Abstract: Described are systems and methods for variable angle Raman spectroscopy, in which electromagnetic radiation will be caused to intersect the sample under investigation at a plurality of angles of incidence, so as to provide Raman scattering spectra at each angle. One example use of measuring such spectra at multiple angles of incidence is to enable evaluation at a plurality of depths within the sample. In many implementations, the range of the angles of incidence will include, and extend to either side, of the critical angle.

Abstract: The disclosure relates to optical measuring methods and apparatus for determining the transmission and/or reflection properties of translucent objects with utility for process monitoring and quality inspection in the manufacture of surface-coated substrates.

Abstract: A robot apparatus includes a gripping unit configured to grip a first component, a force sensor configured to detect, as detection values, a force and a moment acting on the gripping unit, a storing unit having stored therein contact states of the first component and a second component and transition information in association with each other, a selecting unit configured to discriminate, on the basis of the detection values, a contact state of the first component and the second component and select, on the basis of a result of the discrimination, the transition state stored in the storing unit, and a control unit configured to control the gripping unit on the basis of the transition information selected by the selecting unit.

Abstract: A fringe image phase distribution analysis technique that performs one-dimensional discrete Fourier transform using temporal intensity information or spatial intensity information to calculate the phase distribution of the fringe image. To improve the analysis accuracy of the phase distribution, a plurality of phase-shifted moiré fringe images is generated from high-dimensional intensity data by a thinning-out (down-sampling) process and an image interpolation process, and the phase distribution of the moiré fringe is calculated by a two-dimensional or three-dimensional discrete Fourier transform. In addition, the phase distribution of thinned-out is added to calculate the phase distribution of an original fringe image. Since high-dimensional intensity information which is present in both spatio-domain and temporal-domain is used, phase distribution analysis is less likely to be affected by random noise or vibration.

Abstract: A determining method includes the steps of setting a first parameter to define the shape of the plurality of pattern elements of the mask, setting a second parameter to define the effective light source distribution; and repeating the process of calculation of the image of the mask pattern and calculation of a value of an evaluation item while varying the value of the first parameter and the second parameter to thereby determine the effective light source distribution and the mask pattern, wherein parameters of pattern elements are set as one parameter by using a value of an index representing the proximity effect.

Abstract: Apparatuses, systems, and methods to monitor the integrity of a container protected by a refractory material are disclosed having a first radiation detector to measure an external surface temperature of the container, a first radiation source to measure a thickness of the refractory material, and a central controller configured to display to a user the measurement of the external surface temperature of the container and the measurement of the thickness of the refractory material.

Abstract: A system and method for performing field measurement and testing of a plurality of widely spaced laser beams used in visual warning technology (VWT). VWT uses a combination of widely spaced laser beams, to warn civilians from approaching too close to military security areas. The widely spaced laser beams are displaced using rhomboidal prisms. Each rhomboidal prism receives a corresponding laser beam and displaces it toward a collecting lens. The lens focuses the displaced beams received thereon onto an imaging sensor for testing. Beam shutters may be used for selectively blocking one or more beams in order to test the beams separately and in different combinations.

Abstract: A multiple mode evaluation system that includes a multiple mode imager that is arranged to perform a single scan of a substrate while alternating between different optical modes thereby producing different sets of images of areas of the substrate, each set of images being associated with a single optical mode of image acquisition; wherein the different optical modes differ from each other by at least one optical characteristic.

Abstract: While an illumination optical system is irradiating the surface of a contaminated standard wafer with illumination light, this illumination light is scanned over the surface of the contaminated standard wafer, then detectors of a detection optical system each detect the light scattered from the surface of the contaminated standard wafer, next a predefined reference value in addition to detection results on the scattered light is used to calculate a compensation parameter “Comp” for detection sensitivity correction of photomultiplier tubes of the detectors, and the compensation parameter “Comp” is separated into a time-varying deterioration parameter “P”, an optical characteristics parameter “Opt”, and a sensor characteristics parameter “Lr”, and correspondingly managed. This makes is easy to calibrate the detection sensitivity.

Abstract: A method of imaging microscopic objects includes determining the relative depths of two or more semiconductor nanocrystals by analyzing images of the semiconductor nanocrystals at varying z-displacements.

Abstract: Provided is an apparatus for analyzing an electroluminescence sample, which comprises: a pulse generator for applying a pulse driving signal to the electroluminescence sample; an electroluminescence (EL) detector for receiving electroluminescence which is emitted from the electroluminescence sample according to the application of the pulse driving signal, thereby acquiring a light-receiving signal; a temperature controller for varying the temperature of the electroluminescence sample; and an electroluminescence transient spectroscopy (ELTS) analysis unit for analyzing a change in a time division section of the light-receiving signal delayed depending on a change of the temperature of the electroluminescence sample, and acquiring information on a defect-type charge trap which exists in the electroluminescence sample.

