Tool, Workpiece, Or Mechanical Component Inspection Patents (Class 382/152)
  • Patent number: 7330583
    Abstract: Integrated inspection and test systems for liquid crystal display (LCD) active plates. The integrated inspection and test systems may combine visual imaging inspection and an electronic sensing such as voltage imaging, electron beam sensing or charge sensing, in which the potential defect information obtained by the visual inspection system is combined with the potential defect information obtained by the electronic sensing system to produce a defect report. One or more high-resolution visual cameras are scanned over a stationary plate, and the image data from the camera(s) is processed to detect potential defects. A high-resolution electronic sensing system examines the stationary plate, and the image data from the sensor(s) is processed to detect potential defects. The potential defects from the visual image data and electronic sensing image data are processed to produce the final defect information.
    Type: Grant
    Filed: August 19, 2002
    Date of Patent: February 12, 2008
    Assignee: Photon Dynamics, Inc.
    Inventors: Bernard T. Clark, David L. Freeman, Jeffrey A. Hawthorne, Alexander J. Nagy, William K. Pratt
  • Patent number: 7327857
    Abstract: A non-contact imaging apparatus for examining an object having complex surfaces or shape deformations. The imaging apparatus includes at least one imaging device for obtaining a scanned image of the exterior surfaces of the object being examined. A predetermined reference image) of an ideal model for the object is stored in a memory. An image register is coupled to the imaging device and to the memory containing the reference image of the ideal model for the object. A transformation estimator compares the scanned image to the reference image and provides a transform which maps the scanned image to the reference image and provides a set of registered object data points. One or more filter modules process the registered object data points with a priori information to reduce noise and to further enhance the accuracy and precision of the registration. A gauge estimator is coupled to the filter module.
    Type: Grant
    Filed: March 9, 2004
    Date of Patent: February 5, 2008
    Assignee: General Electric Company
    Inventors: Thomas Watkins Lloyd, Jr., Joseph Benjamin Ross, Glen William Brooksby, Van-Duc Nguyen, John Lewis Schneiter, Steven Jeffrey Gordon, Faycal Benayad-Cherif, Victor Nzomigni, Donald Hamilton
  • Patent number: 7324681
    Abstract: The present invention is directed to solving the problems associated with the detection of surface defects on metal bars as well as the problems associated with applying metal flat inspection systems to metal bars for non-destructive surface defects detection. A specially designed imaging system, which is comprised of a computing unit, line lights and high data rate line scan cameras, is developed for the aforementioned purpose. The target application is the metal bars (1) that have a circumference/cross-section-area ratio equal to or smaller than 4.25 when the cross section area is unity for the given shape, (2) whose cross-sections are round, oval, or in the shape of a polygon, and (3) are manufactured by mechanically cross-section reduction processes. The said metal can be steel, stainless steel, aluminum, copper, bronze, titanium, nickel, and so forth, and/or their alloys. The said metal bars can be at the temperature when they are being manufactured.
    Type: Grant
    Filed: August 2, 2005
    Date of Patent: January 29, 2008
    Assignee: OG Technologies, Inc.
    Inventors: Tzyy-Shuh Chang, Daniel Gutchess, Hsun-Hau Huang
  • Patent number: 7313263
    Abstract: According to a measuring method, shapes of two mechanical parts of a measuring object are shot by a camera at their respective axial both ends so that image information of the shapes are obtained. Then a center coordinate of the detected shape is respectively calculated from the image information, and positions of the axial lines for the two mechanical parts are calculated from the calculated center coordinates, and finally the calculated position of the axial line is compared with the calculated position of the other axial line in a certain determination area, to determine the coaxial relation between the two mechanical parts.
    Type: Grant
    Filed: September 2, 2004
    Date of Patent: December 25, 2007
    Assignee: DENSO Corporation
    Inventors: Kazunori Mizutori, Tatsuya Nakagi
  • Patent number: 7310566
    Abstract: A quality control method for two-dimensional matrix codes on metallic workpieces, the codes being in the form of stamped marking dots is disclosed. The stamping process for the marking dots is carried out by a marking tool (17) with the aid of predetermined digital positional data. The corresponding image data is then recorded for analysis by an image processing device (22), exclusively at the locations that have been predetermined by the positional data, or additional image data that has been previously generated is also used for the analysis, to establish whether a correct marking dot with the required quality characteristics is present.
    Type: Grant
    Filed: November 6, 2003
    Date of Patent: December 18, 2007
    Assignee: Borries Markier-Systeme GmbH
    Inventor: Konrad Fröhlich
  • Patent number: 7308130
    Abstract: Provided is a machine and a method for inspecting an input shaft of a power system. First an second cameras take a photograph of first and second champer of the input shaft from directions perpendicular to the chamfers to capture image data of the chamfers. The input shaft is rotated by an indexing drive until overlapping a central line of first and second chamfers of an input shaft on a standard line of image array coordinate system of a computer. Then, widths of the first and second chamfers of the input shaft is calculated. Thereafter, the indexing drive rotates the input shaft by predetermined degrees. The computer processes image data of another first and second chamfers captured by the first and second cameras and calculates widths of the another first and second chamfers. Continuously, widths of remaining chamfers of the input shaft are calculated.
