Length Patents (Class 356/634)
  • Publication number: 20110242549
    Abstract: A body limb measurement device (10) comprising a track (12), a cart (14), and a laser source (16) fixedly attached to the cart. The cart is capable of linearly moving along the track. The device can further include a vertical support (18) having a pivot (20), and the track can comprise a pivot receiver (22), wherein the pivot receiver (22) is rotatably attached to the pivot (20). The track (12) can include units of length measurement (24) embedded therein. The cart (14) can include a reference point (26) to correspond to the units of length measurement, to track the cart's position on the track (12). A method of measuring a body part (28) comprising the steps of moving the cart (14) along the track (12) to measure the distance between a first edge (32) and a second edge (34) of the body part (28).
    Type: Application
    Filed: December 2, 2009
    Publication date: October 6, 2011
    Inventor: Patrick E Eddy
  • Patent number: 8004559
    Abstract: An apparatus for measuring a 3-dimensional (3D) shape which can remove a shadow, which may occur when measuring the 3D shape, and also can measure a reflected light from an external surface of a test object, is provided. The apparatus for measuring a 3D shape includes a projection part 10 generating a light, an image formation part 20 sensing the light, a prism part 30 being provided between the projection part 10 and the viewing part 20, and a first mirror part 40 and a second mirror part 50 being provided in both ends of the prism part 30. Also, the prism part 30 selectively transmits the light generated from the projection part 10 to the first mirror part 40 and the second mirror part 50 to be directed towards an external surface of a test object 1. When the light reflected from the external surface of the test object 1 is selectively transmitted to the first mirror part 40 and the second mirror part 50 and thereby reflected, the prism part 30 transmits the reflected light to the viewing part 20.
    Type: Grant
    Filed: February 27, 2007
    Date of Patent: August 23, 2011
    Assignee: Koh Young Technology Inc.
    Inventors: Moon Young Jeon, Min Young Kim
  • Patent number: 7973943
    Abstract: Apparatus is disclosed for determining the track of origin of a cigarette manufactured in a cigarette making machine having a plurality of tracks. The cigarette making machine (60) is arranged such that the circumferential position of the tipping paper seam and the circumferential position of the tobacco wrapping paper seam are different for different tracks. The apparatus comprises a detector (20, 22; 36; 50) arranged to detect radiation from the cigarette (18) and to produce a signal representative of the detected radiation, and a processor (30; 54) arranged to process the signal produced by the detecting means to identify a shadow cast by a tipping paper seam and a shadow cast by a wrapping paper seam.
    Type: Grant
    Filed: November 10, 2009
    Date of Patent: July 5, 2011
    Assignee: Molins PLC
    Inventors: Honey Jose, Ian Tindall, John Sanders
  • Patent number: 7969582
    Abstract: A laser scanning microscope apparatus comprising, a controlling unit for obtaining height information at each scanning point of a sample to be examined by obtaining a relative distance that maximizes an intensity output from a photo-detecting unit, which is obtained when the sample to be examined is scanned with a light from a laser light source, when a relative distance is changed by a Z scanning unit, includes an arithmetic processing unit for obtaining a plurality of height profiles of one line acquired by scanning the sample to be examined in a state of light with the light defecting unit while shifting the plurality of height profiles of one line in a scanning direction by a predetermined amount, and for obtaining one profile by linking the plurality of height profiles.
    Type: Grant
    Filed: December 15, 2008
    Date of Patent: June 28, 2011
    Assignee: Olympus Corporation
    Inventor: Akihiro Fujii
  • Publication number: 20110146376
    Abstract: The object of the invention is a device for in-situ determining the compactness of grainy material layers, especially determining the compactness of material layers containing equally solid part, liquid and gaseous phases e.g. soils, that consists of a guide body, a loading disc connected with the guide body and a dropping-weight movable relating the loading disc along the guide body. The characteric feature of the device is that an indicator figure (20) is adjusted to a dropping weight (13), the indicator figure (20) has a guide organ (21), wherein one of the guide organs (21) and the guide body (11) are at least periodically in a connection with each other restricting the direction of movement and the guide body (11) is complemented with a length measuring unit (30). Furthermore, the object of the invention is also a method for in-situ determining the compactness of grainy material layers, especially determining the compactness of material layers containing equally solid part, liquid and gaseous phases e.g.
    Type: Application
    Filed: July 17, 2009
    Publication date: June 23, 2011
    Inventor: Istvan Subert
  • Publication number: 20110039709
    Abstract: The invention relates to an apparatus for purification, respectively processing and/or analysis of biological target molecules with a detection device for detecting at least one object, which includes at least one detection area, wherein the detection device is adapted to detect at least one height value of the detection area and is adapted to determine, from the at least one height value, a spatial position and/or orientation and/or a type and/or a presence and/or a number and/or a state of the at least one object. Further, the invention relates to a receiving device for receiving material for the processing, purification and/or analysis of biological target molecules with at least one identification element, wherein the at least one identification element defines a height profile for identifying the receiving device, wherein the height profile is provided for at least one height measurement and extends at least in sections along a line, preferably a straight line.