Abstract: An enhanced photoemission spectroscopy (EPS) system uses at least three photoelectric detection processes to identify a substance or substances in a target. The target can be in a container, and the EPS system accounts for this in the identification process. The photoelectric detection processes include Raman scattering, fluorescence and spectral reflection. The EPS system uses all three processes to generate spectral data that is then combined to derive a target signature. The target signature is then compared to stored signature data to determine the substance or substances in the target.

Abstract: A spectroscopic measuring apparatus with monitoring capability includes a first optical path that extends from a measuring object through an optical system and a slit of a slit-mirror block to a spectroscope main body and a second optical path that extends from the measuring object through the optical system and a mirror face of the slit-mirror block to a two-dimensional photographing unit. The slit and spectroscope main body are integrated into a spectroscopic unit.

Abstract: Metrology targets, design files, and design and production methods thereof are provided. The metrology targets are hybrid in that they comprise at least one imaging target structure configured to be measurable by imaging and at least one scatterometry target structure configured to be measurable by scatterometry. Thus, the hybrid targets may be measured by imaging and scatterometry simultaneously or alternatingly and/or the measurement techniques may be optimized with respect to wafer regions and other spatial parameters, as well as with respect to temporal process parameters. The hybrid targets may be used to monitor process parameters, for example via comparative overlay measurements and/or high resolution measurements.

Abstract: A system for monitoring thin-film fabrication processes is herein disclosed. Diffraction of incident light is measured and the results are compared to a predictive model based on at least one idealized or nominal structure. The model and/or the measurement of diffracted incident light may be modified using the output of one or more additional metrology systems.

Abstract: A method measures the positions of centers of curvature of optical surfaces of a multi-lens optical system. The spacings between the surfaces are measured along a reference axis using an interferometer. Subsequently the centers of curvature of the surfaces are measured using an optical angle-measuring device. In the course of the measurement of the position of the center of curvature of a surface situated within the optical system, the measured positions of the centers of curvature of the surfaces situated between this surface and the angle-measuring device and the previously measured spacings between the surfaces are taken into consideration computationally. In this way, a particularly high accuracy of measurement is achieved, because desired spacings do not have to be fallen back upon.

Abstract: Disclosed are systems and methods for analyzing an oil/gas separation process. One method includes conveying a fluid to a fluid separator coupled to a flow path, the fluid separator having an inlet and a discharge conduit, generating a first output signal corresponding to a characteristic of the fluid adjacent the inlet with a first optical computing device, generating a second output signal corresponding to the characteristic of the fluid adjacent the discharge conduit with a second optical computing device, receiving the first and second output signals with a signal processor communicably, and generating a resulting output signal with the signal processor indicative of how the characteristic of the fluid changed between the inlet and the discharge conduit.

Abstract: A fiber optic inspection microscope including an objective lens, an optical detector, an image detector, an illumination source, and first and second beamsplitters, wherein the first beamsplitter is in a first optical path between the objective lens, the image detector and the optical detector, wherein the first beamsplitter allows passage of an optical image to the image detector, wherein the first beamsplitter directs optical energy to the optical detector, wherein the second beamsplitter is in a second optical path between the illumination source and the objective lens, and wherein the second beamsplitter directs light from the illumination source to the objective lens.

Abstract: Methods and apparatus for downhole fluid analysis are disclosed. An example method includes obtaining first measurements from a first spectrometer and a second spectrometer when a light source is on, obtaining second measurements from the first spectrometer and the second spectrometer when the light source is off and calibrating the first spectrometer based on the first measurements and the second measurements.

Abstract: An apparatus and method for improving aerosol particle characterization and detection accuracy in clean room applications that includes an optical particle sizer that receives a particle containing aerosol sample at a higher flow rate which is operatively coupled to an inertial aerosol concentrator for concentrating particles received from the optical particle sizer and delivering a lower flow rate, particle enriched output. The system further includes an optical sensor for sensing of intrinsic particle fluorescence of the lower, particle-enriched flow, since intrinsic fluorescence is a useful indicator of biological particles and biological particle viability, including bacterial particles. The system as a whole provides a measure derived from a single inlet flow both of total particles and of viable microbial particles based on their spectroscopic properties.

