Abstract: An optical system includes more than two optical interferometers that generate interference phenomena between optical waves to measure a plurality of distances, a plurality of thicknesses, and a plurality of indices of refraction of a sample. An electromagnetic detector receives an output of the optical interferometers to render a magnified image of at least a portion of the sample. A controller reduces or eliminates undesired optical signals through a hierarchical phase unwrapping of the output of the electromagnetic detector.

Abstract: The aim is to be able to determine the spatial structure of an ear canal in a simple and reliable fashion. To this end, it is proposed to produce a hologram of the ear canal, by inserting a holography unit at least partially into the ear canal. The data for the shape of a housing shell or an otoplastic can then be obtained from the resulting hologram for automatic manufacturing methods.

Abstract: An interferometer for optically measuring an object (10), including a light source (1), at least one beam splitter (2) and at least one detector (12a, 12b), with the beam splitter being arranged in the beam path of the light source such that a light beam created by the light source is split into a working beam (3) and a reference beam (4). The interferometer is embodied such that the working beam impinges on the object (10) to be measured and the working beam is at least partially reflected by the object and interfered with the reference beam on the detector (12a, 12b).

Abstract: An improved condition testing system and method includes a structure including a semiconductor material with a target portion and a second portion. The target portion has a first feature when at least one of the following occurs: an external force is received by the second portion of the structure and an internal condition occurs in the target portion. The system and method further has a interferogram shaped and located to produce a first optical interference pattern when the target portion and the interferogram are exposed to non-invasive illumination and when the target portion has the first feature. Further implementations use a second test interferogram spaced apart from the first test interferogram.

Abstract: A sensor for remotely detecting an object, the sensor comprising: a light source having a coherence length that is short relative to the distance between the sensor and the object; a splitter splitting the emitted light beam into an incident beam and a reference beam; a photorefractive crystal recording a hologram on interfering reception of the reference beam and of the reflected beam reflected by an object illuminated by the incident beam, and playing back the hologram in a diffracted beam that is re-emitted by the crystal by anisotropic diffraction under the effect of the reference beam; a detector recording information on receiving the diffracted beam; and a polarizing filter that eliminates the major fraction of the reflected beam as transmitted by the crystal on receiving the reflected beam; such that the detector receives only the diffracted beam from the crystal. Both the sensor and imaging systems incorporating the sensor enable measurements to be made through diffusing media.

Abstract: A system for detecting and locating water in a sandwich-type structure for aircrafts, the system including means for heating the water contained in an intermediate layer of the sandwich-type structure, and means for recording at least one image of a surface of the sandwich-type structure, the image showing particular regions of the surface, corresponding to the presence of water in the intermediate layer. The means for heating the water include a device for emitting microwaves inside the sandwich-type structure, at a frequency essentially equal to the resonance frequency of the water molecules. The invention also relates to a method implemented by the system.

Abstract: A method for optically testing semiconductor devices or wafers using a holographic optical interference system with an infrared or thermal light source providing a light beam of coherent wavelength with a wavelength to which the semiconductor material is transparent, splitting the light beam into a reference beam and an object beam, imposing the object beam on the semiconductor material to generate a reflected object beam reflected from interior structures of the semiconductor material, adjusting the angle of the reference beam relative to the object beam between a plurality of angles with the semiconductor material being a different state for each angle of the reference beam, imposing the reflected object beam and the reference beam onto a detection device to create a plurality of interference patterns, one for each of the reference beam angles, and comparing the interference patterns to one another to determine and display characteristics within the semiconductor material.

Abstract: An improved condition testing system and method includes a structure including a semiconductor material with a target portion and a second portion. The target portion has a first feature when at least one of the following occurs: an external force is received by the second portion of the structure and an internal condition occurs in the target portion. The system and method further has a grating shaped and located to produce a first optical interference pattern when the target portion and the grating are exposed to non-invasive illumination and when the target portion has the first feature. Further implementations use a second grating spaced apart from the first grating.

Abstract: Systems and methods for performing two-dimensional (2D) high resolution spectral-spatial mapping are described. At least one embodiment includes a spectrometer for performing two-dimensional (2D) high resolution spectral-spatial mapping comprising a Fabry-Perot component configured to receive a diffuse input beam and provide a high resolution spectral mapping of the diffuse input beam in a first direction. The spectrometer further comprises a volume hologram for increasing a spectral operating range, the volume hologram configured to perform spectral mapping in a second direction orthogonal to the first direction to increase the spectral operating range. The spectrometer further comprises a charged coupled device (CCD) configured to receive output beams, the output beams used to provide spectral analysis of the input beams.

