Abstract: A fragmented lens system for creating an invisible light pattern useful to computer vision systems is disclosed. Random or semi-random dot patterns generated by the present system allow a computer to uniquely identify each patch of a pattern projected by a corresponding illuminator or light source. The computer may determine the position and distance of an object by identifying the illumination pattern on the object.

Abstract: A surface position detecting apparatus comprises a light-sending optical system which makes first light from a first pattern and second light from a second pattern incident at different incidence angles to a predetermined surface to project an intermediate image of the first pattern and an intermediate image of the second pattern onto the predetermined surface; a light-receiving optical system which guides the first light and the second light reflected on the predetermined surface, to a first observation surface and to a second observation surface, respectively, to form an observation image of the first pattern on the first observation surface and an observation image of the second pattern on the second observation surface; and a detecting section which detects position information of the observation image of the first pattern on the first observation surface and position information of the observation image of the second pattern on the second observation surface and which calculates a surface position of the

Abstract: The present invention provides a location identification sensor (60) capable of identifying a location and moving pattern of an object with correction made in consideration of the moving pattern even if the object is moving. The sensor (60) identifies a location of an object by triangulation principle, and includes at least one pair of light emitting diodes (10a, 10b), line sensors (13), and location identification means for identifying location of an object (50) between the line sensors (13) and the diodes (10) based on the triangulation principle by using first positional information and second positional information, where the first positional information indicates where the object (50) was at a predetermined timing (T2) when the diode (10a) is on, and the second positional information indicates where the object (50) was at two timings (T1 and T3) when the diode (10b) is on, T1 and T3 being before and after T2, respectively.

Abstract: A position measuring apparatus receives at least one precise position information set from at least one visible-light wireless communication device including a transmission light source, and upon receipt of the at least one precise position information ser, acquires a virtual distance based on the positions of transmission light sources imaged on an image sensor. Next, the position is measured according to the precise position information and the actual distance, virtual distance, and image sensor inclination based on this information.

Abstract: A three-dimensional position observation apparatus provided with a lens system having focusing and diaphragm mechanisms, for forming an image on an imaging plane by light from an observation object includes a beam steering member disposed in a light path extending from the observation object to the imaging plane, for changing a traveling direction of observation light into a plurality of different directions, and an image analyzing unit for analyzing a position of the observation object based on a positional relation between a plurality of images on the imaging plane formed by light passing through the beam steering member.

Abstract: A touch device with light frequency sensor to sense the relative position of an object to be detected includes a work area, a light source, at least two light frequency sensors, and a position computation module. The light source is arranged toward the work area for providing light with predetermined frequency. The two light frequency sensors are arranged for respectively detecting the light frequency signals entered into the lens and the optical filter. The position computation module is linked with the two light frequency sensors for signal connection and detects characteristic data by means of trigonometry to determine the position of the object to be detected. As the light frequency sensor could simple detects the signal, the position computing module with a relative low-order computing is capable of processing the signal. That means the high-order processor of the prior art is unnecessary to be used to processing the acquired image.

Abstract: This invention provides a position measuring method for measuring a surface level of melt in a crucible arranged in the inside of a Czochralski furnace based on a principle of triangulation, in which a light source and a photo detector are provided; light emitted from the light source is applied to the surface of the melt; and the light reflected by the surface of the melt is received by the photo detector, the method comprising: providing a member in the vicinity of the surface of the melt; and causing the emitted light to be reflected by the member, applying the reflected light to the surface of the melt, and causing the light reflected by the surface of the melt to be received by the photo detector.

Abstract: A metrology system that uses multiple rotating receiving heads and either (i) photo-emitting targets or (ii) passive retro-reflector targets. In either case, each receiver head includes a pair of slit-shaped field view collectors, at opposing degrees, relative to the axis of rotation of the head. As each head rotates, radiation either generated by or reflected off the targets, passes through slit-shaped field view collectors and onto photo-detectors. A signal processor couple to each of the rotating heads determines the relative position and height of each of the targets based on the signals generated by the photo-detectors.

Abstract: A non-contacting aligning method for planes in a three-dimensional environment is disclosed. The method includes: projecting a light beam in a predetermined incident angle onto a transparent first object and an opaque second object that are facing each other; and calculating a distance between the first and second objects basing on the tangent trigonometric function of the incident angle of the light beam.