    Type: Grant
    Filed: November 30, 2002
    Date of Patent: December 11, 2007
    Assignee: SNU Precision Co., Ltd.
    Inventors: Heui-Jae Pahk, Moon-Tae Hwang, Jin-Ki Kim
  • Patent number: 7305119
    Abstract: Apparatus for simultaneously optically inspecting top and bottom surfaces of a workpiece comprise upper and lower test heads, each head comprising at least one laser for providing a laser beam that scans its associated workpiece surface and at least one detector for detecting reflected laser light. The directions of the laser beams are selected so as to reduce or prevent cross-talk interference between the upper and lower test heads.
    Type: Grant
    Filed: April 22, 2005
    Date of Patent: December 4, 2007
    Assignee: Komag, Inc.
    Inventors: David Treves, Thomas A. O′Dell
  • Patent number: 7305118
    Abstract: An improved method and device for reflectively measuring a subject such as a throat area in a vane ring for a gas turbine engine uses improved lighting arrangements to improve the quality of reflection to thereby reduce problems associated with poor quality reflection which may adversely affect the image processing and thus reduce the accuracy of measurement.
    Type: Grant
    Filed: October 22, 2004
    Date of Patent: December 4, 2007
    Assignee: Pratt & Whitney Canada Corp.
    Inventors: Pierre Leboeuf, Nicolas Gauthier
  • Publication number: 20070217672
    Abstract: An inspection apparatus (10) applying two dimensional nondestructive examination images onto a three dimensional solid model of a component (12) to display a virtual component (73) that may be manipulated to perform a nondestructive inspection. The two dimensional nondestructive examination images may be acquired from a plurality of views of the component in order to provide full coverage of the surface to be inspected, with appropriate stitching of images in regions of overlap between adjacent views. The two dimensional images (62) may be color or black and white photographs or ultraviolet or infrared images, for example. Multiple types of nondestructive examination images, results of inspection data evaluations, and design, operational and/or maintenance information may be displayed separately or jointly on the three dimensional solid model.
    Type: Application
    Filed: June 19, 2006
    Publication date: September 20, 2007
    Inventors: Robert E. Shannon, Clifford Hatcher, Claudio Laloni, Frank Forster, Fredrick M. Davis
  • Patent number: 7266420
    Abstract: The invention describes a method for the inspection of machining tools used in computational numerical control (CNC) machining centers. The invention will observe a machining tool immediately after use to determine if it has been damaged. The invention is based on a machine vision technology that uses one or more image sensors to acquire, locate and compare the tool to a good model. The inspection equipment is designed for implementation in the CNC automatic tool changing system and will alert the operator that tool has been damaged before the next operation. This immediate response of the invention will contain defect components and prevent damage to subsequent components. With the addition of an infrared image sensor the invention is capable of detecting worn or dull tools that may damage a component due to excessive heating.
    Type: Grant
    Filed: April 2, 2005
    Date of Patent: September 4, 2007
    Inventor: Gerald Walter Budd
  • Patent number: 7245759
    Abstract: The present invention relates to novel automated inspection systems and related methods of use. In particular, the present invention provides an automated threaded fastener inspection system, and related methods of use. Furthermore, the present invention provides systems and methods for identifying damaged threaded fasteners prior to industrial use.
    Type: Grant
    Filed: October 30, 2003
    Date of Patent: July 17, 2007
    Assignee: Illinois Tool Works Inc
    Inventors: James D. Jones, Jr., Daniel A. Dechant
  • Publication number: 20070160283
    Abstract: Apparatus for high resolution processing of a generally planar workpiece having microscopic features to be imaged, comprising a video camera acquiring at least two candidate images of a microscopic portion on generally planar workpiece; a motion controller operative to effect motion, relative to the workpiece, of at least an optical element of the video camera along an optical axis extending generally normally to a location on a surface of the workpiece, the video camera acquiring the at least two candidate images at selected time intervals, each of the at least two candidate images differing by at least one image parameter; an image selector operative to select an individual image from among the at least two candidate images according to predefined criteria of image quality; and a selected image analyzer operative to analyze at least a portion of the individual image selected by the image selector.
    Type: Application
    Filed: January 11, 2006
    Publication date: July 12, 2007
    Inventors: Ofer Saphier, Raanan Adin, David Fisch
  • Patent number: 7233867
    Abstract: An eddy current inspection system and method for inspecting a component is provided. The system includes an eddy current probe for sensing eddy currents from the component and an analog to digital converter configured for converting eddy currents to digital signals. The system also includes a processor configured for generating an eddy current image from the digital signals and pre-processing the image to enhance a quality of the image. The processor is configured to identify regions displaying flaw patterns and calculating a defect characterizing parameter for the identified regions.
