Abstract: A biological particle analyzer is disclosed and includes a microchannel including an end coupled to a first drive electrode, another end coupled to a second drive electrode, a first detection area at an upstream location and an excitation area at a downstream location for containing particles flowing from the upstream location to the downstream location inside the microchannel, a first detection circuit coupled to the first detection area for outputting a first detection result when at least one particle has arrived at the first detection area, a light emission source, and a control module coupled to the first detection circuit and the light emission source for determining when to turn on or off the light emission source according to the first detection result.

Abstract: A system for reconstructing optical properties of a diffusing medium including at least one pulsed radiation source capable of illuminating the diffusing medium, at least one first detector of a first type, capable of receiving a signal emitted by the medium, the first detector being a time-resolved detector, and an information processing unit for processing at least one source—first detector pair, a time distribution of the signal received by the corresponding first detector. The reconstruction system also includes at least one second detector of a second type, each second detector being made up of a set of pixel(s) from an image sensor capable of acquiring an image of the medium, and the second detector being capable of measuring an intensity of the signal emitted by the medium, the intensity corresponding to an equivalent moment of order 0 for the corresponding source—second detector pair.

Abstract: A method of combining 2D images into a 3D image includes providing a coordinate measurement device and a six-DOF probe having an integral camera associated therewith, the six-DOF probe being separate from the coordinate measurement device. In a first instance, the coordinate measurement device determines the position and orientation of the six-DOF probe and the integral camera captures a first 2D image. In a second instance, the six-DOF probe is moved, the coordinate measurement device determines the position and orientation of the six-DOF probe, and the integral camera captures a second 2D image. A cardinal point common to the first and second image is found and is used, together with the first and second images and the positions and orientations of the six-DOF probe in the first and second instances, to create the 3D image.

Abstract: Techniques for obtaining a frequency standard using the crystal field splitting frequency of nitrogen vacancy center in diamond are disclosed. In certain exemplary embodiments, a microwave field is applied to the diamond and optically exciting the diamond under green light. The photoluminescent response of the diamond is measured by a photodetector. The intensity of the photoluminescent response can be used to determine the phase shift between the microwave and the crystal field splitting frequency. The microwave field frequency can be adjusted until the phase shift is below a predetermined threshold, and the microwave frequency can then be output for use as a standard.

Abstract: The invention relates to a method for determining whether two plastics components (1, 2) to be welded to each other in a joint plane are welded to each other after a welding process has been carried out, characterized in that the position of a reference plane is determined from a reference point before the welding process is carried out, then the welding process is carried out, and the position of the joint plane or the thickness of the components (1, 2) welded to each other is determined from the reference point during or after the welding process.

Abstract: A subject information obtaining apparatus has: a light source; a plurality of receiving elements which receive acoustic waves generated from a subject, and output signals; a memory unit for storing, for each of a plurality of predetermined positions, information to represent signals which are output from the plurality of receiving elements when an acoustic wave source is assumed to exist in the position; and an estimating unit for estimating a distribution of acoustic wave sources. The estimating unit assumes a distribution of acoustic wave sources, obtains signals corresponding to positions of respective acoustic wave sources in the assumed distribution from the stored information, and defines a distribution of acoustic wave sources, of which degree of coincidence between the obtained signals and signals obtained in an actual measurement is highest, as the distribution of acoustic wave sources.

Abstract: A system and method that scans areas of a human body to identify unattractive characteristics and make cosmetic enhancements is modified for medical monitoring and optionally for treatment. A 3-D model of the exterior surface of the human body is created, and the scanned data is analyzed by characteristics of reflectance and surface topology to identify unhealthy characteristics. Because people will use a cosmetics system widely and frequently, base lines of patients' conditions can be created through frequent monitoring over a long time period, so that potentially dangerous changes from the base line can identified quickly and reported on. When appropriate, precise applications of medications to treat affected areas may be made automatically. Controlled and precisely directed dosages of medications may be applied to reduce the risk of undesirable side effects. Medicines may also be applied over a large area of skin and during a long period of time to achieve desired treatments.

