Abstract: A method includes performing a first probing on a sample integrated circuit structure to generate a first Raman spectrum. During the first probing, a first laser beam having a first wavelength is projected on the sample integrated circuit structure. The method further includes performing a second probing on the sample integrated circuit structure to generate a second Raman spectrum, wherein a Tip-Enhanced Raman Scattering (TERS) method is used to probe the sample integrated circuit structure. During the second probing, a second laser beam having a second wavelength different from the first wavelength is projected on the sample integrated circuit structure. A stress in a first probed region of the sample integrated circuit structure is then from the first Raman spectrum and the second Raman spectrum.

Abstract: A classification device (2) for identification of articles (3) in an automated checkout counter is presented. The device comprises a memory unit (5) capable of storing digital reference signatures, each of which digital reference signatures corresponds to an article identity, a processor (6) connected to the memory unit (5), and at least one sensor (4, 7, 14, 15, 16, 17, 18, 24) configured to determine a measured signature of an article (3) wherein said processor (6) is configured to compare said measured signature with the digital reference signatures, and to calculate a matching probability of a predetermined number of article identities.

Abstract: The invention refers to a fouling detection setup (I) and method for determining the amount of fouling (5) of surfaces (3) of fluid (6) treating devices (2) and/or internal functional components (4) of such devices, which are exposed to said fluid and are subjected to fouling. Fouling detection setups and methods are useful for monitoring the amount of fouling of surfaces, e.g. heat-transfer surfaces and also for monitoring the cleaning procedure of such fluid treating devices and/or internal functional components of such devices. According to the invention the detection setup (I) comprises at least one first sensor (7), with means (9) for measuring the optical transparency T and/or electrical conductive conductivity Q of said fluid (6). The Sensor includes at least one sensitive area (8) that is located nearby and/or within said surfaces (3) and wherein said area is at least temporarily exposed to said fluid (6).

Abstract: A system for examining intrusions of a physical environment into a reach envelope of a vehicle traveling along a length of track. The system includes a test skid including a chassis with front and rear wheel assemblies each adapted for rollably engaging the track. The test skid may further include a laser measuring scanner supported on an upper surface of the chassis and adapted for scanning a vertical plane orthogonal to a longitudinal axis of the chassis to measure a plurality of distances between the laser measuring scanner and surfaces of the physical environment when the test skid moved along the track. The system also includes a test controller executing an examination program to determine a real world envelope based on the measured distances from the laser measuring scanner and to determine intrusions by comparing a reach envelope for the vehicle with the determined real world envelope.

Abstract: A measurement method of an overlay mark is provided. An overlay mark on a wafer is measured with a plurality of different wavelength regions of an optical measurement tool, so as to obtain a plurality of overlay values corresponding to the wavelength regions. The overlay mark on the wafer is measured with an electrical measurement tool to obtain a reference overlay value. The wavelength region that corresponds to the overlay value closest to the reference overlay value is determined as a correct wavelength region for the overlay mark.

Abstract: A tactile sensor including a piezoresistive layer having its electric resistance varying according to mechanical stress exerted thereon, the piezoresistive layer being at least partially transparent to light; a photosensitive layer, having its electric resistance varying according to the quantity of incident light thereon, the photosensitive layer being arranged opposite the piezoresistive layer; and electric connection elements electrically connecting in parallel the piezoresistive layer and the photosensitive layer.

Abstract: An apparatus includes a coil suspended in a magnetic field and an optical detector to detect displacement of the coil in response to a stimulus. The apparatus further includes a feedback circuit to program a gain of the sensor, wherein the feedback circuit is coupled to the optical detector and to the coil.

Abstract: A sensor includes a coil suspended in a magnetic field, and a light source to produce a light output in response to a current, wherein a duty cycle and/or pulse-repetition frequency of the current is configurable. The sensor further includes an optical detector to use the light output of the light source to detect displacement of the coil in response to a stimulus.

Abstract: Methods and devices for magnified imaging of three-dimensional samples are disclosed. The methods include imaging sample sections of a sample section series using a first particle-optical device. Coordinates of the imaged sample point are acquired and stored in such a way that the coordinates of the imaged sample point can be associated with the respective image of this sample point. The method also includes selecting a volume of interest (VOI), and transmitting the coordinates of the selected VOI to a second particle-optical device. In addition, the method includes imaging the selected VOI by means of the second particle-optical device. A plurality of planes of a sample section are imaged in order to obtain a 3D image of the selected VOI.