    Type: Grant
    Filed: April 6, 2005
    Date of Patent: June 19, 2007
    Assignee: General Electric Company
    Inventors: Preeti Pisupati, Gigi Olive Gambrell, Shyamsunder Tondanur Mandayam, Amitabha Dutta
  • Patent number: 7215808
    Abstract: Disclosed is an image processing system for analyzing images of a specimen to determine whether the specimen contains defects. The system includes a plurality of processors for receiving image data from a specimen and for analyzing one or more selected patch(es) of such image data to determine whether the specimen has a defect. The system also includes a plurality of buses for coupling the processors together, wherein the bus has the following specifications: a data rate of about 50 gigabits per second or more and an error rate less than about 10?16. In one implementation, the buses are low voltage differential signal type buses, and in another implementation, the buses are hyper transport type buses.
    Type: Grant
    Filed: June 2, 2004
    Date of Patent: May 8, 2007
    Assignee: KLA-Tencor Technologies Corporation
    Inventor: Lawrence R. Miller
  • Patent number: 7201032
    Abstract: A metal sheet-receiving system for receiving parts and feeding a metal sheet-folding machine, particularly a folding press comprising at least one manipulator for seizing and moving metal sheet parts with a gripper head fitted with gripping means; an electronic controlling device for controlling the movements of the manipulator; as well as a measuring system for determining the position of the metal sheet parts. The measuring system is formed by an optoelectronic measuring device, particularly an image acquisition means, and a transillumination platform.
    Type: Grant
    Filed: March 4, 2005
    Date of Patent: April 10, 2007
    Assignee: Trumpf Maschinen Austria GmbH & Co. KG
    Inventor: Dieter Pfitzner
  • Patent number: 7177459
    Abstract: A robot system having an image processing function capable of detecting position and/or posture of individual workpieces randomly arranged in a stack to determine posture, or posture and position of a robot operation suitable for the detected position and/or posture of the workpiece. Reference models are created from two-dimensional images of a reference workpiece captured in a plurality of directions by a first visual sensor and stored. Also, the relative positions/postures of the first visual sensor with respect to the workpiece at the respective image capturing, and relative position/posture of a second visual sensor to be situated with respect to the workpiece are stored. Matching processing between an image of a stack of workpieces captured by the camera and the reference models are performed and an image of a workpiece matched with one reference model is selected.
    Type: Grant
    Filed: April 10, 2000
    Date of Patent: February 13, 2007
    Assignee: Fanuc Ltd
    Inventors: Atsushi Watanabe, Taro Arimatsu
  • Patent number: 7177460
    Abstract: A sophisticated surveying instrument consists of a workbench, a coordinate board and two optical sensors. The workbench fastened to a coordinate board with several square grids of equal size forms a connected surveying instrument. Inside the grid there is a readable icon recognizable for the apex coordinate. One of the two optical sensors projects against the workbench to define the starting point and end point of the object while the other against the coordinate, so as to identify the recognizable icon within the projected pixel block on the coordinate board and enter the projected image into an electronic computer for comparison, analysis and conversion, thus identifies the position of the pixel block's center on the coordinate board, defining the corresponding value of the starting point and end point.
    Type: Grant
    Filed: March 11, 2003
    Date of Patent: February 13, 2007
    Inventor: Chun-Yun Hsu
  • Patent number: 7164783
    Abstract: An object inspection system includes an object feeding device, a positioning device including a rotatable wheel with a peripheral edge face formed with retaining grooves for positioning objects from the feeding device, an image recognition detector for detecting a side portion of the object in each of the retaining grooves so as to generate image data, and an image processing device for receiving and converting the image data into a set of calculated dimensions and for comparing the set of calculated dimensions with a set of preset dimensions so as to generate a first signal or a second signal. First and second object removing member are controlled by the first and second signals, respectively, to remove the objects from the positioning device.
    Type: Grant
    Filed: April 4, 2003
    Date of Patent: January 16, 2007
    Assignee: Ming Liau Co., Ltd.
    Inventors: Wen-Jui Yang, Ming-Liau Yang
  • Patent number: 7132225
    Abstract: A method for forming imprint lithography templates is described herein. The method includes forming a masking layer and a conductive layer on a substrate surface. The use of a conductive layer allows patterning of the masking layer using electron beam pattern generators. The substrate is etched using the patterned masking layer to produce a template.
    Type: Grant
    Filed: November 13, 2002
    Date of Patent: November 7, 2006
    Assignee: Molecular Imprints, Inc.