Abstract: An improved condition testing system and method integrated into microelectronic circuits includes a structure including a semiconductor material with a target portion and a second portion for determining the presence and nature of various external (e.g. magnetic field, microwave, bioelectric or incident radiation) or internal stresses (e.g. binary circuit-state or analog signal recognition) or conditions acting upon the material. The target portion has a first feature when at least one of the following occurs: an external force is received by the second portion of the structure and an internal condition occurs in the target portion. The system and method further has a test grating determined and shaped and located to produce a first optical interference pattern when the target portion and the grating are exposed to non-invasive illumination and when the target portion has the first feature.

Abstract: A non-destructive method and device for analyzing a sample comprising transparent living and/or dead cells, by 5 means of a digital holographic microscope, where the sample (8) is exposed to light from a laser (2). The light that travels through the cells in the sample will experience a difference in the optical path length compared to the surrounding media and the wave front that emerges from the 10 cells will thus be phase shifted. This distortion can be detected in the digital hologram, which is reconstructed from the interference pattern detected by a digital sensor (17), such as a CCD or a CMOS, as phase differences or phase shifts and thereby creating a digital hologram. The 15 phase shift of each element of the hologram is then used for analyzing the characteristics of the cells in the sample.

Abstract: An input device for detecting input with respect to a three dimensional area in space. The input device includes an electromagnetic wave interference projector and receiver. The analysis of the difference between the projected interference pattern and the received interference pattern will determine the type and location of the user input. In addition, this holographic type of wave interference will display the image to be “manipulated” or “touched”.

Abstract: Disclosed herein is a method that relates to identifying a microorganism. The method comprising, diffracting laser light through a microorganism, combining a reference beam with the diffracted light on a single axis, and recording the combined light holographically as a three-dimensional image with a single exposure on a detector array. The method further comprising, reconstructing the holographic image and matching the reconstructed image with reference images of known microorganisms. Further disclosed herein is an apparatus for identifying a microorganism. The apparatus comprising, an interferometer to record an image of an unknown microorganism using single-exposure on-line (SEOL) digital holography, a means for reconstructing the recorded image, and a means for matching the reconstructed image with images of known microorganism.

Abstract: An optical system includes a substrate adapted for supporting a sample, where the substrate has a refractive index, nsub, larger than a refractive index of the sample, nsample, a source of electromagnetic radiation having wavelength, ?o, and a detector having multiple individual detector elements configured for detecting a signal resulting from an interaction of the electromagnetic radiation with the sample. The system includes dividing optics, directing optics, and control optics. The dividing optics are configured for dividing the electromagnetic radiation from the source into at least three substantially independent excitation beams.

Abstract: A process for generating a carrier in an interferogram in interferometry device either of the “real-time holographic interferometry” type or of the “double-exposure holographic interferometry” type, including recording a first wave front on a hologram, the first wave front coming from an object; generating a second wave front, in which two wave fronts are superimposed orthogonally polarizing said first and second wave fronts, either naturally or by a modification stage; and passing the orthogonally polarized two wave fronts through a birefringent crystal, a polarizer and a detector to make the two wave fronts interfere.

Abstract: An object of the present invention is to provide an electron microscope that employs a hologram of a diffraction pattern to reconstruct a microscopic image involving no imaging aberration due to image forming lenses, as well as a combined illumination lens used for such an electron microscope.

Abstract: The present invention provides an optical information reading device includes: a light source that irradiates, with reference beam, a hologram recorded in an optical recording medium; a reading unit that reads information from a holographic image reconstructed by the reference beam being diffracted by the hologram; a housing; a contact member of the housing contacting a paper; an open portion formed in the contact member, through which the optical recording medium is exposed and towards which the reference beam is emitted; an alignment mark formed at a periphery of the open portion, the reference beam irradiating the hologram satisfying a holographic image reconstruction condition by the alignment mark being aligned with an optical recording medium alignment mark recorded on the optical recording medium; and a viewing portion that is positioned in the housing and through which the alignment mark and the optical recording medium alignment mark are visible.

