Abstract: Devices, systems and methods facilitate analyzing, identifying and sorting particles in fluids, including cytometry devices and techniques. The described techniques can be used in a variety of applications such as in chemical or biological testing and diagnostic measurements. One exemplary flow cytometry device includes a channel that is capable of conducting a fluid containing at least one particle and also capable of allowing light be transmitted to and from the channel. The flow cytometry device also includes a lens that is positioned between the channel and a color filter. The lens directs at least a portion of light transmitted from the channel to the color filter. The color filter includes a plurality of zones, where each zone is adapted to allow transmission of only a particular spectral range of light. The flow cytometry device further includes a detector configured to receive the light that is transmitted through the color filter.

Abstract: Brightness factors associated with shade fabric may be utilized when shading a building. A brightness factor may incorporate an openness factor, a visible light reflectance, a diffusion factor, a color, or other characteristics of the shade fabric. The brightness factor may be utilized when selecting a particular shade fabric for a room, building or other location. Additionally, the brightness factor may be utilized by an automated shade control system. The shade fabric selection may affect the building envelope by facilitating the optimization of daylighting, reduction of artificial electric lighting needs, minimization of glare conditions, and reduction of thermal load.

Abstract: A for traceably determining an unknown optical path length of a sample in an optical measuring device comprises the steps of: providing a drop analyser connected to a standard spectrophotometer; providing a certified reference material contained in first and second closed high accuracy cuvettes; measuring absorbance of the certified reference material to obtain a first absorbance measurement for the first specified path length; measuring absorbance of the certified reference material for a second path length to obtain a second absorbance measurement; using a dropping device to drop a specified volume of the solvent on an optical surface so that the path length of the specified volume can be determined by reference to the first and second absorbance measurement; and using the dropping device to drop the same volume of sample as the specified volume of solvent on the optical measuring device.

Abstract: A multiple sensor fiber optic sensing system includes an optical fiber having at least first fiber optic sensors and second fiber optic sensors deployed along its length. In response to an interrogating pulse, the first fiber optic sensors generate responses in a first optical spectrum window, and the second fiber optic sensors generate responses in a second, different optical spectrum window. The responses in the first optical spectrum window are measured in a first optical spectrum channel, and the responses in the second optical spectrum window are measure in a second, different optical spectrum channel and provide simultaneous indications of one or more parameters, such as temperature and pressure, in the environment in which the sensors are deployed.

Abstract: The present invention relates to a system for extending microscopy information, where the microscopy information is image information from a first region (118) of an associated sample, the first region being imaged with an imaging system. The extension of the microscopy information originates from probing a larger second region (116) by photons which are emitted at an exit position (128) and collected at en entry position (130). The exit position and the entry position are spatially separated so that so that average spectral information of photons emitted from the exit position and collected at the entry position, is dependent on the second region (116) of the associated sample, the second region (116) being larger than the first region (118).

Abstract: An apparatus for measuring optical properties of transparent materials with a first illumination device which illuminates the material to be investigated along a pre-set illumination path with a pre-set radiation, with a radiation recording space which records radiation passed on by the material to be investigated. The radiation recording space is arranged so that radiation emitted by the first illumination device first strikes the material and then at least for a time an inner wall of the radiation recording space. A radiation detector device is arranged to record radiation reflected and/or scattered essentially only from the inner wall. A second illumination device suitable for emitting modulated radiation also illuminates the inner wall.

Abstract: The present disclosure provides for a system and method for detecting explosives and other materials in a sample scene. First interacted photons are produced from a target area wherein the first interacted photons are generated via solar radiation. The first interacted photons are assessed to thereby generate a SWIR hyperspectral image. The SWIR hyperspectral image is analyzed to identify an area of interest likely of comprising an explosive material. The area of interest is illuminated using laser light illumination to generate second interacted photons from the area of interest. These second interacted photons are assessed to determine whether it not an explosive material is present in the area of interest. The system and method may be configured in standoff, OTM, static and UGV configurations.

Abstract: A device is provided that can be inserted into a spectrophotometer, in order to measure the thickness and refractive index of a thin film that is on a sample plate. A pair of identical parallelogram prisms diverts the spectrophotometer beam to measure the attenuated total reflection, and returns an output beam that is in the original beam path, independent of wavelength and rotation angle. The attenuated total reflection of the thin film sample plate is measured in a prism coupling geometry, as a function of wavelength and angle. From this data, combined with normal incidence transmission data, the thickness and refractive index can be extracted.

Abstract: An apparatus for optical measurement of substance concentrations has at least one transmitter arranged in or on a housing and at least one receiver for optical radiation, and a deflection device, which is at a distance from the at least one transmitter and the at least one receiver and is arranged within the substance when the apparatus is being used correctly, for deflection of the optical radiation from the at least one transmitter to the at least one receiver. The distance between the deflection device and the at least one transmitter and/or the at least one receiver can be varied by means of an adjusting device.

Abstract: A microscope device for inspecting structured objects, including: a camera; an optical imager capable of producing, on the camera, an image of the object according to a field of view, and including a distal lens arranged on the side of the object; and a low-coherence infrared interferometer including a measurement beam capable of producing measurements by means of interferences between retroreflections of the measurement beam and at least one separate optical reference. The device also includes coupler for injecting the measurement beam into the optical imaging means in such a way that the beam passes through the distal lens, and the low-coherence infrared interferometer is balanced in such a way that only the measurement beam retroreflections, taking place at optical distances close to the optical distance covered by the beam to the object, produce measurements.

Abstract: A system (40) for diagnosis and staging of early stages of cancer in the tissue of a patient is provided. The system—is configured to combine information from a Polarized Light Scattering Spectroscopy measurement (70) having a first probe depth, and a Differential Path Length Spectroscopy measurement (60) having a second probe depth, wherein the second probe depth is set larger than' the first probe depth. By comparing the results of the Polarized Light Scattering Spectroscopy and Differential Path Length Spectroscopy measurements early stages of cancer, such as dysplasia may be detected. Also hyperplasia, carcinoma in situ, and carcinoma may be detected. A computer-readable medium, method and use are also provided.

Abstract: A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems.

Abstract: Disclosed are systems and methods for analyzing an oil/gas separation process. One method includes conveying a fluid to a fluid separator coupled to a flow path, the fluid separator having an inlet and a discharge conduit, generating a first output signal corresponding to a characteristic of the fluid adjacent the inlet with a first optical computing device, generating a second output signal corresponding to the characteristic of the fluid adjacent the discharge conduit with a second optical computing device, receiving the first and second output signals with a signal processor communicably, and generating a resulting output signal with the signal processor indicative of how the characteristic of the fluid changed between the inlet and the discharge conduit.

Abstract: Embodiments of the present invention provide a method of determining at least one characteristic of a target surface, comprising providing a phase map for a first region of a target surface via radiation having a first wavelength, providing n further phase maps for the first region via radiation having a further n wavelengths each different from the first wavelength, and determining at least one characteristic at the target surface responsive to the first and further phase maps.

Abstract: According to the invention, a monitoring device (12) is created for monitoring a thinning of at least one semiconductor wafer (4) in a wet etching unit (5), wherein the monitoring device (12) comprises a light source (14), which is designed to emit coherent light of a light wave band for which the semiconductor wafer (4) is optically transparent. The monitoring device (12) further comprises a measuring head (13), which is arranged contact-free with respect to a surface of the semiconductor wafer (4) to be etched, wherein the measuring head (13) is designed to irradiate the semiconductor wafer (4) with the coherent light of the light wave band and to receive radiation (16) reflected by the semiconductor wafer (4). Moreover, the monitoring device (12) comprises a spectrometer (17) and a beam splitter, via which the coherent light of the light wave band is directed to the measuring head (13) and the reflected radiation is directed to the spectrometer (17).

Abstract: Disclosed are systems and methods for analyzing a flow of a fluid at two or more discrete locations to determine the concentration of a substance therein. One method of determining a characteristic of a fluid may include containing a fluid within a flow path that provides at least a first monitoring location and a second monitoring location, generating a first output signal corresponding to the characteristic of the fluid at the first monitoring location with a first optical computing device, generating a second output signal corresponding to the characteristic of the fluid at the second monitoring location with a second optical computing device, receiving first and second output signals from the first and second optical computing devices, respectively, with a signal processor, and determining a difference between the first and second output signals with the signal processor.

Abstract: A system and method for automatically detecting the presence of a perforation, tear, or a transparent window security feature in a bank note. The system includes an optical detection device, and an ultrasonic detection device, and a conveyance device for transporting the bank note along a defined path proximate the detection devices. Each detection device comprises a plurality of optical transmitters and corresponding optical receivers that bracket the note path. A computing device is also provided to determine from the output of the optical detection device the presence of an optical abnormality in the bank note; to determine from the output of the ultrasonic detection device the presence of an ultrasonic abnormality in the bank note; and to determine the presence of a perforation, tear, or transparent window feature based upon the results of the optical abnormality determination or the ultrasonic abnormality determination.

Abstract: A computer-implemented method includes receiving a sequence of current spectra of reflected light from a substrate; comparing each current spectrum from the sequence of current spectra to a plurality of reference spectra from a reference spectra library to generate a sequence of best-match reference spectra; determining a goodness of fit for the sequence of best-match reference spectra; and determining at least one of whether to adjust a polishing rate or an adjustment for the polishing rate, based on the goodness of fit.

Abstract: A sample is illuminated to thereby generate a plurality of first interacted photons selected. The first interacted photons are assessed using a visible imaging device to thereby determine an area of interest in the sample. The area of interest is illuminated to thereby generate a plurality of second interacted photons. The second interacted photons are assessed using a spectroscopic device to thereby generate a SWIR data set representative of said area of interest. A database is searched wherein said database comprises a plurality of known SWIR data sets associated with an explosive material. The data sets comprise at least one of: a plurality of SWIR spectra and a plurality of spatially accurate wavelength resolved SWIR images. An explosive material in the area of interest is thereby identified as a result of the search.

Abstract: To perform high-speed and highly accurate measurement by setting desired measuring conditions for each measuring object. In an alignment sensor of exposure apparatus, in the case of performing position measurement for a plurality of sample shots, measurement is performed by changing the measuring conditions, in response to a measuring axis direction, a mark or a layer whereupon a mark to be measured exists. At that time, for the measuring objects to be measured under the same measuring conditions, for example, a position in a Y axis direction and a position in an X axis direction, measurement is continuously performed. When the measuring condition is changed, a baseline value is remeasured. The changeable measuring conditions are wavelength of measuring light, use and selection of a retarder, NA and ? of an optical system, a light quantity of measuring light, illumination shape, signal processing algorithm, etc.

Abstract: A system for detecting the presence of an analyte in a moving substrate or sample handling device is disclosed, providing means (26,30) for integrated triggering of data acquisition with a detector means (28) and data acquisition with a detector means (28). In particular, a surface Plasmon resonance “lab on disk” reader system is disclosed.

Abstract: An apparatus measuring optical characteristics including position detection is disclosed. A processor is coupled to a display. A first optical sensor makes a first measurement, and a second optical sensor makes a second measurement. A source of illumination and the first optical sensor determine a minimal distance between the apparatus and an external object such that illumination emitted by the source is not received by the first optical sensor when the apparatus is less than the minimal distance from the external object. A position of the apparatus with respect to an object and an optical property of light received by the apparatus are determined. A transparent member with a thickness less than the minimal distance may provide illumination external to the apparatus and receive light from external to the apparatus.

Abstract: The present invention relates to a method and apparatus which can provide rapid scanning of large specimens (14) to detect and determine positions of objects having specific characteristics. The apparatus may, further, be adapted to store information associated with the positions of the detected objects and to retrieve this position information so that an operator may locate a particular type of target object or objects in the specimen for detailed inspection and analysis subsequent to the scanning. The position information may be stored in a volatile or non-volatile memory device provided therefore in a preferred embodiment of the invention. The specimen may be provided on a solid support, such as a circular disc (13) which may be rotatably mounted about an axis (17) of a frame of the apparatus. The objects can be cells or microorganisms of a particular rare type, i.e. they may be present in a very low density in the specimen.

Abstract: An instrument is provided that can monitor nucleic acid sequence amplification reactions, for example, PCR amplification of DNA and DNA fragments. The instrument includes a multi-notch filter disposed along one or both of an excitation beam path and an emission beam path. Methods are also provided for monitoring nucleic acid sequence amplifications using an instrument that includes a multi-notch filter disposed along a beam path.

Abstract: Color measuring systems and methods are disclosed. Perimeter receiver fiber optics are spaced apart from a central source fiber optic and receive light reflected from the surface of the object being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object being measured. Under processor control, the color measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention.

Abstract: The invention provides a method of characterising a scattering coloured pigment for use in the determination of the absorption and scattering coefficients of the scattering coloured pigment, the method comprising the step of obtaining a reflectance spectrum of a mixture of the scattering coloured pigment with a substantially non-absorbing scattering pigment at a plurality of different volume fractions wherein the substantially non-absorbing scattering pigment has a particle size greater than 0.6 micron. Also provided is a pigment characterisation system adapted to perform the method of the invention to characterise a scattering coloured pigment.

Abstract: Device for measuring at least one of diffusion, absorption and refraction of a sample, having a radiation source, at least one receiving element, an optical imaging element and a protection element, the radiation source and the receiving element being arranged on the sensor side of the optical imaging element, the protection element being arranged on the sample side of the imaging element and adjacent to the imaging element and the radiation source. A refraction radiation source and a refraction receiver are arranged on the sensor side of the imaging element and arranged relative to the imaging element so that the refraction radiation of the sample specularly reflected by the sample side interface of the protection element can essentially be received by the refraction receiver and the radiation specularly reflected by the imaging element side interface of the protection element essentially cannot be received by the refraction receiver.

Abstract: The present invention relates to the field of optical precision measurement technologies, and in particular, to a method and a device of differential confocal (confocal) and interference measurement for multiple parameters of an element. The core concept of the invention lies in that: the concurrent high-precision measurement of multiple parameters of an element may be realized by measuring the surface curvature radius of an element with spherical surface, the back focal length of a lens, the refractive index of a lens, the thickness of a lens and the axial spaces of an assembled lenses by using a differential confocal (confocal) measuring system and measuring the surface profile of the element by using a figure interference measuring system.

Abstract: An embodiment of a system for acquiring images of a probe array is described that comprises a first light emitting diode that provides light comprising a first range of wavelengths outside of an excitation spectrum; a second light emitting diode that provides light comprising a second range of wavelengths inside of the excitation spectrum; and a detector that detects one or more wavelengths in the first range of wavelengths, wherein the first range of wavelengths comprise light wavelengths emitted from fluorescent molecules associated with one or more probes of the probe array in response to the second range of wavelengths and wavelengths reflected from one or more reflective elements associated with the probe array.

Abstract: Programmable illuminators in exposure tools are employed to increase the degree of freedom in tool matching. A tool matching methodology is provided that utilizes the fine adjustment of the individual source pixel intensity based on a linear programming (LP) problem subjected to user-specific constraints to minimize the difference of the lithographic wafer data between two tools. The lithographic data can be critical dimension differences from multiple targets and multiple process conditions. This LP problem can be modified to include a binary variable for matching sources using multi-scan exposure. The method can be applied to scenarios that the reference tool is a physical tool or a virtual ideal tool. In addition, this method can match different lithography systems, each including a tool and a mask.

Abstract: The disclosure is directed to nondestructive systems and methods for simultaneously measuring active carrier concentration and thickness of one or more doped semiconductor layers. Reflectance signals may be defined as functions of active carrier concentration and thickness varying over different wavelengths and over different incidence angles of analyzing illumination reflected off the surface of an analyzed sample. Systems and methods are provided for collecting a plurality of reflectance signals having either different wavelengths or different incidence angle ranges to extract active carrier density and thickness of one or more doped semiconductor layers.

Abstract: A measuring device for quantitative determination of optical characteristic values for detecting photo- and/or electrochemical decomposition reactions taking place on surfaces of photocatalytically active substrates.

Abstract: The invention relates to a device for detecting signs of bacterial infection of teeth, comprising a light source, a receiving unit, an evaluation unit, coupled to the receiving unit, at least one emission fiber, coupled to the light source, and at least one detection fiber, coupled to the receiving unit. The invention is characterized in that the common distal front face of the at least one emission fiber and the at least one detection fiber is connected to a front face of a flexible plastic optical wave guide, the diameter of the plastic optical wave guide being less than 400 ?m, preferably less than 300 ?m.

Abstract: This invention is directed to extract the scattering characteristic of a measurement target together when measuring the surface shape in a measurement system, which measures the surface shape of a measurement target, by the pattern projection method. To accomplish this, the measurement system includes an illumination unit which irradiates a measurement target with dot pattern light, a reflected light measurement unit which receives the reflected light at a reflection angle almost equal to a incident angle, and a reflected light extraction unit which extracts the inclination of the surface of the measurement target, based on the shift amount between the light receiving position of the received reflected light and a predetermined reference position, and extracts the luminance value of the reflected light and the dot diameter of the dot pattern light as information about the scattering characteristic.

Abstract: An unevenness inspection apparatus including: an image pickup section obtaining a pickup image of a test object; an image generating section generating each of a color unevenness inspection image and a luminance unevenness inspection image based on the pickup image; a calculating section calculating an evaluation parameter using both of the color unevenness inspection image and the luminance unevenness inspection image; and an inspecting section performing unevenness inspection using the calculated evaluation parameter. The calculating section calculates the evaluation parameter in consideration of unevenness visibility for both color and luminance.

Abstract: A time correlated single photon counting system having a programmable delay generator triggered by a laser fire event detector. The system may be used for chemical agent detection based on Rayleigh scattering using optical time domain reflectometry techniques. The system may also be used for Raman detection using frequency to time transformations.

Abstract: The invention discloses an optical measurement system for measuring the optical properties of a device under test (DUT). The optical measurement system includes a DUT, a light measuring module, a light guiding module and an analyzing module. The present invention utilizes the light guiding module to receive an axial ray of the rays emitted by the DUT so as to analyze the optical properties thereof. Thus, the present invention is not only capable of measuring the light intensity of the rays emitted by the DUT, but also capable of obtaining the properties of the axial ray emitted by the DUT.

Abstract: Authentication apparatus (1, 100) and methods which authenticate an item (4, 110) responsive to the detection that a portion of the item has one or more predetermined characteristics, the said predetermined characteristics comprising either or both the thickness of the said portion of the item, and the thickness of one or more layers within the said portion of the item, determined by optically-based thickness measuring apparatus (6, 102-108). The item may be a product and the portion of the item may be a sheet of packaging material. The item may be a security document and the portion of the item may be a sheet of security document substrate.

Abstract: The disclosure relates to optical measuring methods and apparatus for determining the transmission and/or reflection properties of translucent objects with utility for process monitoring and quality inspection in the manufacture of surface-coated substrates.

Abstract: The invention relates to an apparatus and a method for imaging surface area of a sample having a surface topography with the aid of confocal microscopy, such as confocal Raman and/or fluorescence microscopy. The apparatus comprises a surface topography sensor that provides values for the surface topography. The surface topography values allow for the surface to be maintained in the confocal plane during scanning.

Abstract: Brightness factors associated with shade fabric may be utilized when shading a building. A brightness factor may incorporate an openness factor, a visible light reflectance, a diffusion factor, a color, or other characteristics of the shade fabric. The brightness factor may be utilized when selecting a particular shade fabric for a room, building or other location. Additionally, the brightness factor may be utilized by an automated shade control system. The shade fabric selection may affect the building envelope by facilitating the optimization of daylighting, reduction of artificial electric lighting needs, minimization of glare conditions, and reduction of thermal load.

