Abstract: It is to be possible for the chromatic dispersion of a sample (4) to be determinable in an improved manner. To this end the sample (4) is radiographed, in an interferometer (10), with the light of a radiation source (1). A downstream polarimeter (50) measures both the power changes and the polarisation changes of the interference radiation. In the downstream evaluation unit (7) the wavelength-dependent chromatic dispersion can be determined.

Abstract: A photocoupler 3 splits the light from a low-coherence light source 1 into measuring light DL and local oscillator light KL. A photocoupler 5 receives measuring light DL arid is input to an optical circuit 7 to be measured. The photocoupler 5 splits the reflected light RL. A polarization controller 9 controls the state of polarization of the reflected light RL as split by the photocoupler 5. A photocoupler 13 allows local oscillator light KL to be incident on a reflector mirror 16 and splits local oscillator light KL. A photocoupler 11 combines the reflected light RL as controlled in the state of polarization by the polarization controller 9, with the local oscillator light KL.

Abstract: A sensor platform for use in sample analysis comprises a substrate (30) of refractive index (n1) and a thin, optically transparent layer (32) of refractive index (n2) on the substrate, (n2) is greater than (n1). The platform incorporates one or multiple corrugated structures in the form of periodic grooves (31), (33), which defines one or more sensing areas each for one or more capture elements. The grooves are so profiled, dimensioned and oriented that when coherent light is incident on the platform it is diffracted into individual beams or diffraction order resulting in reduction of the transmitted beam and an abnormal high reflection of the incident light thereby creates an enhanced evanescent field at the surface of the or each sensing area. The amplitude of this field at the resonant condition is greater by an order of approximately 100 than the field of prior art platforms so that the luminescence intensity created from samples on the platform is also increased by a factor of 100.

Abstract: A multi-function opto-electronic detection apparatus for detecting molecular characteristics of a test sample. The appratuses comprises functional mode subsystems including a detecting light source subsystem for generating sampling beams for illuminating the test sample; a manipulation optics subsystem for aligning the sampling beam onto the test sample; a target signal processing subsystem for analyzing target beams emerging from the test sample resulting from the illuminating of the sampling beam; and a sample fixation subsystem for holding the test sample. The detecting light source subsystem, manipulation optics subsystem and target signal processing subsystem are assembled into one of several possible optical sampling setups for the detection characteristics of the test sample. The functional mode setups include at least ellispometer, confocal image scanner, photon tunneling scanning microscope and interferometer.

Abstract: The present invention provides a continuous-zoom imaging device of an interferometer. Reflected lights of a reference plane and a test plane interfere with each other to generate an interference pattern. A collimation device converts a parallel light of the interference pattern into a convergent light. An optical path adjustment means guides the light to a polarizing beam splitter. A continuous-zoom device adjusts the magnification ratio of the interference pattern on the imaging passageway and to output an object image, which is then imaged on a charge-coupled device. The present invention can improve the quality of the interference pattern without using any rotating diffuser, and thus has the characteristics of reduced number of components, lowered cost, and shrunk volume. Besides, the present invention can utilize a joint device to connect the continuous-zoom device and an attenuator so as to achieve automatic light adjustment and convenient operation.

Abstract: Interleavers, based on a Michelson interferometer with a Gires-Tournois (GT) etalon in each arm, are becoming popular in the filtering of light in the fiber optics telecommunications industry. As the channel spacing becomes closer together, e.g. 50 GHz or 25 GHz, dispersion compensation becomes an important factor in the choice and design of a system. The present invention solves the problem of increased chromatic dispersion by utilizing multi-cavity Gires-Tournois (MCGT) etalons, wherein the dispersion from one MCGT is used to compensate or cancel the dispersion from the other MCGT. In an optimum design for a dual cavity GT etalon, the dispersion profile of the first MCGT will have a similar amplitude and frequency as the dispersion profile of the second MCGT, only shifted by half the period so that the positive slopes of one profile are aligned with the negative slopes of the other profile.