    Inventor: Ronald D. Voisin
  • Patent number: 7120288
    Abstract: The present invention relates to an accuracy analyzing apparatus which is capable of efficiently analyzing accuracies of a machine tool including the perpendicularity of a spindle axis and the thermal displacement of a spindle with a higher level of accuracy at lower costs. The accuracy analyzing apparatus (1) comprises a laser oscillator (2) attached to the spindle (26) for emitting a laser beam having a light axis perpendicular to the spindle axis, an imaging device (5, 8) having a light receiving section (5) disposed in the vicinity of the laser oscillator (2) for receiving the laser beam from the laser oscillator (2) by the light receiving section (5) and generating two-dimensional image data, and an analyzer (15) for analyzing the accuracies of the machine tool (20) on the basis of the generated image data.
    Type: Grant
    Filed: January 8, 2003
    Date of Patent: October 10, 2006
    Assignees: Mori Seiki Co., Ltd., Intelligent Manufacturing Systems International
    Inventor: Makoto Fujishima
  • Patent number: 7120524
    Abstract: A carriage moves back and forth under a vehicle and three cameras or laser fixed along one axis pivot in a common plane, utilizing two cameras at time to locate a target fixed to a reference point on the undercarriage of the vehicle. Triangulation calculations, combined with the location of the cameras provide the location of the reference point in space in a three-dimensional coordinate system and compare that location with a stored designed location of the reference point prior to the crash, allowing the vehicle structure to be returned to its designed shape by other equipment.
    Type: Grant
    Filed: October 27, 2004
    Date of Patent: October 10, 2006
    Assignee: Matrix Electronic Measuring, L.P.
    Inventors: Robert W. Srack, Dwight Day
  • Patent number: 7116839
    Abstract: A method and device for optically measuring throat area in a vane ring for a gas turbine engine, the method according to one aspect of the invention following the steps of: placing the vane ring on a fixture with the periphery of each throat within an optical measuring field of view; positioning a primary radiation source to cast an area of shadow on the vane ring delineating the throat as a dark area surrounded by an area of reflectance; capturing an image of the dark area with a radiation detector; analyzing the image to acquire a dimensional data of the dark area, proportional to the absolute value of throat dimensions; progressively capturing and analyzing images from each of the individual throats; then processing and calibrating the dimensional data of each image to account for scaling and viewing direction (perspective distortion) to acquire an absolute value for the composite throat area of the vane ring.
    Type: Grant
    Filed: October 16, 2002
    Date of Patent: October 3, 2006
    Assignee: Pratt & Whitney Canada Corp.
    Inventor: Pierre Leboeuf
  • Patent number: 7085400
    Abstract: Apparatus and methods are disclosed for the calibration of a tracked imaging probe for use in image-guided surgical systems. The invention uses actual image data collected from an easily constructed calibration jig to provide data for the calibration algorithm. The calibration algorithm analytically develops a geometric relationship between the probe and the image so objects appearing in the collected image can be accurately described with reference to the probe. The invention can be used with either two or three dimensional image data-sets. The invention also has the ability to automatically determine the image scale factor when two dimensional data-sets are used.
    Type: Grant
    Filed: June 14, 2000
    Date of Patent: August 1, 2006
    Assignee: Surgical Navigation Technologies, Inc.
    Inventors: Troy Holsing, Gordon Goodchild
  • Patent number: 7068808
    Abstract: Systematic use of infrared imaging characterizes marks made on items and identifies the particular marking tool with better accuracy than use of visual imaging. Infrared imaging performed in total darkness eliminates shadows, glint, and other lighting variations and artifacts associated with visible imaging. Although normally used to obtain temperature measurements, details in IR imagery result from emissivity variations as well as thermal variations. Disturbing an item's surface texture creates an emissivity difference producing local changes in the infrared image. Identification is most accurate when IR images of unknown marks are compared to IR images of marks made by known tools. However, infrared analysis offers improvements even when only visual reference images are available.
    Type: Grant
    Filed: June 10, 1999
    Date of Patent: June 27, 2006
    Inventor: Francine J. Prokoski
  • Patent number: 7065241
    Abstract: The invention relates to an apparatus and a method for monitoring a detection region of a working element (100). The apparatus has at least one camera for continuously monitoring the detection region, and an evaluation unit (53), into which image information generated by the camera is read. In the evaluation unit (53), a comparison of the image information to reference images, and/or a color-feature analysis, allows the detection of endangered objects within at least one protection zone in the detection region. If at least one endangered object is detected inside the protection zone, the evaluation unit (53) disables the working element (100). In contrast, if no endangered object (54) is located inside the protection zone, the evaluation unit (53) enables the working element (100).
    Type: Grant
    Filed: January 8, 2001
    Date of Patent: June 20, 2006
    Assignee: Leuze lumiflex GmbH & Co.