    Type: Application
    Filed: August 20, 2008
    Publication date: February 17, 2011
    Applicant: QIAGEN GMBH
    Inventors: Georg Lips, Ulf Friederichs
  • Publication number: 20110032542
    Abstract: A method of measuring a length of sections of extrados or intrados curves of an elongated workpiece travelling in a bending machine along a forwarding direction, the elongated workpiece having cross-sections each of which is separated by a neutral axis in both an extended portion and a compressed portion when the elongated workpiece is subjected to bending, and at least a neutral cross-section, i.e. not subjected to bending, neutral cross-section beyond which the bending of the elongated workpiece begins along the forwarding direction thereof, provides a measuring instrument positioned so that it engages either an extrados or an intrados point of the elongated workpiece near the neutral cross-section, but displaced therefrom in the forwarding direction of the elongated workpiece. Further, a measuring instrument on a bending machine that embodies the method is described.
    Type: Application
    Filed: August 5, 2010
    Publication date: February 10, 2011
    Applicant: CML INTERNATIONAL S.P.A.
    Inventors: Alessandro CAPORUSSO, Silvio REA
  • Publication number: 20100315655
    Abstract: Determination of the height difference between a first reference point and a second reference point, at least one of the two reference points lying on a semiconductor chip, which is mounted on a substrate, comprises the steps A) recording a first image from a first direction, which runs diagonally to the surface of the substrate at a predetermined angle ?2, the substrate and the semiconductor chip being illuminated from a second direction which runs diagonally to the surface of the substrate at a predetermined angle ?3, a telecentric optics being located in the beam path, B) recording a second image from the second direction, the substrate and the semiconductor chip being illuminated from the first direction, either the cited telecentric optics or a further telecentric optics being located in the beam path, C) ascertaining a first coordinate of the position of the first reference point and a first coordinate of the position of the second reference point in the first image and determining a first difference
    Type: Application
    Filed: November 19, 2007
    Publication date: December 16, 2010
    Applicant: ESEC AG
    Inventors: Stefan Behler, Patrick Blessing, Stephan Scholze, Roland Stalder, Martin Von Arx
  • Patent number: 7853426
    Abstract: A device for determining the category of mail of a mailpiece, which device comprises: an stand designed to receive said mailpiece; at least one gauge fastened to said stand and provided with a slot of predetermined length and of predetermined height, which length and which height are suitable for defining a determined maximum width and a determined maximum thickness for the mailpiece; means for automatically estimating a length of the mailpiece depending on its position on the stand, and relative to the gauge; and means for acting, on the basis of that single estimate of the length of the mailpiece, to deliver, to a franking machine, information about the category of mail to which said mailpiece belongs.
    Type: Grant
    Filed: May 27, 2008
    Date of Patent: December 14, 2010
    Assignee: NEOPOST Technologies
    Inventor: Michel Fajour
  • Patent number: 7826048
    Abstract: An apparatus for measuring geometric deviations in a doctor blade includes a camera defining an optical axis. The optical axis defines an X-axis in a Cartesian coordinate system. An origin of the Cartesian coordinate system defines an intersection point. A first light source has a first central axis. The first central axis is angularly disposed from the X-axis by a first angle with respect to the X-axis. A second light source has a second central axis. The second central axis is angularly disposed from the X-axis by a second angle with respect to the X-axis. A doctor blade holding device is configured to mount a doctor blade wherein a portion of the doctor blade to be measured is positioned at the intersection point.
    Type: Grant
    Filed: December 28, 2006
    Date of Patent: November 2, 2010
    Assignee: Lexmark International, Inc.
    Inventors: Thomas Allen Holecek, Robert L. Paterson
  • Patent number: 7821652
    Abstract: A method for focusing discrete points on an under-measured object is provided. The method includes: (a) receiving an image of the object, selecting measurement points on the image, and obtaining X, Y coordinate values of the measurement points; (b) searching a solid point on the under-measured object according to the X, Y coordinate value of one of the measurement points, wherein the solid point corresponds to the measuring point; (c) emitting a laser light to the solid point for computing a vertical distance “h” between the laser aid and the solid point; (d) computing a Z coordinate value of the measurement point according to the “h”; repeating step (b) to step (d) until all the Z coordinate values of the measurement points have been computed; and (e) focusing the solid points according to the X, Y and Z coordinate values of the measurement points. A related system is also provided.
    Type: Grant
    Filed: December 29, 2007
    Date of Patent: October 26, 2010
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Chih-Kuang Chang, Li Jiang
  • Patent number: 7804588
    Abstract: A measuring device for optical and spectroscopic examination of a sample includes a housing, a first light source, a window, an optical spectrometer with a dispersive element and a number of detector elements and which can record light from the first light source which is indirectly reflected by the sample and reenters the housing through the window, an electronic camera whose incidence opening is directed onto the sample, through the window, and an electronic evaluation device which is connected to an image sensor of the camera and to the detector elements. The camera may be assigned a second light source.
