Length Patents (Class 356/634)
  • Publication number: 20080040070
    Abstract: At least one self-powered light source is mounted on the tail rod of a BOP to provide an indication of the position of the ram of the BOP. The light source moves back and forth with the ram actuating piston of the BOP. Opposite the light source is a light-receiving lens. The lens is coupled by optical fiber to a optical to electrical converter. As the BOP is actuated, the tail rod moves, thereby moving the light source to a position adjacent a different lens. The lens which is now positioned adjacent the light source sends a light signal to its respective converter, thereby indicating the position of the tail rod and thus to ram of the BOP.
    Type: Application
    Filed: August 11, 2006
    Publication date: February 14, 2008
    Applicant: VARCO I/P, INC.
    Inventor: Perry Lee McClanahan
  • Publication number: 20070291283
    Abstract: A linear measurement apparatus includes a measuring unit including at least one first noncontact distance measuring sensor and one second noncontact distance measuring sensor supported at a frame and aligned on opposite sides of a measured object. The measuring unit measures a plurality of first gap distances to a plurality of first object positions in a plurality of parallel first measurement lines and a plurality of second gap distances to a plurality of second object positions in a plurality of parallel second measurement lines. A distance calculator calculates a plurality of candidate object lengths on the basis of the first and second gap distances, each candidate object length being a distance between one of the first object positions and one of the second object positions. A maximum selector selects a maximum object length from among the plurality of candidate object lengths.
    Type: Application
    Filed: May 18, 2007
    Publication date: December 20, 2007
    Inventor: Yoshio Sakai
  • Patent number: 7297930
    Abstract: A device for measuring the width L of a mail item on the fly in a mail handling machine in which mail items are caused to move parallel to a reference wall, the device comprising: a detector device rendered active when the presence of a mail item passing over a plurality of levers is detected, said levers being disposed at a determined set pitch perpendicularly to said reference wall; an emitter device for emitting a light ray, which emitter device is disposed facing a first lever of said plurality; a receiver device for receiving said light ray; a measurement device for measuring the light intensity of the light ray received at said receiver device; and a processor device for computing a determined number y of levers activated by said mail item going past, on the basis of a comparison between said measurement of the received light intensity and an initial measurement of the light intensity of the light ray received at said receiver device when no mail items pass over said plurality of levers, the width L of
    Type: Grant
    Filed: May 19, 2006
    Date of Patent: November 20, 2007
    Assignee: Neopost Technologies
    Inventor: Sébastien Defosse
  • Patent number: 7284604
    Abstract: A method of optically determining a change in magnitude of at least one dimensional characteristic of a sample in response to a selected chamber environment. A magnitude of at least one dimension of the at least one sample may be optically determined subsequent to altering the at least one environmental condition within the chamber. A maximum change in dimension of the at least one sample may be predicted. A dimensional measurement apparatus for indicating a change in at least one dimension of at least one sample. The dimensional measurement apparatus may include a housing with a chamber configured for accommodating pressure changes and an optical perception device for measuring a dimension of at least one sample disposed in the chamber. Methods of simulating injection of a gas into a subterranean formation, injecting gas into a subterranean formation, and producing methane from a coal bed are also disclosed.
    Type: Grant
    Filed: April 18, 2007
    Date of Patent: October 23, 2007
    Assignee: Battelle Energy Alliance, LLC
    Inventors: Eric P Robertson, Richard L. Christiansen
  • Patent number: 7285781
    Abstract: A CD-SEM (critical dimension-scanning electron microscope) system may utilize a technique for characterizing and reducing shrinkage carryover due to CD-SEM measurements. The system may identify the affects of CD-SEM measurements on the resist and adjust the operating parameters for a particular resist to avoid or significantly reduce shrinkage carryover. In this manner, the system may obtain more reliable CD measurements and avoid damage to the measured feature.