    Inventors: Werner Lehner, Anton Kummert, Jörg Velten
  • Patent number: 7043072
    Abstract: Provided herein are a method and an apparatus for examining foreign matters in through holes, which can quickly conduct an examination of foreign matter in through holes with low costs and high accuracy. Light passing through a plurality of through holes having a uniform size is simultaneously taken as image data, the number of areas of the imaged masses corresponding to the plurality of the respective through holes is initially counted, and a process to determine presence or absence of foreign matters is conducted by mutually comparing areas of adjacent masses for only a work piece with a counted value of the masses being concurred with a specified value.
    Type: Grant
    Filed: March 29, 2001
    Date of Patent: May 9, 2006
    Assignee: Seiko Epson Corporation
    Inventors: Noboru Goto, Mikio Saito
  • Patent number: 7036232
    Abstract: A laser apparatus for monitoring the rails of a railway or tramway line, characterized by comprising at least two measurement units mounted on a railway or tramway carriage and operating at last on the inner part of the two rails, along with said carriage is made to advance, and a unit for processing the signals transmitted by said measurement units, each of which comprises at least one triangulation reading device.
    Type: Grant
    Filed: May 11, 2001
    Date of Patent: May 2, 2006
    Assignee: Tecnogamma S.p.A.
    Inventor: Ettore Casagrande
  • Patent number: 7027640
    Abstract: The present invention provides an apparatus and method for detecting or inspecting defects on a polishing pad for use in performing chemical mechanical polishing of a wafer. The apparatus for detecting the defects on the pad comprises a pad driving device for loading the pad thereon and moving the pad, at least one camera installed to face the pad for converting an image of the pad into an electrical signal and outputting the converted electrical signal, a digital image data acquisition device for converting the electrical signal transmitted from the camera into a digital signal, and an image data processing unit for processing the image data and detecting the defects on the pad.
    Type: Grant
    Filed: August 23, 2002
    Date of Patent: April 11, 2006
    Assignee: Nanometrics Incorporated
    Inventors: Sung-Jin Park, Chan-Ho Ryu
  • Patent number: 7020324
    Abstract: A method for measuring the thickness of a tube wall comprising mounting a cut tube onto a rod is disclosed. At least two contact tips are moved into contact with the tube. The tips are imaged with an optical system when the tips are in contact with the cut tube. The optical image is converted into a measurement.
    Type: Grant
    Filed: August 16, 2002
    Date of Patent: March 28, 2006
    Inventor: Daniel Freifeld
  • Patent number: 7016525
    Abstract: Systems and methods for operating a vision system to provide a desired illumination wavelength for an inspection operation on workpiece include illuminating a workpiece using narrowband illumination from a continuously variable filter, and modifying the narrowband illumination and evaluating resulting images until a narrowband illumination is found that reliably supports the inspection operation. The initial narrowband illumination may be based on spectral sensing.
    Type: Grant
    Filed: May 2, 2002
    Date of Patent: March 21, 2006
    Assignee: Mitutoyo Corporation
    Inventor: Paul G. Gladnick
  • Patent number: 6992315
    Abstract: A system (10) for imaging a combustion turbine engine airfoil includes a camera (12) and a positioner (24). The positioner may be controlled to dispose the camera within an inner turbine casing of the engine at a first position for acquiring a first image. The camera may then be moved to a second position for acquiring a second image. A storage device (30) stores the first and second images, and a processor (32) accesses the storage device to generate a composite image from the first and second images. For use when the airfoil is rotating, the system may also include a sensor (40) for generating a position signal (41) responsive to a detected angular position of an airfoil. The system may further include a trigger device (42), responsive to the position signal, for triggering the camera to acquire an image when the airfoil is proximate the camera.
    Type: Grant
    Filed: March 10, 2004
    Date of Patent: January 31, 2006
    Assignee: Siemens Westinghouse Power Corporation
    Inventor: Michael Twerdochlib
  • Patent number: 6993178
    Abstract: A lifetime evaluating system includes a digitalizing unit, an acquiring unit and a determining unit. The digitalizing unit digitizes an original metallographic image of a mechanical element to form a digital image. The acquiring unit acquires a plurality of labels from the digital image. Here, each of the plurality of labels is a set of pixels with a predetermined property. The determining unit classifies the plurality of labels into a class of voids and a class of non-voids based on evaluation data. A lifetime of the mechanical element is determined based on a number of labels in the void class and a size of each of the labels in the void class.
    Type: Grant
    Filed: April 5, 2002
    Date of Patent: January 31, 2006
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventors: Masashi Ozaki, Nobuhiko Nishimura, Nobuya Yoshimoto, Shintaro Kumano, Naoto Kawase
  • Patent number: 6987876
    Abstract: Systems and methods where a lighting configuration of a vision system is determined using a controllable lighting system and at least one image evaluation tool. The lighting configuration is usable to obtain a desired inspection image of at least one feature of a workpiece Base images are obtained using actual illumination settings of the controllable lighting system. Simulated or synthetic sets image results are generated, based on base images and synthetic lighting configurations. The synthetic lighting configurations include at least one illumination setting which is different from the actual illumination settings used to obtain one or more component base images. A best actual or synthetic lighting configuration is chosen based on the best corresponding set of image results.
