Abstract: Non-rigidly coupled, overlapping, non-feedback optical systems for spatial filtering of Fourier transform optical patterns and image shape characterization comprises a first optical subsystem that includes a lens for focusing a polarized, coherent beam to a focal point, an image input device that spatially modulates phase positioned between the lens and the focal point, and a spatial filter at the Fourier transform pattern, and a second optical subsystem overlapping the first optical subsystem includes a projection lens and a detector. The second optical subsystem is optically coupled to the first optical subsystem.

Abstract: In one aspect, the disclosure features methods that include using a microscope to direct light to a test object and to direct the light reflected from the test object to a detector, where the light includes components having orthogonal polarization states, varying an optical path length difference (OPD) between the components of the light, acquiring an interference signal from the detector while varying the OPD between the components, and determining information about the test object based on the acquired interference signal.

Abstract: Disclosed herein is a microscope system.

Abstract: An image projection system for presenting an image to a viewer comprises an electromagnetic radiation source configured to generate radiation having multiple spectral characteristics, and multiple independently operable optical switches configured to selectively transmit, reflect, and/or block radiation from the radiation source to the viewer. The viewed image is made up of pixels defined by the selective operation of the optical switches with the radiation source.

Abstract: The present invention relates to an imaging device (1) for imaging microscopic or macroscopic objects (5). The imaging device (1) comprises a light source (2), an illumination beam path (6), an imaging beam path (7) and an imaging optical means (4), in particular in the form of an objective. The illumination beam path (6) extends from the light source (2) to the object (5). The imaging beam path (7) extends from the object (5) to a detector or a tube (3). At least one polarization means (9) is provided in the illumination beam path (6), which polarization means (9) can be used to convert the light of the light source to a prescribable polarization state. An analyzer means (10) is provided in the imaging beam path (7), with the analyzer means (10) and the polarization means (9) being able to be adjusted in relation to one another in such a manner that the light entering the imaging beam path (7) cannot pass through the analyzer means (10).

Abstract: A differential interference contrast microscope (DIC microscope) suitable for inspecting a specimen inside a measurement area comprises a light source, a beam splitter, a first and second polarizer, a first and second DIC prism, a wave plate, and an image sensor, wherein the beam splitter reflects the beam generated from the light source to the measurement area, and the beam be reflected from the measurement area passes through the beam splitter to the image sensor. The first polarizer is located between the light source and the beam splitter, and the second polarizer is located between the beam splitter and the image sensor. The first DIC prism, the wave-plate and the second DIC prism are located between the beam splitter and the measurement area in order. The included angle between the principal axis of the first DIC prism and the principal axis of the second DIC prism is 90 degree.

Abstract: A particle analysis system has an optical imaging device, e.g., a reflecting light stereomicroscope, that images a particle accumulation onto a substantially planar substrate. An illuminating device that includes a ring light on a lens barrel of the stereomicroscope illuminates at least part of the particle accumulation. The system includes a polarization device with an optical polarizer and an optical analyzer, and a positioning device displacing an illuminated measurement area of the particle accumulation grid by grid. An evaluating device with an electrical adjusting device obtains and evaluates imaging data on each measurement area. The optical polarizer and the optical analyzer are adjustable using the electrical adjusting device relative to each other in two polarizer positions. The imaging device generates imaging data of the particle accumulation with the polarizer positions in a software-controlled manner on each measurement area.

Abstract: A method for performing differential interference contrast microscopy on a specimen includes collecting at least two images with illumination respectively having first and second beam-shear directions relative to a rotational orientation of the specimen, determining data associated with an intensity distribution of each of the collected images, and calculating values having a spatial distribution that is substantially independent of the rotational orientation of the specimen. A differential interference contrast microscope includes a beam-shearing assembly that includes a beam-shearing component. The beam-shearing assembly is configured to provide a variable shear vector without a movement of the beam-shearing component. A microscopy system can include the microscope and an imaging-control unit.

Abstract: A mini-scope for multi-directional imaging is disclosed. The mini-scope includes an elongated mini-scoped body. An emissions aperture is disposed on the distal end of the elongated mini-scope body, which can be configured to emit a beam of optical energy propagating through a flexible optical conductor. A selective mirror is also positioned at the distal end of the elongated mini-scope body and is configured to selectively pass or reflect the beam of optical energy based on the optical characteristics of the beam. A SSID is further disposed on the distal end of the elongated mini-scope body for imaging illumination reflected by an external object in response to the beam of optical energy. This illumination is directed to pass through or reflect from the selective mirror to the camera based on optical characteristics of the beam.