Abstract: An apparatus includes a network of switchable coils suspended in a magnetic field, wherein a topology of the network of switchable coils may be configured to change at least one characteristic of a sensor, and an optical detector to detect displacement of the coil in response to a stimulus. The apparatus further includes a feedback circuit coupled to the optical detector and to the network of switchable coils.

Abstract: A method for measuring the centricity of a conductor in an insulating casing, in which the string formed by the conductor with its insulating casing is moved along a conveying direction. A device for measuring the centricity of a conductor in an insulating casing includes an inductive measuring apparatus, first and second optical measuring apparatus and an evaluation apparatus.

Abstract: A local purging tool for purging a portion of a surface of a wafer with purging gas is disclosed. The purging tool includes a purging chamber configured to contain purging gas within a cavity of the purging chamber, a permeable portion of a surface of the purging chamber configured to diffuse purging gas from the cavity of the chamber to a portion of a surface of a wafer, and an aperture configured to transmit illumination received from an illumination source to a measurement location of the portion of the surface of the wafer and further configured to transmit illumination reflected from the measurement location to a detector.

Abstract: The present disclosure relates to a method of monitoring wafer topography. A position and orientation of a plurality first alignment shapes disposed on a surface of a wafer are measured. Wafer topography as a function of wafer position is modeled by subjecting the wafer to an alignment which simultaneously minimizes misalignment between the wafer and a patterning apparatus and maximizes a focus of radiation on the surface. A non-correctable error is determined as a difference between the modeled wafer topography and a measured wafer topography. A maximum non-correctable error per field is determined for a wafer, and a mean variation in the maximum non-correctable error across each field within each wafer of a lot is determined, both within a layer and across layers. These values are then verified against a set of statistical process control rules to determine if they are within a specification limit of the manufacturing process.

Abstract: A charged-particle microscope with Raman spectroscopy capability and a method for examining a sample using a combined charged-particle microscope and Raman spectroscope. The method includes imaging a region of a sample by irradiating the sample with a beam of charged particles from the microscope; identifying a feature of interest in the region using the microscope; radiatively stimulating and spectroscopically analyzing a portion of the region comprising the feature of interest using a light spot of a width D from the spectroscope, wherein the feature of interest has at least one lateral dimension smaller than width D and, prior to using the light spot of the width D from the spectroscope, an in situ surface modification technique is used to cause positive discrimination of an expected Raman signal from the feature of interest relative to an expected Raman signal from the part of the portion other than the feature of interest.

Abstract: According to one embodiment, a mask distortion measuring apparatus is provided, including a light source, a mask holding unit, a projection optical system, an imaging unit, and a distortion calculating unit. The mask holding unit holds masks overlaid with each other. The projection optical system forms a projection image of patterns provided on the masks by irradiating light from the light source to the masks. The imaging unit images the projection image. The distortion calculating unit calculates misalignment of another mask with respect to a mask to be a reference in the masks using the projection image imaged at the imaging unit.

Abstract: A system for assisting in spectrally characterizing or detecting a sample using radiation at a predetermined wavelength or in a predetermined wavelength range is disclosed. In one aspect, the system includes a substrate having a nanopore for excitation of plasmons. The nanopore provides a window through the substrate, wherein a smallest window opening of the window has an average length (L) and an average width (W) both being substantially smaller than 2 ?m. The nanopore supports highly confined surface plasmon polaritons and at specific wavelengths resonances are observed, when the conditions for a standing wave are fulfilled. This leads to strong field enhancements and enables single molecule spectroscopy.

Abstract: An electromagnetic inspection tool which includes a stage configured to support a wafer having a first surface and an emitter configured to emit electromagnetic waves to be incident on the first surface. The electromagnetic inspection tool further includes a detector configured to detect electromagnetic waves returned from the first surface and a charging mechanism configured to charge the first surface. A method of electromagnetically inspecting a wafer which includes loading a wafer having a first surface onto a stage and emitting electromagnetic waves to be incident on the first surface. The method further includes detecting electromagnetic waves returned from the first surface and charging the first surface prior to detecting the electromagnetic waves returned from the first surface.

