Detail Of Sample Holder Or Support Therefor Patents (Class 374/12)
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Patent number: 12215970Abstract: The system for measuring the angle of repose of high temperature granular material includes a hollow chamber with an optically transparent window. A cylindrical receptacle is rotatably mounted within the hollow chamber, with an open end thereof releasably covered by an optically transparent plate. The cylindrical receptacle is oriented with respect to the hollow chamber such that the optically transparent plate faces, and is aligned with, the optically transparent window. The cylindrical receptacle is controllably rotated within the hollow chamber. The temperature within the hollow chamber may be selectively adjusted by one or more heating elements mounted therein. A camera detects the angle of repose of granular material in the cylindrical receptacle when the cylindrical receptacle is rotated within the hollow chamber. The camera is positioned such that the granular material may be viewed thereby through the optically transparent plate and the optically transparent window.Type: GrantFiled: May 30, 2024Date of Patent: February 4, 2025Assignee: KING SAUD UNIVERSITYInventors: Rageh Saadallah Ali Saeed, Shaker Saeed Abdullah Alaqel, Nader Shaif Saleh, Eldwin Djajadiwinata, Hany Abdurrahman Al-Ansary, Sheldon Jeter, Saeed Mohammed Alzahrani, Zeyad Abdulrahman Alsuhaibani, Zeyad Ammar Almutairi, Syed Noman Danish, Abdelrahman Mahmoud Elleathy, Abdulelah Ibrahim Alswaiyd
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Patent number: 10782193Abstract: An example apparatus can comprise an emitter to emit radio frequency radiation, an absorber that changes temperature based on emissions from the emitter, and one or more sensors to measure a temperature difference between a sample and a reference coupled to the absorber.Type: GrantFiled: September 1, 2017Date of Patent: September 22, 2020Assignees: UT-Battelle, LLC, Iowa State University Research Foundation, Inc.Inventors: Tom Byvank, Benjamin S. Conner, Roger A. Kisner, Michael A. McGuire, Orlando Rios, Michael S. Kesler, Gerard M. Ludtka, Boyd Evans, Cajetan Ikenna Niebedim, Ralph William McCallum
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Patent number: 10697756Abstract: A plate for a 3D scanning system can include a plate body configured to mount to a 3D scanning system, and a plurality of artifact alignment apertures defined in the plate body arranged in a predetermined pattern to allow a predetermined mounting arrangement of one or more artifacts. The artifact alignment apertures are configured to allow an artifact to be mounted to the plate body.Type: GrantFiled: September 15, 2016Date of Patent: June 30, 2020Assignee: Delavan Inc.Inventor: Joseph Samo
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Patent number: 10585057Abstract: The invention relates to detecting a composition of a sample or contamination in liquids by detecting corresponding changes in their thermal properties. In a disclosed arrangement, an apparatus is provided comprising a first probe element configured to provide a first surface in direct contact with the sample and a second surface that is not in direct contact with the sample. A measurement system measures a rate of heat transfer through the first surface. A processing unit analyses the measured rate of heat transfer in order to detect a heat transfer characteristic of the sample that is indicative of a composition of the sample.Type: GrantFiled: December 16, 2015Date of Patent: March 10, 2020Assignee: OXFORD UNIVERSITY INNOVATION LIMITEDInventors: Kamaljit Singh Chana, Jonathan Shamus Sullivan
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Patent number: 9939329Abstract: A device for thermal analysis including: a pair of sample container assembly sets, having a sample container and a heat sink connected using a predetermined thermal resistance; a heating unit for equally heating the pair of sample container assembly sets; a temperature control for the heating unit; a weight measurement unit measuring difference between a sample and a reference material; while the heating unit is changed.Type: GrantFiled: July 31, 2015Date of Patent: April 10, 2018Assignee: Netzsch-Gerätebau GmbHInventors: Yoshio Shinoda, Ryoichi Kinoshita
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Patent number: 8926171Abstract: A balance for a simultaneous differential thermal analysis instrument that combines gravimetric measurements with measurements that require propagation of electrical signals from the sample holder to an apparatus for recording the electrical signals. In one embodiment of the present invention, conductive cross-flexure pivots are used in a parallel guided balance to mechanically and electrically couple the components of the balance mechanism to the apparatus that records the electrical signals.Type: GrantFiled: April 26, 2010Date of Patent: January 6, 2015Assignee: Waters Technologies CorporationInventors: Robert L. Danley, Xiaoping Hu
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Patent number: 8840300Abstract: Certain embodiments disclosed herein are directed to a sensor comprising a support member, a sample sensor coupled to the support member and comprising a sample support electrically coupled to a first set of interconnects, and a reference sensor coupled to the support member and comprising a ring coupled to a second set of interconnects, in which the ring is positioned adjacent to and surrounding at least a portion of the sample support of the sample sensor.Type: GrantFiled: September 22, 2011Date of Patent: September 23, 2014Assignees: Perkinelmer Health Sciences, Inc., Anatech B.V.Inventor: Martinus J. L. M. Wijffels
