Abstract: A method to read and write at least one static memory cell is provided, said cell comprising a cross-coupled inverter pair and two pass-devices wherein said method is characterized in that during read only one of the two pass-devices is selected, while for write both pass-devices are selected. Furthermore, a circuit to read and write at least one static memory cell is described, said cell comprising a cross-coupled inverter pair and two pass-devices. Said circuit is characterized in that for each pass-device of the cell an individual wordline is connected with a gate of the particular pass-device, wherein both wordlines are selected for write and a single wordline is selected for read.

Abstract: A static random access memory (SRAM) cell having a dedicated read port separated from a write port comprises a first and a second bit-line placed in parallel forming a complimentary bit-line pair for the dedicated read port, a first and second metal line adjacently flanking in both side of and in parallel to the first bit-line, the first and second metal line being formed in the same metal layer as the first bit-line and having a first and second predetermined distance to the first bit-line, respectively, and a third and fourth metal line adjacently flanking in both side of and in parallel to the second bit-line, the third and fourth metal line being formed in the same metal layer as the second bit-line and having a third and fourth predetermined distance to the second bit-line, respectively, wherein the first predetermined distance is equal to the third distance and the second predetermined distance is equal to the fourth distance for keeping the first and second bit-lines having balanced capacitance loading

Abstract: A semiconductor memory device includes a read bus line for transferring read data; a write bus line for transferring write data; and a temporary data storage unit connected between the read bus line and the write bus line and controlled by a test mode signal enabled during a test mode.

Abstract: A semiconductor integrated circuit includes a first region configured to operate at a specified first voltage, a second region configured to operate at a varying second voltage, and a memory device formed between the first region and the second region so as to straddle the first and second regions, wherein the memory device comprises a first port driven at the first voltage to transmit an output signal to and receive an input signal from the first region, a second port driven at the second voltage to transmit an output signal to and receive an input signal from the second region, and a memory cell accessed by the first and second ports.

Abstract: A dual port memory device converts an address and a control signal, which are inputted via a first port and conform to a first type memory interface, into an address and a control signal which conform to a second type memory interface, to access a memory array. The dual port memory device accesses a memory array based on an address and a control signal which are inputted via a second port and conform to the second type memory interface. The dual port memory device accesses a memory array according to the first type memory interface or the second type memory interface in response to a selecting signal. Therefore, the dual port memory device can be coupled to a processor with a first interface (e.g., PSRAM or SRAM interface) and a processor with a second interface (e.g., SDRAM interface).

Abstract: A multi-port memory device having a storage node, a precharge node, a first, second, third, and fourth transistor, and a control module. The first transistor includes a current electrode connected to the storage node, another current electrode connected to a first bit line, and a gate connected to a first wordline. The second transistor includes a current electrode connected to the storage node, another current electrode connected to a second bit line, and a gate connected to a second wordline. The third transistor includes a current electrode connected to the reference node, another current electrode connected to the first bit line, and a gate. The fourth transistor includes a current electrode connected to the precharge node, another current electrode connected to the second bit line, and a gate. The control module deactivates the fourth transistor in response to a dummy access of the first storage module at the second transistor.

Abstract: A multi-port semiconductor memory device having variable access paths and a method therefor are provided. The semiconductor memory device includes a plurality of input/output ports; a memory array divided into a plurality of memory areas; and a select control unit to variably control access paths between the memory areas and the input/output ports so that each memory area is accessed through at least one of the input/output ports.

Abstract: A memory cell mat is divided into a plurality of entries, and an arithmetic logic unit is arranged corresponding to each entry. Between the entries and the corresponding arithmetic logic units, arithmetic/logic operation is executed in bit-serial and entry-parallel manner. Where parallel operation is not very effective, data is transferred in entry-serial and bit-parallel manner to a group of processors provided at a lower portion of the memory mat. In this manner, a large amount of data can be processed at high speed regardless of the contents of operation or data bit width.