Abstract: The present invention relates to an optical trapping particle including a birefringent crystalline particle having a body and a length extending between a first end and a second end, said particle comprising an optic axis perpendicular to the length of the body, wherein the length of the body is greater than the largest width dimension of the first or second ends. The present invention also relates to an optical trapping particle including an optically isotropic particle having a body and a length extending between a first end and a second end, said particle having an asymmetric cross-section, wherein the length of the body is from about 10 nanometers to about 10 micrometers and is greater than the largest width dimension of the first or second ends. Angular optical trap systems including the optical trapping particles, methods of making, and methods of use are also disclosed.

Abstract: An axial light loss sensor system, and methods for measuring axial light loss with improved resolution are provided. Aspects of the present invention include an axial light loss sensor positioned along an axis of irradiation to detect axial light loss resulting from a particle passing a light source intersect in a fluid stream, and an obstruction positioned along the axis of irradiation between the light source intersect and the axial light loss sensor. The obstruction is further positioned so as to have an on-axis opaque surface. The obstruction allows for the measurement of a fringe signal in a far-field with respect to the irradiated particle, in order to measure the axial light loss produced by the particle. The systems and methods described herein find use in, for example, flow cytometery.

Abstract: A probe using integrated confocal reflectance imaging, confocal Raman spectroscopy, and gross spatial imaging for non-invasiveIy evaluating a target of interest of a living subject. In one embodiment, the probe includes a casing with first and second ends, and first, second and third optical pons The firsi and second optical ports are located at the first end of the casing and the third optical port is located at the second end of the casing such that the first and third optical ports define a first optical path therebetween and the second and third optical ports define a second optical path therebetween, respectively. Each optical path has first and second portions, where the second portions of the first and second optical paths arc substantially overlapped and proximal to the third optical port.

Abstract: A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems.

Abstract: A particle detection system is provided. The particle detection system includes at least one tapered optical fiber, a light source configured to transmit light through the at least one tapered optical fiber, a photodetector configured to measure a characteristic of the light being transmitted through the at least one optical fiber, and a computing device coupled to the photodetector and configured to determine whether a nanoparticle is present within an evanescent field of the at least one tapered optical fiber based on the measured light characteristic.

Abstract: A measurement apparatus includes a DOT measurement unit, an AOT measurement unit, and a controller configured to calculate at least one of an absorption characteristic and a scattering characteristic of a test region set in an test object by utilizing one of the DOT measurement unit and the AOT measurement unit, whichever one has the smaller measurement size.

Abstract: System and method for determining a disease state of a sample. A sample is positioned in a field of view and a first spectroscopic data set is obtained. The positional information is stored and the sample is treated with a contrast enhancing agent. The sample is repositioned in the field of view and a digital image is obtained. The spectroscopic data is linked with the digital image and a database comprising representative spectroscopic data sets is searched to classify the disease state of the sample. The disclosure also provides for the step of obtaining a processed derivative image and searching a database comprising representative processed derivative images to classify a disease state of the sample.

Abstract: A microbial detection apparatus is provided. The apparatus includes a parabolic reflector. A light source is configured to direct a beam of light toward the focal point of the parabolic reflector. A fluid flow tube passes through the focal point of the parabolic reflector, such that the light beam path and the flow tube intersect at the focal point of the parabola. The fluid flow tube is configured to contain a flow of fluid. A first detector is included for detecting fluorescence light emitted from microbes within the fluid passing through the flow tube. A second detector is included for detecting Mie scattered light from particles within the fluid passing through the flow tube.

Abstract: A microscope system which is capable of changing observation states by driving various optical members and which includes a history record unit for recording history data related to a microscope operation history, a selection unit for selecting one or more microscope operation items from among a plurality of microscope operation items, and a state reproduction unit for reproducing a microscope state on the basis of a microscope operation item(s) selected by the selection unit and on the basis of a microscope operation history related to history data recorded in the history record unit.