    Type: Grant
    Filed: January 10, 2008
    Date of Patent: September 28, 2010
    Assignee: Deere & Company
    Inventors: Georg Kormann, Rico Priesnitz, Nico Correns, Michael Rode
  • Publication number: 20100172544
    Abstract: An on-the-fly method for measuring the length, along an axis (z?z) of an anode (20) used in the production of aluminium by molten salt electrolysis in which: i) said anode is suspended from a gripping member (13a) which is fitted with a displacement sensor measuring the vertical position of the point of attachment (O); ii) said gripping member is moved vertically so that the lower surface (21a) of the anode passes through a plane (P) formed by n beams (f1, . . . , fi, . . . , fn) and, each time one of said beams i (i=1 to n) is disturbed by the lower surface of the anode passing through it, the vertical position hi of said point of attachment (O) is measured; iii) the angle of inclination zz? of the anode stem is measured and the distance between the point of attachment and the lower surface (21a) of the anode block (21) is deduced based on values measured hi (i=1 to n), and the inclination value of the anode stem.
    Type: Application
    Filed: June 1, 2007
    Publication date: July 8, 2010
    Applicant: E.C.L.
    Inventors: Alain Van Acker, Alain Rose, Patrick Marchand
  • Publication number: 20100157317
    Abstract: A testing system for testing dimensions of a cutting tool chosen by a cutting tool choosing device, includes a controller and an optical sensor. The controller includes a cutting tool changing module, a cutting tool control module, and a dimension calculating module. The cutting tool changing module is configured for controlling the cutting tool choosing device to move the cutting tool to a tip initial position above the optical sensor. The cutting tool control module is configured for controlling the cutting tool choosing device to move the cutting tool from the tip initial to the height of a lightbeam of the optical sensor, and moving the cutting tool to pass through the lightbeam of the optical sensor from side to side. The dimension calculating module is configured for receiving the electrical signals from the optical sensor and calculating dimensions of the cutting tool.
    Type: Application
    Filed: December 30, 2008
    Publication date: June 24, 2010
    Applicant: FOXNUM TECHNOLOGY CO., LTD.
    Inventor: WEI-DER TANG
  • Publication number: 20100105153
    Abstract: An expansion/contraction measuring apparatus includes a transport section which transports a flexible substrate along a surface of the substrate; a detecting section detecting first and second marks which are formed on the substrate while being separated from each other by a predetermined spacing distance in a transport direction of the substrate and which are moved, in accordance with the transport of the substrate, to first and second detection areas disposed on a transport route for the substrate respectively; a substrate length setting section which sets a length of the substrate along the transport route between the first and second detection areas to a reference length; and a deriving section which derives information about expansion/contraction of the substrate in relation to the transport direction based on a detection result of the first and second marks. Accordingly, the expansion/contraction state of an expandable/contractible substrate is measured highly accurately.
    Type: Application
    Filed: August 31, 2009
    Publication date: April 29, 2010
    Inventors: Tohru Kiuchi, Hideo Mizutani
  • Patent number: 7700247
    Abstract: A method is described for measuring a dimension on a substrate, wherein a target pattern is provided with a nominal characteristic dimension that repeats at a primary pitch of period P, and has a pre-determined variation orthogonal to the primary direction. The target pattern formed on the substrate is then illuminated so that at least one non-zero diffracted order is detected. The response of the non-zero diffracted order to variation in the printed characteristic dimension relative to nominal is used to determine the dimension of interest, such as critical dimension or overlay, on the substrate. An apparatus for performing the method of the present invention includes an illumination source, a detector for detecting a non-zero diffracted order, and means for positioning the source relative to the target so that one or more non-zero diffracted orders from the target are detected at the detector.
    Type: Grant
    Filed: December 19, 2003
    Date of Patent: April 20, 2010
    Assignee: International Business Machines Corporation
    Inventor: Christopher Ausschnitt
  • Patent number: 7684061
    Abstract: An electronic component mounting apparatus includes a beam projector for projecting a laser beam, a beam receiver which is placed in opposition to the beam projector and which receives a laser beam projected from the beam projector, a light-reception-sensitivity setting unit for adjusting light-reception sensitivity of the beam receiver, a projection-side orifice provided in the beam projector to narrow a projection spot diameter of the laser beam, and a reception-side orifice provided in the beam receiver to narrow a light-reception spot diameter, where the light-reception sensitivity of the beam receiver is improved. As a result, an electronic component mounting apparatus capable of accurately detecting height size of small components by using a relatively inexpensive photoelectric sensor can be provided.