Abstract: A method and a device employing the method of flow cytometry, preferably applicable but not limited to the counting and differentiation of leukocytes. It relates more particularly to the field of simplified haematology instruments with moderate operating costs. The method is characterized in that a technique of impedance measurement is used for identifying the particles whose trajectory did not pass through a predetermined optical measurement zone in order to process them selectively, thus avoiding the use of sheath fluids for guiding the particles towards the measurement zone.

Abstract: An embodiment of a sheath flow device may include: a reflecting plane, aspheric reflecting surface, and a conduit for passage of cells disposed in a central hollow. A focal point of the aspheric reflecting surface is positioned in a location where cells settle. A collimated beam generated by an external light source incident on a first reflective side of the reflecting plane, is reflected to reach a first reflective surface of the aspheric reflecting surface, and reflected before being focused on the focal point, after which the light proceeds to reach a second reflective surface of the aspheric reflecting surface to be reflected to reach a second reflective side of the reflecting plane to emerge after being reflected thereby. The first and second reflective sides and the first and second reflective surfaces may be centrosymmetric. The sheath flow device improves the alignment accuracy of beam commissioning during the application process.

Abstract: A method of investigating a wavefront of a charged-particle beam that is directed from a source through an illuminator so as to traverse a sample plane and land upon a detector, an output of the detector being used in combination with a mathematical reconstruction technique so as to calculate at least one of phase information and amplitude information for the wavefront at a pre-defined location along its path to the detector, in which method: Said beam is caused to traverse a particle-optical lens system disposed between said sample plane and said detector; At a selected location in the path from said source to said detector, a modulator is used to locally produce a given modulation of the wavefront; In a series of measurement sessions, different such modulations are employed, and the associated detector outputs are collectively used in said mathematical reconstruction.

Abstract: Disclosed are systems and methods for analyzing a flow of a fluid at two or more discrete locations to determine the concentration of a substance therein. One method of determining a characteristic of a fluid may include containing a fluid within a flow path that provides at least a first monitoring location and a second monitoring location, generating a first output signal corresponding to the characteristic of the fluid at the first monitoring location with a first optical computing device, generating a second output signal corresponding to the characteristic of the fluid at the second monitoring location with a second optical computing device, receiving first and second output signals from the first and second optical computing devices, respectively, with a signal processor, and determining a difference between the first and second output signals with the signal processor.

Abstract: In imaging a sample using an electron microscope, in order to reduce a time for focusing, a scanning range of a Z coordinate is reduced to complete focusing by obtaining SEM images such that: for a first predetermined number of portions, focal positions of an electron beam in obtaining each SEM image are moved in a predetermined range; then, a curved surface shape of the surface of the sample is estimated by using information relating to the focal positions of the electron beam in the first predetermined number of portions; after the images are taken, the range in which the focal positions of the electron beam are moved for scanning the electron beam on the surface of the sample is made to be narrower than the predetermined range by using the curved surface information estimated, thereby performing scanning to take the images of the sample.

Abstract: An image processing device includes: a demosaicking unit which converts a bayer image from a camera sensor into red, green image and blue images; a first color space conversion unit which converts first camera RGB data into first display R?G?B? data using a first color space conversion matrix; and a display unit which displays an image using the first display R?G?B? data, where the first color space conversion matrix is calculated from a relationship in which the product of the first color space conversion matrix and a transpose of a first N×3 matrix is a transpose of a second N×3 matrix, where the first N×3 matrix represents camera RGB data of N number of colors, and the second N×3 matrix represents display R?G?B? data of the N number of colors calculated by measuring the N number of colors displayed in the display unit using a spectrophotometer.

Abstract: Methods and systems for evaluation of wafers are disclosed. One example method includes illuminating a multi-crystalline wafer according to a plurality of lighting parameters, capturing a plurality of images of the multi-crystalline wafer, stacking and projecting the plurality of images to generate a composite image, analyzing the composite image to identify one or more grains of the multi-crystalline wafer, and generating a report based on the analysis of the composite image. The multi-crystalline wafer is illuminated according to a different one of the plurality of lighting parameters in at least two of the plurality of images.