Abstract: A system includes an interconnect within an integrated circuit, and a first fuse-disabled design block within the integrated circuit that has an internal static random access memory (SRAM). The first fuse-disabled design block is coupled to the interconnect. The system also includes a memory controller that is coupled to the interconnect. The memory controller is capable of selecting the internal SRAM and allocating the internal SRAM for storage accessible by one or more devices external to the first fuse-disabled integrated peripheral.

Abstract: The multi-port memory device includes a mode input/output controller for receiving a flag signal and generating a self-refresh entry signal and a self-refresh escape signal, a refresh interval signal generator for providing a self-refresh interval signal notifying a self-refresh interval in response to the self-refresh entry signal and the self-refresh escape signal, a refresh cycle signal generator for periodically generating a cycle-pulse signal during an activation of the self-refresh interval signal, an internal refresh signal generator for producing an internal refresh signal in response to the self-refresh entry signal and the cycle-pulse signal, and an internal address counter for generating an internal address in response to the internal refresh signal.

Abstract: A multi-port volatile memory device can include a first port that is configured for data transfer to/from an external host system and the device. A volatile main memory core is configured to store data received thereat and read requested stored data thereform. A volatile sub memory core can be configured to store data received thereat and read requested stored data therefrom. A main interface circuit can be coupled to the first port and can be configured to provide data to/from the volatile main memory core and the first port in a master mode and can be configured to provide data to/from the volatile sub memory core and the first port in a slave mode. A second port can be configured for data transfer to/from an external non-volatile memory device and the device and a sub interface circuit can be coupled to the second port and configured to provide data to/from the volatile sub memory core and the second port in the slave mode.

Abstract: An integrated circuit. The integrated circuit includes a plurality of memory requesters and a memory supercell. The memory supercell includes a plurality of memory banks each of which forms a respective range of separately addressable storage locations, wherein the memory supercell is organized into a plurality of bank groups. Each of the plurality of bank groups includes a subset of the plurality of memory banks and a corresponding dedicated access port. The integrated circuit further includes a switch coupled between the plurality of memory requesters and the memory supercell. The switch is configured, responsive to a memory request by a given one of the plurality of memory requesters, to connect a data path between the given memory requester and the dedicated access port of a particular one of the bank groups addressed by the memory request.

Abstract: A memory with a write port configured for double-pump writes. The memory includes a first and second memory locations each having one or more bit cells, and one or more bit lines each coupled to corresponding ones of the bit cells. A write port is coupled to each of the bit lines. Selection circuitry, responsive to a first clock edge, latches first data from a first data path through the write port, and responsive to a second clock edge, latches second data from a second data path through the write port. A first pulse is generated during a first phase of the clock signal to cause writing of the first data into the first memory location. A second pulse is generated during a second phase of the clock signal to cause writing of the second data into the second memory location.

Abstract: A multi-port memory device includes a plurality ports, a plurality of banks, a plurality of global data buses, first and second I/O controllers, and a test input/output (I/O) controller. The ports perform a serial I/O data transmission. The banks perform a parallel I/O data transmission with the ports. The global data buses are employed for transmitting data between the ports and the banks. The first I/O controller controls a serial data transmission between the ports and external devices. The second I/O controller controls a parallel data transmission between the ports and the global buses. The test I/O controller generates test commands based on a test command/address (C/A) inputted from the external devices and transmits a test I/O data with the global data bus during a test operation mode.

Abstract: An integrated circuit having a plurality of sectors is disclosed. One embodiment includes a sector driver for simultaneously driving word lines corresponding to a single sector, the sector driver being connected to each word line and comprising a programmable sector memory for storing the sectors and word lines corresponding to each sector.

Abstract: A switch 100 includes a plurality of ports 101 for exchanging data. A shared memory 102 enables the exchange of data between first and second ones of the ports 101 and includes an array 202 of memory cells arranged as a plurality of rows and a single column having width equal to a predetermined word-width and circuitry 202, 204, 206, 208 for writing selected data presented at the first one of the ports 101 to a selected row in the array as a word of the predetermined word-width during a first time period and for reading the selected data from the selected row as a word of the predetermined wordwidth during a second time period for output at a second one of the ports 101.

Abstract: A pseudo-dual port memory address multiplexing system includes a control circuit operative to identify a read request and a write request to be accomplished during a single clock cycle. A self time tracking circuit monitors a read operation and generates a switching signal when the read operation is determined to be complete. A multiplexer is responsive to the switching signal for selectively providing a read address and a write address to a memory address unit at the proper time.

Abstract: The present invention relates to a multi-port register file memory or SRAM including a plurality of storage elements and other circuitry that operate synchronously or asynchronously. The storage elements are arranged in rows and columns and store data. Two read port pairs are coupled to each of the storage elements and a differential sensing device or circuit. The read port is coupled to the storage elements in an isolated manner, enabling a plurality of cells to be arranged in such rows and columns. The sensing device is adapted to sense a small voltage swing. A column mux circuit is coupled to each column and the sensing device. Performance is not degraded unusually as the power supply voltage is reduced due to bus drop or inductive effects.

Abstract: Embodiments of the present invention are directed to memory subsystems implemented within, or connected to and accessed by, parallel, pipelined, integrated-circuit implementations of computational engines designed to solve complex computational problems. Additional embodiments of the present invention are directed to memory subsystems implemented within, or connected to and accessed by, a variety of different types of electronic devices. One embodiment of the present invention comprises a memory controller implemented in a first integrated circuit or other electronic system and one or more separate memory devices. Alternative embodiments of the present invention incorporate the memory controller within one or more memory devices that are connected to, and accessed by, an integrated-circuit-implemented computational engine or another electronic device.

Abstract: The invention relates to a dual-threshold-voltage two-port sub-threshold SRAM cell apparatus. The above-mentioned apparatus comprises a first inverter, a second inverter, an access transistor and a read buffer. The first inverter and the second inverter include a plurality of first operating elements and a plurality of second operating elements for storing data. The access transistor is coupled to the first inverter and the second inverter, wherein the first operating elements and the second operating elements are high threshold voltage operating elements and the access transistor is low threshold voltage operating transistor. The read buffer is used for performing a read operation.

Abstract: An N-port memory architecture is disclosed that stores multi-dimensional arrays so that: (1) N contiguous elements in a row can be accessed without blocking, (2) N contiguous elements in a column can be accessed without blocking, (3) some N-element two-dimensional sub-arrays can be accessed without blocking, and (4) all N/2-element two-dimensional sub-arrays can be accessed without blocking. Second, the architecture has been modified so that the above can happen and that any element can be accessed on any data port. The architecture is particularly advantageous for loading and unloading data into the vector registers of a single-instruction, multiple-data processor, such as that used for video decoding.

Abstract: A programmable precharge circuit includes a plurality of transistors. Each transistor has a different threshold voltage from other transistors of the plurality of transistors. Each transistor is configured to connect a supply voltage to a node, and the node is selectively coupled to bitlines in accordance with a memory operation. Control logic is configured to enable at least one of the plurality of transistors to provide a programmable precharge voltage to the node in accordance with a respective threshold voltage drop from the supply voltage of one of the plurality of transistors.

Abstract: A semiconductor device that can implement a method comprising selecting a group of rows of auxiliary cells forming part of an auxiliary memory unit, the auxiliary cells being arranged into rows and columns; driving a plurality of bitlines each connected to a respective column of the auxiliary cells, so as to set each of the auxiliary cells to a first logic state; writing input data to selected ones of a plurality of main cells, wherein each of the auxiliary cells corresponds to a respective set of the main cells; selecting a particular row of auxiliary cells that includes at least one auxiliary cell whose corresponding main cells are among the selected cells; and driving the bitlines so as to set the at least one auxiliary cell to a second logic state different from the first logic state.

Abstract: A method for a read-before-write functionality for a memory within a programmable logic device (PLD) is provided. The method begins when a read operation and a write operation are initiated through two different ports of a memory simultaneously to access the same address in the memory. In order to prevent the write operation from proceeding prior to the read operation, a read-before-write control logic is provided to the control block of the port that supports the write operation. Thus, the write operation is paused until the control block of the port that supports the write operation receives a signal from a read sense amplifier indicating that the read operation is complete. The read sense amplifier is capable of detecting the completion of a read operation by monitoring the voltage difference of the read bitline. When this voltage difference reaches a threshold value, the read sense amplifier triggers a write wordline signal.

Abstract: A word line WLA of A port is activated based on a clock signal ACLK, and a word line WLB of B port is activated based on a port setting signal RDXA indicating that A port is a selected state. In addition thereto, a bit line of B port is precharged. A state in a simultaneous access operation is reproduced by activating the word line WLB during a time period of activating the word line WLA regardless of a delay difference of the clock signal and maintaining Vds of an access transistor of A port at a constant value.

Abstract: An integrated circuit and methods for laying out the integrated circuit are provided. The integrated circuit includes a first and a second transistor. The first transistor includes a first active region comprising a first source and a first drain; and a first gate electrode over the first active region. The second transistor includes a second active region comprising a second source and a second drain; and a second gate electrode over the second active region and connected to the first gate electrode, wherein the first source and the second source are electrically connected, and the first drain and the second drain are electrically connected.

Abstract: One memory cell is formed of a first port access transistor, a second port access transistor and a storage transistor coupled commonly to these access transistors. The first port access transistor is coupled to a first electrode of the storage transistor, and the second port access transistor is coupled to a third electrode of the storage transistor. These first and second port access transistors enter a selected state when first and second port word lines are selected, respectively, to couple corresponding second and third electrodes of the corresponding storage transistor to first and second port bit lines, respectively. A dual-port memory cell of which scalability can follow miniaturization in a process can be provided.

Abstract: A memory cell for interconnection with READ and WRITE word lines and READ and WRITE bit lines includes a logical storage element such as a flip-flop formed by a first inverter and a second inverter cross-coupled to the first inverter. The storage element has first and second terminals and a storage element supply voltage terminal configured for interconnection with a first supply voltage. A WRITE access device is configured to selectively interconnect the first terminal to the WRITE bit line under control of the WRITE word line, and a pair of series READ access devices are configured to ground the READ bit line when the READ word line is active and the second terminal is at a high logical level. A logical “one” can be written to the storage element when a second supply voltage, greater than the first supply voltage, is applied to the WRITE word line, substantially without the use of a complementary WRITE bit line.

Abstract: A multi-port memory device includes a first package ball out region in which a plurality of balls for a serial I/O interface part are arranged; and a second package ball out region in which a plurality of balls for a dynamic random access memory (DRAM) part are arranged.

Abstract: To provide a plurality of DRAM cells, a plurality of sense amplifiers connected to corresponding bit line pairs, a first column switch and a second column switch assigned to each of the sense amplifiers, data lines connected via the column switches to the sense amplifiers, a first port PORT1 and a second port PORT2 that can input/output write data and read data, and an input/output circuit that connects the PORT1 and the PORT2 to the data lines. Thus, a pseudo dual-port memory can be configured by using an ordinary DRAM array.

Abstract: A semiconductor memory device includes a plurality of input/output (I/O) ports, a plurality of memory cell arrays and a region configurator. The region configurator is adapted to hold share region information about at least one share region. In the memory cell arrays, at least one share region accessible through the I/O ports is configured on the basis of the share region information.

Abstract: An access unit for a static random access memory (SRAM) is provided. The access unit comprises two inverters. Two different variable voltages are supplied to the two inverters via bitlines to cause an imbalance in the current strengths between the two inverters so that data can be written on the SRAM.

Abstract: Separate read and write ports in a memory system allow simultaneous access to a memory cell array by read and write operations. A single cycle operation of a central processing unit coupled to a memory array depends on a memory access capability providing simultaneous reading and writing to different locations. A pair of pull-down transistor stacks connected to memory cell latch loops allows a single selected pull-down stack of the pair to toggle a memory cell latch loop to a desired data content without any requirement for a precharge scheme. A single pull-down stack of transistors connected to a memory cell latch loop provides a read port with low input loading. A sense amplifier provides a mid-supply-level precharging capability provided by a feedback device within a front-end inversion stage. When not in a feedback mode, the front-end inversion stage cascaded with a second inversion stage provides a rapid read response.