Abstract: Apparatus and techniques for measuring and managing plant growth with cell phones or similar devices are described.

Abstract: A system and method of conducting total internal reflection photoacoustic spectroscopy (TIRPAS) comprising using a pulsed laser source to emit a thermally or stress confined laser beam at a prism comprising a surface to be in contact with a sample such that the laser beam travels through the prism to a location at an interface between the prism and the sample to form an evanescent field extending into the sample to generate a detectable photoacoustic response to the evanescent field by an analyte in the sample.

Abstract: An apparatus comprises a spectrophotometer system configured to measure light absorbance by a tear sample, a refractometer system configured to measure refractive index of the tear sample, and an evaluation unit programmed to calculate an osmolarity of the tear sample based on the measured absorbance and refractive index and stored calibration curves. The spectrophotometer and refractometer systems may share a common prism contacted by the tear sample during measurement. The evaluation unit may be programmed to carry out steps of a method for determining osmolarity of the tear sample in accordance with the invention. The osmolarity of the tear sample may be used as an indicator in diagnosing dry eye.

Abstract: The output of optical computing devices containing an integrated computational element can be corrected when an interferent substance or condition is present.

Abstract: A dynamic measurement procedure of the luminance and retroreflection of the road markings and signals and obtention of the dimensions of the same from a vehicle that circulates on the road; illuminating the zone of interest; knowing the position of the vehicle; measuring the luminance by means of a light sensor in a single pass, at known distances or intervals; identifying and extracting one or several road markings and signals simultaneously in each measurement of luminance by means of algorithms; referencing the luminance both geometrically and in time, as well as the obtention of the shape, position and dimensions of the same; and the device for carrying out said procedure, which includes a luminous source, a system of global positioning of the vehicle, a light sensor, a camera, a data processor and a data storage device.

Abstract: A total station including an electro-optical distance measuring unit and a scanning functionality is disclosed. The total station may include an analysis unit for analysis of the registered measuring signal data and conversion thereof into scanning points for a point cloud, whereby a point cloud having the scanning points can be generated. The distance measuring unit may be configured in such a manner that the distance measurement can be carried out by means of runtime measurement and/or waveform digitizing (WFD). In addition, the total station may have a program storage unit which may provide at least two scanning modes, wherein the at least two scanning modes differ at least in a measuring rate such as, for example, in the number of scanning points per unit of time.

Abstract: Disclosed herein is an optical measuring device including: a light applying section configured to apply exciting light to a sample flowing in a channel; and a scattered light detecting section configured to detect scattered light generated from the sample irradiated with the exciting light on the downstream side of the sample in the traveling direction of the exciting light; the scattered light detecting section including a scattered light separating mask for separating the scattered light into a low numerical aperture component having a numerical aperture not greater than a specific value and a high numerical aperture component having a numerical aperture greater than the specific value; a first detector for detecting the low numerical aperture component; and a second detector for detecting the high numerical aperture component.

Abstract: An enhanced photoemission spectroscopy (EPS) system uses at least three photoelectric detection processes to identify a substance or substances in a target. The target can be in a container, and the EPS system accounts for this in the identification process. The photoelectric detection processes include Raman scattering, fluorescence and spectral reflection. The EPS system uses all three processes to generate spectral data that is then combined to derive a target signature. The target signature is then compared to stored signature data to determine the substance or substances in the target.

Abstract: According to an embodiment, a measuring device includes an imaging unit to capture an object from a plurality of positions to obtain a plurality of images; a distance measuring unit to measure a distance to the object from each position to obtain a plurality of pieces of distance information; a position measuring unit to measure each position to obtain a plurality of pieces of position information; a first calculator to calculate three-dimensional data of the object using the images; a second calculator to calculate a degree of reliability of each piece of distance information and each piece of position information; and a estimating unit to, among the pieces of distance information and the pieces of position information, make use of such pieces of distance information and such pieces of position information which have the degree of reliability greater than a predetermined value to estimate the scale of the three-dimensional data.

Abstract: A method for measuring particle size distributions of bulk materials such as cereals, cereal milling products, cereal products and the like, which is intended to enable the measurement of particle size distributions which vary by orders of magnitude. A sample of isolated particles is optically detected in an arrangement by at least two measurement methods. Preferably, detection of the contours of the particles and laser diffraction take place at the same time.

Abstract: A configurable grating based on collapsing nano-fingers includes a substrate; and a plurality of bendable nano-fingers supported on the substrate. The nano-fingers may be formed in a regular first array and the nano-fingers may be formed in a spacing that, upon closing at their tops, forms a second array to act as an optical grating or a diagnostic tool. A method of fabricating a configurable optical grating based on collapsing nano-fingers is also disclosed, as well as a method of determining an open or closed state for a plurality of nano-fingers.

