For Refractive Indexing Patents (Class 356/517)
  • Patent number: 10416039
    Abstract: The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.
    Type: Grant
    Filed: March 28, 2019
    Date of Patent: September 17, 2019
    Assignee: Johnson & Johnson Vision Care, Inc.
    Inventors: John E. Greivenkamp, Jr., James William Haywood, Kyle C. Heideman, Russell T. Spaulding, Gregory Allen Williby
  • Patent number: 10261013
    Abstract: Provided are improved optical detection systems and methods for using same, which systems and methods comprise single channel interferometric detection systems and methods for determining a characteristic property of samples. Such interferometric detection systems and methods employ a light beam that impinges two or more discrete zones along a channel, thereby avoiding variations that can result in increases in detection limits and/or measurement errors.
    Type: Grant
    Filed: June 30, 2016
    Date of Patent: April 16, 2019
    Assignee: Vanderbilt University
    Inventors: Darryl J. Bornhop, Michael Kammer
  • Patent number: 10162186
    Abstract: A virtual image phase array (VIPA) includes two parallel surfaces, a first highly-reflective surface with a highly-reflective coating, and a second partially-reflective surface. The first highly-reflective surface also requires an input zone with an anti-reflection coating, which abuts the highly-reflective coating, with a transition zone therebetween. Light enters the VIPA through the input zone, and reflects back and forth between the highly and partially reflective surfaces, gradually leaking out through the partially reflective surface. To minimize the transition zone and thereby minimize the input angle of incidence and maximize the number of reflections per unit of length, the substrate coated with the highly-reflective coating is subsequently polished at an acute angle resulting in the transition zone having the same sharp angle.
    Type: Grant
    Filed: May 5, 2015
    Date of Patent: December 25, 2018
    Assignee: LightMachinery Inc.
    Inventors: John H. Hunter, Ian J. Miller, Shane Boisclair, Edward S. Williams, Chris Wimperis, Vaz Zastera
  • Patent number: 9952161
    Abstract: An interferometric holographic instrument enables the generation of digital data for testing and enabling 2-dimensional and 3-dimensional analysis of “live” and real-time semiconductor or anisotropic devices and materials. The digitally recorded interferometric data can be displayed, stored or connected to a live data stream for transmission to digital processing devices. A digital electric processor or analyzer connected to the recording device, or live data stream, enables the interferometric data to be utilized to test, develop, and shape semiconductor and anisotropic microelectronic processing, wireless and microwave devices.
    Type: Grant
    Filed: December 30, 2015
    Date of Patent: April 24, 2018
    Assignee: Attofemto, Inc.
    Inventor: Paul L. Pfaff
  • Patent number: 9488470
    Abstract: A method for evaluating the condition of a ceramic coating deposited on a substrate comprising illuminating the ceramic coating with light, measuring the intensity of light returned from the ceramic coating as function of depth in the coating and transverse position on the coating, and analyzing the measured light intensities to obtain one or more of intensity of the light returned from the exposed coating surface relative to the intensity of light returned from the coating/substrate interface, intensity of the light returned from the coating/substrate interface relative to the intensity of light returned from the bulk of the ceramic coating, determination of roughness at the exposed surface of the ceramic coating, and determination of roughness of the interface between the ceramic coating and underlying bond coat or substrate.
    Type: Grant
    Filed: February 14, 2014
    Date of Patent: November 8, 2016
    Assignees: UNIVERSITY OF CONNETICUT, SOUTHWEST SCIENCES INCORPORATED
    Inventors: Kristen A. Peterson, Elias P. Rosen, Eric H. Jordan, Sina Shahbazmohamadi, Andrei B. Vakhtin
  • Patent number: 9279723
    Abstract: A terahertz spectrometer includes: a terahertz-wave emitter and a terahertz receiver elements. The terahertz wave generated by means of generating beat frequency corresponding to the difference between two rapidly tunable continuous wave lasers. Having a difference in time between the interrogating signal and the reference signal at the receiver end side, which corresponds to intermediate frequency (IF), not centered around the baseband, i.e. zero Hertz. The offset step size of the intermediate frequency from zero Hertz is linearly correlated to the position of the interrogated object position.
    Type: Grant
    Filed: August 18, 2011
    Date of Patent: March 8, 2016
    Assignee: NOVATRANS GROUP SA
    Inventors: John F. Roulston, Daniel Mandelik
  • Patent number: 9250064
    Abstract: Improved methods and systems for inspection imaging for holographic or interferometric semiconductor test and evaluation through all phases of device development and manufacture. Specifically, systems and methods are disclosed for extending the range of optical holographic interferometric inspection for testing and evaluating microelectronic devices and determining the interplay of electromagnetic signals and dynamic stresses to the semiconductor material are provided in which an enhanced imaging method provides continuous and varying the magnification of the optical holographic interferometric images over a plurality of interleaved optical pathways and imaging devices. Analysis of one or more holographic interference patterns displays internal and external stresses and the various effects of such stresses upon the operating characteristics of features within the features, interior structures or within the internal surfaces of the semiconductor device at any stage of development or manufacture.