Abstract: A synchronous memory system configurable in a multiplexed or non-multiplexed mode. In the multiplexed mode, address and data are provided on a shared bus, and accesses to the memory system are qualified by memory access control signals, including an address strobe signal, a counter enable signal and a counter repeat signal. A read/write control signal is maintained for one cycle after the last valid access command to avoid bus turn-around problems. In the multiplexed mode, chip enable and output enable signals may be constantly activated, thereby simplifying associated printed circuit board design. Different ports of the synchronous memory system can be independently configured to operate in either the multiplexed or non-multiplexed mode.

Abstract: An SRAM device that includes an array of SRAM cells arranged in rows and columns. The SRAM device also includes a word line associated with at least one row, the word line operable to control access to cells in the row for both read and write. In addition, the SRAM device includes a write bit-line associated with at least one column operable to provide input to the cells in the column for write. Furthermore, the SRAM device includes a read bit-line associated with the column operable to receive output from cells in the column.

Abstract: A new and useful DMA-like arrangement provides fast inter-system transfers of large data volumes. A preferred embodiment of the invention includes a data-transfer-out system and further includes a data-transfer-in system. At least one of the systems has a dual ported memory structure configured in a way so that data can move out of a memory module of the structure from one port while other data can independently move into the memory module through the other port. The systems are detachable with respect to each other, and the memory modules of both systems are correspondingly paired with compatible specifications such as module sizes. Furthermore, these memory modules are physically configured in a way so that inter-system data transfer occurs in a parallel (i.e., module to module) manner without the aid of the CPU of the system that has the dual ported memory structure.

Abstract: A multi-port memory device includes ports, banks, a global data bus, an input/output (I/O) controller, mode register set (MRS), a clock generator, and a test I/O controller. The I/O controller transmits a test signal to the global data bus in response to a mode register enable signal. The MRS generates a test enable signal in response to the mode register enable signal and outputs a mode selection signal which determines a data transmission mode of a test I/O signal in response to the test signal. The clock generator receives an external clock and generates an internal clock based on the external clock in response to the mode selection signal. The test I/O controller inputs/outputs the test I/O signal in synchronism with the internal clock. The mode register enable signal active during a test operation mode for testing a core area of the banks.

Abstract: Double refresh executing means is changed in accordance with a manner (distributed refresh or burst refresh) of a refresh command so as to suppress a drop of internal power supply that occurs upon double refresh.

Abstract: A printed circuit board may include a memory controller, a plurality of synchronous data memory devices, each synchronous memory device including at least one data pin and at least one address/command pin, an ECC memory device including at least one ECC data pin and at least one ECC address/command pin, and at least one surface. The plurality of synchronous data memory devices may be arranged around a central location on the at least one surface and each synchronous data memory device may be oriented such that the at least one data pin is further from the memory controller than the at least one address/command pin.

Abstract: A memory device is adapted to be connected in a daisy chain with a memory controller and one or more other memory devices. The memory device includes at least one data input port and at least one data output port for communicating data along the daisy-chain between the memory devices and the memory controller. The memory device is adapted to selectively enable/disable at least one of the data input or data output ports in response to whether a command received from the memory controller is intended for the memory device, or for one of the other memory devices.

Abstract: A plurality of masters arbitrate for access to a shared memory device, such as a SDRAM (synchronous dynamic random access memory), amongst themselves using software and arbitration interfaces. The masters generate additional commands upon arbitration, such as MRS and PALL commands, for prevention of collision of commands, refresh starvation, and/or a missing pre-charge operation in the shared memory device.

Abstract: Implementations are presented herein that relate to a memory cell, a memory device, a device and a method of accessing a memory cell.