Abstract: The invention relates to an inner diameter measuring device, having a non-contact measuring unit (3) and a contact measuring unit (4) arranged along the same center line, wherein the non-contact measuring unit comprises an image pickup unit (6) arranged on the center line, a laser beam emitting unit (7), and a laser beam diffusing unit (9) having a cone mirror, wherein a laser beam projected from the laser beam emitting unit to the cone mirror is reflected over a total circumference by the cone mirror, the image pickup unit takes an optical ring which is formed by projecting the reflected laser beam to an inner surface of a hollow portion, at least one of an inner diameter or a shape of the inner surface is measured based on an image picked up, and wherein the contact measuring unit comprises a contact measuring head (42) and a circulation unit (41) for circulating the contact measuring head around the center line, wherein the contact measuring head has a contact measuring unit having a contact at a forward e

Abstract: A system for monitoring thin-film fabrication processes is herein disclosed. Diffraction of incident light is measured and the results are compared to a predictive model based on at least one idealized or nominal structure. The model and/or the measurement of diffracted incident light may be modified using the output of one or more additional metrology systems.

Abstract: Methods, systems, and devices are described for determining positioning information of a mobile device using modulated light signals. A modulated light signal may be received from each of at least one light source. Each modulated light signal may be decoded to obtain identification information identifying the at least one light source. An angle of arrival of each modulated light signal may also be identified. Each angle of arrival of may be associated with an identified light source.

Abstract: A Raman probe is used to detect crystal structure of a substrate undergoing thermal processing in a thermal processing system. The Raman probe may be coupled to a targeting system of a laser thermal processing system. The Raman probe includes a laser positioned to direct probe radiation through the targeting system to the substrate, a receiver attuned to Raman radiation emitted by the substrate, and a filter that blocks laser radiation reflected by the substrate. The Raman probe may include more than one laser, more than one receiver, and more than one filter. The Raman probe may provide more than one wavelength of incident radiation to probe the substrate at different depths.

Abstract: The present invention describes an analysis device and a method associated with this device, said device comprising an analysis cell (8) containing an optrode (10), receiving an input laser signal and sending an output signal to the Raman spectrometer, and said method using two analysis routes: an analysis route 1 connected to the internal circulation current passing from adsorber B to adsorber A, and an analysis route 2 connected to the distilled raffinate originating from distillation column C.

Abstract: An imaging system comprises a wide field of view (FOV) telescope, a narrow FOV telescope, a spectrometer, an imaging detector, an image slicer, and a selection mechanism. The wide FOV telescope is configured to produce a one-dimensional optical image of a broad field of view (FOV) F. The narrow FOV telescope is configured to produce a two-dimensional optical image of a narrow FOV f. The spectrometer is configured to produce a spectrum of a one-dimensional image, and the imaging detector is configured to capture that spectrum. The image slicer is configured to break the two-dimensional optical image into a series of one-dimensional segments. The selection mechanism operable in either of two modes: a wide FOV mode transmitting the one-dimensional optical image to the spectrometer, and a zoom mode transmitting a one-dimensional concatenation of the series of one-dimensional segments to the spectrometer.

Abstract: Approaches for substantially removing bulk aluminum nitride (AlN) from one or more layers epitaxially grown on the bulk AlN are discussed. The bulk AlN is exposed to an etchant during an etching process. During the etching process, the thickness of the bulk AlN can be measured and used to control etching.

Abstract: By forming nanoparticles from gas-phase precursors within cracks or defects in a gas-barrier film, crack-width may be determined from the diameter of the nanoparticles formed within. The optical absorption and emission wavelengths of a quantum dot are governed by the particle size. For a particular material, the absorption and/or emission wavelengths may therefore be correlated to the particle size (as determined from techniques such as transmission electron microscopy, TEM). Thus, fluorescence measurement techniques and/or confocal microscopy may be used to determine the size of quantum dots formed within a gas-barrier film, allowing both the size and nature of a defect to be determined. The method may be used to assess the potential effects of defects on the integrity of the gas-barrier film.

Abstract: A system for verification of dispensed pharmaceuticals includes: a housing; a bar code scanning station mounted on the housing; a vision station mounted on the housing; a spectroscopy station mounted on the housing; an offloading station mounted on the housing; one or more conveyors mounted on the housing to convey pharmaceutical vials between the bar code scanning, vision, spectroscopy and offloading stations, and a controller associated with the bar code scanning, vision, spectroscopy and offloading stations and the conveyors to control their operations. A system of this configuration can use both vision and spectroscopy to verify the identity of the pharmaceutical in the container.