Abstract: A projection-type display apparatus that has enhanced the sense of being present by adaptively adjusting, with a simple constitution, projection illumination, depending on an image signal, without causing color changes and by increasing apparent contrast. The projection-type display apparatus includes a light source, a liquid crystal light valve that modulates light emitted from the light source by turning its light polarization plane, and a projection lens that projects the light modulated by the liquid crystal light valve onto a projection surface, wherein a pivotable light polarizer is arranged between the light source and the liquid crystal light valve. The black level of an image is adjusted by adaptively pivoting the light polarizer in response to the image signal.

Abstract: In an optical microscope, a pair of convergence/collimation lenses (5, 6) are arranged in the common optical axis of a light beam directed toward a sample (15) being observed through an objective lens (14) and a light beam radiated or reflected from the sample to pass through the objective lens respectively. A means (7) varying the phase of the transmitting light beam is varied within a specified range is provided between these lenses so that the sample is irradiated while being focused at a depth corresponding to the phase at the wave front of the light beam entering the objective lens.

Abstract: The present invention is directed to a microscope mounted into a computer, such as e.g., a desktop, workstation, or laptop. The microscope mounted into the computer has a light source component, a microscope component, and a light analysis component. The light source component is connected to the microscope component, which in turn is connected to the light analysis component. This device is advantageously compact and can be used for a variety of microscope techniques such as, e.g., epi-illumination, trans-illumination, and fluorescence microscopy.

Abstract: The present invention relates to two new wave field microscopes, type I and type II, which are distinguished by the fact that they each have an illumination and excitation system, which include at least one real and one virtual illumination source, and at least one objective lens (in the case of type II), i.e., two objective lenses (in the case of type I), with the illumination sources and objective lenses being so positioned with respect to one another that they are suited for generating one-, two-, and three-dimensional standing wave fields in the object space. The calibration method in accordance with the present invention is adapted to this wave field microscopy and permits geometric distance measurements between fluorochrome-labeled object structures, whose distance can be less than the width at half maximum intensity of the effective point spread function. The invention relates moreover to a method of wave-field microscopic DNA sequencing.

Abstract: The present invention relates to confocal self-interference microscopy. The confocal self-interference microscopy further includes a first polarizer for polarizing reflected or fluorescent light from a specimen, a first birefringence wave plate for separating the light from the first polarizer into two beams along a polarizing direction, a second polarizer for polarizing the two beams from the first birefringence wave plate, a second birefringence wave plate for separating the two beams from the second polarizer into four beams along the polarizing direction, and a third polarizer for polarizing the four beams from the second birefringence wave plate, in the existing confocal microscopy.

Abstract: The optical microscope apparatus comprises an illuminating element for emitting as illumination light a convergent beam converging at a point in space; a sample mounting table for mounting a sample in front of the converging point of illumination light; and an objective lens disposed such that the illumination light is incident thereon after light transmitted through or reflected by the sample is once converged at the converging point. The texture and state of orientation of the sample can easily be analyzed by use of the optical microscope apparatus in accordance with the present invention.

Abstract: Specularly reflected light from a convergence position on an object surface 31 enters a second critical-angle prism 14, another prism 15, and a first critical-angle prism 13 of a parallel beam selection optical system 20 in this order as a parallel beam traveling along the optical axis. The critical-angle prisms 13, 14 have critical angles of 45 degrees with respect to the wavelength of the light beam. Light beams other than the parallel light beam are removed at oblique surfaces 13a, 14a of the critical-angle prisms 13, 14, thereby allowing only the parallel light beam to exit as a regular light beam. This parallel beam is formed into a convergent light by a collimator lens 12, reflected by a half prism 11 and converged on an image pickup surface of an image pickup device 52. In this way, unnecessary noise light can be removed without placing a pin hole plate such as that placed before the image pickup plane in a confocal microscope.

Abstract: Systems and methods for producing circular extinction (CE) contrast images of anisotropic samples. Microscope systems for determining circular extinction (CE), the differential transmission of left and right circularly polarized light resulting from circular dichroism (CD) of an anisotropic sample, include mechanically driven optical components and an image detector such as a monochromatic CCD camera to detect light intensities. In one aspect, optical components include a tunable filter, a rotatable linear polarizer and a variable retarder. The tunable filter is adjustable to provide light at a specific desired wavelength. The linear polarizer is adjustable to provide linearly polarized light with a specific wave vector, and the variable retarder is adjustable to produce near perfect circular polarized light at every selected wavelength.