Abstract: The invention relates to a method and to an apparatus for interferometrically determining a deviation of an actual shape of an effective reflection surface (12) of a test object (14) from a desired shape of the effective reflection surface (12). In the method according to the invention electromagnetic illumination radiation (24) is produced by means of an illumination device (16) and provided as an input wave (30). The input wave (30) passes through a diffractive optical element (18) and leaves the latter as an incoming measuring wave (42), the wave front of the input wave (30) being transformed upon passing through the optical element (18) such that the wave front of the incoming measuring wave (42) is adapted to the desired shape of the effective reflection surface (12).

Abstract: An adaptive optics system comprises a beamsplitter configured to divide an incoming beam with an aberrated wave front into a first input beam and a second input beam, a microelectromechanical system configured to reflect the first input beam onto an image plane, and a self-reference wave front generator configured to spatially filter the second input beam to form a reference beam, and to interfere the reference beam with the first input beam on the image plane to form a hologram. The system further comprises an imaging device configured to capture an image of the hologram on the image plane, and one or more processors.

Abstract: The present invention relates to a method of reading information from a holographic data storage medium (10), comprising the steps of: projecting a reference beam (12) having defined properties of a first type into the holographic data storage medium, thereby generating a first diffracted beam (14), detecting the first diffracted beam by a detector array (16) having a plurality of detector areas, selecting a first set of detector areas useful for reconstructing information stored in the holographic data storage medium, reading out data from the first set of detector areas, and not reading out data from other detector areas, projecting a reference beam having defined properties of a second type different from the first type into the holographic data storage medium, thereby generating a second diffracted beam, detecting the second diffracted beam by the detector array having a plurality of detector areas, and selecting a second set of detector areas useful for reconstructing information stored in the holographi

Abstract: The present invention utilizes a holographic optical forcing array for dynamic cellular probing and diagnostics. A holographic optical trapping system generates optical forces on objects so that deformations thereof may be quantified. In one embodiment, digital holography is used to generate an interference pattern, and an analysis thereof determines the phase profile which yields a measurement of the objects' shape deformation using only one image. In another embodiment, phase-stepped holography allows the phase profile of an object to be measured using only one image, by using a holographic optical element to make phase-shifted replicas of the beam in space. In another embodiment, the optical forcing array applies optical forces to beads placed on the objects' surface, deforming the objects. The beads' position is determined by applying Mie theory, and analysis thereof yields the three dimensional position of the beads, and a measurement of the deformation displacement on the objects' surface.

Abstract: In one embodiment, a fingerprint sensing system includes a interference narrow band pass filter, a holographic optical element, a transparent slab stacked together with optical cement. The finger is placed on the filter and illuminated by a narrow band source, the center of its band shifted appropriately with respect to the pass band of the interference filter. A camera on the other side of the slab receives the fingerprint image. The light from the valleys and ridges propagating in the direction of the camera are blocked by the interference filter. The light from the ridges at steep angles are bent by the holographic optical element and then directed towards the lens. This way the ridges are seen by the camera, but not the valleys. In another embodiment, a miniaturized version, the interference filter, a modified holographic optical element, and a blocking filter (if necessary) to block room light can be sequentially attached to the image sensor.

Abstract: Apparatus and method for characterizing perceived visual quality of holographic materials, such as diffraction gratings. A white light source directs a collimated beam onto an embossed material. The first order diffracted light strikes a white background directly in view of a digital camera, which records an image. The image is analyzed to calculate total color intensity of the diffracted light and an estimate of the color distinctness. The data is compared to other samples to determine relative visual quality.

Abstract: A holographically, self-referenced interferometer may include a detector to detect interference fringes in a reference leg optical signal. The interferometer may also include a holographic correction device to holographically compensate the reference leg optical signal in response to the detected interference fringes.

Abstract: A series of holograms is recorded by synchronizing a camera with laser pulses under the control of a digital delay generator. Amplitude and phase images are calculated while image distances are adjusted for the best focus on the object under observation. The amplitude and phase images are reconstructed while adjusting the image distances over a predetermined range to maintain the object in focus. Numerical superposition of a plurality of holographic fields taken with varying wavelengths provides high resolution microscopic three-dimensional imaging. Numerical reconstruction is based on an angular spectrum method that enables calculation of the image at any distance from the hologram plane. Wavelength scanning digital interference holography also enables image reconstruction along an arbitrarily tilted plane.