Abstract: A method of obtaining information about a heterogeneous pharmaceutical mixture is disclosed. This method involves applying an image enhancement agent, such as a stain, to the mixture. An image of the mixture can then be obtained, and information about a distribution of components of the mixture in the image can also be obtained based on spatial information derived from the application of the image enhancement agent.

Abstract: An inspection system includes optical components for operating the inspection system in an interference fringe imaging mode and a microscope imaging mode. The inspection system further includes at least one optical light source configured to emit a first wavelength of light to operate the inspection system in the interference fringe imaging mode and configure to emit a second wavelength of light to operate the inspection system in the microscope mode. The first wavelength of light is different from the second wavelength of light.

Abstract: An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.

Abstract: An analytical device such as a flow cytometer is provided in which a fluid sample flowing through a channel is focused into multiple, parallel particle streams by an acoustic wave field extending across the channel. Each stream is then presented to an individual detector to allow for simultaneous interrogation of the multiple streams and thus, high-throughput analysis of the fluid sample.

Abstract: Cross-interrogating photonic detection systems and methods are shown. A flow through photonic crystal membrane with a surface enhanced Raman scattering (SERS) substrate is provided with pores which are distributed along multiple regions. The pores of one region have walls to which a first type of target specific anchor can be attached, while pores of another region have walls to which a second type of target specific anchor can be attached. An optical arrangement out-of-plane to the SERS substrate is also provided for enhanced sensitivity and identification of target organisms.

Abstract: A method of characterizing an imaging system is described includes printing a color chart having a plurality of predetermined color patches; measuring the color patches to obtain colorimetric data; initializing a Neugebauer model with the Neugebauer solids of said colorimetric data; optimizing the global parameters of the Neugebauer model; optimizing the parameters associated with Demichel terms based on the Neugebauer primary associated with the Demichel term; optimizing parameters that vary with device coordinates; and creating a characterization file for the imaging system.

Abstract: Systems and methods for simultaneous optical testing of a plurality of devices under test. These systems and methods may include the use of an optical probe assembly that includes a power supply structure that is configured to provide an electric current to a plurality of devices under test (DUTs) and an optical collection structure that is configured to simultaneously collect electromagnetic radiation that may be produced by the plurality of DUTs and to provide the collected electromagnetic radiation to one or more optical detection devices. The systems and methods also may include the use of the optical probe assembly in an optical probe system to evaluate one or more performance parameters of each of the plurality of DUTs.

Abstract: A detection device includes a flow channel for a fluid sample, a suction section adapted to draw the fluid sample into the flow channel, an optical device disposed in the flow channel, a light source adapted to irradiate the optical device with light, a light detection section adapted to detect light emitted from the optical device, a microbalance sensor chip having a piezoelectric substrate provided with an oscillation electrode, and disposed in the flow channel, and a quantitative analysis section adapted to perform quantitative analysis on the fluid sample based on output from the light detection section and the microbalance sensor chip. The optical device has a metal nanostructure including projections ranging in size from 1 through 1000 nm, and emits light representing the fluid sample adsorbed to the metal nanostructure.

Abstract: A method for matching color and appearance of a target coating of an article is provided. The method includes the steps utilizing sparkle values of the target coating; color data of the target coating; and flop values based on the color data; to identify and select matching formulas based on sparkle differences, flop value differences, and color difference indexes. The method can be used for matching color and appearance of target coatings having effect pigments. This disclosure is also directed to a system for implementing the method. The method can be particularly useful for vehicle refinish repairs.

Abstract: Disclosed herein is a fluorescence measuring apparatus capable of more accurately measuring fluorescence emitted when an object to be measured is irradiated with laser light. The apparatus for measuring fluorescence emitted when an object to be measured is irradiated with laser light includes: a laser light source that irradiates the object to be measured with laser light; a first light-receiving unit that receives scattered light emitted when the object to be measured is irradiated with the laser light; a second light-receiving unit that receives fluorescence emitted when the object to be measured is irradiated with the laser light; and a signal processing unit that assigns a weight to a signal of the fluorescence received by the second light-receiving unit depending on an intensity of the scattered light received by the first light-receiving unit.