Abstract: A near-field, interferometric optical microscopy system includes: a beam splitter positioned to separate an input beam into a measurement beam and a reference beam; a mask positioned to receive the measurement beam, the mask comprising at least one aperture having a dimension smaller than the wavelength of the input beam, wherein the mask aperture is configured to couple at least a portion of the measurement beam to a sample to define a near-field probe beam, the sample interacting with the near-field probe beam to define a near-field signal beam; a detector having an element responsive to optical energy; and optics positioned to direct at least a portion of the reference beam and at least a portion of the near-field signal beam to interfere at the detector element.

Abstract: A method and an apparatus for determining the influencing of the state of polarization of optical radiation by an optical system under test, wherein radiation with a defined entrance state of polarization is directed onto the optical system, the exit-side state of polarization is measured, and the influencing of the state of polarization is determined by the optical system with the aid of evaluation of the exit state of polarization with reference to the entrance state of polarization. An analyser arrangement which can be used for this purpose is also disclosed. The method and the apparatus are used, e.g., to determine the influencing of the state of polarization of optical radiation by an optical imaging system of prescribable aperture, the determination being performed in a pupil-resolved fashion.

Abstract: A detection apparatus includes a differential interference contrast microscope, a device for changing the amount of retardation between the two polarized components, a device for photographing the image of an object to be observed, and a device for performing a calculation with respect to the image captured by this photographing device. In the detection apparatus, amounts of retardation between two polarized components split in an illumination optical system of the differential interference contrast microscope are detected to form two differential interference contrast images relative to the object in which the amounts of retardation between the polarized components are equal, but have different signs. Subsequently, in the two differential interference contrast images, a differential calculation and a summed calculation are performed with regard to respective corresponding pixels to obtain a differential image and a summed image.

Abstract: The invention relates to an entangled-photon apparatus capable of measuring particular characteristics of an optical element, device or channel and further capable of correcting for the effects of said characteristics in an optical communications signal propagating through the optical element. Specifically, the apparatus and a method of using said apparatus to measure and compensate polarization mode dispersion in an optical communications fiber is disclosed. The apparatus includes a source of entangled photons, which are injected into the device under test along with the communications signal, and a two branch quantum interference device (QID) for determining the state of entanglement of said photons after they pass through the device. The quantum interference device includes a variable, polarization-specific delay element that is incremented to equalize the twinon correlation in the two branches of the QID, and a second variable delay element to apply the compensation to the communications signal.

Abstract: In an interferometric sensing apparatus, a scrambler is positioned in front of a polarizer, followed by a detector. In that way, although the two beams remain orthogonal to each other, they are continuously rotated, relative to the polarizer. In some positions, both beams pass through the polarizer and interfere, thus eliminating polarization fading. The signal is amplitude modulated at the rotation frequency of the scrambler, but this modulation is removed by low pass filtering.

Abstract: A light beam from a laser source is divided into two light beams at a half mirror, and the plane of polarization of one of the two divided light beams is rotated by 90 degrees at a half-wave plate so as to be orthogonal to that of the other of the two divided light beams. The two divided light beams are superimposed and introduced into a sample to be measured in anisotropy. After passing through the sample, the superimposed light beam is split at a polarized light beam splitter into the above two light beams, and the plane of polarization of the other of the two light beam is rotated by 90 degrees at a half-wave plate so as to correspond to that of the one of the two light beams. Then, the two light beams is superimposed again at a half mirror, and an interference pattern of the superimposed light beam is projected on a screen.

Abstract: In order to reduce polarization dependent error, the polarization state of incident light is set to at least two different states of polarization, and a first optical property is determined separately for each of said at least two states of polarization. Then, an averaging procedure is carried out in order to obtain a mean value of the first optical property or of a property derived therefrom. Alternatively, the averaging procedure can be performed with respect to a DUT property of a device under test that is determined as a function of said first optical property.

Abstract: The present invention provides an interferometer. In one embodiment, the interferometer includes a translucent body having a first portion and a second portion, where the second portion has at least three internal reflective sides. The interferometer also includes an interface between the first and second portions, configured to reflect a portion of an optical signal received through the first portion and transmit a remaining portion of the optical signal into the second portion. Also disclosed are a method of manufacturing an interferometer and a transmitter incorporating the interferometer or the method.