Abstract: The described apparatus for analyzing a biological sample includes a first analysis instrument fluidly connected to a reservoir for receiving a first flow of the biological fluid and adapted for performing a measurement of a property of the biological sample. A second analysis instrument is fluidly connected to the reservoir for receiving a second flow of the biological fluid and adapted for performing a thermally controlled analysis of the biological sample. The second analysis instrument includes a thermally controlled chamber. A flow stopping device stops the second flow within the thermally controlled chamber in order to allow the second analysis instrument to perform the thermally controlled analysis of the biological sample. The first analysis instrument may include, for example, a hematology analyzer or a flow cytometer, and the second analysis instrument may include, for example, a dynamic light scattering instrument.

Abstract: An optical sensor system is disclosed including a source module, a first detection module, and a second detection module. The source module includes a source housing unit having a source window member. The source module may emit a detection signal through the source window member. The first detection module and the second detection module are spaced apart from the source module.

Abstract: A system for controlling an epitaxial growth process in an epitaxial reactor. The system includes a processor for setting up a modeled output parameter value as a linear function of the actual output parameter value and a second set of thermocouple offset parameter values. The processor also determines a distance between a target output parameter value and the modeled output parameter value.

Abstract: A measuring method for determining a measurement position of a probe element 6 can include using a coordinate measuring machine 1 having a base and members that can be moved relative to the base and relative to each other, wherein one of the members, as the probe member TG, comprises a probe element 6, so that the probe element 6 can move freely within a prescribed volume of space, wherein the measurement position is captured by the probe element 6, a measurement variable set is taken by measuring measurement variables linked to a measurement position of the members, wherein the measurement position is determined by a relative location of the members to each other and of at least one of the members to the base, and the measurement position is determined relative to the base.

Abstract: A method for etching a workpiece may be provided, which may include: determining a plurality of reference etch profiles for a plurality of positions of an etchant dispenser, each reference etch profile corresponding to a respective position of the plurality of positions of the etchant dispenser; determining a thickness profile of the workpiece; determining a respective etch duration for each position of the plurality of positions of the etchant dispenser based on the determined thickness profile and the plurality of reference etch profiles, to reduce a total thickness variation of the workpiece; and dispensing an etchant over the workpiece via the etchant dispenser for the determined respective etch duration for each position of the plurality of positions.

Abstract: An object of the present invention is to provide a method for repairing a display device according to which a wide variety of regions can be repaired in various ways using various materials, as well as an apparatus for the same. The present invention provides a repairing apparatus for repairing a pattern defect on a surface of a substrate in a display device where an electronic circuit pattern having the above described pattern defect is formed, characterized by having a plasma irradiation means for repairing the above described pattern defect through local irradiation of a region including the above described pattern defect with plasma.

Abstract: The invention relates to a light source for irradiating molecules present in a detection volume with one or more selected wavelengths of light and directing the fluorescence, absorbance, transmittance, scattering onto one or more detectors. Molecular interactions with the light allow for the identification and quantitation of participating chemical moieties in reactions utilizing physical or chemical tags, most typically fluorescent and chromophore labels. The invention can also use the light source to separately and simultaneously irradiate a plurality of capillaries or other flow confining structures with one or more selected wavelengths of light and separately and simultaneously detect fluorescence produced within the capillaries or other flow confining structures. In various embodiments, the flow confining structures can allow separation or transportation of molecules and include capillary, micro bore and milli bore flow systems.

Abstract: An optical metrology device is capable of detection of any combination of photoluminescence light, specular reflection of broadband light, and scattered light from a line across the width of a sample. The metrology device includes a first light source that produces a first illumination line on the sample. A scanning system may be used to scan an illumination spot across the sample to form the illumination line. A detector spectrally images the photoluminescence light emitted along the illumination line. Additionally, a broadband illumination source may be used to produce a second illumination line on the sample, where the detector spectrally images specular reflection of the broadband illumination along the second illumination line. The detector may also image scattered light from the first illumination line. The illumination lines may be scanned across the sample so that all positions on the sample may be measured.

Abstract: A component analyzing apparatus includes a base unit having a mounting part on which a measuring object is mounted and a mass measurement part that measures a mass of the measuring object, a spectroscopic camera that acquires a spectral image of the measuring object, a support unit provided on the base unit and supporting the spectroscopic camera in a location such that an imaging direction in the spectroscopic camera is a direction toward the mounting part and a distance between the mounting part and the spectroscopic camera is a predetermined distance, and a control part that analyzes components of the measuring object based on the spectral image and the mass measured by the mass measurement part.

