Abstract: Spatially resolved Fourier Transform Impedance Spectroscopy (FTIS) is disclosed to spatially map and quickly build the frequency response of optoelectronic devices using optical probes. The transfer function of a linear system is the Fourier transform of its impulse response, which may be obtained from transient photocurrent measurements of devices such as photodetectors and solar cells. We apply FTIS to a PbS colloidal quantum dot (QD)/SiC heterojunction photodiode and corroborate results using intensity-modulated photocurrent spectroscopy. The cutoff frequencies of the QD/SiC devices were as high as ˜10 kHz, demonstrating their utility in advanced flexible and thin film electronics. The practical frequencies for FTIS lie in the mHz-kHz range, ideal for composite or novel materials such as QD films that are dominated by interfacial trap states.

Abstract: Disclosed herein are multiple-input, multiple-output (MIMO) LiDAR systems in which the fields of view of multiple illuminators (e.g., lasers) overlap and/or fields of view of multiple detectors (e.g., photodiodes) overlap. Some embodiments provide for illuminators that transmit substantially white pulse sequences that are substantially uncorrelated with each other so that they can be distinguished from one another when detected by a single detector.

Abstract: An input device comprises a plurality of optical vibration sensors mounted in a common housing. Each optical vibration sensor comprises a diffractive optical element; a light source arranged to illuminate the diffractive optical element such that a first portion of light passes through the diffractive optical element and a second portion of light is reflected from the diffractive optical element; and a photo detector arranged to detect an interference pattern generated by said first and second portions of light. The optical vibration sensor is configured so that in use, after the first portion of light passes through the diffractive optical element, the first portion of light is reflected from a reflective surface onto the photo detector. The input device is placed in contact with a surface of a solid body, and an object is brought into physical contact with the surface of the solid body, thereby causing vibrations in the solid body.

Abstract: An apparatus including a semiconductor substrate; an absorption layer coupled to the semiconductor substrate, the absorption layer including a photodiode region configured to absorb photons and to generate photo-carriers from the absorbed photons; one or more first switches controlled by a first control signal, the one or more first switches configured to collect at least a portion of the photo-carriers based on the first control signal; and one or more second switches controlled by a second control signal, the one or more second switches configured to collect at least a portion of the photo-carriers based on the second control signal, where the second control signal is different from the first control signal.

Abstract: An input device comprises a plurality of optical vibration sensors mounted in a common housing. Each optical vibration sensor comprises a diffractive optical element; a light source arranged to illuminate the diffractive optical element such that a first portion of light passes through the diffractive optical element and a second portion of light is reflected from the diffractive optical element; and a photo detector arranged to detect an interference pattern generated by said first and second portions of light. The optical vibration sensor is configured so that in use, after the first portion of light passes through the diffractive optical element, the first portion of light is reflected from a reflective surface onto the photo detector. The input device is placed in contact with a surface of a solid body, and an object is brought into physical contact with the surface of the solid body, thereby causing vibrations in the solid body.

Abstract: A multi-optic vision device includes a dark-vision lighting apparatus illuminating a defect on a subject and leaving regions that surround the defect dark. A bright-vision lighting apparatus illuminates the subject and the regions that surround the defect and leaving the defect dark. A differential-vision lighting apparatus illuminates the subject so as to stereoscopically show the defect on the subject. An area scan camera continuously imaging the subject as the dark-vision lighting apparatus, the bright-vision lighting apparatus, and the differential-vision lighting apparatus simultaneously and respectively provide light. A controller processes the image to respectively obtain a dark-vision image, a bright-vision image, and a differential-vision image of the subject.

Abstract: An example multimode fiber endoscope may include an elongated body having a proximal end and a distal end; a multimode fiber disposed within the elongated body and extending from the proximal end to the distal end of the elongated body; a light source disposed relative to the proximal end of the elongated body; a light detector disposed relative to the proximal end of the elongated body; and multiple optical elements disposed between the light source and the multimode fiber. One or more of the optical elements are configured to direct light from the light source into the multimode fiber. One or more of the optical elements are configured to direct light from the multimode fiber to the detector. In some embodiments, the multimode fiber may be a single multimode fiber.