Abstract: A two-beam interferometer splits an incident light in two optical paths, combines and outputs split lights together again. The two-beam interferometer generates at least one or more combined light made from two beams each having a polarization different from each other. A polarization state detector detects a variation in the polarization of the combined light generated by the two-beam interferometer. An electric circuit calculates an wavelength of the incident light based on the variation in the polarization detected by the polarization state detector. The two optical paths of the two-beam interferometer has a difference in length between a point of splitting the incident light and a point of combining the split lights, for the detection of polarization variation in the combined light by the polarization state detector. The optical path length difference between the two paths is fixed.

Abstract: The present invention relates to the measurement of birefringence, particularly the optical characterization of retardation and eigenpolarization of an unknown retarding device (22). An optical probe beam (24) with a pre-determined polarization (28) is split into two components (31,32), with constant dynamic phase difference. The beam components (31,32) pass through the retarding device (22) in opposite directions so that the polarization of each probe beam component (131,132) is retarded by an equal degree. Then, the retarded probe beam components (131,132) together pass through a polarizing analyzer (45) with a pre-determined polarization axis to resolve the polarization of each retarded probe beam component (131,132) along said axis. The polarization resolved beams (231,232) combine on an optical detector (50) so that the beams maintain the same dynamic phase and interfere coherently depending on the geometric phase between the two beams (231,232).

Abstract: The change in the circular birefringence of a sample is measured by passing a light beam comprised of a left circularly polarized (LCP) wave and a right circularly polarized (RCP) wave through a sample and measuring the change in the phase difference between the RCP and LCP waves.

Abstract: A method and apparatus for instantaneous measurement of the complete state of polarization across an image. A polarimetric encoding scheme is employed to uniquely map the spatially-varying state of polarization across a partially-polarized image to irradiance variations in a polarization-encoded interference pattern. In one embodiment of the method, two spatially-varying retarders and a linear polarizer comprise an interferometric polarization interrogating filter assembly. When a conventional irradiance image is presented to the filter assembly, it is decomposed into polarized and unpolarized components. While the unpolarized component passes through the filter substantially unaffected, the polarized component gives rise to a polarization-encoded interference pattern that overlaps the scene so that local regions within the image having specific polarization content may be recognized.

Abstract: The object of the invention is to provide an infrared circular dichroism measuring apparatus that improves the measuring time and the measuring accuracy.

Abstract: One form of the present invention is a dual channel optical reflectometer composed of a birefringent path coupler and an optical source path that is optically connected to the path coupler. After entering the path coupler, light is split into birefringent reference and sample paths. The reference path is optically aligned with a first collimating lens, and the collimating lens is directed into a scanning delay line. There is also a birefringent optical sample path that is also optically connected to the path coupler. The sample path is optically aligned with a polarization channel separator/combiner and a lens, to focus and direct optical beams into the turbid sample. Light backscattered from the turbid sample is collected by the second lens and orthogonal polarization channels are reunited by the polarization channel combiner. An analog-to-digital converter is connected to the amplifier, and a computer is connected to the analog-to-digital converter to analyze the output.

Abstract: An interference measuring apparatus has an optical system for dividing a coherent light beam into two light beams, causing the divided two light beams to pass along discrete optical paths and making them into linearly polarized light beams orthogonal to each other and given modulation to the phase of the wave front of at least one of them, and again superposing the wave fronts of the linearly polarized light beams one upon the other, a light dividing member for dividing the light beams superposed one upon the other by the optical system into a plurality of light beams, a rock crystal plate formed with a predetermined level difference in conformity with the incidence positions of the plurality of light beams, a polarizing plate for taking out each light beam transmitted through the rock crystal plate with a 45° polarized component, and a plurality of light receiving elements for individually receiving the light beams taken out by the polarizing plate, a plurality of different interference phase signals bei

Abstract: In an interferometric sensing apparatus, a scrambler is positioned in front of a polarizer, followed by a detector. In that way, although the two beams remain orthogonal to each other, they are continuously rotated, relative to the polarizer. In some positions, both beams pass through the polarizer and interfere, thus eliminating polarization fading. The signal is amplitude modulated at the rotation frequency of the scrambler, but this modulation is removed by low pass filtering.