Abstract: A self-contained monitor array for measuring at least one type of electromagnetic emission and at least one type of mechanical wave emission from a marine-based and/or terrestrial human activity or installation such as alternate energy sources. A multi-modal monitor system includes at least two such arrays, at least one clock, and at least one data storage unit.

Abstract: An arrangement for providing a variable volume size is described. The arrangement includes an outer bellow having an outer end wall closing the outer bellow at one end. The arrangement further includes an inner bellow having an inner end wall closing the inner bellow at one end, the inner bellow being arranged at least partly inside the outer bellow. The arrangement further includes a base at which another end of the outer bellow and another end of the inner bellow are attached. The arrangement further includes a position measuring apparatus for measuring at least one position indicative of a distance between the outer end wall and the inner end wall.

Abstract: A method and apparatus for determining the synchronicity of a rotary platen (22) in a vacuum deposition chamber (24). A light source (64) projects a highly collimated light beam (66) onto the rotating platen (22), thereby tracing a circular swept path (67). The swept path (67) passes alternately through samples (20) on the platen (22) and intervening webs (58, 60). The samples (20) are significantly more reflective than the webs (58, 60). The platen (22) includes an asymmetry feature (60) along the swept path (67). A detector (62) measures light signals reflected from the platen (22) along the swept path (67), and generates a unique signal upon encountering the asymmetry feature (60). A microcontroller generates a trigger pulse synchronized to the unique signal.

Abstract: An apparatus for inertial sensing is provided. The apparatus comprises at least one atomic inertial sensor, and one or more micro-electrical-mechanical systems (MEMS) inertial sensors operatively coupled to the atomic inertial sensor. The atomic inertial sensor and the MEMS inertial sensors operatively communicate with each other in a closed feedback loop.

Abstract: A first temperature sensor is formed in a first measurement area. A first input part is formed in the first measurement area so that an output surface thereof is exposed to the inner surface of the liquid tank. A first light receiving part receives a reference light through the liquid from the first input part. A second input part causes a second incident light to be incident on a living body. A second light receiving part receives a measurement light from the second input part. Based on the light intensity of the reference light and the measurement light, an absorbance calculation device can detect the absorbance of the liquid and living body tissue. A concentration calculation device compares the absorbance of the liquid with the absorbance of the living body tissue and calculates a concentration of a measured component contained in the living body tissue.

Abstract: In a method of inspecting a surface of a substrate, a first surface image of the substrate before loaded into a process chamber may be obtained. The first surface image may be processed to detect a defect on the surface of the substrate. Thus, the surfaces of all of the substrate may be inspected during a process may be performed without transferring the substrates.

Abstract: Methods are provided to use data obtained from a single wavelength ellipsometer to determine the refractive index of materials as a function of wavelength for thin conductive films. The methods may be used to calculate the refractive index spectrum as a function of wavelength for thin films of metals, and conductive materials such as conductive metal nitrides or conductive metal oxides.

Abstract: A system and method of for performing an action at a device is disclosed. A first signal is sent into a first zone from a first light source, wherein the first signal identifies the first zone. The first signal is received at the device when the device is in the zone. The device determines from the received first signal that the device is in the first zone and performs the action at the device based on the device being in the first zone. A second variable light source may send a second signal into a second zone, wherein the second signal identifies the second zone. Triangulation may be performed to determine a location of the device using the first signal and the second signal. Alternately, a parameter of motion of the device may be determined using the received messages.

Abstract: A method for performing an action at a device is disclosed. A first signal is sent into a first zone from a first light source, wherein the first signal identifies the first zone. The first signal is received at the device when the device is in the zone. The device determines from the received first signal that the device is in the first zone and performs the action at the device based on the device being in the first zone. A second variable light source may send a second signal into a second zone, wherein the second signal identifies the second zone. Triangulation may be performed to determine a location of the device using the first signal and the second signal. Alternately, a parameter of motion of the device may be determined using the received messages.

Abstract: This disclosure relates to a method for the nondestructive testing, using laser ultrasonics, of a composite part having a fibrous reinforcement in a resin that optically scatters the laser, includes: a) taking a measurement of the thickness of the resin of the part on the surface that is illuminated during the laser shot, which is capable of generating a thermoelastic effect in said resin and which is referred to as an ultrasonic laser shot; b) adjusting the power of the laser of said ultrasonic shot on the basis of the thickness measurement carried out in step a) so as to eliminate any risk of a flash on the reinforcements; and c) producing the ultrasonic laser shot at the power determined during step b). The device used for implementing the method comprises a combined photoacoustic imaging and low time-coherence interferometry (OCT) system.

Abstract: A control unit for controlling the temperature of a spectrometer to be constant stores a first temperature coefficient indicating a proportion of a temperature change of the spectrometer to a room temperature change and a second temperature coefficient indicating a proportion of the temperature change of the spectrometer to a change in the air volume of blower means, and calculates the amount of change in the air volume of the blower means necessary to offset a change in the temperature of the spectrometer from a predetermined constant temperature, by using the first temperature coefficient and the second temperature coefficient, and controls driving of the blower means based on the calculated amount of change in the air volume.

Abstract: Methods of studying, interrogating, analyzing, and detecting particles, substances, and the like with near field light are described. Methods of identifying binding partners, modulators, inhibitors, and the like of particles, substances, and the like with near field light are described. In certain embodiments, the methods comprise immobilizing or trapping the particle, substance, and the like.

Abstract: A method and apparatus for dimensioning and, optionally, weighing an object. A platform with a surface is used for supporting an object. A user selects between two different dimensioning devices of the apparatus. The first device employs three distance sensors to determine a distance between each of the distance sensors and a side of an object. The second device includes a movable gate which is passed over and about an object or objects on the platform. Sensor arrays, such as paired, aligned light emitter and receiver arrays, are used in combination with a plurality of sensed gate positions to determine the dimensions of the objects(s) as the gate passes around the object(s) based on whether or not light from an emitter on one side of the gate reaches a light receiver on another, opposing side of the gate.

Abstract: A measurement method of an overlay mark is provided. An overlay mark on a wafer is measured with a plurality of different wavelength regions of an optical measurement tool, so as to obtain a plurality of overlay values corresponding to the wavelength regions. The overlay mark on the wafer is measured with an electrical measurement tool to obtain a reference overlay value. The wavelength region that corresponds to the overlay value closest to the reference overlay value is determined as a correct wavelength region for the overlay mark.

Abstract: A technique for forming a two-dimensional electronic spectrum of a sample includes illuminating a line within a portion of the sample with four laser pulses; where along the entire line the difference in the arrival times between two of the laser pulses varies as a function of the position and the difference in the arrival times between the other two pulses is constant along the entire line. A spectroscopic analysis may then be performed on the resulting pulsed output signal from the illuminated line to produce a single-shot two dimensional electronic spectroscopy.

Abstract: A photometric apparatus includes a photosensor portion that receives light and performs a measuring operation for acquiring predetermined photometric data relating to the received light, a tilt sensor portion that detects a tilt angle with respect to a predetermined reference plane, and a measurement control portion that determines a tilt state of the photosensor portion based upon the tilt angle, and executes a measurement control process for specifying the photometric data acquired by the photosensor portion as effective photometric data, when the tilt state satisfies a predetermined condition.

Abstract: An apparatus comprises a substrate (110), the substrate having: a source (141) for generating electromagnetic radiation for illuminating an object; a detector (120) for detecting a response, such as scattered or fluorescent radiation, by the object to illumination by the electromagnetic radiation; and a least one conduit (150) formed through at least a portion of the substrate for transmission of electromagnetic radiation therethrough in a path from the source to the object or a path from the object to the detector, wherein the source and the detector are not in direct line of sight of one another.

Abstract: An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.

Abstract: A method for providing images using a multimodal nonlinear optical microscope is disclosed. The method includes providing a foundation femtosecond laser beam, generating a first femtosecond laser beam and a second femtosecond laser beam corresponding to the foundation femtosecond laser beam, combining the first femtosecond laser beam and the foundation femtosecond laser beam to generate a first combination femtosecond laser beam, and generating a coherent anti-Stokes Raman scattering (CARS) signal based on the first combination femtosecond laser beam. A multimodal nonlinear optical microscopy platform is also disclosed.

