle is turn on and its beam (3) is projected in the obstacle, screen or wall, defining a real drawing (5) of the beam, in fourth phase, according to the space position, the distance to the wall, screen or obstacle and the type of headlamp or lighting projector a processor defines a theoretical beam, and in fifth phase a first artificial viewer (10) takes data of the real drawing and transfers them to the processor which compares them with those of the theoretical drawing.

Abstract: In order to shorten the time required to change or correct a mask pattern over a mask, light-shielding patterns formed of a resist film for integrated circuit pattern transfer are partly provided over a mask substrate constituting a photomask in addition to light-shielding patterns formed of a metal for the integrated circuit pattern transfer.

Abstract: Disclosed is a print quality test structure for devices manufactured by lithography. The test structure allows for visual inspection of the print quality of the device. The test structure decouples the effects of overexposure, underexposure and focus so that corrections can be made for future device manufacturing. By visually inspecting each device during lithography, devices of poor quality can be reworked, and costly testing on all devices can be avoided through device screening.

Abstract: The present invention relates to a comparator of image. In a preferred aspect, the comparator of the invention includes an electronic image display, which shows a picture image for reference, a splitter mirror with a mirror forming an optical path, and making comparison between reference image and image of pattern selected, both images are projected to the same optical plan on the optical path, through overlapping process to achieve precise comparison.

Abstract: A test slide for the calibration, characterization, standardization, use and study of photon and electron microscopes. The slide is created by forming patterns with specific types of geometries on suitable substrates and these slides provide a standard for comparison of image forming capability of any type of microscope imaging system including, without limitation, light, UV, and X-ray photon microscopical imaging systems operating in transmission or reflection modes, and other microscope techniques. Microscopists can employ one of these slides to compare images of the slide which have been produced by the microscope system under consideration with a known, accurate, image of the slide to better understand the fidelity and accuracy of the microscope system under consideration. The test patterns can also comprise reference images which can be images created by a graphic artist or the like or which can be actual images of samples, these images being either two dimensional or three dimensional.

Abstract: An apparatus for determining the profile of an object provides a sensor having at least one light source which projects a sheet of light that is intersected by the object, whereby a stripe of points on the object are illuminated. The light source projects the sheet from multiple angles, so that the resulting stripe represents a continuous profile. The profile is collectively viewed by at least two optical detectors, which each have a different view than the others and provide an output signal representing its particular view of the profile. The output signals are received by an image processor, which digitizes the signals, provides filtering, and identifies (extracts) the points in each view that represent the profile. The image processor uses a predetermined set of calibration parameters to transform the coordinates of the extracted points to corresponding coordinates in a common reference system that collectively represent the profile of the object.

Abstract: The invention provides a unique method and apparatus for detecting defects in an electronic device. In one preferred embodiment, the electronic device is a semiconductor integrated circuit (IC), particularly one of a plurality of IC dies fabricated on a wafer of silicon or other semiconductor material. The defect detection operation is effectuated by a unique combination of critical dimension measurement and pattern defect inspection techniques. During the initial scan of the surface of the wafer, in an attempt to locate the appropriate area for a critical dimension (CD) feature or element that is to be measured, a “best fit” comparison is made between a reference image and scanned images. The critical dimension measurements are conducted on a “best fit” image. In addition, a “worst fit” comparison is made between the reference and scanned images. A “worst fit” determination represents pattern distortions or defects in the ICs under evaluation.

Abstract: A laser positioner is located at a survey base point for projecting a geodetic design pattern depicting design working points onto a working face remote from the base point by use of a laser pattern projector, upon surveying an object route by use of a laser surveying unit. In tunneling operations for example, the design pattern is formed on the working face, so that boring of the holes for charging explosives in the working face can be performed without paint-marking on the working face.