Abstract: A surface (104) is detected repeatedly be a detector row (102) of at least one detector (100), the direction of the detector row (102) being the same as the surface's (104) primary direction of movement, and simultaneously a distance between the surface (104) and the detector (100) is detected to produce enlargement data and response rows. Successive response rows are arranged into a response matrix, and the direction of at least one curve in the matrix is determined. Translation of the surface (104) is determined in response matrices formed by means of the direction or directions of at least one curve or curve portion on the basis of enlargement data.

Abstract: The invention provides a level sensor configured to determine a height level of a surface of a substrate supported on a movable substrate support, the level sensor including multiple projection units, multiple detection units, and a processing unit to calculate a height level for each of a plurality of measurement locations on the basis of the measurement beams from the projection units, wherein the level sensor is configured to measure height levels simultaneously at multiple measurement locations on the substrate, wherein the substrate support is configured to move the substrate in a first direction substantially parallel to the surface of the substrate to measure a height level at different locations on the substrate, and wherein at least part of the multiple measurement locations are at least spaced in a second direction that is substantially parallel to the surface of the substrate and perpendicular to the first direction.

Abstract: A position sensor is configured to measure a position data of a target. The position sensor includes a radiation source configured to irradiate a radiation beam, a first grating configured to diffract the radiation beam in a first diffraction direction into at least a first order diffraction beam, and a second grating, arranged in an optical path of the first order diffraction beam, the second grating being configured to diffract the first order diffraction beam diffracted at the first grating in a second diffraction direction substantially perpendicular to the first diffraction direction. The second grating is connected to the target. A first detector is configured to detect at least a part of the beam diffracted by the first grating, and at least one second detector is configured to detect at least part of the beam diffracted by the first grating and the second grating.

Abstract: A processing device includes a control section adapted to perform emission control of first and second light source sections based on a light reception result of a light receiving section adapted to receive a reflected light beam caused by an object reflecting irradiation light beams from the first and second light source sections, and a determination section adapted to determine a positional relationship of the object with respect to the first and second light source sections based on emission current control information for performing the emission control. The determination section determines the positional relationship of the object based on first period emission current control information as the emission current control information in a first period in which no object exists in the detection area and second period emission current control information as the emission current control information in a second period in which the object exists in the detection area.

Abstract: An optical sensor array comprises a photo-sensitive area formed by an array of chiplets having individual light-sensitive elements, each element configured to produce a signal or signals in response to incident light. The displacement of a chiplet from a predetermined position is derivable from the output signal or signals of the element or elements associated with the chiplet. The arrangement provides a method of measuring the displacement of at least one chiplet in an active display.

Abstract: A system and method for estimating a position and a direction using an infrared light are provided. The system may measure an intensity of an irradiation light irradiated by each light irradiator through each light receiver, and may estimate a position and a direction of a remote apparatus, based on the measured intensity, a light receiving directivity, and a light emitting directivity.

Abstract: A position detection system can utilize multiple optical responses to a detection scene, such as by using multiple different patterns of light for imaging a given detection scene. The multiple patterns can include a first pattern containing image data that can be used to separate reflected light from retroreflected light in a second pattern of light. This can be used to reduce errors, such as false detections due to directly-reflected light, and/or can be used for identification of objects in the touch detection scene when the objects themselves are optically configured to appear differently in different patterns of light.

Abstract: An optical position detection device, includes: a light source adapted to emit at least one detection light beam toward one side in a Z-axis direction; a first detector having a light receiving section directed to the one side in the Z-axis direction; a second detector located at a position on the one side in the Z-axis direction, the position being distant from the light source and the first detector, and having a light receiving section directed to the one side in the Z-axis direction; and a position derivation section adapted to derive a position of a object located in a first space between the first detector and the second detector and a position of a object located in a second space on the one side of the second detector in the Z-axis direction based on a light receiving result in the first detector and the second detector.

Abstract: A sensor system and a reverse clamp is provided. The reverse clamp may include a back portion, a first arm, and a second arm. The first and second arm extending from the back portion to form an opening configured to receive a cylindrical arm.