Abstract: In a known method for particle analysis, at least part of a particle accumulation is illuminated on a substantially planar substrate and imaged, a measurement area of the particle accumulation being displaced grid by grid, and imaging data obtained on the measurement area being evaluated with respect to particle characteristics.

Abstract: A method for performing differential interference contrast microscopy on a specimen includes collecting at least two images with illumination respectively having first and second beam-shear directions relative to a rotational orientation of the specimen, determining data associated with an intensity distribution of each of the collected images, and calculating values having a spatial distribution that is substantially independent of the rotational orientation of the specimen. A differential interference contrast microscope includes a beam-shearing assembly that includes a beam-shearing component. The beam-shearing assembly is configured to provide a variable shear vector without a movement of the beam-shearing component. A microscopy system can include the microscope and an imaging-control unit.

Abstract: An apparatus for producing an inhomogeneously polarized optical beam from a homogeneously polarized input optical beam includes a first phase shifter, a second phase shifter, and one or more polarization beam splitters. The first phase shifter shifts at least one portion of a first part of the input optical beam by a first phase. The second phase shifter shifts at least one portion of a second part of the input optical beam by substantially the first phase. The one or more polarization beam splitters split the input optical beam into the first part and the second part and combine the phase shifted portion and substantially all other portions of the first part of the input optical beam with the phase shifted portion and substantially all other portions of the second part of the input optical beam to produce the inhomogeneously polarized optical beam.

Abstract: A microscope includes an interference contrast transmitted-light device having an analyzer disposed in the microscope imaging beam path, the analyzer causing a beam deflection. A fluorescence device is provided, the fluorescence device and the interference contrast transmitted-light device being selectably and alternatively insertable into the imaging beam path. A pair of glass wedge plates are arranged behind the analyzer in the imaging direction so as to compensate to zero for the beam deflection caused by the analyzer.

Abstract: The invention is directed to a method of differential interference contrast in which the object is illuminated by natural light and the light coming from the object is first polarized after passing through the objective. The observation is carried out with a shearing interferometer which is known per se.

Abstract: A method for determining a surface quality of a substrate sample using a differential interference contrast microscope is described. The microscope includes an eyepiece, an eyepiece focus adjustment, a microscope focus adjustment, a light source, at least one of an aperture or reticule, a camera view, a prism and an eyepiece. The method includes calibrating the focus of the eyepiece with the focus of the camera and determining a peak response ratio for the microscope through adjustment of phase between differential beams of the microscope. The substrate sample is placed under the microscope, illuminated with the light source, and brought into focus with the microscope focus. Phase between differential beams is adjusted, at least one image of the substrate sample is captured and processed to determine a level of surface structure on the substrate sample.

Abstract: The present invention provides a method and apparatus for improving the signal to noise ratio, the contrast and the resolution in images recorded using an optical imaging system which produces a spatially resolved image. The method is based on the incorporation of a polarimeter into the setup and polarization calculations to produce better images. After calculating the spatially resolved Mueller matrix of a sample, images for incident light with different states of polarization were reconstructed. In a shorter method, only a polarization generator is used and the first row of the Mueller matrix is calculated. In each method, both the best and the worst images were computed. In both reflection and transmission microscope and Macroscope and ophthalmoscope modes, the best images are better than any of the original images recorded. In contrast, the worst images are poorer. This technique is useful in different fields such as confocal microscopy, Macroscopy and retinal imaging.

Abstract: A direct-view optical microscope system is provided which uses high-energy light from a phenomenon known as non-resonant Raman scattering to illuminate a living biological specimen. One embodiment of the system combines two discrete light sources to form a combined incident light source for the microscope. The system includes a method and apparatus for modulating the intensity of the scattered light when two light waves are combined to produce the incident light. By varying the frequency of the two source light waves, the intensity of the combined Raman-scattered light can be modulated to achieve finer resolution.

Abstract: A system and method of generating and acquiring phase contrast microscope images without interfering with the intensity and optical quality of other microscopy modalities employ wavelength-specific illumination and attenuation strategies for phase microscopy applications. A wavelength-specific objective phase ring that is opaque only at specific wavelengths may be used in conjunction with a phase microscopy apparatus. Attenuated wavelengths may be controlled such that opacity may be selectively provided only with respect to wavelengths that are outside of the desired range for the fluorescence signals being monitored. Illumination within the opaque wavelength range for the objective phase ring may be selected for phase microscopy applications. Accordingly, an objective phase ring effective for enabling wavelength-specific phase microscopy may not interfere with normal usage of the microscope for other applications such as, for example, fluorescence microscopy.

Abstract: A confocal microscope comprises a light source emitting a polarized light beam, an objective lens irradiating the polarized light beam, which is deflected and scanned by the optical scanner, to the sample as an excitation light beam, a wavelength separator detecting a necessary wavelength band from a polarized fluorescence emitted from the sample which is excited by the polarized light beam, and a photodetector unit having a polarization property extractor extracting a fluorescence with a predetermined polarization property from the fluorescence detected with the wavelength separator, a wavelength selector selecting a wavelength of the fluorescence extracted by the polarization property extractor, and a photodetector detecting the fluorescence selected by the wavelength selector.

Abstract: The present invention broadly comprises a device, such as a slider, for performing phase contrast microscopy, the device containing a plurality of at least three phase contrast annuli. The slider is received into a microscope condenser mounted under a microscope stage and that is adapted to receive the device and align the device such that a phase contrast annulus is aligned with an appropriate microscope objective phase ring. The invention also comprises printed or engraved indicators or other markings indicating whether the bright field aperture or a particular phase contrast annulus is in position in the illumination path of the microscope. The invention further comprises a device for preventing the removal of the device from the condenser.

Abstract: A near-field, interferometric optical microscopy system includes: a beam splitter positioned to separate an input beam into a measurement beam and a reference beam; a mask positioned to receive the measurement beam, the mask comprising at least one aperture having a dimension smaller than the wavelength of the input beam, wherein the mask aperture is configured to couple at least a portion of the measurement beam to a sample to define a near-field probe beam, the sample interacting with the near-field probe beam to define a near-field signal beam; a detector having an element responsive to optical energy; and optics positioned to direct at least a portion of the reference beam and at least a portion of the near-field signal beam to interfere at the detector element.

Abstract: A focusing system for a microscope has an objective lens, a sample stage, a reflected illumination system for generating fluorescence from a sample, a transmitted illumination system for irradiating light on the sample to capture a transmitted optical image, a set of optical elements for forming the transmitted optical image on the basis of a phase information included in light transmitted through the sample, an optical element for dividing the fluorescence image and the transmitted optical image, a sensor for capturing the transmitted optical image divided by the optical element for dividing light, a focus detecting section for detecting a focusing level of the transmitted optical image on the basis of a signal output from the sensor, and a driver for moving at least one of the objective lens and the stage to focus on the sample on the basis of the focusing level.

Abstract: A near-field, interferometric optical microscopy system includes: a beam splitter positioned to separate an input beam into a measurement beam and a reference beam; a mask positioned to receive the measurement beam, the mask comprising at least one aperture having a dimension smaller than the wavelength of the input beam, wherein the mask aperture is configured to couple at least a portion of the measurement beam to a sample to define a near-field probe beam, the sample interacting with the near-field probe beam to define a near-field signal beam; a detector having an element responsive to optical energy; and optics positioned to direct at least a portion of the reference beam and at least a portion of the near-field signal beam to interfere at the detector element.

Abstract: A reflection suppression system for suppressing reflection from scanned infrared focal plane arrays using a system of two or more blazed diffraction gratings in the path of radiations to the array.

Abstract: The quality of images produced by confocal microscopy, and especially scanning laser confocal microscopy, is enhanced especially for images obtained in turbid mediums such as many biological tissue specimens, by reducing speckle from scatterers that exist outside (above and below) the section which is being imaged by utilizing sheared beams, both of which are focused to laterally or vertically offset spots and polarizing the beams to have opposite senses of circular polarization (right and left handed circular polarization). The return light from the section of certain polarization is detected after passing through the confocal aperture of the confocal microscope. Images can be formed using optical coherence detection of the return light. Light from scatterers outside the section of interest, which are illuminated by both of the sheared beams, interfere thereby reducing speckle due to such scatterers, and particularly scatters which are adjacent to the section being imaged.

Abstract: In the transmission illumination type differential interference microscope, light in a given polarized state is separated by a first birefringent optical member 1 into two linearly polarized light components L1 and L2 and both of the polarized light components are converted into parallel light by means of a condenser lens 13. The object being examined 15 is illuminated by the polarized light components which are then converted into convergent light by an objective 16. Both of the polarized light components are then synthesized into a single light beam by a second birefringent optical element 2 and both of the polarized light components of the synthesized light beam are caused to undergo polarization interference by an analyzer 17 so that an enlarged image 18 of the object being examined 15, is formed.