    Type: Grant
    Filed: October 23, 2014
    Date of Patent: February 2, 2016
    Assignee: Attofemto, Inc.
    Inventor: Paul L. Pfaff
  • Patent number: 9209593
    Abstract: A method of controlling the gain or sensitivity of a test and measurement system. The test and measurement system includes a host, a controller with an optical transmitter and an optical receiver, optical-to-electrical converter, an accessory head, and a device under test. The method includes determining whether a gain or sensitivity adjustment of the test and measurement system is required, determining the amount of gain or sensitivity adjustment, and adjusting the output power of a laser of the optical transmitter in response to the determination of the gain or sensitivity adjustment of the test and measurement system.
    Type: Grant
    Filed: December 18, 2013
    Date of Patent: December 8, 2015
    Assignee: Tektronix, Inc.
    Inventors: Michael J. Mende, Richard A. Booman
  • Patent number: 9115976
    Abstract: A method is disclosed of detecting the presence of an organism in a medium. In some embodiments, the method includes: obtaining a series of optical coherence tomography measurements of a region of the medium; processing the series of optical coherence tomography measurements to determine information indicative of translational and rotational motion of an object in the region of the medium; identifying the object as organism based on the information indicative of translational and rotational motion of the object; and outputting information indication of the presence of the organism.
    Type: Grant
    Filed: March 1, 2011
    Date of Patent: August 25, 2015
    Assignee: Empire Technology Development LLC
    Inventor: Lawrence J. Karr
  • Patent number: 9025163
    Abstract: An apparatus and method for detecting refractive index variations in a sample is disclosed. The apparatus includes a multi frequency laser source configured to generate a mixed laser beam having at least two optical frequencies. A sinusoidal function generator is configured to modulate the optical frequencies to generate a chirp-modulated mixed laser beam. The chirp-modulated mixed laser beam being configured to pass through the sample. A detector is configured to detect the chirp-modulated mixed beam. A signal processer is configured to process the detected chirp-modulated mixed beam to measure refractive index variations in the sample.
    Type: Grant
    Filed: April 23, 2012
    Date of Patent: May 5, 2015
    Assignee: The Trustess of Princeton University
    Inventors: Gerard Wysocki, Michal Nikodem
  • Patent number: 8982355
    Abstract: Disclosed is a system and method for characterizing optical materials, using steps and equipment for generating a coherent laser light, filtering the light to remove high order spatial components, collecting the filtered light and forming a parallel light beam, splitting the parallel beam into a first direction and a second direction wherein the parallel beam travelling in the second direction travels toward the material sample so that the parallel beam passes through the sample, applying various physical quantities to the sample, reflecting the beam travelling in the first direction to produce a first reflected beam, reflecting the beam that passes through the sample to produce a second reflected beam that travels back through the sample, combining the second reflected beam after it travels back though the sample with the first reflected beam, sensing the light beam produced by combining the first and second reflected beams, and processing the sensed beam to determine sample characteristics and properties.
    Type: Grant
    Filed: December 9, 2010
    Date of Patent: March 17, 2015
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Sang Hyouk Choi, Yeonjoon Park
  • Publication number: 20150036149
    Abstract: A system (10) for controlling an optical surface to be measured relatively to an optical reference surface, the control system (10) including a first optical element (36) provided with a first optical axis and able to introduce a first phase function into the phase of an incident beam, and a second optical element (38) provided with a second optical axis and able to introduce a second phase function into the phase of a beam transmitted through or reflected by the first optical element (36). The first phase function and the second phase function each correspond to the same optical aberration and at least one from among the first optical element (36) and the second optical element (38) is rotary around the optical axis specific to the relevant optical element (36, 38).
    Type: Application
    Filed: July 31, 2014
    Publication date: February 5, 2015
    Inventor: Julien Fouraz
  • Patent number: 8854628
    Abstract: A method for determining information about a test object includes combining two or more scanning interference signals to form a synthetic interference signal; analyzing the synthetic interference signal to determine information about the test object; and outputting the information about the test object. Each of the two or more scanning interference signals correspond to interference between test light and reference light as an optical path length difference between the test and reference light is scanned, wherein the test and reference light are derived from a common source. The test light scatters from the test object over a range of angles and each of the two or more scanning interferometry signals corresponds to a different scattering angle or polarization state of the test light.