Abstract: A film thickness measurement apparatus includes: an ECT sensor for measuring a film thickness of a thermal barrier coating formed on a turbine blade; a storage unit for storing a measurement point on the turbine blade which is a point where the film thickness of the thermal barrier coating is measured; a laser displacement meter for measuring a shape of the turbine blade; a measurement position calculation unit for calculating an actual measurement point suitable for actual film thickness measurement using the ECT sensor, based on the shape of the turbine blade measured by the laser displacement meter and the measurement point on the turbine blade stored in the storage unit; and an arm drive unit for driving the ECT sensor to adjust a measurement position of the ECT sensor based on the actual measurement point calculated by the measurement position calculation unit.

Abstract: A method of halogen gas monitoring includes contacting room air to be monitored with a halogen sensor including a cobalt or cobalt alloy layer. The halogen sensor exhibits a detectable change in at least one property upon contact with a halogen gas. A measurement from the halogen sensor is obtained after the contacting. The presence of the halogen gas is monitored based on the measurement.

Abstract: Dual mounting head scanners measure the thickness of flexible moving porous webs and employ an air clamp on the operative surface of the lower head to maintain the web in physical contact with a measurement surface. As the web is held firmly by the clamp, the vacuum level that is established is indicative of the porosity of the membrane. As compressed air is supplied to a vacuum generator at a given operational pressure, the rate of airflow through the web can be interred from the vacuum pressure measurements. The rate of airflow through the membrane and therefore the porosity of the membrane are related to the vacuum level. It is not necessary to measure the airflow through the membrane. From the vacuum pressure measurements, the membrane's permeability can also be determined by correlation to empirical data. Thickness measurements are effected by optical triangulation and inductive proximity measurements.

Abstract: A sensor apparatus is provided for sensing relative position of two objects. First and second molecular components, each comprising at least one electronic system, are connected to respective objects. The molecular components are arranged in mutual proximity such that an interaction between the electronic systems of respective components varies with relative position of the objects, the interaction affecting an electrical or optical property of the components. A detector detects the property to produce an output dependent on relative position of the objects.

Abstract: A material-working device with working beams of a beam generator and with in-situ measurement of a working distance between the beam generator and a workpiece, the material-working device including a working laser; a laser scanner for the working laser, the laser scanner including a two-dimensional deflecting device with scanner mirrors and a variable refocusing device at varying working distances; and a sensor device including a spectrometer and at least one sensor light source, wherein measuring beams together scan a working area of the workpiece by the laser scanner and an objective lens while gathering the working distance, and the measuring beams of at least two of the light sources of the sensor device being linearly polarized and being coupled into a working beam path of the laser scanner of the material-working device by an optical coupling element in a collimated state with crossed polarization directions.

Abstract: An analyzer for analyzing a composition of a sample, and methods of operating an analyzer. The analyzer may include an optical illuminator and a Raman spectrometer to produce Raman spectral data representative of Raman radiation emitted from the sample in response to the illuminating light. Features to reduce background fluorescence are optionally provided. An x-ray illuminator may be provided to illuminate the sample with x-rays, and also an x-ray spectrometer may be present to produce x-ray spectral data representative of fluorescence radiation emitted from the sample in response to the illuminating x-rays. A processor receives the Raman spectral data and any x-ray spectral data and provides an analysis of a compound in the sample.

Abstract: A gauge profile apparatus (100) includes a gauge profile system (104) and a lap count system (106) for determining an average three-dimensional profile over the length of a sheet coil (10). The gauge profile system (104) includes a lap profile measuring device (112) which will make a distance determination between top and bottom surfaces for the sheet coil (10). A second embodiment of a lap count system (600) is also provided, which utilizes a pair of reflectance lasers and a positioning system.

Abstract: A method of determining the orientation of a grain structure of a turbine blade or vane using an optical technique, illuminates a surface with a beam from a light source and then manipulates the relative orientation of the surface, a light beam and detector to determine the relative orientation which provides the peak reflectance of the beam from the surface to the detector. Further surfaces of the component are similarly manipulated and illuminated and the orientation of the grain structure calculated from the determined relative peak reflectance orientations of the surface, first further surface and second further surface. Determination of the grain orientation allows the value of high angle boundaries to be determined. Also disclosed is apparatus suitable for performing the method.