    Type: Grant
    Filed: July 7, 2004
    Date of Patent: October 23, 2007
    Assignee: Intel Corporation
    Inventors: Gary X. Cao, George Chen, Brandon L. Ward, Nancy J. Wheeler, Alan Wong
  • Patent number: 7164481
    Abstract: A coefficient of linear expansion measuring apparatus includes: two reflection plates between which a sample is put, a container to house them, which is filled with a gas having known rate of a refractive index variation, a temperature regulating member to set a temperature in the container variably, a light source to irradiate an irradiating light to reflecting surfaces of the reflection plates, a light receiving element to receive reflected lights in which the lights interferes each other and detecting a light intensity thereof, and a calculating member to calculate a coefficient of linear expansion of the sample, wherein: the calculating member calculates an optical path length variation between the reflecting surfaces from an output variation of the light receiving element, and calculates a length variation of the sample by correcting a part of the optical path length variation derived from the refractive index variation of the gas caused by the temperature variation.
    Type: Grant
    Filed: August 27, 2004
    Date of Patent: January 16, 2007
    Assignee: Kabushiki Kaisha Ohara
    Inventors: Nobuo Kawasaki, Toshihide Nakajima, Masahiko Daimon, Osamu Okajima
  • Patent number: 7161688
    Abstract: A package information capture system that provides dimensioning information about, and machine readable codes from, packages passing across a data capture point either singulated or non-singulated. The resulting data can be used to determine, for example, package dimensions, package coordinates, dimension confidence, package classification, and content and coordinates of the machine readable code. The dimensioning information is correlated with the machine readable code to form one record. Subsequent processes can access the record from all or part of the captured machine readable information to retrieve package dimension information.
    Type: Grant
    Filed: August 29, 2000
    Date of Patent: January 9, 2007
    Inventors: Brett Bonner, Ole-Petter Skaaksrud, Cameron Dryden, Andy Jankevics, Steve Tubbs, Mark Chirstiansen
  • Patent number: 7110911
    Abstract: A code applying device is provided which can efficiently manufacture an information recording paper roll having a code relating to the information recording paper. The code applying device includes a tubular body holding section which holds a tubular body and can rotate around an axis; a code forming section forming a code, which expresses specific information, on an end surface of the tubular body held by the tubular body holding section; and a control section rotating the tubular holding section which is holding the tubular body, and applying the code to the end surface of the tubular body along a peripheral direction.
    Type: Grant
    Filed: December 30, 2004
    Date of Patent: September 19, 2006
    Assignee: Fuji Photo Film Co., Ltd.
    Inventors: Taijiro Fujita, Masayuki Nakagiri, Takehiko Nakayama
  • Patent number: 7038767
    Abstract: A light beam is emitted to a test pattern place formed in the scribe area on the wafer for height measurement, an electron beam is emitted to the test pattern place for width and contrast measurement and their correlations are stored. The three-dimensional profile of a pattern in a semiconductor device on the wafer is determined by irradiating the pattern with an electron beam to measure the width and contrast and estimating the height of the pattern by inferring from a correlation corresponding to the measured width and contrast. Thus, a three-dimensional profile measuring system and method capable of measuring the three-dimensional profile of a micropattern in a semiconductor device without cutting the wafer are provided.
    Type: Grant
    Filed: November 7, 2002
    Date of Patent: May 2, 2006
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yuya Toyoshima, Yasuhiro Mitsui, Yasutsugu Usami, Isao Kawata, Tadashi Otaka
  • Patent number: 7032740
    Abstract: The invention relates to a device and a method for automatically sensing the wear state of movable wheels or rollers (1) in conveying systems, for example baggage conveying systems. It achieves the object of easily and reliably sensing the wear state in an automatic fashion using measuring equipment when the roller to be checked runs through the system, by means of a measuring station (2,3) which is arranged in a stationary fashion in the conveying path of the system and in which diameter deviations of the wheel or of the roller (1) from a predefined set point diameter can be sensed in a contactless fashion and signaled.
    Type: Grant
    Filed: April 15, 2004
    Date of Patent: April 25, 2006
    Assignee: Siemens Aktiengesellschaft
    Inventors: Frank Hochhaus, Jaro Kubik, Frank König
  • Patent number: 7035761
    Abstract: A method for analyzing waviness of a surface. The method includes measuring a height of the surface, producing a set of data points indicative of a waviness profile, selecting a subset of the set of data points, calculating a waviness height of the subset, repeating the selecting, determining, and calculating steps for additional subsets until all members of the set of data points have been selected, and selecting a maximum waviness height value from the waviness heights calculated for each subset. The height of the surface may be measured over a distance longer than the length over which waviness assessment is required.