    Type: Grant
    Filed: August 6, 2001
    Date of Patent: January 17, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Andrew D. Silber, Richard M. Wasserman
  • Patent number: 6987877
    Abstract: A method for superimposing graphic representations of ground locations onto images of ground locations after detecting the presence of material failure(s) or failures in man-made structures in such ground locations including providing an image sensor spaced remotely from the ground and which sequentially captures a number of images of various ground locations to provide digital images of such ground locations; processing captured digital images to determine the presence of a potential material failure in a man-made structure in accordance with predetermined coordinate positions which locate the man-made structures in one or more of the captured digital images; identifying reference points in the ground locations corresponding to the same reference points in the graphic representations of the ground location; and superimposing the graphic representation with the reference points onto at least one of the captured digital images.
    Type: Grant
    Filed: October 30, 2001
    Date of Patent: January 17, 2006
    Assignee: ITT Manufacturing Enterprises, Inc.
    Inventors: Gustavo R. Paz-Pujalt, John P. Spoonhower, David A. Parkes
  • Patent number: 6980688
    Abstract: A method for investigating structural integrity utilizes a carrier member having a flexible surface and a plurality of electromechanical transducer elements attached to the carrier member, the transducer elements being spaced from each other along at least two spatial dimensions. The method includes conforming the flexible surface to a solid structural member, so that a substantial portion of the flexible member is in effective wave-transmitting engagement with the structural member, thereafter transmitting pressure waves from at least one of the transducer elements into the structural member, receiving pressure waves reflected from an internal structural defect in the structural member in response to the pressure waves transmitted from the one of the transducer elements, and analyzing the received pressure waves so as to detect the structural defect.
    Type: Grant
    Filed: January 12, 2004
    Date of Patent: December 27, 2005
    Assignee: Wilk Patent Development Corporation
    Inventor: Peter J. Wilk
  • Patent number: 6970590
    Abstract: Apparatus and a method for locating edges of a part for acceptance testing of the part. A white light source (12) illuminates the part which is mounted on a support (14) and rotated relative to the light source. Light reflected by the part creates an outline of the part along the edge thereof. The part is viewed by a camera (16) to obtain an image of the part including its edge. A processor (18) analyzes the image to locate the edge of the part in three dimensional space. Analysis of the image includes determining the number of pixels comprising the viewed image, at the edge thereof, as the part is rotated relative to the light source. The part has more than one edge, and each edge is located using the method. The locations of the edges of the part are now used in a co-ordinate system to locate other surface features of the part.
    Type: Grant
    Filed: March 28, 2002
    Date of Patent: November 29, 2005
    Assignee: General Electric Company
    Inventor: Kevin George Harding
  • Patent number: 6968080
    Abstract: A method of generating a part program for use in an image-measuring system and in an image-measuring instrument is provided. The method can be employed easily by an operator without complicated operations to efficiently generate a part program for a CNC image-measuring instrument. This method facilitates the operator to visually identify a work to be measured, through reading CAD data of the work; setting measurement conditions and a positioning coordinate system; calculating a size of the work when it is practically imaged; and displaying an image of the CAD data with the same size. Then, through setting tolerance information; and selecting an objective graphic to be measured, an edge detection tool is placed for a graphic element of the objective graphic selected.
    Type: Grant
    Filed: May 10, 2001
    Date of Patent: November 22, 2005
    Assignee: Mitutoyo Corporation
    Inventors: Akira Takada, Kozo Ariga
  • Patent number: 6950546
    Abstract: The present invention is directed to solving the problems associated with the detection of surface defects on metal bars as well as the problems associated with applying metal flat inspection systems to metal bars for non-destructive surface defects detection. A specially designed imaging system, which is comprised of a computing unit, line lights and high data rate line scan cameras, is developed for the aforementioned purpose. The target application is the metal bars (1) that have a circumference/cross-section-area ratio equal to or smaller than 4.25 when the cross section area is unity for the given shape, (2) whose cross-sections are round, oval, or in the shape of a polygon, and (3) are manufactured by mechanically cross-section reduction processes. The said metal can be steel, stainless steel, aluminum, copper, bronze, titanium, nickel, and so forth, and/or their alloys. The said metal bars can be at the temperature when they are being manufactured.
    Type: Grant
    Filed: December 27, 2002
    Date of Patent: September 27, 2005
    Assignee: OG Technologies, Inc.