Abstract: The present disclosure advantageously provides apparatus, systems and methods which facilitate estimating and accounting for illumination conditions, viewing conditions and reflectance characteristics for imaged surfaces when performing color measurement, correction and/or transformation in an imaging process, such as photography. Advantageously, the disclosed apparatus, systems and methods may utilize a set of one or more illumination target elements for extrapolating illumination conditions from an imaged scene. The disclosure may be used to improve determination of color correction/transformation parameters and/or to facilitate determining a reflectance model for a target surface of interest.

Abstract: Various embodiments of systems, apparatus, and methods are described for A user input device, such as a remote control device. In one implementation, the remote control device includes at least one pair of electrical contacts, at least one button configured to electrically connect the at least one pair of electrical contacts, and a degradation measurement module in electrical communication with at least one of the electrical contacts. The degradation measurement module is configured to determine a degradation level of the at least one button based on at least one electrical property of a circuit associated with the at least one button when the at least button electrically connects the at least one pair of electrical contacts.

Abstract: A method and system (10) are provided for automatically portioning workpieces (14) using a rotating blade (22) passing through narrow gap (20) formed between the ends of adjacent conveyors (12) and (18). A scanning system (16) scans the workpieces (14) to physically characterize the workpieces and control the operation of the blade (22), including its rotational speed. The portioning of the workpiece can be carried out in accordance with one or more directly-controlled characteristics (parameter/specifications), such as a cutting path of the blade (22), the rotational speed of the blade (22), and the speed of the conveyor (12). The directly-controlled characteristics may be varied until an acceptable set of one or more indirectly-controlled characteristics is achieved, including, for example, the weight of the cut portions, the quality of the cuts achieved by the cutting blade, and the throughput of the portioning system (10).

Abstract: Provided with an endoscope device configured to measure a specimen using a pattern projection image of the specimen on which a light and shade pattern of light is projected, includes: an imaging unit configured to acquire an image of the specimen; an illumination unit having a first light source configured to emit illumination light to illuminate an observation field of vision of the imaging unit; a pattern projection unit having a second light source configured to emit projection light to project the light and shade pattern on the specimen; a display unit configured to display the image acquired by the imaging unit; and a control unit configured to control the imaging unit, the illumination unit, the pattern projection unit, and the display unit.

Abstract: A graphic may include a consumable and having optically encoded information.

Abstract: A method for assessing an interaction of a sample with light beams having different wavelengths, the method comprising: generating a light beam having a wavelength and being intensity modulated according to a modulation function to create an intensity modulation in the light beam; irradiating the sample with the light beam; detecting a response light from the sample, the response light being released by the sample when the sample is irradiated with the light beam, the response light having intensity fluctuations caused by the intensity modulation; using the intensity fluctuations in the response light to identify the modulation function and associate the wavelength and the response light to each other; assessing the interaction of the sample with the light beam using the response light; stopping irradiating the sample with the light beam and performing the previous step with at least one other light beam having a different wavelength.

Abstract: A modulated reflectance measurement system includes lasers for generating an intensity modulated pump beam and a UV probe beam. The pump and probe beams are focused on a measurement site within a sample. The pump beam periodically excites the measurement site and the modulation is imparted to the probe beam. For one embodiment, the wavelength of the probe beam is selected to correspond to a local maxima of the temperature reflectance coefficient of the sample. For a second embodiment, the probe laser is tuned to either minimize the thermal wave contribution to the probe beam modulation or to equalize the thermal and plasma wave contributions to the probe beam modulation.

Abstract: A method for detecting an object using light comprises providing a light source having a function of illuminating an environment. The light source is driven to emit light in a predetermined mode, with light in the predetermined mode being emitted such that the light source maintains said function of illuminating an environment. A reflection/backscatter of the emitted light is received from an object. The reflection/backscatter is filtered over a selected wavelength range as a function of a desired range of detection from the light source to obtain a light input. The presence or position of the object is identified with the desired range of detection as a function of the light input and of the predetermined mode.

Abstract: A diagnostic system for an optical touch control module and an automatic diagnostic method thereof are disclosed. The diagnostic system is used for testing an optical capturing module of the optical touch control module. The diagnostic system includes a controlling module, a first test element, a second test element, and a rotary fixture. The first and the second test element are disposed on a touch surface for allowing the optical capturing module to capture a first and a second test signal. The rotary fixture is used for contacting to the optical capturing module, wherein the controlling module determines whether an image signal captured by the optical capturing module has the first and the second test signal. If not, the controlling module controls the rotary fixture to rotate the optical capturing module to adjust a capturing direction.

Abstract: A discrimination medium on which printing can be freely performed, which cannot be easily falsified, in which the authenticity can be easily discriminated by unique appearance, and which can be produced at low cost, is provided. A cholesteric liquid crystal layer 10, and a breakable print recording layer are laminated in the discrimination medium. The cholesteric liquid crystal layer 10 has plural light transparent films, which are laminated and are different from each other in refraction index. Therefore, the discrimination medium has unique optical characteristics such that a character, a symbol, a pattern, a figure formed by printing by a thermal printer or the like changes in color depending on the viewing angle. A discrimination method using the above optical characteristics of the discrimination medium is provided.

Abstract: A method for determining an active dopant concentration profile of a semiconductor substrate based on optical measurements is disclosed. The active dopant concentration profile includes a concentration level and a junction depth. In one aspect, the method includes obtaining a photomodulated optical reflectance (PMOR) amplitude offset curve and a PMOR phase offset curve for the semiconductor substrate based on PMOR measurements, determining a decay length parameter based on a first derivative of the amplitude offset curve, determining a wavelength parameter based on a first derivative of the phase offset curve, and determining, from the decay length parameter and the wavelength parameter, the concentration level and the junction depth of the active dopant concentration profile.

Abstract: Systems and methods are described for reducing coherence effect in narrow line-width light sources through various modulation techniques. The systems and methods can include a narrow line-width laser source with a thermoelectric cooler thermally coupled thereto and a controller communicatively coupled to the thermoelectric cooler. The controller is configured to provide a varied input signal to the thermoelectric cooler to reduce coherence of the narrow line-width laser source by artificially broadening the narrow line-width on a time averaged basis. The systems and methods can also include direct modulation of the narrow line-width laser source. The systems and methods can include a narrow line-width Optical Time Domain Reflectometer (OTDR). The systems and methods can also include direct modulation of the narrow line-width laser source with or without the varied input signal to the thermoelectric cooler.

Abstract: A diagnostic system for an optical touch control module and an automatic diagnostic method thereof are disclosed. The diagnostic system is used for testing an optical capturing module of the optical touch control module. The diagnostic system includes a controlling module, a first test element, a second test element, and a rotary fixture. The first and the second test element are disposed on a touch surface for allowing the optical capturing module to capture a first and a second test signal. The rotary fixture is used for contacting to the optical capturing module, wherein the controlling module determines whether an image signal captured by the optical capturing module has the first and the second test signal. If not, the controlling module controls the rotary fixture to rotate the optical capturing module to adjust a capturing direction.

Abstract: A sensor for sensing at least one biological target or chemical target is provided. The sensor includes a membrane includes a membrane material that supports generation and propagation of at least one waveguide mode, where the membrane material includes a plurality of voids having an average size<2 microns. The sensor also includes at least one receptor having structure for binding to the target within the plurality of voids, and an optical coupler for coupling light to the membrane sufficient to generate the waveguide mode in the membrane from photons incident on the optical coupler.

Abstract: A method for determining an active dopant concentration profile of a semiconductor substrate based on optical measurements is disclosed. The active dopant concentration profile includes a concentration level and a junction depth. In one aspect, the method includes obtaining a photomodulated reflectance (PMOR) amplitude offset curve and a PMOR phase offset curve for the semiconductor substrate based on PMOR measurements, determining a decay length parameter based on a first derivative of the amplitude offset curve, determining a wavelength parameter based on a first derivative of the phase offset curve, and determining, from the decay length parameter and the wavelength parameter, the concentration level and the junction depth of the active dopant concentration profile.

Abstract: An optical detector senses the intensity of scattered light reflected by a surface coupled to a vibration source. If the vibration source is operating, the coupled surface vibrates at the same frequency. Incident light reflected by the surface is modulated by the vibration at a hypertemporal frequency. The detector produces a direct electrical current as a temporal function of the detected modulated light intensity. A transimpedance amplifier converts the current into a voltage. A voltage amplifier amplifies the voltage. An analog-to-digital converter converts the amplified voltage into digital signal. A digital signal processor converts the digital signal into a function of power spectral density and frequency using Fourier transform and principle component analyses. The vibration signature of the vibration source, if present, is discerned from a graphical display of the foregoing function.