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Patent number: 8821008Abstract: A balance for a simultaneous differential thermal analysis instrument that combines gravimetric measurements with measurements that require propagation of electrical signals from the sample holder to an apparatus for recording the electrical signals. In one embodiment of the invention, conductive flat planar strip flexure pivots are used in a single-meter movement balance to mechanically and electrically couple the components of the balance mechanism to the apparatus that records the electrical signals.Type: GrantFiled: April 26, 2010Date of Patent: September 2, 2014Assignee: Waters Technologies CorporationInventors: Robert L. Danley, Xiaoping Hu
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Publication number: 20140129043Abstract: A controller and method for controlling the temperature of a steam room. The controller comprises a backing plate and a housing that serves as a moisture barrier. The housing comprises an overlay portion and mounts to the backing plate. A circuit board is mounted to the backing plate. One or more primary temperature sensors are mounted to the circuit board and located within the housing, are spaced above the circuit board, and are biased against the overlay portion. One or more secondary temperature sensors are located within the housing to sense a temperature of a backside of the respective one of more primary temperature sensors wherein an estimation of a temperature of the steam room is obtained.Type: ApplicationFiled: November 5, 2013Publication date: May 8, 2014Inventor: James Rocco SCALERA
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Patent number: 8708556Abstract: A thermal analyzer heats and cools a sample placed inside a furnace for measuring a thermal characteristic of the sample during heating and cooling. The thermal analyzer has a multilayer structure for covering the furnace and its surroundings so as to isolate the furnace and its surroundings from an external environment. The multilayer structure includes a multilayer wall with two layers formed of a material having high thermal conductivity and heat dissipation property. The two layers are spaced apart from one another to provide therebetween an interlayer that contains a substance having a heat capacity substantially equal to a gas contained in the furnace so that heat transfer between the two layers is minimized.Type: GrantFiled: March 28, 2011Date of Patent: April 29, 2014Assignee: SII NanoTechnologyInventors: Kentaro Yamada, Shinya Nishimura, Hirohito Fujiwara
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Patent number: 8393785Abstract: A nanocalorimeter includes a merging layer having, a drop placement area for holding drops to be merged and a thermal equilibration area. A measurement layer includes a substrate, and a temperature probe on the substrate, wherein the temperature probe extends out of the surface of the substrate to come into operative contact with the thermal equilibration area when the measurement layer is placed in operative association with the merging layer. The nanocalorimeter is configured to have the merging layer and the measurement layer non-integrated, making the measurement layer reusable.Type: GrantFiled: May 15, 2009Date of Patent: March 12, 2013Assignee: Palo Alto Research Center IncorporatedInventors: Dirk De Bruyker, Francisco E. Torres, Michal V. Wolkin, Gregory B. Anderson, Eugene M. Chow
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Patent number: 8308352Abstract: An apparatus for single-side, thermal shock testing of a specimen may comprise a base and thermal insulation. The base may comprise an internal cavity disposed within the base. The internal cavity may extend through a first outer surface of the base. A specimen-supporting surface may be recessed within the first outer surface for supporting a specimen within the base to substantially close the internal cavity. The thermal insulation may not substantially cover the first outer surface, but may substantially cover other outer surfaces of the base.Type: GrantFiled: May 12, 2009Date of Patent: November 13, 2012Assignee: The Boeing CompanyInventors: John C. Waldrop, III, Daniel J. Perron, Laura Sullivan Riegel
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Patent number: 8147133Abstract: A measured system for use with a calorimeter and related methods of operation.Type: GrantFiled: May 26, 2009Date of Patent: April 3, 2012Assignee: The United States of America as represented by the Secretary of the NavyInventors: Daniel Ellison, Ryan Ubelhor
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Patent number: 8087821Abstract: A heat flux differential scanning calorimeter (DSC) is disclosed. The DSC can be configured with a highly conductive sample assembly enclosure. The enclosure can include a high emissivity coating. In one embodiment, the enclosure extends along a longitudinal direction that is about the same as that of an infrared lamp assembly used to heat the enclosure, thereby increasing the efficiency of heating the sample enclosure. In one embodiment, a gas-filled thermal resistor is used to couple the measurement assembly to a heat sink, such that samples can be rapidly heated and rapidly cooled.Type: GrantFiled: May 29, 2008Date of Patent: January 3, 2012Assignee: Waters Technologies CorporationInventor: Robert L. Danley
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Patent number: 8066429Abstract: A thermal measurement apparatus and method for performing heat flux differential scanning calorimetry (DSC) is disclosed. A variable thermal resistor is used to couple a measurement assembly to a heat sink in the thermal measurement apparatus, such that samples can be rapidly heated and rapidly cooled. The apparatus can be configured with a highly conductive sample assembly enclosure. The enclosure can include a high emissivity coating. In one embodiment, the enclosure extends along a longitudinal direction that is about the same as that of an infrared lamp assembly used to heat the enclosure, thereby increasing the efficiency of heating the sample enclosure. In one configuration, the variable thermal resistor comprises a gap whose gas composition can be varied during a sample measurement to independently optimize sample heating and cooling rates.Type: GrantFiled: May 30, 2008Date of Patent: November 29, 2011Assignee: Waters Technologies CorporationInventor: Robert L. Danley
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Patent number: 8042992Abstract: Certain embodiments disclosed herein are directed to a sensor comprising a support member, a sample sensor coupled to the support member and comprising a sample support electrically coupled to a first set of interconnects, and a reference sensor coupled to the support member and comprising a ring coupled to a second set of interconnects, in which the ring is positioned adjacent to and surrounding at least a portion of the sample support of the sample sensor.Type: GrantFiled: March 31, 2008Date of Patent: October 25, 2011Assignees: Anatech B.V., PerkinElmer LAS, Inc.Inventor: Martinus J. L. M. Wijffels
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Publication number: 20110235671Abstract: To improve measurement accuracy by eliminating influence of a change of a temperature environment around a furnace of a thermal analyzer, the thermal analyzer includes a multilayer structure of at least two sealed layers for covering the furnace and its surroundings so as to isolate the furnace and its surroundings from an outside. An interlayer of the multilayer structure is loaded with a substance having a heat capacity equal to the heat capacity of a gas inside the furnace.Type: ApplicationFiled: March 28, 2011Publication date: September 29, 2011Inventors: Kentaro Yamada, Shinya Nishimura, Hirohito Fujiwara
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Patent number: 7922386Abstract: A thermal analysis apparatus includes: a sample temperature control device for surrounding a sample placed on a measurement position and controlling the temperature of the sample; a balance beam for supporting the sample and capable of tilting about a pivot point; and a sample moving device that allows the balance beam to slide between a first position at which the sample is situated at the measurement position and a second position at which the sample is situated at a distant position which is a position outside the sample temperature control unit. The distant position is a position which is deviated laterally from a line trajectory extending from the measurement position to the outside of the sample temperature control device. When the sample is at the measurement position, the balance beam is allowed to linearly slide and subsequently to rotationally slide about an axial line, to thereby transport the sample from the measurement position to the distant position.Type: GrantFiled: September 26, 2007Date of Patent: April 12, 2011Assignee: Rigaku CorporationInventor: Nobuhiro Tanaka
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Patent number: 7909505Abstract: A device and method for investigating phase transformation properties and structural changes of materials. In one form, the device simulates actual thermal processing conditions, while the method can be used in both simulations as well as in actual processing conditions. An analysis using at least one of the device and method is referred to as a single sensor differential thermal analysis, as it compares the temperature recorded in a measured specimen against a reference thermal history without requiring the derivation of the reference thermal history from measured reference temperatures.Type: GrantFiled: January 6, 2009Date of Patent: March 22, 2011Assignee: The Ohio State UniversityInventors: Boian Todorov Alexandrov, John C. Lippold, Seth Jason Norton
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Patent number: 7774164Abstract: A computer which functions by a performance prediction program for a ground source heat pump system of the present invention and a performance prediction system constructed thereby include a dimensionless distance calculating means, a first dimensionless time calculating means, a second dimensionless time calculating means, a boundary time acquiring means, an underground temperature change calculating means, and a tube surface temperature change calculating means. The performance prediction program and performance prediction system can be applied to the design of heat exchange system by obtaining predicted underground temperature data for the ground source heat pump system with high accuracy and predicting the performance for the ground source heat pump system based on the resulting underground temperature changes, etc., in view of the use of a plurality of buried tubes, underground temperature change patterns for buried tubes placed at different intervals, and the use of U-shaped tube heat exchangers.Type: GrantFiled: August 29, 2006Date of Patent: August 10, 2010Assignees: National University Corporation Hokkaido University, Nippon Steel Engineering Co., Ltd.Inventors: Katsunori Nagano, Takao Katsura
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Publication number: 20090310645Abstract: A method of stably controlling the temperature of a sample placed on a sample stage to a desired temperature by estimating a sample temperature accurately, the sample stage including a refrigerant flow path to cool the sample stage, a heater to heat the sample stage, and a temperature sensor to measure the temperature of the sample stage. This method comprises the steps of: measuring in advance the variation-with-time of supply electric power to the heater, temperature of the sample, and temperature of the temperature sensor, without plasma processing; approximating the relation among the measured values using a simultaneous linear differential equation; estimating a sample temperature from the variation-with-time of sensor temperature y1, heater electric power u1, and plasma heat input by means of the Luenberger's states observer based on the simultaneous linear differential equation used for the approximation; and performing a feedback control of sample temperature using the estimated sample temperature.Type: ApplicationFiled: August 19, 2008Publication date: December 17, 2009Inventors: Naoyuki Kofuji, Tsunehiko Tsubone
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Patent number: 7588366Abstract: There is provided a differential scanning calorimeter in which a base line stability and a responsiveness are improved. There is made a constitution in which the stability is ensured by making a neck-like part in a heat passage from a heat reservoir 1 to a sensor plate 4 and, at the same time, a two-dimension heat flow passage to a sample holder 5a is ensured.Type: GrantFiled: February 14, 2008Date of Patent: September 15, 2009Assignee: SII NanoTechnology Inc.Inventor: Ryoichi Kinoshita
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Patent number: 7473031Abstract: Thermal sensors for calorimetry can include vanadium oxide, heavily p-doped amorphous silicon, or other materials with high temperature coefficients of resistivity. Such thermal sensors can have low noise equivalent temperature difference (NETD). For example, a thermal sensor with NETD no greater than 100 ?K over a bandwidth range of approximately 3 Hz or more can include a thermistor including vanadium oxide sputtered at room temperature under conditions that yield primarily V2O5; more specifically, the NETD can be no greater than 35 ?K, or even 10 ?K over a bandwidth range of approximately 3 Hz or more. If a low noise thermal sensor has NETD no greater than 50 ?K over such a bandwidth range, a low noise output circuitry connected to its thermistor can provide an electrical output signal that includes information about input thermal signal peaks with amplitude of approximately 100 ?K.Type: GrantFiled: June 27, 2005Date of Patent: January 6, 2009Assignee: Palo Alto Research Center, IncorporatedInventors: Michal V. Wolkin, Dirk De Bruyker, Eric Peeters, Alan Bell
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Patent number: 7473028Abstract: A device and method for investigating phase transformation properties and structural changes of materials. In one form, the device simulates actual thermal processing conditions, while the method can be used in both simulations as well as in actual processing conditions. An analysis using at least one of the device and method is referred to as a single sensor differential thermal analysis, as it compares the temperature recorded in a measured specimen against a reference thermal history without requiring the derivation of the reference thermal history from measured reference temperatures.Type: GrantFiled: April 24, 2006Date of Patent: January 6, 2009Assignee: The Ohio State UniversityInventors: Boian Todorov Alexandrov, John C. Lippold, Seth Jason Norton
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Patent number: 7470057Abstract: A sensor for a heat flux differential scanning calorimeter in which the differential temperatures are measured between locations external to the regions of heat exchange between the sensor and sample containers. The measured differential temperatures respond to the magnitude of the heat flow rate between the sensor and the sample and reference containers and are rendered insensitive to variations in the magnitude and distribution of thermal contact resistance between the sensor and the containers.Type: GrantFiled: August 22, 2007Date of Patent: December 30, 2008Assignee: Waters Investments LimitedInventor: Robert L. Danley
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Patent number: 7455449Abstract: There is provided a differential scanning calorimeter possessing an accommodation chamber accommodating a sample to be measured and a reference material, a heater heating the accommodation chamber, a differential heat flow detector outputting a temperature difference between the sample to be measured and the reference material as a heat flow difference signal, a cooling block cooling-controlled to a predetermined temperature, a heat resistor which mechanically connects the cooling block and the accommodation chamber and forms a heat flow path between both, a first fixation means which fixes the heat resistor to the cooling block by pressing the former while being biased by a constant elastic force, and a second fixation means which fixes the accommodation chamber to the heat resistor by pressing the former while being biased by a constant elastic force.Type: GrantFiled: January 24, 2007Date of Patent: November 25, 2008Assignee: SII NanoTechnology Inc.Inventor: Shinya Nishimura
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Publication number: 20080181281Abstract: A thermal analysis apparatus includes: a sample temperature control device for surrounding a sample placed on a measurement position and controlling the temperature of the sample; a balance beam for supporting the sample and capable of tilting about a pivot point; and a sample moving device that allows the balance beam to slide between a first position at which the sample is situated at the measurement position and a second position at which the sample is situated at a distant position which is a position outside the sample temperature control unit. The distant position is a position which is deviated laterally from a line trajectory extending from the measurement position to the outside of the sample temperature control device. When the sample is at the measurement position, the balance beam is allowed to linearly slide and subsequently to rotationally slide about an axial line, to thereby transport the sample from the measurement position to the distant position.Type: ApplicationFiled: September 26, 2007Publication date: July 31, 2008Applicant: RIGAKU CORPORATIONInventor: Nobuhiro TANAKA
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Publication number: 20080063026Abstract: Washers partially coated with a thermochromic material are incorporated into bolted electrical connections to monitor or record temperature changes undergone by the electrical connections as indications of the performance or integrity of the electrical connections. For monitoring ongoing performance, the color changes undergone by the thermochromic coated washers can be compared to each other within a common field of view or to a common datum, such as a nearby thermochromic coated washer mounted in a bolted non-electrical connection. Irreversible thermochromic materials can be used to record elevated temperature events such as approaching or reaching a design temperature limit or a fault condition. Different thermochromic materials can be combined within the same washers to monitor different ranges of temperature or to record multiple threshold events.Type: ApplicationFiled: September 12, 2006Publication date: March 13, 2008Inventor: Richard M. Roche
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Patent number: 7338640Abstract: A method of manufacturing a sensor is provided. The method includes disposing a sacrificial layer on a substrate, disposing a low-thermal-conductivity layer on the sacrificial layer, and disposing a first set of conductive arms and a second set of conductive arms on the low-thermal-conductivity layer to form a plurality of thermal junctions. The plurality of thermal junctions is adapted to form a plurality of hot junctions and a plurality of cold junctions when subjected to a difference in temperature. The method also includes removing the sacrificial layer and a portion of the low-thermal-conductivity layer to form a cavity therein. The cavity is configured to provide insulation for the plurality of hot junctions. A thermopile sensor is also provided, and a calorimetric gas sensor implementing the thermopile sensor is provided.Type: GrantFiled: March 31, 2005Date of Patent: March 4, 2008Assignee: General Electric CompanyInventors: Sunil Srinivasa Murthy, Anis Zribi, Shankar Chandrasekaran
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Patent number: 7234861Abstract: A thermal analyzer has a heat sink for storing therein a specimen, a heater for heating the heat sink and the specimen, at superheating temperatures, and a cooling mechanism thermally connected to the heat sink for cooling the heat sink and the specimen. The cooling mechanism is comprised of a tubular member having an inlet port for introducing a cooling gas into the tubular member and an outlet port for discharging the cooling gas from the tubular member. A tubular extension is thermaly connected to and extends from the tubular member. An electric cooling device has a cooling head connected to the tubular extension for cooling the cooling mechanism.Type: GrantFiled: August 30, 2004Date of Patent: June 26, 2007Assignee: SII NanoTechnology Inc.Inventor: Shinya Nishimura
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Patent number: 7097352Abstract: A holder for materials for use in a measuring instrument includes a three-piece housing consisting of an upper housing member, an intermediate housing member and a lower housing member, the three-piece housing defining a first closed cavity and a second closed cavity. A first winding assembly is disposed within the first closed cavity, and a second winding assembly is disposed within the second closed cavity.Type: GrantFiled: October 5, 2004Date of Patent: August 29, 2006Assignee: PerkinElmer LAS, Inc.Inventor: Donald L. Groeschner
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Patent number: 7056038Abstract: A printer is provided with a buffer to receive document data. Document data is read from the buffer by a control system and information is printed by one or more printhead assemblies in accordance with document data read by the control system from the buffer. The printer operates to print a first set of document data whilst simultaneously receiving second document data. Thus different documents may be printed without pausing.Type: GrantFiled: August 8, 2003Date of Patent: June 6, 2006Assignee: Silverbrook Research Pty LtdInventors: Kia Silverbrook, Simon Robert Walmsley
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Patent number: 6935776Abstract: A sample holder for differential thermal analysis has a substrate with a planar surface provided with a sample position for a sample material and a reference position for reference material. The substrate allows heat flow between a heat source thermally coupled to the sample holder and the sample and reference positions. A first thermoelement arrangement in the area of the sample and reference positions is provided for supplying a thermoelectric signal corresponding to a differential between the temperatures at the sample and reference positions. First connectors are formed on the substrate for tapping the thermoelectric signal corresponding to the temperature differential. A second thermoelement arrangement provides a thermoelectric signal corresponding to an absolute temperature of the sample and reference positions. Second connectors are provided on the substrate for tapping the thermoelectric signal corresponding to the absolute temperature.Type: GrantFiled: June 9, 2003Date of Patent: August 30, 2005Assignee: Mettler-Toledo GmbHInventor: Thomas Hütter
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Patent number: 6860632Abstract: A housing for a material holder includes an intermediate housing member having a generally horizontal member, an upper recess and a lower recess, an upper housing member having a generally horizontal member and a wall defining a material holding chamber, the upper housing member being seated within the upper recess of the intermediate housing member, and a lower housing member having a generally horizontal member, the lower housing member being seated within the lower recess of the intermediate housing member. The upper recess, the generally horizontal member of the intermediate housing member and the generally horizontal member of the upper housing member define a first cavity adapted to receive a first winding assembly, and the lower recess, the generally horizontal member of the intermediate housing member and the generally horizontal member of the lower housing member define a second cavity adapted to receive a second winding assembly.Type: GrantFiled: July 28, 2003Date of Patent: March 1, 2005Assignee: PerkinElmer Instruments LLCInventor: Donald L. Groeschner
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Patent number: 6843596Abstract: A device for thermal sensing is based on only one thermopile. The junctions of the thermopile are coupled thermally to a first region which includes a first substance while the hot junctions of the thermopile are coupled thermally to a second region which includes a second substance. The first and second regions are separated and thermally isolated from each other. The device can further include a membrane to thermally and electrically isolate the thermopile and to mechanically support the thermopile.Type: GrantFiled: March 7, 2003Date of Patent: January 18, 2005Assignee: Vivactis NVInventor: Katarina Verhaegen
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Publication number: 20030231693Abstract: A sample holder for differential thermal analysis has a substrate with a planar surface provided with a sample position for a sample material and a reference position for reference material. The substrate allows heat flow between a heat source thermally coupled to the sample holder and the sample and reference positions. A first thermoelement arrangement in the area of the sample and reference positions is provided for supplying a thermoelectric signal corresponding to a differential between the temperatures at the sample and reference positions. First connectors are formed on the substrate for tapping the thermoelectric signal corresponding to the temperature differential. A second thermoelement arrangement provides a thermoelectric signal corresponding to an absolute temperature of the sample and reference positions. Second connectors are provided on the substrate for tapping the thermoelectric signal corresponding to the absolute temperature.Type: ApplicationFiled: June 9, 2003Publication date: December 18, 2003Applicant: Mettler-Toledo GmbHInventor: Thomas Hutter
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Patent number: 6586258Abstract: In accordance with the invention, a liquid sample for thermal analysis is disposed within a receptacle having a bottom surface and side walls. The top edges of the side walls are bent towards the center of the receptacle. A sheet of flexible, transparent material substantially impermeable to the sample is disposed across the top edges of the side walls, and an open lid compresses an o-ring onto the sheet material, sealing it against the bent top edges of the receptacle. The bottom surface of the receptacle is advantageously coated with a a material not wetted by the sample such as a fluorcarbon.Type: GrantFiled: May 10, 2000Date of Patent: July 1, 2003Assignee: Lucent Technologies Inc.Inventors: Harvey Edward Bair, Arturo Hale, Stephen Reid Popielarski
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Patent number: 6523998Abstract: An improved differential thermal analysis/differential scanning calorimetry (collectively, DSC) assembly with a furnace block assembly having a measurement chamber and a furnace heater. The measurement chamber has a sensor assembly for receiving a sample material and a reference material. The furnace block assembly is coupled to a generally cylindrical cooling flange through a distributed thermal resistor that allows a constrained heat flow between the furnace assembly and cooling flange. The thermal resistor can also withstand the mechanical stresses associated with the differential expansion and contraction of the furnace assembly and cooling flange without permanent deformation of the thermal resistor. The cooling flange can be coupled to various cooling devices, permitting operation of the overall DSC instrument in a variety of temperature regimes for a variety of applications.Type: GrantFiled: January 26, 2001Date of Patent: February 25, 2003Assignee: TA Instruments, Inc.Inventors: Robert L. Danley, John W. Schaefer
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Patent number: 6513969Abstract: A calorimeter that includes a sample cell, a reference cell, a pressure system that applies a variable pressure to the sample cell, and a pressure controller that controls the pressure applied by the pressure system to the sample sell. By applying identical pressure perturbations to both the sample and reference cells over a range of temperature, the calorimeter can be used to accurately calculate both the thermal coefficient of expansion of various substances, and the volume change of molecules undergoing a structural transition.Type: GrantFiled: September 24, 2001Date of Patent: February 4, 2003Assignee: Microcal, LLCInventors: Valerian V. Plotnikov, John F. Brandts, J. Michael Brandts
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Patent number: 6508585Abstract: An insulating substrate provided with two types of metallic or alloy circuit patterns for detecting temperature difference between a sample side and a reference side, and also a metallic resistance circuit pattern, is fixed to a heat sink, and the heat sink is temperature controlled. If a temperature difference between the sample and the reference is detected, electrical power supplied to a compensation heater using metallic resistors is adjusted by a differential heat compensation circuit so that the temperature difference is immediately returned to zero, and a difference in supplied power is output as a differential heat flow.Type: GrantFiled: November 30, 2001Date of Patent: January 21, 2003Assignee: Seiko Instruments Inc.Inventors: Nobutaka Nakamura, Ryoichi Kinoshita
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Patent number: 6436346Abstract: A method and apparatus are provided for detecting and monitoring micro-volumetric enthalpic changes caused by molecular reactions. Micro-machining techniques are used to create very small thermally isolated masses incorporating temperature-sensitive circuitry. The thermally isolated masses are provided with a molecular layer or coating, and the temperature-sensitive circuitry provides an indication when the molecules of the coating are involved in an enthalpic reaction. The thermally isolated masses may be provided singly or in arrays and, in the latter case, the molecular coatings may differ to provide qualitative and/or quantitative assays of a substance.Type: GrantFiled: September 14, 1999Date of Patent: August 20, 2002Assignee: U T Battelle, LLCInventors: Mitchel J. Doktycz, Charles L. Britton, Jr., Stephen F. Smith, Patrick I. Oden, William L. Bryan, James A. Moore, Thomas G. Thundat, Robert J. Warmack
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Publication number: 20020085615Abstract: An insulating substrate provided with two types of metallic or alloy circuit patterns for detecting temperature difference between a sample side and a reference side, and also a metallic resistance circuit pattern, is fixed to a heat sink, and the heat sink is temperature controlled. If a temperature difference between the sample and the reference is detected, electrical power supplied to a compensation heater using metallic resistors is adjusted by a differential heat compensation circuit so that the temperature difference is immediately returned to zero, and a difference in supplied power is output as a differential heat flow.Type: ApplicationFiled: November 30, 2001Publication date: July 4, 2002Inventors: Nobutaka Nakamura, Ryoichi Kinoshita
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Patent number: 6390669Abstract: A heat flux type differential scanning calorimeter has a heat reservoir made of a thermal conducting material. A thermally conductive plate is disposed in the heat reservoir for supporting an unknown sample and a reference sample symmetrically with respect to a center of the reservoir. A thermally conductive support member is disposed in contact with the thermally conductive plate and supports the thermally conductive plate in the heat reservoir. A heat buffer plate is disposed between the thermally conductive support member and the heat reservoir so that the thermally conductive support member and the heat reservoir are contacted only through the heat buffer plate.Type: GrantFiled: July 12, 1999Date of Patent: May 21, 2002Assignee: Seiko Instruments Inc.Inventors: Nobutaka Nakamura, Ryoichi Kinoshita
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Patent number: 6375349Abstract: An instrument for determining thermophysical properties of a solid sample of uniform thickness is disclosed. The instrument comprises a furnace, an elliptical mirror outside the furnace, a light source at one focus of the elliptical mirror that is closest to the elliptical mirror, a beam guide having one end at the other focus of the elliptical mirror and the other end inside the furnace, a sample holder inside the furnace capable of holding at least two diffusivity samples with the front and back surface of a sample exposed, an indexing system for moving the sample holder so as to place samples held by the sample holder in the path of light leaving the beam guide, and an infrared detector for quantifying changes in the temperature of the back surface of a sample that is in the path of the light. Methods for determining the thermal diffusivity, specific heat capacity, thermal conductivity, coefficient of thermal expansion, density, and temperature of a sample using this instrument are also disclosed.Type: GrantFiled: August 5, 1999Date of Patent: April 23, 2002Assignee: Anter CorporationInventors: Peter S. Gaal, Silviu P. Apostolescu
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Publication number: 20020018509Abstract: A cooling system for thermal analysis equipment provides rapid cool down and steady state operation of a differential scanning calorimeter (DSC) at any predetermined temperature between a minimal temperature and room temperature using a throttle-cycle cooler based on a single stage compressor. The cooling system operates with a mixed refrigerant that includes some liquid fraction at the inlet to a cryostat that houses the key cold elements for the cooling system. A temperature actuated automatic throttle valve in the cooling system increases refrigerant mass flow rate when the differential scanning calorimeter increases the heat load (and vice-versa) that is generally provided by a heater. At the same time, the valve design provides a high mass flow during cool down and automatic flow rate reduction at an intermediate temperature as the overall system approaches an operating condition during cool down.Type: ApplicationFiled: July 12, 2001Publication date: February 14, 2002Inventor: Mikhail Boiarski