Abstract: A GTIFR interferometer, for use in an interleaver or in a deinterleaver, wherein the GTIFR interferometer includes a Gires-Toutnois interferometer with a 45 degree Faraday rotator between the mirrors of the Gires-Tournois interferometer and further includes a 22.5 degree Faraday rotator in the light path to the Gires-Tournois interferometer and an interleaver or deinterleaver that contains one GTIFR. A dispersion compensated GTIFR interleaver includes a second Gires-Tournois interferometer for providing chromatic dispersion compensation.

Abstract: A GTIFR interferometer, for use in an interleaver or in a deinterleaver, wherein the GTIFR interferometer includes a Gires-Toutnois interferometer with a 45 degree Faraday rotator between the mirrors of the Gires-Tournois interferometer and further includes a 22.5 degree Faraday rotator in the light path to the Gires-Tournois interferometer and an interleaver or deinterleaver that contains one GTIFR. A dispersion compensated GTIFR interleaver includes a second Gires-Tournois interferometer for providing chromatic dispersion compensation.

Abstract: A near-field, interferometric optical microscopy system includes: a beam splitter positioned to separate an input beam into a measurement beam and a reference beam; a mask positioned to receive the measurement beam, the mask comprising at least one aperture having a dimension smaller than the wavelength of the input beam, wherein the mask aperture is configured to couple at least a portion of the measurement beam to a sample to define a near-field probe beam, the sample interacting with the near-field probe beam to define a near-field signal beam; a detector having an element responsive to optical energy; and optics positioned to direct at least a portion of the reference beam and at least a portion of the near-field signal beam to interfere at the detector element.

Abstract: A method and an apparatus for determination of properties, e.g. of elements of the Jones matrix of an optical device under test, comprising the steps of: producing an incoming light beam, splitting the light beam into a first light beam and a second light beam, coupling the first light beam, preferably having two parts delayed with respect to each other, with a given initial polarization into the optical device under test, letting the second light beam travel a different path than the first light beam, superimposing the first light beam and the second light beam to produce interference between the first light beam and the second light beam in a resulting superimposed light beam, splitting the superimposed light beam into a third light beam polarization dependent and a fourth light beam, detecting the power of the third and the fourth light beam as a function of frequency when tuning the frequency of the incoming light beam over a given frequency range, deriving optical properties, e.g.

Abstract: A near-field, interferometric optical microscopy system includes: a beam splitter positioned to separate an input beam into a measurement beam and a reference beam; a mask positioned to receive the measurement beam, the mask comprising at least one aperture having a dimension smaller than the wavelength of the input beam, wherein the mask aperture is configured to couple at least a portion of the measurement beam to a sample to define a near-field probe beam, the sample interacting with the near-field probe beam to define a near-field signal beam; a detector having an element responsive to optical energy; and optics positioned to direct at least a portion of the reference beam and at least a portion of the near-field signal beam to interfere at the detector element.

Abstract: Apparatus for measuring angular changes in the direction of travel of a light beam comprising at least one beam shearing assembly for separating, preferably orthogonally polarized, components of the light beam and introducing a lateral shear between them. An analyzer operates on the components to provide them with a common polarization state. A lens focuses the commonly polarized components of the light beam to a spot in a detector plane, and a detector operates to generate an electrical signal having a phase that varies in accordance with the angular change of the light beam in at least one plane. Electronic means receive the electrical signal, determines the phase therefrom, and converts the phase to the angular change in the direction of travel of the light beam.

Abstract: A method and apparatus for instantaneous measurement of the complete state of polarization across an image. A polarimetric encoding scheme is employed to uniquely map the spatially-varying state of polarization across a partially-polarized image to irradiance variations in a polarization-encoded interference pattern. In one embodiment of the method, two spatially-varying retarders and a linear polarizer comprise an interferometric polarization interrogating filter assembly. When a conventional irradiance image is presented to the filter assembly, it is decomposed into polarized and unpolarized components. While the unpolarized component passes through the filter substantially unaffected, the polarized component gives rise to a M polarization-encoded interference pattern that overlaps the scene so that local regions within the image having specific polarization content may be recognized.