Abstract: A detection device is described for measuring the vaporization-melt ratio, the device including a light source, a first and second optical lens group, a slit, a first and second steering mirror, a first and second primary mirror, a glass container, a colored blade, and a high-speed recording analyzer. The first primary mirror and the second primary mirror are symmetrically placed at both ends of the glass container. The first optical lens group is located between the light source and the slit. The second optical lens group is located between the colored blade and the high-speed recording analyzer. The first steering mirror is installed behind the slit, passing the light from the slit to the first primary mirror. The light reflected by the second primary mirror is passed to the colored blade from the second steering mirror located between the second primary mirror and the colored blade.

Abstract: Systems and methods for generating 3D representations of shape and color texture of a test surface are described. In one aspect, surface topography interferometers are equipped with a multi-element detector and an illumination system to produce a true-color image of the measured object surface. Color information can be presented as a true-color two-dimensional image or combined with topography information to form a three-dimensional representation of the shape and color texture of the object, effectively creating for a human observer the impression of looking at the actual part.

Abstract: A fine particle analyzing apparatus includes a light irradiation unit configured to irradiate a fine particle that flows in a flow path with a laser beam, and a detection unit configured to detect light emitted from the fine particle that is irradiated with the laser beam. In the fine particle analyzing apparatus, the light irradiation unit includes at least a light source that is composed of a semiconductor laser, an optical fiber that converts a beam pattern of the laser beam generated from the light source into a top-hat type beam pattern, and a light source driving control unit configured to supply driving current, which is obtained by superimposing high-frequency current on direct current, to the light source.

Abstract: The disclosure is directed to nondestructive systems and methods for simultaneously measuring active carrier concentration and thickness of one or more doped semiconductor layers. Reflectance signals may be defined as functions of active carrier concentration and thickness varying over different wavelengths and over different incidence angles of analyzing illumination reflected off the surface of an analyzed sample. Systems and methods are provided for collecting a plurality of reflectance signals having either different wavelengths or different incidence angle ranges to extract active carrier density and thickness of one or more doped semiconductor layers.

Abstract: An apparatus and method to map the body habitus, without the use of ionizing radiation, and to simultaneously track the position of an ionizing radiation imaging detector with respect to the body habitus map so that the radiotracer distribution of the patient can be fused with the body habitus map and thus provide an anatomical reference for the radiotracer distribution within the patient. A depth camera, capable of imaging a 3-dimensional surface, is attached to an ionizing radiation imaging detector where the relative position between the two is known.

Abstract: According to an example, apparatuses for performing multiple concurrent spectral analyses on a sample under test include an optical system to concurrently direct a plurality of light beams onto analytes at multiple locations on the sample under test, in which the plurality of light beams cause light in either or both of a Raman spectra and a non-Raman spectra to be emitted from the analytes at the multiple locations of the sample under test. The apparatuses also include a detector to concurrently acquire a plurality of spectral measurements of the light emitted from the analytes at the multiple locations of the sample under test. Example methods of performing spectral analysis include use of the apparatuses.

Abstract: Methods and devices provide for transmitting a series of optical signals within a range of an O-band through a U-band into a device under test comprising one or more passive optical components; measuring powers of the optical signals that propagated through the device under test; calculating wavelength-dependent insertion loss values based on the measured power of the optical signals; measuring powers of reflected portions of the optical signals that propagated through the device under test; and calculating wavelength-dependent return loss values based on the measured powers of the reflected portion of the optical signal.

Abstract: An apparatus measuring optical characteristics including position detection is disclosed. A processor is coupled to a display. A first optical sensor makes a first measurement and a second optical sensor makes a second measurement. A source of illumination provides illumination in the IR range it and the first optical sensor determine a minimal distance between the apparatus and an external object such that illumination emitted by the source is not received by the first optical sensor when the apparatus is less than the minimal distance from the external object. A position of the apparatus with respect to an object and an optical property of light received by the apparatus are determined. A transparent member having a thickness less than the minimal distance may be provided through which the source provides illumination and receives illumination external to the apparatus.

Abstract: A system for inspecting specimens such as semiconductor wafers is provided. The system provides scanning of dual-sided specimens using a diffraction grating that widens and passes nth order (n>0) wave fronts to the specimen surface and a reflective surface for each channel of the light beam. Two channels and two reflective surfaces are preferably employed, and the wavefronts are combined using a second diffraction grating and passed to a camera system having a desired aspect ratio. The system preferably comprises a damping arrangement which filters unwanted acoustic and seismic vibration, including an optics arrangement which scans a first portion of the specimen and a translation or rotation arrangement for translating or rotating the specimen to a position where the optics arrangement can scan the remaining portion(s) of the specimen. The system further includes-means for stitching scans together, providing for smaller and less expensive optical elements.