Abstract: The invention concerns a quantitative phase-contrast digital holography method for the numerical reconstruction of images, comprising the following steps: A. acquiring a digital hologram of an investigated object; B. reconstructing the digital hologram in a reconstruction plane; C. reconstructing the complex field for the digital hologram; D. obtaining the phase map starting from the complex field; the method being characterised in that it further comprises the following steps: E. applying to the digital matrix of any step A, B, C a shear sx and/or sy respectively along directions x and/or y; F. subtracting the matrix obtained in step E from the starting matrix of step E, or vice versa; G. integrating the obtained matrix along directions x and/or y; H. calculating at least a defocus aberration term; I. subtracting said at least a term calculated in step H from the matrix obtained in step G, the steps G to I being subsequent to step D.

Abstract: An interferometer for optically measuring an object (10), including a light source (1), at least one beam splitter (2) and at least one detector (12a, 12b), with the beam splitter being arranged in the beam path of the light source such that a light beam created by the light source is split into a working beam (3) and a reference beam (4). The interferometer is embodied such that the working beam impinges on the object (10) to be measured and the working beam is at least partially reflected by the object and interfered with the reference beam on the detector (12a, 12b).

Abstract: The present invention utilizes spatially modulated optical force microscopy (SMOFM) with single beam optical force probing capability or with a holographic optical trapping system capable of multi-beam optical force probing coupled to a microscope objective, to generate a probe beam(s) as a force probe to perturb the object that is adhered or resting on a surface, so that deformations of the object may subsequently be quantified. This quantification is performed by imaging a sequence of four phase shifted replicas of the image using a computer-controlled spatial light modulator, and calculating the pixel by pixel optical path-length using existing algorithms. The change in optical path lengths, and consequently the viscoelastic or elastic response elicited, is an indication of damage or disease when the objects are cells. In another embodiment, the optical deformability of the cells may be measured and correlated with measurements of cytoskeletal/structural protein expression.

Abstract: The invention serves for the contour measurement and/or deformation measurement of an object, particularly a tire or a structural component of a composite material. The object is irradiated with light, particularly structured light, that is emitted by a radiation source and consists, in particular, of coherent light or partially coherent light, especially laser light. The light reflected by the object is picked up by a camera with an imaging sensor. In order to improve the image quality, a first image is produced with a first adjustment of the camera and/or the radiation source which is adapted to a first image region (13). In addition, a second image is produced with a second adjustment of the camera and/or the radiation source which is adapted to a second image region (12). Both images are combined (FIG. 5).

Abstract: Various systems and methods for analysis of optical pulses are provided. In one embodiment, an optical system is provided having an optical axis. The optical system includes a two-dimensional diffraction grating positioned along the optical axis, and a spectral filter positioned along the optical axis after the two-dimensional diffraction grating. The spectral filter is angularly offset about a vertical transverse angle associated with the optical system. The diffraction grating is angularly offset about the optical axis relative to the spectral filter, and an optical capture device positioned after the spectral filter.

Abstract: A double-biprism electron interferometer is an optical system which dramatically increases the degree of freedom of a conventional one-stage electron interferometer. The double-biprism electron interferometer, however, is the same as the optical system of the single electron biprism interferometer in terms of the one-dimensional shape of an electron hologram formed by filament electrodes, the direction of an interference area and the azimuth of the interference fringes. In other words, the longitudinal direction of the interference area is determined corresponding to the direction of the filament electrodes, and the azimuth of the interference fringes only coincides with and is in parallel with the longitudinal direction of the interference area.

Abstract: A method for optically testing semiconductor devices or wafers using a holographic optical interference system with light source providing a light beam of coherent wavelength with a wavelength to which the semiconductor material is transparent, splitting the light beam into a reference beam and an object beam, imposing the object beam on the semiconductor material to generate a reflected object beam reflected from interior structures of the semiconductor material, adjusting the angle of the reference beam relative to the object beam between a plurality of angles with the semiconductor material being a different state for each angle of the reference beam, imposing the reflected object beam and the reference beam onto a detection device to create a plurality of interference patterns, one for each of the reference beam angles, and comparing the interference patterns to one another to determine and display characteristics within the semiconductor material.

