Detail Of Sample Holder Or Support Therefor Patents (Class 374/12)
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Patent number: 6062727Abstract: A measuring instrument for the thermal and/or reactive properties of one or several samples of a solid, liquid or gaseous substance, comprising a measuring cell constituted by an electronic component suitable to detect a temperature difference between two regions on it's surface. The instrument includes a thermal inertia block defining an inner chamber in which is contained the measuring cell and which block is provided with an opening above the measuring cell and a skirt surrounding the chamber. The skirt extends vertically downwardly to an essentially horizontal bearing surface.Type: GrantFiled: February 25, 1998Date of Patent: May 16, 2000Assignee: Setaram - Societe d'Etudes d'Automatisation de Regulation et d'Appareils de MesuresInventors: Pierre le Parlouer, Jean-Louis Daudon
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Patent number: 5842788Abstract: A Differential Scanning Calorimeter (DSC) which has constant calorimetric sensitivity over its entire range of operating temperatures from -200.degree. C. to 540.degree. C. The DSC sensor consists of a pair of thin-film Resistance Temperature Detectors (RTDs) which are used to sense the temperature of a sample and the temperature difference between the sample and an inert reference. The RTDs are supplied with an excitation current which varies according to the temperature of the reference to achieve constant calorimetric sensitivity, independent of the operating temperature.Type: GrantFiled: October 31, 1997Date of Patent: December 1, 1998Assignee: TA Instruments, Inc.Inventors: Robert L. Danley, John R. Reader, Jr., John W. Schaefer
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Patent number: 5813764Abstract: A catalytic differential gas combustible microcalorimeter sensor for monitoring the exhaust gas conversion for monitoring the exhaust gas conversion efficiency of a catalytic converter. The catalytic calorimetric sensor disclosed includes a sol-gel processed washcoat and sol-processed catalytically active metal particles. Sol-gel processing creates a washcoat with high surface area and controlled porosity which increases the sensitivity, durability, and reproducibility of the resultant sensor.Type: GrantFiled: September 29, 1997Date of Patent: September 29, 1998Assignee: Ford Global Technologies, Inc.Inventors: Jacobus Hendrik Visser, Chaitanya Kumar Narula, Margherita Zanini-Fisher
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Patent number: 5711604Abstract: A method for measuring the coefficient of thermal conductivity of a solid sample material by: heating a meltable calibration sample having good thermal conductivity to its melting temperature by raising the temperature of an analyzer at a controlled rate and causing heat to flow through a path having a thermal resistance to the calibration sample, the heating being performed one time with the solid sample material interposed in the path so that heat flows through the path and through the solid sample material, and one time with the solid sample material removed so that heat flows only through the path; deriving thermal analysis curves each representing a relation between heat flow to the calibration sample and the controlled rate at which the analyzer temperature is raised, during melting of the calibration sample in respective performances of the heating step; and determining the coefficient of thermal conductivity of the solid sample material based on the solid sample material thickness and a characteristicType: GrantFiled: November 3, 1995Date of Patent: January 27, 1998Assignee: Seiko Instruments Inc.Inventor: Nobutaka Nakamura
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Patent number: 5599104Abstract: The temperature of a heat reservoir is varied according to a linear function which is AC modulated. At this time, the temperature difference between two points located in a heat flow path going from the heat reservoir to an unknown sample is measured. Also, the temperature difference between two points located in a heat flow path going from the heat reservoir to a reference sample is measured. These two pairs of points are arranged symmetrically. Then, the resulting signals are demodulated, and each signal is divided into an AC component and a low-frequency component. Using these signals, the DSC signal is separated into a heat capacity component and a latent heat component.Type: GrantFiled: September 23, 1994Date of Patent: February 4, 1997Assignee: Seiko Instruments Inc.Inventors: Nobutaka Nakamura, Yoshihiko Teramoto