Abstract: A coordinate locating device for a display apparatus is provided, which can have lower manufacturing costs and can locate the coordinates of a single or multiple objects. The coordinate locating device includes a light source configured to emit light, wherein said light source comprises a light emitting device, at least one reflector configured to reflect the light from the light source, and a detector configured to detect the light reflected by the at least one reflector, wherein the light source and the detector are disposed at different positions on the same edge of the coordinate locating device.

Abstract: A tool holder, in particular for a measuring sensor, with an interface to a spindle of a machine tool is proposed. The tool holder comprises, as seen from the interface for the spindle, a material portion which differs from the customary basic material of a tool holder in a lower coefficient of linear expansion ? and/or in a lower heat conductivity ?. According to the invention, the material portion affords thermal decoupling between the tool-side portion of the tool holder and a tool received therein from the tool spindle for reducing a length change on account of an introduction of heat coming from a comparatively hot tool spindle.

Abstract: An optical positioning apparatus and method are adapted for determining a position of an object in a three-dimensional coordinate system which has a first axis, a second axis and a third axis perpendicular to one another. The optical positioning apparatus includes a host device which has a first optical sensor and a second optical sensor located along the first axis with a first distance therebetween, and a processor connected with the optical sensors, and a calibrating device placed in the sensitivity range of the optical sensors with a second distance between an origin of the second axis and a coordinate of the calibrating device projected in the second axis. The optical sensors sense the calibrating device to make the processor execute a calibrating procedure, and then sense the object to make the processor execute a positioning procedure for determining the position of the object in the three-dimensional coordinate system.

Abstract: An optical radiation processing unit directs different wavelengths of the optical radiation emitted by an optical source to an object being measured from a direction that differs from the normal of a surface being measured so that the different wavelengths focus on different heights in the direction of the normal of the surface. A possible polarizer polarizes the reflected radiation in a direction perpendicular to the normal of the surface. The optical radiation processing unit directs to a detector polarized optical radiation that received from the object. The signal processing unit determines on the basis of a signal provided by the detector from the detected radiation the wavelength on which radiation is the highest, and determines the location of the surface by the determined wavelength. When measuring an object from both sides, the thickness of the object being measured is determinable using the locations of the surfaces.

Abstract: An optical locating and tracking system may have two or more optical scanners, one or more optical detectors responsive to radiation from one or more optical sources, and a controller coupled to the detector(s) and the scanner(s). Each scanner has a reflector mounted to a two-dimensional actuator that tilts the reflector about first and second axes. The controller determines whether a given reflector of a given scanner is aligned to provide an optical path between the optical source(s) and the detector(s) from one or more detection signals from the one or more optical detectors. The optical path originates, terminates or is deflected at the object. The controller also determines the object's position in three dimensions from control signals to the two-dimensional actuators of the scanners obtained the reflectors are aligned to provide the optical path. The control signals determine a tilt of each reflector about its first and second axes.

Abstract: There are provided a method of evaluating an area located behind a structure and a system thereof. The system includes: at least one source of electro-magnetic radiation adapted to illuminate a structure portion and to illuminate a area portion via openings formed between elements of the structure while a relative movement is introduced between the structure and the system; multiple detectors adapted to detect electro-magnetic radiation returned from the structure portion and from the area portion; a computing unit adapted to: (i) generate, in response to the detected electro-magnetic radiation, a simplified representation the area portion; and (ii) evaluate the area portion in response to a relationship between the simplified representation of the area portion and a reference simplified representation of the area portion.

Abstract: The invention relates to a focusing and positioning ancillary device for a particle-optical scanning microscope, a particle-optical scanning microscope including a corresponding positioning aid, and a method for focusing and positioning an object in a particle-optical scanning microscope. The focusing and positioning ancillary device includes an illuminating device, a camera, a display and a control unit. The illuminating device produces a collimated or focused light beam at an angle to the particle-optical beam axis which intersects the particle-optical beam axis at a predetermined position. The camera is sensitive to the wavelength of the light beam and records an image of the object, which is positioned on the object table, at a second angle to the particle-optical beam axis. The control unit produces an image captured by the camera on the display together with a marking which indicates the position of the particle-optical beam axis in the image.