Abstract: In a differential interference microscope, polarized light having a predetermined direction of oscillation is incident on a birefringent optical member so as to be separated into two linearly polarized light components having directions of oscillation orthogonal to each other, and the two linearly polarized light components thus separated are directed via an objective lens to a sample to be observed, and the two linearly polarized light components reflected from the sample are guided via the objective to the birefringent optical member so as to be synthesized into single light, and two linearly polarized light components of the synthesized light flux are caused to interfere so that an image of the sample is formed by the objective lens from the light flux that have interfered.

Abstract: A microscope is disclosed which determines a complex three-dimensional representation of an object based on a series of recordings of the light wave diffracted by the object, wherein the direction of the wave lighting of the object varies between two succesive recordings. The diffracted wave interferes with a reference wave on a receiving surface and a frequency representation of the diffracted wave is computed from interference patterns received on the receiving surface. A plurality of frequency representations of diffracted waves are then superimposed yielding a frequency representation of the object. The phase of each frequency representation of a diffracted wave is shifted in order to compensate for variations of the phase difference between the reference wave and the wave lighting of the object.

Abstract: A method for scanning microscopy is disclosed. It contains the step of generating an illuminating light beam that exhibits at least a first substantially continuous wavelength spectrum whose spectral width is greater than 5 nm; the choosing of a second wavelength spectrum that is arranged spectrally within the first wavelength spectrum; the step of selecting the light of the second wavelength spectrum out of the illuminating light beam using an acoustooptical component; and the step of illuminating a specimen with the illuminating light beam. A scanning microscope is also disclosed.

Abstract: A variable dark-field illumination method and apparatus to produce microscopic and macroscopic images with a variable dark-field effect thereby making best use of various detector response characteristics. The variable dark-field of the invention is particularly characterized by an adjustable object contrast which optimizes the use of the various detectors dynamic range. The invention is particularly useful when coupled with a video camera and for macroscopic systems having a large depth object field. The dark-fields of the art have geometries which are objectionable because those geometries have very limited depths of field. The invention is particularly distinguished from the art as the dark-field methods and apparatuses of the art are generally geometrically restrictive and they do not provide variable contrast control for input images.

Abstract: A differential interference contrast (DIC) microscope system is provided comprising: (a) an illumination source for illuminating a sample ; (b) a lens system for viewing the illuminated sample, including an objective, defining an optical axis; (c) at least one detector system for receiving a sample image; (d) mechanisms for wavelength multiplexing the shear direction or shear magnitude or both on the sample and demultiplexing the resultant DIC images on the detector; and (e) a mechanism for modulating the phase of the interference image. Various approaches are disclosed to accomplish wavelength multiplexing of shear direction and demultiplexing the two DIC images that result. It is possible for the two, wavelength multiplexed DIC images to differ in either or both shear direction or magnitude.

Abstract: The invention relates to an analyzer insert (1) in which the rotation of an adjustment wheel (2) accessible from the outside is transmitted by means of two parallel adjustment levers (8, 9) of equal length onto a rotatable analyzer (3) which can be inserted into the optical path of the microscope. The one ends (10, 11) of the adjustment levers (8, 9) are rotationally mounted at the level of the adjustment wheel (2) on bearing axles (14) near the rim while the other ends (12, 13) are mounted on the axles at the level of the analyzer holder (4). At the level of the adjustment wheel (2) and the analyzer holder (4), in relation to the axes of rotation (15, 16) of same these axles generate force levers of equal length, which are situated pairwise at a 90° angle to each other. In the 0° position of the analyzer (3) all four bearing axles (14) are situated on a straight line. The analyzer (3) can be moved into any position between 0° and 180° precisely and without slip.

Abstract: An optical apparatus and a microscope are designed so that high resolution and a high sectioning effect are provided; a time for obtaining an output image can be reduced; it is possible to observe the interior of an object in which light is strongly scattered, without using the fluorescent pigment; resistance to vibration is strong and observations can be carried out with high resolution; and a lamination structure of an IC pattern configured on a semiconductor wafer can also be observed.

Abstract: A differential interference contrast (DIC) microscope system is provided comprising: (a) an illumination source for illuminating a sample; (b) a lens system for viewing the illuminated sample, including an objective, defining an optical axis; (c) at least one detector system for receiving a sample image; (d) mechanisms for wavelength multiplexing the shear direction or shear magnitude or both on the sample and demultiplexing the resultant DIC images on the detector; and (e) a mechanism for modulating the phase of the interference image. Various approaches are disclosed to accomplish wavelength multiplexing of shear direction and demultiplexing the two DIC images that result. It is possible for the two, wavelength multiplexed DIC images to differ in either or both shear direction or magnitude.

