With Modulation (e.g., Flicker Beam) Patents (Class 356/447)
  • Patent number: 10254534
    Abstract: An example multimode fiber endoscope may include an elongated body having a proximal end and a distal end; a multimode fiber disposed within the elongated body and extending from the proximal end to the distal end of the elongated body; a light source disposed relative to the proximal end of the elongated body; a light detector disposed relative to the proximal end of the elongated body; and multiple optical elements disposed between the light source and the multimode fiber. One or more of the optical elements are configured to direct light from the light source into the multimode fiber. One or more of the optical elements are configured to direct light from the multimode fiber to the detector. In some embodiments, the multimode fiber may be a single multimode fiber.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: April 9, 2019
    Assignee: The Regents of The University of Colorado, a body corporate
    Inventors: Antonio Miguel Caravaca-Aguirre, Rafael Piestun
  • Patent number: 10049294
    Abstract: The present disclosure advantageously provides apparatus, systems and methods which facilitate estimating and accounting for illumination conditions, viewing conditions and reflectance characteristics for imaged surfaces when performing color measurement, correction and/or transformation in an imaging process, such as photography. Advantageously, the disclosed apparatus, systems and methods may utilize a set of one or more illumination target elements for extrapolating illumination conditions from an imaged scene. The disclosure may be used to improve determination of color correction/transformation parameters and/or to facilitate determining a reflectance model for a target surface of interest.
    Type: Grant
    Filed: January 30, 2015
    Date of Patent: August 14, 2018
    Assignee: X-Rite Switzerland GmbH
    Inventors: James William Vogh, Jr., Olivier Calas, Beat Frick
  • Patent number: 10008093
    Abstract: Various embodiments of systems, apparatus, and methods are described for A user input device, such as a remote control device. In one implementation, the remote control device includes at least one pair of electrical contacts, at least one button configured to electrically connect the at least one pair of electrical contacts, and a degradation measurement module in electrical communication with at least one of the electrical contacts. The degradation measurement module is configured to determine a degradation level of the at least one button based on at least one electrical property of a circuit associated with the at least one button when the at least button electrically connects the at least one pair of electrical contacts.
    Type: Grant
    Filed: May 6, 2016
    Date of Patent: June 26, 2018
    Assignee: DISH TECHNOLOGIES L.L.C.
    Inventors: Christopher Burns, Brad Bylund, Harold Jaramillo, Paul Langer, Jeremy Mickelsen
  • Patent number: 9983572
    Abstract: A method and system (10) are provided for automatically portioning workpieces (14) using a rotating blade (22) passing through narrow gap (20) formed between the ends of adjacent conveyors (12) and (18). A scanning system (16) scans the workpieces (14) to physically characterize the workpieces and control the operation of the blade (22), including its rotational speed. The portioning of the workpiece can be carried out in accordance with one or more directly-controlled characteristics (parameter/specifications), such as a cutting path of the blade (22), the rotational speed of the blade (22), and the speed of the conveyor (12). The directly-controlled characteristics may be varied until an acceptable set of one or more indirectly-controlled characteristics is achieved, including, for example, the weight of the cut portions, the quality of the cuts achieved by the cutting blade, and the throughput of the portioning system (10).
    Type: Grant
    Filed: January 23, 2016
    Date of Patent: May 29, 2018
    Assignee: John Bean Technologies Corporation
    Inventors: Craig E. Pfarr, George R. Blaine
  • Patent number: 9581802
    Abstract: Provided with an endoscope device configured to measure a specimen using a pattern projection image of the specimen on which a light and shade pattern of light is projected, includes: an imaging unit configured to acquire an image of the specimen; an illumination unit having a first light source configured to emit illumination light to illuminate an observation field of vision of the imaging unit; a pattern projection unit having a second light source configured to emit projection light to project the light and shade pattern on the specimen; a display unit configured to display the image acquired by the imaging unit; and a control unit configured to control the imaging unit, the illumination unit, the pattern projection unit, and the display unit.
    Type: Grant
    Filed: November 20, 2013
    Date of Patent: February 28, 2017
    Assignee: OLYMPUS CORPORATION
    Inventor: Masayoshi Yokota
  • Patent number: 9035785
    Abstract: A graphic may include a consumable and having optically encoded information.
    Type: Grant
    Filed: September 27, 2010
    Date of Patent: May 19, 2015
    Assignee: Whirlpool Corporation
    Inventors: Kirk M. Dunsbergen, Kaustav Ghosh, Robert J. Pinkowski
  • Patent number: 8873059
    Abstract: A method for assessing an interaction of a sample with light beams having different wavelengths, the method comprising: generating a light beam having a wavelength and being intensity modulated according to a modulation function to create an intensity modulation in the light beam; irradiating the sample with the light beam; detecting a response light from the sample, the response light being released by the sample when the sample is irradiated with the light beam, the response light having intensity fluctuations caused by the intensity modulation; using the intensity fluctuations in the response light to identify the modulation function and associate the wavelength and the response light to each other; assessing the interaction of the sample with the light beam using the response light; stopping irradiating the sample with the light beam and performing the previous step with at least one other light beam having a different wavelength.
    Type: Grant
    Filed: March 2, 2010
    Date of Patent: October 28, 2014
    Assignee: Genia Photononics Inc.
    Inventor: Alain Villeneuve
  • Patent number: 8817260
    Abstract: A modulated reflectance measurement system includes lasers for generating an intensity modulated pump beam and a UV probe beam. The pump and probe beams are focused on a measurement site within a sample. The pump beam periodically excites the measurement site and the modulation is imparted to the probe beam. For one embodiment, the wavelength of the probe beam is selected to correspond to a local maxima of the temperature reflectance coefficient of the sample. For a second embodiment, the probe laser is tuned to either minimize the thermal wave contribution to the probe beam modulation or to equalize the thermal and plasma wave contributions to the probe beam modulation.
    Type: Grant
    Filed: November 11, 2009
    Date of Patent: August 26, 2014
    Assignee: KLA-Tencor Corporation
    Inventors: Jon Opsal, Lena Nicolaides, Alex Salnik, Allan Rosencwaig
  • Patent number: 8767215
    Abstract: A method for detecting an object using light comprises providing a light source having a function of illuminating an environment. The light source is driven to emit light in a predetermined mode, with light in the predetermined mode being emitted such that the light source maintains said function of illuminating an environment. A reflection/backscatter of the emitted light is received from an object. The reflection/backscatter is filtered over a selected wavelength range as a function of a desired range of detection from the light source to obtain a light input. The presence or position of the object is identified with the desired range of detection as a function of the light input and of the predetermined mode.
    Type: Grant
    Filed: November 14, 2012
    Date of Patent: July 1, 2014
    Assignee: Leddartech Inc.
    Inventors: Daniel Cantin, Pascal Gallant, François Babin, Yvan Mimeault
  • Patent number: 8665445
    Abstract: A diagnostic system for an optical touch control module and an automatic diagnostic method thereof are disclosed. The diagnostic system is used for testing an optical capturing module of the optical touch control module. The diagnostic system includes a controlling module, a first test element, a second test element, and a rotary fixture. The first and the second test element are disposed on a touch surface for allowing the optical capturing module to capture a first and a second test signal. The rotary fixture is used for contacting to the optical capturing module, wherein the controlling module determines whether an image signal captured by the optical capturing module has the first and the second test signal. If not, the controlling module controls the rotary fixture to rotate the optical capturing module to adjust a capturing direction.
    Type: Grant
    Filed: November 20, 2012
    Date of Patent: March 4, 2014
    Assignee: Wistron Corporation
    Inventors: Lin-Husng Chang, Yu-Yen Chen, Po-Liang Huang, Kai-Chung Cheng
  • Patent number: 8652592
    Abstract: A discrimination medium on which printing can be freely performed, which cannot be easily falsified, in which the authenticity can be easily discriminated by unique appearance, and which can be produced at low cost, is provided. A cholesteric liquid crystal layer 10, and a breakable print recording layer are laminated in the discrimination medium. The cholesteric liquid crystal layer 10 has plural light transparent films, which are laminated and are different from each other in refraction index. Therefore, the discrimination medium has unique optical characteristics such that a character, a symbol, a pattern, a figure formed by printing by a thermal printer or the like changes in color depending on the viewing angle. A discrimination method using the above optical characteristics of the discrimination medium is provided.
    Type: Grant
    Filed: April 14, 2010
    Date of Patent: February 18, 2014
    Assignee: NHK Spring Co., Ltd.
    Inventors: Hidekazu Hoshino, Itsuo Takeuchi
  • Patent number: 8634080
    Abstract: A method for determining an active dopant concentration profile of a semiconductor substrate based on optical measurements is disclosed. The active dopant concentration profile includes a concentration level and a junction depth. In one aspect, the method includes obtaining a photomodulated optical reflectance (PMOR) amplitude offset curve and a PMOR phase offset curve for the semiconductor substrate based on PMOR measurements, determining a decay length parameter based on a first derivative of the amplitude offset curve, determining a wavelength parameter based on a first derivative of the phase offset curve, and determining, from the decay length parameter and the wavelength parameter, the concentration level and the junction depth of the active dopant concentration profile.