Abstract: An apparatus for detecting a position of an object, includes: position detection light sources irradiating light onto the object; a light guide plate having light incident portions receiving the light therein and emitting it onto a detection area to form an intensity distribution of a light emission quantity of the light; a light detector having light receiving portions facing the detection area to receive the light reflected by the object; and a signal processing portion detecting the position of the object based on the intensity distribution; wherein the light guide plate has a plane shape with long-sides and short-sides; the light incident portions and the position detection light sources are installed on corner portions of the light guide plate; and the light incident portions have concavo-convex shapes and provided with deflection incident surfaces for deflecting a portion of the incident light in a direction following the long-sides through refraction.

Abstract: A sensor system and method for analyzing a feature in a sensing volume is provided. The system receives image data from a sensor, where the image data including peaks corresponding to the intersection of laser lines with the feature. The system generates a dynamic window based on the entropy of the peaks.

Abstract: An optical radiation processing unit directs different wavelengths of the optical radiation emitted by an optical source to an object being measured from a direction that differs from the normal of a surface being measured so that the different wavelengths focus on different heights in the direction of the normal of the surface. A possible polarizer polarizes the reflected radiation in a direction perpendicular to the normal of the surface. The optical radiation processing unit directs to a detector polarized optical radiation that received from the object. The signal processing unit determines on the basis of a signal provided by the detector from the detected radiation the wavelength on which radiation is the highest, and determines the location of the surface by the determined wavelength. When measuring an object from both sides, the thickness of the object being measured is determinable using the locations of the surfaces.

Abstract: A method for determining positions and offsets in a plasma processing system, the plasma processing system including at least a chuck and an upper electrode is provided. The method including moving a traversing assembly along a first plurality of paths to generate a first plurality of data sets, the traversing assembly including at least a light source, the light source providing a light beam, moving the traversing assembly along each path of the first plurality of paths causing the light beam to traverse the chuck and resulting in one or more data sets of the first plurality of data sets. The method also including receiving the first plurality of data sets and analyzing the first plurality of data sets to identify a first set of at least three discontinuities, wherein the first set of at least three discontinuities are related to three or more reflected light signals generated when the light beam encounters an edge of the chuck.

Abstract: A triangulation system including a laser beam, optics focusing the laser beam on an object, a light detection unit detecting light reflected from the object due to impingement of the beam on the object, and an arrangement for determining, based on the detected light, object feature dimensions. The wavelength of the laser beam may be shorter than of infrared radiation, which allows for a reduced spot size without significant loss of depth of field. So as to reduce aberrations or a sensitivity to aberrations due to the shortened wavelength, the system may include (i) a polarization dependent coating matching the index of refraction of an element of the light detection unit to that of air for a range of angles, (ii) tilted projection optics, (iii) a prism wavefront corrector, and/or (iv) a positioning assembly, which provides for increased precision in positioning the laser diode with respect to a collimator lens.

Abstract: A method for calibrating alignment of an end effector with respect to a chuck in a plasma processing system is provided. The method including providing a first light beam from the end effector to said chuck. The method including moving the end effector along a predefined calibration path such that the first light beam traverses a surface of the chuck. The method also includes receiving a set of reflected light signals, the set of reflected light signals being generated at least when the surface reflects the first light beam during the moving. The method including analyzing the set of reflected light signals to identify three or more discontinuities. The three or more discontinuities are related to three or more reflected light signals generated when the first light beam encounters an edge of the chuck.

Abstract: A method for measuring relative positions of a specular reflective surface of an object along a measurement line is provided. The method includes converging at least one converging light beam at a nominal position on the measurement line and forming a reflected beam from the specular reflection surface. An image of the reflected beam is recorded at a detector plane. A position of the image of the reflected beam on the detector plane is determined and converted to a displacement of the specular reflection surface from the nominal position along the measurement line. A system for carrying out the method is also provided.

Abstract: In the specification and drawing, an optical detection apparatus is described and shown with scanning devices, detectors, and a processing unit, wherein the scanning devices are positioned to scan a detection region with different light wavelengths.

Abstract: A measurement apparatus, system and method for measuring objects which is easily relocatable about the object is described. The system uses an articulated-arm coordinate measuring machine (CMM) and a laser tracker. A retroreflector for use with the laser tracker is located on the arm of the articulated-arm (CMM). A common coordinate frame of reference can be determined for the CMM and the laser tracker so that the CMM can be moved. Also, points hidden from the laser tracker can be measured for example with the CMM.