    Type: Grant
    Filed: June 29, 2006
    Date of Patent: March 23, 2010
    Assignee: Panasonic Corporation
    Inventors: Masanori Hiyoshi, Hidehiro Saho, Noboru Yamasaki, Tadashi Endo
  • Patent number: 7684059
    Abstract: A device for determining the position of an object that is movable along at least one displacement direction, the or each displacement direction having assigned to it one length measuring device for measuring the position of the object along the respective spatial direction, includes: at least one scale extending along a displacement direction of the object to be measured as a first component of the respective length measuring device; a scanning head for scanning the scale as a second component of the respective length measuring device such that a change in the position of the scale with respect to the scanning head along the associated displacement direction of the object to be measured is measurable, one of the two components of the respective length measuring device being moved together with the object to be measured along the respective displacement direction when the latter is moved; and a device for determining the distance of the component of the respective length measuring device, which is movable tog
    Type: Grant
    Filed: February 7, 2007
    Date of Patent: March 23, 2010
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Gerald Metz, Christian Spaeth, Holmer Dangschat
  • Publication number: 20100045968
    Abstract: A method for non-contact measurement of the velocity and/or the length of an extrudate moved forward in the longitudinal direction, in particular of a cable during the production.
    Type: Application
    Filed: August 14, 2009
    Publication date: February 25, 2010
    Applicant: SIKORA AG
    Inventor: Harald Sikora
  • Publication number: 20100026491
    Abstract: An object detecting device for detecting the existence and general placement of an object residing upon a surface. A preferred embodiment of the invention uses at least one laser measuring scanner operated positioned by a servo motor to allow the laser measuring scanner to generate signals related to the placement of an object on a surface. Those placement signals are then processed by a computer to make a two or three dimensional determination of the object in coordinates that show the object's location in relation to another device such as a robotic depalletizer that can then be moved into position near the object to allow removal of the object by the robotic depalletizer.
    Type: Application
    Filed: September 29, 2009
    Publication date: February 4, 2010
    Applicant: FKI LOGISTEX INC.
    Inventors: Matthew R. Wicks, Christopher S. Maue
  • Publication number: 20100027034
    Abstract: The invention relates to a method and arrangement for measuring a timber piece (4) in a wood handling machine (1). Such a wood handling machine comprises booms (2) arranged in a base machine and a wood handling device (3) operating therein. In such a wood handling machine (1), a wood handling device (3) grips the timber piece (4) to be handled, after which one end of the timber piece is guided into a measuring carriage (5) in the wood handling machine by the wood handling device. The timber piece arranged in the measuring carriage is subjected to one or more observation measures by observation means provided in the measuring carriage.
    Type: Application
    Filed: August 29, 2007
    Publication date: February 4, 2010
    Applicant: PONSSE OYJ
    Inventor: Esko Havimäki
  • Publication number: 20090278927
    Abstract: The disclosed subject matter relates to a sensor and apparatus for vehicle height and slant measurement which can include a light source, and two cameras with respective lenses. The light source can be configured to emit light towards a road, and both cameras can be configured to receive the image of the road that is illuminated by the light from the light source and to thereby create image data. The apparatus can include a control circuit that can geometrically measure a vehicle height in accordance with the image data. The sensor can also receive image data from different points and from two light sources, and the apparatus can detect a vehicular lean using the different vehicle heights. Thus, because the sensors of the disclosed subject matter do not necessarily include a moving part as in the conventional sensor, the sensors can be easily attached to a vehicle body and can also be used for a vehicular lean detection.
    Type: Application
    Filed: May 7, 2009
    Publication date: November 12, 2009
    Inventors: Yutaka ISHIYAMA, Takuya KUSHIMOTO
  • Patent number: 7609393
    Abstract: Method for testing the filling of a container with rod-shaped articles of the tobacco-processing industry and filling test device for the container, in which a depth of the container is at least as great as a length of a rod-shaped article. The process includes detecting at least one property of the content of the container, comparing the at least one property with a predetermined desired content of the container, and when a deviation from the desired content is greater than a predetermined tolerance value, generating a signal corresponding to a defective filling. The instant abstract is neither intended to define the invention disclosed in this specification nor intended to limit the scope of the invention in any way.
    Type: Grant
    Filed: May 22, 2006
    Date of Patent: October 27, 2009
    Assignee: Hauni Maschinenbau AG
    Inventors: Dirk Sacher, Ralf Heikens, Matthias Horn
  • Patent number: 7595482
    Abstract: A standard component for length measurement includes a first diffraction grating and a second diffraction grating. Each of components of the second diffraction grating is disposed between components of the first diffraction grating.
    Type: Grant
    Filed: April 17, 2008
    Date of Patent: September 29, 2009
    Assignee: Hitachi High-Technologies Corporation
    Inventor: Yoshinori Nakayama
  • Patent number: 7593115
    Abstract: A component is deployed into a well on a carrier line having an optical cable. An optical signal is transmitted into the optical cable, and a travel time of the optical signal in the optical cable is determined. A profile of a characteristic along the optical cable is determined, and a length of the carrier line deployed into the well is determined based on the determined profile and the travel time.