Abstract: A Static Random Access Memory (SRAM) having a split write control is described. The SRAM includes bit, write, and write-word lines. Each memory cell within the SRAM includes a delay which is coupled to a dedicated write-word line. When a cell is not being written, its delay receives a delay signal on its associated write-word line, which increases the response time of the cell. When a cell is to be written, however, its delay receives a bypass signal on its associated write-word line, which decreases the response time of the SRAM cell.

Abstract: A multi-port instruction/data integrated cache which is provided between a parallel processor and a main memory and stores therein a part of instructions and data stored in the main memory has a plurality of banks, and a plurality of ports including an instruction port unit consisting of at least one instruction port used to access an instruction from the parallel processor and a data port unit consisting of at least one data port used to access data from the parallel processor. Further, a data width which can be specified to the bank from the instruction port is set larger than a data width which can be specified to the bank from the data port.

Abstract: Method and apparatus for implementing first-in-first-out (FIFO) memories using time-multiplexed memory in an integrated circuit are described. A block random access memory (BRAM) circuit embedded in the integrated circuit is provided. The BRAM includes at least one port responsive to a respective at least one BRAM clock signal. FIFO logic is configured to implement a plurality of FIFOs in the BRAM having a plurality of interfaces. Multiplexer logic is configured to selectively couple the plurality of output interfaces of the FIFO logic to the at least one port of the BRAM circuit responsive to at least one FIFO clock signal. Each of the at least one BRAM clock signal has at least twice the frequency of a respective one of the at least one FIFO clock signal.

Abstract: A method for a read-before-write functionality for a memory within a programmable logic device (PLD) is provided. The method begins when a read operation and a write operation are initiated through two different ports of a memory simultaneously to access the same address in the memory. In order to prevent the write operation from proceeding prior to the read operation, a read-before-write control logic is provided to the control block of the port that supports the write operation. Thus, the write operation is paused until the control block of the port that supports the write operation receives a signal from a read sense amplifier indicating that the read operation is complete. The read sense amplifier is capable of detecting the completion of a read operation by monitoring the voltage difference of the read bitline. When this voltage difference reaches a threshold value, the read sense amplifier triggers a write wordline signal.

Abstract: A system for blocking multiple memory read port activation including a first memory read port word line driver that includes a first polarity hold latch with an output connected to an input of a first buffer, and a second memory read port word line driver that includes a second polarity hold latch with an output connected to an input of a blocking switch and a second buffer with an input connected to an output of the blocking switch, wherein a second input of the blocking switch is also connected to the output of the first polarity hold latch and the blocking switch is configured to allow or block a signal transmission between the input and the output of the blocking switch dependent on a signal assertion of the second input to the blocking switch.

Abstract: A system for providing an application with a plurality of methods for accessing memory of a programmable logic controller includes an application, an interface for establishing communication between the application and a programmable logic controller, and a shared memory area initiated by the application or the programmable logic controller. The shared memory area includes an input memory and an output memory. The application is enabled by the interface to write to the input memory and to read from the output memory.

Abstract: Dual port memory array circuitry is provided that includes bit line voltage clamping circuitry. The clamping circuitry contains control transistors that are used to enable and disable the clamping circuitry. The clamping circuitry also contains voltage regulator transistors and feedback paths. When a write operation is performed on one port of the dual port memory array while a read operation is being performed on the other port of the dual port memory array, the bit line voltage clamping circuitry prevents the voltages on the read port bit lines from dropping too low. This allows the write operation to be performed rapidly, even if the memory cell being written to has been adversely affected by variations due to process, voltage, and temperature.

Abstract: A semiconductor memory having a memory cell structure capable of reducing soft error without complicating a circuit configuration. Specifically, an inverter (I1) consists of a NMOS transistor (N1) and a PMOS transistor (P1), and an inverter (I2) consists of a NMOS transistor (N2) and a PMOS transistor (P2). The inverters (I1, I2) are subjected to cross section. The NMOS transistor (N1) is formed within a P well region (PW0), and the NMOS transistor (N2) is formed within a P well region (PW1). The P well regions (PW0, PW1) are oppositely disposed with an N well region (NW) interposed therebetween.