Abstract: A level sensor configured to determine a height level of a substrate is disclosed. The level sensor includes a projection unit to project a measurement beam having a substantially periodic radiation intensity on the substrate; a detection unit to receive the measurement beam after reflection on the substrate, the detection unit having a detection grating arranged to receive the reflected measurement beam, the detection grating comprising at least one array of three or more segments together having a length substantially equal to a length of a period of the measurement beam projected on the detection grating, and configured to split the reflected measurement beam in three or more reflected measurement beam parts, and three or more detectors each arranged to receive one of the three or more measurement beam parts; and a processing unit to calculate a height level on the basis of the measurement beam parts.

Abstract: Disclosed herein includes a module and an optical detection device comprising the same for determining a touch position on a screen caused by an object, such as a finger of a user or a stylus pen.

Abstract: An apparatus for determining an elevation of a working tool relative to a reference plane, includes a rotary laser system, a radio unit and a detector. The rotary laser system emits a rotating laser beam in a plane inclined relative to the reference plane. The radio unit is configured to measure a distance between the working tool and the rotary laser system and the detector is mounted on the working tool for detecting the laser beam. The elevation of the working tool can be determined on a basis of the inclination angle and the distance between the working tool and the rotary laser system.

Abstract: Provided is a method of measuring the position of a portable terminal, comprising detecting indoor illuminating light, and outputting an electric signal corresponding to the detected indoor illuminating light, obtaining a plurality of data frames from the output electrical signal, and calculating a position of the portable terminal based on information regarding the position of a corresponding reference light source included in each data frame and an identifier corresponding to the reference light source included in said each frame and a reception time of said each data frame.

Abstract: The present invention provides an optical displacement meter in which light receiving elements are disposed two-dimensionally, capable of stably obtaining a reception light amount in accordance with a work.

Abstract: A device for determining the position of at least one local coil arranged or to be arranged on a patient bed of a magnetic resonance device has at least one optical coil marker arranged on the local coil, at least one optical sensor device to detect the coil marker, the field of view of the sensor device at least partially covering the patient bed in at least a recumbent position, and a computer that determines the coil position and/or coil orientation on the patient bed from measurement data of the sensor device. The computer can form a part of a control unit of the magnetic resonance device.

Abstract: Device and method for positioning a precision part on a turntable (130). The device (100) comprises at least two distance sensors (121.1, 121.2, 121.3), which operate in a contactless manner and are situated in a previously known configuration to a rotational axis (A1) of the turntable (130). The measurement axes (124.1, 124.2, 124.3) of the distance sensors (121.1, 121.2, 121.3) are radially oriented in the direction of the rotational axis (A1) so that the measurement axes (124.1, 124.2, 124.3) of the distance sensors (121.1, 121.2, 121.3) meet in a virtual measuring point (MV). The distance sensors (121.1, 121.2, 121.3) are connected to analysis electronics (200). Output signals (a.1, a.2, a.3) of the distance sensors (121.1, 121.2, 121.3) may be processed on the basis of the analysis electronics (200), in order to allow coaxial centering of the precision part (11) in relation to the rotational axis (A1) upon placement of the precision part (11) on the turntable (130).

Abstract: An apparatus for and a method of fitting or removing a motor vehicle tyre (4) comprising a rotatably supported wheel receiving device (2) to which the rim (3) is to be fixed, at least one fitting or removal tool (5), a rotary drive device (10) for the wheel receiving device and a sensing device (6), (7), (8) for sensing the radially outer rim contour (12), (14) along which the at least one fitting or removal tool is to be guided during the fitting or removal operation, wherein the sensing device (6), (7), (8) is a sensing device which contact-lessly senses the rim contour and the sensing signals of which are converted into electrical sensing signals, and connected to the sensing device (6), (7), (8) is a control device (9) which evaluates the electrical sensing signals and which controls the at least one fitting or removal tool (5) in the fitting or removal operation in dependence on the sensing signals without contact with the rim surface.