    Type: Grant
    Filed: February 28, 2007
    Date of Patent: September 22, 2009
    Assignee: Schlumberger Technology Corporation
    Inventors: Vladimir Hernandez-Solis, Rogerio T. Ramos, Joseph Varkey
  • Patent number: 7580137
    Abstract: A method of determining one or more physical properties of a rolled smoking article is disclosed, the method comprising disposing a rolled smoking article within a field of view, illuminating the field of view, imaging the rolled smoking article to form an image, and analyzing the image to determine one or more physical properties of the rolled smoking article. Preferably the image is a digital image, which may be electronically processed to determine the physical properties. The physical properties may include the length of the rolled smoking article, or its mean diameter, ovality, circumference, roundness or shape. Also disclosed is an apparatus for performing such method comprising imaging means defining the field of view, means for positioning a smoking article in the field of view, illuminating means for illuminating the field of view, and processing means for processing the image to determine one more physical properties.
    Type: Grant
    Filed: March 19, 2004
    Date of Patent: August 25, 2009
    Assignee: Molins PLC
    Inventors: Ronald F. Wilson, Gary J. Pitt, Timothy G. Irons, William A. H. Everitt
  • Patent number: 7578068
    Abstract: A detecting apparatus includes a detecting plate, a controlling box, and an indicator installed on the detecting plate. A region is defined on one face of the detecting plate, for supporting a workpiece thereon, with an edge of the workpiece abutting against one side of the region. A first slot and a second slot are defined in the detecting plate on an opposite side of the region. The controlling box having a circuit board with a processor is installed on an opposite face of the detecting plate. Two light sensors are installed on the circuit board aligning with the first and second slots of the detecting plate respectively. The indicator is electrically connected with the light sensors and controlled by the processor, for showing whether the dimension of the workpiece is eligible, according to detection by the light sensors.
    Type: Grant
    Filed: July 27, 2007
    Date of Patent: August 25, 2009
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Bing-Jun Zhang, Lian-Zhong Gong
  • Patent number: 7573587
    Abstract: A method of continuously measuring an elevation and shape of an unmelted polycrystalline silicon island during a silicon meltdown process. The method comprises projecting a focused bright light on the silicon island to produce a bright dot on the silicon island. The method also includes electronically determining an elevation and a shape of the silicon island by tracking the bright dot during the meltdown process.
    Type: Grant
    Filed: August 25, 2008
    Date of Patent: August 11, 2009
    Assignee: MEMC Electronic Materials, Inc.
    Inventors: Zheng Lu, Steven L. Kimbel, Robert H. Fuerhoff, Joseph C. Holzer
  • Patent number: 7570369
    Abstract: In a method for measuring the size or shape of an edge of a machined work piece or of a cutting edge of a tool, the surface of the edge is illuminated by diffused radiation from several positions in the vicinity to the edge by an illumination arrangement, and a picture of the edge is reproduced by recording reflected radiation from the illuminated edge by means of a picture reproduction unit.
    Type: Grant
    Filed: June 17, 2005
    Date of Patent: August 4, 2009
    Assignee: Volvo Aero Corporation
    Inventor: Per Henrikson
  • Patent number: 7543371
    Abstract: An automated system for setting the linear distance from a mounting surface of a pivot cartridge to critical features on actuator arms is disclosed. This distance is set to eliminate the tolerance incurred via normal manufacturing of these components. The system adjusts for every component to customize each actuator and/or pivot assembly to meet the functionality requirements for disk drives.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: June 9, 2009
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: David Joseph Bagaoisan, Steven Hanssen
  • Patent number: 7524105
    Abstract: An optical dilatometer includes a furnace, in which a sample may be laid on a sample carrier, and an optical system for measuring a length of the sample at different temperatures, windows for the passage of beams being provided on a sample chamber of the furnace. A light source and a collimator for generating a parallel beam path are situated on one side of the furnace, the length of the sample being detectable via a silhouette image by a sensor, situated on the diametrically opposite side of the furnace from the light source, and a lens system. This allows a simple length measurement without orientation of an optical system.
    Type: Grant
    Filed: April 24, 2007
    Date of Patent: April 28, 2009
    Assignee: BAEHR - Thermoanalyse GmbH
    Inventor: Heinz Baehr
  • Patent number: 7505155
    Abstract: An apparatus and method for inspecting polycrystalline silicon (Poly-Si) that illuminates light onto protrusions in the Poly-Si in order to determine a distance between them using intensity and reflection angle of reflected light. The Poly-Si inspection apparatus includes a light source that illuminates light, and a reflected light detector for receiving reflected light, wherein a distance between protrusions is measured by an incident angle of the light illuminated into the protrusion from the light source, a detection angle of the reflected light detector, and a wavelength of the detected reflected light.
    Type: Grant
    Filed: January 21, 2005
    Date of Patent: March 17, 2009
    Assignee: Samsung Mobile Display Co., Ltd.