    Type: Grant
    Filed: January 18, 2013
    Date of Patent: January 21, 2014
    Assignees: IMEC, Katholieke Universiteit Leuven
    Inventor: Janusz Bogdanowicz
  • Publication number: 20140009763
    Abstract: Systems and methods are described for reducing coherence effect in narrow line-width light sources through various modulation techniques. The systems and methods can include a narrow line-width laser source with a thermoelectric cooler thermally coupled thereto and a controller communicatively coupled to the thermoelectric cooler. The controller is configured to provide a varied input signal to the thermoelectric cooler to reduce coherence of the narrow line-width laser source by artificially broadening the narrow line-width on a time averaged basis. The systems and methods can also include direct modulation of the narrow line-width laser source. The systems and methods can include a narrow line-width Optical Time Domain Reflectometer (OTDR). The systems and methods can also include direct modulation of the narrow line-width laser source with or without the varied input signal to the thermoelectric cooler.
    Type: Application
    Filed: July 3, 2012
    Publication date: January 9, 2014
    Applicant: CIENA CORPORATION
    Inventors: Jun BAO, Michael Haidar SHAHINE, Hua JIAO, Jean-Luc ARCHAMBAULT
  • Publication number: 20130301054
    Abstract: A diagnostic system for an optical touch control module and an automatic diagnostic method thereof are disclosed. The diagnostic system is used for testing an optical capturing module of the optical touch control module. The diagnostic system includes a controlling module, a first test element, a second test element, and a rotary fixture. The first and the second test element are disposed on a touch surface for allowing the optical capturing module to capture a first and a second test signal. The rotary fixture is used for contacting to the optical capturing module, wherein the controlling module determines whether an image signal captured by the optical capturing module has the first and the second test signal. If not, the controlling module controls the rotary fixture to rotate the optical capturing module to adjust a capturing direction.
    Type: Application
    Filed: November 20, 2012
    Publication date: November 14, 2013
    Applicant: WISTRON CORPORATION
    Inventors: LIN-HUSNG CHANG, YU-YEN CHEN, PO-LIANG HUANG, KAI-CHUNG CHENG
  • Patent number: 8506887
    Abstract: A sensor for sensing at least one biological target or chemical target is provided. The sensor includes a membrane includes a membrane material that supports generation and propagation of at least one waveguide mode, where the membrane material includes a plurality of voids having an average size<2 microns. The sensor also includes at least one receptor having structure for binding to the target within the plurality of voids, and an optical coupler for coupling light to the membrane sufficient to generate the waveguide mode in the membrane from photons incident on the optical coupler.
    Type: Grant
    Filed: October 16, 2009
    Date of Patent: August 13, 2013
    Assignee: Vanderbilt University
    Inventors: Guoguang Rong, Raymond L. Mernaugh, Sharon M. Weiss
  • Publication number: 20130194577
    Abstract: A method for determining an active dopant concentration profile of a semiconductor substrate based on optical measurements is disclosed. The active dopant concentration profile includes a concentration level and a junction depth. In one aspect, the method includes obtaining a photomodulated reflectance (PMOR) amplitude offset curve and a PMOR phase offset curve for the semiconductor substrate based on PMOR measurements, determining a decay length parameter based on a first derivative of the amplitude offset curve, determining a wavelength parameter based on a first derivative of the phase offset curve, and determining, from the decay length parameter and the wavelength parameter, the concentration level and the junction depth of the active dopant concentration profile.
    Type: Application
    Filed: January 18, 2013
    Publication date: August 1, 2013
    Applicants: Katholieke Universiteit Leuven, IMEC
    Inventors: IMEC, Katholieke Universiteit Leuven
  • Patent number: 8488123
    Abstract: An optical detector senses the intensity of scattered light reflected by a surface coupled to a vibration source. If the vibration source is operating, the coupled surface vibrates at the same frequency. Incident light reflected by the surface is modulated by the vibration at a hypertemporal frequency. The detector produces a direct electrical current as a temporal function of the detected modulated light intensity. A transimpedance amplifier converts the current into a voltage. A voltage amplifier amplifies the voltage. An analog-to-digital converter converts the amplified voltage into digital signal. A digital signal processor converts the digital signal into a function of power spectral density and frequency using Fourier transform and principle component analyses. The vibration signature of the vibration source, if present, is discerned from a graphical display of the foregoing function.
    Type: Grant
    Filed: October 5, 2012
    Date of Patent: July 16, 2013
    Assignee: The United States of America as Represented by the Secretary of the Air Force
    Inventor: Frank O. Clark
  • Patent number: 8472025
    Abstract: A device and a method for detecting reflected and/or emitted light of an object (1) are proposed having at least one illumination device (2) illuminating the object (1) with pulsed light, and having at least one sensor (4, 6) capturing the light reflected and/or emitted by the object (1), and having a transport device transporting the object relative to the illumination device (2) and past the sensor 4, 6) in the direction of transport, and having a power supply (16, 17, 18, 19, 20, 21, 22) for the illumination device (2) providing the illumination device (2) with a current that is a periodic function over time, wherein a period comprises at least two current pulses (23, 24) of different magnitudes.
    Type: Grant
    Filed: December 4, 2009
    Date of Patent: June 25, 2013
    Assignee: BEB Industrie-Elektronik AG
    Inventors: Christoph Reinhard, Reto Schletti
  • Patent number: 8461470
    Abstract: In a laser machining apparatus that performs machining by a laser beam (4) emitted from a laser oscillator (1), the laser machining apparatus herein provided includes an aperture (5) placed in a light path of the laser beam (4) emitted from the laser oscillator (1) so as to block a perimeter portion of the laser beam (4) and to transmit a middle portion thereof, and a beam-power measurement sensor (6) for measuring beam power of a laser beam (20) transmitted through the aperture (5), whereby it utilizes that beam power of the laser beam transmitted through the aperture (5) significantly changes (the more degraded, the more the beam power rises) due to a degradation condition of an output mirror (2) when the output mirror in the laser oscillator (1) becomes in high thermal loading condition due to the laser beam with high beam power, so that the degradation condition of the output mirror (2) is determined.
    Type: Grant
    Filed: November 20, 2007
    Date of Patent: June 11, 2013
    Assignee: Mitsubishi Electric Corporation
    Inventors: Kenji Ito, Takamitsu Kimura, Osami Yamaoka
  • Patent number: 8436630
    Abstract: A system for measuring an optical spectral response of a photoelectric DUT includes a spectrally programmable light source including a broadband light source, a dispersive element for dispersing the light, and a spatial light modulator for controlling an intensity and a spectra of the light to provide a spectrally programmable light beam. A light distributing device is coupled to receive the spectrally programmable light beam and includes a light distributing structure for distributing the spectrally programmable light beam in a known ratio to a first area and a second area. A reference detector is positioned at the first area, and the DUT is positioned at the second area. Data acquisition electronics and a processor receive simultaneously generated output signals from the DUT and the reference detector to correct for intensity variation in the spectrally programmable light beam in determining the optical spectral response of the DUT.
    Type: Grant
    Filed: October 13, 2010
    Date of Patent: May 7, 2013
    Assignee: Gooch and Housego PLC
    Inventors: Alexandre Y. Fong, Christopher N. Pannell, Robert Bronson, Jr.
  • Patent number: 8422030
    Abstract: An intensity modulating element for a probe having a plurality of light emitters for phase-shift analysis and measurement is disclosed. The intensity modulating element comprises a plurality of columns of a plurality of grating elements formed by two opposing patterns.
    Type: Grant
    Filed: May 4, 2011
    Date of Patent: April 16, 2013
    Assignee: General Electric Company
    Inventors: Clark Alexander Bendall, Theodore Alexander Chilek
  • Patent number: 8330960
    Abstract: The present invention includes a method of changing intensity of a reflected beam which may be expressed as a method of changing the amount of reflected light from a beam of light, the method comprising: (a) providing a substrate bearing a film of a reflective material; (b) directing a first beam of light at a reflecting point upon the reflective material so as to create a reflecting beam therefrom; (c) directing a second beam of light at the reflecting point upon the reflective material so as to alter the amount of light in the reflecting beam, and (d) detecting the change in the amount of light in the reflecting beam. The invention also includes an apparatus for changing the amount of reflected light from a beam of light and measuring that change, as well as related apparatus for a pulsed optical signal.
    Type: Grant
    Filed: October 25, 2010
    Date of Patent: December 11, 2012
    Assignee: Bowling Green State University
    Inventors: Bruno Ullrich, Artur Erlacher
  • Publication number: 20120268744
    Abstract: A system for monitoring thin-film fabrication processes is herein disclosed. Diffraction of incident light is measured and the results are compared to a predictive model based on at least one idealized or nominal structure. The model and/or the measurement of diffracted incident light may be modified using the output of one or more additional metrology systems.
    Type: Application
    Filed: March 19, 2012
    Publication date: October 25, 2012
    Inventors: Robert Gregory WOLF, Michael J. KOTELYANSKII
  • Patent number: 8295150
    Abstract: Described is an optical information medium measurement method of measuring a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers. The method includes measuring the modulation degree of each layer of the optical information medium, by use of a measurement optical system, obtaining a thickness between layers of the optical information medium, obtaining a reflectance of each layer of the optical information medium, and converting the measured modulation degree of each layer into a modulation degree at a reference optical system differing from the measurement optical system, based on a value indicative of the obtained thickness between layers and a value indicative of the obtained reflectance of each layer.
    Type: Grant
    Filed: March 25, 2011
    Date of Patent: October 23, 2012
    Assignee: Panasonic Corporation
    Inventors: Kousei Sano, Yoshiaki Komma, Yasumori Hino
  • Patent number: 8284405
    Abstract: An optical detector senses the intensity of scattered light reflected by a surface coupled to a vibration source. If the vibration source is operating, the coupled surface vibrates at the same frequency. Incident light reflected by the surface is modulated by the vibration at a hypertemporal frequency. The detector produces a direct electrical current as a temporal function of the detected modulated light intensity. A transimpedance amplifier converts the current into a voltage. A voltage amplifier amplifies the voltage. An analog-to-digital converter converts the amplified voltage into digital signal. A digital signal processor converts the digital signal into a function of power spectral density and frequency using Fourier transform and principle component analyses. The vibration signature of the vibration source, if present, is discerned from a graphical display of the foregoing function.
    Type: Grant
    Filed: December 11, 2009
    Date of Patent: October 9, 2012
    Assignee: The United States of America as Represented by The Secretary of the Air Force
    Inventor: Frank O. Clark
  • Patent number: 8228774
    Abstract: An optical information medium measurement method measures a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers. The method includes measuring the modulation degree of each layer of the optical information medium, obtaining a thickness between layers of the optical information medium, obtaining a reflectance of each layer of the optical information medium, and converting the modulation degree of each layer. The modulation degree is measured based on a value indicative of the thickness between layers, and a value indicative of the reflectance of each layer.
    Type: Grant
    Filed: September 15, 2009
    Date of Patent: July 24, 2012
    Assignee: Panasonic Corporation
    Inventors: Kousei Sano, Yoshiaki Komma, Yasumori Hino
  • Patent number: 8218418
    Abstract: An optical information medium measurement method, for measuring a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers, includes a first step of measuring a modulation degree of each layer of the optical information medium, and a second step of obtaining a thickness between layers of the optical information medium. Further, the method includes a third step of obtaining a reflectance of each layer of the optical information medium, and a fourth step of converting the modulation degree of each layer, as measured in the first step, into a modulation degree at a reference optical system differing from the measurement optical system, based on a value indicative of the thickness between layers, the thickness being obtained in the second step, and a value indicative of the reflectance of each layer, as obtained in the third step.
    Type: Grant
    Filed: September 15, 2009
    Date of Patent: July 10, 2012
    Assignee: Panasonic Corporation
    Inventors: Kousei Sano, Yoshiaki Komma, Yasumori Hino
  • Patent number: 8213017
    Abstract: The invention relates to an analytical system and method for generating and metering optical signals. The invention includes an optical system having an illuminating system and a sensor platform. The illuminating system includes an arrangement identified as “SLM” for the temporally rapidly variable spatial light modulation, by which in an operating state, illuminating patterns of a freely selectable and rapidly variable geometry, which can be determined by the settings of the SLM, can be generated on the sensor platform from an illuminating light, which enters into this SLM and which includes a substantially homogenous intensity distribution in the in the cross section of the illuminating light at right angles to its direction of expansion.
    Type: Grant
    Filed: July 16, 2007
    Date of Patent: July 3, 2012
    Inventor: Max Wiki
  • Patent number: 8149412
    Abstract: A detection device based on the surface plasmon resonance effect, including a radiation emitter and a radiation detector, a fluidic substrate, a liquid crystal layer and respective control mechanism.
    Type: Grant
    Filed: November 15, 2007
    Date of Patent: April 3, 2012
    Assignee: Biosurfit, S.A.
    Inventor: João Garcia da Fonseca
  • Patent number: 8147026
    Abstract: A method and system for improved image quality using an image quality matching method is used to match the optical density of single prints produced on multiple print engines by first sensing the optical density of a first image produced on a first print engine and then sensing the optical density of a second image produced on a second print engine before comparing the optical densities and determining if they are substantially equal. If they are not equal set points and exposures are adjusted on one or both print engines until the differences between the optical densities is less than 0.05, preferably 0.03. The density is changed by adjusting the initial voltage on the primary imaging member of at least one print engine and/or by adjusting the exposure of the primary imaging member of at least one print engine.
    Type: Grant
    Filed: April 27, 2009
    Date of Patent: April 3, 2012
    Assignee: Eastman Kodak Company
    Inventors: Donald S. Rimai, Alan E. Rapkin
  • Patent number: 8120776
    Abstract: Carrier activation and end-of-range defect density of ultra-shallow junctions in integrated circuits are determined using modulated optical reflectance signals, DC reflectances of pump or probe laser beams, and in-phase and quadrature signal processing. A method for determining characteristics of an ultra-shallow junction includes periodically exciting a region of the substrate using a pump laser beam, and reflecting a probe laser beam from the excited region. A modulated optical reflectance signal is measured along with DC reflectance of the probe laser beam. The modulated optical reflectance signal and DC reflectance are compared with reference signals generated from calibration substrates to determine carrier activation and end-of-range defect density in the junction.
    Type: Grant
    Filed: August 20, 2009
    Date of Patent: February 21, 2012
    Assignee: KLA-Tencor Corporation
    Inventors: Alex Salnik, Lena Nicolaides
  • Patent number: 8049897
    Abstract: A reticle defect inspection apparatus that suppresses deterioration of optical components resulting from luminescent spots generated by an integrator and can sustain a defect inspection with high precision for a long time is provided. The reticle defect inspection apparatus is a reticle defect inspection apparatus for inspecting for defects on a reticle using a pattern image obtained by irradiating the reticle on which a pattern is formed with light. And the apparatus includes an illuminating optical system for irradiating the reticle with an inspection light and a detecting optical system for detecting a pattern image of the reticle irradiated with the inspection light, wherein the illuminating optical system comprises an integrator for equalizing illumination distribution of the inspection light and a moving mechanism for enabling the integrator to slightly move in a direction perpendicular to an optical axis of the integrator.
    Type: Grant
    Filed: March 13, 2008
    Date of Patent: November 1, 2011
    Assignees: Kabushiki Kaisha Toshiba, NEC Corporation
    Inventors: Ryoichi Hirano, Riki Ogawa
  • Patent number: 7999938
    Abstract: This application describes designs, implementations, and techniques for controlling propagation mode or modes of light in a common optical path, which may include one or more waveguides, to sense a sample.
    Type: Grant
    Filed: September 29, 2009
    Date of Patent: August 16, 2011
    Assignee: Tomophase Corporation
    Inventor: Feiling Wang
  • Patent number: 7973935
    Abstract: A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.
    Type: Grant
    Filed: November 4, 2008
    Date of Patent: July 5, 2011
    Assignee: Konica Minolta Sensing, Inc.
    Inventor: Kenji Imura
  • Patent number: 7911616
    Abstract: A method of detecting the condition of a turf grass is described. According to one aspect of the invention, the method comprises steps of attaching an active sensor to a mower; traversing a section of turf grass; and processing the output of the sensor. A device for detecting the condition of turf grass is also disclosed. The device comprises an array of illuminating devices generating a pattern of illuminating light; a detecting device receiving a pattern of reflected light which is coincident with the pattern of illuminating light; a detecting device adapted to detect stray light from the array of illuminating devices; and a feedback loop controlling the array of illuminating devices. A system employing the device is also disclosed.
    Type: Grant
    Filed: February 13, 2006
    Date of Patent: March 22, 2011
    Assignee: LI-COR, Inc.
    Inventors: David Franzen, John Rada, Kevin Ediger, Greg Biggs, Jonathan M. Welles, Tanvir Demetriades-Shah
  • Publication number: 20110043813
    Abstract: Provided is an optical apparatus having high durability, less optical absorption than a hole-type metal thin film filter, high transmittance and high reflectance, and variable optical characteristics. The apparatus includes: a dielectric substrate; a metal structure group including multiple metal structures two-dimensionally and discretely disposed at regular intervals; and a dielectric layer covering the metal structure group, in which: the metal structures have a first length equal to or shorter than a predetermined wavelength in a visible light region in one direction, and a second length equal to or shorter than the wavelength in a perpendicular direction; and the metal structures resonates with light entering the dielectric substrate or the dielectric layer, having a variable dielectric constant, to generate localized surface plasmon resonance on a surface of the metal structures to have a minimum transmittance or a maximum reflectance of the light having the wavelength.
    Type: Application
    Filed: August 9, 2010
    Publication date: February 24, 2011
    Applicant: CANON KABUSHIKI KAISHA
    Inventor: Tomohiro Yamada
  • Patent number: 7869732
    Abstract: An image printing system includes a print engine and a sensing system. The print engine is configured to print a marking material image on a image bearing surface. The sensing system includes a plurality of illuminators, a modulator, a sensor, and a demodulator. Each illuminator is configured to simultaneously emit a light beam at the marking material image on the image bearing surface, thereby producing reflectance from the marking material image at least in a first direction. The modulator is configured to modulate an intensity characteristic of each of the light beams emitted by the illuminators such that each light beam has a different modulated waveform characteristic, where the waveform characteristic includes at least frequency. The sensor is configured to detect the reflectance from the plurality of light beams in the first direction and output a reflectance signal.
    Type: Grant
    Filed: July 3, 2008
    Date of Patent: January 11, 2011
    Assignee: Xerox Corporation
    Inventors: Aaron Michael Burry, Julianna Elizabeth Lin, Peter Paul
  • Publication number: 20100321698
    Abstract: The present invention provides for a novel method and apparatus for the simultaneous generation and detection of optical diffraction interference pattern on a photo detector. The monitoring method and apparatus disclosed herein comprises of a (any) continuous wave coherent collimated beam of light (or a laser) falling on an (any) optically reflective coating on the surface of the body with inherent vibrations, or with manifest vibrations induced from another source through any medium where the said light is reflected, and then received on the surface of a (any) photo detector in such a way that the received light falls partially on the active sensing area, and partially on the outer perimeter of the active sensing area.
    Type: Application
    Filed: July 10, 2008
    Publication date: December 23, 2010
    Inventors: Thankappan Santhanakrishnan, Tatavarti Venkata Sreerama Narasimha Rao
  • Publication number: 20100296097
    Abstract: Provided is a scanning optical measurement apparatus having super resolution.
    Type: Application
    Filed: February 18, 2008
    Publication date: November 25, 2010
    Applicant: INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
    Inventors: Seung-Han Park, Dae-Geun Kim, Hong-Gyu Ahn, Eung-Jang Lee
  • Patent number: 7826058
    Abstract: The present invention includes a method of changing intensity of a reflected beam which may be expressed as a method of changing the amount of reflected light from a beam of light, the method comprising: (a) providing a substrate bearing a film of a reflective material; (b) directing a first beam of light at a reflecting point upon the reflective material so as to create a reflecting beam therefrom; (c) directing a second beam of light at the reflecting point upon the reflective material so as to alter the amount of light in the reflecting beam, and (d) detecting the change in the amount of light in the reflecting beam. The invention also includes an apparatus for changing the amount of reflected light from a beam of light and measuring that change, as well as related apparatus for providing a pulsed optical signal by changing the amount of reflected light from a beam of light.
    Type: Grant
    Filed: May 19, 2006
    Date of Patent: November 2, 2010
    Assignee: Bowling Green State University
    Inventors: Bruno Ullrich, Artur Erlacher
  • Patent number: 7821649
    Abstract: A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.
    Type: Grant
    Filed: March 5, 2008
    Date of Patent: October 26, 2010
    Assignee: GE Inspection Technologies, LP
    Inventors: Clark Alexander Bendall, Guiju Song, Li Tao, Kevin George Harding, Thomas Karpen
  • Publication number: 20100245830
    Abstract: In a laser machining apparatus that performs machining by a laser beam (4) emitted from a laser oscillator (1), the laser machining apparatus herein provided includes an aperture (5) placed in a light path of the laser beam (4) emitted from the laser oscillator (1) so as to block a perimeter portion of the laser beam (4) and to transmit a middle portion thereof, and a beam-power measurement sensor (6) for measuring beam power of a laser beam (20) transmitted through the aperture (5), whereby it utilizes that beam power of the laser beam transmitted through the aperture (5) significantly changes (the more degraded, the more the beam power rises) due to a degradation condition of an output mirror (2) when the output mirror in the laser oscillator (1) becomes in high thermal loading condition due to the laser beam with high beam power, so that the degradation condition of the output mirror (2) is determined.
    Type: Application
    Filed: November 20, 2007
    Publication date: September 30, 2010
    Applicant: Mitsubishi Electric Corporation
    Inventors: Kenji Ito, Takamitsu Kimura, Osami Yamaoka
  • Publication number: 20100128590
    Abstract: An optical information medium measurement method of the present invention, for measuring a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers, includes a first step of measuring the modulation degree of each layer of the optical information medium, by use of a measurement optical system, a second step of obtaining a thickness between layers of the optical information medium, a third step of obtaining a reflectance of each layer of the optical information medium, and a fourth step of converting the modulation degree of each layer, the modulation degree being measured in the first step, into a modulation degree at a reference optical system differing from the measurement optical system, based on a value indicative of the thickness between layers, the thickness being obtained in the second step, and a value indicative of the reflectance of each layer, the reflectance being obtained in the third step.
    Type: Application
    Filed: September 15, 2009
    Publication date: May 27, 2010
    Inventors: Kousei SANO, Yoshiaki Komma, Yasumori Hino
  • Publication number: 20100103427
    Abstract: An object detector has a light projecting unit that projects light, a light scanning actuator that scans the light, and a light receiving unit. The light scanning actuator includes plate springs, each having a thin-plate shape and one end in a longitudinal direction thereof being fixed; a movable part attached to the other ends in the longitudinal directions of the plate springs; and an electromagnetic driving unit having a magnet that generates a magnetic flux, a yoke that forms a closed magnetic circuit with the magnet and has a part being stacked on the magnet, and a coil held by the movable part and positioned in a gap between the magnet and the yoke such that an aperture plane is substantially orthogonal to a stacking direction of the magnet and the yoke, the electromagnetic driving unit configured to drive the movable part by an electromagnetic force applied to the coil.