Abstract: Disclosed is a system for aligning a collimator tube with an alignment ring used to hold a film or sensor aligned with the collimator tube. The disclosed alignment system includes a light source, a light detector, and a reflective surface, where, when the collimator and alignment ring are aligned, light emitted from the light source reflects off the reflective surface and is received by the light detector.

Abstract: An electronic device may be provided with electronic components such as mapping circuitry for measuring distances, areas, volumes or other properties of objects in the surrounding environment of the device. The mapping circuitry may include a laser sensor and device position detection circuitry. The device may include processing circuitry configured to gather laser sample data and device position data using the laser sensor and the device position detection circuitry. The laser sample data and the device position data may be gathered while pointing a laser beam generated with a laser in the laser sensor at one or more sample points on a surface such as a surface of a wall. By tracking the device position and orientation using the device position detection circuitry, the objects may be mapped while gathering laser sample data from any position with respect to the object.

Abstract: Seed meters, agricultural planters, and methods of planting seed are provided. Such meters, planters, and methods may include a housing defining a chamber, a seed disc rotatably coupled to the housing and at least partially positioned within the chamber with the seed disc adapted to engage a seed, and a sensor for detecting a characteristic of the seed after the seed disengages the seed disc and before the seed exits the seed meter. The sensor may be coupled to a seed chute of the seed meter and may detect a wide variety of seed characteristics such as seed position within the seed chute, seed size, and seed shape. The seed characteristic may be used to adjust operation of the seed meters, agricultural planters, and methods. In some instances, the adjustment may be manual. In other instances, the adjustment may be automatic.

Abstract: An apparatus and method for improving aerosol particle characterization and detection accuracy in clean room applications that includes an optical particle sizer that receives a particle containing aerosol sample at a higher flow rate which is operatively coupled to an inertial aerosol concentrator for concentrating particles received from the optical particle sizer and delivering a lower flow rate, particle enriched output. The system further includes an optical sensor for sensing of intrinsic particle fluorescence of the lower, particle-enriched flow, since intrinsic fluorescence is a useful indicator of biological particles and biological particle viability, including bacterial particles. The system as a whole provides a measure derived from a single inlet flow both of total particles and of viable microbial particles based on their spectroscopic properties.

Abstract: A defect inspection apparatus comprises a table on which a substrate is placed, a first detection unit which is disposed above the table to detect an optical signal from the substrate, a second detection unit which is disposed above the table to detect an electrical signal from the substrate, and a signal processing unit which is connected to the first detection unit and the second detection unit to detect a chemical defect using the optical signal and the electrical signal.

Abstract: To realize an encoder having highly reliable detection accuracy and capable of reducing a device cost. A light detection unit of an encoder receives light irradiated by a light source and transmitted through light-transmitting portions of Gray code optical patterns of a rotating disk and a light-transmitting/shielding member, and detects the light as digital data. A magnetic detection unit detects a magnetic pattern of a magnet provided on a rotation center portion of the rotating disk as digital data. A processing unit compares the digital data of the magnetic detection unit and the digital data of the light detection unit, and corrects a detection error.

Abstract: An optical carrier based microwave interferometry (OCMI) system for measuring a physical, chemical, or biological property broadly comprises an optical carrier signal source, a waveguide, a microwave envelope signal source, a microwave modulator, an optical interferometer, a detector, and an analyzer. An optical carrier signal is modulated with a microwave envelope signal and transmitted through an optical interferometer. The optical signal is interrogated in microwave domain to obtain interference patterns or absorption/emission spectra corresponding to the physical, chemical, or biological property being measured.

Abstract: In laser-induced breakdown spectroscopy (LIBS), an apparatus includes a pulsed laser configured to generate a pulsed laser signal toward a sample, a constructive interference object and an optical element, each located in a path of light from the sample. The constructive interference object is configured to generate constructive interference patterns of the light. The optical element is configured to disperse the light. A LIBS system includes a first and a second optical element, and a data acquisition module. The data acquisition module is configured to determine an isotope measurement based, at least in part, on light received by an image sensor from the first and second optical elements. A method for performing LIBS includes generating a pulsed laser on a sample to generate light from a plasma, generating constructive interference patterns of the light, and dispersing the light into a plurality of wavelengths.