Abstract: A device and a method for detecting reflected and/or emitted light of an object (1) are proposed having at least one illumination device (2) illuminating the object (1) with pulsed light, and having at least one sensor (4, 6) capturing the light reflected and/or emitted by the object (1), and having a transport device transporting the object relative to the illumination device (2) and past the sensor 4, 6) in the direction of transport, and having a power supply (16, 17, 18, 19, 20, 21, 22) for the illumination device (2) providing the illumination device (2) with a current that is a periodic function over time, wherein a period comprises at least two current pulses (23, 24) of different magnitudes.

Abstract: In a laser machining apparatus that performs machining by a laser beam (4) emitted from a laser oscillator (1), the laser machining apparatus herein provided includes an aperture (5) placed in a light path of the laser beam (4) emitted from the laser oscillator (1) so as to block a perimeter portion of the laser beam (4) and to transmit a middle portion thereof, and a beam-power measurement sensor (6) for measuring beam power of a laser beam (20) transmitted through the aperture (5), whereby it utilizes that beam power of the laser beam transmitted through the aperture (5) significantly changes (the more degraded, the more the beam power rises) due to a degradation condition of an output mirror (2) when the output mirror in the laser oscillator (1) becomes in high thermal loading condition due to the laser beam with high beam power, so that the degradation condition of the output mirror (2) is determined.

Abstract: A system for measuring an optical spectral response of a photoelectric DUT includes a spectrally programmable light source including a broadband light source, a dispersive element for dispersing the light, and a spatial light modulator for controlling an intensity and a spectra of the light to provide a spectrally programmable light beam. A light distributing device is coupled to receive the spectrally programmable light beam and includes a light distributing structure for distributing the spectrally programmable light beam in a known ratio to a first area and a second area. A reference detector is positioned at the first area, and the DUT is positioned at the second area. Data acquisition electronics and a processor receive simultaneously generated output signals from the DUT and the reference detector to correct for intensity variation in the spectrally programmable light beam in determining the optical spectral response of the DUT.

Abstract: An intensity modulating element for a probe having a plurality of light emitters for phase-shift analysis and measurement is disclosed. The intensity modulating element comprises a plurality of columns of a plurality of grating elements formed by two opposing patterns.

Abstract: The present invention includes a method of changing intensity of a reflected beam which may be expressed as a method of changing the amount of reflected light from a beam of light, the method comprising: (a) providing a substrate bearing a film of a reflective material; (b) directing a first beam of light at a reflecting point upon the reflective material so as to create a reflecting beam therefrom; (c) directing a second beam of light at the reflecting point upon the reflective material so as to alter the amount of light in the reflecting beam, and (d) detecting the change in the amount of light in the reflecting beam. The invention also includes an apparatus for changing the amount of reflected light from a beam of light and measuring that change, as well as related apparatus for a pulsed optical signal.

Abstract: A system for monitoring thin-film fabrication processes is herein disclosed. Diffraction of incident light is measured and the results are compared to a predictive model based on at least one idealized or nominal structure. The model and/or the measurement of diffracted incident light may be modified using the output of one or more additional metrology systems.

Abstract: Described is an optical information medium measurement method of measuring a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers. The method includes measuring the modulation degree of each layer of the optical information medium, by use of a measurement optical system, obtaining a thickness between layers of the optical information medium, obtaining a reflectance of each layer of the optical information medium, and converting the measured modulation degree of each layer into a modulation degree at a reference optical system differing from the measurement optical system, based on a value indicative of the obtained thickness between layers and a value indicative of the obtained reflectance of each layer.

Abstract: An optical detector senses the intensity of scattered light reflected by a surface coupled to a vibration source. If the vibration source is operating, the coupled surface vibrates at the same frequency. Incident light reflected by the surface is modulated by the vibration at a hypertemporal frequency. The detector produces a direct electrical current as a temporal function of the detected modulated light intensity. A transimpedance amplifier converts the current into a voltage. A voltage amplifier amplifies the voltage. An analog-to-digital converter converts the amplified voltage into digital signal. A digital signal processor converts the digital signal into a function of power spectral density and frequency using Fourier transform and principle component analyses. The vibration signature of the vibration source, if present, is discerned from a graphical display of the foregoing function.

Abstract: An optical information medium measurement method measures a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers. The method includes measuring the modulation degree of each layer of the optical information medium, obtaining a thickness between layers of the optical information medium, obtaining a reflectance of each layer of the optical information medium, and converting the modulation degree of each layer. The modulation degree is measured based on a value indicative of the thickness between layers, and a value indicative of the reflectance of each layer.

Abstract: An optical information medium measurement method, for measuring a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers, includes a first step of measuring a modulation degree of each layer of the optical information medium, and a second step of obtaining a thickness between layers of the optical information medium. Further, the method includes a third step of obtaining a reflectance of each layer of the optical information medium, and a fourth step of converting the modulation degree of each layer, as measured in the first step, into a modulation degree at a reference optical system differing from the measurement optical system, based on a value indicative of the thickness between layers, the thickness being obtained in the second step, and a value indicative of the reflectance of each layer, as obtained in the third step.

Abstract: The invention relates to an analytical system and method for generating and metering optical signals. The invention includes an optical system having an illuminating system and a sensor platform. The illuminating system includes an arrangement identified as “SLM” for the temporally rapidly variable spatial light modulation, by which in an operating state, illuminating patterns of a freely selectable and rapidly variable geometry, which can be determined by the settings of the SLM, can be generated on the sensor platform from an illuminating light, which enters into this SLM and which includes a substantially homogenous intensity distribution in the in the cross section of the illuminating light at right angles to its direction of expansion.

Abstract: A method and system for improved image quality using an image quality matching method is used to match the optical density of single prints produced on multiple print engines by first sensing the optical density of a first image produced on a first print engine and then sensing the optical density of a second image produced on a second print engine before comparing the optical densities and determining if they are substantially equal. If they are not equal set points and exposures are adjusted on one or both print engines until the differences between the optical densities is less than 0.05, preferably 0.03. The density is changed by adjusting the initial voltage on the primary imaging member of at least one print engine and/or by adjusting the exposure of the primary imaging member of at least one print engine.

Abstract: A detection device based on the surface plasmon resonance effect, including a radiation emitter and a radiation detector, a fluidic substrate, a liquid crystal layer and respective control mechanism.

Abstract: Carrier activation and end-of-range defect density of ultra-shallow junctions in integrated circuits are determined using modulated optical reflectance signals, DC reflectances of pump or probe laser beams, and in-phase and quadrature signal processing. A method for determining characteristics of an ultra-shallow junction includes periodically exciting a region of the substrate using a pump laser beam, and reflecting a probe laser beam from the excited region. A modulated optical reflectance signal is measured along with DC reflectance of the probe laser beam. The modulated optical reflectance signal and DC reflectance are compared with reference signals generated from calibration substrates to determine carrier activation and end-of-range defect density in the junction.

Abstract: A reticle defect inspection apparatus that suppresses deterioration of optical components resulting from luminescent spots generated by an integrator and can sustain a defect inspection with high precision for a long time is provided. The reticle defect inspection apparatus is a reticle defect inspection apparatus for inspecting for defects on a reticle using a pattern image obtained by irradiating the reticle on which a pattern is formed with light. And the apparatus includes an illuminating optical system for irradiating the reticle with an inspection light and a detecting optical system for detecting a pattern image of the reticle irradiated with the inspection light, wherein the illuminating optical system comprises an integrator for equalizing illumination distribution of the inspection light and a moving mechanism for enabling the integrator to slightly move in a direction perpendicular to an optical axis of the integrator.

Abstract: This application describes designs, implementations, and techniques for controlling propagation mode or modes of light in a common optical path, which may include one or more waveguides, to sense a sample.

Abstract: A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.

Abstract: A method of detecting the condition of a turf grass is described. According to one aspect of the invention, the method comprises steps of attaching an active sensor to a mower; traversing a section of turf grass; and processing the output of the sensor. A device for detecting the condition of turf grass is also disclosed. The device comprises an array of illuminating devices generating a pattern of illuminating light; a detecting device receiving a pattern of reflected light which is coincident with the pattern of illuminating light; a detecting device adapted to detect stray light from the array of illuminating devices; and a feedback loop controlling the array of illuminating devices. A system employing the device is also disclosed.

Abstract: Provided is an optical apparatus having high durability, less optical absorption than a hole-type metal thin film filter, high transmittance and high reflectance, and variable optical characteristics. The apparatus includes: a dielectric substrate; a metal structure group including multiple metal structures two-dimensionally and discretely disposed at regular intervals; and a dielectric layer covering the metal structure group, in which: the metal structures have a first length equal to or shorter than a predetermined wavelength in a visible light region in one direction, and a second length equal to or shorter than the wavelength in a perpendicular direction; and the metal structures resonates with light entering the dielectric substrate or the dielectric layer, having a variable dielectric constant, to generate localized surface plasmon resonance on a surface of the metal structures to have a minimum transmittance or a maximum reflectance of the light having the wavelength.