Abstract: Optical apparatus includes a first material that causes positive birefringent retardation under physical strain and a second material that causes negative birefringent retardation under physical strain. The first and second materials are arranged along a common line of sight so that under physical strain the combination of the first and second materials causes birefringent retardation having a magnitude that is less than the magnitude of the positive retardation caused by the first material and that is less than the magnitude of the negative retardation caused by the second material.

Abstract: An optical arrangement, in particular a microscope, having a light source (1) for illuminating an object, and a glass fiber (3), arranged between the light source (1) and the object, for transporting light along a prescribable distance between the light source (1) and the object, is configured with regard to the avoidance of fluctuations in the illuminating light power without a handicap in the optical adjustment of the arrangement in such a way that the glass fiber (3) is a polarizing glass fiber (3).

Abstract: An optical element switching device is provided wherein a plurality of optical elements are held by a guide mechanism for guiding them to move straight or rotate and arranged on a turret, and positioned by a positioning part comprising a spring for pushing a ball into V grooves formed at a rotarys shaft of the turret rotated by a first motor wherein, a selected one of the optical elements is stopped in an optical path (i.e. an optical axis of objectives), and wherein the optical element is moved by a second motor along a direction in which it is guided by the guide mechanism, so that corrections such as adjustment of the contrast and the like are automatically executed at switching operations.

Abstract: An interference microscope includes an illumination optical system for making two light beams fall on a subject, an observation optical system for forming an interference image by causing interference between the two light beams from the subject, a detection unit for detecting the interference image, and a calculation unit for calculating a phase difference between the two light beams from a result of the detection by the detection unit. The two light beams contain light having a plurality of wavelengths. The detection unit detects light intensities with respect to the light having the plurality of wavelengths that is contained in the interference image. The calculation unit obtains such a wavelength as to minimize the light intensity from the light intensities of the light having the plurality of wavelengths which are detected by the detection unit, and sets, as the phase difference, a magnitude of the obtained wavelength.

Abstract: A phase contrast observation device for observing a phase object (O), and phase apertures for same. The device comprises, in order along an optical axis (AX), a light source (LS) capable of providing light (L), an illumination optical system (G2 and G3) for condensing the light and illuminating the object, an aperture stop (AP) having an aperture (AO) therein, arranged in the illumination optical system, an objective lens system (G2 and G3) for converging light from the illuminated object and forming an image of the object. The device also includes one of a number of novel phase apertures (Ph1-Ph4) arranged at a position inside said objective lens conjugate to the aperture stop. The phase apertures of the present invention allow for high-contrast and low-contrast imaging regardless of the phase content of the object.

Abstract: A scanning confocal optical device comprises a light source section, a light transmitting section, a light scanning section, a polarized-plane modulating element, a polarizing/separating element, a light detecting section and a data processing section. The light transmitting section guides light emitted from the light source section to the light scanning section, and guides returning light from the light scanning section to the light detecting section. The light scanning section scans a focused beam of light across the specimen surface. The polarized-plane modulating element comprises, for example, a &lgr;/4 plate, which is located between the light scanning section and the specimen surface. The polarizing/separating element comprises, for example, a linearly polarizing element, which is located between the light transmitting section and the light detecting section.

Abstract: A method and teaching for creating stereographic images with the use of a single lens is presented. A leading linear polarizing filter, a passive half-wave retarder, an electric switched quarter-wave retarder, and a trailing linear polarizing filter are then used in various combination to create: a 3D microscope, a 3D video adapter for microscopes, a general purpose 3D video lens, a 3D video adapter, and a 3D light-valve. A neutral density filter replaces those components to then create a 3D ocular and a 3D ocular adapter.

Abstract: A differential interference contrast microscope including an illuminating light source 61, a polarizer 62 for converting an illumination light ray into a linearly polarized light, a polarized light separating means 63 for dividing the linearly polarized light ray into two linearly polarized light rays having mutually orthogonal vibrating directions, an illuminating optical system 64, 65 for projecting the two linearly polarized light rays onto an object 66 under inspection, a polarized light combining means 69 for combining the two linearly polarized light rays on a same optical path via an inspecting optical system 67, 68, an analyzer 70 for forming a differential interference contrast image on an imaging plane 71.