Abstract: Methods, systems, and devices are disclosed for molecular capture, manipulation, and analysis. In one aspect, a device to aggregate and characterize particles in a fluid includes an electrically insulative substrate including a channel to carry an electrically conducting fluid containing particles, electrodes located in the channel forming a nanoscale opening and including an insulating layer over their surface at the opening, a first circuit to apply a non-uniform ac electric field and a dc bias signal across the electrodes, in which the applied non-uniform ac electric field produces a positive dielectrophoretic force to aggregate the particles in a trapping region including the opening and adjacent region, a second circuit to detect changes in a dc current caused by at least some of the particles in the trapping region, and an optical device that directs a coherent light beam on the opening to determine Raman spectra of the particles in the trapping region.

Abstract: Vapor is provided locally at a sample surface to allow fluorescence of the fluorescent markers in a vacuum chamber. For example, a nanocapillary can dispense a liquid near a region of interest, the liquid evaporating to increase the vapor pressure near the fluorescent markers. The increase in vapor pressure at the fluorescent marker is preferably sufficiently great to prevent deactivation or to reactivate the fluorescent marker, while the overall pressure in the vacuum chamber is preferably sufficiently low to permit charged particle beam operation with little or no additional evacuation pumping.

Abstract: A coaxial gyro accelerometer device in a semiconductor substrate for simultaneously sensing coaxial linear and rotational forces. An exemplary device includes a resonating cantilever beam within a substrate and a package having a resonating cavity. The package supports the substrate while allowing the beam to resonate. The substrate also includes a piezoresistor driver, a piezoresistor sensor, and a semiconductor interferometric optical gyro. The piezoresistor driver and sensor are incorporated within the beam. The driver electrothermally resonates the beam. The sensor piezoresistively senses a signal that relates to an acceleration force out-of-plane of the beam. A waveguide of the semiconductor interferometric optical gyro is incorporated in the substrate around the beam. The gyro senses rotational motion about the axis that is the same as the acceleration vector (out-of-plane of the beam). The gyro also includes a laser source and a light detector.

Abstract: A dynamic measurement procedure of the luminance and retroreflection of the road markings and signals and obtention of the dimensions of the same from a vehicle that circulates on the road; illuminating the zone of interest; knowing the position of the vehicle; measuring the luminance by means of a light sensor in a single pass, at known distances or intervals; identifying and extracting one or several road markings and signals simultaneously in each measurement of luminance by means of algorithms; referencing the luminance both geometrically and in time, as well as the obtention of the shape, position and dimensions of the same; and the device for carrying out said procedure, which includes a luminous source, a system of global positioning of the vehicle, a light sensor, a camera, a data processor and a data storage device.

Abstract: An inertial sensing system comprises a first multi-axis atomic inertial sensor, a second multi-axis atomic inertial sensor, and an optical multiplexer optically coupled to the first and second multi-axis atomic inertial sensors. The optical multiplexer is configured to sequentially direct light along different axes of the first and second multi-axis atomic inertial sensors. A plurality of micro-electrical-mechanical systems (MEMS) inertial sensors is in operative communication with the first and second multi-axis atomic inertial sensors. Output signals from the first and second multi-axis atomic inertial sensors aid in correcting errors produced by the MEMS inertial sensors by sequentially updating output signals from the MEMS inertial sensors.

Abstract: A method of polishing includes polishing a substrate having a second layer overlying a first layer, measuring a sequence of groups of spectra of light from the substrate while the substrate is being polished, each group of the groups of spectra including spectra from different locations on the substrate, for each group, calculating a value for a dispersion parameter of the spectra in the group to generate a sequence of dispersion values, and detecting exposure of the first layer based on the sequence of dispersion values.

Abstract: A sensor arrangement for light sensing and temperature sensing comprises a first sensor input (1) for connecting a temperature sensor (11) and a second sensor input (2) for connecting a light sensor (21), in particular an ambient light sensor. A sensor switch (S3) electrically connects either the first or the second sensor input (1, 2) to an integration input (41) of an integrating analog-to-digital converter (4). A reference circuit (5) connects to the integration input (41) via a first switch (S2). A first reference input (42) of the integrating analog-to-digital converter (4) is to be connected with a first reference potential (Vbl). A counter (6) connects to an integration output (43) of the integrating analog-to-digital converter (4). And a controller unit (6) connects to the counter (6) and is designed to control the first switch (S2) depending on an integrated sensor signal (Vout) integrated by the integrating analog-to-digital converter (4).