Abstract: An improved condition testing system and method includes a structure including a semiconductor material with a target portion and a second portion. The target portion has a first feature when at least one of the following occurs: an external force is received by the second portion of the structure and an internal condition occurs in the target portion. The system and method further has a grating shaped and located to produce a first optical interference pattern when the target portion and the grating are exposed to non-invasive illumination and when the target portion has the first feature. Further implementations use a second grating spaced apart from the first grating.

Abstract: A volume hologram includes: an incidence surface onto which coherent light having a plurality of wavelengths is incident; and a plurality of interference fringes having streaks so that the angles between the streaks and the incidence surface are different from each other and so that the each interference fringe corresponds to one wavelength of the coherent light.

Abstract: A method for optically testing semiconductor devices or wafers using a holographic optical interference system with a light source providing a light beam of coherent wavelength with a wavelength to which the semiconductor material is transparent, splitting the light beam into a reference beam and an object beam, imposing the object beam on the semiconductor material to generate a reflected object beam reflected from interior structures of the semiconductor material, adjusting the angle of the reference beam relative to the object beam between a plurality of angles with the semiconductor material being in a different state for each angle of the reference beam, imposing the reflected object beam and the reference beam onto a detection device to create a plurality of interference patterns, one for each of the reference beam angles, and comparing the interference patterns to one another to determine characteristics within the semiconductor material.

Abstract: The test system includes an electronic device comprising a camera for forming an image on a detector. A holographic element of the test system and the camera under test of the electronic device are arranged during testing to be placed at a predetermined distance from one another where the holographic element is unfocused in the image field of the camera under test, and the holographic element comprises a holographic test image that is arranged to form a focused image on the detector of the camera operating as desired.

Abstract: There is provided a chirp indicator of ultrashort optical pulse in which a target ultrashort optical pulse is introduced into a spatial filter formed of a hologram in which is recorded information of chirp quantity of an ultrashort optical pulse used as a reference. The chirp indicator identifies the chirp quantity of the ultrashort optical pulse by detecting an optical correlation between the target ultrashort optical pulse and the ultrashort optical pulse used as a reference. Here, the ultrashort optical pulse to be detected is detected for each hologram, and depending on intensity of an amplitude of light emitted from each hologram, a composition ratio of chirp quantity corresponding to each hologram is deteremined. Then, based on the determined mixture ratio of the chirp quantity, chirp quantity of the ultrashort optical pulse to be detected is determined.

Abstract: A sensing method, which comprises subjecting a holographic sensor to an external physical interaction to which the sensor is sensitive, and observing a change in the holographic image.

Abstract: The present invention relates to a holographic storage system, and more specifically to a method for pixel detection in a coaxial holographic storage system. In a holographic storage system according to the invention, with a coaxial arrangement of an object beam and a reference beam the bright pixels within the object beam have a phase shift of essentially ?0 relative to the reference beam. For readout of a data page contained in a reconstructed object beam a detector detects an interference pattern generated by the interference between the reference beam and the reconstructed object beam.

Abstract: Systems and methods for shearless digital hologram acquisition, including an apparatus incorporating an illumination source configured to produce a first beam of light, which is then split by a beamsplitter into a reference beam and an object illumination beam. The reference beam is directed onto a phase-shaping optical element which imparts a phase shift to the reference beam and returns the phase-shifted reference beam on itself to the beamsplitter. The object illumination beam is directed onto an object, and a portion of the beam is reflected back to the beamsplitter, which combines the phase-shifted reference beam and object illumination beam substantially coaxially. The combined beams are passed through a focusing lens which focuses them at a focal plane. A digital recorder is positioned at the focal plane to record the spatially heterodyne hologram formed by the focused phase-shifted reference beam and reflected object illumination beam.

Abstract: A transmission mask or cooled aperture is used in spectroscopy to compressively sample an optical signal. The locations of transmissive and opaque elements of the mask are determined by a transmission function. The optical signal transmitted by the mask is detected at each sensor of a plurality of sensors dispersed spatially with respect to the mask. A number of estimated optical signal values is calculated from sensor measurements and the transmission function. The optical signal is compressed by selecting the transmission function so that the number of measurements is less than the number of estimated optical signal values. A reconstructed optical signal is further calculated using signal inference. An imaging system created from plurality of encoded subimaging systems compressively samples an optical signal.

Abstract: An apparatus operable to record a spatially low-frequency heterodyne hologram including spatially heterodyne fringes for Fourier analysis includes: a laser; a beamsplitter optically coupled to the laser; an object optically coupled to the beamsplitter; a focusing lens optically coupled to both the beamsplitter and the object; a digital recorder optically coupled to the focusing lens; and a computer that performs a Fourier transform, applies a digital filter, and performs an inverse Fourier transform.