Abstract: Apparatus for making wavelength-resolved polarimetric measurements comprises an interferometric source (10,12), for example a broadband source (10) and an optical interferometer unit (12), and a polarization generator unit (16) for generating different states of polarization of light received from the interferometric source and applying same to a device-under-test (30). A polarimeter unit (20) receives and polarimetrically-analyzes light from the device-under-test, converts the polarimetrically-analyzed light into electrical signals, and, using Fast Fourier Transform numerical analysis, computes therefrom the wavelength-resolved polarimetric measurements. Placing the optical interferometer unit (10,12) “upstream” not only of the device-under-test (30), but also of the polarisation generator unit (16), means that the latter substantially eliminates polarization dependent effects introduced by the former.

Abstract: A method for measuring acceleration uses an accelerometer apparatus having an optically transparent, stress-birefringent material, a source of polarized light positioned to direct a polarized beam of light into the optically transparent, stress-birefringent material, and a detector system positioned to detect an output beam from the optically transparent, stress-birefringent material. The accelerometer apparatus is accelerated, and the acceleration of the accelerometer apparatus is simultaneously determined from a measurement of stress-induced optical birefringence in the optically transparent, stress-birefringent material.

Abstract: An interferometer uses birefringent elements for splitting and combining beams of orthogonal polarization, and for changing the relative phase between the orthogonally polarized beams. A polarization sensitive detector is used to detect a fringe pattern whose periodicity is dependent on the relative optical paths traversed by the orthogonally polarized beams. In an embodiment of the invention, a birefringent beam splitter has an input path and first and second output paths. A birefringent beam combiner has first and second input paths and an output path, the first and second input paths of the birefringent beam combiner aligned respectively with the first and second output paths of the birefringent beam splitter. A polarization sensitive detector is disposed on the output path of the birefringent beam combiner to detect the periodicity of the fringe pattern.

Abstract: Apparatus and method for interferometric measurement of a change in the relative directions of propagation of components of an optical beam, for interferometric measurement of a change in the direction of propagation of an optical beam, and for interferometric measurments of the change in orientation of an object. An interferometer is arranged to intercept light beams to produce an output beam from which a detector generates an electrical signal having a phase that varies in at least one plane in accordance with the angular separation between the beams. Electronic processing determines the phase and converts it to the angle separating the light beams.

Abstract: An interferometer receives an input optical signal and outputs a signal after changing at least the dispersion of said signal. At least portions of the interferometer are adjustable to adjust at least a first dispersion parameter. Examples of dispersion parameters which are adjustable include dispersion magnitude, center wavelengths and waveshapes or slopes. Preferably the dispersion in the output signal is substantially reduced or substantially eliminated, compared to the dispersion of the input signal. By providing for adjustability of one or more dispersion parameters, a dispersion compensator can be appropriately adjusted for use in a variety of applications.

Abstract: The present invention comprises a tool for and a method of inspecting a mask used in photolithography to determine errors in phase, amplitude, and pattern edges. An embodiment of the tool comprises a laser source, a polarizing beam splitter, a first shutter, a mask, a second shutter, a quarter wave retarder, a single-mode optical fiber, and a CCD detector array. An embodiment of the method comprises four independent measurements of light intensity, comprising: a pattern of a mask, a diffraction pattern of a reference pinhole, an interference pattern of the mask and the reference pinhole, and an interference pattern of the mask and the reference pinhole with a known phase difference. Calculations are performed to determine phase and amplitude information as a function of location on the mask. The phase and amplitude information is then compared with a design layout of the mask to determine pattern edge information and identify possible defects in the mask.

Abstract: The change in the circular birefringence of a sample is measured by passing a light beam comprised of a left circularly polarized (LCP) wave and a right circularly polarized (RCP) wave through a sample and measuring the change in the phase difference between the RCP and LCP waves.

