Abstract: A core including a write logic IP block, a read logic IP block, a master delay IP block and an address and control IP block. The write logic IP block may be configured to communicate data from a memory controller to a double data rate (DDR) synchronous dynamic random access memory (SDRAM). The read logic IP block may be configured to communicate data from the double data rate (DDR) synchronous dynamic random access memory (SDRAM) to the memory controller. The master delay IP block may be configured to generate one or more delays for the read logic IP block. The address and control logic IP block may be configured to control the write logic IP block and the read logic IP block. The core is generally configured to couple the double data rate (DDR) synchronous dynamic random access memory (SDRAM) and the memory controller.

Abstract: There are many inventions described herein as well as many aspects and embodiments of those inventions, for example, circuitry and techniques for reading, writing and/or operating a semiconductor memory cells of a memory cell array, including electrically floating body transistors in which an electrical charge is stored in the body of the transistor. In one aspect, the present inventions are directed to one or more independently controllable parameters of a memory operation (for example, restore, write, refresh), to program or write a data state into a memory cell. In one embodiment, the parameter is the amount of time of programming or writing a predetermined data state into a memory cell. In another embodiment, the controllable parameter is the amplitude of the voltage of the control signals applied to the gate, drain region and/or source region during programming or writing a predetermined data state into a memory cell. Indeed, the controllable parameters may be both temporal and voltage amplitude.

Abstract: A memory includes a row address latch. The row address latch includes a first stage configured to latch a row address for a memory read or write operation, and a second stage configured to latch a row address for a memory bank auto-refresh. The row address latch provides the row address from the first stage in response to an activate command and provides the row address from the second stage in response to a directed auto-refresh command.

Abstract: An exemplary amplifier circuit includes a first group of spatially distributed final amplifier stages having a first configuration, and a second group of spatially distributed final amplifier stages having a second configuration different than the first configuration. Both groups share the same control node for their respective final amplifier stages, and both groups share the same amplifier output node. Each group is typically enabled at a time that the other is disabled. In certain embodiments incorporating a memory array, only one critical analog node must be routed throughout the memory array.

Abstract: A random access memory system has a memory controller, a first memory device, a second memory device, and a memory bus. The memory controller is configured to control access to a plurality of memory devices. The memory bus is configured to alternatively couple the memory controller to the first memory device and to couple the memory controller to the second memory.

Abstract: Level control signals are both set to H level, and potentials of power supply lines are both set to be lower than a power supply potential. In this manner, a gate leakage current during waiting and writing operation of a memory cell array can significantly be reduced. The level control signals are set to L level and H level respectively, and solely the potential of one of the power supply lines is set to be lower than the power supply potential. In this manner, power consumption during a reading operation of the memory cell array can be reduced.

Abstract: A semiconductor memory includes memory cells for even addresses arranged in a first memory array and storing even addressed data, word lines for even addresses arranged parallel to a row direction of the first memory array and selecting the memory cells for even addresses, bit lines for even addresses arranged parallel to a column direction of the first memory array and transferring the even addressed data to the memory cells for even addresses, memory cells for odd addresses arranged in a second memory array and storing odd addressed data, word lines for odd addresses arranged parallel to a row direction of the second memory array and selecting the memory cells for odd addresses, and bit lines for odd addresses arranged parallel to a column direction of the second memory array and transferring the odd addressed data to the memory cells for odd addresses.

Abstract: Reducing power consumption of a semiconductor memory device having a serial interface is disclosed. After parallel read-out data from a memory-cell matrix 14 are held in a data latch 17, the parallel read-out data are selected sequentially by a serial output selector 18 according to timing signals SL0-SL15 from a controller 20 and are outputted serially from an output buffer 19 as an output data DO. In an activating control unit 23, outputting an operation control signal AC to a gate-voltage generating unit 21, a drain-voltage generating unit 22, and a sense amplifier 16 is being halted during from when a timing signal SL0 is finished to when a timing SL10 is finished. Consequently, during the above mentioned period, the unnecessary operations of the gate-voltage generating unit 21, the drain-voltage generating unit 22, and the sense amplifier 16 are being halted and then the power consumption thereof can be reduced.

Abstract: Methods and apparatus are provided for read/write control and bit selection with false read suppression in an SRAM. According to one aspect of the invention, a bit select circuit is provided for an SRAM. The disclosed bit select circuit includes one or more transistors controlled by a write control gate signal to prevent data from being read from one or more data cells during a write operation. The transistors can include, for example, a pair of gated transistors controlled by the write control gate signal. The write control gate signal prevents data from being read from one or more data cells while the write control gate signal is in a predefined state.

Abstract: Method and device for reading data from a semiconductor device, where tR is a read operation time, tT is a buffer transfer time, and tH is a host transfer time, where at least two of tR, tT, and tH may be overlapped to reduce a total transfer time.

Abstract: A hardware implemented method for resolving collisions of memory addresses of a memory array is provided. In this hardware implemented method, a read memory address is compared with a write memory address. If the read and write memory addresses match, write data is directed from a data input to a data output, whereby the data input is further configured to input the write data to the memory array. A system and a memory chip for resolving collisions of memory addresses of a memory array are also described.

Abstract: An integrated circuit comprising a memory cell array capable of simultaneously performing data read and write operations is provided. The integrated circuit to which inputs and outputs (IOs) are separately provided and to which a write address and a read address are simultaneously input during one period of a clock signal comprises a plurality of memory blocks, the memory blocks comprising a plurality of sub-memory blocks, a plurality of data memory blocks corresponding to the memory blocks, and a tag memory controlling unit, which writes data to the memory blocks or reads data from the memory blocks in response to the write address or the read address, wherein access to the same sub-memory block is not simultaneously performed when the write address and the read address are the same.

Abstract: An integrated circuit device includes a RAM block including a plurality of wordlines WL, a plurality of bitlines BL, a plurality of memory cells MC, wordline control circuit, and a data read control circuit, and a data line driver block which drives a plurality of data line groups of a display panel based on data supplied from the RAM block. The data read control circuit reads data for pixels corresponding to the signal lines by N (N is an integer larger than one) times reading in one horizontal scan period 1 H of the display panel. The data line driver block includes first to N-th divided data line driver blocks, each of which drives a different data line group of the data line groups and is disposed along a first direction X in which the bitlines BL extend.

Abstract: A dual-plane type flash memory device having a random program function and program operation method thereof. The flash memory device includes a first plane, a second plane, a first X-decoder, and a second X-decoder. The first plane includes first memory blocks sequentially arranged in a row direction. The second plane includes second memory blocks sequentially arranged in a row direction. The first X-decoder activates one of the first memory blocks in response to a first block address signal. The second X-decoder activates one of the second memory blocks in response to a second block address signal. The block activated by the first X-decoder of the first memory block is different from the block activated by the second X-decoder of the second memory blocks. Accordingly, during a program operation, memory blocks of two planes having different block addresses can be selected and programmed. Accordingly, the operational performance of the flash memory device can be enhanced.

Abstract: Methods and structures utilizing multiple configuration bitstreams to program integrated circuits (ICs) such as programmable logic devices (PLDs), thereby enabling the utilization of partially defective ICs. A user design is implemented two or more times, preferably utilizing different programmable resources as much as possible in each configuration bitstream. The resulting configuration bitstreams are stored in a memory device such as a programmable read-only memory (PROM). Under the control of a configuration control circuit or device, the various bitstreams are sequentially loaded into a partially defective IC and tested using an automated testing procedure. When a bitstream is found that enables the design to function correctly in the programmed IC, i.e., that avoids the defective programmable resources in the IC, the automated testing procedure terminates, and the programmed IC begins to function according to the user design as determined by the last programmed bitstream.

Abstract: A semiconductor memory device is capable of simultaneously carrying out a first operation and a second operation. The semiconductor memory device includes first and second control circuits, a select control circuit, and a select circuit. The first control circuit controls the first operation according to a first address signal and outputs a read start signal when the reading of the data is started. The second control circuit controls the second operation according to a second address signal and outputs a sequence flag when the first and second addresses coincide with each other. The select control circuit generates a select control signal. The select control signal is asserted if the second operation is carried out. The first control circuit instructs the select circuit to select the sequence flag if the select control signal is asserted or the data if the select control signal is negated.

Abstract: A memory device, system and method for allowing an early read operation after one or more write operations is provided according to an embodiment of the present invention. The memory device comprises an interface for providing a first write address, a first write data, and a read address. A memory core is coupled to the interface and includes a first memory section having a first data path and a first address path and a second memory section having a second data path and a second address path. In an embodiment of the present invention, the first data and first address path is independent of the second data and second address path. The first write data is provided on the first data path responsive to the first write address being provided on the first address path while a read data is provided on the second data path responsive to the read address being provided on the second address path.

Abstract: A method of operating a memory system including a plurality of memory devices coupled to a command address bus may be provided. In particular, a first memory device of the plurality of memory devices may be set to a first operating mode, and a second memory device of the plurality of memory devices may be set to a second operating mode different than the first operating mode. In addition, a read/write operation may be performed responsive to a read/write command address signal provided over the command address bus to the plurality of memory devices so that the first memory device operates according to the first operating mode during the read/write operation and so that the second memory device operates according to the second operating mode during the read/write operation. Related systems are also discussed.

Abstract: A method for providing a deglitching circuit for a radiation tolerant static random access memory (SRAM) comprising: providing a configuration memory having a plurality of configuration bits; coupling read and write circuitry to the configuration memory for configuring the plurality of configuration bits; coupling a radiation hard latch to a programmable element, the radiation hard latch controlling the programmable element; and providing an interface that couples at least one of the plurality of configuration bits to the radiation hard latch when the write circuitry writes to the at least one of the plurality of configuration bits.

Abstract: A resistive type memory system provides improved read access with multiple ports. The resistive type memory system includes a plurality of resistive type memory cells arranged in an array. Each of the resistive type memory cells has a corresponding first port and a corresponding second port. Each first port enables both read access and write access to the corresponding resistive type memory cell. Additionally, each second port enables read access to the corresponding MRAM cell. Furthermore, the memory system enables overlapping read or write access, with another read access.

Abstract: In an improved construction of a memory device, the memory device includes a first group of pins via which a command/address signals are received and via which data signals are received, and a second group of pins via which the command/address signals are received and via which data signals are output. When the data signals are input to the first group of pins, the command/address signals are received via the second group of pins. When the data signals are output from the second group of pins, the command/address signals are received via the first group of pins.

Abstract: Reading a plurality of consecutive entries and writing a plurality of consecutive entries with only one read address and one write address using a 2Read/2Write register file is provided. In one exemplary embodiment, a 64 entry register file array is partitioned into four sub-arrays. Each sub-array contains sixteen entries having one or more 2Read/2Write SRAM cells. A mechanism to write the consecutive entries by only having a 4 to 16 decode of one address is also provided. In addition, a mechanism for reading data from the register file array using a starting read word address and two read word lines generated based on the starting read word address is provided. The two read word lines are used to access the two read ports of the entries in the sub-arrays.

Abstract: A method for dual I/O data read in an integrated circuit which includes a serial peripheral interface memory device. In an embodiment, the memory device includes a clock signal, a plurality of pins, and a configuration register. In an embodiment, the configuration register includes a wait cycle count. The method includes transmitting a read address to the memory device using a first input/output pin and a second input/output pin concurrently. In an embodiment, the read address includes at least a first address bit and a second address bit, the first address bit being transmitted using the first input/output pin, and the second address bit being transmitted using the second input/output pin. The method includes accessing the memory device for data associated with the address and waiting a predetermined number clock cycles associated with the wait cycle count. The method includes transferring the data from the memory device using the first input/output pin and the second input/output pin concurrently.

Abstract: A system, method and program product for determining a relative amount of usage of a data retaining device are disclosed. A charge storing device is coupled to a data retaining device in a manner that a use of the data retaining device triggers a charging of the charge storing device. In a period that the data retaining device idles, charges in the charge storing device decay due to natural means. As such, a potential of the charge storing device may be used to indicate an amount of usage of the data retaining device. A comparison of the potentials of two charge storing devices coupled one-to-one to two data retaining devices may be used as a basis to determine a relative amount of usage of each of the two data retaining devices comparing to the other.

Abstract: A first set of configuration logic is configurable to provide a first port input clock signal for controlling input registers of a first port of a memory block. The first set of configuration logic is also configurable to provide a first port core clock signal for controlling the memory block core. The first port core clock signal can either be the same as the first port input clock signal, or can be controlled independently from the first port input clock signal. A second set of configuration logic is configurable to provide a second port input clock signal for controlling input registers of a second port of the memory block. The second set of configuration logic is also configurable to provide a second port core clock signal for controlling the memory block core. The second port core clock signal can be controlled independently from the second port input clock signal.

Abstract: A semiconductor integrated circuit device with reduced consumption current is provided. A first step-down circuit stationarily forms internal voltage lower than supply voltage supplied through an external terminal. A second step-down circuit is switched between first mode and second mode according to control signals. In first mode, the internal voltage is formed from the supply voltage supplied through the external terminal and is outputted through a second output terminal. In second mode, operating current for a control system that forms the internal voltage is interrupted and an output high impedance state is established. The first output terminal of the first step-down circuit and the second output terminal of the second step-down circuit are connected in common, and the internal voltage is supplied to internal circuits.

Abstract: A non-volatile semiconductor memory device comprising a plurality of non-volatile semiconductor memory cells, an interface making data exchange with an external device to write/read data with respect to the non-volatile semiconductor memory cells, and a control circuit for controlling the non-volatile semiconductor memory cells, wherein the interface and the control circuit include a first read mode initialized via a first bootstrap to read data from the non-volatile semiconductor memory cells for continuously outputting (N+M)-byte (N is the n-th power of 2, n is positive integers) data via the interface, and a second read mode initialized via a second bootstrap to read data from the non-volatile semiconductor memory cells for continuously outputting K-byte (K is the k-th power of 2, k is positive integers) data via the interface.

Abstract: An apparatus and method for storage and retrieval of memory content including a storage structure containing a plurality of memory elements addressable as a two-dimensional array of memory content values, a reading circuit capable of retrieving the memory content values from a region of the two-dimensional array varying in size according to the desired memory readout resolution, an aggregating circuit capable of totaling the memory content values of the memory elements addressed by the reading circuit to produce an aggregate memory content value and a normalizing circuit capable of scaling the aggregate memory content value according to the number of memory elements in the contiguous region to produce an average memory content value of the desired memory readout resolution.

Abstract: An array of non-volatiel memory cells arranged in logical columns and logical rows, and associated circuitry to enable reading or writing one or more memory cells on a row in parallel. In some embodiments, the array of memory cells may include a phase change material. In some embodiments, the circuitry may include a write driver, a read driver, a sense amplifier, and circuitry to isolate the memory cells from the sense amplifier with extended refresh.

Abstract: A semiconductor memory device including a memory cell without a capacitor includes: a memory cell array block including first memory cells connected between a first bit line and first word lines and second memory cells connected between a second bit line and second word lines; and a reference memory cell array block including first reference memory cells connected between a first reference bit line connected to the first bit line and a first reference word line and second reference memory cells connected between a second reference bit line connected to the second bit line and a second reference word line. When the first word lines are selected, the second reference memory cells are selected, and when the second word lines are selected, the first reference memory cells are selected. Thus, each bit line includes a reference memory cell and outputs reference signal from the reference memory cell so that data can be precisely sensed during a read operation.

Abstract: This invention discloses a dual port static random access memory (SRAM) cell, which comprises at least one inverter coupled between a positive supply voltage (Vcc) and a complementary low supply voltage (Vss) and having an input and an output terminals, at least one PMOS transistor with its gate, source and drain connected to the output terminal, Vcc and input terminal, respectively, a write port connected to the input terminal and having a write-word-line, a write-enable and a write-bit-line, and a read port connected to either the input or output terminal and having a read-word-line and a read-bit-line.

Abstract: A semiconductor memory device includes a column enable signal generator, a row enable signal generator and a final column enable signal generator. The column signal enable generator may generate a latency control signal and generating a buffered clock signal as a column enable signal in response to the latency control signal. The row enable signal generator may generate a row enable signal. The final column enable signal generator may generate a first signal in response to the column enable signal, a second signal in response to the row enable signal, and may output the first and/or the second signal as a final column enable signal.

Abstract: A non-volatile memory device comprises a plurality of bit lines extending in a first direction, a plurality of word lines extending in a second direction substantially perpendicular to the first direction, a plurality of memory cells provided respectively so as to correspond to the positions of the intersections between the plurality of bit lines and the plurality of word lines, a plurality of source lines corresponding to a plurality of memory cells which are connected to a same bit line, a current source capable of supplying the constant current to a selected memory cell and the corresponding bit line and a voltage control circuit which keeps a voltage of a selected bit line equal to or higher than a predetermined voltage.

Abstract: A memory includes a column segment including memory cells along word lines, and a parity generation circuit configured to receive a first serial data stream of data bit values stored in memory cells along a word line and determine a first parity value of the first serial data stream upon entry of self refresh.

Abstract: Disclosed is a semiconductor memory device which comprises an internal clock generating circuit receiving a clock signal from outside to generate an internal clock signal to be supplied to a random access memory. The internal clock generating circuit includes a circuit for canceling internal clock generation for generating a signal activating an internal clock signal during operation based on an external clock signal, a chip select signal and a write enable signal, and a circuit for setting the internal clock signal based on an output of the circuit for canceling internal clock generation and for resetting the internal clock signal based on an internal clock reset signal. A dummy cycle is provided next to a write cycle.

Abstract: A nonvolatile memory array includes a grid of word lines WL1, . . . ,WL6 and bit lines BL1, . . . ,BL8. Of a plurality of memory cells 210, each memory cell is located at an intersection region of one of the word lines and one of the bit lines. A read/write circuit 280 for reading/writing a data word including a plurality of bits is operative to map each pair of sequential bits of the data word to a respective pair of memory cells located at intersection regions of both a different word line and a different bit line.

Abstract: A semiconductor device includes: a plurality of memory macros, each of which includes a plurality of memory cells, is activated in accordance with a corresponding active macro selection signal, and operates in an active mode according to a corresponding active mode control signal; and a control unit for generating and outputting, in accordance with an input operation mode control signal, the active macro selection signals and the active mode control signals that correspond to the respective memory macros, so that two or more of the memory macros are activated simultaneously.

Abstract: Shifts in the apparent charge stored on a floating gate of a non-volatile memory cell can occur because of coupling of an electric field based on the charge stored in adjacent floating gates. The shift in apparent charge can lead to erroneous readings by raising the apparent threshold voltage, and consequently, lowering the sensed conduction current of a memory cell. The read process for a selected memory cell takes into account the state of one or more adjacent memory cells. If an adjacent memory cell is in one or more of a predetermined set of programmed states, a compensation current can be provided to increase the apparent conduction current of the selected memory cell. An initialization voltage is provided to the bit line of the programmed adjacent memory cell to induce a compensation current between the bit line of the programmed adjacent memory cell and the bit line of the selected memory cell.

Abstract: The present invention makes it possible to inexpensively and quickly execute a process of rewriting data stored in a memory, thus reducing the power consumption of an information processing apparatus. In connection with a conventional Read-Modify-Write function, an information processing apparatus 1 first issues a write instruction, and after all the write commands in the write instruction have been issued, issues read commands from the read instruction. That is, the read commands are issued immediately after the write commands without issuing a precharge command from the write instruction or an active command from the read instruction. This serves to avoid executing the precharge and active commands between instructions which commands are unwanted for accesses to the same row address. The adverse effect of a CAS latency can also be avoided. Therefore, it is possible to inexpensively and quickly execute the process of rewriting data stored in the memory.

Abstract: A magnetic field H1 in the hard-axis direction and a magnetic field H2 in the easy-axis direction are caused to simultaneously act on a MTJ element having an ideal asteroid curve, thereby reversing the magnetizing direction of the storing layer of the MTJ element. When the actual asteroid curve shifts in the hard-axis direction by Ho, a corrected synthesized magnetic field ({right arrow over (H1)}+{right arrow over (H2)}+{right arrow over (Ho)}) is generated in write operation to reliably reverse the magnetizing direction. The corrected synthesized magnetic field can easily be generated by individually controlling a write word/bit line current on the basis of programmed setting data.

Abstract: An integrated circuit digital device is coupled to a memory with a single-node data, address and control bus. The memory may be a non-volatile memory and/or volatile memory. The memory may be packaged in a low pin count integrated circuit package. The memory integrated circuit package may have a ground terminal, VSS; a power terminal, VDD or VCC; and a bidirectional serial input-output (I/O) terminal, SCIO. Memory block address set-up may be performed via software instructions through the SCIO terminal. In addition, hardwired memory block address selection terminals A0 and A1 may be used when more then three terminals are available on the memory integrated circuit package. The memory may have active pull-up and pull-down drivers coupled to the single-node data, address and control bus.

Abstract: Embodiments of the present invention include a data output circuit that can read data in parallel from a plurality of latches in a pipeline circuit. Even-numbered data and odd-numbered data are simultaneously output over a single clock cycle, and are then converted into DDR data and are then serially output. By moving data in this manner, embodiments of the invention can reduce the number of necessary control signals by as much as 50% over conventional data output circuits.

Abstract: In a method for repairing a memory component, data retention times of regular memory cells are determined. Weak regular memory cells having a data retention time that is shorter than a predetermined limit value are determined. A device is programmed in such a manner that a write or read access to the weak regular memory cell is simultaneously also effected for a redundant memory cell in order to jointly read from, or write to, the weak regular memory cell and the redundant memory cell.

Abstract: An improved on-chip storage memory and method for storing variable data bits, the memory including an on-chip storage memory system for storing variable data bits that has a memory for storing data bits, a wrapper for converting the memory into a first-in first-out (FIFO) memory, and a controller for performing operations on the memory. In operation, the memory is converted into a FIFO memory after storing data, and output logic selects data to be output in a serial manner.

Abstract: A nonvolatile memory apparatus which includes plural memories one of which is a nonvolatile memory such as a Flash EEPROM capable of being specified a plurality of operations from a processing unit of the apparatus including an erase operation, the erase operation in the nonvolatile memory performs a threshold voltage moving operation and a verify operation, and the nonvolatile memory is capable of releasing the I/O bus during the erase operation to thereby allow accessing of other memories and/or system components. For example, during this erase operation, the Flash EEPROM is able to free the I/O data terminal such that the EEPROM becomes electrically isolated from the CPU. The CPU is then able to perform data processing by the system bus where information can then be transferred/received such as between other memories, e.g., ROM and RAM, and otherwise with the I/O port.

Abstract: A combination volatile and nonvolatile memory integrated circuit has at least one volatile memory array placed on the substrate and multiple nonvolatile memory arrays. The volatile and nonvolatile memory arrays have address space associated with each other such that each array may be addressed with common addressing signals. The combination volatile and nonvolatile memory integrated circuit further has a memory control circuit in communication with external circuitry to receive address, command, and data signals. The memory control circuit interprets the address, command, and data signals, and for transfer to the volatile memory array and the nonvolatile memory arrays for reading, writing, programming, and erasing the volatile and nonvolatile memory arrays. The volatile memory array is may be a SRAM, a pseudo SRAM, or a DRAM. Any of the nonvolatile memory arrays maybe masked programmed ROM arrays, NAND configured flash memory NAND configured EEPROM.

Abstract: A method of operating a memory system including a plurality of memory devices coupled to a command address bus may be provided. In particular, a first memory device of the plurality of memory devices may be set to a first operating mode, and a second memory device of the plurality of memory devices may be set to a second operating mode different than the first operating mode. In addition, a read/write operation may be performed responsive to a read/write command address signal provided over the command address bus to the plurality of memory devices so that the first memory device operates according to the first operating mode during the read/write operation and so that the second memory device operates according to the second operating mode during the read/write operation. Related systems are also discussed.

Abstract: An enhanced DRAM contains embedded row registers in the form of latches. The row registers are adjacent to the DRAM array, and when the DRAM comprises a group of subarrays, the row registers are located between DRAM subarrays. When used as on-chip cache, these registers hold frequently accessed data. This data corresponds to data stored in the DRAM at a particular address. When an address is supplied to the DRAM, it is compared to the address of the data stored in the cache. If the addresses are the same, then the cache data is read at SRAM speeds. The DRAM is decoupled from this read. The DRAM also remains idle during this cache read unless the system opts to precharge or refresh the DRAM. Refresh or precharge occur concurrently with the cache read. If the addresses are not the same, then the DRAM is accessed and the embedded register is reloaded with the data at that new DRAM address.

Abstract: A semiconductor memory such as a dynamic RAM having memory mats each divided into a plurality of units or sub-memory mats. Each sub-memory mat comprises: a memory array having sub-word lines and sub-bit lines intersecting orthogonally and dynamic memory cells located in lattice fashion at the intersection points between the intersecting sub-word and sub-bit lines; a sub-word line driver including unit sub-word line driving circuits corresponding to the sub-word lines; a sense amplifier including unit amplifier circuits and column selection switches corresponding to the sub-bit lines; and sub-common I/O lines to which designated sub-bit lines are connected selectively via the column selection switches. The sub-memory mats are arranged in lattice fashion.

Abstract: A RAM with programmable data port configuration provides for programmable configuration of RAM data ports, and in the case of a multiport RAM, for independent programmable configuration of each data port. A single programmable RAM cell can be utilized in a variety of data port configurations, thereby reducing the number of combinations necessary in a standard cell library or gate array in implement the every possible configuration. In one embodiment of the invention, a dual port RAM is provided with a decoder, an input multiplexer and an output multiplexer for each data port. The input multiplexer for each data port provides several different selectable mappings of a RAM input word of varying sizes to the input bit lines of the respective data port. Similarly, the output multiplexer for each data port provides several different selectable mappings of the RAM output bit lines to the RAM output word.