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Patent number: 5588746Abstract: In order to carry out thermal analysis under various kinds of atmospheres, there is provided an apparatus for thermal analysis containing a sample chamber having a portion for a sample and a signal detection chamber provided with a signal detection member, the signal detection chamber having an inlet port for a purging gas, the sample chamber and the signal detection chamber being connected through a purging gas passage, and the sample chamber being provided with an inlet port for an atmosphere gas and also with an outlet port for the atmosphere gas and the purging gas.Type: GrantFiled: July 19, 1994Date of Patent: December 31, 1996Assignees: Sumitomo Chemical Company, Limited, Seiko Instruments, Inc.Inventors: Masao Minobe, Noboru Shiraga, Nobutaka Nakamura
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Patent number: 5509733Abstract: The present invention is an infrared-heated differential thermal analyzing instrument. The instrument uses an actively cooled heat sink, and a heat flow restricting element connecting the heat sink to a differential thermal analysis sensor. An IR heater directs IR radiation onto the lateral surfaces of the heat sink and the heat flow restricting element. These lateral surfaces are polished and coated with a high IR reflectance coating, so that heat absorption is minimized. The IR heater preferably uses either elliptical or parabolic mirrors to focus the IR radiation onto the heat sink and the heat flow restricting element. A second embodiment of the invention uses two heat sinks, and two heat flow restricting elements, with one heat sink and one heat flow restricting element mounted on either side of the differential analysis thermal sensor.Type: GrantFiled: December 21, 1993Date of Patent: April 23, 1996Assignee: TA Instruments, Inc.Inventor: Robert L. Danley
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Patent number: 5398556Abstract: A device for charging a measuring apparatus for thermal analysis with material specimens filled into containers includes a vertically displaceable gripping member and a rotatable specimen plate with a plurality of openings arranged in a circle. For transferring a specimen container to the measuring location in the measuring apparatus, the specimen container is moved underneath the gripping member by rotating the specimen plate, the gripping member is lowered and the specimen container is gripped by gripping fingers attached to the gripping member. The container is then raised from the specimen plate by raising the gripping member. Subsequently, the specimen plate is rotated until a recess in the specimen plate is located underneath the gripping member. The measuring location is also located directly underneath the gripping member.Type: GrantFiled: June 25, 1993Date of Patent: March 21, 1995Assignee: Mettler-Toledo AGInventor: Karl Lang
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Patent number: 5321719Abstract: The present invention is a thermogravimetric instrument having a ceramic sample support and a ceramic balance beam. The ceramic platform is rigidly attached to the hot end of the ceramic balance beam. An inert metal liner is press fitted into the ceramic sample platform. In a preferred embodiment, a thermocouple is directly attached to the inert metal liner. The thermocouple wires are routed through the length of the ceramic balance beam and are attached to the cold end of the ceramic balance beam with adhesive. The inert metal liner could be fabricated from platinum or from platinum alloys.Type: GrantFiled: May 26, 1993Date of Patent: June 14, 1994Assignee: TA Instruments, Inc.Inventors: Kevin J. Reed, Michael J. Levchak, John W. Schaefer
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Patent number: 5293404Abstract: A thermal analysis device with a sample transporting machine which automatically carries out pretreatment of a sample to quickly heat or cool it. The configuration includes an electric furnace, a temperature controller, a temperature program setter, a sample placing/removing program setter, and a sample transporter, wherein the said sample placing/removing program setter commands the said sample transporter to place the said sample in or remove it from the said electric furnace in synchronization with a synchronization signal from the said temperature program setter and in accordance with a preset sample placing/removing program and, hence, the said sample placing and removing operations (i.e. to place a sample in the electric furnace or, conversely to remove a sample from the electric furnace) are carried out in the electric furnace which is performing a heating operation or a cooling operation in accordance with a temperature program output by the said temperature program setter.Type: GrantFiled: November 27, 1991Date of Patent: March 8, 1994Assignee: Seiko Instruments Inc.Inventor: Haruo Takeda
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Patent number: 5217690Abstract: A highly sensitive, quick recovery differential microcalorimeter includes two matchingly formed and cooperatingly disposed flow channels. Each flow channel has two inlets, at least one mixing assembly connected to each fluid inlet, a fluid outlet connected to each mixing assembly, at least one heater element surrounding at least a portion of each fluid outlet, and a plurality of sensors surrounding at least a portion of each fluid outlet. Each of the mixing assemblies includes a mixing chamber and at least one entry manifold connected to a fluid inlet and having a plurality of ports which connect to the mixing chamber.Type: GrantFiled: November 6, 1991Date of Patent: June 8, 1993Assignee: The United States of America as represented by the Department of Health and Human ServicesInventors: Courtney Mudd, Robert Berger
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Patent number: 5143450Abstract: Apparatus (10) for handling devices for testing under varying temperature conditions is disclosed including a mechanical arm (32) pivotally mounted by a bearing (34) to a control portion (16) which is variably vertically positionable relative to a platform portion (14). An insert arm (38) is rotatably mounted within the mechanical arm (32) to reciprocally and rotatably mount a thermal socket (90) for mating with a contactor (126). The socket (90) is mounted to a vacuum cup (48) to allow position alignment as alignment pins (132) are initially slideably received in alignment notches (124) and when no vacuum is applied and is fixed in the aligned position after the application of vacuum. Thermal tubes (74) of probes (50) are reciprocal with the thermal socket (90) to provide thermally conditioned gas/air to the thermal socket (90). The thermal socket (90) provides a swirling action to the thermally conditioned gas/air to exit 360.degree.Type: GrantFiled: February 1, 1991Date of Patent: September 1, 1992Assignee: Aetrium, Inc.Inventors: Nathan R. Smith, Steven E. Schmitt
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Patent number: 5098195Abstract: Apparatus and process for determining the emissivity of a test specimen including an integrated sphere having two concentric walls with a coolant circulating therebetween, and disposed within a chamber which may be under ambient, vacuum or inert gas conditions. A reference sample is disposed within the sphere with a monochromatic light source in optical alignment therewith. A pyrometer is in optical alignment with the test sample for obtaining continuous test sample temperature measurements during a test. An arcuate slit port is provided through the spaced concentric walls of the integrating sphere with a movable monochromatic light source extending through and movable along the arcuate slit port. A detector system extends through the integrating sphere for continuously detecting an integrated signal indicative of all radiation within its field of view, as a function of the emissivity of the test specimen at various temperatures and various angle position of the monochromatic light source.Type: GrantFiled: October 31, 1990Date of Patent: March 24, 1992Assignee: Information and Control Systems, Inc.Inventors: Nesim Halyo, Dhirendra K. Pandey
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Patent number: 5052819Abstract: This invention presents an improved way to determine, nondestructively, the composition of an unknown material sample such as, for example, a steel fastener of unknown standard grade. The procedure involves subjecting one end of a standard grade steel fastener of known length and weight to a pulse of heat and subjecting an identically-sized fastener of unknown grade to the equivalent or same conditions for an interval of time for the same finite length and comparing the time varying temperature pattern at the same heated ends of each fastener. The temperature of said locations can be monitored during the time heat is applied.Type: GrantFiled: June 12, 1989Date of Patent: October 1, 1991Inventor: Francis I. Baratta
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Patent number: 5013159Abstract: Apparatus for controlling the temperature of a sample in a thermal analysis system according to a temperature-control program in order to facilitate the production of rising and falling temperatures. The apparatus includes a first heater, a thermally insulating container having an opening and containing a mass of liquified coolant, a coolant vapor flow pipe, a sample chamber for containing the sample, a second heater, a sample chamber temperature detector, a temperature-control program setting circuit, a first power supply regulator and a second power supply regulator.Type: GrantFiled: October 12, 1989Date of Patent: May 7, 1991Assignee: Seiko Instruments, Inc.Inventors: Nobutaka Nakamura, Haruo Takeda, Masafumi Take
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Patent number: 4874250Abstract: The automatic serial testing of the heats of transformation of material samples is accomplished. The samples are enclosed in capsules which are placed into sample carriers on a turntable. A transfer mechanism transfers the capsules from the turntable to a controllably heatable test sample receiver and, after the measurement, back to the turntable. The entire arrangement is located in a housing filled with nitrogen. The sample carriers with the capsules can be inserted into this housing and onto the turntable through an air lock.Type: GrantFiled: December 4, 1986Date of Patent: October 17, 1989Assignee: The Perkin-Elmer CorporationInventor: Winfried Gonner
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Patent number: 4861167Abstract: An apparatus and method for measurement of the thermal conductivity of polymer melts is disclosed. A sample of material to be measured is placed in an elongated cylindrical container and is heated to a preselected base temperature. A probe placed in the container in contact with the sample contains a transient heating element and a temperature sensor. To determine the thermal conductivity of the sample material, the transient heating element is energized and the resulting changing temperature of the sample material is measured for a short period of time. The rate of temperature change is a measure of the thermal conductivity of the sample material at the base temperature.Type: GrantFiled: September 28, 1988Date of Patent: August 29, 1989Assignee: Cornell Research Foundation, Inc.Inventors: Hubert Lobo, Kuo K. Wang
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Patent number: 4854727Abstract: An improved method and apparatus are disclosed for calibrating the emissivity characteristics of a semiconductor wafer within a processing chamber by supporting a sample wafer on a graphite susceptor within the chamber and by comparing the temperature measured within the susceptor in close proximity to the center of the wafer with the temperature measured by the emission of radiation from the surface of the wafer through the walls of the processing chamber. Temperature measurements subsequently made from the radiation emitted from the surface of similar wafers are corrected with reference to the measurement made of the temperature within the susceptor on the sample wafer.Type: GrantFiled: October 26, 1987Date of Patent: August 8, 1989Assignee: AG Processing Technologies, Inc.Inventors: Michel Pecot, Jaim Nulman
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Patent number: 4801429Abstract: A sample handling device for automatically handling a multiplicity of samples, particularly the encapsulated samples for evaluation using a differential scanning calorimeter, on an individual basis. The device comprises a vacuum means, which is capable of transferring a new sample to be substituted for a tested sample, a transfer means, which is capable of removing and replacing a cover means to allow the transfer of the new sample to be substituted for the tested sample.Type: GrantFiled: July 16, 1987Date of Patent: January 31, 1989Assignee: Dow Nederland B.V.Inventors: Jan C. M. Torfs, Johannes P. M. Laarhoven, Christiaan F. J. Van Heel
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Patent number: 4776825Abstract: In a double thermal coupled radiometer for preferable use with a centrifuge, an improved radiometer configuration is disclosed. The isothermal radiometic system improved is of the double junction variety (preferably copper-constantan-copper) and includes a black body housing defining a central concavity. The central concavity has a black body disk at the bottom thereof. The disk is preferably suspended by a copper and a constantan wire with one junction formed on the surface of the disk and the other junction formed on the surface of the housing. The improvement includes a plurality of and preferably three annular baffles defining central, circular and preferably concentric opening. These baffles are lodged in the opening of the housing above the mounted radiometer disk. The annular baffles on the side towards the radiation sources are coated as a black body so as to increase the thermal coupling of the black body housing to the ambient being radiometically observed.Type: GrantFiled: May 22, 1987Date of Patent: October 11, 1988Assignee: Beckman Instruments, Inc.Inventor: Robert Giebeler
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Patent number: 4718323Abstract: The thermal deformation of an edge-restrained plate is expressed as a deflection of the plate out of its plane. Where the plate is used as a reference plane, the deformation of the plate can be quantitatively monitored and compensated for. In the case of a radiantly heated plate, the temperature gradient adjacent an edge of the plate is a linear function of the plate deformation. With convective cooling, the temperature drop from an initial condition relates linearly to deformation. Consequently, relatively simple temperature measurements will provide the necessary information. The invention has particular application to the roof of a military tank turret that is used as a reference plane for a gun sighting system.Type: GrantFiled: April 16, 1986Date of Patent: January 12, 1988Assignee: Her Majesty the Queen in right of Canada as represented by the Minister of National DefenceInventors: David H. Gladstone, Jacques Dubois, Raymond Carbonneau, Gedeon Drouin
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Patent number: 4690569Abstract: Apparatus and method for implementing a characterized thermal profile upon a temperature/time dependent process on any material or materials susceptible to such thermal processing in accordance with a closed loop environmental feedback system and a corresponding predetermined characterized thermal profile.Type: GrantFiled: May 22, 1986Date of Patent: September 1, 1987Assignee: Qualtronics CorporationInventor: Randall C. Veitch
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Patent number: 4623263Abstract: An apparatus for the thermal measurement of the texture of a porous body, including a measuring head, a measuring assembly and a processing and control circuit. The measuring head is provided with two identical cylindrical cells, a measuring cell and a reference cell, arranged in a furnace. The measuring assembly measures the mean temperature of the measuring cell, and measures a calorific effect in the measuring cell, and includes a calorific effect detector, a calibration circuit, a temperature regulator including a furnace heater. The measuring circuit supplies a temperature signal and a calorific effect signal to the processing and control circuit, which in turn controls the heater.Type: GrantFiled: November 1, 1984Date of Patent: November 18, 1986Assignees: Commissariat a l'Energie Atomique, Centre Nationale de la Recherche ScientifiqueInventors: Paul Barberi, Pierre Bergez, Maurice Brun, Michel Chevalier, Charles Eyraud, Jean-Francois Quinson
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Patent number: 4606649Abstract: A modification to thermogravimetric analyzers with data acquisition devised to allow concurrent TG (thermogravimetry) and DTA (differential thermal analysis) measurements employs three samples mounted close to each other in a TG furnace. Two of the samples are active ones, i.e. of the material to be analyzed, and the third is a reference sample of an inert material. The first active sample is suspended from the beam of a thermobalance. The change in weight of this sample is recorded and plotted versus the temperature of the second active sample. The sample thermocouple and another identical thermocouple are placed in contact with crucibles containing the second active sample and the reference material, respectively. The differential temperature between the sample and the reference material is taken from the two identical thermocouples. The differential signal is amplified and plotted against the temperature of the second active sample.Type: GrantFiled: January 14, 1985Date of Patent: August 19, 1986Assignee: Her Majesty the Queen in right of Canada, as represented by the Minister of Energy, Mines and ResourcesInventor: Shaheer A. Mikhail
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Patent number: 4567849Abstract: For HgCdTe liquid phase epitaxy (LPE), in situ differential thermal analysis apparatus is used to precisely monitor the liquidus temperature of each HgCdTe melt. The neutral body, e.g. a slug of copper enclosed in a silica ampoule, is placed near the LPE reactor in a furnace. During heating or cooling, differential sensing of a pair of thermocouples (in the melt and in the neutral body) will show an accelerated change at transformation points, since at these points the temperature of the melt will be changed by the energy of the physical change, while that of the neutral body remains subject only to passive heat transfer. Thus, the actual liquidus temperature of each melt can be measured with extreme precision, and isothermal or programmed cooling methods of LPE can be precisely and reliably controlled under production conditions.Type: GrantFiled: May 7, 1984Date of Patent: February 4, 1986Assignee: Texas Instruments IncorporatedInventor: Chang-Feng Wan
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Patent number: 4541730Abstract: A device and process for determining the vacuum dewar heat load at cryogenic temperatures by a test made at room temperature are described. The test device comprises a heat source and integral temperature sensor mounted on a probe tip. The heat load of a test dewar at a desired test temperature (e.g. 77K) may be determined by measuring the heat load of the dewar under test at a more suitable test temperature (e.g. room temperature) and multiplying that room temperature heat load by a correlation factor. This correlation factor is empirically determined, and is dependent on the design of the test device and dewar, and the desired and actual test temperatures.Type: GrantFiled: May 19, 1983Date of Patent: September 17, 1985Assignee: Honeywell Inc.Inventors: David M. Comey, Ronald R. Kusner
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Patent number: 4518566Abstract: A measuring device for determining the concentration of an absorbable component in a gaseous mixture includes a vertically oriented tubular housing, a vertical hollow tube positioned within the housing and having a heat conducting wall and an open mouth at its upper end; a stub connected to the lower end of the vertical tube for passing a stream of liquid absorbent upwardly through the vertical tube so as to form a free surface area above the mouth of the tube, the liquid absorbent overflowing along the outside of the hollow tube; a stub connected to the housing at a point above the upper end of the vertical tube therein for passing a flow of gaseous mixture past the free surface of the absorbent; a first temperature sensor within the vertical tube adjacent the mouth thereof and covered by the liquid absorbent flowing out of the mouth of the tube; and a second temperature sensor located within the housing to measure the temperature of the gaseous mixture immediately before it contacts the liquid absorbent atType: GrantFiled: May 19, 1983Date of Patent: May 21, 1985Inventor: Ansgar C. H. Sorensen
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Patent number: 4492480Abstract: Probe (1) to be used in a microcalorimeter for various types of heat measurements. The probe having a good thermal contact with thermodetectors (5,6) used in the calorimeter. The probe is designed as a substantially cylindrical hollow body has at least one outer surface (4, 11) which is in contact with the thermodetectors. The outer surface of the probe is provided with a helix groove (2) in which a tube (3) for supplying the continuous flows is arranged in good thermal contact with the probe. The cavity (10) of the body is used for the introduction of the ampoules (9).Type: GrantFiled: March 28, 1984Date of Patent: January 8, 1985Inventors: Ingemar Wadso, Jaak Suurkuusk, Robert L. Taylor
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Patent number: 4468135Abstract: A device is provided which simulates heat transfer into a flexible pouch in which food or like product is cooked and sterilized. The simulator is a block of polymeric material having a thickness approximately that of a food pouch and a thermal diffusivity generally equal to or slightly above that of food product. A thermal sensor is disposed centrally within the block of polymer material and is connected to electrical leads extending externally of the retort to apparatus that records temperature change as a function of time. A plurality of simulators are placed at various regions in the retort, and the uniformity of the heat transfer under certain operating conditions is determined by measuring the heating rates of the several simulators. Operating conditions, such as flow rates or location of introduction of water, steam and air are changed until a sufficiently uniform heat transfer environment is achieved.Type: GrantFiled: February 1, 1983Date of Patent: August 28, 1984Assignee: Kraft, Inc.Inventors: George R. McCain, Philip H. Blaetz
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Patent number: 4419020Abstract: An apparatus for use in combination with a differential thermal analyzer includes a support member which provides at least two tangential points of contact for each of the two support columns of the instrument. Additional points of contact can also be provided by a spring clip to further secure the proper spacing of the columns.Type: GrantFiled: March 31, 1981Date of Patent: December 6, 1983Inventors: Harold I. Hill, Roger W. Targowski
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Patent number: 4368991Abstract: The invention relates to an apparatus for differential thermal analysis, consisting of a furnace with holders to receive vessels sealed on all sides for samples and reference substances and with temperature sensors, which are in good thermal contact with the vessels, characterized in that the holders consist of a metal cylinder open on one side, whose inner diameter is adjusted to the outer diameter of the vessels, and whose bottom is in good thermal contact via a base plate with the furnace, and sensors arranged on the base plate in the immediate vicinity of the cylinder bottom.Type: GrantFiled: January 30, 1981Date of Patent: January 18, 1983Assignee: Gunter HentzeInventor: Gunter Hentze