    Type: Grant
    Filed: August 25, 2004
    Date of Patent: April 25, 2006
    Assignee: Ford Motor Company
    Inventors: Gregory Link, Raghunandan Sridhara, Youssef Hamidieh, Mark Malburg
  • Patent number: 7012703
    Abstract: The invention is a system and method for automatically determining a resolution of an encoder, automatically calibrating the encoder resolution, and automatically determining a length of a workpiece from the encoder resolution and encoder count. The system comprises an encoder for generating an encoder signal indicative of linear movement of a moving workpiece traveling along a path. The system also comprises a first sensor positioned along the path traveled by the workpiece, the first sensor generating a first sensor signal in response to sensing an identifying characteristic of the workpiece. The system further comprises a second sensor positioned along the path traveled by the workpiece, the second sensor generating a second sensor signal in response to sensing the identifying characteristic of the workpiece, said second sensor being positioned a known distance from the first sensor along the path traveled by the workpiece.
    Type: Grant
    Filed: August 21, 2003
    Date of Patent: March 14, 2006
    Assignee: AMS Controls
    Inventors: Andrew J. Allman, James E. Burton, Richard D. Allman
  • Patent number: 6986280
    Abstract: A surface analyzing system including in one system both an integrating optical instrument, such as a scatterometer, and individual-feature-measuring instrument, such as a scanning probe microscope or a beam imaging system, for example, a scanning electron microscope. In a preferred embodiment, the two instruments are capable of characterizing a wafer held on a common stage. The stage may be movable a predetermined displacement to allow the same area of the wafer to be characterized by a scatterometer at one position of the stage and to be characterized by the scanning probe microscope or beam imaging system. The scatterometer can rapidly measure wafers to indicate whether a problem exists, and the scanning probe microscope can perform detailed measurements on wafers flagged by the scatterometer.
    Type: Grant
    Filed: December 11, 2002
    Date of Patent: January 17, 2006
    Assignee: Fei Company
    Inventor: Sylvain G. Muckenhirm
  • Patent number: 6965438
    Abstract: Vehicle measuring apparatus and method are disclosed to accurately measure height and width of a vehicle moving at a high speed. The vehicle measuring apparatus includes: a plurality of laser sensors separated from the road surface with a predetermined height and installed closely to each other corresponding to width of every roadway on the road, and receiving a reflection light of a laser light emitted onto the road from the plurality of the laser sensors and outputting a vehicle measurement signal; and a processor means electrically connected to the laser sensors and calculating height and width of the vehicle on the basis of the signal to measure the vehicle and previously stored installation information of the plurality of laser sensors.
    Type: Grant
    Filed: December 11, 2002
    Date of Patent: November 15, 2005
    Assignee: LG Industrial Systems Co., Ltd.
    Inventors: Sang-Jean Lee, In-June Song, Dae-Woon Lim, Joon-Suk Jun
  • Patent number: 6958465
    Abstract: A method for monitoring two or more movable objects in a monitoring region. A substantially horizontal light barrier grid having a plurality of parallel light barriers monitors the region. To permit a plurality of objects to simultaneously move in the monitored region without deactivating the monitoring function of the system, the system controls an entry area for the objects, the size of the objects as well as the distance between the objects to ascertain that predetermined criteria therefor are met. If one or more of these criteria is not met, a control signal is generated which can be used, for example, to deactivate the machinery and/or prevent access to the monitored region.
    Type: Grant
    Filed: April 10, 2003
    Date of Patent: October 25, 2005
    Assignee: Sick AG
    Inventors: Manfred Haberer, Thomas Staehler
  • Patent number: 6882740
    Abstract: A system and method for automatically determining a seed vigor index for a lot of seeds by analysis of a scanned image of a plurality of seedlings grown from lot of seeds, including automatically separating and analyzing overlapped seedlings. According to one aspect of the current invention, seedling analysis software is used to analyze an image of seedlings. The seedling analysis software preferably analyzes both hypocotyl and radicle lengths and thus determines the separation point between the two for each seedling. The seedling analysis software also preferably separates overlapped seedlings, preferably using a simulated annealing technique. According to another aspect of the present invention, a low-cost scanner placed in an inverted configuration in a scanner enclosure is used to generate high-quality, reproducible images of seedlings. According to yet another aspect of the present invention, a method of using ordinary germination boxes, i.e.