Abstract: Apparatus for splitting, imaging, and measuring wavefronts with a reference wavefront and an object wavefront. A wavefront-combining element receives and combines into a combined wavefront an object wavefront from an object and a reference wavefront. A wavefront-splitting element splits the combined wavefront into a plurality of sub-wavefronts in such a way that each of the sub-wavefronts is substantially contiguous with at least one other sub-wavefront. The wavefront-splitting element may shift the relative phase between the reference wavefront and the object wavefront of the sub-wavefronts to yield a respective plurality of phase-shifted sub-wavefronts. The wavefront-splitting element may then interfering the reference and object wavefronts of the phase-shifted sub-wavefronts to yield a respective plurality of phase-shifted interferograms. An imaging element receives and images the phase-shifted interferograms.

Abstract: A GTIFR interferometer, for use in an interleaver or in a deinterleaver, wherein the GTIFR interferometer includes a Gires-Toutnois interferometer with a 45 degree Faraday rotator between the mirrors of the Gires-Tournois interferometer and further includes a 22.5 degree Faraday rotator in the light path to the Gires-Tournois interferometer and an interleaver or deinterleaver that contains one GTIFR. A dispersion compensated GTIFR interleaver includes a second Gires-Tournois interferometer for providing chromatic dispersion compensation.

Abstract: Apparatus for splitting, imaging, and measuring wavefronts with a reference wavefront and an object wavefront. A wavefront-combining element receives and combines into a combined wavefront an object wavefront from an object and a reference wavefront. A wavefront-splitting element splits the combined wavefront into a plurality of sub-wavefronts in such a way that each of the sub-wavefronts is substantially contiguous with at least one other sub-wavefront. The wavefront-splitting element may shift the relative phase between the reference wavefront and the object wavefront of the sub-wavefronts to yield a respective plurality of phase-shifted sub-wavefronts. The wavefront-splitting element may then interfering the reference and object wavefronts of the phase-shifted sub-wavefronts to yield a respective plurality of phase-shifted interferograms. An imaging element receives and images the phase-shifted interferograms.

Abstract: A method and apparatus for interferometric measurement of a medium surface is disclosed. More particularly, a quadrature phase shift interferometer and a process for unwrapping phase are described. The interferometer has a reduced number of optical components though yields results sufficient to measure surface of a hard disc for final inspection. Defects on such a surface are characterized by their out-of-plane displacement with nanometer resolution.

Abstract: A multi-functional opto-electronic system is mainly applied to the real-time metrologies of biomedical or biochemical reactions as well as the in-situ manufacturing measurements of biochips. The configuration of this system is built up by integration of at least four different near-field optical metrological principles, which share a part of common optical path design and allow to turn on several functions such as ellipsometer, Laser Doppler vibrometer or interferometer (LDV/I), surface plasmon resonance (SPR) for amplitude and phase detection, phase shifting interference microscope, photon tunneling microscope, optical coherence tomography (OCT) and imaging microscope by switching few components in the system. With the creation of a novel opto-mechanical design and its associated signal processing methodologies, both the signal detection of the biomedical reactions and biomedical imaging concerned for the future trend in the modern biomedical sciences are achieved with high resolutions.

Abstract: An interferometer optical element is provided with a birefringent material in the light path. Specifically, a Fabry-Perot optical resonance cavity is operated in a fully reflective mode and is provided with a birefringent material in a cavity between two reflectors. A first mirror, for example of about 90% reflectance and a second mirror, for example of 99% reflectance, define the cavity. The polarization effect is applied exclusively to the resonant wavelength defined by the spacing of the two reflectors. The input beam is fully reflected back in the direction of incidence. However the resonant wavelength component therein is polarized and can be discriminated, e.g., selectively diverted by a polarization beam splitter. A number of application are disclosed, including using a birefringent liquid crystal material and tuning the apparent optical path length by electrically adjusting the birefringence.