    Inventors: Keun-Ho Jang, Hyun-Gue Kim
  • Patent number: 7485859
    Abstract: A charged beam apparatus, such as an electron microscopy apparatus, and a method for determining an aerial dimensional map of a charged beam within the charged beam apparatus, each use a test structure that includes a feature located upon a substrate. One of the feature and the substrate is conductive and the other of the feature and the structure is non conductive. The charged beam within the charged beam apparatus is scanned in a plurality of non-parallel linear directions with respect to the substrate and the feature to provide a corresponding plurality of current versus position response curves from which may be determined the aerial dimensional map of the charged beam within the charged beam apparatus.
    Type: Grant
    Filed: April 17, 2007
    Date of Patent: February 3, 2009
    Assignee: International Business Machines Corporation
    Inventors: Lin Zhou, Eric Peter Solecky
  • Patent number: 7477400
    Abstract: A range/speed finder can be incorporated into a personal electronic device. In one example, a personal electronic device includes an automatic focus system adapted to focus an image of an object and a processor in communication with the automatic focus system adapted to detect a distance of the object using the automatic focus system. The processor can be adapted to detect a speed of the object and/or a dimension of the object using the automatic focus system. Methods and systems for determining a distance, a dimension, and/or a speed of the object relative to the personal electronic device are also provided.
    Type: Grant
    Filed: September 2, 2005
    Date of Patent: January 13, 2009
    Assignee: Siimpel Corporation
    Inventors: Roman C. Gutierrez, Tony K. Tang
  • Patent number: 7468800
    Abstract: A method of determining surface properties is provided, in which radiation is irradiated onto a first region of a surface to be examined, then at least some of the radiation irradiated onto the first region and returned by the latter is detected, and a measured value characteristic of this returned radiation is output. In a further step, the radiation is irradiated onto a second region of the surface and once again at least some of the radiation irradiated onto the second region and returned by the latter is detected, and a second measured value characteristic of this radiation is output. Finally, a result value is output which is characteristic of a relationship between the first measured value and the second measured value.
    Type: Grant
    Filed: May 30, 2006
    Date of Patent: December 23, 2008
    Assignee: BYK-Gardner GmbH
    Inventors: Peter Schwarz, Gerhard Hentschel, Konrad Lex
  • Patent number: 7466431
    Abstract: In order to measure the length F of the band-shaped member 15 in all the positions in a specified width-direction region with a simple construction, a two-dimensional laser displacement sensors 18, 19 emitting laser beams 22, 23 inclined at a certain angle with respect to a longitudinal direction of the band shaped member 15 and the band-shaped member 15 move relative to each other in the longitudinal direction of the band-shaped member 15, each position of a starting end 15a and a terminating end 15b of the band-shaped member 15 crossing the laser beam 22, 23 is detected repeatedly by the two-dimensional laser displacement sensors 18, 19 each time a relative moving distance between the two-dimensional laser displacement sensors 18, 19 and the band-shaped member 15 reaches a certain value, a position information of the starting end 15a and the terminating end 15b of the band-shaped member 15 at each width-direction position is obtained from a detection result thereof, and the length of the band-shaped member
    Type: Grant
    Filed: August 15, 2005
    Date of Patent: December 16, 2008
    Assignee: Bridgestone Corporation
    Inventor: Shinya Iwayama
  • Publication number: 20080281556
    Abstract: An apparatus is for evaluating optical characteristics of an optical system based on an image forming position of a point image formed through the optical system. The apparatus includes a point image producing unit that forms a point image through the optical system in each point light source; an imaging unit that images the point images to produce a point image distribution image; and a moving unit that changes relative distance between the optical system and the point light source or the imaging unit in an optical axis direction. The apparatus also performs processing of detecting an image forming position in each different relative distance of the point image based on image information of the point image distribution images, the processing including calculating a regression expression for the detected image forming positions to obtain a shape parameter of the image axis in each of the point images.
    Type: Application
    Filed: May 8, 2008
    Publication date: November 13, 2008
    Applicant: OLYMPUS CORPORATION
    Inventor: Toshiaki MATSUZAWA
  • Patent number: 7435568
    Abstract: Embodiments of the invention include Optical Cell Guidance (OCG) methods and apparatus to control cell growth. This system guides the leading edge of motile cells with an optical gradient, which biases the cell's motion into the light by pulling on proteins, which act like soft dielectrics in the electromagnetic field. OCG differs from those devices described above in that it controls the direction of cell motility. This is an entirely new field, and the first device to directly manipulate cell motility. OCG differs from current approaches in that it does not trap or hold particles. Instead of trapping and pulling the cell, the goal of OCG is to influence, direct, and control the growth of a growth cone.
    Type: Grant
    Filed: November 13, 2002
    Date of Patent: October 14, 2008
    Assignee: Universitat Leipzig
    Inventors: Josef Käs, Mark Raizen, Valery Milner, Timo Betz, Allen Ehrlicher
  • Publication number: 20080246974
    Abstract: A portable optical measurement assembly for measuring the dimensions of an upper peripheral region of a wall structure of a swimming pool is provided. The assembly comprises an optical unit subassembly including an optical unit casing. The optical unit casing encloses a light source structured and arranged to direct a light beam onto an upper peripheral region of the wall structure of a swimming pool and a sensor structured and arranged to provide data indicative of the distance from the light source to the particular point on the upper peripheral region of a wall structure of a swimming pool surface. The portable optical measurement assembly also includes a mounting assembly for rotationally supporting the optical unit subassembly.