    Type: Application
    Filed: June 3, 2008
    Publication date: April 29, 2010
    Applicant: NHK Spring Co., Ltd.
    Inventors: Ryohei Shigematsu, Hiroshi Imamura, Takafumi Hirata
  • Publication number: 20100067017
    Abstract: An optical modulation-type detection device has a noise detection mode having (i) an offset canceling (hereinafter referred to as “OC”) period in which (a) the light-reception signal pathway of a pulse signal converting section is cut off so that an offset of the pulse signal converting section is suppressed and (b) the light-reception signal pathway of the pulse signal converting section is reconnected while a state in which the offset is suppressed is being maintained, at an end of the OC period, and (ii) an asynchronous reception period in which whether or not asynchronous reception occurs is detected after the first period, and an object detection mode having a synchronous reception period in which whether or not synchronous reception occurs is detected after the asynchronous reception is not detected in the noise detection mode.
    Type: Application
    Filed: August 27, 2009
    Publication date: March 18, 2010
    Applicant: SHARP KABUSHIKI KAISHA
    Inventors: Takuma HIRAMATSU, Ryohhei TADA, Isamu KAWABE, Naruichi YOKOGAWA
  • Patent number: 7679751
    Abstract: A method and apparatus are provided for imaging three-dimensional scenes and objects by detecting reflections from emitted sequences of electromagnetic radiation. At least one transmitter is provided for emitting a sequence of electromagnetic radiation, and at least three sensors are provided for detecting radiation reflected from the scene and objects being imaged. Signals based on the detected radiation are used, together with spatial information of the transmitters and sensors, to calculate reflectivity coefficients for points of interest in the scene. Velocity vectors associated with moving objects within the scene can also be determined based on the rate of change of the phase differences between the emitted and reflected radiations.
    Type: Grant
    Filed: November 24, 2008
    Date of Patent: March 16, 2010
    Assignee: Analog Devices, Inc.
    Inventor: Joshua A. Kablotsky
  • Patent number: 7646486
    Abstract: A modulated reflectance measurement system includes lasers for generating an intensity modulated pump beam and a UV probe beam. The pump and probe beams are focused on a measurement site within a sample. The pump beam periodically excites the measurement site and the modulation is imparted to the probe beam. For one embodiment, the wavelength of the probe beam is selected to correspond to a local maxima of the temperature reflectance coefficient of the sample. For a second embodiment, the probe laser is tuned to either minimize the thermal wave contribution to the probe beam modulation or to equalize the thermal and plasma wave contributions to the probe beam modulation.
    Type: Grant
    Filed: January 30, 2008
    Date of Patent: January 12, 2010
    Assignee: KLA-Tencor Corporation
    Inventors: Jon Opsal, Lena Nicolaides, Alex Salnik, Allan Rosencwaig
  • Publication number: 20100002236
    Abstract: A method is disclosed for determining the inactive doping concentration of a semiconductor region using a PMOR method. In one aspect, the method includes providing two semiconductor regions having substantially the same known as-implanted concentration but known varying junction depths. The method includes determining on one of these semiconductor regions the as-implanted concentration. The semiconductor regions are then partially activated. PMOR measures are then performed on the partially activated semiconductor regions to measure (a) the signed amplitude of the reflected probe signal as function of junction depth and (b) the DC probe reflectivity as function of junction depth. The method includes extracting from these measurements the active doping concentration and then calculating the inactive doping concentration using the determined total as-implanted concentration and active doping concentration.
    Type: Application
    Filed: June 25, 2009
    Publication date: January 7, 2010
    Applicants: Interuniversitair Microelektronica Centrum vzw (IMEC), Katholieke Universiteit Leuven
    Inventor: Janusz Bogdanowicz
  • Publication number: 20090225321
    Abstract: A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.
    Type: Application
    Filed: March 5, 2008
    Publication date: September 10, 2009
    Inventors: Clark Alexander Bendall, Guiju Song, Li Tao, Kevin George Harding, Thomas Karpen
  • Publication number: 20090225320
    Abstract: A probe is presented that includes a light source, a coherent fiber bundle, and a pattern selector. The pattern selector is disposed between the light source and the proximal end of the coherent fiber bundle. The pattern selector includes at least one patterned zone through which light from the light source passes to project at least one fringe set onto a surface. Each of the at least one fringe sets has a structured-light pattern. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is presented.
    Type: Application
    Filed: March 5, 2008
    Publication date: September 10, 2009
    Inventors: Clark Alexander Bendall, Kevin George Harding, Guiju Song, Li Tao, Ming Jia, Xinjun Wan