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Publication number: 20020012379Abstract: A differential thermal analyzer/differential scanning calorimeter has a sample holder supported by a temperature detector inside a heat sink. The sample holder has a bottom wall defining a mounting surface and a side wall. During a measurement, a sample is placed on the mounting surface in the sample holder and the sample holder is inclined so that the sample slides downwardly due to its own weight and contacts the sample holder side wall. A beam of electromagnetic radiation is then passed through the sample and through aligned radiation openings in the bottom wall of the sample holder and in the heat sink, and temperature measurements are taken by the temperature detector. Because the sample is in contact with both the side and bottom walls of the sample holder, heat escape is minimized during temperature measurements.Type: ApplicationFiled: May 3, 2001Publication date: January 31, 2002Inventor: Ryoichi Kinoshita
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Patent number: 6257757Abstract: A gas-tight container such as a glove box maintains a sample under a controlled atmosphere and has a sample chamber formed in a convex portion thereof. The temperature is controlled in the sample chamber by an externally disposed heater. A detector such as a weight detector is disposed in the gas-tight container and has a sample holder for holding a sample under analysis. The detector is movably supported by a movement mechanism so that the sample holder is movable between a first position at which a sample disposed on the sample holder is disposed within the sample chamber and a second position at which a sample disposed on the sample holder is disposed outside the sample chamber, such that the mounting of a sample on the sample holder may be accomplished while the sample holder is disposed outside the sample chamber and a thermal analysis of the sample may be performed while the sample is disposed inside the sample chamber.Type: GrantFiled: May 17, 1999Date of Patent: July 10, 2001Assignee: Seiko Instruments Inc.Inventor: Nobutaka Nakamura
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Patent number: 6238085Abstract: A sensor having an active sensing material exposed to the substance to be detected and an active reference material that is shielded from the substance to be detected. Thermocouples having a set of junctions proximate to the active sensing material and another set of junctions to the active reference material for measuring the temperatures at the respective materials. The junctions are connected differentially in that a difference of the two temperatures is measured. A heater is proximate and common to the two materials. Heat pulses may be applied to the materials via the heater and the temperatures are measured. If ambient factors or substances affect the active sensing material, its thermal response will be different than that of the active reference material, and a differential pulse-like indication of temperature will be detected.Type: GrantFiled: December 31, 1998Date of Patent: May 29, 2001Assignee: Honeywell International Inc.Inventors: Robert E. Higashi, Barrett E. Cole
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Patent number: 6095680Abstract: This invention presents an improved way to determine, nondestructively, the composition of an unknown material sample such as, for example, an alloy steel fastener or a carbon steel fastener of unknown standard grade. The procedure involves utilizing a pulse of heat from a focused laser or infrared heater to a spot at the end of a standard grade fastener of known length or applying a pulse of cold and then placing an infrared temperature detector a specific distance from the heat or cold source and measure the temperature-time transmission. Over an interval of time the nature of the transmitted pulse and the time variation of temperature causes a pattern that allows the determination of the alloy content of the bolt. The temperature-time signature of the bolt, the decay curve after shut-off and the slopes of the curves can be used to detect inferior or mismatched bolts in a laboratory, in a plant or production floor environment or in situ testing in installed equipment.Type: GrantFiled: May 5, 1997Date of Patent: August 1, 2000Inventor: Francis I. Baratta
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Patent number: 6079873Abstract: A differential scanning microcalorimeter produced on a silicon chip enables microscopic scanning calorimetry measurements of small samples and thin films. The chip may be fabricated using standard CMOS processes. The microcalorimeter includes a reference zone and a sample zone. The reference and sample zones may be at opposite ends of a suspended platform or may reside on separate platforms. An integrated polysilicon heater provides heat to each zone. A thermopile consisting of a succession of thermocouple junctions generates a voltage representing the temperature difference between the reference and sample zones. Temperature differences between the zones provide information about the chemical reactions and phase transitions that occur in a sample placed in the sample zone.Type: GrantFiled: June 30, 1998Date of Patent: June 27, 2000Assignee: The United States of America as represented by the Secretary of CommerceInventors: Richard E. Cavicchi, Gregory Ernest Poirier, John S. Suehle, Michael Gaitan, Nim H. Tea