    Type: Application
    Filed: March 28, 2008
    Publication date: October 9, 2008
    Inventors: Jean Laurent Wilson, Thomas Edward Lucas, Jacques Lamond
  • Patent number: 7423269
    Abstract: One embodiment relates to a method of automated microalignment using off-axis beam tilting. Image data is collected from a region of interest on a substrate at multiple beam tilts. Potential edges of a feature to be identified in the region are determined, and computational analysis of edge-related data is performed to positively identify the feature(s). Another embodiment relates to a method of automated detection of undercut on a feature using off-axis beam tilting. For each beam tilt, a determination is made of difference data between the edge measurement of one side and the edge measurement of the other side. An undercut on the feature is detected from the difference data. Other embodiments are also disclosed.
    Type: Grant
    Filed: February 22, 2006
    Date of Patent: September 9, 2008
    Assignee: KLA-Tencor Technologies Corporation
    Inventors: Amir Azordegan, Hedong Yang, Gongyuan Qu, Gian Francesco Lorusso
  • Patent number: 7414734
    Abstract: An image position detecting device is disclosed that detects an image position based on a reflected light from an image carrier that reflects a light irradiated from a light emitting source. The device includes first and second light receivers that are spaced apart in a moving direction of the image carrier such that the first light receiver detects a toner image adhered on and being moved by the image carrier before the second light receiver detects the toner image, and a comparison output unit that compares first and second analog signals input from the first and second light receivers to determine whether a level of the first analog signal is higher than a level of the second analog signal, and outputs the comparison result as an output signal in binary form. The first and second analog signals are input to the comparison output unit at different levels.
    Type: Grant
    Filed: February 22, 2006
    Date of Patent: August 19, 2008
    Assignee: Ricoh Printing Systems, Ltd.
    Inventor: Yasuyuki Horie
  • Publication number: 20080186515
    Abstract: In a method for measuring the size or shape of an edge of a machined work piece or of a cutting edge of a tool, the surface of the edge is illuminated by diffused radiation from several positions in the vicinity to the edge by an illumination arrangement, and a picture of the edge is reproduced by recording reflected radiation from the illuminated edge by means of a picture reproduction unit.
    Type: Application
    Filed: June 17, 2005
    Publication date: August 7, 2008
    Applicant: VOLVO AERO CORPORATION
    Inventor: Per Henrikson
  • Publication number: 20080170243
    Abstract: An apparatus for measuring the height of a work held by a chuck table provided in a machining apparatus, including: a white light source for emitting a white beam of light; a chromatic aberration lens for condensing the white beam emitted from the white light source; a beam splitter which is disposed between the white light source and the chromatic aberration lens and by which a reflected beam of the white beam irradiating the work therewith is split; a first condenser lens for condensing the reflected beam split by the beam splitter; a diffraction grating by which the reflected beam condensed by the first condenser lens is converted into a diffracted beam; a second condenser lens for condensing the diffracted beam diffracted by the diffraction grating; and a wavelength detecting unit for detecting the wavelength of the diffracted beam condensed by the second condenser lens.
    Type: Application
    Filed: January 3, 2008
    Publication date: July 17, 2008
    Applicant: Disco Corporation
    Inventor: Keiji Nomaru
  • Patent number: 7397252
    Abstract: A method for accurately measuring feature sizes and quantifying the beam spot size in a CDSEM at real time is provided. The inventive method is based on a scanning microscope and it works on both conductive and non-conductive features. The measurement of conductive feature includes first providing a conductive feature on a surface of a substrate (the substrate maybe an insulator, a semiconductor or a material stack thereof). The conductive feature is then connected to ground and thereafter an electron beam probe raster scans the sample. When the electron beam probe hits the conductive feature the spot will have a negative potential. The potential difference between the spot and the ground will induce an electrical current flow. When the electrical beam is off the conductive feature, there will be no current flow. Therefore, by measuring the current response to the location of the beam spot, the dimension of the conductive feature can be derived.
    Type: Grant
    Filed: July 31, 2006
    Date of Patent: July 8, 2008
    Assignee: International Business Machines Corporation
    Inventors: Lin Zhou, Eric P. Solecky
  • Patent number: 7391524
    Abstract: A system and a method for optical characterization of a symmetric grating illuminated at off-normal incident angle are provided, where the plane of incidence is parallel to the grating lines. In this case corresponding positive and negative diffraction orders have the same intensity and phase. Several approaches for exploiting this symmetry are given. The first approach is a symmetric rigorous coupled wave analysis (SRCWA) adapted to the symmetric case, which accounts for N positive and N negative diffraction orders with M=N+1 space harmonics, without approximation. Various approximation methods are also given. Approximate versions of the RCWA (or SRCWA) can be developed by neglecting polarization coupling for small angles of incidence. A normal incident angle calculation can be used to approximate a situation with a small angle of incidence. Refinements to this approximation include revision of grating depth or refractive indices to improve accuracy.