    Inventors: Tzyy-Shuh Chang, Daniel Gutchess, Hsun-Hau Huang
  • Patent number: 6950552
    Abstract: A scanning system and method for locating a point within a region. The method may: 1) determine or locate a region of interest in the region; 2) determine one or more characteristics of the region of interest within the region, wherein the region of interest includes the point of interest; 3) determine a continuous trajectory based on the one or more characteristics of the region of interest; 4) measure the region of interest at a plurality of points along the continuous trajectory to generate a sample data set; 5) perform a surface fit of the sample data set using the approximate model to generate a parameterized surface; and 6) calculate a location of the point of interest based on the parameterized surface. The method may include measuring the region at and/or near the calculated location to confirm the solution, and may also include generating output comprising the results.
    Type: Grant
    Filed: June 8, 2001
    Date of Patent: September 27, 2005
    Assignee: National Instruments Corporation
    Inventors: Dinesh Nair, Ram Rajagopal, Lothar Wenzel
  • Patent number: 6922903
    Abstract: A method and device for determining the length (b) of at least one of two legs (13, 14), of a workpiece (12) bent toward each other at a bending angle (?) requires location of the workpiece (12) in a defined position. The position of the bending angle vertex (S) and the position of the end (E) of the leg (13, 14) to be measured are determined. Based on the position of the bending angle vertex (S) and of the end (E), the length (b) is calculated as the distance between the bending angle vertex (S) and the end (E). The measuring apparatus includes a system serving to determine the position of the bending angle vertex (S), a unit serving to determine the position of the end (E) and an evaluation unit which, based on the position of the bending angle vertex (S) and of the end (E), calculates the length (b) as the distance between the bending angle vertex (S) and the end (E).
    Type: Grant
    Filed: September 11, 2003
    Date of Patent: August 2, 2005
    Assignee: Trumpf Werkzeugmaschinen GmbH+Co. KG
    Inventor: Armin Horn
  • Patent number: 6917700
    Abstract: A certain percentage of sheet metal blanks (20) for cars are not bounded by straight cuts. These so-called contour blanks are cut by form dies to optimize material usage of sheet metal coils. During the tryout process of the press tools the final contour for the blanks is determined in an iterative process. The manually size-optimized blank contour has to be digitized for blank nesting and the construction of a form die to cut the blank from the coil in production. The present invention discloses a low-cost measurement system based on a digital camera (21). This camera allows taking pictures of blanks (20) on-site in the plant and process them off-line to regenerate geometrical information by use of photogrammetric principles. This method yields a significant reduction of lead-time by eliminating the need for a slow coordinate measuring machine (CMM).
    Type: Grant
    Filed: June 22, 2001
    Date of Patent: July 12, 2005
    Assignee: Ford Global Technologies, LLC
    Inventors: Heinrich Schuler, Udo Mattes
  • Patent number: 6909800
    Abstract: The present invention relates to processes and systems for locating coated cooling holes on parts such as turbine vanes. In a first embodiment of the present invention, a thermal imaging technique is utilized to obtain the locations of the cooling holes on a turbine vane. In a second embodiment of the present invention, a laser scanning technique is utilized to obtain the locations of the cooling holes on a turbine vane.
    Type: Grant
    Filed: December 15, 2000
    Date of Patent: June 21, 2005
    Assignee: United Technologies Corporation
    Inventor: Janakiraman Vaidyanathan
  • Patent number: 6909801
    Abstract: A system and method for generating a curve, such as a Low Discrepancy Curve, on a surface, such as an abstract surface with a Riemannian metric. The system may comprise a computer which includes a CPU and a memory medium which is operable to store one or more programs executable by the CPU to perform the method. The method may: 1) parameterize the surface; 2) select a curve, such as a Low Discrepancy Curve, in a parameter space, for example, a simple space such as a unit square; 3) re-parameterize the surface, for example, re-parameterize the surface such that a ratio of line and area elements of the surface based on a Riemannian metric is constant; and 4) map the curve onto the surface using the re-parameterization. The method may also generate output comprising information regarding the mapped curve, for example, displaying the mapped curve on a display device.
    Type: Grant
    Filed: June 8, 2001
    Date of Patent: June 21, 2005
    Assignee: National Instruments Corporation
    Inventors: Lothar Wenzel, Ram Rajagopal, Dinesh Nair
  • Patent number: 6909799
    Abstract: To follow and inspect a common edge between two sheet metal blanks which are to be welded together, a line pattern is projected across the edge by a projector and is imaged by a camera. The image captured is analyzed in order to derive from the trace of the lines information on the gap between the blanks, or on the track of the edge. The pattern projected has several lines with different light intensities. When the photographed image is processed, it is then possible—even if there is variation in the reflection characteristics of the sheet metal blanks—to select a line which is neither too faint nor too bright in the image obtained and which can therefore be used for meaningful analysis.