Abstract: This invention relates to optical devices such as a fiber-optic frequency shifter and an optical interferometer. This invention also relates to a method of generating optical interference signals to obtain reliable sensor signals independent of polarization fluctuations of the optical waves in the fiber. Fiber-optic interferometers have many advantages such as high sensitivity and convenient way of using even in poor surrounding environments. These interferometer, however, exhibit polarization dependent signal degradation since the polarization of a light wave passing through an optical fiber irregularly changes depending on the birefringence of the fiber. This invention is characterized in that the frequencies of two orthogonal eigen polarizations of a light wave are shifted to different frequency values at one optical path of the interferometer. They produce two beat interference signals after interfering with the light wave passed through the other optical paht of the interferometer.

Abstract: A retarder includes a birefringent film embedded in an adhesive between two plates, The adhesive is index matched to the birefringent film.

Abstract: Interleavers are a useful tool in wavelength division multiplexing (WDM) to separate a signal with closely spaced channels into two signals, e.g. odd and even ITU channels, each with twice the channel spacing. Alternatively, two signals with a large channel spacing can be combined into a single beam with half the channel spacing. The invention relates to an optical interferometer using rhomb prisms as resonant cavities, which, when properly designed, provide the necessary phase shifts for interleaving or de-interleaving sets of optical wavelength channels. The present invention utilizes the differential phase shift between orthogonally polarized components induced by total internal reflection (TIR) off the surfaces of the rhomb prisms. Dispersion reducing techniques are also disclosed, including multiple rhomb interleavers and multi-pass rhomb interleavers.

Abstract: Optical interferometery is used to probe an integrated circuit device under test (DUT). During each cycle of a repetitive electrical test pattern applied to the DUT a reference pulse is provided at a fixed time relative to the test pattern, and a probe pulse is provided at a time scanned through the test pattern in the manner of equivalent time sampling. The probe and reference light pulses are each split to provide at least a second probe pulse and a second reference pulse. One probe pulse and one reference pulse interact with the DUT at the same physical location, but at displaced times with respect to each other. The second probe pulse and the second reference pulse travel an optical delay path with length controlled to compensate for motions of the DUT. The probe pulses are recombined and detected to provide a probe interference signal. The reference pulses are recombined and detected to provide a reference interference signal.

Abstract: The present invention provides a multi-functional separator which may be used as a demultiplexer or as a multiplexer in wavelength division multiplexed optical communication systems. The preferred embodiment of the multi-functional separator includes a first polarization beam splitter, a non-reciprocal rotator; a reciprocal rotator, a second polarization beam splitter, and a non-linear interferometer. Each of the polarizing input and polarizing output ports includes an optical fiber, a collimator, a birefringent walk-off plate and a non-reciprocal optical rotator. The collimator includes a glass plate and a lens/spacer element between the glass plate and the birefringent walk-off plate. The multi-functional separator is easily aligned by adjusting the positions of each of the polarizing input and output port. Further embodiments of the present invention provide additional optical isolation, optical circulation, optical comb filtering and/or two-stage channel separation capabilities.

Abstract: A dispersion compensated optical signal interleaver having GTI based interferometer for interleaving and deinterleaving sets of odd and even channels and having an additional GTI interferometer for compensating the chromatic dispersion arising from the first interferometer.

Abstract: Interleavers, based on a Michelson interferometer with a Gires-Tournois (GT) etalon in each arm, are becoming popular in the filtering of light in the fiber optics telecommunications industry. As the channel spacing becomes closer together, e.g. 50 GHz or 25 GHz, dispersion compensation becomes an important factor in the choice and design of a system. The present invention solves the problem of increased chromatic dispersion by utilizing multi-cavity Gires-Tournois (MCGT) etalons, wherein the dispersion from one MCGT is used to compensate or cancel the dispersion from the other MCGT. In an optimum design for a dual cavity GT etalon, the dispersion profile of the first MCGT will have a similar amplitude and frequency as the dispersion profile of the second MCGT, only shifted by half the period so that the positive slopes of one profile are aligned with the negative slopes of the other profile.

Abstract: A laser wavelength meter determines the unknown wavelength of a laser by measuring the phase difference between two orthogonally polarized beams derived from the laser. The orthogonally polarized beams propagate along two optical paths of different length as defined, for example, by a polarizing beam splitter or a stepped reflector with a defined step height. An in situ reference laser of known wavelength allows calculation and monitoring of the path difference between the two optical paths.