Abstract: Systems and methods are described for faster processing of multiple spatially-heterodyned direct to digital holograms.

Abstract: Systems and methods are described for reduction of reference hologram noise and reduction of Fourier space smearing, especially in the context of direct-to-digital holography (off-axis interferometry). A method of reducing reference hologram noise includes: recording a plurality of reference holograms; processing the plurality of reference holograms into a corresponding plurality of reference image waves; and transforming the corresponding plurality of reference image waves into a reduced noise reference image wave.

Abstract: A method of recording a spatially low-frequency heterodyne hologram, including spatially heterodyne fringes for Fourier analysis, includes: splitting a laser beam into a reference beam and an object beam; interacting the object beam with an object; focusing the reference beam and the object beam at a focal plane of a digital recorder to form a spatially low-frequency heterodyne hologram including spatially heterodyne fringes for Fourier analysis; digital recording the spatially low-frequency heterodyne hologram; Fourier transforming axes of the recorded spatially low-frequency heterodyne hologram including spatially heterodyne fringes in Fourier space to sit on top of a heterodyne carrier frequency defined by an angle between the reference beam and the object beam; cutting off signals around an origin; and performing an inverse Fourier transform.

Abstract: A Real-Time Optical Correlating System produces holograms that contain both amplitude and phase information and have none of the time constraints of the traditional holographic methods. It has been demonstrated to operate at television field rates (60 Hz) employing currently available devices of moderate resolution. Using the System, the holographic matched filter of an input scene is calculated optically as an analog sum, captured by a charge-coupled device (CCD) camera and transmitted directly or through a computer to and displayed on a commercially available liquid crystal display (LCD) device. The correlation plane may be viewed immediately on a suitable screen because there is no film to process or computer calculations to be performed. Concurrently with the creation of the holographic matched filter of the input scene, a Fourier transform of a test scene is produced and both are imaged on another charge-coupled device camera for any correlation between the input and test scenes.

Abstract: In one embodiment, an apparatus for measuring pressure is provided including a holographic element containing at least one volume hologram; a reference member; a sensing member coupled to the pressure being measured, and at least one light source; wherein the device operates by passing a reference light beam between the reference member and the holographic element, the reference beam having a constant optical path, and passing a sensing light beam between the sensing member and the holographic element, the sensing beam having optical path that varies as a function of the pressure; the volume hologram converting the reference beam and the sensing beam into an information light beam the intensity of which is a measure of the pressure. Preferably, the reference member and the sensing member are made from the same material.

Abstract: The present invention is a phase-imaging technique by digital holography that eliminates the problem of 2&pgr;-ambiguity. The technique is based on a combination of two or more digital holograms generated using multiple wavelengths. For a two-wavelength experiment, the phase maps of two digital holograms of different wavelengths are subtracted which yields another phase map whose effective wavelength is inversely proportional to the difference of wavelengths. Using two holograms made with a 633 nm HeNe laser and a 532 nm doubled YAG laser an image was obtained that is a 3D reconstruction of a reflective surface with axial resolution of ˜10 nm over a range of −5 um, without any phase discontinuity over this range. The method can be extended to three wavelengths or more in order to reduce the effect of phase noise further.

Abstract: An improvement is provided for a system that identifies particles such as microorganisms in fluid by directing a laser beam (52) forwardly through a tiny detect zone (46) in the fluid and detecting the pattern of light scatter by a particle as it passes through the detect zone. The improvement includes a holographic optical element (60) positioned forward of the detect zone to intercept light scattered in multiple directions by the particle. The holographic optical element is divided into discrete areas, or sections, that each directs intercepted scattered light toward a selected photodetector (74, 90, 92) of a linear array (62) of photodetectors. A converging lens (106) reduces the required diffraction angles of the sections of the holographic optical element. This arrangement avoids the need to custom mount and connect numerous individual photocells, and enables simplified high speed readout of the photodetectors.

Abstract: A three dimensional true color holographic imaging system using three primary color Fresnel-Zone-Pattern laser generators combined as a single beam that scans the target and the reflections of which are sensed simultaneously by a single electronic detector. The detector signals corresponding to each generator are then separated electronically and independently recorded.