Abstract: A positioning system having an emitter unit, a plurality of detector units, a computer and a software package is described. The emitter unit is configured to emit an emitter signal. Each detector unit is configured to output a detector signal in response to detecting the emitter signal. The computer is coupled to the emitter unit and to the detector units. The software package is installed in the computer that directs the computer to perform a number of functions such as controlling the emitter unit, controlling the detector units, inputting positional information into the computer, and estimating a relative position of the emitter unit relative to a target site within a given workspace. An associated method is also described in which the method includes the steps of calculating, directing, displaying, estimating, identifying, inputting, inserting, mounting, and obtaining.

Abstract: An optical displacement sensor for measuring distance or surface displacement of an object by surface profile scanning includes an optical source, a first optical detector and a second optical detector. The optical source is located intermediate the first and second optical detectors. The first and second optical detectors are arranged to collect light emitted by the optical source when scattered by and/or reflected from the object.

Abstract: An apparatus detects an object using an optoelectronic apparatus. Light beams generated by a light source are scattered back and/or reflected by an object and are detected by a receiver arrangement in accordance with the triangulation principle. An object detection signal is output by an evaluation unit and the light beams in the receiver arrangement act via an optical receiver system and a microlens array on a pixel array comprising photodetectors. A macropixel has a plurality of subpixels associated with each microlens. The evaluation unit comprises a unit for determining the received signal distribution over the subpixels. Methods for operating the apparatus are also provided.

Abstract: A three-dimensional shape measuring system includes: a light projecting/receiving apparatus which causes a light receiver to receive light reflected on a surface of a measurement object onto a light receiving surface thereof at a predetermined cycle multiple times, while changing a projecting direction of the light; and a measuring apparatus for measuring a three-dimensional shape of the measurement object, utilizing light receiving data.

Abstract: A method is provided for monitoring degradation of a data storage medium. Multiple reactive elements are provided in the data storage medium. Properties of each one of these elements is determined, prior or subsequent to data being stored in the medium, to generate a baseline map of the medium. Updated properties of at least one of the elements are determined in order to generate an updated map of the medium. A determination can then be made as to whether degradation of the medium has occurred by comparing the baseline map to the updated map.

Abstract: Utilizing frequency-dependent diffraction (also referred to as dispersion) to determine the angular position of a retro-reflective object within a scanning space. The technique involves dispersing an electromagnetic beam into a scanning space by frequency. If a retro-reflective object is located within the scanning space, the object will retro-reflect a portion of the dispersed beam having a frequency that is associated with the angular position of the retro-reflective object within the scanning space. The frequency of the retro-reflected beam is used to determine the angular position of the retro-reflective object within the scanning space. When a second beam is dispersed into the scanning space and a portion of the second beam is retro-reflected in the manner just described, a second angular position of the retro-reflective object can be found. Coordinates of the retro-reflective object are determinable by triangulation using the two angular positions.

Abstract: A surface position detecting apparatus comprises a light-sending optical system which makes first light from a first pattern and second light from a second pattern incident at different incidence angles to a predetermined surface to project an intermediate image of the first pattern and an intermediate image of the second pattern onto the predetermined surface; a light-receiving optical system which guides the first light and the second light reflected on the predetermined surface, to a first observation surface and to a second observation surface, respectively, to form an observation image of the first pattern on the first observation surface and an observation image of the second pattern on the second observation surface; and a detecting section which detects position information of the observation image of the first pattern on the first observation surface and position information of the observation image of the second pattern on the second observation surface and which calculates a surface position of the

Abstract: According to the method for characterizing fancy yarn, at least one characteristic of the fancy yarn is scanned along the longitudinal direction of the fancy yarn. Values of the scanning are evaluated and the results of the evaluation are outputted. The results of the evaluation are the fancy yarn parameters such as base yarn mass, base yarn diameter, slub distance, mass increase (?M) of a slub, slub diameter increase, slub diameter, slub length (LE) and/or slub total mass. The evaluation includes a smoothing or idealization of the scanning values, e.g. an idealization of the webs (91, 91?) as horizontal stretches and of the slubs (92, 92?) as trapeziums. the idealized course of the curve may be subtracted from the original course of the curve in order to obtain information on the slubs on the one hand, and on the virtual base yarn on the other hand. The occurring data quantity may be reduced by specifying parameters of the idealized course of the curve.