    Type: Grant
    Filed: September 21, 2011
    Date of Patent: October 7, 2014
    Assignee: Zygo Corporation
    Inventors: Xavier M. Colonna de Lega, Peter J. de Groot, Jan Liesener
  • Patent number: 8848199
    Abstract: The present invention relates to systems and methods for quantitative three-dimensional mapping of refractive index in living or non-living cells, tissues, or organisms using a phase-shifting laser interferometric microscope with variable illumination angle. A preferred embodiment provides tomographic imaging of cells and multicellular organisms, and time-dependent changes in cell structure and the quantitative characterization of specimen-induced aberrations in high-resolution microscopy with multiple applications in tissue light scattering.
    Type: Grant
    Filed: July 10, 2008
    Date of Patent: September 30, 2014
    Assignee: Massachusetts Institute of Technology
    Inventors: Wonshik Choi, Ramachandra Rao Dasari, Christopher M. Fang-Yen, Michael S. Feld
  • Patent number: 8830483
    Abstract: An optical tomographic image forming method including: splitting low coherence light emitted from a light source is split into a measuring light and a reference light; forming an optical tomographic image of a measured object by detecting an interference light that is obtained by superposing reflected light, reflected from the measured object when the measuring light is irradiated onto the measured object via a condenser lens, and reflected light, reflected from a reference mirror, which is positioned a predetermined length of optical path away from the splitting position, when the reference light is irradiated onto the reference mirror, wherein the method further includes: inputting a refractive index of the measured object; correcting the tomographic image in accordance with the inputted refractive index of the measured object; and outputting the corrected tomographic image.
    Type: Grant
    Filed: September 4, 2009
    Date of Patent: September 9, 2014
    Assignee: Konica Minolta Opto, Inc.
    Inventors: Fumio Nagai, Soh Ohzawa
  • Patent number: 8804129
    Abstract: The invention relates to a method and an apparatus for measuring the thickness of a transparent film by broad band interferometry, comprising the steps of preparing a correlogram of the film by an interferometer, applying a Fourier transformation to said correlogram to obtain a Fourier phase function, removing a linear component thereof, applying a second integral transformation to the remaining non-linear component to obtain an integral amplitude function of said non-linear component, identifying the peak location of said integral amplitude function and determining the thickness of the film as the double value of the abscissa at said peak location considering a refractive index of a film which is dependent on wavelength. The last two steps may be replaced by identifying the peak locations of said integral amplitude function and determining the thickness of the films as the double values of the abscissas at the peak locations.
    Type: Grant
    Filed: May 4, 2012
    Date of Patent: August 12, 2014
    Assignee: Mitutoyo Corporation
    Inventor: Ki-Nam Joo
  • Patent number: 8724117
    Abstract: Measuring of an electro-optic coefficient and a thermo-optic coefficient of an optical device and an optical material, and more specifically, to measurement systems and methods of evaluating the electro-optic and thermo-optic coefficients by using interference fringe measurement techniques, wherein those optical characteristics can be precisely measured over a wide wavelength intended without using a complicated measuring equipment.
    Type: Grant
    Filed: May 13, 2010
    Date of Patent: May 13, 2014
    Assignee: Inha Industry Partnership Institute
    Inventors: Kyong-Hon Kim, Seoung-Hun Lee, Seung-Hwan Kim, El-Hang Lee
  • Publication number: 20140092395
    Abstract: A method for an automated inline determination of the refractive power of an ophthalmic lens (5) including providing an inspection cuvette having an optically transparent bottom (21) and having a concave inner surface (210) and containing the ophthalmic lens (5) immersed in a liquid, and providing a light source (42) and a wavefront sensor (6) including a detector. The light coming from the light source (42) and having passed the ophthalmic lens (5) contained in the inspection cuvette and impinging on the detector generates signals at the detector. By comparing the signals generated at the detector with predetermined signals representative of a reference refractive power, the refractive power of the ophthalmic lens (5) is thereby determined.
    Type: Application
    Filed: September 26, 2013
    Publication date: April 3, 2014
    Applicant: Novartis AG
    Inventors: Susanne Fechner, Roger Biel
  • Patent number: 8687204
    Abstract: A method and apparatus for measuring refractive index of an object are disclosed. The method includes, acquiring a number of first fringes of a first interference pattern formed by interference of a first beam of light transmitted through the object with a second beam of light not transmitted through the object; acquiring a number of second fringes of a second interference pattern formed by interference of a third beam of light reflected from a first surface of the object with a fourth beam of light transmitted through the object and reflected from a second surface of the object; and calculating the refractive index of the object based on the number of first fringes and the number of second fringes. The method may further include calculating the Abbe number of the object based on the refractive indices of the object measured at different wavelengths.
    Type: Grant
    Filed: March 24, 2011
    Date of Patent: April 1, 2014
    Assignee: Canon Kabushiki Kaisha
    Inventor: Chung-Chieh Yu
  • Patent number: 8681079
    Abstract: An optical device suitable for forming a pixel in a video display. The optical device includes a first layer having a first refractive index; a second layer over the first layer, the second layer having a second refractive index less than the first refractive index; and a third layer over the second layer, the third layer having a third refractive index larger than the second refractive index; and a fourth layer that is at least partially optically absorptive, wherein the optical stack and the fourth layer are a first distance from one another when the device is in a first state and are a second distance from one another when the device is in a second state, the first distance different from the second distance.
    Type: Grant
    Filed: November 30, 2011
    Date of Patent: March 25, 2014
    Assignee: QUALCOMM MEMS Technologies, Inc.
    Inventor: Gang Xu
  • Patent number: 8665452
    Abstract: Measuring refractive index of air based on laser synthetic wavelength interferometry. The Apparatus includes a dual-frequency laser that emits orthogonal linear polarized light of wavelengths ?1 and ?2, a beamsplitter, two polarizing beamsplitters, two corner-cube retroreflectors, a quartz vacuum cavity of length L disposed in the measuring optical path in parallel to the light propagation direction, and two detectors. The apparatus is used to measure the refractive index of air using the dual-frequency laser to emit orthogonal linear polarized light with wavelengths ?1 and ?2, using the beamsplitters, corner-cube retroreflectors, quartz vacuum cavity, and detectors. The integer N and fraction ? of interference fringes of wavelength ?2 are determined. The refractive index of air n is obtained by using the length L of the vacuum cavity, integer N and fraction ? of the interference fringes of wavelength ?2.
    Type: Grant
    Filed: May 18, 2011
    Date of Patent: March 4, 2014
    Assignee: Zhejiang Sci-Tech University
    Inventors: Liping Yan, Benyong Chen, Qiuhong Tian, Zhengrong Sun
  • Publication number: 20140009765
    Abstract: A method of measuring a refractive index distribution includes steps of setting a plurality of different arrangements by a translation movement in a state where an object is arranged in first and second media having refractive indices different from a refractive index of the object, measuring transmissive wavefront of the object for each of media and each of the plurality of arrangements by reference light entering the object (S400), obtaining wavefront aberration corresponding to a difference between each transmissive wavefront and a reference transmissive wavefront (S500), obtaining refractive index distribution of the object by removing an influence of a shape error of the object using wavefront aberration of two media in which the object is arranged at the same position (S70), and obtaining refractive index distribution information of the object based on a plurality of refractive index distributions corresponding to the plurality of arrangements (S80).
    Type: Application
    Filed: June 21, 2013
    Publication date: January 9, 2014
    Inventor: Tomohiro SUGIMOTO
  • Patent number: 8593624
    Abstract: By using two probe optical systems for measurement by disposing the probe optical systems with a test object sandwiched therebetween, an optical path length of light transmitted through the test object which is identified locally is calculated using an interference signal thereof. In addition, a geometrical thickness of the same part is calculated by measuring positions of the probe optical systems, whereby two calculated values are obtained. Based on the values and a calculated value for a reference object, a refractive index distribution of the test object is obtained.
    Type: Grant
    Filed: January 21, 2010
    Date of Patent: November 26, 2013
    Assignee: Panasonic Corporation
    Inventors: Yusuke Kusaka, Yohei Takechi, Atsushi Fukui, Seiji Hamano, Kazumasa Takata
  • Patent number: 8576148
    Abstract: An optical device suitable for forming a pixel in a video display. The optical device includes a first layer having a first refractive index; a second layer over the first layer, the second layer having a second refractive index less than the first refractive index; and a third layer over the second layer, the third layer having a third refractive index larger than the second refractive index; and a fourth layer that is at least partially optically absorptive, wherein the optical stack and the fourth layer are a first distance from one another when the device is in a first state and are a second distance from one another when the device is in a second state, the first distance different from the second distance.
    Type: Grant
    Filed: November 30, 2011
    Date of Patent: November 5, 2013
    Assignee: QUALCOMM MEMS Technologies, Inc.
    Inventor: Gang Xu
  • Patent number: 8559015
    Abstract: The present invention provides a measuring apparatus for measuring an absolute distance between a reference surface an d a test surface, including a phase detection unit configured to detect an interference signal between light reflected by the reference surface and light reflected by the test surface, and detect, from the interference signal, a phase corresponding to an optical path length between the reference surface and the test surface, and a processing unit configured to perform processing of obtaining the absolute distance by controlling the phase detection unit so as to detect the phase corresponding to the optical path length between the reference surface and the test surface for each of a first reference wavelength and a second reference wavelength while changing the wavelength of light to be emitted by a first light source continuously from the first reference wavelength to the second reference wavelength.
    Type: Grant
    Filed: October 22, 2010
    Date of Patent: October 15, 2013
    Assignee: Canon Kabushiki Kaisha
    Inventor: Yoshiyuki Kuramoto
  • Patent number: 8520218
    Abstract: A measuring method includes measuring a sum of an optical path length of a test object and a first medium in a first container, introducing light into an area that includes the first medium but does not include the test object and measuring the optical path length of the first medium, measuring a sum of the optical path length of the test object and a second medium in a second container, the second medium having a refractive index different from that of the first medium, introducing the light into an area that includes the second medium but does not include the test object and of measuring the optical path length of the second medium, and calculating a refractive index of the test object based on the measured optical path lengths and an actual distance of an optical path for which each optical path length is measured.
    Type: Grant
    Filed: September 12, 2011
    Date of Patent: August 27, 2013
    Assignee: Canon Kabushiki Kaisha
    Inventor: Tomohiro Sugimoto
  • Patent number: 8508725
    Abstract: The measuring method includes a step of causing reference light to enter an object placed in a first medium to measure a first transmitted wavefront, a step of causing the reference light to enter the object placed in a second medium to measure a second transmitted wavefront, a step of measuring first and second placement positions where the object is placed in the first and second media, and a calculating step of calculating an internal refractive index distribution of the object by using measurement results of the first and second transmitted wavefronts. The calculating step calculates the internal refractive index distribution from which a shape component of the object is removed by using the measurement results of the first and second transmitted wavefronts, and first and second reference transmitted wavefronts of a reference object to be placed at positions identical to the first and second placement positions.
    Type: Grant
    Filed: November 2, 2010
    Date of Patent: August 13, 2013
    Assignee: Canon Kabushiki Kaisha
    Inventor: Seima Kato
  • Patent number: 8488112
    Abstract: A method for contactless measurement of the density of a porous material, using a measurement of the refractive index of the material by optical coherence tomography. In the optical coherence tomography technique, the optical path corresponding to the crossing of an object made of the material by a light beam used in the technique, is determined, the thickness of the object is determined, the refractive index of the material is determined from the optical path and from the thickness, and the density of the material is determined from the refractive index.
    Type: Grant
    Filed: August 3, 2009
    Date of Patent: July 16, 2013
    Assignee: Commissariat a l'Energie Atomique et aux Energies Alternatives
    Inventors: Laurent Jeannot, Florent Sandras
  • Patent number: 8477297
    Abstract: The method measures first transmitted wavefronts and second transmitted wavefronts by respectively causing reference light to enter an object placed in plural placement states in a first medium and a second medium, calculates an aberration sensitivity with respect to changes of the placement state of the object, and calculates an alignment error of the object in each placement state by using the aberration sensitivity and the first and second transmitted wavefronts measured in each placement state. The method further calculates first and second reference transmitted wavefronts respectively acquirable when causing the reference light to enter the reference object placed in placement states including the alignment errors in the first medium and the second medium, and calculates a refractive index distribution of the object which a shape component thereof is removed, by using the first and second transmitted wavefronts and the first and second reference transmitted wavefronts.
    Type: Grant
    Filed: November 29, 2011
    Date of Patent: July 2, 2013
    Assignee: Canon Kabushiki Kaisha
    Inventor: Seima Kato
  • Patent number: 8477316
    Abstract: In an interferometer system and a method for its operation, the interferometer system includes an interferometer having an interferometer light source whose emitted radiation is able to be split into a measuring arm and a reference arm, an object to be measured being disposed in the measuring arm, and the interferometer delivering interferometer signals as a function of the position of the object to be measured. In addition, a detecting device is provided for detecting fluctuations in the refractive index of the air in the measuring arm and/or reference arm. The detecting device includes a spectrometer unit; the spectrometer unit has at least one spectrometer light source, as well as at least one spectrometer detector unit.
    Type: Grant
    Filed: October 1, 2008
    Date of Patent: July 2, 2013
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventor: Wolfgang Holzapfel
  • Patent number: 8472013
    Abstract: A refractive index distribution measurement method includes the steps of measuring a first transmission wavefront of a test object by introducing reference light to the test object immersed in a first medium having a first refractive index lower than that of the test object by 0.01 or more, measuring a second transmission wavefront of the test object by introducing the reference light to the test object immersed in a second medium having a second refractive index lower than that of the test object by 0.01 or more and different from the first refractive index, and obtaining a refractive index distribution of the test object based on a measurement result of the first transmission wavefront and a measurement result of the second transmission wavefront.
    Type: Grant
    Filed: December 22, 2009
    Date of Patent: June 25, 2013
    Assignee: Canon Kabushiki Kaisha
    Inventor: Seima Kato
  • Publication number: 20130094030
    Abstract: Methods and/or systems are disclosed herein for use in imaging an object including using interferometry while modifying at least one characteristic of the object (e.g., refractive index of the object).
    Type: Application
    Filed: April 13, 2011
    Publication date: April 18, 2013
    Applicant: University of Manitoba
    Inventors: Sherif S. Sherif, Pedro Fernando Pereira Bogado
  • Publication number: 20130094029
    Abstract: Quantifying a refractive index of a test medium by obtaining spectral data representative for an optical signal being modulated with an optical transfer characteristics of a photonic sensor, the modulation being obtained by combining modulation of a first electromagnetic wave component in an optical filter element with a first periodic transfer spectrum having a first free spectral range and modulation of a second electromagnetic wave component in an optical filter element with a second periodic transfer spectrum having a second free spectral range being different from the first free spectral range. A relative is change induced in the second periodic transfer spectrum by bringing the test medium in proximity with the optical filter element with the second periodic transfer spectrum. The refractive index of the test medium is quantified by determining a wavelength offset of an envelope signal in said spectral data.
    Type: Application
    Filed: October 12, 2011
    Publication date: April 18, 2013
    Inventors: Peter BIENSTMAN, Tom CLAES, Wim BOGAERTS
  • Patent number: 8405836
    Abstract: Subject matter disclosed herein relates to measuring optical fibers or measuring devices comprising optical fibers and, in particular, to measuring a variation of refractive index of an optical fiber as a function of position and wavelength.
    Type: Grant
    Filed: March 19, 2010
    Date of Patent: March 26, 2013
    Assignee: Interfiber Analysis, LLC
    Inventor: Andrew D. Yablon
  • Publication number: 20130057873
    Abstract: A method and system that enable the measurement of a second-harmonic-generation-forward/backward (SHG F/B) ratio from an object by performing only a single image scan using via epi-imaging using an epi-detection technique. Two simultaneous SGH images (a forward propagating SHG “F” image and a back propagating SHG “B” image) are generated during the single image scan. A pinhole mirror can be used to separate the F-SHG and the B-SHG, which are detected by separate detectors.
    Type: Application
    Filed: May 3, 2011
    Publication date: March 7, 2013
    Applicant: UNIVERSITY OF ROCHESTER
    Inventors: Edward Brown, III, Xiaoxing Han
  • Patent number: 8374800
    Abstract: Method and apparatus for determining dielectric function of liquid solutions and thereby concentrations of substances in aqueous solution or the volatile/non-volatile nature of the liquid by self-referenced reflection THz spectroscopy. Having the aqueous solution in any container with a window allows irradiating coherent THz radiation with frequencies within the range 0.05-2 THz on the front of the window, and recording both a reference signal reflected from the front of the window and a sample signal reflected from the back of the window in contact with the aqueous solution. From these signals, the complex index of refraction, (I) or the complex reflection coefficient (II), can be calculated. The calculated components are compared with previously determined components from samples with known concentrations, whereby a concentration of the substance in the mixture can be estimated.
    Type: Grant
    Filed: July 5, 2007
    Date of Patent: February 12, 2013
    Assignee: Danmarks Tekniske Universitet
    Inventor: Peter Uhd Jepsen
  • Patent number: 8310664
    Abstract: The method includes first and second steps of placing an object in first and second media whose refractive indices are lower than that of the object, and of causing the reference light to enter the object to measure first and second transmitted wavefronts. When light rays entering a peripheral portion of the object and passing through a same point of the object are defined as first and second light rays, the method causes these light rays to proceed in directions mutually different to change an NA of the reference light such that the reference light after being transmitted through the object is brought closer to collimated light than that before entering the object. The method calculates an effective thickness of the object using geometric thicknesses thereof and calculates a refractive index distribution thereof using the first and second transmitted wavefronts and the effective thickness.
    Type: Grant
    Filed: November 18, 2010
    Date of Patent: November 13, 2012
    Assignee: Canon Kabushiki Kaisha
    Inventor: Tomohiro Sugimoto
  • Publication number: 20120268746
    Abstract: An apparatus and method for detecting refractive index variations in a sample is disclosed. The apparatus includes a multi frequency laser source configured to generate a mixed laser beam having at least two optical frequencies. A sinusoidal function generator is configured to modulate the optical frequencies to generate a chirp-modulated mixed laser beam. The chirp-modulated mixed laser beam being configured to pass through the sample. A detector is configured to detect the chirp-modulated mixed beam. A signal processer is configured to process the detected chirp-modulated mixed beam to measure refractive index variations in the sample.
    Type: Application
    Filed: April 23, 2012
    Publication date: October 25, 2012
    Applicant: THE TRUSTEES OF PRINCETON UNIVERSITY
    Inventors: Gerard Wysocki, Michal Nikodem
  • Publication number: 20120243002
    Abstract: A method and apparatus for measuring refractive index of an object are disclosed. The method includes, acquiring a number of first fringes of a first interference pattern formed by interference of a first beam of light transmitted through the object with a second beam of light not transmitted through the object; acquiring a number of second fringes of a second interference pattern formed by interference of a third beam of light reflected from a first surface of the object with a fourth beam of light transmitted through the object and reflected from a second surface of the object; and calculating the refractive index of the object based on the number of first fringes and the number of second fringes. The method may further include calculating the Abbe number of the object based on the refractive indices of the object measured at different wavelengths.
    Type: Application
    Filed: March 24, 2011
    Publication date: September 27, 2012
    Applicant: CANON KABUSHIKI KAISHA
    Inventor: Chung-Chieh Yu
  • Patent number: 8237931
    Abstract: An optoacoustic convolver includes: a light source; a first acoustic waveguide filled with a light-transmissive first acoustic medium; a second acoustic waveguide filled with a light-transmissive second acoustic medium; an optical system whereby light emitted from the light source is split into a first light beam and a second light beam, the first light beam entering the first acoustic waveguide, and the second light beam entering the second acoustic waveguide, thereby generating interference light between the first light beam having passed through the first acoustic waveguide and the second light beam having passed through the second acoustic waveguide; a light-receiving section for receiving the interference light and outputting an electric signal based on an intensity of the received light; and a correlation determination section for determining whether the received signal is correlated with the reference signal by observing the electric signal output from the light-receiving section.
    Type: Grant
    Filed: September 27, 2011
    Date of Patent: August 7, 2012
    Assignee: Panasonic Corporation
    Inventors: Ushio Sangawa, Masahiko Hashimoto
  • Publication number: 20120176627
    Abstract: This invention provides an interferometric detection device configured to maintain a temperature of a sensing area to within 20 m° C. of a first target temperature and to maintain a temperature of the medium within 500 m° C. of a second target temperature The device can do so under conditions in which ambient temperature changes from 0.1° C. to 5° C. over 5 minutes.
    Type: Application
    Filed: January 10, 2012
    Publication date: July 12, 2012
    Applicants: Vanderbilt University, Molecular Sensing, Inc.
    Inventors: Scot R. Weinberger, Bruce J. Richardson, Darryl L. Bornhop
  • Patent number: 8218152
    Abstract: A system and method for microscale measurement and imaging of the group refractive index of a sample. The method utilizes a broadband confocal high-numerical aperture microscope embedded into an interferometer and a spectrometric means, whereby spectral interferograms are analyzed to compute optical path delay of the beam traversing the sample as the sample is translated through the focus of an interrogating light beam. A determination of group refractive index may serve to disambiguate phase ambiguity in a measurement of refractive index at a specified wavelength. Spatial resolution of object characterization in three dimensions is achieved by imaging the object from multiple viewpoints.
    Type: Grant
    Filed: December 3, 2008
    Date of Patent: July 10, 2012
    Assignee: The Board of Trustees of the University of Illinois
    Inventors: Daniel L. Marks, Stephen A. Boppart, Adam M. Zysk, Simon C. Schlachter
  • Publication number: 20120069350
    Abstract: A measuring method includes measuring a sum of an optical path length of a test object and a first medium in a first container, introducing light into an area that includes the first medium but does not include the test object and measuring the optical path length of the first medium, measuring a sum of the optical path length of the test object and a second medium in a second container, the second medium having a refractive index different from that of the first medium, introducing the light into an area that includes the second medium but does not include the test object and of measuring the optical path length of the second medium, and calculating a refractive index of the test object based on the measured optical path lengths and an actual distance of an optical path for which each optical path length is measured.
    Type: Application
    Filed: September 12, 2011
    Publication date: March 22, 2012
    Applicant: CANON KABUSHIKI KAISHA
    Inventor: Tomohiro SUGIMOTO
  • Publication number: 20120057173
    Abstract: The invention relates to an optical sensor arrangement comprising a measuring optical fiber demonstrating birefringence modifiable as a function of a measurement variable, and to an optical analysis unit having two optical branches implemented as optical fibers forming a Mach-Zehnder interferometer and an optical coupler for bringing together light guided in the two branches, wherein at least one output of the coupler is optically connected to at least one light-sensitive element, and wherein the analysis unit comprises a polarizing beam splitter from which the optical branches originate, wherein the measurement optical fiber is connected upstream of an optical input of the polarizing beam splitter, and wherein a polarization converter is disposed in a course of one of the optical branches. The invention further relates to a detection method that can be performed using said sensor arrangement.
    Type: Application
    Filed: January 8, 2010
    Publication date: March 8, 2012
    Applicant: Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung E.V.
    Inventors: Helmut Heidrich, Peter Luetzow
  • Publication number: 20120058569
    Abstract: The invention relates to a method for determining optical properties by measuring intensities on a thin layer, wherein light is irradiated onto a carrier (105) that has said thin layer and that is at least partially transparent. Interferences on the at least one thin layer are measured as the relative intensity of at least one superpositioned wave, optionally using filter arrangements (113, 115, 117) provided for this purpose, whereupon the reflection coefficient(s) and/or the transmission coefficient(s) from the reflection and/or the transmission on the thin layer are determined. Preferably, the intensity of at least two superpositioned waves is measured. The light may be irradiated directly onto the carrier. The invention also relates to a device for determining optical properties by measuring intensities on a thin layer, said device comprising an analysis unit which stores at least one lookup table. The method and the device are preferably used in the area of homeland security.
    Type: Application
    Filed: May 5, 2010
    Publication date: March 8, 2012
    Applicant: BIAMETRICS MARKEN UND RECHTE GMBH
    Inventors: Johannes Landgraf, Günther Proll, Florian Pröll
  • Publication number: 20120019834
    Abstract: Disclosed are improved optical detection systems and methods comprising multiplexed interferometric detection systems and methods for determining a characteristic property of a sample, together with various applications of the disclosed techniques.
    Type: Application
    Filed: June 10, 2011
    Publication date: January 26, 2012
    Inventor: Darryl J. Bornhop
  • Patent number: 8101423
    Abstract: Methods and compositions are provided for detecting biomolecular interactions. The use of labels is not required and the methods can be performed in a high-throughput manner. The invention also provides optical devices useful as narrow band filters.
    Type: Grant
    Filed: August 29, 2005
    Date of Patent: January 24, 2012
    Assignee: SRU Biosystems, Inc.
    Inventors: Brian T. Cunningham, Jane Pepper, Bo Lin, Peter Li
  • Patent number: 8089609
    Abstract: A lithographic apparatus comprises an immersion fluid system and an interferometric temperature detection system. The immersion fluid system is configured to provide immersion fluid to an exposure system. The interferometric temperature detection system is configured to measure a temperature of the immersion fluid.
    Type: Grant
    Filed: September 25, 2008
    Date of Patent: January 3, 2012
    Assignee: ASML Holding N.V.
    Inventors: Harry Sewell, Justin L. Kreuzer
  • Patent number: 8077325
    Abstract: Structure profiles from optical interferometric data can be identified by obtaining a plurality of broadband interferometric optical profiles of a structure as a function of structure depth in an axial direction. Each of the plurality of interferometric optical profiles include a reference signal propagated through a reference path and a sample signal reflected from a sample reflector in the axial direction. An axial position corresponding to at least a portion of the structure is selected. Phase variations of the plurality of interferometric optical profiles are determined at the selected axial position. A physical displacement of the structure is identified based on the phase variations at the selected axial position.
    Type: Grant
    Filed: December 9, 2009
    Date of Patent: December 13, 2011
    Assignee: Duke University
    Inventors: Michael Choma, Joseph A. Izatt, Audrey Ellerbee, Marinko Sarunic
  • Patent number: 8072402
    Abstract: An optical device suitable for forming a pixel in a video display. The optical device includes a first layer having a first refractive index; a second layer over the first layer, the second layer having a second refractive index less than the first refractive index; and a third layer over the second layer, the third layer having a third refractive index larger than the second refractive index; and a fourth layer that is at least partially optically absorptive, wherein the optical stack and the fourth layer are a first distance from one another when the device is in a first state and are a second distance from one another when the device is in a second state, the first distance different from the second distance.
    Type: Grant
    Filed: August 29, 2007
    Date of Patent: December 6, 2011
    Assignee: Qualcomm Mems Technologies, Inc.
    Inventor: Gang Xu