    Type: Grant
    Filed: July 24, 1997
    Date of Patent: June 21, 2005
    Assignee: Elpatronic AG
    Inventors: Daniel Wildmann, Christa Buchmann
  • Patent number: 6907358
    Abstract: A specimen is mounted in a multiaxis machine. An eddy current probe is also mounted in the machine for multiaxis movement relative to the specimen. The probe is aligned in situ with a target in the specimen by direct contact therebetween at multiple alignment sites corresponding with a numerical model of the specimen. Eddy current inspection of the target may then be conducted by moving the probe along multiple inspection sites of the target corresponding with the specimen model.
    Type: Grant
    Filed: January 30, 2003
    Date of Patent: June 14, 2005
    Assignee: General Electric Company
    Inventors: Ui Won Suh, Clifford Sneed, Jr.
  • Patent number: 6873722
    Abstract: The invention relates to a method of contactlessly ascertaining chatter marks in finely-machined workpiece surfaces, with the following steps: a contactlessly operating, high-resolution surface-measuring method is used to generate from the workpiece surface a data record representing the actual microtopography of the workpiece surface, to take away from this a data record representing the idealized macroform of the workpiece surface, and in this way to generate a data record representing the flat-extended form of the microtopography of the workpiece surface. This data record is subjected to a digital in-phase bandpass filtering with respect to its circumferential waviness, the waviness of interest here of the chatter marks preferably being allowed through. The data record formed in this way is for its part subjected to a stationary multiple cross correlation with respect to the transverse direction.
    Type: Grant
    Filed: May 16, 2001
    Date of Patent: March 29, 2005
    Assignee: DaimlerChrysler AG
    Inventors: Tobias Hercke, Norbert Rau, Michael Seibold
  • Patent number: 6873680
    Abstract: A digital radiography apparatus (10) and process for providing images of an object, for example, an exhaust transition duct (12) comprising a core material and an overlying thermal barrier layer, to detect surface and interior defects within the duct (12). Incident energy is provided by an energy source (30), transmitted through the object (12), and sensed by a sensor (32). An image of the object (12) is formed by processing the signal from the sensor (32) in a signal processor (34) and displaying the image on a display (36) for determining defects in the object (12).
    Type: Grant
    Filed: May 2, 2003
    Date of Patent: March 29, 2005
    Assignee: Siemens Westinghouse Power Corporation
    Inventor: James Wayne Jones
  • Patent number: 6873721
    Abstract: A method for determining a helical groove structure, for example in the form of flutes, in the surface of a finely finished cylindrical workpiece, in particular the ground mating bearing surface of radial shaft sealing rings, which is characterized in that a camera is used to record at least one image of the illuminated surface of the workpiece, which image reproduces the helical groove structure in the surface of the workpiece. A device for carrying out a method includes a CCD camera with a macrolens, a radial bearing device for the workpiece, an illuminating device and an image reading and image processing device.
    Type: Grant
    Filed: March 5, 1999
    Date of Patent: March 29, 2005
    Assignee: DaimlerChrysler AG
    Inventors: Jürgen Beyerer, Doris Krahe
  • Patent number: 6870953
    Abstract: A method sorts out defect-free elements blanked out of a metal sheet for a belt for use in a continuously variable transmission. Each of the elements has a body and a head joined to the body with a pair of recesses defined therebetween. The elements are stacked in a transverse direction thereof into an annular form and bundled together by an assembly of stacked endless metal rings inserted in the recesses into a belt for use in a continuously variable transmission. The elements are inserted into a passage having a predetermined width to sort out and deliver those elements which have passed through the passage to a feed path. Respective images of the elements which have been delivered to the feed path are analyzed while in the feed path to compare the images with a reference element image. Elements which have entrapped foreign matter, outer profile deformations, and defects are rejected from the feed path, and other elements are fed through the feed path.
    Type: Grant
    Filed: February 21, 2001
    Date of Patent: March 22, 2005
    Assignee: Honda Giken Kogyo Kabushiki Kaisha
    Inventors: Tetsuo Suzuki, Hideki Shigematsu
  • Patent number: 6839975
    Abstract: The present invention relates to an accuracy measuring apparatus which is capable of efficiently measuring the accuracies of a machine tool at low costs. The accuracy measuring apparatus (1) comprises a laser oscillator (2) attached to a spindle (15) of the machine tool (10) for projecting a light beam having an axis aligning with the axis of the spindle, a CCD camera (3) disposed in opposed relation to the laser oscillator (2) for receiving the light beam projected from the laser oscillator (2) and generating two-dimensional image data, and an analyzer (4) for analyzing the image data to determine the accuracies of the machine tool (10).
    Type: Grant
    Filed: October 11, 2002
    Date of Patent: January 11, 2005
    Assignees: Mori Seiki Co., LTD, Intelligent Manufacturing Systems International
    Inventor: Makoto Fujishima