Abstract: The invention provides a method for acoustically and optically characterizing an immersed object of interest by generating a serial plurality of acoustic and optical illumination pulses through a liquid. In addition to the spectral analyses/imaging of objects/environment made possible by the white-light illumination, a target material can be ablated, generating an ionized plume to spectrally identify the target's constituent atoms.

Abstract: A method of determining a mathematical transformation to place three-dimensional (3D) coordinates of points measured by an articulated arm coordinate measurement machine (AACMM) and 3D points measured by a scanner in a common coordinate system is provided. The method including providing the 3D scanner and the AACMM having a probe. The scanner and AACMM each have a local frame of reference. Three non-collinear targets are measured with the probe and then with the scanner. 3D probe reference coordinates and 3D scanner reference coordinates are determined based on the measurement of the targets by the AACMM and scanner. The mathematical transformation is determined based at least in part on the 3D probe reference coordinates and the 3D scanner reference coordinates, the mathematical transformation characterized at least in part by a collection of parameters.

Abstract: A method for detecting hydrocarbons is described. The method includes performing a remote sensing survey of a survey location to identify a target location. Then, an underwater vehicle (UV) is deployed into a body of water and directed to the target location. The UV collects measurement data within the body of water at the target location, which is then analyzed to determine whether hydrocarbons are present at the target location.

Abstract: A system for real-time sizing of fluid-borne particles is disclosed. The system further determines, in real time, whether the detected particles are biological or non-biological. As the fluid is being tested, it is exposed to a microbe collection filter which is cultured to determine the type of microbes present in the fluid being tested.

Abstract: A laser ablation tomography system includes a specimen stage for supporting a specimen. A specimen axis is defined such that a specimen disposed generally on the axis may be imaged. A laser system is operable to produce a laser sheet in a plane intersecting the specimen axis and generally perpendicular thereto. An imaging system is operable to image the area where the laser sheet intersects the specimen axis.

Abstract: A sensor is provided that includes a first optical body having at opposing, spaced sides an incident surface and a reflecting surface. The sensor includes an optical pathway for carrying incident light to the incident surface. The first optical body acts as a Fabry-Pérot etalon, such that a portion of the incident light passes through the incident surface, reflects from the reflecting surface, and then returns along the optical pathway. The first optical body is formed of a material whose optical absorbance increases depending on the neutron fluence experienced by the material, such that a corresponding characteristic attenuation is produced in the reflected light returned along the optical pathway depending on the neutron fluence experienced by the first optical body. The sensor may measure pressure in combination with the measurement of temperature and neutron fluence, and a further sensor is provided for combined measurement of pressure and neutron fluence.

Abstract: A detection device includes a flow channel for a fluid sample, a suction section adapted to draw the fluid sample into the flow channel, an optical device disposed in the flow channel, a light source adapted to irradiate the optical device with light, a light detection section adapted to detect light emitted from the optical device, a microbalance sensor chip having a piezoelectric substrate provided with an oscillation electrode, and disposed in the flow channel, and a quantitative analysis section adapted to perform quantitative analysis on the fluid sample based on output from the light detection section and the microbalance sensor chip. The optical device has a metal nanostructure including projections ranging in size from 1 through 1000 nm, and emits light representing the fluid sample adsorbed to the metal nanostructure.

Abstract: The positions of the slitter blades of a slitter-winder are calibrated using a laser to perform measurement and calibration of the fiber web cutting point of each slitter blade pair. Measurement and calibration is preformed on the top slitter blade of each of a multiplicity of slitter blade pairs one after another. The laser measures one slitter blade of each slitter blade pair while they are engaged. The slitter blade pairs between the laser and the slitter blade pair being measured are not engaged. Carriages which support the slitter blades have position sensors which the laser measurements calibrate and the blade pair positions are measured and the carriage positions are read simultaneously. The cutting edges of the slitter blades are sharpened to have straight sides and the laser measurement system is located so the laser beam is directed to the straight side.

Abstract: Color measuring systems and methods are disclosed. Perimeter receiver fiber optics are spaced apart from a central source fiber optic and receive light reflected from the surface of the object being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object being measured. Under processor control, the color measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention.