Using Thermo-luminescent Materials (epo) Patents (Class 374/E11.024)
  • Patent number: 8434939
    Abstract: The present invention relates to a method of measuring a temperature and/or temperature distribution at a resolution <1 &mgr; m in an object and to a device for performing such method, more particularly to a microscope for performing such method. The method comprises applying a molecular thermometer embedded in a matrix layer on an object, photoexciting the said molecular thermometer with a light source of said microscope and measuring emission of radiation from said molecular thermometer with two photodetectors of said microscope. A first intensity at a first wavelength is measured by said first detector, a second intensity at a second wavelength is measured by said second.detector, and a ratio of said intensities is calculated and used to determine a temperature with a calibrated curve. Said microscope is a confocal microscope or a stimulated emission depletion (STED) microscope.
    Type: Grant
    Filed: December 12, 2007
    Date of Patent: May 7, 2013
    Assignee: Sony Deutschland GmbH
    Inventors: Tzenka Miteva, Gabriele Nelles, Akio Yasuda
  • Publication number: 20110069735
    Abstract: A system for and method of determining thermal history of components which are subjected to high-temperature environments, such as in boilers, fuel cells, furnaces, engines and gas turbines, and temperature-monitoring materials and coatings for use in such a system and method.
    Type: Application
    Filed: December 31, 2008
    Publication date: March 24, 2011
    Inventors: Jörg Peter Feist, John Rayment Nicholls, Andrew Lawrence Heyes
  • Publication number: 20100124250
    Abstract: The present invention relates to an apparatus, which works according to galvanic principles, in particular to a lithium-ion accumulator or, respectively, a lithium-ion cell, with at least two electrode devices (10; 20), in particular, a cathode and an anode, in particular, a separator device (30), arranged between two electrode devices, the apparatus (2) comprises, according to the invention, at least one or a plurality of glass fibers (18, 28, 38) which are configured or, respectively, operable as temperature sensor. It can comprise a net (16, 26, 36) formed by glass fibers, or an arrangement of a plurality of glass fibers, which are arranged substantially in parallel to each other, wherein at least one glass fiber (18, 28, 38) is configured or operable as temperature sensor.
    Type: Application
    Filed: November 16, 2009
    Publication date: May 20, 2010
    Inventors: Walter Lachenmeier, Tim Schäfer, Andreas Gutsch
  • Publication number: 20100008394
    Abstract: The present invention relates to a method of measuring a temperature and/or temperature distribution at a resolution <1 &mgr; m in an object and to a device for performing such method, more particularly to a microscope for performing such method. The method comprises applying a molecular thermometer embedded in a matrix layer on an object, photoexciting the said molecular thermometer with a light source of said microscope and measuring emission of radiation from said molecular thermometer with two photodetectors of said microscope. A first intensity at a first wavelength is measured by said first detector, a second intensity at a second wavelength is measured by said second.detector, and a ratio of said intensities is calculated and used to determine a temperature with a calibrated curve. Said microscope is a confocal microscope or a stimulated emission depletion (STED) microscope.
    Type: Application
    Filed: December 12, 2007
    Publication date: January 14, 2010
    Applicant: SONY DEUTSCHLAND GMBH
    Inventors: Tzenka Miteva, Gabriele Nelles, Akio Yasuda
  • Publication number: 20090022205
    Abstract: Temperature probes for measuring the temperature of objects are disclosed. The temperature probes include a housing and a tip in thermal contact with an end of the housing. The tip is adapted to contact a surface of the object whose temperature is to be measured by the temperature probe. A portion of the housing in contact with the tip has a high thermal resistance effective to thermally isolate the tip from an adjacent portion of the housing. A sensor is located inside of the housing and adapted to measure the temperature of the tip.
    Type: Application
    Filed: July 19, 2007
    Publication date: January 22, 2009
    Applicant: Lam Research Corporation
    Inventor: Keith Comendant