Abstract: An image printing system includes a print engine and a sensing system. The print engine is configured to print a marking material image on a image bearing surface. The sensing system includes a plurality of illuminators, a modulator, a sensor, and a demodulator. Each illuminator is configured to simultaneously emit a light beam at the marking material image on the image bearing surface, thereby producing reflectance from the marking material image at least in a first direction. The modulator is configured to modulate an intensity characteristic of each of the light beams emitted by the illuminators such that each light beam has a different modulated waveform characteristic, where the waveform characteristic includes at least frequency. The sensor is configured to detect the reflectance from the plurality of light beams in the first direction and output a reflectance signal.

Abstract: The present invention provides for a novel method and apparatus for the simultaneous generation and detection of optical diffraction interference pattern on a photo detector. The monitoring method and apparatus disclosed herein comprises of a (any) continuous wave coherent collimated beam of light (or a laser) falling on an (any) optically reflective coating on the surface of the body with inherent vibrations, or with manifest vibrations induced from another source through any medium where the said light is reflected, and then received on the surface of a (any) photo detector in such a way that the received light falls partially on the active sensing area, and partially on the outer perimeter of the active sensing area.

Abstract: Provided is a scanning optical measurement apparatus having super resolution.

Abstract: The present invention includes a method of changing intensity of a reflected beam which may be expressed as a method of changing the amount of reflected light from a beam of light, the method comprising: (a) providing a substrate bearing a film of a reflective material; (b) directing a first beam of light at a reflecting point upon the reflective material so as to create a reflecting beam therefrom; (c) directing a second beam of light at the reflecting point upon the reflective material so as to alter the amount of light in the reflecting beam, and (d) detecting the change in the amount of light in the reflecting beam. The invention also includes an apparatus for changing the amount of reflected light from a beam of light and measuring that change, as well as related apparatus for providing a pulsed optical signal by changing the amount of reflected light from a beam of light.

Abstract: A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.

Abstract: In a laser machining apparatus that performs machining by a laser beam (4) emitted from a laser oscillator (1), the laser machining apparatus herein provided includes an aperture (5) placed in a light path of the laser beam (4) emitted from the laser oscillator (1) so as to block a perimeter portion of the laser beam (4) and to transmit a middle portion thereof, and a beam-power measurement sensor (6) for measuring beam power of a laser beam (20) transmitted through the aperture (5), whereby it utilizes that beam power of the laser beam transmitted through the aperture (5) significantly changes (the more degraded, the more the beam power rises) due to a degradation condition of an output mirror (2) when the output mirror in the laser oscillator (1) becomes in high thermal loading condition due to the laser beam with high beam power, so that the degradation condition of the output mirror (2) is determined.

Abstract: An optical information medium measurement method of the present invention, for measuring a degree of modulation in an optical information medium of a multilayered structure having a plurality of information layers, includes a first step of measuring the modulation degree of each layer of the optical information medium, by use of a measurement optical system, a second step of obtaining a thickness between layers of the optical information medium, a third step of obtaining a reflectance of each layer of the optical information medium, and a fourth step of converting the modulation degree of each layer, the modulation degree being measured in the first step, into a modulation degree at a reference optical system differing from the measurement optical system, based on a value indicative of the thickness between layers, the thickness being obtained in the second step, and a value indicative of the reflectance of each layer, the reflectance being obtained in the third step.

Abstract: An object detector has a light projecting unit that projects light, a light scanning actuator that scans the light, and a light receiving unit. The light scanning actuator includes plate springs, each having a thin-plate shape and one end in a longitudinal direction thereof being fixed; a movable part attached to the other ends in the longitudinal directions of the plate springs; and an electromagnetic driving unit having a magnet that generates a magnetic flux, a yoke that forms a closed magnetic circuit with the magnet and has a part being stacked on the magnet, and a coil held by the movable part and positioned in a gap between the magnet and the yoke such that an aperture plane is substantially orthogonal to a stacking direction of the magnet and the yoke, the electromagnetic driving unit configured to drive the movable part by an electromagnetic force applied to the coil.