    Type: Grant
    Filed: June 9, 2000
    Date of Patent: April 19, 2005
    Assignee: The Ohio State University Research Foundation
    Inventors: Miller Baird McDonald, Jr., Kikuo Fujimura, Mark Alan Bennett, Yusaku Sako, Andrew Frederick Evans
  • Patent number: 6873423
    Abstract: A length measure apparatus and the method for measuring transform an image from a lens set into a digital contrast image via a central processing unit. The CPU has multiple standard lines that are previously set therein. Multiple movement controllers control a movement of a selected standard line from the CPU relative to the digital contrast image. A movement value is output when the selected standard line flushes with a profile of the contrast image. The measure value is shown on a monitor when the CPU contrasts the movement of the selected standard line.
    Type: Grant
    Filed: July 21, 2003
    Date of Patent: March 29, 2005
    Assignee: Lih Rurng Instrument Trading Co., Ltd.
    Inventor: Yi-Shih Huang
  • Patent number: 6858858
    Abstract: A hand-held or tool integrated measurement device is provided for quickly and accurately performing non-contact measurements of dimensions and/or angles associated with various objects in a home or commercial work area. The measurement device generally includes at least one user input element, a non-contact sensor, an image processor and a display element packaged in a portable housing assembly. In operation, a user initiates the measurement by activating the user input element associated with the measurement device. The non-contact sensor receives a trigger signal from the user input element and is operative to collect image data representative of at least a portion of the surface of a measured object. The image processor in turn receives the image data from the non-contact sensor and is operative to convert the image data into measurement data for the measured object. The display element is operable to visually display the measurement data to the user.
    Type: Grant
    Filed: May 27, 2003
    Date of Patent: February 22, 2005
    Assignee: Perceptron, Inc.
    Inventor: Alfred A. Pease
  • Patent number: 6767127
    Abstract: The invention comprises: a rest base (1) for a sample (2) to be examined, at least a first and a second optical systems (3, 4), identifying two optical paths located at a predetermined distance one from another. The at least a first and a second optical systems (3, 4) are commandable and are able to focus, with a predetermined enlargement, on two ends of the sample (2). The at least a first and a second optical systems (3, 4) are arranged and maintained on parallel planes which are also parallel to the rest base (1). The invention also comprises at least a monitoring and measuring device able to gather images sent by the at least a first and a second optical systems (3, 4). The apparatus is structured to carry out measurements of dimensions of a sample (2) while completely eliminating any influence on the measurements by the measuring system and the rest base for the sample.
    Type: Grant
    Filed: November 14, 2002
    Date of Patent: July 27, 2004
    Assignee: Expert System Solutions S.R.L.
    Inventor: Mariano Paganelli
  • Publication number: 20040141188
    Abstract: A system for precision testing of fiber length and the like using electrostatic collection and control of fibers. The system comprises two spaced-apart and longitudinal extending electrode plates wherein one electrode plate has a positive charge and the other electrode plate is grounded or has a negative charge. An endless rotating belt extends between and parallel to the electrode plates, and the rotating belt is positioned next adjacent and in contact with or in close proximity to one of the two spaced-apart electrode plates such that the distance between the belt and the other electrode plate is greater than the length of fibers to be tested. A fiber introduction system is provided to introduce a plurality of individual fibers above the two electrode plates such that the fibers will adhere to the belt and the other ends of the fibers are attracted to the other electrode plate and thereby straightened.
    Type: Application
    Filed: January 21, 2003
    Publication date: July 22, 2004
    Applicant: North Carolina State University
    Inventors: Jon P. Rust, Stephen P. Stroupe, Thesley A. Byrd, Joseph A. Brenzovich
  • Patent number: 6765191
    Abstract: The disclosed roller switch has a roller, a flag arm, and a photoelectric detector. The roller is connected to the flag arm and vertical movement of the roller causes the flag arm to move. The movement of the flag arm causes the photoelectric detector to send a signal. The signal may be used to measure the length of a material passing under the roller. The inventive roller switch has a pair of flag arms, and the roller is mounted on a shaft extending between the pair of flag arms. By providing a pair of flag arms connected by the roller, the roller switch is more robust and durable. The roller switch is also capable of pivoting across a conveyor belt.
    Type: Grant
    Filed: August 20, 2001
    Date of Patent: July 20, 2004
    Assignee: The Goodyear Tire & Rubber Company
    Inventors: Brian Darrell Hollis, Robert Albert Lammlein, Jr., Thomas Alan Murray, Raymond Patrick Eckman, William George Burton
  • Patent number: 6765671
    Abstract: A method for automating measurement of an optical property of a sample includes selecting a measurement aperture around a reference point on the sample (38), generating a set of grid nodes that fall within the measurement aperture (68), calculating the radial distance of each node with respect to a reference point within the measurement aperture, and calculating the angular position of each node with respect to the vertical. The method also includes moving a light source (32) and a light detector along the vertical and rotating the sample to measurement positions in which the light source and the light detector are aligned with one of the nodes in the measurement aperture, and measuring the optical property at the measurement position by energizing the light source and interrogating the detector. The calculated radial distances and angular positions are used to control positioning of the light source and the light detector and rotation of the sample.
    Type: Grant
    Filed: November 18, 2002
    Date of Patent: July 20, 2004
    Assignee: Corning Incorporated
    Inventor: Richard S. Priestley
  • Patent number: 6760117
    Abstract: Measurement apparatus for measuring at least one of a length, surface area or volume of an object (or portion thereof) or area (22) (or portion thereof). The apparatus includes means for creating a three-dimensional map of an object or area to be measured and a touch-sensitive screen (16) for displaying the mapped image of the object or area. The user can select the area (22) of interest by drawing around it on the screen to create an outline of its shape and the apparatus then creates a virtual shape (20) which matches the outline and maps it onto the image. The user can alter the size, angle, pitch, etc. of the virtual shape (20) until it matches the area (22) exactly and the apparatus then determines the length, surface area and/or volume of the area (22), as required.
    Type: Grant
    Filed: January 30, 2002
    Date of Patent: July 6, 2004
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventor: David Neil Slatter
  • Patent number: 6679426
    Abstract: In a machine for counting bars, for example metal bars, that are to be sent on to a packaging station which packages a pre-set number of them in bundles, the problem of precise counting of the bars is solved by using, for the conveyance of the bars to the counting station, a screw conveyor, in which each groove of the screw has a wall having a pitch increasing more rapidly as compared to the normal pitch of the screw, thus making it possible, in the case where more than one bar is present in the same groove, to render the lying plane of the bars not parallel to the specific axis of the counting means. This is obtained by providing one of the faces of the grooves either with a special step having a continuously increasing width, or with a continuously increasing inclination.
    Type: Grant
    Filed: November 8, 2000
    Date of Patent: January 20, 2004
    Assignee: Danieli & C. Officine Meccaniche SpA
    Inventors: Rolando Paolone, Romano Cernotta
  • Patent number: 6672778
    Abstract: At least two (groups of) sensors forming an insertion detection sensor are offset from each other in the conveyance direction of a photosensitive material. An insertion speed, which is different for each manual insertion event, is obtained based on the time difference when sensors that have been offset from each other detect the leading end of the photosensitive material. The length of the photosensitive material in the conveyance direction thereof is accurately computed based on the insertion speed and other information. By correcting the errors due to the changeable insertion state of the photosensitive material caused by manual insertion by the operator, the process area of the photosensitive material, required for calculating the amount of replenisher to be replenished, is accurately obtained. Therefore, the amount of the replenisher is appropriately determined and the process capacity of the developer or the fixing solution can constantly be maintained at the satisfactory level.
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: January 6, 2004
    Assignee: Fuji Photo Film Co., Ltd.
    Inventors: Tsukasa Sato, Yoko Usui
  • Patent number: 6661525
    Abstract: On a circuit-board intended for constant-wire-length (CWL) bonding, one or more special “test” pairs of bonding pads are provided along with, in each case, a series of markings adjacent the pads. In use, the board is populated with CWL bonds (this includes the normal circuit-related RF bond-pads as well as the test bond-pads) and the test bonds are distorted so that the bond-wires in question lie aligned against the markings. The alignment position relative to the markings indicates whether the bond-wires for the whole board are of correct or incorrect length. Measurement may be either absolute, in which case the markings are associated with a scale indication, or relative, in which case one of the markings will usually be visibly distinguished from the rest in some way. Depending on the length determination, the bond-forming device (e.g.
    Type: Grant
    Filed: September 11, 2001
    Date of Patent: December 9, 2003
    Assignee: Marconi Communications GmbH
    Inventors: Klaus Junger, Willibald Konrath, Stefan Kern
  • Patent number: 6593587
    Abstract: A hand-held or tool integrated measurement device is provided for quickly and accurately performing non-contact measurements of dimensions and/or angles associated with various objects in a home or commercial work area. The measurement device generally includes at least one user input element, a non-contact sensor, an image processor and a display element packaged in a portable housing assembly. In operation, a user initiates the measurement by activating the user input element associated with the measurement device. The non-contact sensor receives a trigger signal from the user input element and is operative to collect image data representative of at least a portion of the surface of a measured object. The image processor in turn receives the image data from the non-contact sensor and is operative to convert the image data into measurement data for the measured object. The display element is operable to visually display the measurement data to the user.
    Type: Grant
    Filed: March 9, 2001
    Date of Patent: July 15, 2003
    Assignee: Perceptron, Inc.
    Inventor: Alfred A. Pease
  • Patent number: 6590656
    Abstract: Before the diffraction from a diffracting structure on a semiconductor wafer is measured, where necessary, the film thickness and index of refraction of the films underneath the structure are first measured using spectroscopic reflectometry or spectroscopic ellipsometry. A rigorous model is then used to calculate intensity or ellipsometric signatures of the diffracting structure. The diffracting structure is then measured using a spectroscopic scatterometer using polarized and broadband radiation to obtain an intensity or ellipsometric signature of the diffracting structure. Such signature is then matched with the signatures in the database to determine the grating shape parameters of the structure.
    Type: Grant
    Filed: September 21, 2001
    Date of Patent: July 8, 2003
    Assignee: KLA-Tencor Corporation
    Inventors: Yiping Xu, Ibrahim Abdulhalim
  • Publication number: 20030123068
    Abstract: A device for controlling at least one cut in an inner wrapping (“inner liner”) for a group of cigarettes in a cigarette packaging machine comprises at least one optical detector consisting of a light source and a sensor.
    Type: Application
    Filed: December 26, 2002
    Publication date: July 3, 2003
    Applicant: Brown & Williamson Tobacco Corporation (a Delaware Corporation)
    Inventor: Gunter Ackermann
  • Patent number: 6476922
    Abstract: The apparatus comprises: a holder for a test piece; at least two optical systems, identifying two optical paths located at a predetermined and known reciprocal distance, which are able to focalize, with a predetermined degree of magnification, images of two ends of the test piece; the at least two optical systems being aligned with the holder; at least one viewing and measuring device able to collect the images which are focalized by the at least two optical systems. The apparatus is structured to perform measurement of a size of a test piece while completely eliminating any influence on such measurement on the part of the holder or the measuring system.
    Type: Grant
    Filed: June 22, 2001
    Date of Patent: November 5, 2002
    Assignee: Expert System Solution S.r.L.
    Inventor: Mariano Paganelli
  • Patent number: 6459760
    Abstract: An automated real-time, non-destructive inspection system usable to inspect a selected structure for a defect and visually identify a defect's location. In one embodiment, the inspection system is an x-ray inspection system mounted to an articulatable robot arm movable relative to the selected structure. A support system is attached to the articulatable robot arm that supports an imaging source on a first support portion and a detector panel on a second support portion spaced apart from the first support portion. A visual targeting system configured to identify where an imaging beam axis intersects the selected structure is positioned adjacent to the imaging source. The inspection system is configured to maneuver the imaging source and detector panel around the selected structure such that the desired areas on the selected structure may be fully inspected without having to reposition the selected structure.
    Type: Grant
    Filed: December 7, 2000
    Date of Patent: October 1, 2002
    Assignee: Exotic Metals Forming Company, Inc.
    Inventor: Karl V. D'Ambrosio
  • Publication number: 20020113978
    Abstract: On a circuit-board intended for constant-wire-length (CWL) bonding, one or more special “test” pairs of bonding pads are provided along with, in each case, a series of markings adjacent the pads. In use, the board is populated with CWL bonds (this includes the normal circuit-related RF bond-pads as well as the test bond-pads) and the test bonds are distorted so that the bond-wires in question lie aligned against the markings. The alignment position relative to the markings indicates whether the bond-wires for the whole board are of correct or incorrect length. Measurement may be either absolute, in which case the markings are associated with a scale indication, or relative, in which case one of the markings will usually be visibly distinguished from the rest in some way. Depending on the length determination, the bond-forming device (e.g.