Abstract: In a microscope viewing apparatus for viewing a specimen image, the provision of microscope viewing apparatus including a microscope eyepiece lens for focusing on a focusing plane at or above a specimen support panel and coincident with a desired viewing plane of a real microscopic specimen positioned therein, arranged to generate a specimen image, and the further provision of separate overlay pattern image-generating apparatus arranged to optically effectively generate a desired type, shape and size of optical overlay pattern and image, and the further provision of optical-image-mixing and combining apparatus arranged to receive the specimen image and the optical overlay pattern image and to effectively mix and combine same into desired selectively optically alignedly effectively centered and superimposed relationship to form a resultant effectively visually composite image output for effective viewing by the microscope viewing apparatus.

Abstract: Parts in a desired attitude are selected, by memorizing the standard shape signal of a certain part and comparing the shape signals of supplied parts on the parts feeder with the memorized shape signal. A plurality of light emitting elements provided on the track of the parts feeder detect the shape signal of the parts serially.

Abstract: A fingerprint comparator includes a projection system including a source of light and a carrier for mounting samples of prints to be compared with an optical system for projecting the images of the samples side-by-side on a screen with one image reverted and the screen divided with the images being movable toward and from the dividing line appearing to merge and emerge from the central dividing line for a precise adjacent comparison at the dividing line. An alternate embodiment uses a split video screen and provides for remote transmission of either the record or sample print.

Abstract: Apparatus for image subtraction in order to extract non-common information from two light images comprises a TV camera tube including a photosensitive coating on its inner face and a grating on its outer face spaced from the photosensitive coating by the thickness of the tube; projectors for projecting the two light images simultaneously, from slightly different angles, onto the photosensitive coating via the grating such that the shadow of the grating interlaces the two light images on the photosensitive coating; and a scanner for electronically scanning the interlaced images on the photosensitive coating to produce a video output, and for processing same to select only the image information which is non-common to the two optical images.

Abstract: Apparatus for determining the diameter of corrective lenses adaptable to spectacle frames. The apparatus comprises at least a stand or structure provided with (a) a symmetrical linear measuring scale, (b) guiding means parallel to the said measuring scale, and (c) an underlying surface, a resting support and centering means all cooperating to hold a spectacle frame in a predetermined position. The apparatus further comprises at least one carriage sliding on the said guiding means and comprising a first part provided with a planar receiving surface adapted to receive removable plates provided with reference marks and lines representing at least the outline of one or more types of uncut corrective lenses, and a second part equipped with a semi-reflecting mirror placed in the bisecting plane of the dihedron angle defined by the said receiving surface and the said reference plane.

Abstract: An optical comparator which provides confronting images of a pair of similar objects being compared, the images having a pronounced 3-D effect when viewed with a single eye. Images of the two objects are projected in separate optical paths and are greatly enlarged, the resultant composite image showing comparable portions of the two objects side-by-side with a sharp dividing line. The two objects are mounted in related alignment on a common holder and, when the holder is moved, the objects are scanned across their faces with the images converging toward or diverging from the dividing line, depending on the direction of motion of the holder.

Abstract: Disclosed are a method and apparatus for verifying an identification card or the like having visible indicia thereon and also having on a portion thereof a hologram of said visible indicia as originally placed on the identification card. The method comprises the steps of: producing an optical image of the visible indicia on the identification card; producing a reconstructed image of the hologram on the identification card; projecting the optical image and the reconstructed holographic image, in superimposed register, and either continuously or intermittently, e.g., alternately, upon a common optical image plane; and comparing the images on the image plane. The apparatus comprises suitable optical elements for carrying out these steps using either a single laser light source or such a light source together with a conventional light source.

Abstract: A microscope-projector system is employed to image and view a transition of light and dark areas on an object. The position of the shadow corresponds to the vertical position of a portion of the object, and an adjustable device is employed for adjusting the position of the microscope-projector with respect to the object. A video camera may be connected to the microscope, to project the image on a monitor. Vertical adjustment of the microscope-projector assembly enables measurement of thickness, for example, with respect to a reference level. The scan lines of the video camera may also be employed to locate the position of the shadow to indicate the thickness of the object, and also to automatically readjust the position of the shadow to a reference level. Electronic circuitry may also play a part to determine from transition in scan lines the horizontal dimensions of an object.