    Type: Grant
    Filed: September 13, 2004
    Date of Patent: June 24, 2008
    Assignee: n&k Technology, Inc.
    Inventors: Shuqiang Chen, Guoguang Li
  • Publication number: 20080123113
    Abstract: In order to measure the length F of the band-shaped member 15 in all the positions in a specified width-direction region with a simple construction, a two-dimensional laser displacement sensors 18, 19 emitting laser beams 22, 23 inclined at a certain angle with respect to a longitudinal direction of the band shaped member 15 and the band-shaped member 15 move relative to each other in the longitudinal direction of the band-shaped member 15, each position of a starting end 15a and a terminating end 15b of the band-shaped member 15 crossing the laser beam 22, 23 is detected repeatedly by the two-dimensional laser displacement sensors 18, 19 each time a relative moving distance between the two-dimensional laser displacement sensors 18, 19 and the band-shaped member 15 reaches a certain value, a position information of the starting end 15a and the terminating end 15b of the band-shaped member 15 at each width-direction position is obtained from a detection result thereof, and the length of the band-shaped member
    Type: Application
    Filed: August 15, 2005
    Publication date: May 29, 2008
    Applicant: Bridegstone Corporation
    Inventor: Shinya Iwayama
  • Publication number: 20080100852
    Abstract: An optical sensor for detecting the housing state such as the thickness of a substrate in the present invention is provided at supporting arms. The supporting arms are attached to a supporting shaft. The supporting arms are in a vertical state in a state before detection of the substrate, but when detecting, the supporting shaft rotates to bring the supporting arms into a horizontal state so that the optical sensor enters a substrate housing body and is set at a predetermined detection position. Accordingly, a space for moving the optical sensor in the horizontal direction becomes unnecessary to reduce the space required for the detecting operation and the like, making it possible to reduce the size of a substrate processing apparatus in which the detecting apparatus is incorporated.
    Type: Application
    Filed: October 12, 2007
    Publication date: May 1, 2008
    Applicant: TOKYO ELECTRON LIMITED
    Inventor: Naruaki IIDA
  • Publication number: 20080072444
    Abstract: The present invention relates to a system for viewing coordinates representative of points on a vehicle, which includes a portable gauge assembly (52) having a length of bar (62) graduations (64), an adjustable pointer mount (76) and adjustable pointer (78) for simultaneously setting coordinates representative of a height and width or height and length dimension of a point on the vehicle and an adjustable positioning means (66) for setting a coordinate representative of a baseline of light emitted relative to the vehicle. Positioning means (66) is further used for adjusting bar (62) level and perpendicular to the baseline when gauge (52) is spatially place relative to the point on the vehicle and the baseline, whereby the coordinates may then be viewed at pointer mount (76) or transferred a spatial location within the path of the baseline and viewed at positioning means (66).
    Type: Application
    Filed: September 20, 2007
    Publication date: March 27, 2008
    Inventors: Mitchell C. Harrill, Elena Harrill
  • Patent number: 7349106
    Abstract: An apparatus (1) and a method for thin-layer metrology of semiconductor substrates (16) are disclosed. The semiconductor substrates (16) are delivered or transported to the apparatus (1) by means of at least one cassette element. A measurement unit (5) for thin-layer micrometrology is provided in the apparatus (1), the semiconductor substrates being conveyed by means of a transport mechanism (7) from the cassette element (3) to the measurement unit (5) for thin-layer micrometrology. A measurement unit (9) for thin-layer macrometrology is provided in the region of the transport mechanism (7) after the cassette element (3). By means of the measurement unit (9) for thin-layer macrometrology, measurement locations (22) on the semiconductor substrate that require more detailed examination in the measurement unit (5) for thin-layer micrometrology can rapidly be identified.
    Type: Grant
    Filed: February 13, 2004
    Date of Patent: March 25, 2008
    Assignee: Vistec Semiconductor Systems Jena GmbH
    Inventor: Matthias Slodowski
  • Patent number: RE40676
    Abstract: A scanning unit for an optical position measuring device, which is suited for optically scanning a scale graduation, to produce positionally dependent scanning signals on the basis of scale graduation. The scanning unit includes a carrier element, at least one optoelectronic component, which is arranged on the carrier element, a radiation-sensitive or a radiation-emitting surface region of the component being oriented to face away from the carrier element. Provision is also made for at least one electrically conductive connector lead between the carrier element and a contacting region of the component. An at least semi-transparent cover element is arranged directly on the radiation-sensitive and/or radiation-emitting surface region of the component.
    Type: Grant
    Filed: February 11, 2005
    Date of Patent: March 24, 2009
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Wolfgang Holzapfel, Elmar Mayer, Siegfried Reichhuber