    Type: Application
    Filed: September 11, 2001
    Publication date: August 22, 2002
    Inventors: Klaus Junger, Willibald Konrath, Stefan Kern
  • Patent number: 6429944
    Abstract: A process for the determination of the thickness transverse profile and the thickness longitudinal profile of a running material strip.
    Type: Grant
    Filed: October 16, 2000
    Date of Patent: August 6, 2002
    Assignee: IMS Messsysteme GmbH
    Inventor: Paul Flormann
  • Patent number: 6417929
    Abstract: A method for optically measuring lithographic process bias of a minimum feature formed by a lithographic process. The method comprises creating on a substrate an array of elements from which a darkfield optical image is generated and detected, electronic information corresponding to the image is generated and processed, and the difference between the created length versus the nominal length of the elements is calculated to determine lithographic process bias. The darkfield optical image may be a double-lobe optical image, and signal processing may comprise creating a normalized intensity profile to overcome film-thickness dependencies, to which one or more noise-rejecting, edge-detection methods is or are applied to calculate the created length of the elements. A method for using double-lobe darkfield imaging for general edge detection is also disclosed.
    Type: Grant
    Filed: November 20, 2000
    Date of Patent: July 9, 2002
    Assignee: International Business Machines Corporation
    Inventors: Christopher P. Ausschnitt, Christopher J. Progler
  • Patent number: 6407819
    Abstract: A method and apparatus for measuring the length of fibers is provided. The method includes the steps of separating the fibers in order to obtain a fiber in single form. The method further involves passing the fiber by an optical measurement system that optically images the fiber. Another step includes calculating the length of the fiber by measuring an increment of the fiber in the x coordinate plane, the y coordinate plane, and the z coordinate plane. Also, the method involves repeating this step to obtain additional increment measurements. These measurements are placed into an equation to compute the length of the fiber. The apparatus for measuring the length of separated fibers from a fiber band includes an apparatus for separating the fiber from the fiber band. Further, a duct is provided for transporting the fiber. At least one camera is proximate to the duct for obtaining an image of the fiber, and a computer is connected to the camera.
    Type: Grant
    Filed: November 13, 2000
    Date of Patent: June 18, 2002
    Assignee: Maschinenfabrik Rieter AG
    Inventor: Christoph Kuratle
  • Patent number: 6404506
    Abstract: In current practice, quantitative traffic data is most commonly acquired from inductive loops. In addition, video-image processing or time-of-flight laser systems can be used. These methods all have problems associated with them. Therefore, we have developed a new type of non-intrusive laser-based detection system for measurement of vehicle travel time. The system employs a fan angle laser, an image lens, a set of cylindrical optics, a linear photodetector array, and associated signal processing hardware and software. The system is positioned above the plane of detection and configured such that it can unambiguously find the object boundaries in all lighting conditions independent of the time-of-flight of the laser. Instead of depending upon the reflectance of the object being detected, or determination of the range or distance from the detector to the object being detected, the invention reflects the laser off of the pavement or other roadway surface.
    Type: Grant
    Filed: March 8, 1999
    Date of Patent: June 11, 2002
    Assignee: The Regents of the University of California
    Inventors: Harry H. Cheng, Benjamin D. Shaw, Joe Palen, Jonathan E. Larson, Xudong Hu, Kirk Van Katwyk
  • Patent number: 6346988
    Abstract: An optical measuring system capable of high resolution measurement of objects, and a method of measuring the same, are provided. The optical measuring system is formed in one integral, portable unit, and includes a laser source having associated optics for emitting a wide collimated light beam. A CCD receiver and a processor housed together and spaced apart from the laser source receive the wide collimated light beam. The CCD receiver has a plurality of diode cells, or “pixels,” formed in a linear array, and the diode cells exhibit output signals corresponding to the received light beam. The processor processes the output signals and determines a measurement associated with the output signals.
    Type: Grant
    Filed: August 1, 1997
    Date of Patent: February 12, 2002
    Assignee: Hama Sensors, Inc.
    Inventors: Hans Bartunek, Mark Cerny